CN105975409A - NandFlash scanning method and system - Google Patents
NandFlash scanning method and system Download PDFInfo
- Publication number
- CN105975409A CN105975409A CN201610283785.7A CN201610283785A CN105975409A CN 105975409 A CN105975409 A CN 105975409A CN 201610283785 A CN201610283785 A CN 201610283785A CN 105975409 A CN105975409 A CN 105975409A
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- Prior art keywords
- nandflash
- equipment
- scanning
- host computer
- scanned
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/10—Program control for peripheral devices
- G06F13/102—Program control for peripheral devices where the programme performs an interfacing function, e.g. device driver
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Abstract
The invention discloses a NandFlash scanning method. The NandFlash scanning method comprises the following steps that: while scanning that a NandFlash in currently connected NandFlash equipment is provided with a pre-set number of available storage blocks, an upper computer writes a pre-set first scan program in the scanned available storage blocks; and, when being electrified again, the NandFlash equipment scans all the storage blocks in the NandFlash according to the first scan program in the available storage blocks. The invention further discloses a NandFlash scanning system. According to the NandFlash scanning method and system disclosed by the invention, the NandFlash scanning time by the upper computer is reduced; and the production efficiency of the NandFlash equipment is increased.
Description
Technical field
The present invention relates to flash memory detection technique field, particularly relate to the scan method of a kind of NandFlash and be
System.
Background technology
It is known that when NandFlash equipment produces, it usually needs NandFlash is scanned.
But NandFlash equipment is generally connected, by computer pair by existing scan mode with computer
The available block storage of the NandFlash in NandFlash equipment is scanned.Due to NandFlash's
The cycle that all block storage is scanned is longer, and the NandFlash that a computer once can scan
The limited amount of equipment, therefore cannot improve the formation efficiency of NandFlash equipment.
Summary of the invention
Present invention is primarily targeted at scan method and the system that a kind of NandFlash is provided, it is intended to reduce
Host computer sweep time to NandFlash, improve the production efficiency of NandFlash equipment.
For achieving the above object, the scan method of a kind of NandFlash that the present invention provides includes following step
Rapid:
There is preset quantity in the NandFlash in host computer scans the NandFlash equipment of current connection
Available block storage time, the first default scanning imaging system is written to the available storage scanned by described host computer
In counterfoil；
When described NandFlash equipment powers on again, described NandFlash equipment is according to available block storage
Described in the first scanning imaging system all block storages in described NandFlash are scanned.
Preferably, described NandFlash equipment is according to can use the first scanning imaging system described in block storage to described
All block storages in NandFlash equipment also include after being scanned:
When described host computer is connected with described NandFlash equipment again, described host computer reads described
The scanning result of NandFlash equipment.
Preferably, also include after the scanning result of the described NandFlash equipment of described host computer reading:
Described host computer carries out reprogramming algorithm management program according to described scanning result to NandFlash.
Preferably, the scan method of described NandFlash also includes:
After all block storages in NandFlash have been scanned, described NandFlash equipment output phase
The information answered.
Additionally, for achieving the above object, the present invention also provides for the scanning system of a kind of NandFlash, described
The scanning system of NandFlash includes host computer and NandFlash equipment, wherein,
Described host computer, in the NandFlash equipment scanning current connection when host computer
When NandFlash exists the available block storage of preset quantity, the first default scanning imaging system is written to scanning
To available block storage in；
Described NandFlash equipment, for when described NandFlash equipment powers on again, according to available
All block storages in described NandFlash are scanned by the first scanning imaging system described in block storage.
Preferably, described host computer is additionally operable to, when described host computer connects with described NandFlash equipment again
When connecing, read the scanning result of described NandFlash equipment.
Preferably, described host computer is additionally operable to, and again compiles NandFlash according to described scanning result
Journey algorithm management program.
Preferably, described NandFlash equipment is additionally operable to, when all block storages in NandFlash are swept
After having retouched, export corresponding information.
