CN105783941A - Testing method for inertial measurement unit based on SPI bus communication protocol output - Google Patents
Testing method for inertial measurement unit based on SPI bus communication protocol output Download PDFInfo
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- CN105783941A CN105783941A CN201610099803.6A CN201610099803A CN105783941A CN 105783941 A CN105783941 A CN 105783941A CN 201610099803 A CN201610099803 A CN 201610099803A CN 105783941 A CN105783941 A CN 105783941A
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- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
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Abstract
The invention relates to a testing method for an inertial measurement unit based on SPI bus communication protocol output.The testing method includes the steps that testing equipment and the inertial measurement unit based on SPI bus communication protocol output are connected; a serial port in the testing equipment and a testing computer are connected; the system is powered on, and the testing equipment collects output data of the inertial measurement unit based on the SPI bus communication protocol and sends a new data frame to the testing computer through the serial port; the testing computer collects the data, and the inertial measurement unit based on SPI bus communication protocol output is tested.The problem that the error rate is large as the testing computer is directly used as SPI main equipment for testing is solved.
Description
Technical field
The present invention relates to a kind of Inertial Measurement Unit method of testing, particularly relate to the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol, belong to Inertial Measurement Unit method of testing field, can be used for testing the occasion of the Inertial Measurement Unit of spi bus communication protocol output.
Background technology
SPI (SerialPeripheralInterface, Serial Peripheral Interface) is a kind of high speed, full duplex, the synchronization communication bus that motorola inc releases.It works with master slave system, is mainly used in the high-speed communication of microprocessor and peripheral hardware, have that speed is fast, communication protocol simply, take the feature that pin is few.It is a kind of conventional standard interface, easy to use and saving system resource.Spi bus communication protocol generally has a main equipment and one or more from equipment, need 4 lines, they are that (main equipment data input MISO, from device data export), MOSI (main equipment data export, from device data input), SCK (clock signal, produced by main equipment), SS (chip select, from equipment enable signal, by main equipment control).
Inertial Measurement Unit (InertialMeasurementUnit, IMU) refer to and be made up of gyroscope, accelerometer and auxiliary electron circuit, the device of the information such as carrier relative inertness space or regulation navigational coordinate system rotational angle, angular velocity and linear acceleration can be measured.It is the core component of inertial navigation system.
The Inertial Measurement Unit of existing a kind of spi bus communication protocol output needs through turntable slip ring when carrying out Laboratory Calibration, and output connection is very long, and electromagnetic environment is complicated.If directly carrying out testing as SPI main equipment using measuring and calculation machine, the significantly high bit error rate can be caused, bring very big inconvenience to staking-out work.It is thus desirable to study the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol, the Inertial Measurement Unit of SPI protocol output is tested.
Summary of the invention
Present invention solves the technical problem that and be: overcome the deficiencies in the prior art, it is provided that the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol, solve directly to carry out testing the problem causing high bit-error as SPI main equipment using measuring and calculation machine.
The technical solution of the present invention is divided into step as follows:
(1) connecting test equipment and the Inertial Measurement Unit based on the output of spi bus communication protocol；
(2) serial ports on test equipment is connected with measuring and calculation machine；
(3) system electrification of test equipment and Inertial Measurement Unit composition, test equipment gathers the output data of Inertial Measurement Unit by spi bus communication protocol；The numbering adding chip-select pin before each frame Inertial Measurement Unit exports data constitutes new Frame, and new data frame is sent to measuring and calculation machine by test equipment by serial ports；Data are acquired by measuring and calculation machine.
Different Inertial Measurement Units can be enabled by the test equipment in described step (1) by different chip-select pin, the corresponding numbering different from other pins of each chip-select pin, test equipment can be simultaneously connected with the Inertial Measurement Unit of one or more sets spi bus communication protocol output, the chip-select pin quantity that the no more than test equipment of Inertial Measurement Unit quantity is reserved.
In described step (3) after system electrification, test equipment chip selection signal is high level entirely, the voltage of the chip-select pin dragging down test equipment and being connected with the Inertial Measurement Unit gathered before gathering the output of certain Inertial Measurement Unit, after Inertial Measurement Unit output data acquisition completes, the voltage of the chip-select pin being connected with the Inertial Measurement Unit gathered by test equipment is set to high level.
The numbering being numbered the chip-select pin that test equipment is connected with the Inertial Measurement Unit of this collection of the chip-select pin added in described step (3).
In described step (3), measuring and calculation machine is by judging that the Frame the first two byte received identifies the Inertial Measurement Unit that these frame data are corresponding, and data is preserved to corresponding file, obtains the test data of Inertial Measurement Unit.
