CN102288848A - Automatic current test and analysis system and method for constant-temperature crystal oscillator - Google Patents
Automatic current test and analysis system and method for constant-temperature crystal oscillator Download PDFInfo
- Publication number
- CN102288848A CN102288848A CN2011101626907A CN201110162690A CN102288848A CN 102288848 A CN102288848 A CN 102288848A CN 2011101626907 A CN2011101626907 A CN 2011101626907A CN 201110162690 A CN201110162690 A CN 201110162690A CN 102288848 A CN102288848 A CN 102288848A
- Authority
- CN
- China
- Prior art keywords
- crystal oscillator
- current
- test
- oscillator
- hyperchannel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Oscillators With Electromechanical Resonators (AREA)
Abstract
The invention relates to an automatic current test and analysis system for a constant-temperature crystal oscillator. The system comprises 1) a multichannel oscillator test board, 2) a program-controlled current meter, 3) a multichannel switching device and 4) a computer control system. An automatic current test and analysis method for the constant-temperature crystal oscillator comprises the following steps of: 1) setting a test standard for current test and analysis; 2) adding the crystal oscillator to the multichannel oscillator test board; 3) detecting whether the current of the crystal oscillator is abnormal or not; 4) starting a formal test; 5) testing starting current of the crystal oscillator; 6) after the first crystal oscillator is tested, making the first crystal oscillator enter a power-on stable state and switching the current meter to test the second crystal oscillator at the same time, and repeating the step 5) until the starting current of the last crystal oscillator is tested; and 7) measuring stable current of all the crystal oscillators. Compared with the prior art, the automatic current test and analysis system and the automatic current test and analysis method have the advantages that: labors during test and personal errors of data are reduced; the current test efficiency of the OCXO is improved; furthermore, only one current tester is used, but a speed of a plurality of testers can be achieved; therefore, equipment investment is reduced.
Description
Technical field
The present invention relates in constant-temperature crystal oscillator (then the be called for short OCXO) production test procedure system and method that the current characteristics of OCXO is tested, analyzed.
Background technology
In OCXO produced, the time more than 80% was that product is tested.In the product test performance index, it is the current value of test OCXO that an important techniques index is arranged, and its value is divided into two, a maximum current when starting for product, and another reaches steady current when stablizing for product.
In traditional mode of production, the electric current index is generally by manually finishing, and test process is, product turn-on current table checks that manually electric current changes, and finds the value of electric current, waits for the product stable working state then, reads the stable electrical flow valuve.Because the electric current pace of change is very fast when starting, and needs the workman to observe always, cause the product number that can check simultaneously limited, the multipotency of a general skilled labor is observed the current value of 3 products simultaneously, and the Measuring Time of a general product is 3 to 5 minutes.If write down a plurality of products simultaneously, also need to be equipped with the reometer of as much, increase production cost.For the data of record, by manual record, data volume is big, and the later stage is difficult to management data.Simultaneously,, can only see starting and steady current for these data, and the real current situation of change that can't reappear product.
Summary of the invention
Technical matters to be solved by this invention is: a kind of constant-temperature crystal oscillator current detecting system and method for robotization are provided, and the manpower when reducing test uses, and reduces the personal error of data.
In order to solve the problems of the technologies described above, the present invention by the following technical solutions:
A kind of constant-temperature crystal oscillator automatic current detecting and analysing system is characterized in that this system comprises:
1) hyperchannel oscillator test board: be connected with tested crystal oscillator, be used to load tested crystal oscillator;
2) programmable current table: link to each other with the hyperchannel switching device shifter, measure the current value of the crystal oscillator of respective channel;
3) hyperchannel switching device shifter: be connected with hyperchannel oscillator test board, programmable current table, computer control system, each passage is corresponding with a tested crystal oscillator on the hyperchannel oscillator test board, be used to accept the order of computer control system, open or close dedicated tunnel automatically; Make the tested crystal oscillator on the hyperchannel oscillator test board corresponding be in energising or off-position with dedicated tunnel;
4) computer control system: be connected with the hyperchannel switching device shifter by communication interface, be responsible for the switching of each passage of control; Be connected with the programmable current table by the GPIB line, be responsible for reading the current value of tested crystal oscillator, and generate the electric current and the time curve of tested crystal oscillator in real time from the programmable current table.
