CN104678279A - System and method for testing connecting slot by using testing vector - Google Patents
System and method for testing connecting slot by using testing vector Download PDFInfo
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- CN104678279A CN104678279A CN201310628308.6A CN201310628308A CN104678279A CN 104678279 A CN104678279 A CN 104678279A CN 201310628308 A CN201310628308 A CN 201310628308A CN 104678279 A CN104678279 A CN 104678279A
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Abstract
The invention discloses a system and method for testing a connecting slot by using a testing vector. According to the method, the connecting slot is tested by using the testing vector through analyzing connecting circuit information of the connecting slot of a target circuit board and after generating the testing vector according to the connecting circuit information, and whether the connecting slot is a normal technical measure is judged according to the testing result, so that pins having faults on the connecting slot can be rapidly detected, and the technical effect of shortening the detecting time of the connecting slot can be achieved.
Description
Technical field
The present invention relates to a kind of connection insertion groove investigating system and method thereof, mean a kind of system and the method thereof that use test vector test to connect slot especially.
Background technology
On the production line of current circuit board, be carry out functional test mostly to the test of the connection slot (slot) of circuit board.For the connection slot of motherboard and storer, after the main element assembling of motherboard, the connection slot of circuit board inserts corresponding storer, and allow motherboard come into operation, afterwards, the device comprising this motherboard in the operating system run perform testing software, and motherboard when testing software detects that storer is abnormal, can be delivered maintenance station maintenance by tester.
When maintenance personal takes the abnormal motherboard of storer, usually first can change storer, execute store testing software in the operating system then run at the device comprising this motherboard, uses the situation got rid of memory stick fault and cause memory exception.
When fault be not caused by storer time, there is physical connection fault in the connection slot of the storer often on expression motherboard, the core logic elements such as the central processing unit (CPU) namely on motherboard, storage buffer (Buffer) and the connecting circuit be connected between slot and/or weld has problems, or the power supply connected on slot and/or ground wire open circuit.
In practice, the logic element on testing circuit plate and the circuit be connected between slot or welding is wanted to be very loaded down with trivial details, maintenance personal needs to use suitable surveying instrument to measure welding and the connecting circuit of each the pin position (pin) connected on slot one by one, uses welding or connecting circuit generation problem which pin position judgement is.Because the stitch connecting the regular size of slot is at present mostly very many, such as 168 pin positions, 184 pin positions, 200 pin positions, 240 pin positions etc., carrying out detection to each pin position one by one will the at substantial time.
In sum, since known prior art is medium-term and long-term, there is the problem that efficiently cannot detect the pin position connecting slot generation problem always, be therefore necessary the technological means proposing to improve, solve this problem.
Summary of the invention
Because prior art exists the problem that efficiently cannot detect the pin position connecting slot generation problem, the present invention discloses a kind of system and the method thereof that use test vector test to connect slot then, wherein:
Use test vector test disclosed by the present invention connects the system of slot, and at least comprise: at least one proving installation, each proving installation connects from the different connection slots of objective circuit plate respectively; Model building module, wherein more comprise circuit analysis unit in order to analyze the connecting circuit information connecting slot and in order to produce according to connecting circuit information test vector to production units; Testing control module, in order to connect slot according to test vector test, and obtains corresponding result vector by proving installation; Results analyses module, in order to judge that according to result vector whether the circuit connecting slot is normal.
Use test vector test disclosed by the present invention connects the method for slot, and its step at least comprises: the connecting circuit information of the connection slot of evaluating objects circuit board; Test vector is produced according to connecting circuit information; Connecting test device be connected slot; Connect slot according to test vector test, and obtain corresponding result vector by proving installation; Judge that whether the circuit connecting slot is normal according to result vector.
System and method for disclosed by the present invention as above, and the difference between prior art is the connecting circuit information of the present invention by the connection slot of evaluating objects circuit board, and after producing test vector according to connecting circuit information, test vector is used to test connection slot, and whether judge to connect slot according to test result normal, use the problem solved existing for prior art, and the technology effect shortening the detection time connecting slot can be reached.
Accompanying drawing explanation
The element schematic of the proving installation that Fig. 1 carries for the present invention.
The system architecture diagram of the use test vector test connection slot that Fig. 2 carries for the present invention.
The method flow diagram of the use test vector test connection slot that Fig. 3 A carries for the present invention.
The method detailed process flow diagram of the test connection slot that Fig. 3 B carries for the present invention.
