CN106021783B - A kind of optimization method and device of repeat impact stress screening condition - Google Patents
A kind of optimization method and device of repeat impact stress screening condition Download PDFInfo
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Abstract
The invention discloses the optimization methods and device of a kind of repeat impact stress screening condition.This method comprises: obtaining the working life distribution function of not damaged product to the Reliability modeling of product, and in use only because impact stress leads to the working life distribution function of the product of failure；According to the working life distribution function of not damaged product and in use only because impact stress leads to the working life distribution function of the product of failure to repeat impact stress screening process model building, the normalizing life distribution function for the product that obtains not failing after repeat impact stress screening；Optimize the normalizing life distribution function according to the life expectancy of product, the repeat impact stress screening condition after being optimized, the screening conditions include screening number and screening stress.The present invention can carry out repeat impact stress screening to product, and can play certain directive function to the screening conditions optimization of repeat impact stress screening is realized.
Description
Technical field
The present invention relates to reliability engineering technique field, in particular to a kind of optimization side of repeat impact stress screening condition
Method and device.
Background technique
In the process of product development, environmental stress screening test is that the common product of rejecting of one kind introduces in the fabrication process
Potential defect, the effective means of damage.For example, before with satellite launch, often needing to carry out device for aerospace electron product
The environmental stress screenings at different levels such as grade, plate grade, single machine grade.Currently, the selection for environmental stress screening experimental condition, often root
It determines according to engineering experience or all kinds of specifications, is seldom determined according to the practical development of specific products, applicable cases optimization.This ring
There may be following problems for the selection mode of border stress screening experimental condition: first, probably due to excessively high experimental condition causes
Originally there is defect, damage in intact product；Second, probably due to excessive screening cause unnecessary testing expenses and when
Between.
Currently, it is seldom about the research that environmental stress screening Experiment Modeling and experimental condition optimize, in the prior art mainly
For single-impact stress, research of the screening test condition to the influence of life of product characteristic after test is carried out.Due to existing skill
Art only accounts for the test process of single-impact stress screening, and development repeatedly punching is likely that there are in actual product screening process
The situation of stress screening is hit, therefore, it is necessary to propose a kind of screening conditions prioritization scheme based on repeat impact stress screening.
Summary of the invention
In view of the above problems, the present invention provides the optimization method and device of a kind of repeat impact stress screening condition, with
Solve the problems, such as that the prior art is not suitable for repeat impact stress screening.
In order to achieve the above objectives, the technical scheme of the present invention is realized as follows:
On the one hand, the present invention provides a kind of optimization method of repeat impact stress screening experimental condition, the method packets
It includes:
To the Reliability modeling of product, the working life distribution function of not damaged product is obtained, and in use
Only because impact stress leads to the working life distribution function of the product of failure；
According to the working life distribution function of the not damaged product and described in use only because impact stress is led
The working life distribution function for causing the product of failure obtains repeat impact stress sieve to repeat impact stress screening process model building
Do not fail the normalizing life distribution function of product after choosing；
Optimize the normalizing life distribution function according to the life expectancy of product, the repeat impact stress sieve after being optimized
Condition is selected, the screening conditions include impact screening number and screening stress.
Preferably, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the product longevity of failure
Life, r (x) are the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being working time t, WiFor work
Lesion size caused by i-th impact stress in the process, WMFor the original damage size of product, DwFor the failure threshold of product.
Preferably, described according to the working life distribution function of the not damaged product and in use only because of impact
Stress leads to the working life distribution function of the product of failure, includes: to repeat impact stress screening process model building
Repeat impact stress screening is carried out to product, and the product by not failing after repeat impact stress screening is carried out
Classification；Wherein, it is damaged by the product not failed after repeat impact stress screening including being not present after initial not damaged and screening
Product, initial not damaged but there is the product of damage after screening and be initially present damage but by the product of screening；
Every class product ratio shared in all products by repeat impact stress screening is calculated, and according to described
The working life distribution function of not damaged product and it is described in use only because impact stress cause failure product work
Make life distribution function, calculates life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, repeat impact stress is established
Screening process model.
