CN104730441B - Transistors breakdown detection device - Google Patents
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- CN104730441B CN104730441B CN201310711933.7A CN201310711933A CN104730441B CN 104730441 B CN104730441 B CN 104730441B CN 201310711933 A CN201310711933 A CN 201310711933A CN 104730441 B CN104730441 B CN 104730441B
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Abstract
The present invention provides a kind of transistors breakdown detection devices, including switch, first switch control mechanism, voltage detection mechanism and breakdown judge mechanism.The switch is connected in parallel on the both ends of thyristor with soft open after resistance is connected；The input terminal of the voltage detection mechanism is respectively connected to the thyristor both ends, the voltage difference for detecting thyristor both ends；The output end of the voltage detection mechanism is electrically connected with the input terminal of the breakdown judge mechanism；The output end of the breakdown judge mechanism is electrically connected with the controller, and the first switch control mechanism is connected with the voltage detection mechanism.The present invention transistors breakdown detection device, it is therefore prevented that driver work in transistors breakdown and caused by capacitance even controller damage.Moreover, it is simple in structure, it is easy to use.
Description
Technical field
The present invention relates to detection device technology fields, more particularly to a kind of transistors breakdown detection device.
Background technology
Commonly using the rectification module with thyristor in the rectification circuit of linear motor driver, when controller connects electricity
Behind source, the rectifying part in rectification module converts AC power to DC power supply, and then to open resistance straight to being connected in parallel on by soft
The capacitance at stream busbar both ends charges.When the voltage on capacitance reaches certain value, controller controls thyristor and opens.Brilliant lock
After pipe conducting, the soft resistance that opens is bypassed, and controller completes power up.But when thyristor occur open circuit or short circuit failure,
And controller can cause the damage of capacitance, in some instances it may even be possible to damage controller when can not know the malfunction of thyristor.
Invention content
In view of the present situation of the prior art, the purpose of the present invention is to provide a kind of transistors breakdown detection devices so that
In the power up of controller, the transistors breakdown detection device can judge thyristor whether failure, and by the work of thyristor
Controller is sent to as state, avoids the damage for causing capacitance and controller.
To achieve the above object, the present invention adopts the following technical scheme that：
A kind of transistors breakdown detection device, including switch, first switch control mechanism, voltage detection mechanism and failure are sentenced
Breaking mechanism；
The switch is connected in parallel on the both ends of thyristor with soft open after resistance is connected；
The input terminal of the voltage detection mechanism is separately connected the thyristor both ends, the electricity for detecting thyristor both ends
Pressure difference；The output end of the voltage detection mechanism is electrically connected with the input terminal of the breakdown judge mechanism；
The output end of the breakdown judge mechanism is electrically connected with the controller, the first switch control mechanism and the voltage
Testing agency connects.
Further include accessory power supply and second switch control mechanism in one of the embodiments,；
The input terminal of the accessory power supply is separately connected the cathode of the thyristor and the lower bridge arm of DC bus, described auxiliary
The output end of power supply is helped to be electrically connected with the second switch control mechanism；
The output end of the second switch control mechanism is electrically connected with the first switch control mechanism.
The switch is that open type switchs in one of the embodiments,.
The switch is normally closed switch in one of the embodiments,.
The breakdown judge mechanism includes comparing testing agency and fault logic output machine in one of the embodiments,
Structure；
The input terminal of the relatively testing agency is electrically connected with the output end of the voltage detection mechanism, described relatively to detect
The output end of mechanism is electrically connected with the input terminal of the fault logic output mechanism；
The output end of the fault logic output mechanism is electrically connected with the controller.
The relatively testing agency is comparator in one of the embodiments,.
The breakdown judge mechanism is CPU in one of the embodiments,；
The input terminal of the CPU is electrically connected with the output end of voltage detection mechanism, the output end of the CPU and the control
Device is electrically connected.
The CPU is microcontroller, DSP, ARM, CPLD, FPGA in one of the embodiments, or other are programmable micro-
Processor.
The beneficial effects of the invention are as follows：
The transistors breakdown detection device of the present invention, the voltage difference by detecting thyristor both ends judge the work of thyristor
State, and send the working condition of thyristor to controller, controller makes corresponding guarantor according to the working condition of thyristor
Shield.Which prevent driver work in transistors breakdown and caused by capacitance even controller damage.Moreover, knot
Structure is simple, easy to use.