[symbol description]
101 proving installations
110 connecting pin positions
150 scanning logic elements
200 control device
210 model building modules
211 circuit analysis unit
215 to production units
219 interactive dispensing units
230 testing control module
250 results analyses module
400 objective circuit plates
420 core logic elements
460 connect slot
Embodiment
Graphic and embodiment below will be coordinated to describe feature of the present invention and embodiment in detail, content is enough to enable any those skilled in the art fully understand the technological means that technical solution problem of the present invention is applied easily and implement according to this, realizes the attainable effect of the present invention by this.
The present invention can test the circuit of the connection slot (slot) be connected with proving installation, and judges that whether tested connection slot is normal according to the result of test result.
Wherein, proving installation 101 as shown in Fig. 1, at least comprises connecting pin position (pin) 110 and scanning logic element 150.
Connecting pin position 110 is used for connecting test device 101 and the objective circuit plate 400 comprising the tested connection slot 460 of needs.Generally speaking, connecting pin position 110 can be inserted and be connected in slot 460, and proving installation 101 is connected with objective circuit plate 400.
In the embodiment of part, connecting pin position 110 is golden finger (Golden Finger), but the present invention is not as limit, all corresponding with the connection slot 460 of objective circuit plate 400, and can allow proving installation 101 be connected element that slot 460 connects and can become the connecting pin position 110 that the present invention carries.
Scanning logic unit 150 is responsible for the electric signal being pushed to connecting pin position 110 being supplied to control device 200(" Fig. 2 " reference be connected with proving installation 101).Generally speaking, scanning logic unit 150 is directly connected with connecting pin position 110, but the present invention is not as limit, and scanning logic unit 150 also can be connected with connecting pin position 110 indirectly.
In order to more complete is described System Operation of the present invention, please refer to the system architecture diagram of the use test vector test connection slot that " Fig. 2 " the present invention carries.As shown in " Fig. 2 ", system of the present invention contains proving installation 101 and control device 200.Wherein, the explanation of proving installation 101 as above, therefore repeats no more.
The flow process controlling test is responsible for by control device 200, and test procedure is accomplished.Wherein, control device 200 more comprises model building module 210, testing control module 230 and results analyses module 250.
Model building module 210 is responsible for objective circuit plate 400 and sets up test model.Model building module 210 needs for each sets up test model for the objective circuit plate tested set connection slot, but the test model be established can be supplied to testing control module reuses.That is, model building module 210 only needs for a test model set up by multiple objective circuit plates of circuit identical (practice representing model is identical).
Model building module 210 more comprises circuit analysis unit 211 and to production units 215.In the embodiment of part, model building module 210 more can comprise attached interactive dispensing unit 219.
Circuit analysis unit 211 is responsible for the connecting circuit information analyzing the one or more connection slots be arranged on objective circuit plate 400.In the embodiment of part, circuit analysis unit 211 can open the circuit design file such as the Layout of objective circuit plate 400, and to the data analysis in opened circuit design file, use the information obtaining the core logic element 420 on objective circuit plate 400 and all connecting lines be connected between slot 460, this information is called as " connecting circuit information " in the present invention.Wherein, circuit analysis unit 211 can use the circuit design file of existing technical Analysis objective circuit plate 400, but the present invention is not as limit.
Test vector is organized in the connecting circuit information generation of being responsible for producing according to circuit analysis unit 211 to production units 215 more, is also responsible for producing the anticipatory data corresponding with each group of test vector.Wherein, test vector can be produced according to existing various algorithm to production units 215.
Each the group test vector produced to production units 215 represents multiple test signal, after test signal represented by same group of test vector is pushed to the core logic element 420 of objective circuit plate 400, the combination of one or more consequential signals that core logic element 420 exports under normal operation is the result vector that the present invention carries.
In the embodiment of part, the test vector produced to production units 215 is boundary scan testing vector, each test signal represented by boundary scan testing vector can be pushed to corresponding boundary scan cell (BSC) (not shown), these boundary scan cells are included in the core logic element 420 of objective circuit plate 400, connect with the corresponding pin position of core logic element 420.
Interactive dispensing unit 219 is responsible for when the proving installation 101 be connected with objective circuit plate 400 is more than one, according to the order of connection of each proving installation, setting order of connection parameter, makes to produce to production units 215 according to the connecting circuit information that the order of connection parameter set by interactive dispensing unit 219 and circuit analysis unit 211 produce to organize test vector more.
