CN106055790B - A kind of optimization method and device of single-impact stress screening condition - Google Patents
A kind of optimization method and device of single-impact stress screening condition Download PDFInfo
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Abstract
The invention discloses the optimization methods and device of a kind of single-impact stress screening condition.This method comprises: obtaining not damaged product and in use only because impact stress leads to the working life distribution function of the product of failure according to the failure threshold of product to the reliability model for establishing product；Failure threshold based on product is to determine that value establishes single-impact stress screening process model, obtain not failing after single-impact stress screening the normalizing life distribution function of product, wherein initial not damaged but there is the product of damage after screening and be initially present damage but have different life distribution functions by the product of screening；Optimize normalizing life distribution function according to the life expectancy of product, the single-impact stress screening condition after being optimized.The present invention, which can be applicable in initial not damaged product and product initial intact but that defect is generated after screening, the situation of different lifetime functions, enriches the application scenarios of single-impact stress screening.
Description
Technical field
The present invention relates to reliability engineering technique field, in particular to a kind of optimization side of single-impact stress screening condition
Method and device.
Background technique
In the process of product development, environmental stress screening test is that the common product of rejecting of one kind introduces in the fabrication process
Potential defect, the effective means of damage.For example, before with satellite launch, often needing to carry out device for aerospace electron product
The environmental stress screenings at different levels such as grade, plate grade, single machine grade.Currently, the selection for environmental stress screening experimental condition, often root
It determines according to engineering experience or all kinds of specifications, is seldom determined according to the practical development of specific products, applicable cases optimization.This ring
There may be following problems for the selection mode of border stress screening experimental condition: first, probably due to excessively high experimental condition causes
Originally there is defect, damage in intact product；Second, probably due to excessive screening cause unnecessary testing expenses and when
Between.
Currently, it is seldom about the research that environmental stress screening Experiment Modeling and experimental condition optimize, in the prior art mainly
For single-impact stress, research of the screening test condition to the influence of life of product characteristic after test is carried out.Due to existing skill
Art is the screening test condition expansion research based on random this characteristic of product failure threshold value to single-impact stress, thus
For the prior art when carrying out the modeling of impact stress screening process using failure threshold, what is obtained is initially present the production of not failing of defect
It is identical that the lifetime function for the product that do not fail of defect is generated after product and initial intact but screening, i.e. prior art only applicable punching
It hits during stress screening, the product of the product and generation defect after initial intact but screening that are initially present defect has the identical longevity
Order the scene of function.But in practical projects, such as when carrying out impact stress screening to sophisticated product, often exists and be initially present
The product that defect is generated after the product of defect and initial intact but screening has the average case of different lifetime functions.
Summary of the invention
The present invention provides the optimization methods and device of a kind of single-impact stress screening condition, to solve in the prior art
Single-impact stress screening scheme be applicable in the limited problem of scene.
In order to achieve the above objectives, the technical scheme of the present invention is realized as follows:
On the one hand, the present invention provides a kind of optimization methods of single-impact stress screening condition, which comprises
The reliability model that product is established according to the failure threshold of product obtains the working life distribution letter of not damaged product
It counts and in use only because impact stress leads to the working life distribution function of the product of failure；
Failure threshold based on product is to determine that value establishes single-impact stress screening process model, obtains single-impact and answers
Do not fail the normalizing life distribution function of product after power screening, and the product that do not fail after the single-impact stress screening includes: just
Beginning, not damaged and there is no the products of damage, initial not damaged but there is the product of damage after screening and be initially present damage after screening
Wound but the product by screening；Wherein there is the product of damage after initial not damaged but screening and is initially present damage but passes through sieve
The product of choosing has different life distribution functions；
Optimize the normalizing life distribution function according to the life expectancy of product, the single-impact stress sieve after being optimized
Condition is selected, the screening conditions include screening stress.
Preferably, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the product longevity of failure
Life, r (x) are the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being time t, WiFor the course of work
Lesion size caused by middle i-th impact stress, WMFor the original damage size of product, DwFor the failure threshold of product.
