CN105991007A - 参数控制方法以及使用其的集成电路 - Google Patents
参数控制方法以及使用其的集成电路 Download PDFInfo
- Publication number
- CN105991007A CN105991007A CN201510087970.4A CN201510087970A CN105991007A CN 105991007 A CN105991007 A CN 105991007A CN 201510087970 A CN201510087970 A CN 201510087970A CN 105991007 A CN105991007 A CN 105991007A
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- CN
- China
- Prior art keywords
- impedance
- group
- setting
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000012544 monitoring process Methods 0.000 claims description 19
- 239000000725 suspension Substances 0.000 claims description 11
- 230000005611 electricity Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 5
- 206010022000 influenza Diseases 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 8
- 238000013461 design Methods 0.000 description 4
- 101000702132 Homo sapiens Protein spinster homolog 1 Proteins 0.000 description 3
- 101000629319 Homo sapiens Spindlin-1 Proteins 0.000 description 3
- 101000828807 Homo sapiens Spindlin-2A Proteins 0.000 description 3
- 102100027005 Spindlin-1 Human genes 0.000 description 3
- 102100023505 Spindlin-2A Human genes 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L5/00—Automatic control of voltage, current, or power
- H03L5/02—Automatic control of voltage, current, or power of power
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Networks Using Active Elements (AREA)
Abstract
Description
第三设定 | RSET1L | RSET1H |
RSET2L | LL | HL |
RSET2H | LH | HH |
VFB | SL | SH |
ML | V1 | V3 |
MH | V2 | V4 |
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103141328 | 2014-11-27 | ||
TW103141328A TWI533573B (zh) | 2014-11-27 | 2014-11-27 | 參數控制方法以及使用其之積體電路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105991007A true CN105991007A (zh) | 2016-10-05 |
CN105991007B CN105991007B (zh) | 2019-05-31 |
Family
ID=56079844
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510087970.4A Expired - Fee Related CN105991007B (zh) | 2014-11-27 | 2015-02-26 | 参数控制方法以及使用其的集成电路 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9490816B2 (zh) |
CN (1) | CN105991007B (zh) |
TW (1) | TWI533573B (zh) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09264924A (ja) * | 1996-03-28 | 1997-10-07 | Nec Yamaguchi Ltd | Ic検査装置 |
CN103472347A (zh) * | 2012-06-08 | 2013-12-25 | 富泰华工业(深圳)有限公司 | 辅助测试电路及具有该辅助测试电路的芯片及电路板 |
CN103714850A (zh) * | 2012-09-28 | 2014-04-09 | 美国亚德诺半导体公司 | 用于集成电路的数字配置的装置和方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7602627B2 (en) * | 2005-04-28 | 2009-10-13 | Origin Electric Company, Limited. | Electrical power source, operational method of the same, inverter and operational method of the same |
-
2014
- 2014-11-27 TW TW103141328A patent/TWI533573B/zh not_active IP Right Cessation
-
2015
- 2015-02-26 CN CN201510087970.4A patent/CN105991007B/zh not_active Expired - Fee Related
- 2015-05-18 US US14/715,192 patent/US9490816B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09264924A (ja) * | 1996-03-28 | 1997-10-07 | Nec Yamaguchi Ltd | Ic検査装置 |
CN103472347A (zh) * | 2012-06-08 | 2013-12-25 | 富泰华工业(深圳)有限公司 | 辅助测试电路及具有该辅助测试电路的芯片及电路板 |
CN103714850A (zh) * | 2012-09-28 | 2014-04-09 | 美国亚德诺半导体公司 | 用于集成电路的数字配置的装置和方法 |
Also Published As
Publication number | Publication date |
---|---|
CN105991007B (zh) | 2019-05-31 |
TWI533573B (zh) | 2016-05-11 |
US20160156359A1 (en) | 2016-06-02 |
TW201620235A (zh) | 2016-06-01 |
US9490816B2 (en) | 2016-11-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Taiwan City, Taipei China Neihu district Patentee after: Plinway Technology Co.,Ltd. Address before: Taiwan City, Taipei China Neihu district Patentee before: EOSMEM Corp. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20190527 Address after: Kaohsiung City, Taiwan, China Patentee after: PAN-JIT INTERNATIONAL INC. Address before: Taiwan City, Taipei China Neihu district Patentee before: Plinway Technology Co.,Ltd. Effective date of registration: 20190527 Address after: Taiwan City, Taipei China Neihu district Patentee after: EOSMEM Corp. Address before: Hsinchu County, Taiwan, China Patentee before: EOSMEM Corp. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190531 Termination date: 20200226 |