Testing control module 230 is connected with the core logic element 420 of objective circuit plate 400, also be connected with the scanning logic unit 150 of proving installation 101, be responsible for the connection slot 460 according to the test vector test target circuit board 400 produced to production units 215 in model building module 210.Wherein, testing control module 230 can be connected with the boundary scan cell of core logic element 420, and testing control module 230 also can be connected with the boundary scan cell of scanning logic unit 150, but the present invention is not as limit.
In the embodiment of part, testing control module 230 sequentially can produce each corresponding control signal according to the test signal represented by each group of test vector, and sequentially by the produced control signal core logic element 420 pushing objective circuit plate 400 a group by a group, that is, each control signal produced according to same group of test vector can be pushed to core logic element 420 by testing control module 230 together, and the different input pin positions of core logic element 420 can be pushed to according to each test signal that same group of test vector produces, so, core logic element 420 is after each test signal produced according to same group of test vector carries out logical process, the multiple consequential signals corresponding with this group test vector are exported by the output pin position of core logic element 420, produced consequential signal is made to be pushed to the input pin position of the connection slot 460 of the objective circuit plate 400 be connected with each output pin position.Wherein, corresponding with one group of test vector multiple consequential signals are called as one group of result vector in the present invention.
Testing control module 230 also can the clock signal required for core logic element 420 of simulated target circuit board 400, and the clock signal that simulation produces is pushed to core logic element 420, make core logic element 420 to operate smoothly and to push the connection slot 460 of produced consequential signal to objective circuit plate 400.
Many groups result vector that the connection slot 460 that testing control module 230 is also responsible for obtaining objective circuit plate 400 by proving installation 101 exports, directly the signal being pushed to input pin position can be exported by output pin position owing to connecting slot 460, so, the signal that connection slot 460 exports is the multiple consequential signals corresponding with each group of test vector of the core logic element 420 being pushed to objective circuit plate 400, so, the result vector that the connection slot 460 of objective circuit plate 400 exports is by the connecting pin position 110 of proving installation 101 after being pushed to the scanning logic element 150 of proving installation 101, received result vector can be supplied to testing control module 230 by scanning logic element 150, testing control module 230 can be obtained and connect each group of result vector exporting of slot 460.
In addition, the scanning logic element 150 that the result vector that testing control module 230 obtains also comprises proving installation 101 directly reads the value of the grounding leg position of the connection slot 460 of objective circuit plate 400, and/or the value of the power supply pin of the connection slot 460 of objective circuit plate 400 that scanning logic unit 150 is obtained by analogy digital quantizer (ADC) (not shown).
In addition, when objective circuit plate 400 has multiple connection slot 460, and exist multiple proving installation 101 with two or more be connected slot 460 connect time, each proving installation 101 is except being connected side by side with testing control module 230 respectively, testing control module 230 and each proving installation 101 also can use the mode of tandem to be connected, that is, testing control module 230, scanning logic element 150 on each proving installation 101, and core logic element 420 is serially connected, wherein, the tdi signal pin of testing control module 230 is connected with the tdi signal pin of core logic element 420, the tdo signal pin of core logic element 420 is connected with the tdi signal pin of one of them scanning logic element 150, the tdo signal pin of this scanning logic element 150 is connected with the tdi signal pin of another scanning logic element 150, the tdo signal pin of last scanning logic element 150 is then connected with the tdo signal pin of testing control module 230.
Therefore, when testing control module 230 is connected with each proving installation 101 tandem, the one group of test vector produced to production units 215 comprises the paragraph corresponding with core logic element 420, and the paragraph corresponding with the scanning logic element 150 on each proving installation 101, wherein, the quantity of the boundary scan cell on the length of the paragraph corresponding with core logic element 420 and core logic element 420 is identical, similar, the length of each corresponding with each scanning logic element 150 respectively paragraph also can be identical with the quantity of the boundary scan cell on corresponding scanning logic element 150.Wherein, the test vector produced to production units 215 can allow testing control module 230 produce the control signal of the control signal comprising the boundary scan cell (namely the tdi signal pin of core logic element 420) sending core logic element 420 to and the boundary scan cell (namely the tdi signal pin of scanning logic element 150) sending each proving installation 101 to, simultaneously, testing control module 230 also can arrange the boundary scan cell of core logic element 420 and the boundary scan cell of each proving installation 101, and identification code corresponding to each boundary scan cell give, such as serial number, but the present invention is not as limit.