Preferably, there is no ratio shared by the product of damage and its in screening process after the initial not damaged and screening
In life distribution function respectively successively are as follows:
,
There is ratio and its service life in screening process shared by the product of damage after the initial not damaged but screening
Distribution function is successively are as follows:
,
It is described to be initially present damage but by ratio shared by the product of screening and its distribution of the service life in screening process
Function is successively are as follows:
,
The repeat impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial not damaged but screens
There is the ratio of the product of damage afterwards, N is that number is screened in the impact of repeat impact stress screening, and n is initial undamaged product
Damage is generated in the screening of n-th impact stress, M is initial not damaged but generates damage in the screening of n-th impact stress
Product number, WsiFor lesion size caused by i-th impact stress in screening process, W'MIt is initial undamaged product because of punching
Hit caused by stress screening lesion size for the first time, TESSTo pass through the service life of the product after repeat impact stress screening.
Preferably, described that the normalizing life distribution function is optimized according to the life expectancy of product, it is more after being optimized
Secondary Shocks stress screening condition includes:
According to formulaOptimize production of not failing after the repeat impact stress screening
The normalizing life distribution function of product；Alternatively,
According to formulaIt is not lost after optimizing the repeat impact stress screening
Imitate the normalizing life distribution function of product；
Wherein, TgFor the life expectancy of product.
On the other hand, the present invention provides a kind of optimization device of repeat impact stress screening experimental condition, described devices
Include:
Reliability modeling unit obtains the working life distribution letter of not damaged product for the Reliability modeling to product
Number, and in use only because impact stress leads to the working life distribution function of the product of failure；
Repeat impact stress screening process model building unit, for the working life distribution function according to the not damaged product
With described in use only because impact stress leads to the working life distribution function of the product of failure, to repeat impact stress
Screening process modeling, the normalizing life distribution function for the product that obtains not failing after repeat impact stress screening；
Screening conditions optimize unit, for optimizing the normalizing life distribution function according to the life expectancy of product, obtain
Repeat impact stress screening condition after optimization, the screening conditions include impact screening number and screening stress.
Preferably, the working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the product longevity of failure
Life, r (x) are the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being working time t, WiFor work
Lesion size caused by i-th impact stress in the process, WMFor the original damage size of product, DwFor the failure threshold of product.
Preferably, the repeat impact stress screening process model building unit includes:
Categorization module, for carrying out repeat impact stress screening to product, and to by after repeat impact stress screening not
The product of failure is classified；Wherein, include initial not damaged by the product not failed after repeat impact stress screening and sieve
There is no the products of damage, initial not damaged but there is the product of damage after screening and be initially present damage but pass through screening after choosing
Product；
Computing module, for calculating every class product ratio shared in all products by repeat impact stress screening
Example, and according to the working life distribution function of the not damaged product and described in use only because impact stress causes
The working life distribution function of the product of failure calculates life distribution function of every class product in screening process；
Module is established, for the ratio according to shared by every class product and its life distribution function in screening process, is built
Vertical repeat impact stress screening process model.
Preferably, there is no ratio shared by the product of damage and its in screening process after the initial not damaged and screening
In life distribution function respectively successively are as follows:
,
There is ratio and its service life in screening process shared by the product of damage after the initial not damaged but screening
Distribution function is successively are as follows:
,
It is described to be initially present damage but by ratio shared by the product of screening and its distribution of the service life in screening process
Function is successively are as follows:
,
The repeat impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial not damaged but screens
There is the ratio of the product of damage afterwards, N is that number is screened in the impact of repeat impact stress screening, and n is initial undamaged product
Damage is generated in the screening of n-th impact stress, M is initial not damaged but generates damage in the screening of n-th impact stress
Product number, WsiFor lesion size caused by i-th impact stress in screening process, W'MIt is initial undamaged product because of punching
Hit caused by stress screening lesion size for the first time, TESSTo pass through the service life of the product after repeat impact stress screening.
