CN101540205A - Method for scanning flash memory - Google Patents
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- CN101540205A CN101540205A CN 200810087810 CN200810087810A CN101540205A CN 101540205 A CN101540205 A CN 101540205A CN 200810087810 CN200810087810 CN 200810087810 CN 200810087810 A CN200810087810 A CN 200810087810A CN 101540205 A CN101540205 A CN 101540205A
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Abstract
The invention provides a method for scanning a flash memory, which comprises the following steps of: selecting a scanning grade; scanning the flash memory according to the selected scanning grade to obtain information on good blocks and bad blocks in the flash memory to form a scanning result; and outputting the scanning result according to the selected scanning grade. The method can improve the efficiency for scanning the flash memory when scanning different flash memories a plurality of set different grades of scanning.
Description
Technical field
The present invention relates to the erasable and programable memory field, particularly the scan method of flash media.
Background technology
Along with technology constantly develops, flash memory is also more and more wider as the field of storer utilization, and the user is also more and more higher to the capacity requirement of flash memory simultaneously.In order to satisfy the different requirement of user, to the also raising thereupon of scan efficiency of flash memory.Good bad piece of piece is determined in existing flash memory scanning, adopts the single scanning method flash memory to be scanned real bad block management.
General way is at present: at first all pieces write data in flash memory, read and judged bad piece of piece writing data again, though the single scanning method can satisfy the user to the requirement of flash memory sweep test, but need carry out the mass data exchange because this scanning that does not have a difference requires often to scan, thereby make sweep velocity lower.Concerning the less demanding user of flash memory, adopting this kind method to reduce scan efficiency for those, is to meet the demands.More can't satisfy the requirement of user to the flash memory scan efficiency, select the different scanning method that flash memory is scanned as required, quick check goes out the bad piece of depositing in the flash memory.
Summary of the invention
The technical matters that the present invention solves provides a kind of scan method, adopts many grades scan method that flash memory is scanned, and determines fast can improve the flash memory scan efficiency by good bad piece of piece.
A kind of method for scanning flash memory of the present invention is determined good piece of flash memory and bad piece by flash memory is scanned, and the method comprising the steps of: select the scanning grade; According to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, form scanning result; Export the scanning result of above-mentioned formation.
Preferably, flash memory is scanned, obtain good piece and bad block message in the flash memory, before the formation scanning result, at first flash memory is wiped,, determine initial good piece and bad piece again by reading each blocks of data of flash memory fast according to the scanning grade of selecting.
Preferably, described each the blocks of data step of flash memory that reads fast comprises: partial data in the flash block is read; The result judges according to reading of data, to determine initial good piece and bad piece; Whether flash data read completely judge, produce scanning result; The output scanning result.
Preferably, described scanning grade comprises: the first scanning grade, the second scanning grade and the 3rd scanning grade.
Preferably, when selecting the scanning grade to be the first scanning grade, initial good piece and bad block message are as a result of exported.
Preferably, when selecting the scanning grade to be the second scanning grade, select in the initial good piece one page at least, write data to described one page at least, and read data in described one page at least, and redefined piece and bad piece, the good piece and the bad block message that redefine are exported as scanning result.
Preferably, when selecting the scanning grade to be the second scanning grade, all pages or leaves write data in initial good piece, select initial good piece middle part paging and read wherein data, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
Preferably, when selecting the scanning grade to be the second scanning grade, all pages or leaves write data in initial good piece, read the data in all pages, have redefined piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result.
Preferably, when selecting the scanning grade to be the 3rd scanning grade, all pages or leaves write data in the initial good piece of flash memory, read the data in all pages, determine final good piece and bad piece, will redefine piece and bad block message is exported as scanning result.
Preferably, the second scanning grade and/or the 3rd scanning grade only write data and reading of data scanning to initial good piece.
Preferably, scanning in the process, is unit with the page or leaf, as long as there is a page or leaf to be judged as when going bad page or leaf, just stops to scan page or leaf remaining in this piece, and this piece is labeled as bad piece.
The present invention scans flash memory according to different scanning grades by selecting the scanning grade, can quick and precisely scan flash memory, has determined bad piece of piece.
