CN105262963B - Dark pixel array replaces control circuit system and method - Google Patents
Dark pixel array replaces control circuit system and method Download PDFInfo
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- CN105262963B CN105262963B CN201510666187.3A CN201510666187A CN105262963B CN 105262963 B CN105262963 B CN 105262963B CN 201510666187 A CN201510666187 A CN 201510666187A CN 105262963 B CN105262963 B CN 105262963B
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Abstract
The present invention provides a kind of dark pixel array, replace control circuit system and method, when the first dark pixel area, there are when bad row, whole chips need not be discarded, it only needs that register is written in the information of relevant row according to test result, system employs the good row in the second dark pixel area to replace bad row certainly；Replaced dark current levels can be normally carried out calculating operation.This method can greatly improve the yield of chip；Further, when chip operation is normal and new damage occurs in actual application in dark pixel, if there is alternatively good row in the second dark pixel area, it can be used for the reparation of chip；Therefore, the present invention not only ensures the correctness of dark current levels calculating, and operating method is simply easy to implement, improves process efficiency.
Description
Technical field
The present invention relates to cmos image sensor fields, and in particular to a kind of dark picture for calculating dark pixel levels of current
Pixel array, dark pixel rows read the control circuit system of replacement operation and carry out dark pixel rows replacement using the control circuit system
Method.
Background technology
In common image sensor design, for detection image sensor dark current levels, and to dark current levels
Carry out calibration, it will usually some dark pixel regions are added in the pel array of imaging sensor.The pixel in these dark pixel areas
With normal pixel on circuit, only illumination can all be masked with metal layer during fabrication.However, dark in manufacture
Metal layer may be not covered on certain dark pixels during pixel, caused the work of these dark pixels abnormal, become dark
Pixel bad point.If the bad point number of certain a line dark pixel is more than certain standard, which becomes bad dark pixel rows.
When carrying out dark current levels calculating, it will usually choose several rows among dark pixel area to carry out dark current levels
Calculating.If wherein there is a line or multirow bad pixel column, the dark current levels calculated can be influenced.For this feelings
Condition, existing processing mode are that the image sensor chip with bad dark pixel is discarded.This will cause under chip yield
Drop and manufacturing cost improve.
Therefore, for the problem of dark pixel bad point, it is badly in need of a solution, to improve chip yield, drop
Low manufacturing cost.
Invention content
In order to overcome problem above, the present invention in dark pixel area by increasing backup pixel region, when being intended for dark electricity
It when bad row occur in the dark pixel rows that flow horizontal calculates, is replaced with the good dark pixel rows in backup dark pixel area, to ensure
The correctness that dark current levels calculate.
In order to achieve the above object, the present invention provides the dark pixel arrays calculated for dark pixel levels of current, are M rows
The dark pixel array of × N row；It includes the first dark pixel area and the second dark pixel area；
First dark pixel area is the dark pixel array of L rows × P row, and in the case of no bad row, described first is dark
All pixels in pixel region are all used for the calculating of dark current levels；
Second dark pixel area is the dark pixel array of K rows × P row, the backup pixel as first dark pixel area
Area is substituted when bad row occurs in first dark pixel area with corresponding good row in second dark pixel area；Described second
Dark pixel area is disposed adjacent with first dark pixel area；Wherein, 1≤K≤L ＜ M, P ＜ N.
Preferably, the dark pixel array further includes peripheral dark pixel area, and the periphery dark pixel area is enclosed in described the
The outside in one dark pixel area and second dark pixel area；The periphery dark pixel area includes J rows and P row, is not used in dark
The calculating of levels of current, and it is used for the sacrifice dark pixel when preparing first dark pixel area and the second dark pixel area
Area avoids light leakage in first dark pixel area and second dark pixel area；Wherein, J ＜ L ＜ M, P ＜ N.