Preferably, the failure threshold based on product is to determine that value establishes single-impact stress screening process model packet
It includes:
Single-impact stress screening is carried out to product according to the failure threshold of product, is obtained through single-impact stress screening
The product that do not fail afterwards, and calculate that initial not damaged and there is no the products of damage, initial not damaged but deposit after screening after screening
It damages in the product of damage with being initially present but is not failed after all stress screenings by single-impact by the product of screening
Product in shared ratio；
It is worked life distribution function and described in use only because impact stress is led according to the longevity of the not damaged product
The working life distribution function of the product of failure is caused to calculate life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, single-impact stress is established
Screening process model, the normalizing life distribution function for the product that obtains not failing after single-impact stress screening.
Preferably, there is no ratio shared by the product of damage and its in screening process after the initial not damaged and screening
In life distribution function respectively successively are as follows:
There is ratio and its service life in screening process shared by the product of damage after the initial not damaged but screening
Distribution function is successively are as follows:
It is described to be initially present ratio shared by damage but the product by screening and its make the service life in screening process point
Cloth function is successively are as follows:
The single-impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial not damaged but screens
There is the ratio of the product of damage, W afterwardssFor lesion size caused by impact stress in screening process, Ws' it is initial undamaged
Lesion size for the first time caused by product is screened because of impact stress, TESSTo use the longevity by the product of single-impact stress screening
Life.
Preferably, described that the normalizing life distribution function is optimized according to the life expectancy of product, the list after being optimized
Secondary Shocks stress screening condition includes:
According to formulaOptimize the product that do not fail after the single-impact stress screening
Normalizing life distribution function；Alternatively,
According to formulaOptimize production of not failing after the single-impact stress screening
The normalizing life distribution function of product；
Wherein, TgFor the life expectancy of product.
On the other hand, the present invention also provides a kind of optimization device of single-impact stress screening condition, described device packets
It includes:
Reliability modeling unit establishes the reliability model of product for the failure threshold according to product, obtains not damaged
The working life distribution function of product and in use only because impact stress cause failure product working life distribution
Function；
Single-impact stress screening process model building unit is to determine that value establishes single punching for the failure threshold based on product
Stress screening process model is hit, the normalizing life distribution function for the product that obtains not failing after single-impact stress screening, the list
The product that do not fail after Secondary Shocks stress screening includes: initial not damaged and there is no the products of damage, initial not damaged after screening
But there is the product of damage after screening and be initially present and damage but by the product of screening；Wherein deposited after initial not damaged but screening
Damage product and be initially present damage but by screening product have different life distribution functions；
Screening conditions optimize unit, for optimizing the normalizing life distribution function according to the life expectancy of product, obtain
Single-impact stress screening condition after optimization, the screening conditions include screening stress.
Preferably, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the product longevity of failure
Life, r (x) are the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being time t, WiFor the course of work
Lesion size caused by middle i-th impact stress, WMFor the original damage size of product, DwFor the failure threshold of product.
Preferably, the single-impact stress screening process model building unit includes:
Ratio computing module is led to for carrying out single-impact stress screening to product according to the failure threshold of product
The product that do not fail after crossing single-impact stress screening, and calculate it is initial not damaged and after screening there is no the product of damage, just
Begin to there is the product damaged after not damaged but screening and be initially present damage but rush all by single by the product of screening
Hit ratio shared in the product not failed after stress screening；
Life distribution function computing module, for according to the longevity of the not damaged product work life distribution function and it is described
Only because impact stress causes the working life distribution function of the product of failure to calculate every class product in screening process in use process
In life distribution function；
Model building module, the service life for the ratio according to shared by every class product and its in screening process are distributed letter
Number, establishes single-impact stress screening process model, the normalizing service life point for the product that obtains not failing after single-impact stress screening
Cloth function.