During the embodiment of the present invention is by scanning the current NandFlash equipment connected when host computer
When NandFlash exists the available block storage of preset quantity, described host computer is by the first default scanning imaging system
It is written in the available block storage scanned；When described NandFlash equipment powers on again, described
NandFlash equipment is according to can use the first scanning imaging system described in block storage to the institute in described NandFlash
Block storage is had to be scanned.Due to when NandFlash equipment is connected with host computer, only to NandFlash
In several block storages be scanned after, above-mentioned first scanning imaging system can be written to NandFlash
In, and again pass by after simple power supply mode powers at NandFlash equipment, by NandFlash
Block storage in NandFlash is scanned by the first scanning imaging system of storage；Therefore host computer pair is decreased
The sweep time of NandFlash, improve the production efficiency of NandFlash equipment.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of the scan method first embodiment of NandFlash of the present invention；
Fig. 2 is the schematic flow sheet of scan method second embodiment of NandFlash of the present invention；
Fig. 3 is the schematic flow sheet of scan method the 3rd embodiment of NandFlash of the present invention.
The realization of the object of the invention, functional characteristics and advantage will in conjunction with the embodiments, do referring to the drawings further
Explanation.
Detailed description of the invention
Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not used to limit
Determine the present invention.
The present invention provides the scan method of a kind of NandFlash, with reference to Fig. 1, in one embodiment, and should
The scan method of NandFlash comprises the following steps:
Step S10, the NandFlash in host computer scans the NandFlash equipment of current connection deposits
When the available block storage of preset quantity, the first default scanning imaging system is written to scanning by described host computer
To available block storage in；
The scan method of the NandFlash that the embodiment of the present invention provides is mainly used in NandFlash equipment
In generation, for realization, the NandFlash in NandFlash equipment is scanned.
In the present embodiment, above-mentioned NandFlash equipment is the storage device with flash memory capability, such as should
NandFlash equipment can be the storage facilities such as USB flash disk.Specifically, in existing NandFlash equipment
Generally include NandFlash and main control chip, main control chip set up NandFlash and outside equipment
Connecting in bridge, and main control chip and have startup program, this startup program can start NandFlash voluntarily
In the program run, it is also possible to receive the programmed instruction of outside input.
Specifically, above-mentioned host computer can be computer, is provided with the second scanning imaging system in a computer,
For NandFlash in the NandFlash equipment being currently connected with computer is scanned, to obtain
Available block storage (being the good block that can store data) in NandFlash.Scan at the second scanning imaging system
During, it is judged that the available storage that whether there is preset quantity in NandFlash is fast, when there is preset number
During the available block storage measured, above-mentioned the first default scanning imaging system can be written to the available of scanning acquisition
In block storage.
It is understood that the size of above-mentioned preset quantity can be configured according to actual needs, at this
In embodiment, the available block storage of above-mentioned preset quantity is used for storing above-mentioned first scanning imaging system.Therefore exist
After several block storages of NandFlash are scanned by above-mentioned host computer, can be by above-mentioned first scanning pass
Sequence (can be with named Scan) is written in NandFlash.
Step S20, when described NandFlash equipment powers on again, described NandFlash equipment according to
Described in available block storage, all block storages in described NandFlash are scanned by the first scanning imaging system.
In the present embodiment, if above-mentioned first scanning imaging system is successfully written to above-mentioned NandFlash equipment
After in NandFlash, when NandFlash equipment powers on again, NandFlash equipment passes through master control core
Sheet starts, thus finds program of can running in NandFlash.Now will call in NandFlash
One scan program is run, by reading NandFlash, programming NandFlash and erasing NandFlash
The result data to NandFlash detection is obtained Deng operation, after then completing the analysis to result data, system
Meter selects out available block storage (good block) and disabled block storage (bad block)；Thus obtain each
The scanning result of the block storage in NandFlash.
During the embodiment of the present invention is by scanning the current NandFlash equipment connected when host computer
When NandFlash exists the available block storage of preset quantity, described host computer is by the first default scanning imaging system
It is written in the available block storage scanned；When described NandFlash equipment powers on again, described
NandFlash equipment is according to can use the first scanning imaging system described in block storage to the institute in described NandFlash
Block storage is had to be scanned.Due to when NandFlash equipment is connected with host computer, only to NandFlash
In several block storages be scanned after, above-mentioned first scanning imaging system can be written to NandFlash
In, and again pass by after simple power supply mode powers at NandFlash equipment, by NandFlash
Block storage in NandFlash is scanned by the first scanning imaging system of storage；Therefore host computer pair is decreased
The sweep time of NandFlash, improve the production efficiency of NandFlash equipment.
