CN104730441A - Thyristor fault detecting device - Google Patents

Thyristor fault detecting device Download PDF

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Publication number
CN104730441A
CN104730441A CN201310711933.7A CN201310711933A CN104730441A CN 104730441 A CN104730441 A CN 104730441A CN 201310711933 A CN201310711933 A CN 201310711933A CN 104730441 A CN104730441 A CN 104730441A
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thyristor
electrically connected
breakdown
pick
output terminal
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CN104730441B (en
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蒋哲
张弛
陈龙
刘强
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Ningbo Institute of Material Technology and Engineering of CAS
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Ningbo Institute of Material Technology and Engineering of CAS
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Abstract

The invention provides a thyristor fault detecting device comprising a switch, a first switch control mechanism, a voltage detecting mechanism and a fault judging mechanism. The switch and a soft start resistor are connected in series and then connected to the two ends of a thyristor in parallel. The input end of the voltage detecting mechanism is connected to the two ends of the thyristor, and the voltage detecting mechanism is used for detecting the voltage difference between the two ends of the thyristor. The output end of the voltage detecting mechanism is electrically connected with the input end of the fault judging mechanism. The output end of the fault judging mechanism is electrically connected with a controller. The first switch control mechanism is connected with the voltage detecting mechanism in series. The thyristor fault detecting device prevents the situation that under the condition that a thyristor breaks down, an actuator goes on working, so that a capacitor and even the controller are damaged, and is simple in structure and convenient to use.