To achieve the goals above, dark pixel rows reading is carried out using above-mentioned dark pixel array the present invention also provides a kind of
Take the control circuit system of replacement operation comprising：Memory, dark pixel rows counter, the first dark pixel area act charitably bad indicate
Register, shift register, the second dark pixel area act charitably bad flag register, temporary register, row address generator, and read
Operation and control device；Wherein
Memory, the quality mark of the dark pixel rows in first dark pixel area for preserving dark pixel area array
The fine or not flag data of the dark pixel rows of second dark pixel of data and dark pixel area array area；Memory exists
Also data can be preserved when no power, when being powered, the fine or not flag data on the memory is posted by system loads to corresponding
In storage；
Dark pixel rows counter；When each image frame grabber starts, the value of the dark pixel rows counter is reset to 0；
When Image Acquisition, after read operation controller completes often capable read operation, the value of the dark pixel rows counter adds 1, described dark
The maximum value of pixel linage-counter is the line number value of all dark pixel rows in first dark pixel area；When the dark pixel rows meter
When the value of number device reaches the maximum value, the dark pixel rows counter is sent to row address generator stops detection signal；
First dark pixel area acts charitably bad flag register, and a shared L place values indicate respectively from the 0th place value to L-1 place values
The fine or not flag data of dark pixel rows in corresponding first dark pixel area；When system energization, the institute that is stored in the memory
The fine or not flag data for stating the dark pixel rows in the first dark pixel area is acted charitably bad indicate by system loads to first dark pixel area
In register；
First dark pixel area is acted charitably when dark current levels each time calculate beginning and badly indicates deposit by shift register
Each place value in device is by system loads to the shift register；When the dark pixel rows counter often completes the meter of a line
When number, the shift register displacement is primary；The quality of 0th characterization current line of the shift register；
Second dark pixel area acts charitably bad flag register, and a shared K-bit corresponds to respectively from the 0th place value to K-1 place values
The fine or not flag data of each dark pixel rows in second dark pixel area；When system energization, stored in the memory
The fine or not flag data of the dark pixel rows in second dark pixel area is acted charitably by system loads to second dark pixel area and is badly marked
In will register；
Temporary register acts charitably in second dark pixel area bad indicate when dark current levels each time calculate beginning
Place value in register is loaded into the temporary register；
Row address generator detects the 0th place value in the shift register to judge working as first dark pixel area
It has been row or bad row to move ahead；Current line preferably row when, the row address of the current line is sent to by the row address generator
Read operation controller, read operation controller carry out read operation to the row address of the current line；When the bad row of current behavior, the row
Address generator detects the position in temporary register, from the 0th to K-1, when detecting first good row, according to this
Bit address corresponding to good row calculates the row address of the good row in second dark pixel area, and by the row of the good row
The row address of the current behavior bad row is replaced in location, while the row address of the good row is sent to read operation controller to the good row
Carry out read operation；After the completion of replacement, the row address generator is good by this corresponding for being used to replace in the temporary register
Capable place value negates；When the value of the dark pixel rows counter reaches the maximum value, the row address generator receives
After the stopping detection signal that the dark pixel rows counter is sent, stop detection；
Read operation controller, the row address sent according to the row address generator complete the read operation of corresponding row.
Preferably, during the place value in bad flag register is acted charitably in first dark pixel area, indicated capable with 0, with 1
Indicate bad row；Or indicated capable with 1, indicate bad row with 0.
Preferably, during the place value in bad flag register is acted charitably in second dark pixel area, indicated capable with 0, with 1
Indicate bad row；Or indicated capable with 1, indicate bad row with 0.
Preferably, the dark pixel array further includes peripheral dark pixel area, and the periphery dark pixel area is enclosed in described the
The outside in one dark pixel area and second dark pixel area；The periphery dark pixel area includes J rows and P row, is not used in dark
The calculating of levels of current, and it is used for the sacrifice dark pixel when preparing first dark pixel area and the second dark pixel area
Area avoids light leakage in first dark pixel area and second dark pixel area；Wherein, J ＜ K≤L ＜ M, P ＜ N.