When testing control module 230 pushes control signal according to one group of test vector, the control signal of this boundary scan cell can be sent to according to propelling movement with putting in order of boundary scan cell, so, after the control signal that core logic element 420 receives by boundary scan cell, test signal can be exported to connection slot 460, test signal is made to arrive at scanning logic element 150 respectively by the connecting pin position of each proving installation 101, and by tdo signal pin output result signal, so, testing control module 230 just can receive the result vector that the consequential signal that exported by the tdo signal pin of each scanning logic element 150 forms.
In the embodiment of part, too small to such an extent as to be not easy to use connection line to connect each proving installation in order to avoid connecting spacing between slot 460, the present invention more can comprise one can the connecting circuit board (not shown) of connecting test control module 230 and each proving installation 101 simultaneously.This connecting circuit board can comprise multiple slot being used to provide each proving installation 101 and connecting, and proving installation 101 can be inserted in connecting circuit board.
Results analyses module 250 is responsible for judging that whether the circuit of the connection slot 460 of objective circuit plate 400 is normal according to the result vector received by testing control module 230.In the embodiment of part, results analyses module 250 can use and produce to production units 215 circuit that the corresponding existing diagnosis scheme of the algorithm of test vector judges to connect slot 460 in model building module 210, such as, results analyses module 250 can produce anticipatory data by the algorithm producing test vector to production units 215, and judge that whether the circuit being connected slot 460 is normal by comparison anticipatory data and result vector, such as, the actual value of the identifier of each boundary scan cell in the desired value of the identifier of each boundary scan cell and result vector in comparison anticipatory data, and when comparison result is all identical, judge that the circuit connecting slot 460 is normal, and when having the desired value of any one boundary scan cell different from actual value, judge that the circuit connecting slot 460 is abnormal, can obtain according to the boundary scan cell different with actual value from desired value to be connected in slot 460 simultaneously and produce abnormal pin position, and in the embodiment of another part, results analyses module 250 is used for the anticipatory data that uses of comparison result vector and also can produces by production units 215.But the whether normal mode of circuit that results analyses module 250 judges to connect slot 460 according to result vector is not limited with above-mentioned.
Then explain orally operation system of the present invention and method with an embodiment, and please refer to the method flow diagram of the use test vector test connection slot that " Fig. 3 A " the present invention carries.In the present embodiment, hypothetical target circuit board 400 is motherboard, and core logic element 420 is central processing unit (CPU) and storage buffer (Buffer), and connecting slot 460 is memory bank, but the present invention is not as limit.
Before tester tests for the connection slot of use the present invention to objective circuit plate 400, if model building module 210 did not set up the test model corresponding with objective circuit plate 400 to be tested, then model building module needed the test model first setting up objective circuit plate 400 to be tested.
First, the circuit analysis unit 211 in model building module 210 can the connecting circuit information (step 310) of connection slot 460 of evaluating objects circuit board 400.In the present embodiment, suppose that tester can by circuit design file input circuit analytic units 211 such as the Layout of objective circuit plate 400, circuit analysis unit 211 can analyze the circuit design file be transfused to, and obtains the connecting circuit information such as the core logic element 420 of objective circuit plate 400 and the quantity of the connecting line be connected between slot 460 and connecting pin position after analysis.
Then, the connecting circuit information that can obtain according to the circuit analysis unit 211 in model building module 210 to production units 215 in model building module 210 produces organizes test vector (step 320) more.In the present embodiment, suppose to use the algorithms such as maximum independent algorithm, walking 0 algorithm or walking 1 algorithm to produce test vector to production units 215.
In model building module 210 produce test vector (step 320) to production units 215 according to connecting circuit information after, model building module 210 just completes the foundation of test model, and tester can start to test the connection slot 460 of objective circuit plate 400 to be tested.In addition, if the test model corresponding with objective circuit plate 400 to be tested is set up by model building module 210, then tester also can directly start to test the connection slot 460 of objective circuit plate 400 to be tested, and model building module 210 is without the need to setting up the test model corresponding with objective circuit plate 400 to be tested.
The test model corresponding when the objective circuit plate 400 with to be tested is set up by model building module 210, then tester can start to test the connection slot 460 of objective circuit plate 400 to be tested.
Now, tester needs first connect the proving installation 101 corresponding with the connection slot 460 of objective circuit plate 400 to be tested and be connected slot 460(step 330).In the present embodiment, suppose that the connecting pin position 110 of proving installation 101 is golden finger, golden finger can insert and connect in slot 460 by tester, uses connecting test device 101 and is connected slot 460.