Description of the drawings
Fig. 1 is the system diagram of one embodiment of transistors breakdown detection device normally open of the present invention；
Fig. 2 is the system diagram of another embodiment of transistors breakdown detection device normally open of the present invention；
Fig. 3 is the system diagram of one embodiment of transistors breakdown detection device normally closed of the present invention；
Fig. 4 is the system diagram of another embodiment of transistors breakdown detection device normally closed of the present invention.
Specific implementation mode
In order to keep technical scheme of the present invention clearer, below in conjunction with attached drawing, the transistors breakdown of the present invention is detected
Device and method is described in further detail.It should be appreciated that described herein, specific examples are only used to explain the present invention
It is not intended to limit the present invention.
Referring to Fig. 1 to Fig. 4, which is arranged between rectification module A1 and the capacitance of its rear end.
Wherein, rectification module A1 includes rectification circuit and thyristor VT1, and rectification circuit forms rectifier bridge by six diode V1~V6,
For converting AC power to DC power supply.Thyristor VT1 is arranged on the upper bridge arm of DC bus, i.e. thyristor VT1's
Anode is electrically connected with the cathode of diode V1~V3.
The transistors breakdown detection device includes switch K, first switch control mechanism U0, voltage detection mechanism U1 and failure
Decision mechanism.Wherein, switch K is connected in parallel on the both ends of thyristor VT1 with soft open after resistance R connects.I.e. soft one end for opening resistance R with
The anode of thyristor VT1 is electrically connected, and the soft other end for opening resistance R is electrically connected with one end of switch K, the other end connection of switch K
The cathode of thyristor VT1.First switch control mechanism U0 connects with voltage detection mechanism U1, after electricity on the controller, control
System switch K is in closed state；After the completion of the capacitor charging of rear end, control switch K is in the open state.
Two input terminals of voltage detection mechanism U1 are separately connected the both ends of thyristor VT1, i.e. voltage detection mechanism its
In input terminal connection thyristor VT1 anode, the moon of another input terminal connection thyristor VT1 of voltage detection mechanism
Pole.The input terminal of the output end connecting fault decision mechanism of voltage detection mechanism U1, the output end connection control of breakdown judge mechanism
Device processed.
Voltage detection mechanism U1 is used to detect the voltage difference V0 at the both ends thyristor VT1, and sends voltage difference V0 to events
Hinder decision mechanism.Breakdown judge mechanism analyzes the work shape of thyristor VT1 according to the voltage difference V0 at the thyristor both ends received
State, and send the working condition of thyristor VT1 to controller.It should be understood that the working condition packet of thyristor VT1 herein
Include thyristor normal work, thyristor open circuit and thyristor short circuit.
Different according to the type of switch K, which can be divided into the transistors breakdown of normally open
The transistors breakdown detection device of detection device and normally closed.
It is as depicted in figs. 1 and 2 the system diagram of the normally open of the transistors breakdown detection device of the present invention, wherein open
It is that open type is switched and connected with the soft resistance R that opens to close K.When controller does not power on, switch K is in the open state.Controller
After the power is turned on, first switch control mechanism U0 controls switch K and is closed.In rear end after the completion of capacitor charging, first switch control mechanism
U0 controls switch K and opens.
It further include auxiliary as a kind of embodiment, in the embodiment of the normally open of the transistors breakdown detection device
Power supply U4 and second switch control mechanism U5.Two input terminals of accessory power supply U4 be respectively connected to thyristor VT1 cathode and
The lower bridge arm of DC bus.The input terminal of the output end connection second switch control mechanism U5 of accessory power supply U4, second switch control
The output end connection first switch control mechanism U0 of mechanism U5 processed.
Accessory power supply U4 is used to reach certain voltage value in busbar voltage（The voltage value generally less than worked normally）Shi Wei
Controller provides power supply, and exports the normal work signal of accessory power supply U4.Second switch control mechanism U5 receives auxiliary electricity
Output control signal after the normal work signal of source U4, and send the control signal to first switch control structure U0, first
Switching control mechanism U0 control switches K restores the state opened.
It is as shown in Figure 1 the system diagram of an embodiment of the transistors breakdown detection device normally open of the present invention, wherein
Breakdown judge mechanism includes comparing testing agency U2 and fault logic output mechanism U3.And compare the input terminal of testing agency U2 with
The output end of voltage detection mechanism U1 is electrically connected, and compares the input of the output end and fault logic output mechanism U3 of testing agency U2
End electrical connection.Preferably, it is comparator to compare testing agency U2.The output end of fault logic output mechanism U3 is electrically connected with controller
It connects so that controller can know the working condition of thyristor and make corresponding protection act.