To achieve the goals above, the present invention also provides a kind of dark pixel rows replacement method, above-mentioned dark pixel is used
It includes following step that row, which reads the control circuit system of replacement operation and above-mentioned dark pixel array, the dark pixel rows replacement method,
Suddenly：
Step 01：It detects dark in first dark pixel area and second dark pixel area of dark pixel area array
Pixel column writes the fine or not flag data of every a line in memory；
Step 02：When system energization, the fine or not flag data in the memory is by system loads to corresponding register
In；Wherein, the fine or not flag data of the dark pixel rows in first dark pixel area first dark pixel area is loaded into act charitably
It is loaded into the described second dark picture in bad flag register and by the fine or not flag data of the dark pixel rows of second dark pixel
It acts charitably in bad flag register in plain area；
Step 03：When dark current each time calculates beginning, the value of the dark pixel rows counter is reset to 0；Then, institute
Each place value that dark pixel rows counter acts charitably first dark pixel area in bad flag register is stated by system loads to institute
It states in shift register, and the place value in bad flag register that second dark pixel area acted charitably is loaded into described temporary post
In storage；
Step 04：The row address generator detects the 0th place value in the shift register to judge that described first is dark
The current line of pixel region has been row or bad row；
Step 05：Current line preferably row when, the row address of the current line is sent to described by the row address generator
Read operation controller, the read operation controller carry out read operation to the row address of the current line；
When the bad row of current behavior, the position in the row address generator detection temporary register, from the 0th to K-1
Position, when detecting first good row, the bit address corresponding to the good row calculates the good row in second dark pixel
Row address in area, and the row address of the good row is replaced to the row address of the current behavior bad row, while by the good row
Row address is sent to the read operation controller, and the read operation controller carries out read operation to the good row；After the completion of replacement, institute
Row address generator is stated to negate the place value of the corresponding good row for replacement in the temporary register；
Step 06：The operation of next line is proceeded by, the value of the dark pixel rows counter adds 1；
Step 07：Repeating said steps 04-06, until the value of the dark pixel rows counter is equal to first dark pixel
The line number value of all dark pixel rows in area, the dark pixel rows counter is sent to the row address generator stops detection letter
Number；
Step 08：The row address generator receives the stopping detection signal that the dark pixel rows counter is sent
Afterwards, stop detection.
Preferably, the dark pixel array further includes peripheral dark pixel area, and the periphery dark pixel area is enclosed in described the
The outside in one dark pixel area and second dark pixel area；The periphery dark pixel area includes J rows and P row, is not used in dark
The calculating of levels of current, and it is used for the sacrifice dark pixel when preparing first dark pixel area and the second dark pixel area
Area avoids light leakage in first dark pixel area and second dark pixel area；Wherein, J ＜ K≤L ＜ M, P ＜ N.
Preferably, during the place value in bad flag register is acted charitably in first dark pixel area, indicated capable with 0, with 1
Indicate bad row；Or indicated capable with 1, indicate bad row with 0.
Preferably, during the place value in bad flag register is acted charitably in second dark pixel area, indicated capable with 0, with 1
Indicate bad row；Or indicated capable with 1, indicate bad row with 0.
The dark pixel array of the present invention replaces control circuit system and method, when the first dark pixel area is there are when bad row, no
It needs to discard whole chips, it is only necessary to the information of relevant row be written register according to test result, system is from employing the
Good row in two dark pixel areas replaces bad row；Replaced dark current levels can be normally carried out calculating operation.This method
The yield of chip can be greatly improved；Further, when chip operation is normal and dark pixel occurs newly in actual application
Damage when, if in the second dark pixel area also have alternatively good row, can be used for the reparation of chip；Therefore, of the invention
The correctness of dark current levels calculating is not only ensured, and operating method is simply easy to implement, improves process efficiency.
Description of the drawings
Fig. 1 is the structural schematic diagram of the dark pixel array of the preferred embodiment of the present invention
Fig. 2 is the structure that the dark pixel rows of the preferred embodiment of the present invention read the control circuit system of replacement operation
Schematic diagram
Fig. 3 is the flow diagram of the dark pixel rows replacement method of the preferred embodiment of the present invention
Specific implementation mode
To keep present disclosure more clear and easy to understand, below in conjunction with Figure of description, present disclosure is made into one
Walk explanation.Certainly the invention is not limited to the specific embodiment, the general replacement known to those skilled in the art
Cover within the scope of the present invention.
