CN103777386B - LCM (Liquid Crystal Display Module) testing machine - Google Patents
LCM (Liquid Crystal Display Module) testing machine Download PDFInfo
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- CN103777386B CN103777386B CN201410054857.1A CN201410054857A CN103777386B CN 103777386 B CN103777386 B CN 103777386B CN 201410054857 A CN201410054857 A CN 201410054857A CN 103777386 B CN103777386 B CN 103777386B
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- 238000012360 testing method Methods 0.000 title claims abstract description 39
- 239000004973 liquid crystal related substance Substances 0.000 title abstract description 15
- 230000003139 buffering effect Effects 0.000 claims abstract description 16
- 238000006243 chemical reaction Methods 0.000 claims abstract 3
- 210000001503 joint Anatomy 0.000 abstract 2
- 238000013500 data storage Methods 0.000 abstract 1
- 238000000370 laser capture micro-dissection Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000005684 electric field Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000003556 assay Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
An LCM (Liquid Crystal Display Module) testing machine comprises a central processing module, a negative pressure control module, a butt joint module and a calling module, wherein the central processing module comprises a single chip microcomputer, a storage and a data buffering module, which are connected with each other in pairs; the negative pressure control module is used for converting the input positive pressure into negative pressure, and connected with a to-be-tested LCM; the butt joint module comprises a 20 pin output module and a 26 pin output module which are connected in parallel; the 20 pin output module or the 26 pin output module is respectively and correspondingly connected with pins of the to-be-tested LCM; the calling module comprises a model calling unit and an A/D conversion circuit which are connected with the single chip microcomputer, and a control display screen connected with the single chip microcomputer through the A/D conversion circuit. Through the arrangement of the data buffering module connected with the single chip microcomputer and the storage for data storage, the testing of various models of LCMs is realized, and programs of various product models are directly called after being written, so that the operation of workers is facilitated, and the testing efficiency is improved greatly.
Description
Technical field
The present invention relates to a kind of test instrunment, more particularly, to a kind of LCM test machine.
Background technology
Liquid crystal calling module is i.e. " Liquid Crystal Display Module ", referred to as " LCM ", is a kind of by liquid
The assembly that LCD, connector, integrated circuit, PCB, backlight, structural member are assembled together, liquid crystal display
The electric field signal of drive circuit is only applied to the display just enabling display device on ITO conductive electrode, therefore, LCM by part
Exactly the electric field signal of the conductive electrode of liquid crystal display part and drive circuit is coupled together, thus realizing the interior of the display of needs
Hold.
With the fast development of information industry, supporting liquid crystal calling module demand suddenly increases, particularly single color LCD mould
Block, CSTN Liquid Crystal Module, the ratio of TFT Liquid Crystal Module are also gradually increased.General module detection method is all relative complex, test
Content is single, and Micro Controller Unit (MCU) driving calling module is usually used, in order to detect the parameters such as function electric current and the backlight pressure drop of product,
Also need to increase the instruments such as electric current, voltmeter or circuit tester, its operation principle is：Micro Controller Unit (MCU) driving LCM shows, circuit tester is serially connected in
LCM operating current is monitored on testing jig, operator need to see display effect, while whether observe electric current exceeded, if only needed
Detect that whole module dissipation electric current is a little also relatively easy, but if the static current of lcd of major and minor screen and backlight will be checked, just
This three electric currents need to be detected respectively with circuit tester in three times, and need when detecting each to see that display effect sees electric current
Whether change is exceeded, and this detection mode has problems with：1) assay is unreliable, leans on subjective judgment more, easily leaks
Inspection, erroneous judgement；2) inefficiency：Different product must change different single-chip microcomputer testing jigs, writes new driver.And,
The corresponding test program of a LCM product and a test machine, test different products every time and are required for filling on a testing machine
Enter corresponding test program, liquid crystal module can be tested, when test product, parameter cannot directly be adjusted, and also cannot
Reading parameter directly perceived.