Described channel switching device comprises MCU, code translator, test channel switch, preheating channel switch, pilot lamp and hummer, described MCU is connected with preheating channel switch, pilot lamp and hummer respectively, described MCU is connected with computer control system by the RS232 communication interface, computer control system is connected with code translator by 25 pin parallel ports, code translator is connected with the test channel switch, test channel switch, preheating channel switch are connected with hyperchannel oscillator test board, and the preheating channel switch is used to control crystal oscillator and shifts to an earlier date preheating; The test channel switch is used to open or close passage, pilot lamp is used to indicate current heating of crystal oscillator or test mode, code translator is used to accept the instruction that computer control system transmits by the parallel port line, nominative testing passage, MCU are used to control switch, pilot lamp light on and off, the control of inside chip and the piping of hummer of preheating channel.
A kind of constant-temperature crystal oscillator automatic current method for testing and analyzing is characterized in that: constant-temperature crystal oscillator automatic current test analysis program is deposited in the memory under program of computer control system, start computer control system and carry out the following step:
1) testing standard that this testing current is analyzed is set;
2) add crystal oscillator toward a hyperchannel oscillator test board;
3) detect whether the crystal oscillator current anomaly is arranged,, out-of-the way position is identified out, after all the crystal oscillator inspections finish, stop test, wait for that the user gets rid of unusually if having unusually;
4) repeating step 3) after whole crystal oscillators detections are not often led, the beginning official testing;
5) computer control one hyperchannel switching device shifter is opened dedicated tunnel, make the crystal oscillator test board crystal oscillator corresponding be in "on" position with dedicated tunnel, first crystal oscillator is powered up and, check simultaneously whether crystal oscillator occurs unusually by the continuous record test data of programmable current table; If find to take place in the crystal oscillator test process unusually, then unusual at the mark crystal oscillator, skip this crystal oscillator, directly test next crystal oscillator; If crystal oscillator is normal, then test the starting current of crystal oscillator;
6) test first crystal oscillator after, first crystal oscillator is entered power up steady state (SS), simultaneously reometer switches to second crystal oscillator of test, repeating step 5) up to the starting current that tests last crystal oscillator;
7) steady current of measurement all crystals oscillator.
Wherein step 5) also comprises the step of the next crystal oscillator to be measured of preheating: in the crystal oscillator test starting electric current process, the next crystal oscillator to be measured of preheating continues to test the starting current of first test crystal oscillator simultaneously before not obtaining starting current.
Step 2 wherein) further may further comprise the steps: when on a hyperchannel oscillator test board, adding crystal oscillator, write down the location number of crystal oscillator and the relation of crystal oscillator numbering, subsequently this relation is added in the database, conveniently to manage and to discern.
Wherein step 3) further may further comprise the steps: after the whole interpolations of crystal oscillator are finished; computer control one hyperchannel switching device shifter open with hyperchannel oscillator test board on the corresponding passage of tested crystal oscillator; crystal oscillator is switched on one by one; and read the crystal oscillator electric current by a programmable current table; the crystal oscillator electric current that computing machine reads the programmable current table and the range of current of testing standard are relatively; check that whether having current anomaly or crystal oscillator not to insert causes opening circuit; if the crystal oscillator electric current not in testing standard predetermined electric current scope, shows that then crystal oscillator is unusual.
The present invention compared with prior art has following beneficial effect: the manpower when reducing test uses, and reduces the personal error of data.Improve the testing current efficient of OCXO, only use a testing current instrument, reach the speed of many testing tools, minimizing equipment drops into.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples:
Fig. 1 is a general structure block diagram of the present invention;
Fig. 2 is the structured flowchart of hyperchannel switching device shifter of the present invention;
Fig. 3 is a current test method process flow diagram of the present invention;
Fig. 4 is the electric current and the time plot of the tested crystal oscillator of the present invention.
Embodiment
With reference to Fig. 1, a kind of constant-temperature crystal oscillator current detecting system comprises hyperchannel oscillator test board, programmable current table, hyperchannel switching device shifter, computer control system.
Hyperchannel oscillator test board is connected with tested crystal oscillator, is used to load tested crystal oscillator, by the tester crystal oscillator to be tested is plugged the crystal oscillator test board.
Programmable current table: link to each other with the hyperchannel switching device shifter, measure the current value of the crystal oscillator of respective channel.Reometer is that HP3478 command set compatibility gets final product.
