CN105490656A - Production debugging system and production debugging method for digital temperature compensated crystal oscillator - Google Patents
Production debugging system and production debugging method for digital temperature compensated crystal oscillator Download PDFInfo
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Abstract
The invention discloses a production debugging system and a production debugging method for a digital temperature compensated crystal oscillator. The production debugging system comprises a high and low temperature test box, a placement module, a frequency measurement mechanism, a main control board, and an external control center; the placement module is arranged in the high and low temperature test box, the placement module comprises a placement board used for placing a crystal oscillator to be measured and a conversion connecting module for signal transferring, a signal output end of the placement board is connected with the frequency measurement mechanism and the main control board through the conversion connecting module, the frequency measurement mechanism is arranged at the outside of the high and low temperature test box, the frequency measurement mechanism comprises a plurality of frequency measurement boards, all frequency measurement boards are arranged on the same bottom board as the main control board, and the main control board communicates with the external control center. The production debugging system disclosed by the invention is applied to the production debugging of the digital temperature compensated crystal oscillator, the system has a simple structure, a low cost and relatively high test efficiency, and the rest result is accurate. The production debugging system disclosed by the invention is suitable for testing any crystal oscillators.
Description
Technical field
The invention belongs to crystal oscillator field tests, relate to a kind of scheduling and planning system of crystal oscillator, specifically a kind of factory test system for digital temperature compensation crystal oscillistor, present invention also offers the adjustment method of this factory test system.
Background technology
Digital temperature compensation crystal oscillistor is the frequency signal generator part of a kind of high accuracy, high stability, due to temperature compensation procedure digitlization, needs to carry out frequency measurement frequently and a large amount of data manipulations in production process.Current production equipment mainly adopts the mode of production of commissioning in turn, and frequency of utilization counter completes frequency measurement, can only carry out commissioning to one or several product at every turn simultaneously, and this commissioning mode of production seriously constrains production efficiency.In order to solve the lower problem of current crystal oscillator commissioning production efficiency, need the more efficient factory test equipment of exploitation.Such as, publication number is CN101609126B, and the Chinese patent that name is called " Auto-Test System of temperature compensating crystal oscillator " just provides a kind of Auto-Test System of temperature compensating crystal oscillator, but this system has following defect:
(1) crystal oscillator gating module is made up of multiple decoder and multidiameter option switch, work computer-chronograph can only rely on crystal oscillator gating module to select a crystal oscillator to be measured to rely on frequency counter to complete frequency test to it, this use gating module chooses product to carry out the method for testing in turn, production efficiency is low, seriously governs the raising of output;
(2) crystal oscillator gating module is placed in incubator, and in actual production process, the temperature in incubator constantly circulates between high/low temperature, considerably increases the spoilage of gating module, can have an impact to the life cycle of system and production process;
(3) take frequency marking as benchmark, frequency of utilization counter carries out frequency measurement to output signal, frequency counter can only carry out frequency measurement to a road input signal in real time, and the method for measurement cost of this frequency is comparatively large, efficiency is lower, is also the key factor that limit production efficiency improves;
(4) data transmission module converts digital signal to analog level signal, and analog level signal is easily subject to the interference such as various level signal, magnetic field around, can have an impact to compensation effect, and the commissioning being not suitable for digital temperature compensation crystal oscillistor is produced;
(5) temperature control unit is single-chip microcomputer, operationally adopt the change of pid algorithm control temperature and stablize, in actual use, need according to the actual conditions of incubator, constantly carry out test calibration and just can find most suitable pid algorithm value, increase the use difficulty of system.
Summary of the invention
For solving the above deficiency existed in prior art, the invention provides a kind of factory test system for digital temperature compensation crystal oscillistor, frequency measurement and data acquisition can be carried out to multiple digital temperature compensation crystal oscillistor simultaneously, greatly improve commissioning efficiency.
The present invention is also supplied to a kind of adjusting, measuring method of above-mentioned debug system, and this adjustment method is applicable to the factory test of digital temperature compensation crystal oscillistor, combines with above-mentioned regulating and measuring system, and commissioning process is more simple, quick, and testing result is more accurate.
For achieving the above object, the technical solution adopted in the present invention is as follows:
For a factory test system for digital temperature compensation crystal oscillistor, it comprises:
High-low temperature test chamber, for place crystal oscillator to be measured and draw signal placement module, for gathering the frequency measurement mechanism of all crystal oscillators to be measured, the master control borad as control centre, external control center.Described placing mold is mounted in high-low temperature test chamber, described placement module comprises the placement plate for placing crystal oscillator to be measured and the conversion link block for signal converting, described placement partitioned signal output is by conversion link block rate of connections measuring mechanism and master control borad, described frequency measurement mechanism is located at outside high-low temperature test chamber, described frequency measurement mechanism comprises polylith frequency measurement plate, all frequency measurement plates and master control borad are located on same base plate, base plate there is line connect all frequency measurement plates and master control borad, described master control borad and external control center communicate.
