CN105215838B - The lapping device and its Ginding process of a kind of sapphire wafer - Google Patents

The lapping device and its Ginding process of a kind of sapphire wafer Download PDF

Info

Publication number
CN105215838B
CN105215838B CN201510722951.4A CN201510722951A CN105215838B CN 105215838 B CN105215838 B CN 105215838B CN 201510722951 A CN201510722951 A CN 201510722951A CN 105215838 B CN105215838 B CN 105215838B
Authority
CN
China
Prior art keywords
grinding
slurry
grinder
upper disc
pump
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510722951.4A
Other languages
Chinese (zh)
Other versions
CN105215838A (en
Inventor
赵元亚
王晨宇
王禄宝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tunghsu Group Co Ltd
Original Assignee
JIANGSU JIXING NEW MATERIALS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JIANGSU JIXING NEW MATERIALS CO Ltd filed Critical JIANGSU JIXING NEW MATERIALS CO Ltd
Priority to CN201510722951.4A priority Critical patent/CN105215838B/en
Publication of CN105215838A publication Critical patent/CN105215838A/en
Application granted granted Critical
Publication of CN105215838B publication Critical patent/CN105215838B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/08Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B57/00Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
    • B24B57/02Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

A kind of lapping device of sapphire wafer of the present invention, including size barrel, peristaltic pump and grinder, grinder are provided with slurry tank, and slurry is entered in grinder by peristaltic pump and slurry tank, a kind of Ginding process of sapphire wafer, comprised the following steps:1st, slurry is prepared:Multilevel hierarchy time throwing raw materials, 2, slurry flow control:Slurry launch it is accurate, 3, grinding lower disk surface flatness correction:Calipers, short rule plus amesdial are repeatedly measured and are modified, and 4, grinding card cloth powder, 5, chip twin grinding:Light pressure grinding is carried out first, it is a feature of the present invention that optimizing the raw material proportioning of slurry, the supply flow rate of slurry is more accurate, conveying evenly, before normal grinding, first carries out light pressure grinding, the problem of preventing chip from being ruptured in process of lapping of maximum possible, the fragment rate of chip is reduced, removal rate when improving the factor of merit of grinding, and grinding is stable, the problem of overground, removal rate is low will not be produced, efficiency is very fast.