Replacement operation is read to dark pixel array, the dark pixel rows of the present invention below in conjunction with attached drawing 1-3 and specific embodiment
Control circuit system and dark pixel rows replacement method be described in further detail.It should be noted that attached drawing is all made of very
Simplified form, using non-accurate ratio, and only to it is convenient, clearly achieve the purpose that aid in illustrating the present embodiment.
Referring to Fig. 1, the dark pixel array calculated for dark pixel levels of current of the present embodiment, is the dark of M rows × N row
Pel array；It includes：
First dark pixel area 101 is the dark pixel array of L rows × P row；In the case of no bad row, the first dark pixel
All pixels in area 101 are all used for the calculating of dark current levels；
Second dark pixel area 102 is the dark pixel array of K rows × P row, the backup pixel as the first dark pixel area 101
Area；When bad row occurs in the first dark pixel area 101, substituted with corresponding good row in the second dark pixel area 102；Second dark pixel
Area 102 is disposed adjacent with the first dark pixel area 101；Wherein, K≤L ＜ M, P ＜ N；The dark pixel line number in the second dark pixel area 102
Less than the first dark pixel area 101 dark pixel line number when, it is desirable that it is dark that the good line number in the second dark pixel area 102 is greater than or equal to first
Bad line number in pixel region 101, therefore, K are greater than the bad line number being likely to occur in the first dark pixel area 101, if definition the
The estimated bad line number occurred is Q rows in one dark pixel area 101, then K is required to be greater than or equal to Q, but no matter bad line number Q whether be
0, K value is at least 1, to when the value of Q is more than or equal to 1, there is Q≤K≤L ＜ M at this time；When Q values are equal to 0, then there is 1≤K
≤ L ＜ M.It should be noted that in general, the bad line number that is likely to occur of dark pixel area is determined usually with technique correlation by manufacturing process
It is fixed, it is a statistics empirical value.
In the present embodiment, dark pixel array can also include peripheral dark pixel area 103, and peripheral dark pixel area 103 is enclosed in
The outside in the first dark pixel area 101 and the second dark pixel area 102；Peripheral dark pixel area 103 includes J rows and P row, is not used in
The calculating of dark current levels, and it is used for the sacrifice dark pixel when preparing the first dark pixel area 101 and the second dark pixel area 102
Area avoids light leakage in the first dark pixel area 101 and the second dark pixel area 102；Wherein, J ＜ L ＜ M, P ＜ N；This is because usually
When preparing dark pixel array, due to manufacture or light leakage, the dark pixel positioned at the region at dark pixel array edge can be caused
It fails or degenerates and cannot be used for calculating dark current levels, therefore, in order to avoid the first dark pixel area 101 and the second dark pixel area
There is bad row and improves the good row ratio in the first dark pixel area 101 and the second dark pixel area 102 as far as possible in 102 edge,
First dark pixel area 101 and 102 periphery of the second dark pixel area are provided with peripheral dark pixel area 103, thus it can become " sacrifice
Dark pixel area ".
Referring to Fig. 2, in the present embodiment, the control that dark pixel rows read replacement operation is carried out using above-mentioned dark pixel array
Circuit system processed, consists of the following parts：
Memory 201, the fine or not flag data of the dark pixel rows in the first dark pixel area for preserving dark pixel area array,
And the fine or not flag data of the dark pixel rows of the second dark pixel of dark pixel area array area；Memory can also be protected in no power
Deposit data, when being powered, the fine or not flag data on memory is by system loads to corresponding register；
Dark pixel rows counter 204；When each image frame grabber starts, the value of dark pixel rows counter 204 is reset to
0；When Image Acquisition, after read operation controller 208 completes often capable read operation, the value of dark pixel rows counter 204 adds 1, secretly
The maximum value of pixel linage-counter 204 is the line number value of all dark pixel rows in the first dark pixel area；When dark pixel rows counter
When 204 value reaches maximum value, dark pixel rows counter 204 is sent to row address generator 207 stops detection signal；
First dark pixel area acts charitably bad flag register 202, a shared L place values, distinguishes from the 0th place value to L-1 place values
The fine or not flag data of each dark pixel rows in corresponding first dark pixel area 101 is indicated, for example, the first dark pixel area acts charitably
In place value in bad flag register, indicates capable with 0, bad row is indicated with 1；Or indicated capable with 1, indicate bad row with 0, etc.