It should be noted that, the mode that above-mentioned NandFlash equipment powers on again can be entered according to actual needs
Row is arranged, such as, be inserted in computer, it is also possible to provide other power-supply device to NandFlash
Equipment powers on.
Further, with reference to Fig. 2, based on above-described embodiment, in the scan method of NandFlash of the present invention
In second embodiment, the scan method of this NandFlash includes:
Step S10, the NandFlash in host computer scans the NandFlash equipment of current connection deposits
When the available block storage of preset quantity, the first default scanning imaging system is written to scanning by described host computer
To available block storage in；
Step S20, when described NandFlash equipment powers on again, described NandFlash equipment according to
Described in available block storage, all block storages in described NandFlash are scanned by the first scanning imaging system；
Step S30, when described host computer is connected with described NandFlash equipment again, described host computer
Read the scanning result of described NandFlash equipment.
In the present embodiment, after NandFlash equipment powers on again, by the first scanning imaging system pair
All block storages in NandFlash are scanned, thus obtain the scanning result of NandFlash equipment (i.e.
The information of block storage).When after the end of scan of NandFlash, can by NandFlash equipment again with
Host computer connects, and now can be sent in host computer by the information of block storage each in NandFlash, it is possible to
To be read the scanning result of NandFlash by host computer.
After host computer gets the scanning result of above-mentioned NandFlash equipment, host computer will be swept according to described
Retouch result and NandFlash is carried out reprogramming algorithm management program.Thus when storing data, can store up
It is stored in available block storage, and then realizes storing function normally.
Further, reference Fig. 3, scan method above-described embodiment based on NandFlash of the present invention,
In scan method the 3rd embodiment of NandFlash of the present invention, the scan method of this NandFlash includes:
Step S10, the NandFlash in host computer scans the NandFlash equipment of current connection deposits
When the available block storage of preset quantity, the first default scanning imaging system is written to scanning by described host computer
To available block storage in；
Step S20, when described NandFlash equipment powers on again, described NandFlash equipment according to
Described in available block storage, all block storages in described NandFlash are scanned by the first scanning imaging system；
Step S40, after all block storages in NandFlash have been scanned, described NandFlash
Equipment exports corresponding information.
In the present embodiment, above-mentioned NandFlash equipment can be provided with the prompting such as display lamp or loudspeaker
Device.After all block storages in NandFlash have been scanned, suggestion device output phase can be controlled
The information answered, reminds the user that the scanning mode of NandFlash equipment.Specifically, information
The form shown can be configured according to actual needs, does not do limiting further at this.
The present invention also provides for the scanning system of a kind of NandFlash, and in one embodiment, the present invention provides
The scanning system of NandFlash includes host computer and NandFlash equipment, wherein,
Described host computer, in the NandFlash equipment scanning current connection when host computer
When NandFlash exists the available block storage of preset quantity, the first default scanning imaging system is written to scanning
To available block storage in；
The scanning system of the NandFlash that the embodiment of the present invention provides is mainly used in NandFlash equipment
In generation, for realization, the NandFlash in NandFlash equipment is scanned.
In the present embodiment, above-mentioned NandFlash equipment is the storage device with flash memory capability, such as should
NandFlash equipment can be the storage facilities such as USB flash disk.Specifically, in existing NandFlash equipment
Generally include NandFlash and main control chip, main control chip set up NandFlash and outside equipment
Connecting in bridge, and main control chip and have startup program, this startup program can start NandFlash voluntarily
In the program run, it is also possible to receive the programmed instruction of outside input.
Specifically, above-mentioned host computer can be computer, is provided with the second scanning imaging system in a computer,
For NandFlash in the NandFlash equipment being currently connected with computer is scanned, to obtain
Available block storage (being the good block that can store data) in NandFlash.Scan at the second scanning imaging system
During, it is judged that the available storage that whether there is preset quantity in NandFlash is fast, when there is preset number
During the available block storage measured, above-mentioned the first default scanning imaging system can be written to the available of scanning acquisition
In block storage.
