CN104251784A - Reliability accelerated testing method of combined stress of integrated mechanical and electrical product - Google Patents
Reliability accelerated testing method of combined stress of integrated mechanical and electrical product Download PDFInfo
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- CN104251784A CN104251784A CN201310260645.4A CN201310260645A CN104251784A CN 104251784 A CN104251784 A CN 104251784A CN 201310260645 A CN201310260645 A CN 201310260645A CN 104251784 A CN104251784 A CN 104251784A
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Abstract
The invention discloses a reliability acceleration testing method of a combined stress of an integrated mechanical and electrical product. The method comprises the following steps: determining failure distribution of integrated mechanical and electrical products based on numerical simulation; using a combined stress as an integrated accelerated stress and determining an integrated stress acceleration model; and calculating an integrated acceleration coefficient by using the numerical simulation. According to the invention, the combined stress is used as the integrated acceleration test stress and the failure distribution and the of the acceleration coefficient of the integrated mechanical and electrical product are determined by using the numerical simulation method, thereby solving problems that the failure distribution of the integrated mechanical and electrical product can not be determined, the acceleration coefficient calculation error is large, the integrated failure mechanism excited by the single stress is single, and the test efficiency is low.
Description
Technical field
The present invention relates to fail-test technical field, especially a kind of electronic product complete machine combined stress reliability accelerated test method.
Background technology
The reliability accelerated test of carrying out on electronic product complete machine is at present only the invalid cost obeys index distribution of simple hypothesis electronic product complete machine, select temperature, humidity, vibration or electric stress as single accelerated stress, test the complete machine failure mechanism inspired more single, test efficiency is low, and the accelerator coefficient calculated exists comparatively big error.
According to the demand in real work, industry needs in accelerated test, use the combined stress that more can excite product failure, and need to obtain invalid cost and the accelerator coefficient of electronic product complete machine by method more accurately, to solve the problem that complete machine failure mechanism is single, test efficiency is low that electronic product complete machine invalid cost cannot be determined, the accelerator coefficient error of calculation large, simple stress inspires.The present invention is with electronic product complete machine for subjects, by numerical simulation determination complete machine invalid cost and complete machine accelerator coefficient, product is applied to the method for comprehensive acceleration reliability accelerated test.
Summary of the invention
The object of the present invention is to provide a kind of electronic product complete machine combined stress reliability accelerated test method, solve the problem that electronic product complete machine failure mechanism is single, test efficiency is low, improve the efficiency of accelerated test.
In order to reach foregoing invention object, the present invention is realized by following technical scheme, proposes a kind of electronic product complete machine combined stress reliability accelerated test method, comprises the steps: 1) invalid cost of dynamo-electric machine product is determined by numerical simulation; 2) combined stress is determined combined stress acceleration model as complete machine accelerated stress; 3) numerical simulation is utilized to calculate complete machine accelerator coefficient.
Further, described step 1) comprises: 1-1) utilizing works experience, consult handbook and document to determine the regularity of distribution of the failure model parameter of all types of unit product; 1-2) carry out assignment according to the failure model parameter of the regularity of distribution to each unit product of failure model parameter, according to its invalid cost model, utilize the method for random sampling to obtain the out-of-service time of each unit product
; 1-3) calculate the out-of-service time of electronic product complete machine
; 1-4) by step 1-2), 1-3) repeat
msecondary, can obtain
mthe out-of-service time of individual complete machine
; 1-5) under confidence degree to obtain
mthe out-of-service time of individual complete machine carries out the test of hypothesis of various distribution, carries out matching to verifying as really to distribute, and obtains the invalid cost that this machine product is obeyed.
Further, described step 2) in select to the maximum temperature of failure mechanism facilitation, vibration stress as accelerated test stress, the applying mode of stress is constant stress, and stress level number gets 1;
Use broad sense Ai Lin model as acceleration model, broad sense Ai Lin model can be expressed as:
In formula:
for reliability characteristic value,
for positive number,
for temperature stress,
for vibration stress,
for activation energy,
for Boltzmann constant,
c,
dfor undetermined constant,
be similar to and regard a constant as; Model can be written as:
In formula:
,
,
,
for undetermined constant; Ignore the interaction item of temperature and vibration:
, the model of abbreviation form is:
.
The accelerator coefficient of broad sense Ai Lin model:
In formula
item is temperature acceleration factor when adopting Arrhenius relationship,
;
item is vibration accelerator coefficient during employing inverse power law model,
.
Further, activation energy and fail message first by the reliability accelerated test of basic data or device level can be utilized to obtain unit product in complete machine in described step 3), fail message is utilized to obtain the reliability characteristic value of complete machine under condition of different temperatures by numerical simulation, accounting temperature accelerator coefficient, calculate vibration accelerator coefficient by vibrating fatigue convert formula again, two accelerator coefficients are multiplied and obtain complete machine accelerator coefficient.