Description

Transistors breakdown pick-up unit
Technical field
The present invention relates to pick-up unit technical field, particularly relate to a kind of transistors breakdown pick-up unit.
Background technology
The rectification module with thyristor is often used in the rectification circuit of linear motor driver, after controller switches on power, AC power is converted into direct supply by the rectifying part in rectification module, is then charged to the electric capacity being connected in parallel on DC bus two ends by the soft resistance that opens.When the voltage on electric capacity reaches certain value, controller controls thyristor and opens.After turn on thyristors, the soft resistance that opens is bypassed, and controller completes power up.But, when the fault of open circuit or short circuit appears in thyristor, and when controller cannot know the malfunction of thyristor, the damage of electric capacity can be caused, even may damage controller.
Summary of the invention
In view of the present situation of prior art, the object of the present invention is to provide a kind of transistors breakdown pick-up unit, make in the power up of controller, this transistors breakdown pick-up unit can judge thyristor whether fault, and send the duty of thyristor to controller, avoid the damage causing electric capacity and controller.
For achieving the above object, the present invention adopts following technical scheme:
A kind of transistors breakdown pick-up unit, comprises switch, the first switching control mechanism, voltage detection mechanism and breakdown judge mechanism;
Described switch and soft open resistant series after be connected in parallel on the two ends of thyristor;
The input end of described voltage detection mechanism connects described thyristor two ends respectively, for detecting the voltage difference at thyristor two ends; The output terminal of described voltage detection mechanism is electrically connected with the input end of described breakdown judge mechanism;
The output terminal of described breakdown judge mechanism is electrically connected with controller, and described first switching control mechanism is connected with described voltage detection mechanism.
Wherein in an embodiment, also comprise accessory power supply and second switch control gear;
The input end of described accessory power supply connects the negative electrode of described thyristor and the lower brachium pontis of DC bus respectively, and the output terminal of described accessory power supply is electrically connected with described second switch control gear;
The output terminal of described second switch control gear is electrically connected with described first switching control mechanism.
Wherein in an embodiment, described switch is open type switch.
Wherein in an embodiment, described switch is closed type switch.
Wherein in an embodiment, described breakdown judge mechanism comprises and compares testing agency and fault logic output mechanism;
The described input end comparing testing agency is electrically connected with the output terminal of described voltage detection mechanism, and the described output terminal comparing testing agency is electrically connected with the input end of described fault logic output mechanism;
The output terminal of described fault logic output mechanism is electrically connected with described controller.
Wherein in an embodiment, the described testing agency that compares is comparer.
Wherein in an embodiment, described breakdown judge mechanism is CPU;
The input end of described CPU is electrically connected with the output terminal of voltage detection mechanism, and the output terminal of described CPU is electrically connected with described controller.
Wherein in an embodiment, described CPU is single-chip microcomputer, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
The invention has the beneficial effects as follows:
Transistors breakdown pick-up unit of the present invention, judged the duty of thyristor by the voltage difference detecting thyristor two ends, and send the duty of thyristor to controller, controller makes corresponding protection according to the duty of thyristor.Which prevent driver to work on when transistors breakdown and the electric capacity even damage of controller that cause.And structure is simple, easy to use.
Accompanying drawing explanation
Fig. 1 is the system diagram of transistors breakdown pick-up unit Chang Kaifang formula one embodiment of the present invention;
Fig. 2 is the system diagram of another embodiment of transistors breakdown pick-up unit Chang Kaifang formula of the present invention;
Fig. 3 is the system diagram of transistors breakdown pick-up unit of the present invention normally closed mode one embodiment;
Fig. 4 is the system diagram of normally closed another embodiment of mode of transistors breakdown pick-up unit of the present invention.
Embodiment
In order to make technical scheme of the present invention clearly, below in conjunction with accompanying drawing, transistors breakdown pick-up unit of the present invention and method are described in further detail.Should be appreciated that specific embodiment described herein only in order to explain that the present invention is not intended to limit the present invention.
See Fig. 1 to Fig. 4, this transistors breakdown pick-up unit is arranged between the electric capacity of rectification module A1 and its rear end.Wherein, rectification module A1 comprises rectification circuit and thyristor VT1, and rectification circuit forms rectifier bridge, for AC power is converted into direct supply by six diode V1 ~ V6.Thyristor VT1 is arranged on the upper brachium pontis of DC bus, and namely the anode of thyristor VT1 is connected with the cathodic electricity of diode V1 ~ V3.
This transistors breakdown pick-up unit comprises K switch, the first switching control mechanism U0, voltage detection mechanism U1 and breakdown judge mechanism.Wherein, K switch opens with soft the two ends being connected in parallel on thyristor VT1 after resistance R connects.Namely soft one end of opening resistance R is electrically connected with the anode of thyristor VT1, and one end of the soft other end and K switch that open resistance R is electrically connected, and the other end of K switch connects the negative electrode of thyristor VT1.First switching control mechanism U0 connects with voltage detection mechanism U1, and for after electricity on the controller, gauge tap K is in closure state; After the capacitor charging of rear end completes, gauge tap K is in open mode.