As limitation of the invention: described conversion link block comprises the Signals Transfer Board be located in high-low temperature test chamber, described all placement plates are dismountable to be placed on Signals Transfer Board, place plate when normal work to be located on Signals Transfer Board, and all placement plates are all connected with the port that Signals Transfer Board is arranged; Described frequency measurement mechanism comprises the frequency measurement plate identical with placing plate quantity, for providing the frequency marking of standard frequency, the frequency signal input end to be measured of each frequency measurement plate described is connected with the frequency signal output to be measured of corresponding placement plate, described master control borad and all frequency measurement plates are located on a base plate all altogether, base plate have cabling be connected with all frequency measurement plates by master control borad; The signal output part of described frequency marking is connected with the standard frequency input interface of base plate.
As limitation of the invention further: described control centre is connected with the test data communication bus port on master control borad by test data communication bus, is connected with high-low temperature test chamber by high-low temperature test chamber control bus;
Described each frequency measurement plate by frequency signal transmission line connection signal keyset to be measured, and connects corresponding placement plate by Signals Transfer Board, and described each frequency measurement plate is connected with master control borad by backplane routing.
Present invention also offers a kind of adjustment method of the factory test system for digital temperature compensation crystal oscillistor, complete debugging based on the factory test system for digital temperature compensation crystal oscillistor described above, comprise the following steps:
One, crystal oscillator to be measured is placed: be positioned over by all crystal oscillators to be measured on placement plate in high-low temperature test chamber;
Can two, systemic-function detects: the frequency measurement function of external control center check system, is arranged by all crystal oscillators to be measured and enters debugging mode, and check set up with all crystal oscillators to be measured and communicate;
Crystal oscillator commissioning to be measured: external control center directly controls to enter commissioning work for the factory test system of digital temperature compensation crystal oscillistor, frequency commissioning is carried out to all crystal oscillators to be measured placed, and the data after commissioning are carried out matching, conversion, then the data generated after conversion are write corresponding crystal oscillator to be measured respectively;
Four, crystal oscillator detects: after completing steps one, step 2, step 3, external control center directly controls to enter testing for the factory test system of digital temperature compensation crystal oscillistor, frequency detecting is carried out to all crystal oscillators to be measured placed, and filters out underproof crystal oscillator according to frequency detecting result.
Restriction as to said method: described step 3 comprises the following steps:
31) central capacitive calibration: the output frequency according to crystal oscillator to be measured adjusts its central capacitive, use the gamut of binary search traversal central capacitive value, find the most suitable central capacitive value of each crystal oscillator to be measured, make its output frequency meet the requirements of frequency range;
32) start high-low temperature test chamber: the operation formula of high-low temperature test chamber when debugging efforts is set, run formula and comprise constant temperature zone and alternating temperature section, wherein the temperature of constant temperature zone is commissioning temperature spot, in whole temperature range, commissioning temperature spot is set according to certain temperature interval, completes and after formula is arranged operation formula to be write and to start high-low temperature test chamber;
33) commissioning temperature spot temperature keeps: external control center constantly gathers the current state information of high-low temperature test chamber, judge whether high-low temperature test chamber enters constant temperature zone, once high-low temperature test chamber enters Test Station constant temperature zone, external control center controls high-low temperature test chamber and enters hold mode, high-low temperature test chamber will remain on temperature constant state always, the state information of continuous collecting high-low temperature test chamber afterwards, judge in high-low temperature test chamber, whether temperature is stabilized in Test Station temperature, if high-low temperature test chamber is stabilized in Test Station temperature, external control center controls to start to carry out commissioning on current commissioning temperature spot for the factory test system of digital temperature compensation crystal oscillistor,
34) crystal oscillator frequency commissioning to be measured: according to the frequency compensation polarity of crystal oscillator to be measured, use binary search to find out the optimal frequency offset of each crystal oscillator to be measured on current commissioning temperature spot, and read the temperature transition numerical value corresponding with ambient temperature from each crystal oscillator to be measured;
35) loop test: external control center controls high-low temperature test chamber and removes hold mode, and runs to next commissioning temperature spot; 36) continuous circulation step 33), 34), 35), until complete the debugging under all commissioning temperature spots;
37) test data process: the optimal frequency offset record under all commissioning temperature spots the crystal oscillator each to be measured after commissioning and temperature transition numerical value carry out curve fitting respectively, transform, and the data programming after matching being transformed enters corresponding crystal oscillator to be measured.