Deng；When system energization, the fine or not flag data of the dark pixel rows in the first dark pixel area 101 stored in memory 201 is by system
The first dark pixel area is loaded into act charitably in bad flag register 202；
Shift register 205, dark current levels each time calculate start when, the first dark pixel area bad mark of acting charitably is posted
Each place value in storage 202 is by system loads to shift register 205；When dark pixel rows counter 204 often completes a line
Counting when, 205 displacement of shift register is primary；The quality of 0th characterization current line of shift register 205；
Second dark pixel area acts charitably bad flag register 203, a shared K-bit, distinguishes from the 0th place value to K-1 place values
The fine or not flag data of each dark pixel rows in corresponding second dark pixel area 102, the bad mark for example, the second dark pixel area acts charitably
In place value in register, indicates capable with 0, bad row is indicated with 1；Or indicated capable with 1, indicate bad row, etc. with 0；System
The fine or not flag data of the dark pixel rows in the second dark pixel area stored when system is powered, in memory 201 is by system loads to the
It acts charitably in bad flag register 203 in two dark pixel areas；
Temporary register 206, dark current levels each time calculate start when, the second dark pixel area bad mark of acting charitably is posted
Place value in storage 203 is loaded into temporary register 206；After the completion of replacement, temporary register connects 206 receipts and carrys out row address
Generator 207 sends inversion operation and controls signal, and temporary register 206 takes the place value of the corresponding good row for replacement
Instead；
Row address generator 207 detects the 0th place value in shift register 205 to judge the current of the first dark pixel area
Row has been row or bad row；Current line preferably row when, the row address of current line is sent to read operation control by row address generator 207
Device 208 processed, read operation controller 208 carry out read operation to the row address of current line；When the bad row of current behavior, row address generator
Position in 207 detection temporary registers 206, from the 0th to K-1, when detecting first good row, according to the good row
Corresponding bit address calculates the row address of the good row in the second dark pixel area 102, and the row address of the good row is replaced
The row address of current behavior bad row is changed, while the row address of the good row is sent to read operation controller 208, the good row is carried out
Read operation；After the completion of replacement, row address generator 207 sends inversion operation control signal to temporary register 206, keeps in deposit
Device 206 negates the place value of the corresponding good row for replacement；When the value of dark pixel rows counter 204 reaches set by it
When maximum value (the line number values of all dark pixel rows in the first dark pixel area), row address generator 207 receives dark pixel rows meter
After the stopping detection signal that number device 204 is sent, stop detection；
Read operation controller 208, the row address sent according to row address generator 207 complete the read operation of corresponding row.
In the present embodiment, read operation controller 208 has row address decoder, can carry out the row address that row address generator is sent
Decoding obtains the format that read operation controller can be read.
