CN103837814B - Tester - Google Patents
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- CN103837814B CN103837814B CN201410120773.3A CN201410120773A CN103837814B CN 103837814 B CN103837814 B CN 103837814B CN 201410120773 A CN201410120773 A CN 201410120773A CN 103837814 B CN103837814 B CN 103837814B
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Abstract
The invention discloses a kind of tester, including: discrete device detection module, integrated circuit detection module and control module；The outfan of control module is connected with the driving input of discrete device detection module and integrated circuit detection module, according to the model of current detection device, drives discrete device detection module or integrated circuit detection module to detect.Thus the problem solving the inconvenience of polymorphic type electron device testing.Achieve the detection of two class devices, and can set and detect program accordingly by the type to different integrated circuits, it is achieved the detection to multiple integrated circuit.Thus, improve reliability and the concordance of electronic device detection, reduce the testing cost of electronic device, improve production efficiency and the reliability of electronic product.
Description
Technical field
The present invention relates to element test, production and application, particularly to tester.
Background technology
Along with modernization industrial expansion and the raising of people's living standard, various electrical equipment every aspect in producing, living is widely used.For ensureing the reliability of electrical equipment and can realize effectively applying, therefore, electronic device detection in process of production just becomes particularly important.The detection of existing electronic device can be divided into discrete device detection and integrated circuit detection, but during detection, owing to existing discrete device detection device and integrated circuit detector are separate, thus can not synchronize to use, when needs carry out discrete device detection, can only carry out on discrete device detection device, when needs carry out integrated circuit detection, can only carry out on integrated circuit detector, therefore, it is impossible to carry out synchronous detecting.For this problem, the indivedual discrete devices detected as required in prior art make detection box or detection device, use with integrated circuit detector simultaneously, but in use, when the type of discrete device changes, it is accomplished by re-starting the making of discrete device detection box, on the one hand, again the time making detection box or device is longer, it is delayed and produces, still further aspect, owing to being not the detection device of specialty, therefore, poor reliability, service life is low, thus directly affects detection and the quality of rear road assembling of electronic device, service efficiency and effectiveness, make the less reliable of the electronic product of subsequent production, use and maintenance cost rises.
Summary of the invention
In order to overcome in prior art, the problem of polymorphic type electron device testing inconvenience, the present invention provides tester.
The tester that the present invention provides, including: discrete device detection module, integrated circuit detection module and control module；The outfan of described control module is connected with the driving input of described discrete device detection module and integrated circuit detection module, according to the model of current detection device, drives described discrete device detection module or integrated circuit detection module to detect；
Also include: discrete device detection mouthpiece and integrated circuit detection mouthpiece；Described discrete device detection mouthpiece is connected with the input of discrete device detection module, described integrated circuit detection mouthpiece is connected with the input of integrated circuit detection module；
Described control module also prestores the detection program of device to be detected and corresponding detection reference value；If the model of current detection device is integrated circuit model, then extract current detection program and corresponding integrated circuit detection reference value according to the model of current detection device；Detect according to integrated circuit detection module described in described current detection driven by program；Current detection value is detected reference value phase comparison with described integrated circuit, if coupling, then output integrated circuit detection correct information；If not mating, then output integrated circuit detection abnormal information；If the model of current detection device is discrete device model, then according to the discrete device detection reference value corresponding to the model extraction of current detection device；Current detection value is detected reference value phase comparison with described discrete device, if coupling, then output discrete device detection correct information；If not mating, then output discrete device detection abnormal information.
In a preferred embodiment, described discrete device detection module or integrated circuit detection module, it is connected with described control module by controlling bus.
In a preferred embodiment, also including: regulated power supply module, described regulated power supply module, by described control bus, is connected with described control module；Prestore in described control module the driving electrical quantity of device to be detected；Model according to current detection device is extracted when front wheel driving electrical quantity；According to described when front wheel driving electrical quantity driving regulated power supply module, described discrete device detection module or integrated circuit detection module is driven to detect.
In a preferred embodiment, also include: external discrete units test module and external integrated detection module；Described external discrete units test module and external integrated detection module, be connected with the outfan of described control module by described control bus.
In a preferred embodiment, if described control module output integrated circuit detection abnormal information, then according to set point number, again integrated circuit detection module is detected；If described control module output discrete device detection abnormal information, then according to set point number, again discrete device detection module is detected.
In a preferred embodiment, if described control module output integrated circuit detection abnormal information, then detected by external integrated detection module；If described control module output discrete device detection abnormal information, then detected by external discrete units test module.
In a preferred embodiment, also including: Circuit Matching data module, described Circuit Matching data module is connected with described control module by described control bus；Described Circuit Matching data module prestores, updates the tables of data that circuit model is corresponding.