Preferably, there is no ratio shared by the product of damage and its in screening process after the initial not damaged and screening
In life distribution function respectively successively are as follows:
There is ratio and its service life in screening process shared by the product of damage after the initial not damaged but screening
Distribution function is successively are as follows:
It is described to be initially present damage but by ratio shared by the product of screening and its distribution of the service life in screening process
Function is successively are as follows:
The single-impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial not damaged but screens
There is the ratio of the product of damage, W afterwardssFor lesion size caused by impact stress in screening process, Ws' it is initial undamaged
Lesion size for the first time caused by product is screened because of impact stress, TESSTo use the longevity by the product of single-impact stress screening
Life.
Preferably, the screening conditions optimize unit, are specifically used for according to formulaIt is excellent
Change the normalizing life distribution function for the product that do not fail after the single-impact stress screening；Alternatively, according to formulaOptimize the normalizing service life distribution for the product that do not fail after the single-impact stress screening
Function；Wherein, TgFor the life expectancy of product.
The beneficial effect of the embodiment of the present invention is: the present invention establishes the reliability mould of product according to the failure threshold of product
Type respectively obtains not damaged product and in use only because impact stress causes the working life of the product of failure to be distributed letter
Number；It is to determine that value establishes single-impact stress screening process model by the failure threshold based on product, the single punching made
It hits after stress screening in the product that do not fail, there is the product of damage after initial not damaged but screening and is initially present damage but passes through
The product of screening has different screening life distribution functions.Therefore, screening technique of the invention can be applicable in initial not damaged
The product that defect is generated after product and initial intact but screening has the average case of different lifetime functions, enriches single-impact and answers
The application scenarios of power screening；The present invention is also according to the product that do not fail after the life expectancy optimization single-impact stress screening of product
Normalizing life distribution function realizes above-mentioned average case so as to the single-impact stress screening condition after being optimized
Certain directive function is played in the screening conditions optimization of single-impact stress screening.
Detailed description of the invention
Fig. 1 is the optimization method flow chart for the single-impact stress screening condition that embodiment one provides；
Fig. 2 is that the initial undamaged product that embodiment two provides increases with impact stress and generates damage in screening process
The probability curve diagram of wound；
In the case of the different impact stress that Fig. 3 provides for embodiment two, product is in projected life TgWhen reliability curves
Figure；
Fig. 4 is the optimization apparatus structure block diagram for the single-impact stress screening condition that embodiment three provides.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with attached drawing to embodiment party of the present invention
Formula is described in further detail.
Embodiment one
Fig. 1 is the optimization method flow chart of single-impact stress screening condition provided in this embodiment, as shown in Figure 1, should
Method includes:
S110 obtains the work longevity of not damaged product according to the failure threshold of product to the reliability model for establishing product
Order distribution function and in use only because impact stress leads to the working life distribution function of the product of failure.
In manufacture course of products, due to off-gauge material or other factors, may produce it is some there are latent defect,
The product of damage (such as: micro-crack).These defective products are easy to lose because of the damage of accumulation in use
Effect, relative to there is no the product of latent defect, damage, the failure mode-for just having one kind additional is because of accumulated damage failure
Mode, therefore the product reliability model that the present embodiment is established distinguishes not damaged product and because impact stress leads to the production of failure
Product, and obtain the working life distribution function of these two types of products.
It is frequently subjected to meet the impact of nonhomogeneous Poisson distribution in the course of work of product, under work condition environment, it is assumed that produce
Suffered accumulation number of shocks is N (t) in product working time t, and nonhomogeneous Poisson distribution intensity function is λ (t), and there will be no latent
T is denoted as in the service life of defect, the product of damage namely lossless productN, corresponding substrate crash rate is r (t).Also, this implementation
Official holiday is located in work condition environment, and impact stress can make the damaged products size further expansion that there is latent defect originally until reaching
To failure threshold Dw, and the product that latent defect is not present originally is insensitive to impact stress, i.e., it will not be because of under work condition environment
Impact stress lead to the generation accordingly damaged, finally stop working because of other failure modes.