Two input ends of voltage detection mechanism U1 connect the two ends of thyristor VT1 respectively, and namely one of them input end of voltage detection mechanism connects the anode of thyristor VT1, and another input end of voltage detection mechanism connects the negative electrode of thyristor VT1.The output terminal of voltage detection mechanism U1 connects the input end of breakdown judge mechanism, the output terminal connection control device of breakdown judge mechanism.
Voltage detection mechanism U1 for detecting the voltage difference V0 at thyristor VT1 two ends, and sends this voltage difference V0 to breakdown judge mechanism.Breakdown judge mechanism analyzes the duty of thyristor VT1 according to the voltage difference V0 at the thyristor two ends received, and sends the duty of thyristor VT1 to controller.It should be understood that the duty of thyristor VT1 herein comprises that thyristor normally works, thyristor open circuit and thyristor short circuit.
Different according to the type of K switch, this transistors breakdown pick-up unit can be divided into the transistors breakdown pick-up unit of Chang Kaifang formula and the transistors breakdown pick-up unit of normally closed mode.
Be the system diagram of the Chang Kaifang formula of transistors breakdown pick-up unit of the present invention as depicted in figs. 1 and 2, wherein, K switch is open type switch and connects with the soft resistance R that opens.When controller does not power on, K switch is in open mode.After controller powers on, the first switching control mechanism U0 gauge tap K closes.After rear end capacitor charging completes, the first switching control mechanism U0 gauge tap K opens.
As a kind of embodiment, in the embodiment of the Chang Kaifang formula of this transistors breakdown pick-up unit, also comprise accessory power supply U4 and second switch control gear U5.Two input ends of accessory power supply U4 are connected to the negative electrode of thyristor VT1 and the lower brachium pontis of DC bus respectively.The output terminal of accessory power supply U4 connects the input end of second switch control gear U5, and the output terminal of second switch control gear U5 connects the first switching control mechanism U0.
Accessory power supply U4 is used for when busbar voltage reaches certain voltage value (being generally less than the magnitude of voltage of normal work) for controller provides power supply, and exports the normal working signal of accessory power supply U4.Second switch control gear U5 exports control signal after receiving the normal working signal of accessory power supply U4, and sends this control signal to first power control structure U0, and the first switching control mechanism U0 gauge tap K recovers the state opened.
Be illustrated in figure 1 the system diagram of an embodiment of transistors breakdown pick-up unit Chang Kaifang formula of the present invention, wherein, breakdown judge mechanism comprises and compares testing agency U2 and fault logic output mechanism U3.And the output terminal of the input end and voltage detection mechanism U1 that compare testing agency U2 is electrically connected, the output terminal comparing testing agency U2 is electrically connected with the input end of fault logic output mechanism U3.Preferably, comparing testing agency U2 is comparer.The output terminal of fault logic output mechanism U3 is electrically connected with controller, makes controller can know the duty of thyristor and make corresponding protection act.
When the voltage difference V0 at thyristor VT1 two ends is greater than the predeterminated voltage difference V1 comparing testing agency U2, compare testing agency U2 output logic level a, wherein, logic level a can be high level or low level.When the voltage difference V0 at thyristor VT1 two ends is less than the predeterminated voltage difference V1 comparing testing agency U2, compare testing agency U2 output logic level such as, as V0 > V1, comparing testing agency U2 output logic level is 1, then, as V0 < V1, the output logic level comparing testing agency U2 is 0.
Fault logic output mechanism U3 judges the duty of thyristor according to the logic level that the comparison testing agency U2 received exports, and sends the duty of thyristor to controller.When thyristor VT1 normally works, in process electric on the controller, thyristor VT1 is bypassed, and now the voltage difference V0 at thyristor two ends is comparatively large, V0 > V1.After controller has powered on, K switch has been opened, and controller controls thyristor VT1 conducting, and now, the voltage difference V0 at thyristor two ends can be decreased to gradually close to 0V, V0 < V1.Therefore, when thyristor VT1 normally works, voltage detection mechanism U1 first output logic level a, rear output logic level
Now, fault logic output mechanism U3 correspondence exports two-way level value.As the first output logic level a of voltage detection mechanism U1, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level c of fault logic output mechanism U3.
When output logic level after voltage detection mechanism U1 time, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level of fault logic output mechanism U3
When thyristor VT1 open circuit, the voltage difference V0 at thyristor two ends is greater than the predeterminated voltage difference V1 comparing testing agency U2 all the time, and the output of comparing testing agency U2 is always logic level a.Now, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level c of fault logic output mechanism U3.
When thyristor VT1 short circuit, the voltage difference V0 at thyristor two ends is close to 0V, and the voltage difference V0 at thyristor two ends is less than the predeterminated voltage difference V1 comparing testing agency U2 all the time, and the output of comparing testing agency U2 is always logic level now, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level of fault logic output mechanism U3
In sum, when thyristor VT1 normally works, the level value that Logic judgment mechanism exports exists by logic level c to logic level hopping phenomenon.When thyristor VT1 open circuit, the level that Logic judgment mechanism exports is always level c.When thyristor VT1 short circuit, the level that Logic judgment output mechanism exports is always the level value that controller transmits according to Logic judgment mechanism, judges the duty of thyristor.