Content of the invention
It is an object of the invention to provide a kind of LCM test machine, improve existing testing efficiency, solve an existing LCM
Test machine cannot test the problem of multiple LCM products.
The technical solution adopted for the present invention to solve the technical problems is：A kind of LCM test machine, processes mould including central authorities
Block, the vacuum cavitations module electrically connecting with central processing module, to connection module and calling module.
Central processing module includes single-chip microcomputer, the memorizer data buffer module being connected mutually two-by-two；Described single-chip microcomputer
For transferring the program in memorizer, control data buffer module works, and the letter of receiving data buffer module, memorizer feedback
Breath；Described data buffering module is used for reading the driver of memorizer, and is in series with to connection module；The letter of described memorizer
Number outfan is connected with the signal input part of data buffering module.Vacuum cavitations module is used for for malleation input being converted to negative pressure,
And be connected with LCM to be measured, the outfan of this vacuum cavitations module connects the input of single-chip microcomputer, the input of vacuum cavitations module
Connect the outfan of single-chip microcomputer.Connection module is included with two 20pin output modules being connected in parallel and 26pin output module, should
20pin output module or the connection corresponding with the pin of LCM to be measured respectively of 26pin output module.Calling module includes and single-chip microcomputer
Connected model call unit and A/D change-over circuit, and shown by the control that described A/D change-over circuit is connected with single-chip microcomputer
Screen；The input of described single-chip microcomputer is connected with the outfan of A/D change-over circuit.
In order to avoid plugging single-chip microcomputer IC, cause single-chip microcomputer IC to damage, LCM test machine also include being connected with single-chip microcomputer
Line collector.
Adjust voltage for convenience, LCM test machine also includes the manual voltage regulation unit being connected with single-chip microcomputer.
Further, data buffering module includes three SN74HC245 chips, by digital signal by internal VCCLogic electricity
Flat turn is changed to VddModule logic operational voltage level, thus drive LCM to be measured.
Beneficial effects of the present invention：Because single-chip microcomputer has abundant expanding function in itself, by setting and single-chip microcomputer phase
Data buffering module even and the memorizer of storage data, realize the test to Multiple Type LCM, the journey of multiple product types
Directly invoke after sequence write, facilitate the operation of employee, and greatly improve detection efficiency.Become present aspect, one existing general
The amount of money used by single-chip microcomputer IC that logical test machine consumes for 1 year is far longer than the manufacturing cost of LCM test machine of the present invention.Operation side
Face, the present invention has memorizer data buffer module so that amount of storage greatly improves although existing LCM test machine also has
Store function, but also need to setup parameter after calling model, operation is inconvenient, the present invention can to single color LCD module,
CSTN Liquid Crystal Module, TFT Liquid Crystal Module are detected, cover the product test of all modules.
Brief description
Below with reference to drawings and Examples, the present invention is described in detail.
Fig. 1 is the system block diagram of the present invention.
Fig. 2 is the structure principle chart of the present invention.
Fig. 3 is data buffering module shown in Fig. 2 and the circuit theory diagrams to connection module.
Fig. 4 is the circuit theory diagrams of single-chip microcomputer shown in Fig. 2 and A/D change-over circuit.
Fig. 5 is the FB(flow block) of control software of the present invention.
Specific embodiment
Embodiment, as shown in Fig. 1 is to 2, LCM test machine in this preferred embodiment, including central processing module 1, with central authorities
Processing module electrical connection vacuum cavitations module 2, to connection module 3 and calling module 4.
Central processing module 1 includes single-chip microcomputer 11, the memorizer 12 data buffer module 13 being connected mutually two-by-two；Described
Single-chip microcomputer 11 is used for transferring the program in memorizer, and control data buffer module works, and receiving data buffer module, memorizer
Feedack；Described data buffering module 13 is used for reading the driver of memorizer 12, and is in series with to connection module；Institute
The signal output part stating memorizer 12 is connected with the signal input part of data buffering module 13.