Hyperchannel switching device shifter: be connected with hyperchannel oscillator test board, programmable current table, computer control system, each passage is corresponding with a tested crystal oscillator on the hyperchannel oscillator test board, be used to accept the order of computer control system, open or close dedicated tunnel automatically; Make the tested crystal oscillator on the hyperchannel oscillator test board corresponding be in energising or off-position with dedicated tunnel.Referring to Fig. 2, the hyperchannel switching device shifter comprises MCU, code translator, the test channel switch, the preheating channel switch, pilot lamp and hummer, MCU respectively with the preheating channel switch, pilot lamp is connected with hummer, described MCU is connected with computer control system by the RS232 communication interface, computer control system is connected with code translator by 25 pin parallel ports, code translator is connected with the test channel switch, the test channel switch, the preheating channel switch is connected with hyperchannel oscillator test board, the preheating channel switch, the test channel switch can adopt relay element, and the preheating channel switch is used to control crystal oscillator and shifts to an earlier date preheating; The test channel switch is used to open or close passage, pilot lamp is used to indicate current heating of crystal oscillator or test mode, code translator is used to accept the instruction that computer control system transmits by the parallel port line, nominative testing passage, MCU are used to control switch, pilot lamp light on and off, the control of inside chip and the piping of hummer of preheating channel.
Computer control system (promptly depositing the computing machine of constant-temperature crystal oscillator automatic current test analysis program in): be connected with the hyperchannel switching device shifter by communication interface, be responsible for the switching of each passage of control; Be connected with the programmable current table by the GPIB line, be responsible for reading the current value of tested crystal oscillator, and generate the electric current and the time curve of tested crystal oscillator in real time from the programmable current table.Be divided into four big functional modules again:
Passage switching controls module, the control channel switching device shifter opens or closes the passage of appointment, and calculates the sequencing of test, test logic;
The current anomaly protection module is used to protect the crystal oscillator in test, when crystal oscillator electric current during greater than setting value, close the crystal oscillator power supply automatically, and mark is unusual;
Real-time current curve module, the real-time current data that obtains according to test, the current-time curvel figure that draws is used for analyzing crystal oscillator state;
The data that test data administration module, management testing obtain.
In concrete case study on implementation, the communication interface that is connected of computer control system of the present invention and channel switching device is 25 pin parallel ports and RS232 interface; The mode in succession of computing machine and programmable current table is the GPIB line, and employed electric current is a Switching Power Supply; Hyperchannel oscillator test board 100 has 24 test interfaces, directly links to each other by copper conductor with channel switching device 101.
Referring to Fig. 3, a kind of constant-temperature crystal oscillator automatic current method for testing and analyzing deposits constant-temperature crystal oscillator automatic current test analysis program in the memory under program of computer control system in, starts computer control system and carries out the following step:
1) testing standard that this testing current is analyzed is set:
The testing standard that this testing current is analyzed at first is set, if the standard of this test is with consistent in the past, then can directly selects in the historical record the inside, testing standard is the starting current scope, steady current scope and abnormal current scope;
2) add crystal oscillator toward a hyperchannel oscillator test board:
On a hyperchannel oscillator test board, add crystal oscillator, when adding, write down the location number of crystal oscillator and the relation of crystal oscillator numbering, subsequently this relation is added in the database, conveniently to manage and to discern;
3) detect whether the crystal oscillator current anomaly is arranged:
After the whole interpolations of crystal oscillator are finished; computer control one hyperchannel switching device shifter open with hyperchannel oscillator test board on the corresponding passage of tested crystal oscillator; crystal oscillator is switched on one by one; and read the crystal oscillator electric current by a programmable current table; the crystal oscillator electric current that computing machine reads the programmable current table and the range of current of testing standard are relatively; check that whether having current anomaly or crystal oscillator not to insert causes opening circuit; if the crystal oscillator electric current not in testing standard predetermined electric current scope, shows that then crystal oscillator is unusual.If have unusually, out-of-the way position is identified out, after all the crystal oscillator inspections finish, stop test, wait for that the user gets rid of unusually;
4) repeating step 3) after whole crystal oscillators detections are not often led, the beginning official testing;