When the voltage difference V0 at the both ends thyristor VT1 is more than the predeterminated voltage difference V1 for comparing testing agency U2, compare detection
Mechanism U2 exports logic level a, wherein logic level a can be high level or low level.When the voltage at the both ends thyristor VT1
When poor V0 is less than the predeterminated voltage difference V1 for comparing testing agency U2, compare testing agency U2 output logic levelsFor example, working as V0
When ＞ V1, it is 1 to compare testing agency U2 output logic levels, then as V0 ＜ V1, compares the output logic electricity of testing agency U2
Put down is 0.
Fault logic output mechanism U3 judges thyristor according to the logic level of the comparison testing agency U2 outputs received
Working condition, and send the working condition of thyristor to controller.When thyristor VT1 is worked normally, on the controller
In the process of electricity, thyristor VT1 is bypassed, and the voltage difference V0 at thyristor both ends is larger at this time, V0 ＞ V1.When controller has powered on
Cheng Hou, switch K are opened, and controller controls thyristor VT1 conductings, at this point, the voltage difference V0 at thyristor both ends can be gradually decrease to
Close to 0V, V0 ＜ V1.Therefore, when thyristor VT1 is worked normally, voltage detection mechanism U1 first exports logic level a, rear to export
Logic level
At this point, fault logic output mechanism U3 corresponds to output two-way level value.When voltage detection mechanism U1 first exports logic
When level a, the wherein all the way output logic level b of fault logic output mechanism U3（Logic level b can be high level or low electricity
It is flat）And the value of logic level b is locked.And logic levelWherein Vu3 indicates fault logic output mechanism U3's
Original levels.The another way output logic level c of fault logic output mechanism U3.
Logic level is exported after voltage detection mechanism U1When, wherein exporting all the way for fault logic output mechanism U3 is patrolled
Collect level b（Logic level b can be high level or low level）And the value of logic level b is locked.And logic levelWherein Vu3 indicates the original levels of fault logic output mechanism U3.The another way of fault logic output mechanism U3 is defeated
Go out logic level
When thyristor VT1 open circuits, the voltage difference V0 at thyristor both ends is consistently greater than the default electricity for comparing testing agency U2
Pressure difference V1, the output for comparing testing agency U2 are always logic level a.At this point, fault logic output mechanism U3 wherein all the way
Export logic level b（Logic level b can be high level or low level）And the value of logic level b is locked.And logic electricity
It is flatWherein Vu3 indicates the original levels of fault logic output mechanism U3.The another way of fault logic output mechanism U3
Export logic level c.
When thyristor VT1 short circuits, the voltage difference V0 at thyristor both ends is close to 0V, and the voltage difference V0 at thyristor both ends begins
It is less than the predeterminated voltage difference V1 for comparing testing agency U2 eventually, the output for comparing testing agency U2 is always logic levelAt this point,
The wherein all the way output logic level b of fault logic output mechanism U3（Logic level b can be high level or low level）And it will
The value of logic level b locks.And logic levelWherein Vu3 indicates the initial electricity of fault logic output mechanism U3
It is flat.The another way of fault logic output mechanism U3 exports logic level
In conclusion when thyristor VT1 is worked normally, the level value of logic judgment mechanism output exists by logic level
C is to logic levelHopping phenomenon.When thyristor VT1 open circuits, the level of logic judgment mechanism output is always level c.
When thyristor VT1 short circuits, the level of logic judgment output mechanism output is alwaysController is passed according to logic judgment mechanism
The level value sent judges the working condition of thyristor.
It is illustrated in figure 2 the system diagram of another embodiment of transistors breakdown detection device normally open of the present invention.Wherein,
Breakdown judge mechanism is CPU.And the input terminal of CPU is electrically connected with the output end of voltage detection mechanism U1, the output end of CPU and control
Device electrical connection processed.Preferably, CPU can be microcontroller, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
When thyristor VT1 is worked normally, voltage detection mechanism U1 first exports logic level a, rear output levelWork as crystalline substance
When brake tube VT1 open circuits, voltage detection mechanism U1 exports logic level a always.When thyristor VT1 short circuits, voltage detection mechanism
U1 exports logic level alwaysIn this way, CPU can judge thyristor according to the level value of voltage detection mechanism U1 outputs
Working condition, and send the working condition of thyristor to controller.
