CN105509626A - Instrument amplification circuit for micro displacement testing - Google Patents
Instrument amplification circuit for micro displacement testing Download PDFInfo
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- CN105509626A CN105509626A CN201510829841.8A CN201510829841A CN105509626A CN 105509626 A CN105509626 A CN 105509626A CN 201510829841 A CN201510829841 A CN 201510829841A CN 105509626 A CN105509626 A CN 105509626A
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- Prior art keywords
- pin
- amplifier
- amplification chip
- resistance
- instrument amplification
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
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- General Physics & Mathematics (AREA)
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Abstract
The invention discloses an instrument amplification circuit for micro displacement testing. The circuit comprises an instrument amplification chip; an IN- pin, an IN+ pin, an RG1 pin, an RG2 pin, a VOUT pin, an REF pin, a VCC pin, and a VSS pin are arranged on the instrument amplification chip; and a gain adjusting resistor RG is arranged between the RG1 pin and the RG2 pin. A first radio frequency interference filter, a second radio frequency interference filter, a third radio frequency interference filter, a fourth radio frequency interference filter, a first amplifier, a second amplifier, and a third amplifier are arranged inside the instrument amplifier chip. The circuit has the following technical effects: the output signal from a linear variable differential transformer type sensor can be amplifier and common-mode noises can be filtered; and a dual-end signal can be converted into a single-end signal and the performance is improved and the size is reduced.
Description
Technical field
The present invention relates to a kind of micrometric displacement test magnifier of micrometric displacement field tests.
Background technology
Linear variable difference transformer formula sensor is the common equipment in micrometric displacement test macro, and the output signal of linear variable difference transformer formula sensor is very faint, and is easy to by noise.Therefore this signal must be amplified, and suppress high frequency noise wherein, and magnifier is applicable to the amplification of feeble signal very much, but application in the micrometric displacement test macro adopting linear variable difference transformer formula sensor few.The volume simultaneously how reducing magnifier is also the problem must considered in application.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, providing a kind of micrometric displacement test magnifier, the output signal of linear variable difference transformer formula sensor can effectively be amplified by it, and suppresses high frequency noise wherein.
A kind of technical scheme realizing above-mentioned purpose is: a kind of micrometric displacement test magnifier, comprise instrument amplification chip, described instrument amplification chip is provided with IN-pin, IN+ pin, RG1 pin, RG2 pin, VOUT pin, REF pin, and VCC pin and VSS pin, be provided with gain setting resistor RG between wherein said RG1 pin and described RG2 pin;
Described instrument amplification chip inside is provided with the first rfi filter, the second rfi filter, the 3rd rfi filter, the 4th rfi filter and the first amplifier, the second amplifier and the 3rd amplifier;
Described first rfi filter connects the in-phase input end of described IN-pin and described first amplifier, described second rfi filter connects the inverting input of described RG1 pin and described first amplifier, described 3rd rfi filter connects the inverting input of described RG2 pin and described second amplifier, and described 4th rfi filter connects the in-phase input end of described IN+ pin and described second amplifier;
Between the output terminal of described RG1 pin and described first amplifier, between the output terminal of described RG2 pin and described second amplifier, be equipped with the resistance that resistance is 50k Ω;
Between the output terminal of described first amplifier and the inverting input of described 3rd amplifier, between the output terminal of described second amplifier and the in-phase input end of described 3rd amplifier, between the inverting input of described 3rd amplifier and the output terminal of described 3rd amplifier, between the in-phase input end of described 3rd amplifier and described REF pin, be equipped with the resistance that resistance is 150k Ω;
The output terminal of described 3rd amplification chip connects described VOUT pin.
Further, the gain setting resistor between described RG1 pin and described RG2 pin is in series by resistance R5 and potentiometer P1.
Further, electric capacity C4 is provided with between the IN+ pin of described instrument amplification chip and IN-pin.