Referring to Fig. 3, in the present embodiment, the institute of the control circuit system of replacement operation is read according to above-mentioned dark pixel rows
The dark pixel rows replacement method of progress comprising following steps：
Step 01：The dark pixel rows in the first dark pixel area and the second dark pixel area of dark pixel area array are detected, it will be every
The fine or not flag data of a line is write in memory；
Step 02：When system energization, the fine or not flag data in memory is by system loads to corresponding register；
Specifically, in the present embodiment, it is dark that the fine or not flag data of the dark pixel rows in the first dark pixel area is loaded into first
Pixel region is acted charitably in bad flag register and that the fine or not flag data of the dark pixel rows of the second dark pixel is loaded into second is dark
Pixel region is acted charitably in bad flag register；First dark pixel area bad flag register one of acting charitably shares L place values, from the 0th place value to
L-1 place values indicate the fine or not flag data of the dark pixel rows in corresponding first dark pixel area respectively, for example, the first dark pixel
Area acts charitably in the place value in bad flag register, has indicated capable with 0, bad row is indicated with 1；Or indicated capable with 1, it is indicated with 0
Bad row, etc.；Second dark pixel area acts charitably bad flag register, and a shared K-bit is right respectively to K-1 place values from the 0th place value
The fine or not flag data of each dark pixel rows in the second dark pixel area is answered, the bad mark deposit for example, the second dark pixel area acts charitably
In place value in device, indicates capable with 0, bad row is indicated with 1；Or indicated capable with 1, indicate bad row, etc. with 0；
Step 03：When dark current each time calculates beginning, the value of dark pixel rows counter is reset to 0；By the first dark picture
Each place value in bad flag register is acted charitably by system loads to shift register by plain area, and by the second dark pixel area row
Place value in fine or not flag register is loaded into temporary register；
Step 04：Row address generator detects the 0th place value in shift register to judge the current of the first dark pixel area
Row has been row or bad row；
Specifically, the 0th place value in shift register indicates the dark pixel rows in the first dark pixel area currently to be read
Quality；
Step 05：Current line preferably row when, the row address of current line is sent to read operation controller by row address generator,
Read operation controller carries out read operation to the row address of current line；
When the bad row of current behavior, row address generator detects the position in temporary register, from the 0th to K-1, when
When detecting first good row, the bit address corresponding to the good row calculates row ground of the good row in the second dark pixel area
Location, and by the row address of the row address of good row replacement current behavior bad row, while the row address of the good row is sent to reading
Operation and control device, read operation controller carry out read operation to the good row；After the completion of replacement, row address generator is by temporary register
In the corresponding place value of the good row for replacement negate；
Step 06：The operation of next line is proceeded by, the value of dark pixel rows counter adds 1；
Step 07：Step 04-06 is repeated, until the value of dark pixel rows counter is equal to all dark in the first dark pixel area
The line number value of pixel column, dark pixel rows counter is sent to row address generator stops detection signal；
Specifically, step 04-06 is repeated, until the value of dark pixel rows counter is equal to L, L in the first dark pixel area
Dark pixel rows are all finished.
Step 08：After row address generator receives the stopping detection signal of dark pixel rows counter transmission, stop detection.
In conclusion the dark pixel array of the present invention, replacement control circuit system and method, when the first dark pixel area exists
When bad row, whole chips need not be discarded, it is only necessary to which the information of relevant row is written according to test result by register, system
Bad row is replaced from the good row employed in the second dark pixel area；Replaced dark current levels can be normally carried out calculating operation.
This method can greatly improve the yield of chip；Further, when chip operation is normal and dark pixel is in actual application
It is middle when there is new damage, if there is alternatively good row in the second dark pixel area, it can be used for the reparation of chip；Cause
This, the present invention not only ensures the correctness of dark current levels calculating, and operating method is simply easy to implement, improves technique
Efficiency.
Although the present invention disclosed with preferred embodiment it is as above, the right embodiment illustrate only for the purposes of explanation and
, it is not limited to the present invention, if those skilled in the art can make without departing from the spirit and scope of the present invention
Dry changes and retouches, and the protection domain that the present invention is advocated should be subject to described in claims.
Claims (10)
1. a kind of dark pixel array calculated for dark pixel levels of current is the dark pixel array of M rows × N row；Its feature exists
In, including the first dark pixel area and the second dark pixel area；
First dark pixel area is the dark pixel array of L rows × P row, in the case of no bad row, first dark pixel
All pixels in area are all used for the calculating of dark current levels；
Second dark pixel area is the dark pixel array of K rows × P row, as the backup pixel region in first dark pixel area,
When bad row occurs in first dark pixel area, substituted with corresponding good row in second dark pixel area；Described second is dark
Pixel region is disposed adjacent with first dark pixel area；Wherein, 1≤K≤L ＜ M, P ＜ N.