It is as shown in Figure 3 and Figure 4 the system diagram of the normally closed of the transistors breakdown detection device of the present invention, wherein open
K is closed to be normally closed switch and connect with the soft resistance R that opens.When controller does not power on, switch K is in closed state.Controller
After the power is turned on, switch K is still within closed state.In rear end after the completion of capacitor charging, first switch control mechanism U0 control switches K
It opens.
It is illustrated in figure 3 the system diagram of an embodiment of the transistors breakdown detection device normally closed of the present invention, wherein
Breakdown judge mechanism includes comparing testing agency U2 and fault logic output mechanism U3.And compare the input terminal of testing agency U2 with
The output end of voltage check device U1 is electrically connected, and compares the input of the output end and fault logic output mechanism U3 of testing agency U2
End electrical connection.Preferably, comparison testing agency U2 is comparator.The output end of fault logic output mechanism U3 and controller electricity
Connection so that controller can know the working condition of thyristor and make corresponding protection act.
When the voltage difference V0 at the both ends thyristor VT1 is more than the predeterminated voltage difference V1 for comparing testing agency U2, compare detection
Mechanism U2 exports logic level a, wherein logic level a can be high level or low level.When the voltage at the both ends thyristor VT1
When poor V0 is less than the predeterminated voltage difference V1 for comparing testing agency U2, compare testing agency U2 output logic levelsFor example, working as V0
When ＞ V1, it is 1 to compare testing agency's U2 output levels, then as V0 ＜ V1, the output level for comparing testing agency U2 is 0.
Fault logic output mechanism U3 according to receive comparison testing agency U2 output electrical level judging thyristor work
Make state, and sends the working condition of thyristor to controller.It is electric on the controller when thyristor VT1 is worked normally
In the process, thyristor VT1 is bypassed, and the voltage difference V0 at thyristor both ends is larger at this time, V0 ＞ V1.When controller powers on completion
Afterwards, switch K is opened, and controller controls thyristor VT1 conductings, at this point, the voltage difference V0 at thyristor both ends can be gradually decrease to connect
Nearly 0V, V0 ＜ V1.Therefore, when thyristor VT1 is worked normally, voltage detection mechanism U1 elder generations output level a, rear output level
At this point, fault logic output mechanism U3 corresponds to output two-way level value.When voltage detection mechanism U1 first exports logic
When level a, the wherein all the way output logic level b of fault logic output mechanism U3（Logic level b can be high level or low electricity
It is flat）And the value of logic level b is locked.And logic levelWherein Vu3 indicates that fault logic output mechanism U3's is first
Beginning level.The another way output logic level c of fault logic output mechanism U3.
Logic level is exported after voltage detection mechanism U1When, wherein exporting all the way for fault logic output mechanism U3 is patrolled
Collect level b（Logic level b can be high level or low level）And the value of logic level b is locked.And logic levelWherein Vu3 indicates the original levels of fault logic output mechanism U3.The another way of fault logic output mechanism U3 is defeated
Go out logic level
When thyristor VT1 open circuits, the voltage difference V0 at thyristor both ends is consistently greater than the default electricity for comparing testing agency U2
Pressure difference V1, the output for comparing testing agency U2 are always logic level a.At this point, fault logic output mechanism U3 wherein all the way
Export logic level b（Logic level b can be high level or low level）And the value of logic level b is locked.And logic electricity
It is flatWherein Vu3 indicates the original levels of fault logic output mechanism U3.The another way of fault logic output mechanism U3
Export logic level c.
When thyristor VT1 short circuits, the voltage value V0 at thyristor both ends is close to 0V, and the voltage difference V0 at thyristor both ends begins
It is less than the predeterminated voltage difference V1 for comparing testing agency U2 eventually, the output for comparing testing agency U2 is always levelAt this point, failure
The wherein all the way output logic level b of logic output mechanism U3（Logic level b can be high level or low level）And this is patrolled
Collect the value locking of level b.And logic levelWherein Vu3 indicates the original levels of fault logic output mechanism U3.Therefore
The another way for hindering logic output mechanism U3 exports logic level
In conclusion when thyristor VT1 is worked normally, the level value of logic judgment mechanism output exists by logic level
C is to logic levelHopping phenomenon.When thyristor VT1 open circuits, the level of logic judgment mechanism output is always logic electricity
Flat c.When thyristor VT1 short circuits, the level of logic judgment output mechanism output is always logicController is sentenced according to logic
The level value of breaking mechanism transmission, judges the working condition of thyristor.