5) the computer control channel switching device is opened dedicated tunnel, make the crystal oscillator test board crystal oscillator corresponding be in "on" position with dedicated tunnel, first crystal oscillator is powered up and, check simultaneously whether crystal oscillator occurs unusually by the continuous record test data of programmable current table; If find to take place in the crystal oscillator test process unusually, then unusual at the mark crystal oscillator, skip this crystal oscillator, directly test next crystal oscillator; If crystal oscillator is normal, then test the starting current of crystal oscillator; In order to improve testing efficiency, then in crystal oscillator test starting electric current process, before not obtaining starting current, (be generally crystal oscillator energising heating in the time of back 30 seconds), the next crystal oscillator to be measured of preheating; Continue the starting current (being generally crystal oscillator energising back about 40 to 60 seconds) of first test crystal oscillator of test simultaneously, the preheating of next crystal oscillator to be tested this moment; Take preheating mode,, when measuring a product, next one product to be tested is carried out preheating, and do not wait for stablely, continue test according to the electric current characteristics of product.With respect to the manual testing, its testing efficiency promotes about 70%;
6) test first crystal oscillator after, first crystal oscillator is entered power up steady state (SS), simultaneously reometer switches to second crystal oscillator of test, repeating step 5) up to the starting current that tests last crystal oscillator; Since preheating next crystal oscillator, the starting current that therefore obtains next crystal oscillator is general only to need 10 seconds; System every about 30 seconds, preheating crystal oscillator to be tested;
7) steady current of measurement all crystals oscillator, because crystal oscillator was in and powers up steady state (SS) after the starting current test was finished always, whole crystal oscillator test starting electric currents during this period of time in, crystal oscillator is complete stability, so the stable testing electric current got final product in general 2 to 5 seconds;
8) test obtains steady current, and computing machine sends order to the hyperchannel switching device shifter, closes the crystal oscillator power supply, and hummer rings, prompting tester end of test (EOT);
9) current data value that obtains according to test generates electric current and the curve map of time or directly derives test data in the Excel table.
Fig. 4 is the electric current and the time plot of tested crystal oscillator.Starting current is the mxm. of current curve among the figure, difference according to the test crystal oscillator, generally appear between 30 to 60 seconds, and steady current was meant in a period of time, current changing rate is less than designated value the time, crystal oscillator is stable, and steady current generally appeared at the energising back in the time of 2 to 3 minutes.
Claims (6)
1. constant-temperature crystal oscillator automatic current detecting and analysing system is characterized in that this system comprises:
1) hyperchannel oscillator test board: be connected with tested crystal oscillator, be used to load tested crystal oscillator;
2) programmable current table: link to each other with the hyperchannel switching device shifter, measure the current value of the crystal oscillator of respective channel;
3) hyperchannel switching device shifter: be connected with hyperchannel oscillator test board, programmable current table, computer control system, each passage is corresponding with a tested crystal oscillator on the hyperchannel oscillator test board, be used to accept the order of computer control system, open or close dedicated tunnel automatically; Make the tested crystal oscillator on the hyperchannel oscillator test board corresponding be in energising or off-position with dedicated tunnel;
4) computer control system: be connected with the hyperchannel switching device shifter by communication interface, be responsible for the switching of each passage of control; Be connected with the programmable current table by the GPIB line, be responsible for reading the current value of tested crystal oscillator, and generate the electric current and the time curve of tested crystal oscillator in real time from the programmable current table.
2. a kind of constant-temperature crystal oscillator automatic current detecting and analysing system as claimed in claim 1, it is characterized in that: described channel switching device comprises MCU, code translator, the test channel switch, the preheating channel switch, pilot lamp and hummer, described MCU respectively with the preheating channel switch, pilot lamp is connected with hummer, described MCU is connected with computer control system by the RS232 communication interface, computer control system is connected with code translator by 25 pin parallel ports, code translator is connected with the test channel switch, the test channel switch, the preheating channel switch is connected with hyperchannel oscillator test board, and the preheating channel switch is used to control crystal oscillator and shifts to an earlier date preheating; The test channel switch is used to open or close passage, pilot lamp is used to indicate current heating of crystal oscillator or test mode, code translator is used to accept the instruction that computer control system transmits by the parallel port line, nominative testing passage, MCU are used to control switch, pilot lamp light on and off, the control of inside chip and the piping of hummer of preheating channel.