As to step 31 in said method) restriction: described step 31) comprise the following steps:
I) the central capacitive value that arranges all crystal oscillators to be measured is intermediate value;
II) measure the output frequency of all crystal oscillators to be measured;
III) each crystal oscillator output frequency to be measured is carried out size with nominal frequency compare, according to size comparative result, and the central capacitive of crystal oscillator to be measured is to the adjustment polarity of output frequency, take binary search as the central capacitive of the adjustment next time value that principle calculates each crystal oscillator to be measured;
IV) the central capacitive value after the adjustment of generation is write in corresponding crystal oscillator to be measured respectively;
V) circulation step II), III), IV), until binary search completes, complete the gamut of traversal central capacitive value.
VI) find out output frequency and nominal frequency that central capacitive adjusted value immediate in all previous adjustment process of each crystal oscillator to be measured, and judge this output frequency value whether in the frequency range required, if finally determine that immediate output frequency value is in the frequency range required with nominal frequency, then preserve the best central capacitive calibration value of crystal oscillator to be measured and the frequency of each crystal oscillator correspondence to be measured output, otherwise the central capacitive of crystal oscillator to be measured is calibrated unsuccessfully, row labels of going forward side by side.
As to said method step 34) restriction: described step 34) comprise the following steps:
1. the frequency compensation value arranging all crystal oscillators to be measured is intermediate value;
2. the output frequency of all crystal oscillators to be measured is measured;
3. the output frequency of each crystal oscillator to be measured and nominal frequency are carried out size to compare, according to the frequency compensation adjustment polarity of the result after relatively and crystal oscillator to be measured, find out the offset of next time adjusting frequency of each crystal oscillator to be measured with the principle of binary search;
4. the frequency compensation value after the adjustment of generation is write respectively in corresponding crystal oscillator to be measured;
5. step is repeated 2., 3., 4., until binary search completes;
6. output frequency is found out in all previous adjustment process of each crystal oscillator to be measured closest to that frequency compensation numerical value of nominal frequency, then read the temperature transition numerical value corresponding with external temperature from all crystal oscillators to be measured, preserve the temperature of current commissioning temperature spot and the deviation of the optimal compensation value of each crystal oscillator to be measured on this commissioning temperature spot, temperature transition value and the relative nominal frequency of output frequency.
Owing to have employed technique scheme, compared with prior art, acquired technological progress is in the present invention:
(1) the present invention abandons the traditional approach using counter frequency measurement, frequency measurement plate can be run simultaneously measurement to multichannel frequency signal to be measured, and polylith frequency measurement plate works and further increases measurement capability simultaneously, frequency measurement can be carried out to all crystal oscillators to be measured simultaneously, enormously simplify factory test step, reduce equipment cost, save frequency-measurement time, improve factory test efficiency;
(2) the present invention have employed master-slave control mode in factory test system, take master control borad as system master center, can be controlled all frequency measurement plates and all crystal oscillators to be measured by master control borad, this pattern simplifies system, be beneficial to modularized design, maintain easily;
(3) the present invention is in master-slave control mode, increase the data-handling capacity of master control borad, simplify and the control command of system is operated, host computer external control center only need control the control that master control borad can realize whole system, reduce the operation easier of whole system when work in every, facilitate automated production;
(4) in the present invention, factory test system has stronger frequency measurement ability and data-handling capacity, crystal oscillator to be measured is placed on and places on plate, without the need to gating module, by Signals Transfer Board, all signal convertings placed on plate are exported, regulating and measuring system can be measured the output frequency of all crystal oscillators to be measured, gather simultaneously, greatly improves production efficiency;
(5) the present invention is applicable to the factory test of digital temperature compensation crystal oscillistor, and the signal of detection and transmission is digital signal, and antijamming capability is strong, and reliability is high;
(6) the present invention adopts binary search to calibrate the central capacitive of crystal oscillator to be measured respectively, searches the optimal frequency offset of each crystal oscillator to be measured, binary search can travel through whole seek scope, calibration and compensation are more accurate, and commissioning is more simple and accurate.
In sum, the factory test system configuration for digital temperature compensation crystal oscillistor of the present invention is simple, cost is low, and its adjustment method is simply efficient, and test result is accurate.
The present invention is applicable to test any crystal oscillator.
Accompanying drawing explanation
Below in conjunction with drawings and the specific embodiments, the present invention is further described in detail.
Fig. 1 is the structural representation of the embodiment of the present invention 1;
Fig. 2 is the functional block diagram that plate measured by the embodiment of the present invention 1 medium frequency;
Fig. 3 is the functional block diagram of master control borad in the embodiment of the present invention 1;
Fig. 4 is the flow chart of the embodiment of the present invention 2.
In figure: 1-high-low temperature test chamber, 2-place plate, 3-master control borad, 4-external control center, 5-conversion link block, 6-frequency measurement plate, 7-frequency marking, 8-base plate, 9-stabilized voltage power supply, 10--product commissioning bus, 11-frequency signal transmission bus to be measured, 12-system data communication bus, 13-high-low temperature test chamber control bus.