Afterwards, testing control module 230 can be tested connection slot 460 according to each group of test vector produced to production units 215 in model building module 210, and by obtaining the result vector (step 370) corresponding with each group of test vector with the proving installation 101 that the connection slot 460 of objective circuit plate 400 connects.In the present embodiment, suppose that testing control module 230 can select the pin positions such as pin position to test respectively to the import and export pin position of the connection slot 460 of objective circuit plate 400, ground connection (VSS) pin position, power supply pin and bus address.
When the import and export pin position of the connection slot 460 of testing control module 230 pairs of objective circuit plates 400 is tested, testing control module 230 sequentially can produce the control signal corresponding with the specific input pin position of the control core logic element 420 of objective circuit plate 400 according to each the group test vector produced to production units 215 in model building module 210, and the specific input pin position of the correspondence control signal produced according to same group of test vector being together pushed to control core logic element 420, make the specific output pin position output result signal of core logic element 420 to connection slot 460(step 372), so, scanning logic element 150 in proving installation 101 just can by be connected golden finger that slot 460 connects and obtain result vector by connecting slot 460, and can obtained result vector be sent to testing control module 230.Wherein, the result vector that exports of core logic element 420 is corresponding with the test vector producing pushed control signal.
When the power supply pin of the connection slot 460 of testing control module 230 pairs of objective circuit plates 400 and bus address select pin position to test, testing control module 230 can analog digital analogy converter (DAC) produce clock signal, and produced clock signal is pushed to the corresponding input pin position (step 376) of control core logic element 420, the specific output pin position of core logic element 420 is made to export corresponding power supply signal to connection slot 460 according to clock signal, so, obtained power supply signal can be converted to corresponding potential value (consequential signal) by analogy digital quantizer (ADC) by the scanning logic element 150 in proving installation 101, and then the result vector obtained by connecting slot 460, and can obtained result vector be sent to testing control module 230.
When the grounding leg position of the connection slot 460 of testing control module 230 pairs of objective circuit plates 400 is tested, testing control module 230 can ask the value of the grounding leg position connecting slot 460 directly to the scanning logic element 150 of proving installation 101, so, scanning logic unit 150 just directly can read the value (step 378) of the grounding leg position connecting slot 460, and read value is returned to testing control module 230.
Test according to the connection slot 460 of test vector to objective circuit plate 400 in testing control module 230; and by with connect after the proving installation 101 that connects of slot 460 obtains the result vector (step 370) corresponding with each group of test vector, whether the circuit that results analyses module 250 can judge connection slot 460 according to result vector normally or have exception (step 390).In the present embodiment, suppose that results analyses module 250 can use and producing the corresponding diagnosis scheme of test vector to production units 215 to judge to connect the circuit of slot 460 normal or abnormal in model building module 210.
In the above-described embodiment, if tester's objective circuit plate 400 is provided with multiple connection slot 460, and tester wishes that connecting slot 460 to each tests simultaneously, then interactive dispensing unit 219 can provide tester to set number of connection parameter, namely with the quantity being connected the proving installation 101 that slot 460 connects, afterwards, the connecting circuit information that can produce according to circuit analysis unit 211 to production units 215 and interactive dispensing unit 219 provide the number of connection parameter of setting to produce test vector (step 320).So, a proving installation 101(step 330 is connected for each connects on slot 460 tester) after, testing control module 250 can be tested (step 370) all connection slots 460 according to the test vector produced to production units 215 equally simultaneously.
And if above-mentioned multiple proving installations 101 are connected with testing control module 250 tandem by tester, then tester also needs to set the order of connection between each proving installation 101 by interactive configuration module 219, so, when testing control module 250 tests (step 370) to all connection slots 460 according to the test vector produced to production units 215 simultaneously, the output signal of the preceding proving installation of the order of connection just can become the input signal of the posterior proving installation of the order of connection.
So, pass through the present invention, according to the analysis result of results analyses module 250, tester can learn that whether the circuit of the connection slot 460 of objective circuit plate 400 is normal, and when connecting the circuit abnormality of slot 460, the analysis result that tester also can produce according to results analyses module 250 judges it is that the connecting line of which pin position is abnormal fast.
In sum, difference between known the present invention and prior art is the connecting circuit information of the connection slot with evaluating objects circuit board, and after producing test vector according to connecting circuit information, test vector is used to test connection slot, and judge to connect the whether normal technological means of slot according to test result, the problem that efficiently cannot detect the pin position connecting slot generation problem existing for prior art can be solved by this technological means, and then reach the technology effect shortening the detection time connecting slot.
