CN103685988A - 用于确定缺陷像素的设备和方法 - Google Patents
用于确定缺陷像素的设备和方法 Download PDFInfo
- Publication number
- CN103685988A CN103685988A CN201310384874.7A CN201310384874A CN103685988A CN 103685988 A CN103685988 A CN 103685988A CN 201310384874 A CN201310384874 A CN 201310384874A CN 103685988 A CN103685988 A CN 103685988A
- Authority
- CN
- China
- Prior art keywords
- pixel
- defect
- center
- value
- center pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims abstract description 302
- 238000000034 method Methods 0.000 title claims abstract description 44
- 238000012937 correction Methods 0.000 claims description 35
- 238000010586 diagram Methods 0.000 description 15
- 239000003086 colorant Substances 0.000 description 12
- 230000006870 function Effects 0.000 description 10
- 230000009931 harmful effect Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000001915 proofreading effect Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
- H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Color Television Image Signal Generators (AREA)
- Facsimile Image Signal Circuits (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012-0188468 | 2012-08-29 | ||
JP2012188468A JP6091807B2 (ja) | 2012-08-29 | 2012-08-29 | 欠陥画素判定装置および欠陥画素判定方法 |
JP2012-188468 | 2012-08-29 | ||
KR10-2013-0059927 | 2013-05-27 | ||
KR1020130059927A KR101945408B1 (ko) | 2012-08-29 | 2013-05-27 | 결함 화소 판정 장치 및 결함 화소 판정 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103685988A true CN103685988A (zh) | 2014-03-26 |
CN103685988B CN103685988B (zh) | 2018-02-02 |
Family
ID=50187045
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310384874.7A Active CN103685988B (zh) | 2012-08-29 | 2013-08-29 | 用于确定缺陷像素的设备和方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US9258555B2 (zh) |
CN (1) | CN103685988B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107016669A (zh) * | 2017-03-27 | 2017-08-04 | 福州瑞芯微电子股份有限公司 | 一种图像坏点检测方法和装置 |
CN107820618A (zh) * | 2017-09-30 | 2018-03-20 | 深圳市汇顶科技股份有限公司 | 传感像素单元及光学指纹传感器 |
CN110827245A (zh) * | 2019-10-28 | 2020-02-21 | 上海悦易网络信息技术有限公司 | 一种检测屏幕显示断线的方法及设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050231617A1 (en) * | 2004-04-20 | 2005-10-20 | Canon Kabushiki Kaisha | Image processing apparatus for correcting captured image |
CN101335827A (zh) * | 2007-06-25 | 2008-12-31 | 华邦电子股份有限公司 | 使用定向检测方法的影像缺陷校正*** |
CN101365050A (zh) * | 2007-08-06 | 2009-02-11 | 联发科技股份有限公司 | 检测与校正缺陷像素的方法及装置 |
US20110001853A1 (en) * | 2009-07-01 | 2011-01-06 | Sato Ryuki | Solid-state imaging device and image defect correction processing circuit |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4388909B2 (ja) * | 2005-04-25 | 2009-12-24 | イーストマン コダック カンパニー | 画素欠陥補正装置 |
KR100825821B1 (ko) | 2006-08-16 | 2008-04-28 | 엠텍비젼 주식회사 | 결함 화소의 검출 방법 |
JP4895107B2 (ja) | 2006-09-08 | 2012-03-14 | ソニー株式会社 | 電子機器、情報処理方法、およびプログラム |
JP4703601B2 (ja) * | 2007-04-27 | 2011-06-15 | 株式会社東芝 | 撮像装置 |
JP2009290653A (ja) | 2008-05-30 | 2009-12-10 | Sony Corp | 欠陥画素補正装置、撮像装置、欠陥画素補正方法、およびプログラム |
JP5511212B2 (ja) | 2009-03-31 | 2014-06-04 | 大日本スクリーン製造株式会社 | 欠陥検出装置及び欠陥検出方法 |
JP5120441B2 (ja) | 2009-11-26 | 2013-01-16 | 株式会社ニコン | 画像処理装置 |
JP5574379B2 (ja) * | 2010-10-13 | 2014-08-20 | 富士機械製造株式会社 | 画像処理装置及び画像処理方法 |
KR101175737B1 (ko) | 2010-12-14 | 2012-08-21 | 엠텍비젼 주식회사 | 결함 화소 처리 방법 및 장치 |
-
2013
- 2013-08-27 US US14/010,978 patent/US9258555B2/en active Active