Present invention advantage compared with prior art is as follows:
(1) in the present invention, test equipment gathers the output of Inertial Measurement Unit by spi bus communications protocol, again the data gathered are transmitted to measuring and calculation machine by serial communication protocol, solve in prior art and measuring and calculation machine is carried out, as SPI main equipment, the problem that Inertial Measurement Unit test causes high bit-error.
(2) in the present invention, test equipment once can gather the test data overlapping Inertial Measurement Unit more, substantially increases testing efficiency, saves cost.
Accompanying drawing explanation
Fig. 1 is the schematic diagram that in the present invention, a set of test equipment gathers three set Inertial Measurement Units simultaneously；
The structural representation of whole test system when Fig. 2 is gather three set Inertial Measurement Units in the present invention simultaneously.
Detailed description of the invention
A specific embodiment of the inventive method is given below.
(1) Inertial Measurement Unit of connecting test equipment and three set spi bus communication protocol outputs, as shown in Figure 1；The connection of three set Inertial Measurement Units and test equipment includes MISO (test device data input, Inertial Measurement Unit data export), MOSI (test device data output, Inertial Measurement Unit data input), SCK (clock signal, by test equipment produce), SS (chip select, Inertial Measurement Unit enables signal, test equipment control).Inertial Measurement Unit 1, Inertial Measurement Unit 2, Inertial Measurement Unit 3 can be enabled respectively by test equipment by different chip-select pin SS1, SS2, SS3.
(2) serial ports on test equipment is connected with measuring and calculation machine, as shown in Figure 2.
(3) system electrification, test equipment chip selection signal SS1, SS2, SS3 are high level entirely.
Dragging down the voltage of pin SS1 before gathering Inertial Measurement Unit 1 output, Inertial Measurement Unit 1 exports after data acquisition completes, and its chip selection signal SS1 is reverted to high level.Before Inertial Measurement Unit 1 exports data, add two byte 0x0001 constitute new Frame, by serial ports, new data frame is sent to measuring and calculation machine；Data are acquired by measuring and calculation machine, are the 0x0001 Inertial Measurement Unit 1 identifying that these frame data are corresponding by judging the Frame the first two byte received, and data are preserved to Inertial Measurement Unit 1 file, obtain the test data of Inertial Measurement Unit 1.
Dragging down the voltage of pin SS2 before gathering Inertial Measurement Unit 2 output, Inertial Measurement Unit 2 exports after data acquisition completes, and its chip selection signal SS2 is reverted to high level.Before Inertial Measurement Unit 2 exports data, add two byte 0x0002 constitute new Frame, by serial ports, new data frame is sent to measuring and calculation machine；Data are acquired by measuring and calculation machine, are the 0x0002 Inertial Measurement Unit 2 identifying that these frame data are corresponding by judging the Frame the first two byte received, and data are preserved to Inertial Measurement Unit 2 file, obtain the test data of Inertial Measurement Unit 2.
Dragging down the voltage of pin SS3 before gathering Inertial Measurement Unit 3 output, Inertial Measurement Unit 3 exports after data acquisition completes, and its chip selection signal SS3 is reverted to high level.Before Inertial Measurement Unit 3 exports data, add two byte 0x0003 constitute new Frame, by serial ports, new data frame is sent to measuring and calculation machine；Data are acquired by measuring and calculation machine, are the 0x0003 Inertial Measurement Unit 3 identifying that these frame data are corresponding by judging the Frame the first two byte received, and data are preserved to Inertial Measurement Unit 3 file, obtain the test data of Inertial Measurement Unit 3.
Above a kind of method of testing based on the Inertial Measurement Unit of spi bus communication protocol output provided by the present invention is described in detail, for one of ordinary skill in the art, all will change according in specific embodiment of the invention process and range of application, in sum, this specification content should not be construed as limitation of the present invention.The non-detailed description of the present invention is known to the skilled person technology.
Claims (5)
1. the method for testing based on the Inertial Measurement Unit of spi bus communication protocol output, it is characterised in that step is as follows:
(1) connecting test equipment and the Inertial Measurement Unit based on the output of spi bus communication protocol；
(2) serial ports on test equipment is connected with measuring and calculation machine；
(3) system electrification of test equipment and Inertial Measurement Unit composition, test equipment gathers the output data of Inertial Measurement Unit by spi bus communication protocol；The numbering adding chip-select pin before each frame Inertial Measurement Unit exports data constitutes new Frame, and new data frame is sent to measuring and calculation machine by test equipment by serial ports；Data are acquired by measuring and calculation machine.
2. the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1, it is characterized in that: different Inertial Measurement Units can be enabled by the test equipment in described step (1) by different chip-select pin, the corresponding numbering different from other pins of each chip-select pin, test equipment can be simultaneously connected with the Inertial Measurement Unit of one or more sets spi bus communication protocol output, the chip-select pin quantity that the no more than test equipment of Inertial Measurement Unit quantity is reserved.