Based on foregoing description, for example following formula (1) institutes of the working life distribution function of the not damaged product in the present embodiment
Show:
R (x) in formula (1) is the substrate crash rate of not damaged product；It should be noted that base described in the present embodiment
Bottom crash rate is not consider the crash rate of accumulated damage failure mode.
When product working time t, the lesion size such as formula (2) that there is the product of latent defect originally is shown:
W in formula (2)iFor lesion size caused by i-th impact stress in the course of work, WMFor the initial damage of product
Hurt size.
It is available according to formula (2), in use only because impact stress leads to the working life of the product of failure
Distribution function, specific as shown in formula (3):
For ease of understanding the present embodiment formula (3) define in use only because impact stress cause failure product
Working life distribution function meaning, the present embodiment is illustrated by following specific implementations.
In this specific implementation, it is assumed that lesion size W caused by i-th impact stress in the course of workiMeet
Value is μ, variance σ2Normal distribution, original damage size WMMeeting mean value is μM, variance isNormal distribution when, it is above-mentioned
Formula (3) can be derived further are as follows:
Φ () in formula (4) is the probability cumulative distribution function of standardized normal distribution.
For a collection of product newly developed, it is assumed that the ratio of no defective product is π, and correspondingly the ratio of defective product is
The service life of product is denoted as T by 1- π, then the working life distribution function of product are as follows:
Formula (5) defines the service life distribution letter of the product randomly selected from a collection of product of production in use
Number.
S120, the failure threshold based on product are to determine that value establishes single-impact stress screening process model, obtain single
Do not fail the normalizing life distribution function of product after impact stress screening.
The product that do not fail after single-impact stress screening include: initial not damaged and after screening there is no the product of damage,
There is the product of damage after initial not damaged but screening and is initially present damage but passes through the product of screening；It is wherein initial not damaged
But there is the product of damage after screening and be initially present damage but there is different life distribution functions by the product of screening.
" failure threshold based on product is to determine that value establishes single-impact stress screening process model " tool in this step
Body are as follows:
Single-impact stress screening is carried out to product according to the failure threshold of product, is obtained through single-impact stress screening
The product that do not fail afterwards, and calculate that initial not damaged and there is no the products of damage, initial not damaged but deposit after screening after screening
Damage product and be initially present damage but by screening product；
It is worked life distribution function and described in use only because impact stress is led according to the longevity of the not damaged product
The working life distribution function of the product of failure is caused to calculate life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, single-impact stress is established
Screening process model.
It should be noted that above-mentioned three types can be obtained due to when carrying out single-impact stress screening to product
Do not fail the life distribution function of product, in order to obtain optimal screening stress during impact screening, this reality in subsequent processing
It applies example and the life distribution function of the product that do not fail of these three types is weighted summation process, so as to use a service life
The expression formula of distribution function indicates not fail after screening the life distribution function of product；The normalizing service life i.e. in the present invention is distributed letter
Number is only illustrated to be distributed with the service life of all kinds of products that do not fail after an expression formula statement screening, is not to all kinds of products that do not fail
Life distribution function be normalized.
For the method for building up for more fully understanding the single-impact stress screening process model in step S120, the present embodiment leads to
Following implementations are crossed to be illustrated.
In the impact stress screening test of this implementation, the impact that a magnitude is s (is generally rushed in work condition environment
Hit the several times of stress intensity) it is applied to each product for participating in screening.
For original defective product, it is W that single-impact screening test, which will introduce an additional size,sDamage,
Its size increases and random increase with s.In addition, the original intact product of a part produced in impact stress screening test it is scarce
It falls into, the ratio of this portioned product is denoted as ρ (s), have 0≤ρ (s)≤1, and ρ (s) equally increases and random increase with s.Wherein,
After impact stress screening test, the sample of failure will be rejected, and the sample not failed then comes into operation.
This implementation is after terminating the test of single-impact stress screening, and the product not failed can be divided into three classes: (1) just
Begin that the product damaged is not present after not damaged and screening；(2) there is the product of damage after initial not damaged but screening；(3) initial
In the presence of damage but pass through the product of screening.