It is understood that the size of above-mentioned preset quantity can be configured according to actual needs, at this
In embodiment, the available block storage of above-mentioned preset quantity is used for storing above-mentioned first scanning imaging system.Therefore exist
After several block storages of NandFlash are scanned by above-mentioned host computer, can be by above-mentioned first scanning pass
Sequence (can be with named Scan) is written in NandFlash.
Described NandFlash equipment, for when described NandFlash equipment powers on again, according to available
All block storages in described NandFlash are scanned by the first scanning imaging system described in block storage.
In the present embodiment, if above-mentioned first scanning imaging system is successfully written to above-mentioned NandFlash equipment
After in NandFlash, when NandFlash equipment powers on again, NandFlash equipment passes through master control core
Sheet starts, thus finds program of can running in NandFlash.Now will call in NandFlash
One scan program is run, by reading NandFlash, programming NandFlash and erasing NandFlash
The result data to NandFlash detection is obtained Deng operation, after then completing the analysis to result data, system
Meter selects out available block storage (good block) and disabled block storage (bad block)；Thus obtain each
The scanning result of the block storage in NandFlash.
During the embodiment of the present invention is by scanning the current NandFlash equipment connected when host computer
When NandFlash exists the available block storage of preset quantity, described host computer is by the first default scanning imaging system
It is written in the available block storage scanned；When described NandFlash equipment powers on again, described
NandFlash equipment is according to can use the first scanning imaging system described in block storage to the institute in described NandFlash
Block storage is had to be scanned.Due to when NandFlash equipment is connected with host computer, only to NandFlash
In several block storages be scanned after, above-mentioned first scanning imaging system can be written to NandFlash
In, and again pass by after simple power supply mode powers at NandFlash equipment, by NandFlash
Block storage in NandFlash is scanned by the first scanning imaging system of storage；Therefore host computer pair is decreased
The sweep time of NandFlash, improve the production efficiency of NandFlash equipment.
It should be noted that, the mode that above-mentioned NandFlash equipment powers on again can be entered according to actual needs
Row is arranged, such as, be inserted in computer, it is also possible to provide other power-supply device to NandFlash
Equipment powers on.
Further, based on above-described embodiment, in scanning system second embodiment of NandFlash of the present invention
In, above-mentioned host computer is additionally operable to, and when described host computer is connected with described NandFlash equipment again, reads
Take the scanning result of described NandFlash equipment.
In the present embodiment, after NandFlash equipment powers on again, by the first scanning imaging system pair
All block storages in NandFlash are scanned, thus obtain the scanning result of NandFlash equipment (i.e.
The information of block storage).When after the end of scan of NandFlash, can by NandFlash equipment again with
Host computer connects, and now can be sent in host computer by the information of block storage each in NandFlash, it is possible to
To be read the scanning result of NandFlash by host computer.
After host computer gets the scanning result of above-mentioned NandFlash equipment, host computer is additionally operable to basis
Described scanning result carries out reprogramming algorithm management program to NandFlash.Thus when storing data,
Can be stored in available block storage, and then realize storing function normally.
Further, scanning system above-described embodiment based on NandFlash of the present invention, in the present invention
In scanning system the 3rd embodiment of NandFlash, above-mentioned NandFlash equipment is additionally operable to, when
After all block storages in NandFlash have been scanned, export corresponding information.
In the present embodiment, above-mentioned NandFlash equipment can be provided with the prompting such as display lamp or loudspeaker
Device.After all block storages in NandFlash have been scanned, suggestion device output phase can be controlled
The information answered, reminds the user that the scanning mode of NandFlash equipment.Specifically, information
The form shown can be configured according to actual needs, does not do limiting further at this.
These are only the preferred embodiments of the present invention, not thereby limit the scope of the claims of the present invention, every
Utilize equivalent structure or equivalence flow process conversion that description of the invention and accompanying drawing content made, or directly or
Connect and be used in other relevant technical fields, be the most in like manner included in the scope of patent protection of the present invention.