Description

The lapping device and its Ginding process of a kind of sapphire wafer
Technical field
The present invention relates to the manufacture field of sapphire substrate sheet, a kind of lapping device more particularly to sapphire wafer and Its Ginding process.
Background technology
Sapphire wafer grinding is a very important technological process in sapphire wafer manufacture, and it determines sapphire TTV and WARP after grinding, and surface roughness, existing technology in the application, are typically first stirred to slurry, then Pour into size barrel, using mashing pump plus the mode of delivery pipe, slurry is transported in grinding card and supplied, after grinding Slurry is come back in size barrel, recycling, and actual slurry agitation is often very uneven in grounds travel configuration process, Opened without stirring completely, ground slurry suspension is poor, it is easy to cause wafer breakage and the overproof situation of roughness, these chippings It can be entered with the chip particle of rupture in slurry, recycling is again fed in card, can cause whole bucket slurry can not be after Continue and use and waste, the wafer surface of grinding scratches, and cut occurs, whole disk quick-fried disk can be produced when serious, chip total loss Situation, it is not in place plus grinding technics process control, cause to grind factor of merit decline, cost increases.
The content of the invention
In view of the above-mentioned problems, the present invention proposes the lapping device and its Ginding process of a kind of sapphire wafer.
To solve above technical problem, technical scheme provided by the invention is:
A kind of lapping device of sapphire wafer, it is characterised in that described compacted including size barrel, peristaltic pump and grinder Dynamic pump includes 2 pump heads, delivery pipe and pump-out pipe, and the pump head carries out conveying control to delivery pipe, the delivery pipe with pump out Delivery hose is sheathed with pipe respectively and pumps out flexible pipe, the grinder is included under crossbeam, slurry tank, grinding upper disc and grinding Disk, the crossbeam are provided with control cylinder and hose support, and the control cylinder is vertically arranged, including cylinder rod, the cylinder Bar downwards, and is rotatablely connected by bearing and grinding upper disc, realizes motion and the level of grinding upper disc in the vertical direction Rotation on direction, the slurry tank is fixedly installed on above grinding upper disc, between crossbeam and grinding upper disc, and with grinding Upper disk is affixed, and slurry tank is in the channel form of annular, and opening up, its lower surface is evenly arranged with 36 leak, the grinding Upper disk is provided with 36 pipe joints for running through grinding upper disc, and the pipe joint is uniformly arranged, and is connected by transparent hose and leak Connect, connect slurry tank;
The size barrel is positioned over grinder side, and the peristaltic pump is positioned on the table top of grinder, and the conveying is soft One end of pipe is sunken to slurry bottom of the barrel by way of weight of tying, it is described pump out flexible pipe one end it is removable by hose support The formula of unloading is fixed on directly over slurry tank, and is uniformly distributed, and pumps out the outlet face slurry tank of flexible pipe;
Further, the peristaltic pump quantity is at least 2;
Further, the delivery hose and to pump out flexible pipe be a diameter of 8 millimeters of transparent hose;
Further, the grinder is provided with slurry outlet, and the slurry outlet is equipped with useless slurry charging basket.
A kind of Ginding process of sapphire wafer, it is characterised in that comprise the following steps:
(1) slurry is prepared:30L pure water is poured into size barrel, is placed on below pulp blender, starts slurry agitation Machine, Agitator Impeller is stirred in pure water, set mixer rotating speed as 50rpm, then, take the carbonization that 10kg granularities are 240# Boron, slowly pour into the water of agitation, until after boron carbide all pours into, then 45min is kept stirring for, finally it is slowly added to 1.5L Suspension and 0.5L alkaline antirust agent, continue stir 45min after, obtain abradant slurry;
(2) slurry flow controls:One end of delivery hose is sunk to the slurry bottom of the barrel for being contained with slurry, flexible pipe will be pumped out Remove, be placed in 500ml plastic measuring glass, start peristaltic pump, flow rate of slurry is monitored, pump head is adjusted, to slurry Transporting velocity is controlled, until flow rate of slurry reaches 50 ± 5ml/min;
(3) grinding lower disk surface flatness is corrected:The lower card of grinding is measured using the mode of calipers plus amesdial, grinds lower wall The intermediate settings in face are recessed 0~-15um, measure the lower card of grinding using the mode of short rule plus amesdial, grind lower card Intermediate settings if there is error, do not reach requirement between 0~+10um of projection, then using the amendment wheel of grinding to upper lower burrs Face is ground finishing, until meeting the requirements;