So then have, first kind product-is initial not damaged and there is no ratios shared by the product of damage after screening are as follows:
Second class product-is initial not damaged but there is ratio shared by the product of damage after screening are as follows:
Third class product-is initially present damage but by ratio shared by the product of screening are as follows:
The working life distribution function P (T of the not damaged product according to obtained in step S110N> t) and in use process
In only because impact stress cause failure product working life distribution function P (TE> t) available above-mentioned three classes product exists
Life distribution function in screening process.
The service life distribution that first kind product-is initial not damaged and there is no the products of damage in screening process after screening
Function are as follows:
Second class product-is initial not damaged but there is service life of the product of damage in screening process after screening and is distributed letter
Number are as follows:
Third class product-is initially present damage but the life distribution function by the product of screening in screening process are as follows:
W in above-mentioned formulas' it is initial undamaged product because of lesion size for the first time caused by impact stress screening.
The lesion size W caused by i-th impact stress in the course of workiMeeting mean value is μ, variance σ2Normal state point
Cloth, initial undamaged product is because of lesion size W for the first time caused by impact stress screenings' meet mean value for μ 's, variance is
Normal distribution, original damage size WMMeeting mean value is μM, variance isNormal distribution, impact stress is made in screening process
At lesion size WsMeeting mean value is μs, variance isNormal distribution when, in formula (10), in formula (11)
According to ratio shared by above-mentioned three classes product and its life distribution function in screening process, available single
Impact stress screening process model are as follows:
T in above-mentioned formulaESSIt is to respectively correspond by the service life of the product after single-impact stress screening
A kind of product, the second class product and third class product.
S130 optimizes the normalizing life distribution function according to the life expectancy of product, the single-impact after being optimized
Stress screening condition, the screening conditions include screening stress.
For the product developed, the reliability of the life expectancy of product is an important design objective, usually
Wish the reliability of the life expectancy of promotion product.
Step S130 mainly passes through the normalizing longevity for the product that do not fail after following two schemes optimization single-impact stress screenings
Order distribution function:
The optimization of screening conditions is carried out according to following formula, to obtain optimal screening conditions:
Alternatively, the optimization of screening conditions is carried out according to following formula, to obtain optimal screening conditions:
Wherein, TgFor the life expectancy of product.
It should be noted that formula (13) and formula (14) can generally be investigated in screening stress by the method for simulation calculation
The possible range of magnitude s in the different reliability or the expectsted of working life of product, and finally choose optimal value.
The method of the present embodiment is particularly suitable for the product that lesion size caused by impact stress meets normal distribution, this reality
The reliability model that example establishes product according to the failure threshold of product is applied, not damaged product and in use only is respectively obtained
Because impact stress leads to the working life distribution function of the product of failure；Failure threshold based on product is to determine that value establishes single
Impact stress screening process model, it is initial not damaged but screen in the product that do not fail after the single-impact stress screening made
There is the product of damage afterwards and be initially present damage but pass through the product screened has different screening life distribution functions, therefore
It is different with the product of generation defect after initial intact but screening that screening technique of the invention can be applicable in initial not damaged product
The situation of lifetime function enriches the application scenarios of single-impact stress screening；The present invention is excellent also according to the life expectancy of product
Change the normalizing life distribution function of product of not failing after single-impact stress screening, so as to the single-impact after being optimized
Stress screening condition realizes that the screening conditions optimization of single-impact stress screening is played certain guidance and made to above-mentioned average case
With.
Embodiment two
The optimization method of repeat impact stress screening condition in embodiment one is suitable for initial not damaged product and initially
The product that defect is generated after intact but screening has the average case of different lifetime functions, is particularly suitable for damage caused by impact stress
Hurt the product that size meets normal distribution.Such as the solder joint with micro-crack during receiving external impact, crackle will gradually
Extension, the fracture failure when crack size reaches a threshold value, thus the single-impact stress screening condition in embodiment one
Optimization method can be used for the single-impact stress screening of solder joint.