Claims (8)
1. the scan method of a NandFlash, it is characterised in that the scanning side of described NandFlash
Method comprises the following steps:
There is preset number in the NandFlash in host computer scans the NandFlash equipment of current connection
During the available block storage of amount, it is available that the first default scanning imaging system is written to scan by described host computer
In block storage；
When described NandFlash equipment powers on again, described NandFlash equipment stores according to available
All block storages in described NandFlash are scanned by the first scanning imaging system described in block.
2. the scan method of NandFlash as claimed in claim 1, it is characterised in that described
NandFlash equipment is according to can use the first scanning imaging system described in block storage to described NandFlash equipment
In all block storages be scanned after also include:
When described host computer is connected with described NandFlash equipment again, described host computer reads described
The scanning result of NandFlash equipment.
3. the scan method of NandFlash as claimed in claim 2, it is characterised in that described upper
Also include after the machine-readable scanning result taking described NandFlash equipment:
Described host computer carries out reprogramming algorithm management journey according to described scanning result to NandFlash
Sequence.
4. the scan method of NandFlash as claimed any one in claims 1 to 3, its feature exists
In, the scan method of described NandFlash also includes:
After all block storages in NandFlash have been scanned, described NandFlash equipment exports
Corresponding information.
5. the scanning system of a NandFlash, it is characterised in that the scanning system of described NandFlash
Unite and include host computer and NandFlash equipment, wherein,
Described host computer, in the NandFlash equipment scanning current connection when host computer
When NandFlash exists the available block storage of preset quantity, it is written to sweep by the first default scanning imaging system
In the available block storage retouched；
Described NandFlash equipment, for when described NandFlash equipment powers on again, according to can
With the first scanning imaging system described in block storage, all block storages in described NandFlash are scanned.
6. the scanning system of NandFlash as claimed in claim 5, it is characterised in that described upper
Machine is additionally operable to, and when described host computer is connected with described NandFlash equipment again, reads described
The scanning result of NandFlash equipment.
7. the scanning system of NandFlash as claimed in claim 6, it is characterised in that described upper
Machine is additionally operable to, and according to described scanning result, NandFlash carries out reprogramming algorithm management program.
8. the scanning system of the NandFlash as according to any one of claim 5 to 7, its feature exists
In, described NandFlash equipment is additionally operable to, when all block storages in NandFlash have been scanned
After, export corresponding information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610283785.7A CN105975409A (en) | 2016-04-29 | 2016-04-29 | NandFlash scanning method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610283785.7A CN105975409A (en) | 2016-04-29 | 2016-04-29 | NandFlash scanning method and system |
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| CN105975409A true CN105975409A (en) | 2016-09-28 |
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| CN201610283785.7A Pending CN105975409A (en) | 2016-04-29 | 2016-04-29 | NandFlash scanning method and system |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101540205A (en) * | 2008-03-21 | 2009-09-23 | 深圳市朗科科技股份有限公司 | Method for scanning flash memory |
| CN101620557A (en) * | 2008-10-31 | 2010-01-06 | 长沙市源微微电子有限公司 | Portable memory device and automatic scanning method thereof |
| CN101710237A (en) * | 2008-12-30 | 2010-05-19 | 深圳市江波龙电子有限公司 | Equipment production flow using flash memory as storage medium |
-
2016
- 2016-04-29 CN CN201610283785.7A patent/CN105975409A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101540205A (en) * | 2008-03-21 | 2009-09-23 | 深圳市朗科科技股份有限公司 | Method for scanning flash memory |
| CN101620557A (en) * | 2008-10-31 | 2010-01-06 | 长沙市源微微电子有限公司 | Portable memory device and automatic scanning method thereof |
| CN101710237A (en) * | 2008-12-30 | 2010-05-19 | 深圳市江波龙电子有限公司 | Equipment production flow using flash memory as storage medium |
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Address after: Units 05-2 and 06-08, 6th floor, Changhong Science and Technology Building, 18 Science and Technology South 12 Road, Nanshan District, Shenzhen City, Guangdong Province Applicant after: Shenzhen SiliconGo Semiconductor Co., Ltd. Address before: Units 05-2 and 06-08, 6th floor, Changhong Science and Technology Building, 18 Science and Technology South 12 Road, Nanshan District, Shenzhen City, Guangdong Province Applicant before: SILICONGO MICROELECTRONICS CO., LTD. |
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