Embodiment
Embodiment 1 is for the factory test system of digital temperature compensation crystal oscillistor
Present embodiments provide a kind of factory test system for digital temperature compensation crystal oscillistor, as shown in Figure 1, comprising:
High-low temperature test chamber 1, for providing temperature environment for the factory test of crystal oscillator to be measured, its inside is provided with several for the placement plate 2 of placing crystal oscillator to be measured and the conversion link block 5 exported by the signal converting placed on plate 2, places plate 2 and is drawn by the signal of crystal oscillator to be measured placed thereon.In the present embodiment, every block is placed on plate 2 and can be placed at most 80 crystal oscillators to be measured; Be outside equipped with for measuring the frequency measurement mechanism gathering all crystal oscillator output frequencies to be measured at high-low temperature test chamber 1, by changing, link block 5 is forwarded to frequency measurement mechanism to the output frequency signal of described placement plate 2, data traffic signals passes through conversion link block 5 and is forwarded to master control borad 3.Described master control borad 3 is communicated with external control center 4 by system data communication bus 12.
The conversion link block 5 of the present embodiment comprises Signals Transfer Board, described Signals Transfer Board is located in high-low temperature test chamber 1, each placement plate 2 is equipped with the port be connected with Signals Transfer Board, when normal work, all placement plates 2 are all located on Signals Transfer Board, place plate 2 can take out from Signals Transfer Board or put into, namely all signal convertings placed on plate 2 can be exported by Signals Transfer Board; And Signals Transfer Board is provided with product commissioning bus port and multichannel frequency signal output port to be measured, every block is placed the commissioning bus switching on plate 6 and is connected on master control borad 3 by product commissioning bus 10 by Signals Transfer Board, and the frequency signal switching to be measured that every block is placed on plate 6 by Signals Transfer Board is exported and is connected on corresponding frequency measurement plate 6 by frequency signal transmission bus 11 to be measured.
The frequency measurement mechanism of the present embodiment as shown in Figure 1, comprise the frequency measurement plate 6 identical with placing plate 2 quantity, and for providing the frequency marking 7 of standard frequency, wherein each frequency measurement plate 6 is provided with frequency signal input end mouth to be measured, and the frequency signal input end mouth to be measured of each frequency measurement plate 6 is connected by frequency signal transmission bus 11 to be measured and the multichannel on Signals Transfer Board rate-adaptive pacemaker port to be measured, and be forwarded to corresponding placement plate 6 by Signals Transfer Board.
Also be provided with base plate 8 in the present embodiment, described master control borad 3 is all located on base plate 8 with all frequency measurement plates 6, and is connected with all frequency measurement plates 6 by master control borad 3 by the circuit board trace on base plate 8.Described base plate 8 is provided with standard frequency input interface, power interface, master control borad port and multiple frequency measurement plate port, wherein the quantity of frequency measurement plate port is identical with the quantity of frequency measurement plate 6, and a frequency measurement plate port correspondence connects a frequency measurement plate 6; Master control borad on master control borad port correspondence connection master control borad 3 on base plate 8 and base plate connectivity port; Power interface is directly connected with the power output end of the stabilized voltage power supply 9 in the external world; Standard frequency input port then connects the signal output part of frequency marking 7.
Meanwhile, in order to make the control of the present embodiment more accurate, described external control center 4 is controlled by high-low temperature test chamber control bus 13 pairs of high-low temperature test chambers 1.
The master control borad 3 of the present embodiment and frequency measurement plate 6 are all core with fpga chip, frequency measurement plate 6 is that normative reference carries out frequency measurement with standard-frequency signal, every block frequency measurement plate 6 can carry out frequency measurement to 80 tunnel frequency signals to be measured at most simultaneously, every block frequency measurement plate 6 is all designed with frequency measurement control module and 80 frequency measuring block through coding, when channelized frequencies is tested, as shown in Figure 2, frequency measurement control module realizes carrying out frequency measurement Control & data acquisition to all frequency measuring block by frequency measurement control signal bus and frequency measurement data transmission bus.In frequency measurement, accepted standard frequency is the standard frequency that frequency marking 7 exports.The frequency measurement data of generation are all sent to master control borad 3 by base plate 8 after completing frequency measurement by frequency measurement plate 6 at every turn automatically, and master control borad 3 also can carry out single frequency measurement by control frequency measurement plate 6 simultaneously.
