CN106199256A - The method for designing of TCXO test circuit - Google Patents
The method for designing of TCXO test circuit Download PDFInfo
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- CN106199256A CN106199256A CN201610503984.4A CN201610503984A CN106199256A CN 106199256 A CN106199256 A CN 106199256A CN 201610503984 A CN201610503984 A CN 201610503984A CN 106199256 A CN106199256 A CN 106199256A
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- tcxo
- station
- row
- control chip
- signal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The present invention is the method for designing of a kind of TCXO test circuit, its test circuit includes X-direction 8 row frequency signal output lead, Y-direction 8 row signal control line, every row, column intersection point is a TCXO test station, totally 64 stations, frequency signal outfan in each test station configures one and enables control chip, uses software control signals mode to control to measure any one station in array.Often 8 station rate-adaptive pacemaker of row are connected to a shared frequency output lead through enabling control chip, and the enable control chip of 8 stations of each column connects one and enables signal, and output line is all connected with electrical switch control chip with enabling signal.Advantage: control more TCXO test station with less holding wire, can realize many TCXO being tested simultaneously, realize low cost, efficiency is high, it is applicable to batch production, and the design of division function can reduce the interference of extraneous factor in frequency transmission, improves accuracy and the reliability of frequency measurement.
Description
Technical field
The present invention relates to the method for designing of a kind of TCXO test circuit, be particularly suited for the volume production of TCXO, simultaneously to upper frequency
And the TCXO test aspect of high-stability requirement has higher accuracy and reliability.
Background technology
Temperature compensation quartz oscillator (being called for short TCXO) is low in energy consumption due to it, and frequency-temperature degree of stability high extensively should
For communicating, the equipment such as vehicle mounted guidance, key characteristic index is frequency-temperature degree of stability, reference frequency precision etc., is producing
Needing in journey these characteristic index are carried out 100% test, the reliability and the efficiency that how to improve test are that design TCXO test is
The key of system.The present invention proposes a kind of novel TCXO and tests circuit design method, for realizing the test of volume production TCXO product,
Product attribute testing reliability can be ensured, and batch production can be realized.
Summary of the invention
In order to meet the product demand of expanding day and ensure product index, the present invention provides a kind of novel TCXO test circuit to set
Meter method, can be effectively improved testing efficiency, can reduce again the interference that in frequency transmitting procedure, extraneous factor causes, and improves TCXO
The accuracy of test and reliability.
The technical solution of the present invention is: the method for designing of a kind of TCXO test circuit, it is characterized in that X-direction has 8 row
Intermediate-freuqncy signal output lead, Y-direction has 8 row signal control lines, every row, column intersection point to be a TCXO test station, totally 64 stations,
Frequency signal outfan in each test station configures one and enables control chip, uses software control signals to carry out station
Selecting, often 8 station rate-adaptive pacemaker of row are connected to a shared frequency output lead, 8 stations of each column through enabling control chip
Enable control chip connect one enable signal, circuit medium frequency output line and enable signal be all connected to electrical switch
Control chip.
Application tri-state control functional device combines other hardware circuits and realizes the test to TCXO, and TCXO test circuit is adopted
Arranging with 8 × 8 array formats, the frequency output terminal in each TCXO test station configures one and enables control chip, uses soft
Part control signal mode controls to measure any one station in array.
The invention has the beneficial effects as follows: controlling more TCXO test station with less holding wire, it is the most right to realize
Many TCXO products are tested；Testing efficiency is high, convenient extension, it is adaptable to the volume production of TCXO.Additionally, the design of division function
The interference of extraneous factor in frequency transmitting procedure can be reduced, it is ensured that the accuracy of frequency measurement and reliability.
Accompanying drawing explanation
Accompanying drawing 1 is the present invention 8 × 8 array test circuit design partial schematic diagram.