Further, the VCC pin of described instrument amplification chip connects+3V power supply, and the VSS pin of described instrument amplification chip connects-3V power supply.
Have employed the technical scheme of a kind of micrometric displacement test magnifier of the present invention, comprise instrument amplification chip, described instrument amplification chip is provided with IN-pin, IN+ pin, RG1 pin, RG2 pin, VOUT pin, REF pin, and VCC pin and VSS pin, be provided with gain setting resistor RG between wherein said RG1 pin and described RG2 pin; Described instrument amplification chip inside is provided with the first rfi filter, the second rfi filter, the 3rd rfi filter, the 4th rfi filter and the first amplifier, the second amplifier and the 3rd amplifier; Described first rfi filter connects the in-phase input end of described IN-pin and described first amplifier, described second rfi filter connects the inverting input of described RG1 pin and described first amplifier, described 3rd rfi filter connects the inverting input of described RG2 pin and described second amplifier, and described 4th rfi filter connects the in-phase input end of described IN+ pin and described second amplifier; Between the output terminal of described RG1 pin and described first amplifier, between the output terminal of described RG2 pin and described second amplifier, be equipped with the resistance that resistance is 50k Ω; Between the output terminal of described first amplifier and the inverting input of described 3rd amplifier, between the output terminal of described second amplifier and the in-phase input end of described 3rd amplifier, between the inverting input of described 3rd amplifier and the output terminal of described 3rd amplifier, between the in-phase input end of described 3rd amplifier and described REF pin, be equipped with the resistance that resistance is 150k Ω; The output terminal of described 3rd amplification chip connects described VOUT pin.Its technique effect is: the output signal of linear variable difference transformer formula sensor can be amplified, and filtering common mode noise, double-end signal is transformed to single-ended signal, its performance can be more superior, and volume is less simultaneously.
Accompanying drawing explanation
Fig. 1 is the structural representation of instrument amplification chip in a kind of micrometric displacement test magnifier of the present invention.
Fig. 2 is the schematic diagram of the peripheral circuit of instrument amplification chip in a kind of micrometric displacement test magnifier of the present invention.
Embodiment
Refer to Fig. 1 and Fig. 2, the present inventor, in order to understand technical scheme of the present invention better, below by embodiment particularly, and is described in detail by reference to the accompanying drawings:
Refer to Fig. 1 and Fig. 2, a kind of micrometric displacement test magnifier of the present invention is a kind of precision differential voltage amplifier circuit, and it comes from operation amplifier circuit, but is better than operation amplifier circuit.It is inner that magnifier is integrated in instrument amplification chip key element, the structure of its uniqueness makes it have high cmrr, high input impedance, low noise, low linear error, low offset drift gain, the features such as flexible and easy to use are set, make it in data acquisition, sensor signal amplification, high speed signal adjustment etc., have outstanding advantage.
Instrument amplification chip in magnifier is that one has Differential Input and relative reference end, and the closed loop gain assembly of Single-end output, has the Single-end output of Differential Input and relative reference end.The closed loop gain that itself and operational amplifier difference are operational amplifiers is determined by the non-essential resistance be connected between inverting input with output terminal, and instrument amplifier then uses the internal feedback resistor network of isolating with input end.Two differential input ends of instrument amplification chip apply input signals, and its gain can be preset by inside, also can be arranged by pin inner portions by user or preset by the outside gain resistor of isolating with input signal.
Refer to Fig. 1, magnifier comprises instrument amplification chip 1, and the pin on instrument amplification chip 1 comprises IN-pin, IN+ pin, RG1 pin, RG2 pin, VOUT pin, REF pin, and VCC pin and VSS pin.Wherein be provided with gain setting resistor RG between RG1 pin, RG pin, gain setting resistor RG is by connection RG1 pin, and resistance value is the resistance R5 of 10k Ω, and connection RG2 pin, maximum resistance is that the potentiometer P1 of 10k Ω is in series.