In a preferred embodiment, if current detection device model does not exists, then judge whether described current detection device model is to update circuit model, the most then according to described tables of data, obtain and update circuit model；If it is not, then send false alarm information.
It can thus be appreciated that, tester in the present invention has the advantage that the present invention passes through, integrated to discrete device detection device and integrated circuit detector, achieve the detection of two class devices, and can be by the type to different integrated circuits, set and detect program accordingly, it is achieved the detection to multiple integrated circuit.Thus, improve reliability and the concordance of electronic device detection, reduce the testing cost of electronic device, improve production efficiency and the reliability of electronic product.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in describing below is only some embodiments of the present invention, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the composition schematic diagram of tester in one embodiment of the present invention；
Fig. 2 is the composition schematic diagram of tester in another embodiment of the invention；
Fig. 3 be the present invention another embodiment in the composition schematic diagram of tester；
Fig. 4 be the present invention another embodiment in the composition schematic diagram of tester.
Detailed description of the invention
As shown in the composition schematic diagram of tester in one embodiment of the present invention in Fig. 1, tester of the present invention includes: discrete device detection module 10, integrated circuit detection module 20 and control module 30.The outfan of control module 30 is connected with the driving input of discrete device detection module 10 and integrated circuit detection module 20；Input in control module 30 connects input equipment 31, for control module 30 carrying out instruction input and controlling；The input of discrete device detection module 10 is connected with discrete device detection mouthpiece 11, and discrete device detection mouthpiece 11 is used for patching discrete device to be detected.The input of integrated circuit detection module 20 is connected with integrated circuit detection mouthpiece 21, integrated circuit detection mouthpiece 21 is used for patching integrated circuit to be detected, it should be noted that, integrated circuit detection mouthpiece 21 herein also is understood as integrated circuit detection platform, including: one or more integrated circuit test socket；When detecting integrated circuit feature board, it is also possible to for the connector of integrated circuit feature board, e.g., " golden finger " connector.Above-mentioned control module 30 can use the programmable control modules such as FPGA, single-chip microcomputer, single board computer to realize.Control module 30 exchanges can realize by controlling bus with the data of discrete device detection module 10, integrated circuit detection module 20 and input equipment 31, controls bus and includes: the type such as data, transmission.Input equipment 31 can use personal computer (PC) or other processing meanss possessing keyboard and screen to realize, and input equipment 31 and control module 30 can be connected by interface module, it is achieved communication；Simultaneously, it is possible to be connected on the input of FPGA platform (or development platform) realize.It should be noted that above-mentioned discrete device detection module 10, integrated circuit detection module 20 and discrete device detection mouthpiece 11 and integrated circuit detection mouthpiece 21 can be fabricated separately in the specific implementation, it is possible to be made as a single unit system.Prestore in control module 30 detection device data table, and this table includes: the contents such as the testing conditions (detection electrical quantity, detection program and circuit types) corresponding to the model of device to be detected, this model, as shown in Table 1:
Table one
| Circuit model | Detection electrical quantity | Detection program | Circuit types |
| A | 5V AC、1kHz | Nothing | Discrete device |
| B | +12V\-12V | Nothing | Discrete device |
| C | +12V\0V、3.3V | Detection program 1 | Integrated circuit |
| D | +12V\-12V、5V | Detection program 2 | Integrated circuit |
Current detection device model is inputted by input equipment 31, input equipment 31 is by the current period detection model of this input, it is transferred in control module 30, control module 30 is according to received current detection device model, detection device data table is inquired about, transfer corresponding electric circuit inspection condition, and drive discrete device detection module 10 or integrated circuit detection module 20 that current detection device is detected according to this condition.As: when " A " to be detected device is detected by needs, first " A " device is patched in discrete device detection mouthpiece 11.Input equipment 31 will be connected by input afterwards and input device to be detected " A " in control module 30, control module 30 retrieves table one, obtain the detection electrical quantity 5V AC 1kHz corresponding with " A " device, detection program "None" and circuit types " discrete device ", afterwards according to the circuit types of " discrete device ", drive discrete device detection module 10, and be sent to drive discrete device detection module 10 by detection parameter (detection electrical quantity 5V AC 1kHz), discrete device detection module 10 is driven to drive discrete device detection mouthpiece 11 according to detection electrical quantity 5V AC 1kHz, " A " to be detected device is detected.When being " integrated circuit " type such as the type of device to be detected, above-mentioned testing conditions also needs call " detection program " data, treat detection device and detect.