When to single-impact stress screening process model building, it is assumed that substrate crash rate r (t)=0.001 of not damaged product,
Nonhomogeneous Poisson distribution intensity function lambda (t)=0.001, failure threshold Dw=4, ratio π=0.7 of initial not damaged product, just
Begin it is not damaged but screen after exist damage product ratio ρ (s)=1-exp [- 0.001s], the projected life T of productg=
100。
Present embodiment assumes that lesion size W caused by i-th impact stress in the course of workiMeeting mean value is μ=0.2,
Variance is σ2=0.2 normal distribution, initial undamaged product is because of lesion size W for the first time caused by impact stress screenings' symbol
Conjunction mean value is μ 's=0.1, variance isNormal distribution, original damage size WMMeeting mean value is μM=0.8, variance
ForNormal distribution, lesion size W caused by impact stress in screening processsMeeting mean value is μs=0.02s, side
Difference isNormal distribution.
According to above-mentioned parameter, Fig. 2 gives initial undamaged product and increases with impact stress and produce in screening process
The probability of raw damage, from figure 2 it can be seen that initially intact product is under the action of impact stress, with impact stress
It is also bigger to increase the probability that initial intact product generates damage.
In the case of Fig. 3 gives different impact stress, product is in projected life TgWhen reliability.It can from Fig. 3
Out, if according to product is maximized in the criterion of projected life end reliability, the magnitude s=for the optimal screening stress that should be chosen
158。
Embodiment three
The present embodiment provides a kind of single-impact stress screening condition using the design concept that is the same as example 1
Optimize device.
Fig. 4 is the optimization apparatus structure block diagram of single-impact stress screening condition provided in this embodiment, as shown in figure 4,
The device includes:
Reliability modeling unit 41 establishes the reliability model of product for the failure threshold according to product, obtains lossless
The working life distribution function of injured labour product and in use only because impact stress leads to the working life point of the product of failure
Cloth function.
Wherein, the working life distribution function of not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
T in above-mentioned formulaNFor the service life of not damaged product, TEFor in use only because impact stress causes to fail
Life of product, r (x) is the substrate crash rate of not damaged product, suffered accumulative number of shocks when N (t) is time t, WiFor
Lesion size caused by i-th impact stress, W in the course of workMFor the original damage size of product, DwFor the failure threshold of product
Value.
Single-impact stress screening process model building unit 42 is to determine that value establishes single for the failure threshold based on product
Impact stress screening process model, the normalizing life distribution function for the product that obtains not failing after single-impact stress screening are described
The product that do not fail after single-impact stress screening includes: initial not damaged and there is no the products of damage, initial lossless after screening
There is the product of damage after wound but screening and is initially present damage but passes through the product of screening；Wherein after initial not damaged but screening
There are the product of damage and it is initially present damage but there is different life distribution functions by the product of screening.
In an implementation of the present embodiment, single-impact stress screening process model building unit 42 includes:
Ratio computing module is led to for carrying out single-impact stress screening to product according to the failure threshold of product
The product that do not fail after crossing single-impact stress screening, and calculate it is initial not damaged and after screening there is no the product of damage, just
Begin to there is the product damaged after not damaged but screening and be initially present damage but rush all by single by the product of screening
Hit ratio shared in the product not failed after stress screening；
Life distribution function computing module, for according to the longevity of the not damaged product work life distribution function and it is described
Only because impact stress causes the working life distribution function of the product of failure to calculate every class product in screening process in use process
In life distribution function；
Model building module, the service life for the ratio according to shared by every class product and its in screening process are distributed letter
Number, establishes single-impact stress screening process model, the normalizing service life point for the product that obtains not failing after single-impact stress screening
Cloth function.
Wherein, there is no ratio and its longevity in screening process shared by the product of damage after initial not damaged and screening
Order distribution function difference successively are as follows:
There is ratio shared by the product of damage and its distribution of the service life in screening process after initial not damaged but screening
Function is successively are as follows:
It is initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
Single-impact stress screening process model is
π in above-mentioned formula is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial lossless
There is the ratio of the product of damage, W after wound but screeningsFor lesion size caused by impact stress in screening process, Ws' it is initial
Lesion size for the first time caused by undamaged product is screened because of impact stress, TESSTo pass through the product of single-impact stress screening
Service life.
