CN105204840B - 用于部件程序的机器视觉***的编辑环境 - Google Patents

用于部件程序的机器视觉***的编辑环境 Download PDF

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Publication number
CN105204840B
CN105204840B CN201510334979.0A CN201510334979A CN105204840B CN 105204840 B CN105204840 B CN 105204840B CN 201510334979 A CN201510334979 A CN 201510334979A CN 105204840 B CN105204840 B CN 105204840B
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China
Prior art keywords
instructions
mode
image acquisition
image analysis
operations
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CN201510334979.0A
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Chinese (zh)
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CN105204840A (zh
Inventor
M.德拉尼
B.E.塞勒
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Mitutoyo Corp
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Mitutoyo Corp
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Priority claimed from US14/307,458 external-priority patent/US9167215B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/401—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201510334979.0A 2014-06-17 2015-06-16 用于部件程序的机器视觉***的编辑环境 Active CN105204840B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/307,458 2014-06-17
US14/307,458 US9167215B2 (en) 2011-11-15 2014-06-17 Machine vision system editing environment for a part program in which a continuous stream of image acquisition operations are performed during a run mode

Publications (2)

Publication Number Publication Date
CN105204840A CN105204840A (zh) 2015-12-30
CN105204840B true CN105204840B (zh) 2020-05-12

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CN201510334979.0A Active CN105204840B (zh) 2014-06-17 2015-06-16 用于部件程序的机器视觉***的编辑环境

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Country Link
JP (1) JP6585934B2 (ja)
CN (1) CN105204840B (ja)
DE (1) DE102015208337A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6647094B2 (ja) * 2016-03-16 2020-02-14 株式会社ミツトヨ 表面性状測定機用のパートプログラム生成装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8516462D0 (en) * 1984-07-17 1985-07-31 Electronic Automation Ltd Vision inspection method
CN103106077A (zh) * 2011-11-15 2013-05-15 株式会社三丰 机器视觉检测***
CN103105193A (zh) * 2011-11-15 2013-05-15 株式会社三丰 精密机器视觉检测***和用于操作该***的方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6542180B1 (en) 2000-01-07 2003-04-01 Mitutoyo Corporation Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the part
US7324682B2 (en) 2004-03-25 2008-01-29 Mitutoyo Corporation System and method for excluding extraneous features from inspection operations performed by a machine vision inspection system
US7454053B2 (en) 2004-10-29 2008-11-18 Mitutoyo Corporation System and method for automatically recovering video tools in a vision system
US7590276B2 (en) 2004-12-20 2009-09-15 Mitutoyo Corporation System and method for programming interrupting operations during moving image acquisition sequences in a vision system
US7394926B2 (en) * 2005-09-30 2008-07-01 Mitutoyo Corporation Magnified machine vision user interface
US8111938B2 (en) 2008-12-23 2012-02-07 Mitutoyo Corporation System and method for fast approximate focus
US8111905B2 (en) 2009-10-29 2012-02-07 Mitutoyo Corporation Autofocus video tool and method for precise dimensional inspection
US9013574B2 (en) 2011-11-15 2015-04-21 Mitutoyo Corporation Machine vision system program editing environment including synchronized user interface features
US9223306B2 (en) 2011-11-15 2015-12-29 Mitutoyo Corporation System and method utilizing an editing initialization block in a part program editing environment in a machine vision system
CN104137147B (zh) * 2011-12-23 2017-05-31 株式会社三丰 机器视觉***中的使用多个光设置的对焦点操作

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8516462D0 (en) * 1984-07-17 1985-07-31 Electronic Automation Ltd Vision inspection method
CN103106077A (zh) * 2011-11-15 2013-05-15 株式会社三丰 机器视觉检测***
CN103105193A (zh) * 2011-11-15 2013-05-15 株式会社三丰 精密机器视觉检测***和用于操作该***的方法
JP2013105500A (ja) * 2011-11-15 2013-05-30 Mitsutoyo Corp 画像取得動作の連続ストリームが実行モード中に実行されるパートプログラムのマシンビジョンシステム編集環境
JP2013104877A (ja) * 2011-11-15 2013-05-30 Mitsutoyo Corp リアルタイムコンテキスト生成機能を含むマシンビジョンシステムプログラム編集環境

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Publication number Publication date
CN105204840A (zh) 2015-12-30
DE102015208337A1 (de) 2015-12-17
JP2016004043A (ja) 2016-01-12
JP6585934B2 (ja) 2019-10-02

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