Vacuum cavitations module 2 is used for for malleation input being converted to negative pressure, and is connected with LCM to be measured, this vacuum cavitations module
Outfan connect the input of single-chip microcomputer, the input of vacuum cavitations module connects the outfan of single-chip microcomputer.
Connection module 3 is included with two 20pin output modules 31 being connected in parallel and 26pin output module 32, this 20pin is defeated
Go out module 31 or 26pin output module 32 connection corresponding with the pin of LCM to be measured respectively.
Calling module 4 includes the model call unit 41 being connected with single-chip microcomputer and A/D change-over circuit 42, and by described
The control display screen 43 that A/D change-over circuit is connected with single-chip microcomputer；The input of described single-chip microcomputer and the outfan of A/D change-over circuit
It is connected.
In order to avoid plugging single-chip microcomputer IC, cause single-chip microcomputer IC to damage, LCM test machine also include being connected with single-chip microcomputer
Line collector 5.
Adjust voltage for convenience, LCM test machine also includes the manual voltage regulation unit 6 being connected with single-chip microcomputer.
As shown in figure 3, data buffering module includes three SN74HC245 chips, by reading the driver of memorizer,
And by digital signal by internal VCCLogic level transition is VddModule logic operational voltage level, thus drive LCM to be measured.
As shown in figure 4, single-chip microcomputer adopts ATMEGA64, it is responsible for controlling the operating coordinating whole test machine.The type of memorizer
Number it is AT24C1024, A/D change-over circuit adopts U8（SN74HC164）.The present invention with single-chip microcomputer as core, deposit by control program
In memory, A/D change-over circuit is circumscribed with 132*64 matrix liquid-crystal display screen, can intuitively read product type for adjusting
Take, and by vacuum cavitations module provide LCM to be measured needed for voltage, data buffering module and connection module is reached driving effect
Really.
As shown in figure 5, employee can proceed as follows：It is first turned on power supply, select the product type of LCM to be measured, by true
Recognize part to confirm, LCM test board to be measured is accessed at 20pin output module or 26pin output module, test board is fixed on test
Start on frame to test.Directly invoked by selecting product type during detection, be truly realized a tractor serves several purposes, and store various modes
Detection mode, such as pen section（Short in size）Module, graphic dot matrix module, character pattern module, graphic dot matrix-COB, can be to single color LCD
Module, CSTN Liquid Crystal Module, TFT Liquid Crystal Module are detected, the above product test substantially covering all modules.
The operation principle of the present invention is as follows：Select the product type of LCM to be measured by model call unit, single-chip microcomputer receives
This data and obtain corresponding digital quantity through A/D change-over circuit so that show in control display screen product type, IC model,
Magnitude of voltage, current value, power values, Uled、Iled.Product type only need to be transferred during operation.On the other hand, single-chip microcomputer passes through to bear
Vdd (logic working voltage) needed for pressure control module generation LCM, Vled (backlight running voltage), If (backlight driver use
Constant-current source), and by data buffering module with to connection module, drive LCM to be measured, obtain test result.