Instrument amplification chip 1 inside is provided with the first rfi filter 11, second rfi filter 12, the 3rd rfi filter 13, the 4th rfi filter 14, and the first amplifier A1, the second amplifier A2 and the 3rd amplifier A3.Wherein, the first rfi filter 11 connects the in-phase input end of IN-pin and the first amplifier A1, and the second rfi filter 12 connects the inverting input of RG1 pin and the first amplifier A1.3rd rfi filter 13 connects the inverting input of RG2 pin and the second amplifier A2, and the 4th rfi filter 13 connects the in-phase input end of IN+ pin and the second amplifier A2.Be provided with the resistance R11 that resistance is 50k Ω between the output terminal of RG1 pin and the first amplifier A1, between the output terminal of RG2 pin and the second amplifier A2, be provided with the resistance R12 that resistance is 50k Ω.
Meanwhile, between the output terminal of the first amplifier A1 and the inverting input of the 3rd amplifier A3, be provided with the resistance R21 that resistance is 150k Ω, between the output terminal of the second amplifier A2 and the in-phase input end of the 3rd amplifier A3, be provided with the resistance R22 that resistance is 150k Ω.Be provided with the resistance R3 that resistance is 150k Ω between the inverting input of the 3rd amplifier A3 and the output terminal of the 3rd amplifier A3, between the in-phase input end of the 3rd amplifier A3 and REF pin, be provided with the resistance R4 that resistance is 150k Ω.
The output terminal of the 3rd amplification chip A3 connects the VOUT pin of this instrument amplification chip 1.
Be provided with electric capacity C4 between the IN-input pin of instrument amplification chip 1 and IN+ pin, VCC pin connects+3V power supply, and VSS pin connects-3V power supply, for the output signal of linear variable difference transformer formula sensor being carried out the suppression of high frequency noise.
There is in a kind of micrometric displacement test magnifier of the present invention the low maladjustment voltage of maximum 25uV, the low drifting of 0.1uV/ DEG C, the low noise of 50nV, the common-mode rejection ratio of 100dB/min, the low input current deflection of maximum 200pA, the power range of 1.8V ~ 5.5V, the input voltage of+0.1V to-0.1V, the output voltage of+0.05V to-0.05V, the low quiescent current of 50uA, the operating temperature range of-40 DEG C ~ 125 DEG C.
The gain-adjusted to magnifier can be realized by the resistance of regulator potentiometer P1.
A kind of micrometric displacement test magnifier of the present invention, can amplify the output signal of linear variable difference transformer formula sensor, and filtering common mode noise, double-end signal is transformed to single-ended signal, its performance can be more superior, and volume is less simultaneously.
Those of ordinary skill in the art will be appreciated that, above embodiment is only used to the present invention is described, and be not used as limitation of the invention, as long as in spirit of the present invention, all will drop in Claims scope of the present invention the change of the above embodiment, modification.
Claims (4)
1. a micrometric displacement test magnifier, is characterized in that:
Comprise instrument amplification chip, described instrument amplification chip is provided with IN-pin, IN+ pin, RG1 pin, RG2 pin, VOUT pin, REF pin, and VCC pin and VSS pin, be provided with gain setting resistor RG between wherein said RG1 pin and described RG2 pin;
Described instrument amplification chip inside is provided with the first rfi filter, the second rfi filter, the 3rd rfi filter, the 4th rfi filter and the first amplifier, the second amplifier and the 3rd amplifier;
Described first rfi filter connects the in-phase input end of described IN-pin and described first amplifier, described second rfi filter connects the inverting input of described RG1 pin and described first amplifier, described 3rd rfi filter connects the inverting input of described RG2 pin and described second amplifier, and described 4th rfi filter connects the in-phase input end of described IN+ pin and described second amplifier;
Between the output terminal of described RG1 pin and described first amplifier, between the output terminal of described RG2 pin and described second amplifier, be equipped with the resistance that resistance is 50k Ω;
Between the output terminal of described first amplifier and the inverting input of described 3rd amplifier, between the output terminal of described second amplifier and the in-phase input end of described 3rd amplifier, between the inverting input of described 3rd amplifier and the output terminal of described 3rd amplifier, between the in-phase input end of described 3rd amplifier and described REF pin, be equipped with the resistance that resistance is 150k Ω;
The output terminal of described 3rd amplification chip connects described VOUT pin.