3. the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1, it is characterized in that: in described step (3) after system electrification, test equipment chip selection signal is high level entirely, the voltage of the chip-select pin dragging down test equipment and being connected with the Inertial Measurement Unit gathered before gathering the output of certain Inertial Measurement Unit, after Inertial Measurement Unit output data acquisition completes, the voltage of the chip-select pin being connected with the Inertial Measurement Unit gathered by test equipment is set to high level.
4. the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1, it is characterised in that: the numbering being numbered the chip-select pin that test equipment is connected with the Inertial Measurement Unit of this collection of the chip-select pin added in described step (3).
5. the method for testing of a kind of Inertial Measurement Unit based on the output of spi bus communication protocol according to claim 1, it is characterized in that: in described step (3), measuring and calculation machine is by judging that the Frame the first two byte received identifies the Inertial Measurement Unit that these frame data are corresponding, and data are preserved to corresponding file, obtain the test data of Inertial Measurement Unit.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037739A (en) * | 2016-12-02 | 2017-08-11 | 上海航天控制技术研究所 | A kind of used group analogy method of carrier rocket Hardware-in-loop Simulation Experimentation |
| CN110779523A (en) * | 2019-10-16 | 2020-02-11 | 中国航空工业集团公司洛阳电光设备研究所 | Inertial measurement unit testing platform based on LabWindows/CVI |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102590556A (en) * | 2012-02-24 | 2012-07-18 | 哈尔滨工业大学 | Zero offset test compensation system of multi-channel capacitor type MEMS (micro-electromechanical system) acceleration sensor |
| CN103196447A (en) * | 2013-03-20 | 2013-07-10 | 哈尔滨工业大学 | Batch MEMS (micro-electromechanical system) sensor based inertial measurement unit and gesture-position information acquisition method |
| CN103453904A (en) * | 2013-09-26 | 2013-12-18 | 哈尔滨工程大学 | Redundancy configuration structure of inertial measurement unit |
| US20150006778A1 (en) * | 2013-06-28 | 2015-01-01 | Stmicroelectronics S.R.L | Integrated data concentrator for multi-sensor mems systems |
| CN104359481A (en) * | 2014-11-12 | 2015-02-18 | 中国兵器工业集团第二一四研究所苏州研发中心 | Miniature inertia measurement unit based on FPGA (field programmable gate array) |
| CN204406391U (en) * | 2014-12-19 | 2015-06-17 | 上海亨通光电科技有限公司 | A kind of data of optical fiber gyroscope R-T unit based on SPI |
| CN105183690A (en) * | 2015-09-02 | 2015-12-23 | 北京航天控制仪器研究所 | Double buffering data transmission method based on serial peripheral interface (SPI) bus communication protocol |
-
2016
- 2016-02-24 CN CN201610099803.6A patent/CN105783941B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102590556A (en) * | 2012-02-24 | 2012-07-18 | 哈尔滨工业大学 | Zero offset test compensation system of multi-channel capacitor type MEMS (micro-electromechanical system) acceleration sensor |
| CN103196447A (en) * | 2013-03-20 | 2013-07-10 | 哈尔滨工业大学 | Batch MEMS (micro-electromechanical system) sensor based inertial measurement unit and gesture-position information acquisition method |
| US20150006778A1 (en) * | 2013-06-28 | 2015-01-01 | Stmicroelectronics S.R.L | Integrated data concentrator for multi-sensor mems systems |
| CN103453904A (en) * | 2013-09-26 | 2013-12-18 | 哈尔滨工程大学 | Redundancy configuration structure of inertial measurement unit |
| CN104359481A (en) * | 2014-11-12 | 2015-02-18 | 中国兵器工业集团第二一四研究所苏州研发中心 | Miniature inertia measurement unit based on FPGA (field programmable gate array) |
| CN204406391U (en) * | 2014-12-19 | 2015-06-17 | 上海亨通光电科技有限公司 | A kind of data of optical fiber gyroscope R-T unit based on SPI |
| CN105183690A (en) * | 2015-09-02 | 2015-12-23 | 北京航天控制仪器研究所 | Double buffering data transmission method based on serial peripheral interface (SPI) bus communication protocol |
Non-Patent Citations (2)
| Title |
|---|
| 廖建平 等，: ""加速度计动态特性自动测试***设计"", 《测控技术》 * |
| 贾伟 等，: ""基于SPI总线的高速串行数据采集***设计"", 《研究与开发》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037739A (en) * | 2016-12-02 | 2017-08-11 | 上海航天控制技术研究所 | A kind of used group analogy method of carrier rocket Hardware-in-loop Simulation Experimentation |
| CN110779523A (en) * | 2019-10-16 | 2020-02-11 | 中国航空工业集团公司洛阳电光设备研究所 | Inertial measurement unit testing platform based on LabWindows/CVI |
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