Detailed description of the invention
A kind of TCXO tests circuit design method, it is characterized in that X-direction has 8 row intermediate-freuqncy signal output leads, and Y-direction has 8 row signals
Control line, every row, column intersection point is a TCXO test station, totally 64 stations, the frequency signal output in each test station
End configuration one enables control chip, uses software control signals to carry out the selection of station, and often 8 station rate-adaptive pacemaker of row pass through
Enabling control chip and be connected to a shared frequency output lead, the enable control chip of 8 stations of each column shares one and enables control
Signal processed, circuit medium frequency output line and enable control signal are all connected with electrical switch control chip.
Described 8 × 8 array formats arrange it is to have 8 row and 8 row, and often row has 8 station rate-adaptive pacemaker to control core through enabling
Being attached after sheet sharing a rate-adaptive pacemaker line, the enable control chip of 8 stations of each column shares one and enables signal.
Described design medium frequency output lead and enable control signal are by electronic device control, when measuring a certain TCXO station
Time, the enable control signal making these station place ranks is effective, and the enable control signal of other ranks is invalid, can realize this
The measurement of station frequency.
The described orientation choosing test station, is to control electronic switch chip by software to select test station,
Can control to measure any one station in 64 stations, it is only necessary to 6 address wires can realize, and also can be with 64 stations for one
Group is extended, as used 8 data lines just can control 256 test station.
Described method for designing medium frequency outfan uses the enable control chip with division function, can be by TCXO output frequency
It is transmitted after rate frequency dividing, the extraneous factor interference to frequency signal in frequency transmission can be reduced, it is provided that frequency measurement accurate
Property and reliability.
Described enable control chip, its effect is to have on or off function, when this station tested by needs, this work
The enable control chip conducting of position, when not testing, this enable control chip must cut-off.Enable control chip such as 74LS125 etc..
Described electrical switch control chip: its effect is to carry out that 1 choosing is many or the on-off control of multiselect 1, as
74LS138,74LS4051 etc..
Embodiment:
Comparison accompanying drawing 1, X0～X7 is 8 row intermediate-freuqncy signal output leads in the X direction, Y0～Y7 is 8 row letters in the Y direction
Number control line, each row, column intersection point is a TCXO test station, totally 64 test station, the frequency in each test station
Signal output part configures one and enables control chip, uses software to control information and carries out the selection of station, often 8 station intermediate frequencies of row
The output of rate signal connects a shared frequency signal output lead after enabling control chip, and the enable of 8 stations of each column controls
Chip shares one and enables control signal, and method for designing medium frequency output line is controlled core with enabling signal by electrical switch
Sheet controls.When measuring the station X0Y0 that the first row is intersected with first row, need to make first row enable signal by software effective,
The enable invalidating signal of other row, 8 stations of the most only X0 row have frequency signal to export, simultaneously 8 row medium frequency signal electronics
Switch control chip selects the first row Y0, i.e. the TCXO rate-adaptive pacemaker of X0 row Y0 row unit measures to cymometer, for reducing
Interference and raising accuracy, when actual design circuit, can use the enable with division function to control core in test station
Sheet, divides the transmission of laggard row TCXO output frequency.
Claims (6)
1. TCXO tests a circuit design method, it is characterized in that X-direction has 8 row intermediate-freuqncy signal output leads, and Y-direction has 8 row letters
Number control line, every row, column intersection point is a TCXO test station, totally 64 stations, the frequency signal output of each test station
End configuration one enables control chip, uses software control signals to carry out the selection of station, and often 8 station rate-adaptive pacemaker of row pass through
Enabling control chip and connect a shared frequency output lead, the enable control chip of 8 stations of each column connects one and enables control
Signal, circuit medium frequency output line and enable control signal are all connected to electrical switch control chip.
The method for designing of TCXO the most according to claim 1 test circuit, the method application tri-state control functional device combines it
He realizes the test to TCXO by hardware circuit, it is characterised in that: TCXO test circuit uses 8 × 8 array formats to arrange, each
Frequency output terminal in TCXO test station configures one and enables control chip, uses software control signals mode to control to measure battle array
Any one station in row.