3. constant-temperature crystal oscillator automatic current method for testing and analyzing is characterized in that: constant-temperature crystal oscillator automatic current test analysis program is deposited in the memory under program of computer control system, start computer control system and carry out the following step:
1) testing standard that this testing current is analyzed is set;
2) add crystal oscillator toward a hyperchannel oscillator test board;
3) detect whether the crystal oscillator current anomaly is arranged,, out-of-the way position is identified out, after all the crystal oscillator inspections finish, stop test, wait for that the user gets rid of unusually if having unusually;
4) repeating step 3) after whole crystal oscillators detections are not often led, the beginning official testing;
5) computer control one hyperchannel switching device shifter is opened dedicated tunnel, make the crystal oscillator test board crystal oscillator corresponding be in "on" position with dedicated tunnel, first crystal oscillator is powered up and, check simultaneously whether crystal oscillator occurs unusually by the continuous record test data of programmable current table; If find to take place in the crystal oscillator test process unusually, then unusual at the mark crystal oscillator, skip this crystal oscillator, directly test next crystal oscillator; If crystal oscillator is normal, then test the starting current of crystal oscillator;
6) test first crystal oscillator after, first crystal oscillator is entered power up steady state (SS), simultaneously reometer switches to second crystal oscillator of test, repeating step 5) up to the starting current that tests last crystal oscillator;
7) measure the steady current of all crystal oscillators.
4. a kind of constant-temperature crystal oscillator automatic current method for testing and analyzing as claimed in claim 3, it is characterized in that step 5) also comprises the step of the next crystal oscillator to be measured of preheating: in the crystal oscillator test starting electric current process, the next crystal oscillator to be measured of preheating continues to test the starting current of first test crystal oscillator simultaneously before not obtaining starting current.
5. as claim 3 or 4 described a kind of constant-temperature crystal oscillator automatic current method for testing and analyzing, it is characterized in that wherein step 2) further may further comprise the steps: when on a hyperchannel oscillator test board, adding crystal oscillator, write down the location number of crystal oscillator and the relation of crystal oscillator numbering, subsequently this relation is added in the database, conveniently to manage and to discern.
6. as claim 3 or 4 described a kind of constant-temperature crystal oscillator automatic current method for testing and analyzing; it is characterized in that wherein step 3) further may further comprise the steps: after the whole interpolations of crystal oscillator are finished; computer control one hyperchannel switching device shifter open with hyperchannel oscillator test board on the corresponding passage of tested crystal oscillator; crystal oscillator is switched on one by one; and read the crystal oscillator electric current by a programmable current table; the crystal oscillator electric current that computing machine reads the programmable current table and the range of current of testing standard are relatively; check that whether having current anomaly or crystal oscillator not to insert causes opening circuit; if the crystal oscillator electric current not in testing standard predetermined electric current scope, shows that then crystal oscillator is unusual.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101626907A CN102288848A (en) | 2011-06-16 | 2011-06-16 | Automatic current test and analysis system and method for constant-temperature crystal oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101626907A CN102288848A (en) | 2011-06-16 | 2011-06-16 | Automatic current test and analysis system and method for constant-temperature crystal oscillator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102288848A true CN102288848A (en) | 2011-12-21 |
Family
ID=45335426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011101626907A Pending CN102288848A (en) | 2011-06-16 | 2011-06-16 | Automatic current test and analysis system and method for constant-temperature crystal oscillator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102288848A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN102928692A (en) * | 2012-10-12 | 2013-02-13 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
| CN103259540A (en) * | 2013-03-15 | 2013-08-21 | 深圳市三奇科技有限公司 | Device and method for debugging reflection point resistance of high stability oven controlled crystal oscillator |
| CN105262203A (en) * | 2015-10-27 | 2016-01-20 | 深圳市信维通信股份有限公司 | Power supply management method and system |