Screening conditions optimize unit 43, and screening conditions optimize unit, for returning according to the optimization of the life expectancy of product
One life distribution function, the single-impact stress screening condition after being optimized, the screening conditions include screening stress.
In a preferred embodiment of this embodiment, screening conditions optimize unit 43, are specifically used for according to formulaDo not fail the normalizing life distribution function of product after optimization single-impact stress screening；Or
Person, according to formulaIt does not fail normalizing longevity of product after optimization single-impact stress screening
Order distribution function；Wherein, TgFor the life expectancy of product.
The specific working mode of each unit module of apparatus of the present invention embodiment may refer to embodiment of the method for the invention,
Details are not described herein.
In conclusion the present invention provides the optimization method and device of a kind of single-impact stress screening condition, the present invention
The reliability model that product is established according to the failure threshold of product respectively obtains not damaged product and in use only because of punching
Hitting stress leads to the working life distribution function of product of failure；It is to determine that value establishes single by the failure threshold based on product
Impact stress screening process model, it is initial not damaged but screen in the product that do not fail after the single-impact stress screening made
There is the product of damage afterwards and be initially present damage but pass through the product screened has different screening life distribution functions.Cause
This, screening technique of the invention, which can be applicable in the product for generating defect after initial not damaged product and initial intact but screening, to be had not
With the average case of lifetime function, the application scenarios of single-impact stress screening are enriched；Expectation of the present invention also according to product
Do not fail the normalizing life distribution function of product after service life optimization single-impact stress screening, so as to the list after being optimized
Secondary Shocks stress screening condition plays the screening conditions optimization of above-mentioned average case realization single-impact stress screening certain
Directive function.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the scope of the present invention.It is all
Any modification, equivalent replacement, improvement and so within the spirit and principles in the present invention, are all contained in protection scope of the present invention
It is interior.
Claims (8)
1. a kind of optimization method of single-impact stress screening condition, which is characterized in that the described method includes:
The reliability model that product is established according to the failure threshold of product, obtain not damaged product working life distribution function and
In use only because impact stress leads to the working life distribution function of the product of failure；
Failure threshold based on product is to determine that value establishes single-impact stress screening process model, obtains single-impact stress sieve
Do not fail the normalizing life distribution function of product after choosing, and the product that do not fail after the single-impact stress screening includes: initial nothing
Damage and after screening there is no the product of damage, it is initial not damaged but there is the product of damage after screening and be initially present damage but
Pass through the product of screening；Wherein there is the product of damage after initial not damaged but screening and is initially present damage but passes through screening
Product has different life distribution functions；
Optimize the normalizing life distribution function according to the life expectancy of product, the single-impact stress screening item after being optimized
Part, the screening conditions include screening stress；
Wherein, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the life of product of failure, r
It (x) is the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being time t, WiIt is in the course of work i-th
Lesion size caused by Secondary Shocks stress, WMFor the original damage size of product, DwFor the failure threshold of product.
2. the method according to claim 1, wherein the failure threshold based on product is to determine that value establishes list
Secondary Shocks stress screening process model includes:
Single-impact stress screening is carried out to product according to the failure threshold of product, is obtained by after single-impact stress screening
Do not fail product, and calculates that initial not damaged and there is no the products of damage, initial not damaged but there is damage after screening after screening
The product of wound and the production for being initially present damage but not failed after all stress screenings by single-impact by the product of screening
Shared ratio in product；
According to the working life distribution function of the not damaged product and described in use only because impact stress causes to lose
The working life distribution function of the product of effect calculates life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, single-impact stress screening is established
Process model, the normalizing life distribution function for the product that obtains not failing after single-impact stress screening.