Because product commissioning bus 10 is the direct communication buss in the face of crystal oscillator to be measured of master control borad 3 in the present embodiment, traffic rate is lower, and its message transmission rate is generally no more than 20Kbps; And test data communication bus 13 is connection buses of external control center 4 and master control borad 3, adopt Multi-serial port or usb bus design, transmission rate can reach even a few Mbps of hundreds of Kbps, there are differences between the Bus Speed of such front and back end, in order to accelerate the transmission rate of total system data, adopt serioparallel exchange technology, to multichannel product commissioning bus 10 distribution end port address respectively, will at the enterprising Serial Communication of that product commissioning bus 10 by differentiating the judgement of instruction middle port address.Master control borad 3 specific design principle as shown in Figure 3, comprises commissioning bus master module, instruction analysis and data transmission module, test data communication bus interface module, frequency measurement plate functional control module, multiple product commissioning bus interface module.
Embodiment 2 is for the adjustment method of the factory test system of digital temperature compensation crystal oscillistor
Present embodiments provide a kind of adjustment method of the factory test system for digital temperature compensation crystal oscillistor, complete debugging based on the factory test system for digital temperature compensation crystal oscillistor described in embodiment 1, as shown in Figure 4, comprise the following steps:
First system initialization setting is carried out, comprising arranging nominal frequency, frequency measurement relevant parameter, temperature characteristic parameter, file preservation parameter etc.
One, crystal oscillator to be measured is placed: be all positioned over by all crystal oscillators to be measured on placement plate 2 in high-low temperature test chamber 1;
Two, System self-test: system carries out self-inspection, comprise detection system frequency measurement function, all crystal oscillator settings to be measured are entered debugging mode, can inspection set up with all crystal oscillators to be measured and communicate.
Three, product commissioning: commissioning is carried out to all crystal oscillators to be measured.
Wherein step 3 is the committed step of the present embodiment, and it specifically comprises the following steps:
31) central capacitive calibration: according to crystal oscillator central capacitive value to be measured to the adjustment polarity of frequency, use binary search traversal central capacitive value gamut, find the most suitable central capacitive value of each crystal oscillator to be measured, and its output frequency is met the requirements of in frequency range.Binary search is used to the step that central capacitive is calibrated to be in this step:
I) the central capacitive value that arranges all crystal oscillators to be measured is intermediate value;
II) measure the output frequency of all crystal oscillators to be measured, such as, be provided with N(N >=1 in the present embodiment) individual crystal oscillator to be measured, therefore need the output frequency measuring N number of crystal oscillator to be measured, be designated as F(1 respectively), F(2), F(3) ... F(N);
III) each crystal oscillator output frequency to be measured is carried out size with nominal frequency compare, according to size comparative result, and the central capacitive of crystal oscillator to be measured is to the adjustment polarity of output frequency, calculate the central capacitive of the adjustment next time value of each crystal oscillator to be measured with binary search principle, be specifically adjusted to:
If F(N) > nominal frequency, and central capacitive is negative to output frequency polarity, illustrate that the central capacitive value that this inputs is on the low side, the adjustment central capacitive value generating next time should be: the central capacitive value+central capacitive value full scale/M(M of last input is regulation coefficient, first time is 4, second time be 8, after be once previous twice).
If F(N) < nominal frequency, and central capacitive is negative to output frequency polarity, illustrate that the central capacitive intermediate value that this inputs is bigger than normal, the central capacitive value generated after the adjustment of next time should be: the central capacitive value-central capacitive value full scale/M(M of last input is regulation coefficient, first time is 4, second time be 8, after be once previous twice).
If F(N)=nominal frequency, then this central capacitive value is most suitable central capacitive value.
IV) the central capacitive value after the adjustment of generation is write in corresponding crystal oscillator to be measured respectively;
V) circulation step II), III), IV), until the central capacitive calibration success of all crystal oscillators to be measured or the ratio of central capacitive value full scale and regulation coefficient are 1 is also that binary search completes;
VI) find out output frequency and nominal frequency that central capacitive adjusted value immediate (being last central capacitive adjusted value in theory) in all previous adjustment process of each crystal oscillator to be measured, and judge output frequency under this adjusted value whether in the frequency range required, if finally determine that immediate output frequency is in the frequency range required with nominal frequency, then preserve the best central capacitive calibration value of crystal oscillator to be measured and the corresponding frequency exported, otherwise the central capacitive of crystal oscillator to be measured is calibrated unsuccessfully, row labels of going forward side by side.
The calibration to each crystal oscillator central capacitive to be measured then can be completed according to above-mentioned step, such as, if the central capacitive value scope of a crystal oscillator to be measured is 0-255, central capacitive value is negative to frequency adjustment polarity, namely central capacitive value is larger, and crystal oscillator output frequency is lower, and vice versa, require nominal frequency 10000000, split is searched:
First time writes intermediate value: 128, regulation coefficient M=4, output frequency: 10000045;
Second time adjusted value: 128+256/4=192, regulation coefficient M=8, output frequency: 9999981;
Adjusted value: 192-256/8=160, regulation coefficient M=16 for the third time, output frequency: 10000013;
4th adjusted value: 160+256/16=176, regulation coefficient M=32, output frequency: 9999997;
5th adjusted value: 176-256/32=168, regulation coefficient M=64, output frequency: 10000005;
6th adjusted value: 168+256/64=172, regulation coefficient M=128, output frequency: 10000001;
7th adjusted value: 172+256/128=174, regulation coefficient M=256, output frequency: 9999999;
8th adjusted value: 174-256/256=173,256/M=1; Output frequency: 10000000.