A kind of TCXO the most according to claim 2 tests circuit design method, it is characterised in that: described 8 × 8 array formats
Layout is to have 8 row and 8 row, and often row has 8 station rate-adaptive pacemaker to be attached sharing a frequency after enabling control chip
Output lead, the enable control chip of 8 stations of each column shares one and enables control signal.
A kind of TCXO the most according to claim 3 tests circuit design method, it is characterised in that: described medium frequency output lead
Controlled by electrical switch control chip with enabling signal, when measuring a certain TCXO station, make making of these station place ranks
Energy signal is effective, and the enable invalidating signal of other ranks can realize the measurement to this station frequency.
A kind of TCXO the most according to claim 2 tests circuit design method, it is characterised in that choose the side of station described in:
Method is to control to choose by software, can choose any one station in measurement 64 stations, it is only necessary to 6 address wires can realize,
And also can be one group with 64 stations and be extended, control 256 test station as used 8 data lines just can realize.
A kind of TCXO the most according to claim 2 tests circuit design method, it is characterised in that: described medium frequency output
End uses the enable control chip with division function, TCXO output frequency divides the transmission of laggard row, it is possible to decrease extraneous factor
Interference to frequency signal, thus improve measurement accuracy, improve and produce qualification rate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610503984.4A CN106199256B (en) | 2016-07-01 | 2016-07-01 | The design method of TCXO test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610503984.4A CN106199256B (en) | 2016-07-01 | 2016-07-01 | The design method of TCXO test circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106199256A true CN106199256A (en) | 2016-12-07 |
| CN106199256B CN106199256B (en) | 2019-06-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610503984.4A Active CN106199256B (en) | 2016-07-01 | 2016-07-01 | The design method of TCXO test circuit |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6414559B1 (en) * | 1998-03-23 | 2002-07-02 | Dallas Semiconductor Corporation | Single package temperature compensated electronic device |
| KR100862896B1 (en) * | 2007-07-27 | 2008-10-13 | (주)아날로그칩스 | Digitally temperature compensated crystal oscillator and method for stabilizing frequency of the same |
| CN101413980A (en) * | 2007-10-18 | 2009-04-22 | 纬创资通股份有限公司 | Automatic test method and automatic test device thereof |
| CN102288848A (en) * | 2011-06-16 | 2011-12-21 | 平湖市电子有限公司 | Automatic current test and analysis system and method for constant-temperature crystal oscillator |
| CN204575766U (en) * | 2015-03-13 | 2015-08-19 | 熊猫电子集团有限公司 | A kind of temperature compensating crystal oscillator proving installation |
-
2016
- 2016-07-01 CN CN201610503984.4A patent/CN106199256B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6414559B1 (en) * | 1998-03-23 | 2002-07-02 | Dallas Semiconductor Corporation | Single package temperature compensated electronic device |
| KR100862896B1 (en) * | 2007-07-27 | 2008-10-13 | (주)아날로그칩스 | Digitally temperature compensated crystal oscillator and method for stabilizing frequency of the same |
| CN101413980A (en) * | 2007-10-18 | 2009-04-22 | 纬创资通股份有限公司 | Automatic test method and automatic test device thereof |
| CN102288848A (en) * | 2011-06-16 | 2011-12-21 | 平湖市电子有限公司 | Automatic current test and analysis system and method for constant-temperature crystal oscillator |
| CN204575766U (en) * | 2015-03-13 | 2015-08-19 | 熊猫电子集团有限公司 | A kind of temperature compensating crystal oscillator proving installation |
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| Publication number | Publication date |
|---|---|
| CN106199256B (en) | 2019-06-18 |
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Effective date of registration: 20221214 Address after: No. 56, Xingang Avenue, Nanjing Economic and Technological Development Zone, Qixia District, Nanjing, Jiangsu 210000 Patentee after: NANJING CHINA ELECTRONICS PANDA CRYSTAL TECHNOLOGY Corp. Address before: Favorable economic and Technological Development Zone Road 065001 Hebei city of Langfang province Langfang Industrial Park No. 2 CEC Patentee before: LANGFANG CHINA ELECTRONICS PANDA CRYSTAL TECHNOLOGY Corp. |