Description of drawings
Fig. 1 is an embodiment of the invention scan method process flow diagram;
Fig. 2 specifically scans process flow diagram for the embodiment of the invention;
Fig. 3 scans process flow diagram for the initial good piece of the embodiment of the invention;
Fig. 4 scans process flow diagram fast for the embodiment of the invention;
Fig. 5 writes data flowchart for the embodiment of the invention;
Fig. 6 is embodiment of the invention reading of data flow process figure;
Fig. 7 is the embodiment of the invention the 3rd a scanning grade process flow diagram.
The realization of the object of the invention, functional characteristics and advantage will be in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
The present invention proposes first embodiment and by a plurality of different scanning grades are set flash memory is scanned, and determines scan mode according to the scanning grade, thereby can realize the quick scanning to flash memory, has determined piece and bad piece, improves scan efficiency.
As shown in Figure 1, be present embodiment method for scanning flash memory schematic flow sheet,, thereby determine scan mode, flash memory is scanned according to scan mode by the scanning grade of selecting, and the output scanning result.This scan method comprises step:
Step S101 selects the scanning grade, is provided with different scanning grades in the system, and each scanning grade is all to there being different scan modes, and the user can select different scanning grades as required;
Step S102 scans according to the scanning grade of selecting, and selects scan mode that flash memory is scanned, and reads data in the flash memory, obtains in the flash memory the bad piece block message of becoming reconciled, and forms scanning result;
Step S103 exports the scanning result of above-mentioned formation, and this scanning result comprises the bad block message block message of becoming reconciled.
The present invention also proposes second embodiment on the basis of first embodiment, by the data in the first erasing flash memory, reads flash data again, the piece thereby definite flash memory bad block is become reconciled.
Be illustrated in figure 2 as present embodiment scanning particular flow sheet, determine that according to the scanning grade scan mode scans the piece in the flash memory, thereby determine good piece and bad piece, this flow process comprises:
Step S200 obtains the scanning class information, according to the scanning class information of selecting flash memory is scanned;
Step S201, the data in the erasing flash memory on all pieces;
Step S202, whether the data that scan fast on each piece of flash memory have wiped totally, read the data on every of the flash memory, determine initial good piece and bad piece;
Step S203 determines the scanning grade;
Step S204, according to step S203, when the scanning grade is first scanning during grade, execution in step S209 then, with initial good piece and bad block message as final good piece and bad block message;
Step S205, according to step S203, when the scanning grade is the second scanning grade, execution in step S207;
Step S206, according to step S203, when the scanning grade is the 3rd scanning grade, execution in step S208;
Step S207 according to initial good piece and the bad block message of determining, scans wherein good piece, and this scanning according to scanning result, has redefined piece and bad block message by the part page or leaf in the above-mentioned good piece is write data and read data operation;
Step S208 according to initial good piece and the bad block message of determining, scans wherein good piece, and this scanning according to scanning result, has redefined piece and bad block message by all pages in the above-mentioned good piece are write data and read data operation;
Step S209 is according to selecting the first scanning grade, the second scanning grade and the 3rd scanning grade output scanning result respectively.
Specifically, above-mentioned steps S200 obtains the scanning class information, and the user is provided with different scanning grades as required, when needs scan flash memory, selects to scan grade by the user.This scanning grade can comprise: the first scanning grade, and read flash memory and wipe the result, initial good piece and bad block message are as a result of exported; The second scanning grade is selected initial good piece middle part paging to write data and read the result and is scanned, and no longer initial bad blocks is scanned, and has redefined piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result; The 3rd scanning grade all will scan all pages or leaves in the initial good piece of flash memory, no longer initial bad blocks is scanned, and writes data and reads the result, determines final good piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result.
Data on all pieces of above-mentioned steps S201 erasing flash memory, wherein step S201 is specific for step S102 to step S208.
Whether the data that above-mentioned steps S202 scans on each piece of flash memory have fast wiped totally, read the data on every of the flash memory, determine initial good piece and bad piece.For flash memory, wiped the data on the piece after, each position of this good piece should be 1, through after wiping, if data are not entirely on the piece, illustrates that then this piece do not wipe fully at 1 o'clock, thinks that this piece is a bad piece.If data are 1 o'clock entirely on the piece, then this piece has been wiped totally, thinks that this piece has been a piece, determines initial good piece and bad piece, and this bad piece no longer carries out scan operation.
Above-mentioned steps S203 determines the scanning grade, adopts different scan modes that flash memory is scanned according to the scanning grade.
Above-mentioned steps S204, when above-mentioned scanning grade was the first scanning grade, step S202 was that the initial good piece of determining is final good piece.