(4) card cloth powder is ground:The one end for pumping out flexible pipe is fixed on directly over slurry tank by hose support, and makes pump Go out the outlet face slurry tank of flexible pipe, fall grinding upper disc, the slurry in size barrel passes through in peristaltic pump, slurry tank and grinding Disk, it is sent on grinding lower wall, grinder, grinding upper disc and the grinding slow preaceleration of lower wall is started, until the rotating speed of grinding upper disc Reach 1.7rpm, the rotating speed for grinding lower wall reaches 5rpm, and pressure 0.020kg/cm, 20 seconds used times, subsequent grinder is persistently transported Turn 1min, carry out the operation of card cloth powder;
(5) chip twin grinding:After the completion of the operation of cloth powder, stop slurry conveying, lift grinding upper disc, be put into erratic star wheel, Place a wafer into the hole of the erratic star wheel in grinder, and it is floating, confirm and ensure that every wafer all enters wandering star wheel bore In hole, the thickness error that enters the station of whole disk chip is controlled within 5um, and the WARP that enters the station is controlled within 20um, is started grinder, is ground Disk and slow preaceleration under grinding on mill, until the rotating speed of grinding upper disc reaches 5.3rpm, the rotating speed for grinding lower wall reaches 16rpm, pressure 0.049kg/cm, 60 seconds used times, grinder continuous running 1.5min, the light pressure grinding of first paragraph is carried out, with Slowly accelerate again under grinding upper disc and grinding afterwards, until the rotating speed of grinding upper disc reaches 6.7rpm, grind the turn up of lower wall To 20rpm, pressure 0.058kg/cm, 20 seconds used times, grinder continuous running 10min, the normal grinding of second segment is carried out, with Removal rate during grinder grinding is calculated afterwards, according to removal rate and the follow-up milling time of remaining THICKNESS CALCULATION, and is set again Determine the polish process time, untill being ground to standard thickness, complete grinding, the slurry after grinding is exhausted directly to useless slurry charging basket In, it is not recycled.
The lapping device and its Ginding process of a kind of sapphire wafer of the present invention, have the characteristics that:
(1) present invention optimizes the raw material proportioning of slurry, and grounds travel and the order and mixing time of suspension are poured into, It can ensure that grounds travel is sufficiently stirred, ground slurry suspension effect is good, and uniformity is consistent, reduces wafer breakage and roughness Overproof situation;
(2) by way of new feedway and flow measurement, slurry can be supplied with accurate flow, slurry Material consumption has obtained effective control, will not produce the situation of waste;
(3) by the slurry tank above hanging wall in grinder, equally distributed 36 pipe joints are coordinated, can be slurry very The uniform relevant position for being transported to grinding card, ensure that the uniformity of slurry conveying, while ensure that the quality of grinding;
(4) substitute the mode of traditional mashing pump, although slurry does not recycle, wriggle by using peristaltic pump Pump conveying slurry has more uniformity, also uses less flow control, and the consumption of slurry does not increase, material cost Do not rise;
(5) substitute the mode of traditional mashing pump by using peristaltic pump, make slurry not recycled, collapsed with chip The slurry of side and rupture particle will not be circulated again into card, greatly reduce cut and fragmentation, the generation of quick-fried disk accident, Reduce abnormal loss;
(6) by control single-deck wafer thickness uniformity and setting pressure and rotating speed process meanses, plus control and The concavo-convex parameter of finishing grinding card, chip TTV out can reach within 2um, and WARP can reach within 2.5, rough surface Spend that Ra is stable between 0.9-1.1, be easily reached the requirement of chip back surface roughness Ra value in industry in 0.8-1.2, quality obtains To effective lifting;
(7) after film releasing, before grinding, floating operation is carried out in advance, and in grinding, the light pressure for carrying out first paragraph first is ground Mill, the problem of preventing chip to be ruptured in process of lapping of maximum possible, reduces the fragment rate of chip, improves grinding The factor of merit;
(8) removal rate of grinding is stable, will not produce the problem of overground or removal rate is low, and efficiency comparison is fast, can reach 1.8um/min removal rate, improves device efficiency.
Brief description of the drawings
Fig. 1 feedway schematic diagrames.
Fig. 2 slurry tank schematic diagrames.
Fig. 3 Ginding process schematic diagrames.
Embodiment
A kind of lapping device of sapphire wafer as depicted, it is characterised in that including size barrel 1, peristaltic pump 2 and grind Grinding machine 3, the peristaltic pump 2 include 2 pump heads 4, delivery pipe 5 and pump-out pipe 6, and the pump head 4 carries out conveying control to delivery pipe 5 System, delivery hose 7 is sheathed with the delivery pipe 5 and pump-out pipe 6 respectively and pumps out flexible pipe 8, the grinder 3 include crossbeam 9, Slurry tank 10, grinding upper disc 11 and grinding lower wall 19, the crossbeam 9 are provided with control cylinder 12 and hose support 13, the control Cylinder 12 processed is vertically arranged, including cylinder rod 14, and the cylinder rod 14 downwards, and is rotated by bearing and grinding upper disc 11 Connection, realizes the rotation in the motion and horizontal direction of the in the vertical direction of grinding upper disc 11, the slurry tank 10 is fixedly installed Above grinding upper disc 11, between crossbeam 9 and grinding upper disc 11, and it is affixed with grinding upper disc 11, slurry tank 10 is in annulus The channel form of shape, opening up, its lower surface is evenly arranged with 36 leak 15, and the grinding upper disc 11 runs through provided with 36 The pipe joint 16 of grinding upper disc 11, the pipe joint 16 are uniformly arranged, and are connected by transparent hose with leak 15, connect slurry Groove 10;