Also namely best central capacitive calibration value is: 173, and the relative nominal frequency deviation of corresponding calibration frequency is 0.
32) high-low temperature test chamber 1 is started: high-low temperature test chamber is set and runs formula, run formula and comprise constant temperature zone and alternating temperature section, wherein constant temperature zone is commissioning temperature spot, in whole temperature range, commissioning temperature spot is set according to certain temperature interval, completes and after formula is arranged operation formula to be write and to start high-low temperature test chamber 1; Such as overall commissioning temperature range is-40 DEG C ~ 85 DEG C, according to from high temperature to low temperature, and the setting of the commissioning temperature spot in every 5 DEG C of intervals, then the first commissioning temperature spot is 85 DEG C, next commissioning temperature spot is 80 DEG C, next commissioning temperature spot is 75 DEG C again ... by that analogy, to the last a commissioning temperature spot is-45 DEG C.
33) commissioning temperature spot temperature constant: external control center 4 constantly gathers the state information of high-low temperature test chamber 1, judge whether high-low temperature test chamber 1 enters constant temperature zone, once high-low temperature test chamber 1 enters Test Station constant temperature zone, then external control center 4 controls high-low temperature test chamber 1 and enters hold mode, high-low temperature test chamber 1 will remain on temperature constant state always, the state information of continuous collecting high-low temperature test chamber 1 afterwards, judge in high-low temperature test chamber 1, whether temperature is stabilized in Test Station temperature, if high-low temperature test chamber 1 is stable in Test Station temperature, external control center 4 controls to start to carry out the commissioning on Current Temperatures point for the factory test system of digital temperature compensation crystal oscillistor,
Judge in the present embodiment that the standard whether temperature is stable is artificial setting, such as, judge whether temperature is stabilized on 80 DEG C, the method judged is: within every 3 seconds, (this value can be arranged) reads the temperature in a high-low temperature test chamber 1, judge that this reading temperature is whether in 80 ± 0.1 DEG C (error amount of 0.1 DEG C can be arranged), if it is counter adds 1, if not then counter O reset, circulation so, can arrange until counter accumulated value is more than or equal to this value of 60(), be judged to be that temperature has been stabilized on 80 DEG C, namely continuous within 3*60=180 second, temperature in high-low temperature test chamber 1 remains in the scope of 80 ± 0.1 DEG C all always, that now can think that temperature has been stabilized on 80 DEG C.
34) crystal oscillator frequency to be measured compensates: according to the frequency compensation polarity of crystal oscillator to be measured, use binary search to find out the optimal frequency offset of each crystal oscillator to be measured on current commissioning temperature spot, and read the temperature transition numerical value corresponding with ambient temperature from each crystal oscillator to be measured; This step is by the optimal frequency offset of each crystal oscillator to be measured on binary search Current Temperatures point, and detailed process is:
1. the frequency compensation value arranging all crystal oscillators to be measured is intermediate value;
2. the output frequency of all crystal oscillators to be measured is measured;
3. the output frequency of each crystal oscillator to be measured and nominal frequency are carried out size to compare, according to the frequency compensation adjustment polarity of the result after relatively and crystal oscillator to be measured, find out the offset of next time adjusting frequency of each crystal oscillator to be measured with binary search principle; Be the same with the calibration steps utilizing binary search to central capacitive in this step, do not repeat them here.
4. the frequency compensation value after the adjustment of generation is write respectively in corresponding crystal oscillator to be measured;
5. step is repeated 2., 3., 4., until binary search completes;
6. that frequency compensation numerical value (in theory for adjusting offset for the last time) of the nominal frequency that output frequency exports closest to frequency marking in all previous adjustment process of each crystal oscillator to be measured is found out, then read the temperature transition numerical value corresponding with external temperature from all crystal oscillators to be measured, and preserve temperature and the optimal compensation value of each crystal oscillator to be measured on this commissioning temperature spot, compensating frequency deviation and the temperature transition value of current commissioning temperature spot.
35) loop test: external control center 4 control high-low temperature test chamber formula remove hold mode, and to next commissioning temperature spot run, continuous circulation step 33), 34), 35), until complete the debugging under all commissioning temperature spots;
36) test data process: the optimal frequency offset that the crystal oscillator each to be measured after commissioning is recorded under all temperature spots to be measured and temperature transition numerical value carries out curve fitting respectively, data transformations, programming store.In this step, curve is that the optimal frequency offset that utilizes least square method to record under all temperature spots to be measured according to each crystal oscillator to be measured and temperature transition numerical value carry out curve fitting; And the curve generated calculates programming data according to set form, and programming enters in corresponding crystal oscillator to be measured.