2. the dark pixel array according to claim 1 calculated for dark pixel levels of current, which is characterized in that described dark
Pel array further includes peripheral dark pixel area, and the periphery dark pixel area is enclosed in first dark pixel area and described second secretly
The outside of pixel region；The periphery dark pixel area includes J rows and P row, is not used in the calculating of dark current levels, and is used for
Prepare sacrifice dark pixel area when first dark pixel area and the second dark pixel area, avoid first dark pixel area and
Light leakage in second dark pixel area；Wherein, J ＜ L ＜ M, P ＜ N.
3. a kind of carrying out the control circuit system that dark pixel rows read replacement operation using dark pixel array described in claim 1
System comprising：Memory, dark pixel rows counter, the first dark pixel area act charitably bad flag register, shift register, and second
Dark pixel area acts charitably bad flag register, temporary register, row address generator and read operation controller；Wherein,
Memory, the fine or not conventional number of the dark pixel rows in first dark pixel area for preserving dark pixel area array
According to and dark pixel area array area second dark pixel dark pixel rows fine or not flag data；Memory is not
Also data can be preserved when energization, when being powered, the fine or not flag data on the memory is by system loads to corresponding deposit
In device；
Dark pixel rows counter, when each image frame grabber starts, the value of the dark pixel rows counter is reset to 0；Image
When acquisition, after read operation controller completes often capable read operation, the value of the dark pixel rows counter adds 1, the dark pixel
The maximum value of linage-counter is the line number value of all dark pixel rows in first dark pixel area；When the dark pixel rows counter
Value when reaching the maximum value, the dark pixel rows counter is sent to row address generator stops detection signal；
First dark pixel area acts charitably bad flag register, and a shared L place values indicate corresponding respectively from the 0th place value to L-1 place values
The first dark pixel area in dark pixel rows fine or not flag data；When system energization, stored in the memory described
The fine or not flag data of the dark pixel rows in one dark pixel area is acted charitably by system loads to first dark pixel area badly indicates deposit
In device；
Shift register, dark current levels each time calculate start when, the first dark pixel area is acted charitably in bad flag register
Each place value by system loads to the shift register；When the dark pixel rows counter often completes the counting of a line
When, the shift register displacement is primary；The quality of 0th characterization current line of the shift register；
Second dark pixel area acts charitably bad flag register, a shared K-bit, corresponded to respectively from the 0th place value to K-1 place values described in
The fine or not flag data of each dark pixel rows in second dark pixel area；When system energization, what is stored in the memory is described
The fine or not flag data of the dark pixel rows in the second dark pixel area is posted by system loads to second dark pixel area bad mark of acting charitably
In storage；
Second dark pixel area is acted charitably when dark current levels each time calculate beginning and badly indicates deposit by temporary register
Place value in device is loaded into the temporary register；
Row address generator detects the 0th place value in the shift register to judge the current line in first dark pixel area
It has been row or bad row；Current line preferably row when, the row address generator by the row address of the current line be sent to reading behaviour
Make controller, read operation controller carries out read operation to the row address of the current line；When the bad row of current behavior, the row address
Generator detects the position in temporary register, from the 0th to K-1, when detecting first good row, according to the good row
Corresponding bit address calculates the row address of the good row in second dark pixel area, and the row address of the good row is replaced
The row address of the current behavior bad row is changed, while the row address of the good row is sent to read operation controller, the good row is carried out
Read operation；After the completion of replacement, the row address generator is by the corresponding good row for replacement in the temporary register
Place value negates；When the value of the dark pixel rows counter reaches the maximum value, the row address generator receives described
After the stopping detection signal that dark pixel rows counter is sent, stop detection；
Read operation controller, the row address sent according to the row address generator complete the read operation of corresponding row.
4. dark pixel rows according to claim 3 read the control circuit system of replacement operation, which is characterized in that described the
One dark pixel area acts charitably in the place value in bad flag register, has indicated capable with 0, bad row is indicated with 1；Or it is indicated with 1
Good row, bad row is indicated with 0.