3. according to the method described in claim 2, it is characterized in that,
There is no ratio shared by the product of damage and its service life in screening process point after the initial not damaged and screening
Cloth function difference is successively are as follows:
There is ratio shared by the product of damage and its distribution of the service life in screening process after the initial not damaged but screening
Function is successively are as follows:
It is described to be initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
The single-impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is deposited after being initially not damaged but screening
In the ratio of the product of damage, WsFor lesion size caused by impact stress in screening process, W 'sFor initial undamaged product
Because of lesion size for the first time caused by impact stress screening, TESSTo pass through the service life of the product of single-impact stress screening.
4. according to the method described in claim 3, it is characterized in that, described optimize the normalizing longevity according to the life expectancy of product
Distribution function is ordered, the single-impact stress screening condition after being optimized includes:
According to formulaOptimize the normalizing for the product that do not fail after the single-impact stress screening
Life distribution function；Alternatively,
According to formulaOptimize the product that do not fail after the single-impact stress screening
Normalizing life distribution function；
Wherein, TgFor the life expectancy of product.
5. a kind of optimization device of single-impact stress screening condition, which is characterized in that described device includes:
Reliability modeling unit establishes the reliability model of product for the failure threshold according to product, obtains not damaged product
Working life distribution function and in use only because impact stress cause failure product working life distribution function；
Single-impact stress screening process model building unit is to determine that value is established single-impact and answered for the failure threshold based on product
Power screening process model, the normalizing life distribution function for the product that obtains not failing after single-impact stress screening, the single punching
It hits after stress screening after the product that do not fail includes: initially not damaged and screening and product, the initial not damaged but sieve of damage is not present
There is the product of damage after choosing and is initially present damage but passes through the product of screening；Wherein there is damage after initial not damaged but screening
The product of wound and be initially present damage but by screening product have different life distribution functions；
Screening conditions optimize unit, for optimizing the normalizing life distribution function according to the life expectancy of product, are optimized
Single-impact stress screening condition afterwards, the screening conditions include screening stress；
Wherein, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the life of product of failure, r
It (x) is the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being time t, WiIt is in the course of work i-th
Lesion size caused by Secondary Shocks stress, WMFor the original damage size of product, DwFor the failure threshold of product.
6. device according to claim 5, which is characterized in that the single-impact stress screening process model building unit packet
It includes:
Ratio computing module obtains passing through list for carrying out single-impact stress screening to product according to the failure threshold of product
The product that do not fail after Secondary Shocks stress screening, and the product damaged, initial nothing is not present after calculating initial not damaged and screening
There is the product of damage after damage but screening and is initially present damage but is answered all by single-impact by the product of screening
Shared ratio in the product not failed after power screening；
Life distribution function computing module, for according to the working life distribution function of the not damaged product and described using
In the process only because impact stress causes the working life distribution function of the product of failure to calculate every class product in screening process
Life distribution function；
Model building module is built for the ratio according to shared by every class product and its life distribution function in screening process
Vertical single-impact stress screening process model, the normalizing service life distribution letter for the product that obtains not failing after single-impact stress screening
Number.
7. device according to claim 6, which is characterized in that there is no the productions of damage after the initial not damaged and screening
Ratio shared by product and its difference of the life distribution function in screening process are successively are as follows:
There is ratio shared by the product of damage and its distribution of the service life in screening process after the initial not damaged but screening
Function is successively are as follows:
It is described to be initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
The single-impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is deposited after being initially not damaged but screening
In the ratio of the product of damage, WsFor lesion size caused by impact stress in screening process, W 'sFor initial undamaged product
Because of lesion size for the first time caused by impact stress screening, TESSTo pass through the service life of the product of single-impact stress screening.
8. device according to claim 7, which is characterized in that the screening conditions optimize unit, are specifically used for according to public affairs
FormulaOptimize the normalizing service life distribution letter for the product that do not fail after the single-impact stress screening
Number；Alternatively, according to formulaOptimize production of not failing after the single-impact stress screening
The normalizing life distribution function of product；Wherein, TgFor the life expectancy of product.
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