Three, crystal oscillator detects: after completing steps one, step 2, step 3, the factory test system that external control center 4 directly controls to be used for digital temperature compensation crystal oscillistor enters testing, frequency detecting is carried out to all crystal oscillators to be measured placed, and filters out underproof crystal oscillator according to frequency detecting result.
In this step, high-low temperature test chamber 1 detects formula and can arrange, and arranges example:
Be no more than 0.5 degree/min for principle with rate temperature change in high-low temperature test chamber 1, detecting formula can be set to:
First paragraph: test 120 hours for 25 DEG C ~ 85 DEG C;
Second segment: test 250 minutes for 85 DEG C ~-40 DEG C;
Test 130 minutes for 3rd section :-40 DEG C ~ 25 DEG C;
Within every 4 seconds, carry out once to the frequency measurement of all crystal oscillators to be measured, each Measuring Time is 1 second, within so actual every 5 seconds, carries out a frequency measurement, and namely temperature-averaging often changes 0.042 degree and completes a frequency detecting.
According to the result detected, according to different accuracy classes, sifting sort is carried out to crystal oscillator.As following various accuracy class can be set to: be better than ± 0.2ppm, ± 0.2ppm ~ ± 0.5ppm, ± 0.5ppm ~ ± 1ppm, ± 1ppm ~ ± 2ppm, defective etc.
Claims (7)
1., for a factory test system for digital temperature compensation crystal oscillistor, it is characterized in that: comprise high-low temperature test chamber, for place crystal oscillator to be measured and draw signal placement module, for measuring and gathering the frequency measurement mechanism of all crystal oscillator output frequencies to be measured, the master control borad as System Control Center, external control center; Described placing mold is mounted in high-low temperature test chamber, described placement module comprises the placement plate for placing crystal oscillator to be measured and the conversion link block for signal converting, the signal output part of described placement plate is by conversion link block rate of connections measuring mechanism and master control borad, described frequency measurement mechanism is located at outside high-low temperature test chamber, described frequency measurement mechanism comprises polylith frequency measurement plate, all frequency measurement plates and master control borad are located on same base plate, and described master control borad and external control center communicate.
2. the factory test system for digital temperature compensation crystal oscillistor according to claim 1, it is characterized in that: described conversion link block comprises the Signals Transfer Board be located in high-low temperature test chamber, all placement plates are removably placed on Signals Transfer Board, and all placement plates are all connected with the port that Signals Transfer Board is arranged; Described frequency measurement mechanism comprises the frequency measurement plate identical with placing plate quantity, for providing the frequency marking of standard frequency, the frequency signal input end to be measured of each frequency measurement plate is connected with the frequency signal output to be measured of corresponding placement plate, described master control borad and all frequency measurement plates are located on a base plate all altogether, base plate have cabling be connected with all frequency measurement plates by master control borad; The signal output part of described frequency marking is connected with the standard frequency input interface of base plate.
3. the factory test system for digital temperature compensation crystal oscillistor according to claim 2, it is characterized in that: described external control center is connected with the test data communication bus port on master control borad by test data communication bus, described external control center is connected with high-low temperature test chamber by high-low temperature test chamber control bus; Each frequency measurement plate by frequency signal transmission line connection signal keyset to be measured, and connects corresponding placement plate by Signals Transfer Board, and each frequency measurement plate is connected with master control borad by backplane routing.
4. the adjustment method for the factory test system of digital temperature compensation crystal oscillistor, complete debugging based on the factory test system for digital temperature compensation crystal oscillistor in claims 1 to 3 described in any one, it is characterized in that it comprises the following steps of carrying out successively:
One, crystal oscillator to be measured is placed: be positioned over by all crystal oscillators to be measured on placement plate in high-low temperature test chamber;
Two, systemic-function detects: external control center checks the frequency measurement function of the factory test system being used for digital temperature compensation crystal oscillistor, all crystal oscillators to be measured are arranged and enters debugging mode, and check to set up with all crystal oscillators to be measured and communicate;
Three, crystal oscillator commissioning to be measured: external control center directly controls to enter commissioning work for the factory test system of digital temperature compensation crystal oscillistor, frequency commissioning is carried out to all crystal oscillators to be measured placed, and the data after commissioning are carried out matching, conversion, then the data generated after conversion are write corresponding crystal oscillator to be measured respectively;
Four, crystal oscillator to be measured detects: after completing steps one, step 2, step 3, control centre directly controls to enter testing for the factory test system of digital temperature compensation crystal oscillistor, frequency detecting is carried out to all crystal oscillators to be measured placed, and filters out underproof crystal oscillator according to frequency detecting result.