In the implementation process of above-mentioned case, can realize the driving of discrete device detection module 10, integrated circuit detection module 20 is powered by regulated power supply module 40, when control module 30 is according to device to be detected, after obtaining detection electrical quantity, by controlling bus driver regulated power supply module 40, required detection electrical quantity is sent in units test module 10 or integrated circuit detection module 20 by regulated power supply module 40, detects its device to be detected connected.
For realizing the automatic detection of device to be detected to integrated circuit, in one embodiment of the invention, in control module 30, also prestore the detection normal value corresponding to detection program of device to be detected, it is connected with the outfan of discrete device detection module 10, integrated circuit detection module 20, as shown in Table 2.It should be noted that this detection normal value can be the numerical value of concrete outfan, it is also possible to for the numerical value of multiple outfans, such as the chip for single computing function, when input port being carried out parameter restriction, and give with corresponding operation program after, it will obtain the numerical value determined at delivery outlet.But for multifunctional unit chip, when multiple input ports being carried out parameter restriction, and give with corresponding operation program after, it will obtain multiple numerical value at multiple delivery outlets.
Table two
If the model of current detection device is integrated circuit, then control module 30 extracts current detection program and corresponding integrated circuit detection reference value according to the model of current detection device；Detect according to current detection driven by program integrated circuit detection module 20；Current detection value is detected reference value phase comparison with integrated circuit, if coupling, then output integrated circuit detection correct information；If not mating, then output integrated circuit detection abnormal information；If the model of current detection device is discrete device, then according to the discrete device detection reference value corresponding to the model extraction of current detection device；Current detection value is detected reference value phase comparison with discrete device, if coupling, then output discrete device detection correct information；If not mating, then output discrete device detection abnormal information.
For making the tester in the present invention the most reliable, in one embodiment of the invention, as it is shown on figure 3, also include: external discrete units test module 50 and external integrated detection module 60.External discrete units test module 50 and external integrated detection module 60, detecting mouthpiece 61 with external discrete units test mouthpiece 51 and external integrated respectively to be connected, external discrete units test module 50 and external integrated detection module 60 are connected with the outfan of control module 30 by controlling bus.If control module 30 is after testing, when outputing integrated circuit detection abnormal information, on the one hand, control module 30 can be according to set point number, such as: 3 times, again detects integrated circuit detection module 20；If control module 30 exports discrete device detection abnormal information, then according to set point number, again discrete device detection module 10 is detected.On the other hand, control module 30 can pass through external integrated detection module 60, detects.If control module 30 exports discrete device detection abnormal information, then detected by discrete device detection module 10.Therefore, on the one hand, when there is using fault in discrete device detection mouthpiece 11 and integrated circuit detection mouthpiece 21, external discrete units test mouthpiece 51 and external integrated detection mouthpiece 61 can be used to detect, thus, ensure that the utilization rate of detection efficiency and equipment, improve detection efficiency.On the other hand, also by said method, the flase drop situation that detection device fault brings is eliminated to electric circuit inspection.
For making tester in the present invention in use, can possess more preferable extensibility, i.e. for the device of new model, in the case of can re-entering not carrying out data base, detection information just can be updated, therefore, in one embodiment of the invention, as shown in Figure 4, also including: Circuit Matching data module 70, Circuit Matching data module 70 is connected with control module 30 by controlling bus；Circuit Matching data module 70 prestores, updates circuit model and the corresponding data table of the detection device model that prestores.As shown in following table three:
Table three
| Circuit model | Update circuit model |
| A | E |
| B | F |
| C | G |
| D | H |
If current detection device model does not exists, control module 30 then judges whether current detection device model is to update circuit model, the most then retrieve corresponding data table according to current detection device type, obtain the detection device model that prestores；If it is not, then send false alarm information.Such as the G of current detection model, then can realize the test to device " G " by the parameter calling device " C ".Should be noted that, the method with to prestore detection device data table renewal compared with by more stable, and can be by the integral replacing of Circuit Matching data module 70 be carried out quick-replaceable, being very beneficial for being updated equipment and upgrading, Circuit Matching data module 70 can be realized by memorizer.
By above example, the present invention having been carried out further announcement, but the scope of the present invention is not limited thereto, under conditions of without departing from present inventive concept, the above step that respectively realizes can be replaced by the similar or equivalent step that realizes that art personnel understand.