Above-mentioned steps S205 determines that the scanning grade is the second scanning grade.
Above-mentioned steps S206 determines that the scanning grade is the 3rd scanning grade.
Above-mentioned steps S207, the scanning grade of determining according to step S205 is that the initial good piece middle part paging of determining scans to step S202, write data and reading of data,, then do not need to scan for initial bad blocks according to writing data and the reading of data result has redefined piece and bad piece.Can select initial good piece middle part paging to write data and reading section data, can also select in the initial good piece all pages or leaves to write data and read all page datas, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
Above-mentioned steps S208, the scanning grade of determining according to step S206 scans all pages or leaves in the definite initial good piece of step S202, write data and reading of data, according to writing data and the reading of data result has redefined piece, being a good piece determines also just to have determined then not need bad piece to scan for initial bad blocks.
Above-mentioned steps S209 is according to the first scanning grade of determining, the second scanning grade and the 3rd scanning grade difference output scanning result.
As shown in Figure 3, for the initial good piece of present embodiment scans process flow diagram, the good piece of determining according to above-mentioned steps S207 scans, and has redefined piece and bad piece by scanning, and this step comprises:
Step S2071, the good piece that flash memory is initially determined scans, and when being the second scanning grade according to step S205 scanning grade, data being write initial good piece middle part paging, and carry out the data that write are read, and scans;
Step S2072 has redefined piece and bad piece according to scanning result, according to step S2071 flash memory is write data and reading of data scanning, has redefined piece and bad piece.
Scan period of step S2071 and S2072, the requirement difference according to scanning can increase or reduces the scan period.
Among the above-mentioned S2071 data having been write in the piece, is to carry out according to the block address and the length of the main frame appointment that flash memory is scanned, and this block address and length are used to determine to begin to write the starting block and the continuous write-in block quantity of data.In the follow up scan process, scan according to this physical block address and length.
As shown in Figure 4, for present embodiment scans process flow diagram fast, this flow process is determined this piece quality by reading in the flash memory data on the piece fast, and this step comprises:
Step S400, the variable i of establishing the piece number that is used to write down current scanning block, the variable i initial value is 0;
Step S401 reads the information of i piece, reading section data from the i piece, as first page, middle one page and last page, do not need the data of all pages in the piece are read, the page or leaf of choosing also only need read wherein several bytes, does not also need all data in the page or leaf are all read;
Whether step S402 is 1 to judge to reading of data entirely, if the data that read are 1 entirely, and execution in step S404 then, if the data that read are not to be 1 entirely, execution in step S403 then;
Step S403 is not 1 according to step S402 to the data that read entirely, and this piece is labeled as bad piece;
Step S404, read one after, variable i is added 1, next piece is read;
Step S405, judge whether to have read flash data, add 1 according to step S404 variable i, judge whether to have scanned all pieces in the flash memory, when variable i adds 1 back more than or equal to the block address of above-mentioned main frame appointment and length, in the flash memory during quantity of set piece, judge that the data in this flash memory read fully, then carry out next step, when variable i adds 1 back less than the block address of main frame appointment and length, judge that this flash data is not read fully, also need to read, return step S401 and re-execute step S401 to step S405;
Step S406 returns the bad piece block message of becoming reconciled and gives system, according to step S405 judged result, when flash memory scans fully, returns the bad piece block message of becoming reconciled and gives system and withdraw from.
Therefore in the present embodiment, only read and seldom measure data, determine whether to be 1 entirely, for a good piece, wiping its each position, back all should be 1, is not that the piece at 1 place, position is thought bad piece, also can read whole all data of page or leaf as required, determines fine or not piece.
As shown in Figure 5, for present embodiment writes data flowchart, this process step comprises:
Step S500 determines block address and block length according to the order that main frame sends, and is used to specify from certain BOB(beginning of block) and carries out write operation, writes how many pieces continuously;
Step S501, it is 0 that initial offset is set, and is that unit carries out with the page or leaf when writing data;
Step S502, data are write the specific page in the piece of appointment, as required data are write in the specific page, wherein specific page is determined according to the scanning grade, if select the second scanning grade, then only needs the paging of data write section, for example write two pages of fronts, two pages and last two pages of centres, if what select is that the scanning grade is the 3rd scanning grade, then need each page or leaf all to write, up to writing full this piece;
Step S503, side-play amount increases, according to step S502, write finish one after, will be offset increase by 1;
Step S504, whether side-play amount is judged more than or equal to block length, according to step S503, the side-play amount after increasing and the length of appointment are compared judgement, if judge the length of side-play amount more than or equal to appointment, then this time write operation finishes, if side-play amount is less than the length of appointment, then return step S502 and continue next piece is carried out write operation, up to having write the piece of setting.