5. the adjustment method of the factory test system for digital temperature compensation crystal oscillistor according to claim 4, is characterized in that: described step 3 comprises the following steps:
31) central capacitive calibration: the output frequency according to crystal oscillator to be measured adjusts its central capacitive, use the gamut of binary search traversal central capacitive value, find the most suitable central capacitive value of each crystal oscillator to be measured, make its output frequency meet the requirements of frequency range;
32) start high-low temperature test chamber: the operation formula of high-low temperature test chamber when debugging efforts is set, run formula and comprise constant temperature zone and alternating temperature section, wherein the temperature of constant temperature zone is commissioning temperature spot, in whole temperature range, commissioning temperature spot is set according to certain temperature interval, completes and after formula is arranged operation formula to be write and to start high-low temperature test chamber;
33) commissioning temperature spot temperature keeps: external control center constantly gathers the current state information of high-low temperature test chamber, judge whether high-low temperature test chamber enters constant temperature zone, once high-low temperature test chamber enters Test Station constant temperature zone, external control center controls high-low temperature test chamber and enters hold mode, high-low temperature test chamber will remain on temperature constant state always, the state information of continuous collecting high-low temperature test chamber afterwards, judge in high-low temperature test chamber, whether temperature is stabilized in Test Station temperature, if high-low temperature test chamber is stabilized in Test Station temperature, external control center controls to start to carry out commissioning on current commissioning temperature spot for the factory test system of digital temperature compensation crystal oscillistor,
34) crystal oscillator frequency commissioning to be measured: according to the frequency compensation polarity of crystal oscillator to be measured, use binary search to find out the optimal frequency offset of each crystal oscillator to be measured on current commissioning temperature spot, and read the temperature transition numerical value corresponding with ambient temperature from each crystal oscillator to be measured;
35) loop test: external control center controls high-low temperature test chamber and removes hold mode, and runs to next commissioning temperature spot; 36) continuous circulation step 33), 34), 35), until complete the debugging under all commissioning temperature spots;
37) test data process: the optimal frequency offset record under all commissioning temperature spots the crystal oscillator each to be measured after commissioning and temperature transition numerical value carry out curve fitting respectively, transform, and the data programming after matching being transformed enters corresponding crystal oscillator to be measured.
6. the adjustment method of the factory test system for digital temperature compensation crystal oscillistor according to claim 5, is characterized in that: described step 31) comprise the following steps:
I) the central capacitive value that arranges all crystal oscillators to be measured is intermediate value;
II) measure the output frequency of all crystal oscillators to be measured;
III) each crystal oscillator output frequency to be measured is carried out size with nominal frequency compare, according to size comparative result, and the central capacitive of crystal oscillator to be measured is to the adjustment polarity of output frequency, take binary search as the central capacitive of the adjustment next time value that principle calculates each crystal oscillator to be measured;
IV) the central capacitive value after the adjustment of generation is write in corresponding crystal oscillator to be measured respectively;
V) circulation step ii), III), IV), until complete binary search, the gamut of traversal central capacitive value;
VI) find out output frequency and nominal frequency that central capacitive adjusted value immediate in all previous adjustment process of each crystal oscillator to be measured, and judge this output frequency value whether in the frequency range required, if finally determine that immediate output frequency value is in the frequency range required with nominal frequency, then preserve the best central capacitive calibration value of crystal oscillator to be measured and the frequency of each crystal oscillator correspondence to be measured output, otherwise the central capacitive of crystal oscillator to be measured is calibrated unsuccessfully, row labels of going forward side by side.
7. the adjustment method of the factory test system for digital temperature compensation crystal oscillistor according to claim 5 or 6, is characterized in that: described step 34) comprise the following steps:
1. the frequency compensation value arranging all crystal oscillators to be measured is intermediate value;
2. the output frequency of all crystal oscillators to be measured is measured;
3. the output frequency of each crystal oscillator to be measured and nominal frequency are carried out size to compare, according to the frequency compensation adjustment polarity of the result after relatively and crystal oscillator to be measured, find out the offset of next time adjusting frequency of each crystal oscillator to be measured with the principle of binary search;
4. the frequency compensation value after the adjustment of generation is write respectively in corresponding crystal oscillator to be measured;
5. step is repeated 2., 3., 4., until binary search completes;
6. output frequency is found out in all previous adjustment process of each crystal oscillator to be measured closest to that frequency compensation numerical value of nominal frequency, then read the temperature transition numerical value corresponding with external temperature from all crystal oscillators to be measured, preserve the temperature of current commissioning temperature spot and the optimal compensation value of each crystal oscillator to be measured on this commissioning temperature spot, temperature transition value and the deviation compensating the relative nominal frequency of output frequency.
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