Moreover, use test vector test of the present invention connects the method for slot, can be implemented in the combination of hardware, software or hardware and software, the dispersing mode that also can realize or intersperse among with different elements the computer system of some interconnection in computer systems, which in a centralised manner realizes.
Although the embodiment disclosed by the present invention as above, only described content is also not used to directly limit scope of patent protection of the present invention.Any the technical staff in the technical field of the invention, under the prerequisite not departing from the spirit and scope disclosed by the present invention, to the formal of enforcement of the present invention and details being done a little change retouching, all belongs to scope of patent protection of the present invention.Scope of patent protection of the present invention, still must be as the criterion with the appending claims person of defining.
Claims (10)
1. use test vector to test the system connecting slot, it is characterized in that, this system at least comprises:
At least one proving installation, each this proving installation connects from the different connection slots of an objective circuit plate respectively;
One model building module, wherein more comprises:
One circuit analysis unit, in order to analyze a connecting circuit information of respectively this connection slot; And
One to production units, organizes test vector in order to produce according to this connecting circuit information more;
One testing control module, connects slot in order to test those according to those test vectors, and obtains corresponding multiple result vectors by each this proving installation; And
According to those result vectors, one results analyses module, in order to judge that whether the circuit of respectively this connection slot is normal.
2. the system using test vector test to connect slot as claimed in claim 1, it is characterized in that, this testing control module produces corresponding each control signal according to those test vectors, and sequentially those control signals are pushed a core logic element of this objective circuit plate, make this core logic element export each result vector corresponding with those test vectors respectively to this connection slot at least one.
3. the as claimed in claim 1 system using test vector test to connect slot, is characterized in that, this testing control module is more in order to simulate a clock signal and this clock signal to be pushed a core logic element of this objective circuit plate.
4. the system using test vector test to connect slot as claimed in claim 1, it is characterized in that, this model building module more comprises an interactive dispensing unit, in order to the order of connection according to those proving installations, set an order of connection parameter, this more organizes test vector in order to produce according to this order of connection parameter and this connecting circuit information to production units more.
5. use test vector to test the method connecting slot, it is characterized in that, the method at least comprises the following step:
Analyze the connecting circuit information that one of an objective circuit plate connects slot;
Produce according to this connecting circuit information and organize test vector more;
Connect a proving installation with one this be connected slot;
Test this connection slot according to those test vectors, and obtain corresponding multiple result vectors by this proving installation; And
Judge that whether the circuit of this connection slot is normal according to those result vectors.
6. the method using test vector test to connect slot as claimed in claim 5, it is characterized in that, the step of testing this connection slot according to those test vectors comprises and produces corresponding each control signal according to those test vectors, and sequentially those control signals are pushed a core logic element of this objective circuit plate, make this core logic element export the step of this result vector corresponding with this test vector to this connection slot.
7. the method using test vector test to connect slot as claimed in claim 5, it is characterized in that, the step of testing this connection slot according to those test vectors comprises simulation one clock signal and this clock signal is pushed the step of a core logic element of this objective circuit plate.
8. use test vector to test the method connecting slot, it is characterized in that, the method at least comprises the following step:
Analyze a connecting circuit information of multiple connection slots of an objective circuit plate;
Produce according to this connecting circuit information and organize test vector more;
Connect each proving installation and respectively this is connected slot;
The quantity set one number of connection parameter of the connection slot connected according to this proving installation;
Be connected slot according to the test of those test vectors with those, and obtain corresponding multiple result vectors by this proving installation; And
Judge that whether the circuit that those connect slot is normal according to those result vectors.
9. the method using test vector test to connect slot as claimed in claim 8, it is characterized in that, the method is before testing the step being connected slot with those according to those test vectors, more comprise and connect those proving installations, and according to the order of connection of those proving installations, set the step of an order of connection parameter.
10. the method using test vector test to connect slot as claimed in claim 8, it is characterized in that, the step of testing this connection slot according to those test vectors more comprises the step of the output signal of preceding for order of connection proving installation as the input signal of the posterior proving installation of the order of connection.
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| CN201310628308.6A CN104678279A (en) | 2013-11-29 | 2013-11-29 | System and method for testing connecting slot by using testing vector |
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| CN201310628308.6A CN104678279A (en) | 2013-11-29 | 2013-11-29 | System and method for testing connecting slot by using testing vector |
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