As shown in Figure 6, be present embodiment reading of data flow process figure, this flow process comprises step:
Step S600, the block address and the length of the appointment of reception main frame, this block address and length are used to determine to begin to read piece and read number of blocks continuously;
Step S601 is provided with side-play amount and is initially 0;
Step S602 determines bad piece according to the scanning grade, as the second scanning grade, then only need read the part page or leaf in the initial good piece, if the 3rd scanning grade then needs to read all pages or leaves in the initial good piece, thereby determines good piece and bad piece;
Step S603, according to step S602, read one after, side-play amount is increased by 1;
Step S604, according to the side-play amount among the step S603, this side-play amount is judged, if side-play amount is during more than or equal to the main frame designated length, reading of data finishes, with good piece and the output of bad block message, if side-play amount is during less than the length of main frame appointment, then continue to read next piece, up to having read physical block.
Shown in 7, be present embodiment tertiary gradient scanning process flow diagram, judge reading section page data in the flowchart process at bad piece, data read in the flash memory can be come out compare, also can only the data that read be defeated by flash memory main control chip internal memory, and need not compare, judge by error correcting code (ECC) module that hardware carries record reads whether data mistake has taken place in the process.Can reading of data mistake specified scope be set by the user,, think that this piece has been a piece when reading of data error code during in specified scope.If the data that read all are 0, hardware also can be provided with relevant register.Describe in the internal memory of flash memory main control chip with a reading of data among the present invention.
This flow process describes with the 3rd scanning grade, scan in the process, and in scanning process, be unit with the page or leaf, as long as when having a page or leaf to be judged as bad page or leaf, just stop to scan the page or leaf that is left in this piece, this piece is labeled as bad piece, this flow process comprises step:
Step S700 establishes the variable i that is used to write down current page number, and its initial value is 0;
Step S701, read the data on the i page or leaf, determine different scan modes according to the different scanning grade, when if the scanning grade is the 3rd scanning grade, read all pages or leaves that scanned in the piece, as long as it is bad having a page or leaf to judge, just stop to read remaining page or leaf in this piece of scanning, this piece is labeled as bad piece;
Step S702, whether system is error correction to judge to the data that read, if make a mistake, determines whether this mistake is what can correct, if mistake cannot be corrected, then execution in step S707 is labeled as bad piece with this piece; If mistake can be corrected, then carry out next step;
Whether step S703 judges greater than specified scope the error in data that reads, according to step S702, when the error in data that reads is that cannot correct or wrong greater than specified scope, with regard to execution in step S707, this piece is labeled as bad piece, finish simultaneously this other pages of piece scanning; When if mistake is the number of errors less than setting that can correct and wrong, execution in step S704;
Step S704, whether to the data that read is 0 to judge entirely, for some page or leaf, when wherein writing non-complete 0 data, the result who reads all is 0, and this moment, ECC thought that it is right, cause S702, S703 can not check out that all this is a bad page or leaf, non-complete 0 the data that write for system, if the hardware record it be complete 0, then the piece at this page of mark place is a bad piece, otherwise carries out next step;
Step S705, the page number variable i increases 1, and following one page is scanned;
Step S706, according to step S705, after the page number variable i increased 1, the length of system's appointment compares judgement, if this page variable i is more than or equal to the length of system's appointment, end operation, if this this page variable i is less than the length of system's appointment, then return step S701, following one page is carried out step S701 to step S705 operation, increase the length of the page or leaf at place, 1 back more than or equal to system's appointment until the page number variable i.Can scan flash memory fast by selecting the scanning grade, improve scan efficiency;
Step S707 is designated as bad piece with current block, finishes the scanning to this piece.
The above only is the preferred embodiments of the present invention; be not so limit claim of the present invention; every equivalent structure or equivalent flow process conversion that utilizes instructions of the present invention and accompanying drawing content to be done; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present invention.