Preferably, the screening conditions optimize unit, are specifically used for according to formulaOptimize the normalizing service life distribution for the product that do not fail after the repeat impact stress screening
Function；Alternatively, according to formulaOptimize after the repeat impact stress screening not
The normalizing life distribution function of failure product；Wherein, TgFor the life expectancy of product.
The beneficial effect of the embodiment of the present invention is: the present invention is respectively obtained lossless by establishing the reliability model of product
Injured labour product and in use only because impact stress leads to the working life distribution function of the product of failure, and according to acquired
The working life distribution function of two types product establish repeat impact stress screening process model, to obtain repeat impact
Do not fail the service life distribution function of product after stress screening；Therefore, screening technique of the invention can be applicable in product into
The situation of row repeat impact stress screening；The present invention does not lose after optimizing repeat impact stress screening also according to the life expectancy of product
The normalizing life distribution function of product is imitated, so as to the repeat impact stress screening condition after being optimized, to said circumstances
Realize that certain directive function is played in the screening conditions optimization of repeat impact stress screening.
Detailed description of the invention
Fig. 1 is the optimization method flow chart for the repeat impact stress screening condition that embodiment one provides；
Fig. 2 is the product task longevity under the conditions of different impact stress in certain screening numbers range that embodiment two provides
Order the reliability curves figure at end；
Fig. 3 is the optimization apparatus structure block diagram for the repeat impact stress screening condition that embodiment three provides.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with attached drawing to embodiment party of the present invention
Formula is described in further detail.
Embodiment one:
Since the prior art only accounts for the test process of single-impact stress screening, and in actual product screening process very
There may be the situations for carrying out repeat impact stress screening.For carrying out the situation of repeat impact stress screening, not only need to consider
Influence of the impact stress size to product reliability after screening also needs to consider test number (TN) to the shadow of product reliability after screening
It rings.In view of above-mentioned consideration, for the situation of repeat impact stress screening, the present invention discloses a kind of repeat impact stress screening condition
Optimization method.
Fig. 1 is the optimization method flow chart of repeat impact stress screening condition provided in this embodiment, as shown in Figure 1, should
Method includes:
S110 obtains the working life distribution function of not damaged product to the Reliability modeling of product, and is using
Only because impact stress leads to the working life distribution function of the product of failure in journey.
In manufacture course of products, due to off-gauge material or other factors, may produce it is some there are latent defect,
The product of damage (such as: micro-crack).These defective products are easy to lose because of the damage of accumulation in use
Effect, relative to there is no the product of latent defect, damage, the failure mode-for just having one kind additional is because of accumulated damage failure
Mode, therefore the product reliability model that the present embodiment is established distinguishes not damaged product and because impact stress leads to the production of failure
Product, and obtain the working life distribution function of these two types of products.
It is frequently subjected to meet the impact of nonhomogeneous Poisson distribution in the course of work of product, under work condition environment, it is assumed that produce
Suffered accumulation number of shocks is N (t) in product working time t, and nonhomogeneous Poisson distribution intensity function is λ (t), and there will be no latent
T is denoted as in the service life of defect, the product of damage namely lossless productN, corresponding substrate crash rate is r (t).Also, this implementation
Official holiday is located in work condition environment, and impact stress can make the damaged products size further expansion that there is latent defect originally until reaching
To failure threshold Dw, and the product that latent defect is not present originally is insensitive to impact stress, i.e., it will not be because of under work condition environment
Impact stress lead to the generation accordingly damaged, finally stop working because of other failure modes.
Based on foregoing description, for example following formula (1) institutes of the working life distribution function of the not damaged product in the present embodiment
Show:
R (x) in formula (1) is the substrate crash rate of not damaged product；It should be noted that base described in the present embodiment
Bottom crash rate is not consider the crash rate of accumulated damage failure mode.