Be illustrated in figure 2 the system diagram of another embodiment of transistors breakdown pick-up unit Chang Kaifang formula of the present invention.Wherein, breakdown judge mechanism is CPU.And the input end of CPU is electrically connected with the output terminal of voltage detection mechanism U1, the output terminal of CPU is electrically connected with controller.Preferably, CPU can be single-chip microcomputer, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
When thyristor VT1 normally works, voltage detection mechanism U1 first output logic level a, rear output level when thyristor VT1 open circuit, voltage detection mechanism U1 is output logic level a all the time.When thyristor VT1 short circuit, voltage detection mechanism U1 is output logic level all the time like this, the level value that CPU can export according to voltage detection mechanism U1, judges the duty of thyristor, and sends the duty of thyristor to controller.
Be the system diagram of the normally closed mode of transistors breakdown pick-up unit of the present invention as shown in Figure 3 and Figure 4, wherein, K switch is closed type switch and connects with the soft resistance R that opens.When controller does not power on, K switch is in closure state.After controller powers on, K switch is still in closure state.After rear end capacitor charging completes, the first switching control mechanism U0 gauge tap K opens.
Be illustrated in figure 3 the system diagram of an embodiment of the normally closed mode of transistors breakdown pick-up unit of the present invention, wherein, breakdown judge mechanism comprises and compares testing agency U2 and fault logic output mechanism U3.And the input end comparing testing agency U2 is electrically connected with the output terminal of voltage check device U1, the output terminal comparing testing agency U2 is electrically connected with the input end of fault logic output mechanism U3.Preferably, this compares testing agency U2 is comparer.The output terminal of fault logic output mechanism U3 is electrically connected with controller, makes controller can know the duty of thyristor and make corresponding protection act.
When the voltage difference V0 at thyristor VT1 two ends is greater than the predeterminated voltage difference V1 comparing testing agency U2, compare testing agency U2 output logic level a, wherein, logic level a can be high level or low level.When the voltage difference V0 at thyristor VT1 two ends is less than the predeterminated voltage difference V1 comparing testing agency U2, compare testing agency U2 output logic level such as, as V0 > V1, comparing testing agency U2 output level is 1, then, as V0 < V1, the output level comparing testing agency U2 is 0.
The duty of the electrical level judging thyristor that fault logic output mechanism U3 exports according to the comparison testing agency U2 received, and send the duty of thyristor to controller.When thyristor VT1 normally works, in process electric on the controller, thyristor VT1 is bypassed, and now the voltage difference V0 at thyristor two ends is comparatively large, V0 > V1.After controller has powered on, K switch has been opened, and controller controls thyristor VT1 conducting, and now, the voltage difference V0 at thyristor two ends can be decreased to gradually close to 0V, V0 < V1.Therefore, when thyristor VT1 normally works, the first output level a of voltage detection mechanism U1, rear output level
Now, fault logic output mechanism U3 correspondence exports two-way level value.As the first output logic level a of voltage detection mechanism U1, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level c of fault logic output mechanism U3.
When output logic level after voltage detection mechanism U1 time, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level of fault logic output mechanism U3
When thyristor VT1 open circuit, the voltage difference V0 at thyristor two ends is greater than the predeterminated voltage difference V1 comparing testing agency U2 all the time, and the output of comparing testing agency U2 is always logic level a.Now, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level c of fault logic output mechanism U3.
When thyristor VT1 short circuit, the magnitude of voltage V0 at thyristor two ends is close to 0V, and the voltage difference V0 at thyristor two ends is less than the predeterminated voltage difference V1 comparing testing agency U2 all the time, and the output of comparing testing agency U2 is always level now, a wherein road output logic level b(logic level b of fault logic output mechanism U3 can be high level or low level) and the value of this logic level b is locked.And logic level wherein Vu3 represents the original levels of fault logic output mechanism U3.Another road output logic level of fault logic output mechanism U3
In sum, when thyristor VT1 normally works, the level value that Logic judgment mechanism exports exists by logic level c to logic level hopping phenomenon.When thyristor VT1 open circuit, the level that Logic judgment mechanism exports is always logic level c.When thyristor VT1 short circuit, the level that Logic judgment output mechanism exports is always logic the level value that controller transmits according to Logic judgment mechanism, judges the duty of thyristor.
Be illustrated in figure 4 the system diagram of another embodiment of transistors breakdown pick-up unit Chang Kaifang formula of the present invention.Wherein, breakdown judge mechanism is CPU.And the input end of CPU is electrically connected with the output terminal of voltage detection mechanism U1, the output terminal of CPU is electrically connected with controller.Preferably, CPU can be single-chip microcomputer, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
When thyristor VT1 normally works, voltage detection mechanism U1 first output logic level a, rear output logic level when thyristor VT1 open circuit, voltage detection mechanism U1 is output logic level a all the time.When thyristor VT1 short circuit, voltage detection mechanism U1 is output logic level all the time like this, the level value that CPU can export according to voltage detection mechanism U1, judges the duty of thyristor, and sends the duty of thyristor to controller.
Transistors breakdown pick-up unit of the present invention, judged the duty of thyristor by the voltage difference detecting thyristor two ends, and send the duty of thyristor to controller, controller makes corresponding protection according to the duty of thyristor.Which prevent driver to work on when transistors breakdown and the electric capacity even damage of controller that cause.And structure is simple, easy to use.
The above embodiment only have expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.