| CN105572429A (en) * | 2015-12-22 | 2016-05-11 | 北京无线电计量测试研究所 | Crystal oscillator fixing device and monitoring system |
| CN106199256A (en) * | 2016-07-01 | 2016-12-07 | 廊坊中电熊猫晶体科技有限公司 | The method for designing of TCXO test circuit |
| CN108957282A (en) * | 2018-10-09 | 2018-12-07 | 北京无线电计量测试研究所 | A kind of crystal oscillator electric performance test system |
| CN109387770A (en) * | 2018-09-25 | 2019-02-26 | 安徽华东光电技术研究所有限公司 | To the method for high-frequency vacuum electro coupled oscillator work electric parameters testing |
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
-
2011
- 2011-06-16 CN CN2011101626907A patent/CN102288848A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
Non-Patent Citations (2)
| Title |
|---|
| V.J.ROSATI等: "晶体谐振器-振荡器测试设备及测试结果", 《宇航计测技术》, 31 December 1985 (1985-12-31), pages 240 - 244 * |
| 赵曙光等: "恒温晶振(OCXO)计算机辅助调试和自动测试***", 《仪器仪表学报》, vol. 23, no. 6, 31 December 2002 (2002-12-31), pages 642 - 644 * |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN102565676B (en) * | 2012-01-13 | 2014-01-01 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN102928692A (en) * | 2012-10-12 | 2013-02-13 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
| CN102928692B (en) * | 2012-10-12 | 2014-10-29 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
| CN103259540A (en) * | 2013-03-15 | 2013-08-21 | 深圳市三奇科技有限公司 | Device and method for debugging reflection point resistance of high stability oven controlled crystal oscillator |
| CN105262203A (en) * | 2015-10-27 | 2016-01-20 | 深圳市信维通信股份有限公司 | Power supply management method and system |
| CN105572429A (en) * | 2015-12-22 | 2016-05-11 | 北京无线电计量测试研究所 | Crystal oscillator fixing device and monitoring system |
| CN105572429B (en) * | 2015-12-22 | 2019-12-20 | 北京无线电计量测试研究所 | Fixing device and monitoring system of crystal oscillator |
| CN106199256A (en) * | 2016-07-01 | 2016-12-07 | 廊坊中电熊猫晶体科技有限公司 | The method for designing of TCXO test circuit |
| CN109387770A (en) * | 2018-09-25 | 2019-02-26 | 安徽华东光电技术研究所有限公司 | To the method for high-frequency vacuum electro coupled oscillator work electric parameters testing |
| CN109387770B (en) * | 2018-09-25 | 2021-01-01 | 安徽华东光电技术研究所有限公司 | Method for testing working electrical parameters of high-frequency vacuum electronic oscillator |
| CN108957282A (en) * | 2018-10-09 | 2018-12-07 | 北京无线电计量测试研究所 | A kind of crystal oscillator electric performance test system |
| CN108957282B (en) * | 2018-10-09 | 2021-09-10 | 北京无线电计量测试研究所 | Crystal oscillator electrical property test system |
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102288848A (en) | Automatic current test and analysis system and method for constant-temperature crystal oscillator | |
| CN103033738B (en) | A kind of Automatic test system for circuit board | |
| CN100592091C (en) | Transformer regulation measuring systems based on virtual instrument | |
| CN105425201B (en) | metering chip simulation test method for software reliability detection of intelligent electric energy meter | |
| CN102455701B (en) | Programmable logic controller (PLC) automatic testing platform using programmable relay structure | |
| CN102252820B (en) | On-line automatic testing system in production of optical module | |
| CN107544018A (en) | A kind of more site semaphores detections and fail-ure criterion system and method | |
| CN203859750U (en) | Optical module test system | |
| CN202770933U (en) | High-precision multichannel analog quantity automatic test system | |
| CN104614668A (en) | Circuit board testing system | |
| CN102608522B (en) | Constant-temperature crystal oscillator ageing parameter automatic measurement instrument | |
| CN203275631U (en) | Intelligent detection system of microcomputer type relay protection tester | |
| CN105242218A (en) | DC source full-coverage automatic test system | |
| CN103869190A (en) | Real time simulation system-based power distribution terminal automatic closed-loop test platform | |
| CN103592615B (en) | The intelligent test device of the built-in on-load switch of a kind of electric energy meter | |
| CN106405286B (en) | The automatic test approach and system of quality monitoring device of electrical energy | |
| CN105785306A (en) | Voltage transformer on-line group calibration method and apparatus | |
| CN102164196A (en) | Automatic mobile phone current testing method | |
| CN201699720U (en) | Radio-frequency testing system of mobile communication terminal | |
| CN108761328A (en) | Electric tool switch test device and system | |
| CN200997633Y (en) | Automatic testing system based on graphic testing platform | |
| CN204228800U (en) | A kind of multi-channel DC microampere meter | |
| CN102571079A (en) | ATE (Automatic Test Equipment) test circuit for PLL (Phase Locked Loop) and test method thereof | |
| CN103530166A (en) | Verification platform and verification method for multi-channel chip based on virtual RAM | |
| CN105241529A (en) | Full-automatic testing system for gas meter module |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20111221 |