When product working time t, the lesion size such as formula (2) that there is the product of latent defect originally is shown:
W in formula (2)iFor lesion size caused by i-th impact stress in the course of work, WMFor the initial damage of product
Hurt size, usual WMMuch smaller than WiSize, thus formula (2) can be approximately:
It is available according to formula (2) or (3), in use only because impact stress leads to the work of the product of failure
Life distribution function, specific as shown in formula (4):
For ease of understanding the present embodiment formula (4) define in use only because impact stress cause failure product
Working life distribution function meaning, the present embodiment is illustrated by following specific implementations.
In this specific implementation, it is assumed that failure threshold DwMeet the exponential distribution that parameter is θ, WiFor independent same distribution
Stochastic variable when, above-mentioned formula (4) can be derived further are as follows:
W in formula (5)W() is variable WiMoment generating function.
For a collection of product newly developed, it is assumed that the ratio of no defective product is π, and correspondingly the ratio of defective product is
The service life of product is denoted as T by 1- π, then the working life distribution function of product are as follows:
Formula (6) defines the working life of the product randomly selected from a collection of product of production in use point
Cloth function.
S120, according to the working life distribution function of not damaged product and in use only because impact stress causes to lose
The working life distribution function of the product of effect obtains after repeat impact stress screening not repeat impact stress screening process model building
The normalizing life distribution function of failure product.
In this step " according to the working life distribution function of not damaged product and in use only because of impact stress
Cause the working life distribution function of the product of failure to repeat impact stress screening process model building " specifically:
Repeat impact stress screening is carried out to product, and the product by not failing after repeat impact stress screening is carried out
Classification；Wherein, it is damaged by the product not failed after repeat impact stress screening including being not present after initial not damaged and screening
Product, initial not damaged but there is the product of damage after screening and be initially present damage but by the product of screening；
Every class product ratio shared in all products by repeat impact stress screening is calculated, and according to lossless
The working life distribution function of injured labour product and in use only because impact stress leads to the working life point of the product of failure
Cloth function calculates life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, repeat impact stress is established
Screening process model.
It should be noted that above-mentioned three types can be obtained due to when carrying out repeat impact stress screening to product
Do not fail the life distribution function of product, secondary in order to obtain optimal impact screening in repeat impact screening process in subsequent processing
The life distribution function of the product that do not fail of these three types is weighted summation process by number and screening stress, the present embodiment,
So as to the life distribution function of product of not failing after indicating screening with the expression formula of a life distribution function；It is i.e. of the invention
In normalizing life distribution function only illustrate with the service life distribution of all kinds of products that do not fail after the statement screening of expression formula, not
It is that all kinds of life distribution functions for not failing product are normalized.
For the method for building up for more fully understanding the repeat impact stress screening process model in step S120, the present embodiment leads to
Following implementations are crossed to be illustrated.
In the impact stress screening test of this implementation, the impact that a magnitude is s (is generally rushed in work condition environment
Hit the several times of stress intensity) it is applied to each product for participating in screening.
For original defective product, it is W that i-th impact screening test, which will introduce an additional size,siDamage,
Its size increases and random increase with s.In addition, the original intact product of a part produced in impact stress screening test it is scarce
It falls into, the ratio of this portioned product is denoted as ρ (s), have 0≤ρ (s)≤1, and ρ (s) equally increases and random increase with s.Wherein,
After impact stress screening test, the sample of failure will be rejected, and the sample not failed then comes into operation.
This implementation is after terminating impact stress screening test, and the product not failed can be divided into three classes: (1) initial nothing
There is no the products of damage after damage and screening；(2) there is the product of damage after initial not damaged but screening；(3) it is initially present
Damage but the product by screening.
So then have, first kind product-is initial not damaged and there is no ratios shared by the product of damage after screening are as follows:
It for the second class product, can also further be segmented: i.e. initial not damaged but generated when n-th is impacted and screened
The product of defect；Given M such products then generate defect when n-th is impacted and screened and impact eventually by n times and screen
Product ratio are as follows:
Wherein, WsiFor lesion size caused by i-th impact stress in screening process, W'MFor initial undamaged product
Because of lesion size for the first time caused by impact stress screening, usual W'MRelative to WSiAll very littles.