The present invention's beneficial effect is compared with prior art:
1) before electronic product complete machine carries out reliability accelerated test, the invalid cost of complete machine is determined, for the calculating of accelerator coefficient and the process of test figure provide foundation.
2) selected temperature-vibration integrated accelerated stress to replace single accelerated stress, temperature, vibration stress are maximum to product failure facilitation, can excite the failure mechanism of complete machine more all sidedly and improve the efficiency of accelerated test.
3) use numerical value emulation method to carry out the calculating of complete machine accelerator coefficient, result of calculation is comparatively accurate, can designed reliability accelerated test scheme accordingly.
Accompanying drawing explanation
Below with reference to drawings and Examples, the invention will be further described.
Fig. 1 is electronic product complete machine combined stress reliability accelerated test method process flow diagram of the present invention;
Fig. 2 is the schematic flow sheet that the present invention calculates numerical simulation in complete machine accelerator coefficient.
Embodiment
Below with reference to accompanying drawing and exemplifying embodiment, the invention will be further described.
As shown in Figure 1, the present invention is by following flow process specific implementation:
1) invalid cost of dynamo-electric machine product is determined by numerical simulation
Certain electronic product complete machine is analyzed, it comprises
nindividual unit product, wherein the electronic devices and components series products of invalid cost obeys index distribution has
n 1 individual, component of machine, the delicate electronic device product of the Weibull distribution of invalid cost obedience have
n 2 individual, starting material, the typical process product of invalid cost obeys logarithm normal distribution have
n 3 individual.With the invalid cost of the method determination complete machine of numerical simulation.Key step has:
1. utilizing works experience, consults handbook and document to determine the regularity of distribution of the failure model parameter of all types of unit product;
2. carry out assignment according to the failure model parameter of the regularity of distribution to each unit product of failure model parameter, according to its invalid cost model, utilize the method for random sampling to obtain the out-of-service time of each unit product
.
3. the out-of-service time of electronic product complete machine is calculated:
;
4. step 2, step 3 are repeated
msecondary, can obtain
mthe out-of-service time of individual complete machine
;
5. under confidence degree to obtain
mthe out-of-service time of individual complete machine carries out the test of hypothesis of various distribution, carries out matching to verifying as really to distribute, and obtains the invalid cost that this machine product is obeyed;
2) combined stress is determined combined stress acceleration model as complete machine accelerated stress
Select to the maximum temperature of failure mechanism facilitation, vibration stress as accelerated test stress, the applying mode of stress is constant stress, and stress level number gets 1.
Use broad sense Ai Lin model as acceleration model, broad sense Ai Lin model can be expressed as:
In formula:
for reliability characteristic value,
for positive number,
for temperature stress,
for vibration stress,
for activation energy,
for Boltzmann constant,
c,
dfor undetermined constant,
be similar to and regard a constant as.Model can be written as:
In formula:
,
,
,
for undetermined constant.Ignore the interaction item of temperature and vibration:
, the model of abbreviation form is:
The accelerator coefficient of broad sense Ai Lin model:
item is temperature acceleration factor when adopting Arrhenius relationship,
;
item is vibration accelerator coefficient during employing inverse power law model,
.So accelerator coefficient is the product of two kinds of stress accelerator coefficient when accelerating respectively when two stress accelerates.
3) numerical simulation is utilized to calculate complete machine accelerator coefficient
In complete machine, the activation energy of unit product and fail message can obtain by utilizing the reliability accelerated test of basic data or device level.Unit product can be obtained in different temperature according to activation energy and fail message
tfailure model parameter under condition.
For electronic component products, all electronic devices and components are in temperature
tcrash rate total under condition is
, by Practical computer teaching random number
p,
n 1 electronic devices and components overall out-of-service time is:
.
For parts, delicate electronic device product, the
jindividual product is in temperature
tunder condition, characteristics life is
, form parameter is
, by Practical computer teaching random number
p j , its out-of-service time is:
.The out-of-service time of all parts, delicate electronic device overall product is:
.
For starting material and typical process product, the
kindividual product is in temperature
tunder condition, logarithmic average is
, logarithm variance is
, by Practical computer teaching random number
p k , the
kthe out-of-service time of individual product
.The out-of-service time of all raw material and typical process overall product is:
.
So machine product is in temperature
tout-of-service time under condition is
.Repeat whole process
nssecondary, complete machine can be simulated in temperature
tunder condition
nsthe individual out-of-service time.Whole simulation flow as shown in Figure 2.