5. dark pixel rows according to claim 3 read the control circuit system of replacement operation, which is characterized in that described the
Two dark pixel areas act charitably in the place value in bad flag register, have indicated capable with 0, bad row is indicated with 1；Or it is indicated with 1
Good row, bad row is indicated with 0.
6. dark pixel rows according to claim 3 read the control circuit system of replacement operation, which is characterized in that described dark
Pel array further includes peripheral dark pixel area, and the periphery dark pixel area is enclosed in first dark pixel area and described second secretly
The outside of pixel region；The periphery dark pixel area includes J rows and P row, is not used in the calculating of dark current levels, and is used for
Prepare sacrifice dark pixel area when first dark pixel area and the second dark pixel area, avoid first dark pixel area and
Light leakage in second dark pixel area；Wherein, J ＜ L ＜ M, P ＜ N.
7. a kind of dark pixel rows replacement method, which is characterized in that read replacement operation using the dark pixel rows described in claim 3
Control circuit system and dark pixel array described in claim 1, the dark pixel rows replacement method include the following steps：
Step 01：Detect the dark pixel in first dark pixel area and second dark pixel area of dark pixel area array
Row, the fine or not flag data of every a line is write in memory；
Step 02：When system energization, the fine or not flag data in the memory is by system loads to corresponding register；Its
In, the fine or not flag data of the dark pixel rows in first dark pixel area is loaded into first dark pixel area and is acted charitably bad indicate
It is loaded into second dark pixel area row in register and by the fine or not flag data of the dark pixel rows of second dark pixel
In fine or not flag register；
Step 03：When dark current each time calculates beginning, the value of the dark pixel rows counter is reset to 0；Then, described dark
Each place value in bad flag register is acted charitably by system loads to the shifting by pixel linage-counter by first dark pixel area
In bit register, and the place value in bad flag register that second dark pixel area acted charitably is loaded into the temporary register
In；
Step 04：The row address generator detects the 0th place value in the shift register to judge first dark pixel
The current line in area has been row or bad row；
Step 05：Current line preferably row when, the row address of the current line is sent to the reading and grasped by the row address generator
Make controller, the read operation controller carries out read operation to the row address of the current line；
When the bad row of current behavior, the position in the row address generator detection temporary register, from the 0th to K-1, when
When detecting first good row, the bit address corresponding to the good row calculates the good row in second dark pixel area
Row address, and the row address of the good row is replaced to the row address of the current behavior bad row, while by the row address of the good row
It is sent to the read operation controller, the read operation controller carries out read operation to the good row；After the completion of replacement, the row
Location generator negates the place value of the corresponding good row for replacement in the temporary register；
Step 06：The operation of next line is proceeded by, the value of the dark pixel rows counter adds 1；
Step 07：Repeating said steps 04-06, until the value of the dark pixel rows counter is equal in first dark pixel area
All dark pixel rows line number value, the dark pixel rows counter to the row address generator send stop detection signal；
Step 08：After the row address generator receives the stopping detection signal that the dark pixel rows counter is sent,
Stop detection.
8. dark pixel rows replacement method according to claim 7, which is characterized in that the dark pixel array further includes periphery
Dark pixel area, the periphery dark pixel area are enclosed in the outside in first dark pixel area and second dark pixel area；It is described
Peripheral dark pixel area includes J rows and P row, is not used in the calculating of dark current levels, and is used to prepare the described first dark picture
Sacrifice dark pixel area when plain area and the second dark pixel area, avoids first dark pixel area and second dark pixel area
Middle light leakage；Wherein, J ＜ L ＜ M, P ＜ N.
9. dark pixel rows replacement method according to claim 7, which is characterized in that act charitably and badly mark in first dark pixel area
In the place value in will register, indicates capable with 0, bad row is indicated with 1；Or indicated capable with 1, indicate bad row with 0.
10. dark pixel rows replacement method according to claim 7, which is characterized in that act charitably bad in second dark pixel area
In the place value in flag register, indicates capable with 0, bad row is indicated with 1；Or indicated capable with 1, indicate bad row with 0.
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