Claims (11)
1. a method for scanning flash memory is determined good piece of flash memory and bad piece by flash memory is scanned, and it is characterized in that the method comprising the steps of:
Select the scanning grade;
According to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, form scanning result;
Export the scanning result of above-mentioned formation.
2. method for scanning flash memory according to claim 1, it is characterized in that, according to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, before forming scanning result, at first flash memory is wiped,, determined initial good piece and bad piece again by reading each blocks of data of flash memory fast.
3. method for scanning flash memory according to claim 2 is characterized in that, described each the blocks of data step of flash memory that reads fast comprises:
Partial data in the flash block is read;
The result judges according to reading of data, to determine initial good piece and bad piece;
Whether flash data read completely judge, produce scanning result;
The output scanning result.
4. according to any described method for scanning flash memory of claim 1 to 3, it is characterized in that described scanning grade comprises: the first scanning grade, the second scanning grade and/or the 3rd scanning grade.
5. method for scanning flash memory according to claim 4 is characterized in that, when selecting the scanning grade to be the first scanning grade, initial good piece and bad block message is as a result of exported.
6. method for scanning flash memory according to claim 4, it is characterized in that, when selecting the scanning grade to be the second scanning grade, select initial good piece middle part paging, write data to described part page or leaf, and read data from described part page or leaf, and redefined piece and bad piece, the good piece and the bad block message that redefine are exported as scanning result.
7. method for scanning flash memory according to claim 6, it is characterized in that, when selecting the scanning grade to be the second scanning grade, all pages or leaves write data in initial good piece, select initial good piece middle part paging and read data in the described part page or leaf, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
8. method for scanning flash memory according to claim 6, it is characterized in that, when selecting the scanning grade to be the second scanning grade, all pages or leaves write data in initial good piece, read the data in all pages, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
9. method for scanning flash memory according to claim 4, it is characterized in that, when selecting the scanning grade to be the 3rd scanning grade, all pages or leaves write data in the initial good piece of flash memory, read the data in all pages, determine final good piece and bad piece, will redefine piece and bad block message is exported as scanning result.
10. method for scanning flash memory according to claim 4 is characterized in that, described second scanning grade and/or the 3rd scanning grade only write data and reading of data scanning to initial good piece.
11., it is characterized in that according to any described method for scanning flash memory of claim 1 to 3, scan in the process, be unit with the page or leaf, as long as there is a page or leaf to be judged as when going bad page or leaf, just stop to scan page or leaf remaining in this piece, this piece is labeled as bad piece.
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| CN 200810087810 CN101540205B (en) | 2008-03-21 | 2008-03-21 | Method for scanning flash memory |
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| CN 200810087810 CN101540205B (en) | 2008-03-21 | 2008-03-21 | Method for scanning flash memory |
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| CN101540205B CN101540205B (en) | 2013-03-27 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101562051B (en) * | 2008-04-18 | 2013-05-01 | 深圳市朗科科技股份有限公司 | Flash memory medium scan method |
| CN105975409A (en) * | 2016-04-29 | 2016-09-28 | 深圳市硅格半导体股份有限公司 | NandFlash scanning method and system |
| CN113126916A (en) * | 2021-03-29 | 2021-07-16 | 广州安凯微电子股份有限公司 | Data restoration method and device after abnormal power failure |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103927128B (en) * | 2013-07-11 | 2017-03-01 | 威盛电子股份有限公司 | Data storage device and flash memory control method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1728284B (en) * | 2004-07-26 | 2012-08-22 | 深圳市朗科科技股份有限公司 | Method for seanning flash memory chip in flash memory disk |
| EP1679704A1 (en) * | 2005-01-10 | 2006-07-12 | Thomson Licensing | Method and device for scanning the contents of a storage medium |
| CN100357874C (en) * | 2005-09-30 | 2007-12-26 | 华为技术有限公司 | Flash memory loading method and system based on boundary scan |
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2008
- 2008-03-21 CN CN 200810087810 patent/CN101540205B/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101562051B (en) * | 2008-04-18 | 2013-05-01 | 深圳市朗科科技股份有限公司 | Flash memory medium scan method |
| CN105975409A (en) * | 2016-04-29 | 2016-09-28 | 深圳市硅格半导体股份有限公司 | NandFlash scanning method and system |
| CN113126916A (en) * | 2021-03-29 | 2021-07-16 | 广州安凯微电子股份有限公司 | Data restoration method and device after abnormal power failure |
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