Claims (8)
1. tester, it is characterised in that including: discrete device detection module, integrated circuit detection mould
Block and control module；The outfan of described control module and described discrete device detection module and integrated electricity
The driving input of road detection module connects, and according to the model of current detection device, drives described discrete
Units test module or integrated circuit detection module detect；
Also include: discrete device detection mouthpiece and integrated circuit detection mouthpiece；Described discrete device
Detection mouthpiece is connected with the input of discrete device detection module, described integrated circuit detection mouthpiece
It is connected with the input of integrated circuit detection module；
Described control module also prestores the detection program of device to be detected and corresponding detection reference value；
If the model of current detection device is integrated circuit model, then according to the model of current detection device
Extract current detection program and corresponding integrated circuit detection reference value；According to described current detection journey
Sequence drives described integrated circuit detection module to detect；Current detection value is examined with described integrated circuit
Survey reference value phase comparison, if coupling, then output integrated circuit detection correct information；If not mating, then
Output integrated circuit detection abnormal information；
If the model of current detection device is discrete device model, then according to the model of current detection device
Discrete device detection reference value corresponding to extraction；By current detection value and described discrete device detection ginseng
Examine value phase comparison, if coupling, then output discrete device detection correct information；If not mating, then export
Discrete device detection abnormal information.
2. tester as claimed in claim 1, it is characterised in that described discrete device detection mould
Block or integrated circuit detection module, be connected with described control module by controlling bus.
3. tester as claimed in claim 2, it is characterised in that also include: regulated power supply module,
Described regulated power supply module, by described control bus, is connected with described control module；Described control mould
Prestore in block the driving electrical quantity of device to be detected；Model according to current detection device is extracted and is worked as forerunner
Electrokinetic Parameters；According to described when front wheel driving electrical quantity driving regulated power supply module, drive described deviding device
Part detection module or integrated circuit detection module detect.
4. tester as claimed in claim 3, it is characterised in that also include: external discrete device
Detection module and external integrated detection module；Described external discrete units test module and outside collection
Become electric circuit inspection module, be connected with the outfan of described control module by described control bus.
5. tester as claimed in claim 4, it is characterised in that if described control module output collection
Become electric circuit inspection abnormal information, then according to set point number, again integrated circuit detection module is examined
Survey；If described control module output discrete device detection abnormal information, then according to set point number, again
Discrete device detection module is detected.
6. tester as claimed in claim 4, it is characterised in that if described control module output collection
Become electric circuit inspection abnormal information, then by external integrated detection module, detect；If it is described
Control module output discrete device detection abnormal information, then carried out by external discrete units test module
Detection.
7. tester as claimed in claim 2, it is characterised in that also include: Circuit Matching data
Module, described Circuit Matching data module is connected with described control module by described control bus；Institute
State in Circuit Matching data module and prestore, update the tables of data that circuit model is corresponding.
8. tester as claimed in claim 7, it is characterised in that if current detection device model
Do not exist, then judge whether described current detection device model is to update circuit model, the most then root
According to described tables of data, obtain and update circuit model；If it is not, then send false alarm information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410120773.3A CN103837814B (en) | 2014-03-28 | 2014-03-28 | Tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410120773.3A CN103837814B (en) | 2014-03-28 | 2014-03-28 | Tester |
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| Publication Number | Publication Date |
|---|---|
| CN103837814A CN103837814A (en) | 2014-06-04 |
| CN103837814B true CN103837814B (en) | 2016-08-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410120773.3A Expired - Fee Related CN103837814B (en) | 2014-03-28 | 2014-03-28 | Tester |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111077432A (en) * | 2019-12-30 | 2020-04-28 | 浙江力创自动化科技有限公司 | Controller and control system of integrated circuit on-line detection device |
| CN114047426A (en) * | 2021-10-12 | 2022-02-15 | 武汉光谷信息光电子创新中心有限公司 | Test system and method compatible with multiple types of chips |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101158708A (en) * | 2007-10-23 | 2008-04-09 | 无锡汉柏信息技术有限公司 | Multiple chips automatic test method based on programmable logic device |
| CN101334448A (en) * | 2008-05-23 | 2008-12-31 | 深圳市同洲电子股份有限公司 | Test platform and method for testing PC board |
| CN101368991A (en) * | 2007-08-15 | 2009-02-18 | 鹏智科技(深圳)有限公司 | Electronic device test device and method thereof |
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2014
- 2014-03-28 CN CN201410120773.3A patent/CN103837814B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101368991A (en) * | 2007-08-15 | 2009-02-18 | 鹏智科技(深圳)有限公司 | Electronic device test device and method thereof |
| CN101158708A (en) * | 2007-10-23 | 2008-04-09 | 无锡汉柏信息技术有限公司 | Multiple chips automatic test method based on programmable logic device |
| CN101334448A (en) * | 2008-05-23 | 2008-12-31 | 深圳市同洲电子股份有限公司 | Test platform and method for testing PC board |
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| CN103837814A (en) | 2014-06-04 |
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Granted publication date: 20160817 Termination date: 20190328 |