According to foregoing description, the second class product-is initial not damaged but there is ratio shared by the product of damage after screening
Are as follows:
Third class product-is initially present damage but by ratio shared by the product of screening are as follows:
The working life distribution function P (T of the not damaged product according to obtained in step S110N> t) and in use process
In only because impact stress cause failure product working life distribution function P (TE> t) available above-mentioned three classes product exists
Life distribution function in screening process.
The service life distribution that first kind product-is initial not damaged and there is no the products of damage in screening process after screening
Function are as follows:
Second class product-is initial not damaged but generates the product of defect in screening process when n-th is impacted and screened
Life distribution function are as follows:
Third class product-is initially present damage but the life distribution function by the product of screening in screening process are as follows:
It is available multiple according to ratio shared by above-mentioned three classes product and its life distribution function in screening process
Impact stress screening process model are as follows:
Wherein, in formula (14)It is special
Not, as failure threshold DwMeet the exponential distribution that parameter is θ, WiWhen for independent identically distributed stochastic variable, have:
T in above-mentioned formulaESSIt is to respectively correspond by the service life of the product after repeat impact stress screening
In the product and third class product for receiving to generate damage when the screening of n-th impact stress in a kind of product, the second class product.
S130 optimizes the normalizing life distribution function according to the life expectancy of product, the repeat impact after being optimized
Stress screening condition, the screening conditions include impact screening number and screening stress.
For the product developed, the reliability of the life expectancy of product is an important expectation index, usually
Wish the reliability of the life expectancy of promotion product.
Step S130 mainly passes through the normalizing longevity for the product that do not fail after following two schemes optimization repeat impact stress screenings
Order distribution function:
The optimization of screening conditions is carried out according to following formula, to obtain optimal screening conditions:
Alternatively, the optimization of screening conditions is carried out according to following formula, to obtain optimal screening conditions:
Wherein, TgFor the life expectancy of product.
It is screened it should be noted that formula (16) and formula (17) can generally be investigated by the method for simulation calculation in impact
The times N reliability or the expectsted of working life different with product in the possible range of the magnitude s of screening stress, and finally choose most
The figure of merit.
The method of the present embodiment is particularly suitable for the product of failure threshold index of coincidence distribution, and the present embodiment is produced by establishing
The reliability model of product respectively obtains not damaged product and in use only because impact stress leads to the work of the product of failure
Make life distribution function, and repeat impact stress sieve is established according to the working life distribution function of obtained two types product
Process model is selected, thus the service life distribution function for the product that do not fail after obtaining repeat impact stress screening；Therefore, of the invention
Screening technique can be applicable in product carry out repeat impact stress screening situation；Life expectancy of the present invention also according to product
Do not fail the normalizing life distribution function of product after optimization repeat impact stress screening, so as to the multiple punching after being optimized
Stress screening condition is hit, the screening conditions optimization of repeat impact stress screening, which is played certain guidance and made, to be realized to said circumstances
With.
Embodiment two
The optimization method of repeat impact stress screening condition in embodiment one, which is applicable in, carries out repeat impact stress to product
The screening scene of screening is particularly suitable for the product of failure threshold index of coincidence distribution.Such as the solder joint with micro-crack is receiving
During external impact, crackle will gradually extend, the fracture failure when crack size reaches a threshold value, thus embodiment one
In the optimization method of repeat impact stress screening condition can be used for the repeat impact stress screening of solder joint.
When to repeat impact stress screening process model building, it is assumed that substrate crash rate r (t)=0.1 of not damaged product, it is non-
Homogeneous Poisson distribution intensity function λ (t)=1, failure threshold DwParameter θ=1, task time τ=4.0, initial not damaged product
Ratio π=0.7, ratio ρ (s)=1-exp [- 0.015s] of product that is initial not damaged but there is damage after screening, i-th punching
Hit lesion size W caused by stressiMeet the exponential distribution that parameter is 3, then has WiMoment generating functionAnd in order to portray
Damage WsiWith the relationship of screening stress s, W is definedsiMeeting parameter isExponential distribution, i.e.,
It should be noted that the present embodiment chooses above-mentioned characterisitic parameter according to product characteristic and history cumulative number according to estimates
Numerical value.