The size barrel 1 is positioned over the side of grinder 3, and the peristaltic pump 2 is positioned on the table top of grinder 3, described defeated One end of flexible pipe 7 is sent by way of weight of tying, is sunken to the bottom of size barrel 1, described one end for pumping out flexible pipe 8 passes through flexible pipe branch Frame 13 is detachably secured to directly over slurry tank 10, and is uniformly distributed, and pumps out the outlet face slurry tank 10 of flexible pipe 8;
Wherein, the quantity of peristaltic pump 2 is at least 2, and the delivery hose 7 is a diameter of 8 millimeters with flexible pipe 8 is pumped out Transparent hose, the grinder 3 are provided with slurry outlet 17, and the slurry outlet 17 is equipped with useless slurry charging basket 18.
The Ginding process of above-mentioned a kind of sapphire wafer, it is characterised in that comprise the following steps:
(1) slurry is prepared:30L pure water is poured into size barrel, is placed on below pulp blender, starts slurry agitation Machine, Agitator Impeller is stirred in pure water, set mixer rotating speed as 50rpm, then, take the carbonization that 10kg granularities are 240# Boron, slowly pour into the water of agitation, until after boron carbide all pours into, then 45min is kept stirring for, finally it is slowly added to 1.5L Suspension and 0.5L alkaline antirust agent, continue stir 45min after, obtain abradant slurry;
(2) slurry flow controls:One end of delivery hose is sunk to the slurry bottom of the barrel for being contained with slurry, flexible pipe will be pumped out Remove, be placed in 500ml plastic measuring glass, start peristaltic pump, flow rate of slurry is monitored, pump head is adjusted, to slurry Transporting velocity is controlled, until flow rate of slurry reaches 50 ± 5ml/min;
(3) grinding lower disk surface flatness is corrected:The lower card of grinding is measured using the mode of calipers plus amesdial, grinds lower wall The intermediate settings in face are recessed 0~-15um, measure the lower card of grinding using the mode of short rule plus amesdial, grind lower card Intermediate settings if there is error, do not reach requirement between 0~+10um of projection, then using the amendment wheel of grinding to upper lower burrs Face is ground finishing, until meeting the requirements;
(4) card cloth powder is ground:The one end for pumping out flexible pipe is fixed on directly over slurry tank by hose support, and makes pump Go out the outlet face slurry tank of flexible pipe, fall grinding upper disc, the slurry in size barrel passes through in peristaltic pump, slurry tank and grinding Disk, it is sent on grinding lower wall, grinder, grinding upper disc and the grinding slow preaceleration of lower wall is started, until the rotating speed of grinding upper disc Reach 1.7rpm, the rotating speed for grinding lower wall reaches 5rpm, and pressure 0.020kg/cm, 20 seconds used times, subsequent grinder is persistently transported Turn 1min, carry out the operation of card cloth powder;
(5) chip twin grinding:After the completion of the operation of cloth powder, stop slurry conveying, lift grinding upper disc, be put into erratic star wheel, Place a wafer into the hole of the erratic star wheel in grinder, and it is floating, confirm and ensure that every wafer all enters wandering star wheel bore In hole, the thickness error that enters the station of whole disk chip is controlled within 5um, and the WARP that enters the station is controlled within 20um, is started grinder, is ground Disk and slow preaceleration under grinding on mill, until the rotating speed of grinding upper disc reaches 5.3rpm, the rotating speed for grinding lower wall reaches 16rpm, pressure 0.049kg/cm, 60 seconds used times, grinder continuous running 1.5min, the light pressure grinding of first paragraph is carried out, with Slowly accelerate again under grinding upper disc and grinding afterwards, until the rotating speed of grinding upper disc reaches 6.7rpm, grind the turn up of lower wall To 20rpm, pressure 0.058kg/cm, 20 seconds used times, grinder continuous running 10min, the normal grinding of second segment is carried out, with Removal rate during grinder grinding is calculated afterwards, according to removal rate and the follow-up milling time of remaining THICKNESS CALCULATION, and is set again Determine the polish process time, untill being ground to standard thickness, complete grinding, the slurry after grinding is exhausted directly to useless slurry charging basket In, it is not recycled.
The foregoing is only a preferred embodiment of the present invention, but protection scope of the present invention be not limited thereto, Any one skilled in the art the invention discloses technical scope in, the change or replacement that can readily occur in, It should all cover within the scope of the present invention.Therefore, protection scope of the present invention should be with the protection domain of claims It is defined.