Claims (8)

1. a transistors breakdown pick-up unit, is characterized in that:
Comprise switch, the first switching control mechanism, voltage detection mechanism and breakdown judge mechanism;
Described switch and soft open resistant series after be connected in parallel on the two ends of thyristor;
The input end of described voltage detection mechanism connects described thyristor two ends respectively, for detecting the voltage difference at thyristor two ends; The output terminal of described voltage detection mechanism is electrically connected with the input end of described breakdown judge mechanism;
The output terminal of described breakdown judge mechanism is electrically connected with controller, and described first switching control mechanism is connected with described voltage detection mechanism.
2. transistors breakdown pick-up unit according to claim 1, is characterized in that:
Also comprise accessory power supply and second switch control gear;
The input end of described accessory power supply connects the negative electrode of described thyristor and the lower brachium pontis of DC bus respectively, and the output terminal of described accessory power supply is electrically connected with the input end of described second switch control gear;
The output terminal of described second switch control gear is electrically connected with described first switching control mechanism.
3. transistors breakdown pick-up unit according to claim 2, is characterized in that:
Described switch is open type switch.
4. transistors breakdown pick-up unit according to claim 1, is characterized in that:
Described switch is closed type switch.
5. the transistors breakdown pick-up unit according to any one of claim 1-4, is characterized in that:
Described breakdown judge mechanism comprises and compares testing agency and fault logic output mechanism;
The described input end comparing testing agency is electrically connected with the output terminal of described voltage detection mechanism, and the described output terminal comparing testing agency is electrically connected with the input end of described fault logic output mechanism;
The output terminal of described fault logic output mechanism is electrically connected with described controller.
6. transistors breakdown pick-up unit according to claim 5, is characterized in that:
The described testing agency that compares is comparer.
7. the transistors breakdown pick-up unit according to any one of claim 1-4, is characterized in that:
Described breakdown judge mechanism is CPU;
The input end of described CPU is electrically connected with the output terminal of voltage detection mechanism, and the output terminal of described CPU is electrically connected with described controller.
8. transistors breakdown pick-up unit according to claim 7, is characterized in that:
Described CPU is single-chip microcomputer, DSP, ARM, CPLD, FPGA or other programmable microprocessors.
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CN102207531A (en) * 2011-03-08 2011-10-05 深圳和而泰智能控制股份有限公司 Silicon controlled rectifier state detection method, apparatus and circuit for adjusting AC load power
CN102998620A (en) * 2012-12-17 2013-03-27 哈尔滨工业大学 Device and method for quick online fault detection of high voltage thyristor valve block
CN203705598U (en) * 2013-12-20 2014-07-09 中国科学院宁波材料技术与工程研究所 Thyristor fault detection device

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CN105425134A (en) * 2015-12-18 2016-03-23 马鞍山钢铁股份有限公司 Rolling mill main transmission system AC - AC frequency converter abnormal thyristor assembly determination method
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CN106711945B (en) * 2016-10-19 2018-10-19 许继集团有限公司 A kind of blocking device and diagnostic method of tape jam diagnostic function
CN106841966A (en) * 2016-12-28 2017-06-13 广东高标电子科技有限公司 A kind of method and system of the switching tube fault detect of controller for electric vehicle
CN109061427A (en) * 2017-08-10 2018-12-21 上海英奇电气科技有限公司 A kind of thyristor detection method of semi-conductor electricity machine-cut resistance controller
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CN108011357B (en) * 2017-12-26 2019-04-05 保定尤耐特电力科技有限公司 A kind of thyristor groups string protective device and method
CN109507487A (en) * 2018-11-21 2019-03-22 华自科技股份有限公司 Thyristor triggering impulse signal deteching circuit
CN110208670A (en) * 2019-05-27 2019-09-06 南京理工大学 The quick fault testing device of series thyristor
CN111220929A (en) * 2020-03-04 2020-06-02 珠海格力电器股份有限公司 Control circuit capable of realizing short circuit detection and short circuit detection method thereof
CN111220929B (en) * 2020-03-04 2021-04-23 珠海格力电器股份有限公司 Control circuit capable of realizing short circuit detection and short circuit detection method thereof
CN112394269A (en) * 2020-11-16 2021-02-23 中冶赛迪电气技术有限公司 Thyristor fault diagnosis system of AC-AC frequency conversion device
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CN114859197A (en) * 2022-04-06 2022-08-05 国网江苏省电力有限公司电力科学研究院 Online monitoring device and method for thyristor aging evaluation

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