It is illustrated in figure 4 the system diagram of another embodiment of transistors breakdown detection device normally open of the present invention.Wherein,
Breakdown judge mechanism is CPU.And the input terminal of CPU is electrically connected with the output end of voltage detection mechanism U1, the output end of CPU and control
Device electrical connection processed.Preferably, CPU can be microcontroller, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
When thyristor VT1 is worked normally, voltage detection mechanism U1 first exports logic level a, exports logic level afterwards
When thyristor VT1 open circuits, voltage detection mechanism U1 exports logic level a always.When thyristor VT1 short circuits, voltage detecting
Mechanism U1 exports logic level alwaysIn this way, CPU can judge brilliant lock according to the level value of voltage detection mechanism U1 outputs
The working condition of pipe, and send the working condition of thyristor to controller.
The transistors breakdown detection device of the present invention, the voltage difference by detecting thyristor both ends judge the work of thyristor
State, and send the working condition of thyristor to controller, controller makes corresponding guarantor according to the working condition of thyristor
Shield.Which prevent driver work in transistors breakdown and caused by capacitance even controller damage.Moreover, knot
Structure is simple, easy to use.
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
Cannot the limitation to the scope of the claims of the present invention therefore be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the guarantor of the present invention
Protect range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (5)
1. a kind of transistors breakdown detection device, it is characterised in that：
Including switch, first switch control mechanism, voltage detection mechanism and breakdown judge mechanism；Wherein, the breakdown judge machine
Structure includes comparing testing agency and fault logic output mechanism, the input terminal with the voltage detecting machine of the relatively testing agency
The output end of structure is electrically connected, and the input terminal of the relatively output end and the fault logic output mechanism of testing agency is electrically connected
It connects；
The switch is connected in parallel on the both ends of thyristor with soft open after resistance is connected；
The input terminal of the voltage detection mechanism is separately connected the thyristor both ends, the voltage for detecting thyristor both ends
Difference；The output end of the fault logic output mechanism is electrically connected with the controller, the first switch control mechanism and the voltage
Testing agency connects；
When the voltage difference at the thyristor both ends that the voltage detection mechanism detects is more than the default electricity of the relatively testing agency
When pressure difference, the relatively testing agency exports logic level a, when the electricity at the thyristor both ends that the voltage detection mechanism detects
When pressure difference is less than the relatively predeterminated voltage difference of testing agency, the relatively testing agency exports logic level
When the thyristor is in normal operating conditions, the relatively testing agency first exports logic level a, exports logic afterwards
LevelThe level value of the fault logic output mechanism output exists by logic level c to logic levelHopping phenomenon；
When the thyristor open circuit, the output of the relatively testing agency is always logic level a, the fault logic output mechanism
The level of output is always level c；When the thyristor short circuit, the output of the relatively testing agency is always logic levelThe level of fault logic output mechanism output is always
2. transistors breakdown detection device according to claim 1, it is characterised in that：
Further include accessory power supply and second switch control mechanism；
The input terminal of the accessory power supply is separately connected the cathode of the thyristor and the lower bridge arm of DC bus, the auxiliary electricity
The output end in source is electrically connected with the input terminal of the second switch control mechanism；
The output end of the second switch control mechanism is electrically connected with the first switch control mechanism.
3. transistors breakdown detection device according to claim 2, it is characterised in that：
The switch is that open type switchs.
4. transistors breakdown detection device according to claim 1, it is characterised in that：
The switch is normally closed switch.
5. transistors breakdown detection device according to claim 1, it is characterised in that：
The relatively testing agency is comparator.
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| CN108011357B (en) * | 2017-12-26 | 2019-04-05 | 保定尤耐特电力科技有限公司 | A kind of thyristor groups string protective device and method |
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| CN102279335A (en) * | 2010-06-11 | 2011-12-14 | 山特电子（深圳）有限公司 | Device and method for online detection on short troubles of thyristor |
| CN102998620A (en) * | 2012-12-17 | 2013-03-27 | 哈尔滨工业大学 | Device and method for quick online fault detection of high voltage thyristor valve block |
| CN203705598U (en) * | 2013-12-20 | 2014-07-09 | 中国科学院宁波材料技术与工程研究所 | Thyristor fault detection device |
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| CN104730441A (en) | 2015-06-24 |
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