According to above-mentioned parameter, Fig. 2 is given in certain screening numbers range, the product task under the conditions of different impact stress
The reliability curves figure of service life Mo.It is according to fig. 2 as a result, optimum option screening times N=6 and screening stress s=6.
Embodiment three:
The present embodiment provides a kind of repeat impact stress screening condition using the expectation design being the same as example 1
Optimize device.
Fig. 3 is the optimization apparatus structure block diagram of repeat impact stress screening experimental condition provided in this embodiment, such as Fig. 3 institute
Show, which includes:
Reliability modeling unit 31 obtains the working life distribution of not damaged product for the Reliability modeling to product
Function, and in use only because impact stress leads to the working life distribution function of the product of failure.
Wherein, the working life distribution function of not damaged product is speciallyIt is using
Only it is specially because impact stress leads to the working life distribution function of product of failure in the process
T in above-mentioned formulaNFor the service life of not damaged product, TEFor in use only because impact stress causes to fail
Life of product, r (x) is the substrate crash rate of not damaged product, suffered accumulative number of shocks when N (t) is working time t,
WiFor lesion size caused by i-th impact stress in the course of work, WMFor the original damage size of product, DwFor the mistake of product
Imitate threshold value.
Repeat impact stress screening process model building unit 32, for being distributed letter according to the working life of the not damaged product
It is several and described in use only because impact stress leads to the life distribution function of the work product of failure, repeat impact is answered
The modeling of power screening process, the normalizing life distribution function for the product that obtains not failing after repeat impact stress screening.
In the implementation of the present embodiment, repeat impact stress screening process model building unit 32 includes:
Categorization module, for carrying out repeat impact stress screening to product, and to by after repeat impact stress screening not
The product of failure is classified；Wherein, include initial not damaged by the product not failed after repeat impact stress screening and sieve
There is no the products of damage, initial not damaged but there is the product of damage after screening and be initially present damage but pass through screening after choosing
Product；
Computing module, for calculating every class product ratio shared in all products by repeat impact stress screening
Example, and according to the working life distribution function of the not damaged product and described in use only because impact stress causes
The working life distribution function of the product of failure calculates life distribution function of every class product in screening process；
Module is established, for the ratio according to shared by every class product and its life distribution function in screening process, is built
Vertical repeat impact stress screening process model.
Wherein, there is no ratio and its longevity in screening process shared by the product of damage after initial not damaged and screening
Order distribution function difference successively are as follows:
,
There is ratio shared by the product of damage and its distribution of the service life in screening process after initial not damaged but screening
Function is successively are as follows:
,
It is initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
,
The repeat impact stress screening process model is
π in above-mentioned formula is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is initial lossless
There is the ratio of the product of damage after wound but screening, N is that number is screened in the impact of repeat impact stress screening, and n is initial lossless
The product of wound generates damage when n-th impact stress is screened, and M is initial not damaged but produces in the screening of n-th impact stress
The product number of raw damage, WsiFor lesion size caused by i-th impact stress in screening process, W'MIt is initial undamaged
Lesion size for the first time caused by product is screened because of impact stress, TESSTo pass through the use of the product after repeat impact stress screening
Service life.
Screening conditions optimize unit 33, for optimizing the normalizing life distribution function according to the life expectancy of product, obtain
Repeat impact stress screening condition after to optimization, the screening conditions include impact screening number and screening stress.
In the implementation of the present embodiment, screening conditions optimize unit 33, are specifically used for according to formulaDo not fail the normalizing life distribution function of product after optimization repeat impact stress screening；
Alternatively, according to formulaDo not fail product after optimization repeat impact stress screening
Normalizing life distribution function；Wherein, TgFor the life expectancy of product.