Claims (2)

  1. A kind of 1. lapping device of sapphire wafer, it is characterised in that including size barrel, peristaltic pump and grinder, the wriggling Pump includes 2 pump heads, delivery pipe and pump-out pipe, and the pump head carries out conveying control, the delivery pipe and pump-out pipe to delivery pipe Upper to be sheathed with delivery hose respectively and pump out flexible pipe, the grinder includes crossbeam, slurry tank, grinding upper disc and grinding lower wall, The crossbeam is provided with control cylinder and hose support, and the control cylinder is vertically arranged, including cylinder rod, the cylinder rod erect Directly down, and by bearing and grinding upper disc it is rotatablely connected, realizes motion and the horizontal direction of grinding upper disc in the vertical direction On rotation, the slurry tank is fixedly installed on above grinding upper disc, between crossbeam and grinding upper disc, and and grinding upper disc Affixed, slurry tank is in the channel form of annular, and opening up, its lower surface is evenly arranged with 36 leak, the grinding upper disc 36 pipe joints for running through grinding upper disc are provided with, the pipe joint is uniformly arranged, and is connected by transparent hose with leak, even Logical slurry tank;
    The size barrel is positioned over grinder side, and the peristaltic pump is positioned on the table top of grinder, the delivery hose One end is sunken to slurry bottom of the barrel by way of weight of tying, it is described pump out flexible pipe one end it is detachable by hose support It is fixed on directly over slurry tank, and is uniformly distributed, pumps out the outlet face slurry tank of flexible pipe;The peristaltic pump quantity is at least 2 Platform;The delivery hose and to pump out flexible pipe be a diameter of 8 millimeters of transparent hose;The grinder is provided with slurry outlet, The slurry outlet is equipped with useless slurry charging basket.
  2. 2. a kind of Ginding process of sapphire wafer, it is characterised in that comprise the following steps:
    (1) slurry is prepared:30L pure water is poured into size barrel, is placed on below pulp blender, starts pulp blender, is made Agitator Impeller stirs in pure water, sets mixer rotating speed as 50rpm, then, takes the boron carbide that 10kg granularities are 240#, delays In the slow water for pouring into agitation, until after boron carbide all pours into, then 45min is kept stirring for, finally it is slowly added to the outstanding of 1.5L The alkaline antirust agent of supernatant liquid and 0.5L, continue after stirring 45min, obtain abradant slurry;
    (2) slurry flow controls:One end of delivery hose is sunk to the slurry bottom of the barrel for being contained with slurry, flexible pipe will be pumped out and taken Under, it is placed in 500ml plastic measuring glass, starts peristaltic pump, flow rate of slurry is monitored, adjusts pump head, it is defeated to slurry Speed is sent to be controlled, until flow rate of slurry reaches 50 ± 5ml/min;
    (3) grinding lower disk surface flatness is corrected:The lower card of grinding is measured using the mode of calipers plus amesdial, grinds lower card Intermediate settings are recessed 0~-15um, measure the lower card of grinding using the mode of short rule plus amesdial, grind the centre of lower card It is set as between 0~+10um of projection, if there is error, does not reach requirement, then upper and lower card is entered using the amendment wheel of grinding Row cutting down, until meeting the requirements;
    (4) card cloth powder is ground:The one end for pumping out flexible pipe is fixed on directly over slurry tank by hose support, and makes to pump out soft The outlet face slurry tank of pipe, falls grinding upper disc, and the slurry in size barrel is sent by peristaltic pump, slurry tank and grinding upper disc Up on grinding lower wall, grinder, grinding upper disc and the grinding slow preaceleration of lower wall are started, until the rotating speed of grinding upper disc reaches 1.7rpm, the rotating speed for grinding lower wall reach 5rpm, pressure 0.020kg/cm, 20 seconds used times, subsequent grinder continuous running 1min, carry out the operation of card cloth powder;
    (5) chip twin grinding:After the completion of the operation of cloth powder, stop slurry conveying, lift grinding upper disc, erratic star wheel is put into, by crystalline substance Piece is put into the hole of the erratic star wheel in grinder, and floating, is confirmed and is ensured that every wafer is all entered in erratic star wheel hole, The thickness error that enters the station of whole disk chip is controlled within 5um, and the WARP that enters the station is controlled within 20um, starts grinder, in grinding Disk and the grinding slow preaceleration of lower wall, until the rotating speed of grinding upper disc reaches 5.3rpm, the rotating speed for grinding lower wall reaches 16rpm, Pressure is 0.049kg/cm, 60 seconds used times, grinder continuous running 1.5min, carries out the light pressure grinding of first paragraph, then grinding Upper disk and grinding lower wall slowly accelerate again, and until the rotating speed of grinding upper disc reaches 6.7rpm, the rotating speed for grinding lower wall reaches 20rpm, pressure 0.058kg/cm, 20 seconds used times, grinder continuous running 10min, the normal grinding of second segment is carried out, then Removal rate during grinder grinding is calculated, according to removal rate and the follow-up milling time of remaining THICKNESS CALCULATION, and is set again The polish process time, untill being ground to standard thickness, grinding is completed, the slurry after grinding is exhausted directly in useless slurry charging basket, It is not recycled.
CN201510722951.4A 2015-10-29 2015-10-29 The lapping device and its Ginding process of a kind of sapphire wafer Active CN105215838B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510722951.4A CN105215838B (en) 2015-10-29 2015-10-29 The lapping device and its Ginding process of a kind of sapphire wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510722951.4A CN105215838B (en) 2015-10-29 2015-10-29 The lapping device and its Ginding process of a kind of sapphire wafer

