CN105427324B - 基于二值化阈值自动搜索的磁光成像缺陷检测方法 - Google Patents
基于二值化阈值自动搜索的磁光成像缺陷检测方法 Download PDFInfo
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- CN105427324B CN105427324B CN201510888490.8A CN201510888490A CN105427324B CN 105427324 B CN105427324 B CN 105427324B CN 201510888490 A CN201510888490 A CN 201510888490A CN 105427324 B CN105427324 B CN 105427324B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20024—Filtering details
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN110111315A (zh) * | 2019-04-26 | 2019-08-09 | 五邑大学 | 一种基于cis的圆柱体表面检测方法、装置及存储介质 |
Families Citing this family (9)
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CN106600604B (zh) * | 2016-11-14 | 2019-06-14 | 电子科技大学 | 一种磁光成像缺陷检测方法的阀值优化方法 |
CN107180428B (zh) * | 2017-06-09 | 2019-08-20 | 电子科技大学 | 一种基于光流算法的磁光图像增强方法 |
CN107688812B (zh) * | 2017-08-25 | 2020-04-21 | 重庆慧都科技有限公司 | 一种基于机器视觉的食品生产日期喷墨字体修复方法 |
CN107993225B (zh) * | 2017-11-28 | 2020-06-23 | 电子科技大学 | 一种磁光涡流成像检测的缺陷识别方法 |
CN110857920A (zh) * | 2018-08-24 | 2020-03-03 | 东华大学 | 一种卷装长丝的成型不良缺陷检测方法 |
CN111354009B (zh) * | 2020-02-27 | 2022-10-28 | 西安交通大学 | 激光增材制造熔池形状的提取方法 |
CN112285339B (zh) * | 2020-09-25 | 2024-02-06 | 安徽润谷科技有限公司 | 一种荧光免疫层析视觉检测划线标记方法 |
CN112927189A (zh) * | 2021-01-28 | 2021-06-08 | 江苏大学 | 一种电镀工件表面瑕疵视觉检测中边缘反射光斑剔除方法 |
CN114283170B (zh) * | 2021-12-24 | 2024-05-03 | 北京元客视界科技有限公司 | 一种光斑提取方法 |
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CN101256157A (zh) * | 2008-03-26 | 2008-09-03 | 广州中国科学院工业技术研究院 | 表面缺陷检测方法、装置 |
CN102509300A (zh) * | 2011-11-18 | 2012-06-20 | 深圳市宝捷信科技有限公司 | 一种缺陷检测方法及*** |
CN103698393A (zh) * | 2013-12-03 | 2014-04-02 | 广东工业大学 | 焊接缺陷磁光成像无损检测方法 |
CN104616275A (zh) * | 2013-11-04 | 2015-05-13 | 北京兆维电子(集团)有限责任公司 | 一种缺陷检测方法和装置 |
EP2913795A1 (en) * | 2012-10-25 | 2015-09-02 | Mitsubishi Electric Corporation | Image processing device and image processing method |
CN104950039A (zh) * | 2015-06-23 | 2015-09-30 | 西安交通大学 | 基于非线性磁饱和脉冲涡流的铁磁管道定量无损评价方法 |
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CN101256157A (zh) * | 2008-03-26 | 2008-09-03 | 广州中国科学院工业技术研究院 | 表面缺陷检测方法、装置 |
CN102509300A (zh) * | 2011-11-18 | 2012-06-20 | 深圳市宝捷信科技有限公司 | 一种缺陷检测方法及*** |
EP2913795A1 (en) * | 2012-10-25 | 2015-09-02 | Mitsubishi Electric Corporation | Image processing device and image processing method |
CN104616275A (zh) * | 2013-11-04 | 2015-05-13 | 北京兆维电子(集团)有限责任公司 | 一种缺陷检测方法和装置 |
CN103698393A (zh) * | 2013-12-03 | 2014-04-02 | 广东工业大学 | 焊接缺陷磁光成像无损检测方法 |
CN104950039A (zh) * | 2015-06-23 | 2015-09-30 | 西安交通大学 | 基于非线性磁饱和脉冲涡流的铁磁管道定量无损评价方法 |
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探测亚表面缺陷的磁-光显微成像检测技术研究;程玉华;《中国博士学位论文全文数据库 工程科技I辑》;20080415;全文 * |
电涡流脉冲热成像无损检测技术研究;白利兵;《中国博士学位论文全文数据库 工程科技I辑》;20140615;全文 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110111315A (zh) * | 2019-04-26 | 2019-08-09 | 五邑大学 | 一种基于cis的圆柱体表面检测方法、装置及存储介质 |
CN110111315B (zh) * | 2019-04-26 | 2021-01-26 | 五邑大学 | 一种基于cis的圆柱体表面检测方法、装置及存储介质 |
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