In temperature
t 1 with
t 2 carry out respectively under condition
nssecondary emulation, obtains complete machine in temperature
t 1 with
t 2 each under condition
nsindividual fail data.Machine product is calculated in temperature according to the invalid cost of complete machine
t 1 with
t 2 reliability characteristic value under condition
with
, so for machine product,
t 1 right
t 2 temperature acceleration factor be
.
According to middle vibration convert formula of equal value, vibration accelerator coefficient computing formula is:
In formula:
with
the vibration level before accelerating and after accelerating respectively,
cbe conversion factor, conservative value is 3, so vibration accelerator coefficient is
.The accelerator coefficient of complete machine is temperature acceleration factor and the product vibrating accelerator coefficient, for
.
After calculating the accelerator coefficient of machine product, namely can convert the fail-test time of this complete machine routine, the reliability accelerated test scheme of design complete machine.
To those skilled in the art, obviously the invention is not restricted to the details of above-mentioned one exemplary embodiment, and when not deviating from spirit of the present invention or essential characteristic, the present invention can be realized in other specific forms.Therefore, no matter from which point, all should embodiment be regarded as exemplary, and be nonrestrictive, scope of the present invention is limited by claims instead of above-mentioned explanation, and all changes be therefore intended in the implication of the equivalency by dropping on claim and scope are included in the present invention.Any Reference numeral in claim should be considered as the claim involved by limiting.
Claims (4)
1. an electronic product complete machine combined stress reliability accelerated test method, is characterized in that: comprise the steps:
1) invalid cost of dynamo-electric machine product is determined by numerical simulation;
2) combined stress is determined combined stress acceleration model as complete machine accelerated stress;
3) numerical simulation is utilized to calculate complete machine accelerator coefficient.
2. electronic product complete machine combined stress reliability accelerated test method according to claim 1, it is characterized in that, described step 1) comprises:
1-1) utilizing works experience, consults handbook and document to determine the regularity of distribution of the failure model parameter of all types of unit product;
1-2) carry out assignment according to the failure model parameter of the regularity of distribution to each unit product of failure model parameter, according to its invalid cost model, utilize the method for random sampling to obtain the out-of-service time of each unit product
;
1-3) calculate the out-of-service time of electronic product complete machine
;
1-4) by step 1-2), 1-3) repeat
msecondary, can obtain
mthe out-of-service time of individual complete machine
;
1-5) under confidence degree to obtain
mthe out-of-service time of individual complete machine carries out the test of hypothesis of various distribution, carries out matching to verifying as really to distribute, and obtains the invalid cost that this machine product is obeyed.
3. electronic product complete machine combined stress reliability accelerated test method according to claim 1, it is characterized in that, described step 2) in select the maximum temperature of failure mechanism facilitation, vibration stress as accelerated test stress, the applying mode of stress is constant stress, and stress level number gets 1;
Use broad sense Ai Lin model as acceleration model, broad sense Ai Lin model can be expressed as:
In formula:
for reliability characteristic value,
for positive number,
for temperature stress,
for vibration stress,
for activation energy,
for Boltzmann constant,
c,
dfor undetermined constant,
be similar to and regard a constant as; Model can be written as:
In formula:
,
,
,
for undetermined constant;
Ignore the interaction item of temperature and vibration:
, the model of abbreviation form is:
The accelerator coefficient of broad sense Ai Lin model:
item is temperature acceleration factor when adopting Arrhenius relationship,
;
item is vibration accelerator coefficient during employing inverse power law model,
.
4. electronic product complete machine combined stress reliability accelerated test method according to claim 1, it is characterized in that, activation energy and fail message first by the reliability accelerated test of basic data or device level can be utilized to obtain unit product in complete machine in described step 3), fail message is utilized to obtain the reliability characteristic value of complete machine under condition of different temperatures by numerical simulation, accounting temperature accelerator coefficient, calculate vibration accelerator coefficient by vibrating fatigue convert formula again, two accelerator coefficients are multiplied and obtain complete machine accelerator coefficient.
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| CN106021928A (en) * | 2016-05-20 | 2016-10-12 | 中国人民解放军总参谋部第六十研究所 | Comprehensive stress acceleration test method |
| CN110686915A (en) * | 2019-10-24 | 2020-01-14 | 上海航天精密机械研究所 | Method, system, medium and equipment for determining multi-stress acceleration test profile |
| CN116227240A (en) * | 2023-05-08 | 2023-06-06 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Product life evaluation method, device and equipment based on comprehensive stress acceleration test |
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| CN116227240A (en) * | 2023-05-08 | 2023-06-06 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Product life evaluation method, device and equipment based on comprehensive stress acceleration test |
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