Claims (1)
1. a kind of LCM test machine, including central processing module it is characterised in that：Also include being electrically connected with described central processing module
The vacuum cavitations module that connects, to connection module and calling module；
Described central processing module includes single-chip microcomputer, the memorizer data buffer module being connected mutually two-by-two；Described single-chip microcomputer
For transferring the program in memorizer, control data buffer module works, and the letter of receiving data buffer module, memorizer feedback
Breath；Described data buffering module is used for reading the driver of memorizer, and is in series with to connection module；The letter of described memorizer
Number outfan is connected with the signal input part of data buffering module；
Described vacuum cavitations module is used for for malleation input being converted to negative pressure, and is connected with LCM to be measured, this vacuum cavitations module
Outfan connects the input of single-chip microcomputer, and the input of vacuum cavitations module connects the outfan of single-chip microcomputer；
Described connection module is included with two 20pin output modules being connected in parallel and 26pin output module, this 20pin exports mould
Block or the connection corresponding with the pin of LCM to be measured respectively of 26pin output module；
Described calling module includes the model call unit being connected with single-chip microcomputer and A/D change-over circuit, and is turned by described A/D
Change the control display screen that circuit is connected with single-chip microcomputer；The input of described single-chip microcomputer is connected with the outfan of A/D change-over circuit；
Described LCM test machine also includes the compiled online module being connected with described single-chip microcomputer, and be connected with described single-chip microcomputer
Manual voltage regulation unit；Described data buffering module includes three SN74HC245 chips, and digital signal is patrolled by internal Vcc
Collecting level conversion is Vdd module logic operational voltage level, thus driving LCM to be measured；
Described single-chip microcomputer adopts ATMEGA64, model AT24C1024 of memorizer, and A/D change-over circuit adopts SN74HC164；
Select the product type of LCM to be measured by model call unit, single-chip microcomputer receives data the warp of LCM product type to be measured
A/D change-over circuit obtains corresponding digital quantity so that showing product type, IC model, magnitude of voltage, electric current in control display screen
Value, power values, Uled、Iled, during operation, only need to transfer product type；On the other hand, single-chip microcomputer passes through vacuum cavitations module
Vdd logic working voltage needed for generation LCM, Vled backlight running voltage, the constant-current source of If backlight driver, and pass through
Data buffering module and to connection module, drives LCM to be measured, obtains test result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410054857.1A CN103777386B (en) | 2014-02-18 | 2014-02-18 | LCM (Liquid Crystal Display Module) testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410054857.1A CN103777386B (en) | 2014-02-18 | 2014-02-18 | LCM (Liquid Crystal Display Module) testing machine |
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| Publication Number | Publication Date |
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| CN103777386A CN103777386A (en) | 2014-05-07 |
| CN103777386B true CN103777386B (en) | 2017-02-22 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104318882A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Display module testing equipment |
| CN107515350A (en) * | 2017-08-24 | 2017-12-26 | 蚌埠高华电子股份有限公司 | A kind of LCM test control systems based on capacitance monitoring |
| CN107817386A (en) * | 2017-09-15 | 2018-03-20 | 北方电子研究院安徽有限公司 | A kind of CCD wafers test device for insulation resistance |
| CN112735309A (en) * | 2020-12-04 | 2021-04-30 | 安徽金视界光电科技有限公司 | STN liquid crystal display OTP (one time programmable) burning instrument and burning method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1282280C (en) * | 2003-01-24 | 2006-10-25 | 胜华科技股份有限公司 | Base of hand operated cam for fina test of liquid crystal module (LCM) |
| JP5091561B2 (en) * | 2007-06-27 | 2012-12-05 | Ｉｄｅｃ株式会社 | Explosion-proof LCD |
| CN202171929U (en) * | 2011-05-31 | 2012-03-21 | 贺术春 | LCM module group test system |
| US20130207986A1 (en) * | 2012-02-14 | 2013-08-15 | Mediatek Inc. | Method and device for accessing buffer of display |
| CN202794388U (en) * | 2012-08-30 | 2013-03-13 | 亚世光电股份有限公司 | On-line assembling testing integrating system for liquid crystal module (LCM) |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: LCM (Liquid Crystal Display Module) testing machine Effective date of registration: 20190605 Granted publication date: 20170222 Pledgee: Xiuning Qiyun Financing Guarantee Co.,Ltd. Pledgor: ANHUI GOLDEN VISION OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019340000288 |
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Granted publication date: 20170222 Pledgee: Xiuning Qiyun Financing Guarantee Co.,Ltd. Pledgor: ANHUI GOLDEN VISION OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019340000288 |
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| PC01 | Cancellation of the registration of the contract for pledge of patent right |