Publications (2)

Publication Number Publication Date
CN105215838A CN105215838A (en) 2016-01-06
CN105215838B true CN105215838B (en) 2017-11-28

Family

ID=54985283

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510722951.4A Active CN105215838B (en) 2015-10-29 2015-10-29 The lapping device and its Ginding process of a kind of sapphire wafer

Country Status (1)

Country Link
CN (1) CN105215838B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107932204B (en) * 2016-04-27 2019-05-21 马鞍山市金德瑞冶金机械配件制造有限公司 A kind of method of planer-type grinding device production high-speed steel tool
CN108393784A (en) * 2017-02-06 2018-08-14 张燕平 A kind of mobile phone shell grinding apparatus
CN107309784B (en) * 2017-09-03 2019-08-02 湖北天宝光电科技有限公司 A kind of two-sided fine grinding technology of sapphire cover board
JP6935635B2 (en) * 2017-09-06 2021-09-15 スピードファム株式会社 Carrier for holding objects to be polished for double-sided polishing equipment
JP2019136837A (en) * 2018-02-14 2019-08-22 信越半導体株式会社 Double-sided polishing method
JP7116371B2 (en) * 2019-04-01 2022-08-10 株式会社村田製作所 Abrasive supply device, polishing device and abrasive supply method
CN110484207B (en) * 2019-09-20 2020-05-29 江苏京晶光电科技有限公司 Preparation method of sapphire wafer fine grinding fluid
CN112264928A (en) * 2020-10-23 2021-01-26 长江存储科技有限责任公司 Chemical mechanical polishing equipment
CN113601397B (en) * 2021-10-08 2022-02-15 常州市名流干燥设备有限公司 Polishing paste conveying device for semiconductor wafer drying
CN117359435B (en) * 2023-12-05 2024-03-05 福建荣德光电科技有限公司 Numerical control plane precision milling and grinding machine for optical lens processing