The specific working mode of each unit module of apparatus of the present invention embodiment may refer to embodiment of the method for the invention,
Details are not described herein.
In conclusion the present invention provides the optimization methods and device of a kind of repeat impact stress screening condition, by building
The reliability model of vertical product respectively obtains not damaged product and in use only because impact stress leads to the product of failure
Working life distribution function, and repeat impact is established according to the working life distribution function of obtained two types product and is answered
Power screening process model, thus the service life distribution function for the product that do not fail after obtaining repeat impact stress screening；Therefore, originally
The screening technique of invention can be applicable in the situation that repeat impact stress screening is carried out to product；Expectation of the present invention also according to product
Do not fail the normalizing life distribution function of product after service life optimization repeat impact stress screening, so as to more after being optimized
Secondary Shocks stress screening condition realizes that certain guidance is played in the screening conditions optimization of repeat impact stress screening to said circumstances
Effect.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the scope of the present invention.It is all
Any modification, equivalent replacement, improvement and so within the spirit and principles in the present invention, are all contained in protection scope of the present invention
It is interior.
Claims (8)
1. a kind of optimization method of repeat impact stress screening condition, which is characterized in that the described method includes:
To the Reliability modeling of product, obtain the working life distribution function of not damaged product, and in use only because
Impact stress leads to the working life distribution function of the product of failure；
According to the working life distribution function of the not damaged product and described in use only because impact stress causes to lose
The working life distribution function of the product of effect, to repeat impact stress screening process model building, after obtaining repeat impact stress screening
Do not fail the normalizing life distribution function of product；
Optimize the normalizing life distribution function according to the life expectancy of product, the repeat impact stress screening item after being optimized
Part, the screening conditions include impact screening number and screening stress；
The working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the life of product of failure, r
It (x) is the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being working time t, WiFor the course of work
Lesion size caused by middle i-th impact stress, DwFor the failure threshold of product.
2. the method according to claim 1, wherein described be distributed according to the working life of the not damaged product
Function and in use only because impact stress cause failure product working life distribution function, to repeat impact stress
Screening process models
Repeat impact stress screening is carried out to product, and the product by not failing after repeat impact stress screening is divided
Class；It wherein, include: initial not damaged by the product not failed after repeat impact stress screening and there is no damages after screening
There is the product of damage after product, initial not damaged but screening and is initially present damage but the product by screening；
Every class product ratio shared in all products by repeat impact stress screening is calculated, and according to described lossless
The life distribution function of injured labour product and it is described in use only because impact stress cause failure product service life be distributed letter
Number, calculates life distribution function of every class product in screening process；
According to ratio shared by every class product and its life distribution function in screening process, repeat impact stress screening is established
Process model.
3. according to the method described in claim 2, it is characterized in that,
There is no ratio shared by the product of damage and its service life in screening process point after the initial not damaged and screening
Cloth function difference is successively are as follows:
,
There is ratio shared by the product of damage and its distribution of the service life in screening process after the initial not damaged but screening
Function is successively are as follows:
,
It is described to be initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
,
The repeat impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is deposited after being initially not damaged but screening
In the ratio of the product of damage, N is that number is screened in the impact of repeat impact stress screening, and M is initial not damaged but rushes in n-th
The product number of damage, W are generated when hitting stress screeningMFor the original damage size of product, WsiIt is impacted for i-th in screening process
Lesion size caused by stress, WM' it is initial undamaged product because of lesion size for the first time caused by impact stress screening, TESS
To pass through the service life of the product after repeat impact stress screening.
4. according to the method described in claim 3, it is characterized in that, described optimize the normalizing longevity according to the life expectancy of product
Distribution function is ordered, the repeat impact stress screening condition after being optimized includes:
According to formulaOptimize the product that do not fail after the repeat impact stress screening
Normalizing life distribution function；Alternatively,
According to formulaOptimize production of not failing after the repeat impact stress screening
The normalizing life distribution function of product；
Wherein, TgFor the life expectancy of product.