2. a kind of micrometric displacement test magnifier according to claim 1, is characterized in that: the gain setting resistor between described RG1 pin and described RG2 pin is in series by resistance R5 and potentiometer P1.
3. a kind of micrometric displacement test magnifier according to claim 1, is characterized in that: be provided with electric capacity C4 between the IN+ pin of described instrument amplification chip and IN-pin.
4. a kind of micrometric displacement test magnifier according to claim 1, is characterized in that: the VCC pin of described instrument amplification chip connects+3V power supply, and the VSS pin of described instrument amplification chip connects-3V power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510829841.8A CN105509626A (en) | 2015-11-25 | 2015-11-25 | Instrument amplification circuit for micro displacement testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510829841.8A CN105509626A (en) | 2015-11-25 | 2015-11-25 | Instrument amplification circuit for micro displacement testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105509626A true CN105509626A (en) | 2016-04-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510829841.8A Pending CN105509626A (en) | 2015-11-25 | 2015-11-25 | Instrument amplification circuit for micro displacement testing |
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| CN (1) | CN105509626A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114166106A (en) * | 2021-11-03 | 2022-03-11 | 重庆材料研究院有限公司 | Magnetostrictive displacement sensor |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5777468A (en) * | 1996-12-19 | 1998-07-07 | Texas Instruments Incorporated | Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus |
| CN203225708U (en) * | 2013-04-15 | 2013-10-02 | 成都瑞途电子有限公司 | Instrumentation amplifier circuit |
| CN103986427A (en) * | 2014-05-22 | 2014-08-13 | 北京空间机电研究所 | Instrumentation amplifier circuit with selectable magnification times |
| CN104807392A (en) * | 2015-05-08 | 2015-07-29 | 上海工程技术大学 | LVDT (linear variable differential transformer) sinusoidal excitation signal generating circuit |
| CN104833297A (en) * | 2015-05-26 | 2015-08-12 | 上海工程技术大学 | Signal processing unit for multichannel micro-strain data acquisition system |
-
2015
- 2015-11-25 CN CN201510829841.8A patent/CN105509626A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5777468A (en) * | 1996-12-19 | 1998-07-07 | Texas Instruments Incorporated | Variable differential transformer system and method providing improved temperature stability and sensor fault detection apparatus |
| CN203225708U (en) * | 2013-04-15 | 2013-10-02 | 成都瑞途电子有限公司 | Instrumentation amplifier circuit |
| CN103986427A (en) * | 2014-05-22 | 2014-08-13 | 北京空间机电研究所 | Instrumentation amplifier circuit with selectable magnification times |
| CN104807392A (en) * | 2015-05-08 | 2015-07-29 | 上海工程技术大学 | LVDT (linear variable differential transformer) sinusoidal excitation signal generating circuit |
| CN104833297A (en) * | 2015-05-26 | 2015-08-12 | 上海工程技术大学 | Signal processing unit for multichannel micro-strain data acquisition system |
Non-Patent Citations (1)
| Title |
|---|
| TEXAS INSTRUMENTS: "INA333 微功耗(50μA)、零漂移、轨到轨输出仪表放大器", 《HTTP://WWW.TI.COM.CN/CN/LIT/DS/SYMLINK/INA333.PDF》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114166106A (en) * | 2021-11-03 | 2022-03-11 | 重庆材料研究院有限公司 | Magnetostrictive displacement sensor |
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Application publication date: 20160420 |
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