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000326209A (en) * 1999-05-20 2000-11-28 Nec Corp Surface grinding device
JP4636787B2 (en) * 2003-10-22 2011-02-23 株式会社ディスコ Fixed abrasive polishing pad, polishing equipment
KR101715024B1 (en) * 2006-12-28 2017-03-10 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 A sapphire substrate
CN101716745B (en) * 2009-11-09 2011-06-29 清华大学 Device and method for polishing sapphire substrate material by ultrasound assisted chemical machinery
CN205148037U (en) * 2015-10-29 2016-04-13 江苏吉星新材料有限公司 Sapphire wafer's grinder

Also Published As

Publication number Publication date
CN105215838A (en) 2016-01-06

Similar Documents

Publication Publication Date Title
CN105215838B (en) The lapping device and its Ginding process of a kind of sapphire wafer
CN208839703U (en) A kind of serialization pulp grinder
CN107935602A (en) A kind of more component ceramic powder High Efficiency Superfine Ginding process and its grinding system
CN207372924U (en) A kind of sapphire substrate sheet double-sided polisher
CN205148037U (en) Sapphire wafer's grinder
CN208526774U (en) A kind of pitch vertical lapping machine structure
CN107053032A (en) A kind of preparation method of deep cure type concretion abrasive polishing pad
CN209138831U (en) Grinding device is used in a kind of production of glass marble
CN206406227U (en) New Concrete azulejo process units
CN203972011U (en) Nanometer mud wet milk
CN213654259U (en) Concrete paving and conveying equipment for civil engineering construction
CN106542768A (en) A kind of OK a karaoke club crystobalite stone slab and its manufacture craft
CN203856170U (en) Non-deforming quartz stone manufactured on site
CN210097922U (en) Double-screw conveyor is feed mechanism in coordination
CN206121577U (en) Agitating unit is prevented deposiing by lapping liquid
CN208554427U (en) Agitator mill with power-assisted starting component
CN207206083U (en) Target grinder
CN208929974U (en) A kind of semi-consolidated abrasive disk for semiconductor substrate grinding
CN110409450A (en) Improve the construction method of concrete bottom plate flatness and finish
CN106738221A (en) A kind of mechanical device for producing concrete azulejo
CN215694425U (en) Device for automatically stabilizing concentration of grinding slurry
CN215903737U (en) Cement pipe making machine for producing reinforced concrete pipe
CN218227203U (en) Raw materials mix device for concrete preparation
CN104117405B (en) Nanofiber slurry wet milk
CN205521945U (en) Novel cement mixer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
EE01 Entry into force of recordation of patent licensing contract
EE01 Entry into force of recordation of patent licensing contract

Application publication date: 20160106

Assignee: Zhejiang Zhaojing New Material Technology Co.,Ltd.

Assignor: JIANGSU JESHINE NEW MATERIAL Co.,Ltd.

Contract record no.: X2022980008188

Denomination of invention: A grinding device for sapphire wafer and its grinding method

Granted publication date: 20171128

License type: Common License

Record date: 20220627

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20230104

Address after: 100102 20628, Floor 2, Building A1, No. 1, Huangchang West Road, Dougezhuang, Chaoyang District, Beijing

Patentee after: Youran Walker (Beijing) Technology Co.,Ltd.

Address before: 212200 new materials Industrial Park, Youfang Town, Yangzhong City, Zhenjiang City, Jiangsu Province

Patentee before: JIANGSU JESHINE NEW MATERIAL Co.,Ltd.

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20230621

Address after: 050035 No. 369, Zhujiang Avenue, high tech Zone, Shijiazhuang, Hebei

Patentee after: TUNGHSU GROUP Co.,Ltd.

Address before: 100102 20628, Floor 2, Building A1, No. 1, Huangchang West Road, Dougezhuang, Chaoyang District, Beijing

Patentee before: Youran Walker (Beijing) Technology Co.,Ltd.