5. a kind of optimization device of repeat impact stress screening experimental condition, which is characterized in that described device includes:
Reliability modeling unit obtains the working life distribution function of not damaged product for the Reliability modeling to product, with
And in use only because impact stress leads to the working life distribution function of the product of failure；
Repeat impact stress screening process model building unit, for according to the not damaged product working life distribution function and institute
It states in use only because impact stress leads to the working life distribution function of the product of failure, to repeat impact stress screening
Process model building, the normalizing life distribution function for the product that obtains not failing after repeat impact stress screening；
Screening conditions optimize unit, for optimizing the normalizing life distribution function according to the life expectancy of product, are optimized
Repeat impact stress screening condition afterwards, the screening conditions include impact screening number and screening stress；
The working life distribution function of the not damaged product is specially
It is described to be only specially because impact stress leads to the working life distribution function of product of failure in use
Wherein, TNFor the service life of not damaged product, TEFor in use only because impact stress leads to the life of product of failure, r
It (x) is the substrate crash rate of not damaged product, accumulative number of shocks N (t) suffered when being working time t, WiFor the course of work
Lesion size caused by middle i-th impact stress, DwFor the failure threshold of product.
6. device according to claim 5, which is characterized in that the repeat impact stress screening process model building unit packet
It includes:
Categorization module, for carrying out repeat impact stress screening to product, and to by not failing after repeat impact stress screening
Product classify；Wherein, after including initially not damaged and screening by the product not failed after repeat impact stress screening
There is no there is the product of damage after the product of damage, initial not damaged but screening and be initially present damage but the production by screening
Product；
Computing module, for calculating every class product ratio shared in all products by repeat impact stress screening, with
And according to the working life distribution function of the not damaged product and described in use only because impact stress causes to fail
Product working life distribution function, calculate life distribution function of every class product in screening process；
Module is established, for the ratio according to shared by every class product and its life distribution function in screening process, is established more
Secondary Shocks stress screening process model.
7. device according to claim 6, which is characterized in that there is no the productions of damage after the initial not damaged and screening
Ratio shared by product and its difference of the life distribution function in screening process are successively are as follows:
,
There is ratio shared by the product of damage and its distribution of the service life in screening process after the initial not damaged but screening
Function is successively are as follows:
,
It is described to be initially present damage but by ratio and its life distribution function in screening process shared by the product of screening
Successively are as follows:
,
The repeat impact stress screening process model is
Wherein, π is the ratio of initial not damaged product, and s is the magnitude for screening stress, and ρ (s) is deposited after being initially not damaged but screening
In the ratio of the product of damage, N is that number is screened in the impact of repeat impact stress screening, and M is initial not damaged but rushes in n-th
The product number of damage, W are generated when hitting stress screeningMFor the original damage size of product, WsiIt is impacted for i-th in screening process
Lesion size caused by stress, WM' it is initial undamaged product because of lesion size for the first time caused by impact stress screening, TESS
To pass through the service life of the product after repeat impact stress screening.
8. device according to claim 7, which is characterized in that the screening conditions optimize unit, are specifically used for according to public affairs
FormulaOptimize the normalizing service life point for the product that do not fail after the repeat impact stress screening
Cloth function；Alternatively, according to formulaAfter optimizing the repeat impact stress screening
Do not fail the normalizing life distribution function of product；Wherein, TgFor the life expectancy of product.
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| CN103344515A (en) * | 2013-07-05 | 2013-10-09 | 北京航空航天大学 | Damage calculation method for low-cycle fatigue and high-strength impact coupling based on local stress strain method |
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| CN103344515A (en) * | 2013-07-05 | 2013-10-09 | 北京航空航天大学 | Damage calculation method for low-cycle fatigue and high-strength impact coupling based on local stress strain method |
| WO2015017160A1 (en) * | 2013-07-31 | 2015-02-05 | Qualcomm Incorporated | Handover and reselection searching using predictive mobility |
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