- 2013-08-29 CN CN201310384874.7A patent/CN103685988B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050231617A1 (en) * | 2004-04-20 | 2005-10-20 | Canon Kabushiki Kaisha | Image processing apparatus for correcting captured image |
CN101335827A (zh) * | 2007-06-25 | 2008-12-31 | 华邦电子股份有限公司 | 使用定向检测方法的影像缺陷校正*** |
CN101365050A (zh) * | 2007-08-06 | 2009-02-11 | 联发科技股份有限公司 | 检测与校正缺陷像素的方法及装置 |
US20110001853A1 (en) * | 2009-07-01 | 2011-01-06 | Sato Ryuki | Solid-state imaging device and image defect correction processing circuit |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107016669A (zh) * | 2017-03-27 | 2017-08-04 | 福州瑞芯微电子股份有限公司 | 一种图像坏点检测方法和装置 |
CN107016669B (zh) * | 2017-03-27 | 2019-08-23 | 福州瑞芯微电子股份有限公司 | 一种图像坏点检测方法和装置 |
CN107820618A (zh) * | 2017-09-30 | 2018-03-20 | 深圳市汇顶科技股份有限公司 | 传感像素单元及光学指纹传感器 |
CN107820618B (zh) * | 2017-09-30 | 2022-05-17 | 深圳市汇顶科技股份有限公司 | 传感像素单元及光学指纹传感器 |
CN110827245A (zh) * | 2019-10-28 | 2020-02-21 | 上海悦易网络信息技术有限公司 | 一种检测屏幕显示断线的方法及设备 |
Also Published As
Publication number | Publication date |
---|---|
US20140063266A1 (en) | 2014-03-06 |
US9258555B2 (en) | 2016-02-09 |
CN103685988B (zh) | 2018-02-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8571346B2 (en) | Methods and devices for defective pixel detection | |
JP5311916B2 (ja) | 撮像装置 | |
EP3327666B1 (en) | Control method and electronic apparatus | |
WO2016031597A1 (ja) | 画像処理装置、画像処理方法、及び、画像処理システム | |
US20130229550A1 (en) | Defective pixel correction apparatus, method for controlling the apparatus, and program for causing computer to perform the method | |
US8698923B2 (en) | Image processing device, image processing method, and program for detecting and correcting defective pixel in image | |
US9030579B2 (en) | Image processing apparatus and control method that corrects a signal level of a defective pixel | |
CN103369347A (zh) | 相机瑕疵缺陷检测 | |
US8593546B2 (en) | Image processing apparatus, image processing method, and camera module for detecting and correcting defective pixels based on contrast and illuminance | |
TWI547169B (zh) | 影像處理方法與模組 | |
JP2007201530A (ja) | 画素欠陥補正装置 | |
JP4343988B2 (ja) | 欠陥画素補正装置及び欠陥画素補正処理方法 | |
CN103369265A (zh) | 像素信息管理装置及使用该管理装置的图像拍摄装置 | |
US9092845B2 (en) | Image processing device with defect correcting circuit and image processing method | |
CN102870402A (zh) | 成像设备和成像方法 | |
KR101945408B1 (ko) | 결함 화소 판정 장치 및 결함 화소 판정 방법 | |
CN103685988A (zh) | 用于确定缺陷像素的设备和方法 | |
US9497427B2 (en) | Method and apparatus for image flare mitigation | |
CN111669523A (zh) | 像素校正 | |
JP5600812B2 (ja) | 撮像装置 | |
US20150055861A1 (en) | Methods and Systems for Image Demosaicing | |
US8294771B2 (en) | Image correction device and image correction method thereof | |
JP6091807B2 (ja) | 欠陥画素判定装置および欠陥画素判定方法 | |
CN102316242B (zh) | 图像校正***及其校正方法 | |
JP6091808B2 (ja) | 欠陥画素判定装置および欠陥画素判定方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
EXSB | Decision made by sipo to initiate substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C53 | Correction of patent of invention or patent application | ||
CB02 | Change of applicant information |
Address after: Gyeongnam Changwon City, South Korea Applicant after: HANWHA TECHWIN Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Applicant before: Samsung Techwin Co.,Ltd. |
|
COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: SAMSUNG TAI KEWEI CO., LTD. TO: HANWHA TECHWIN CO., LTD. Free format text: CORRECT: ADDRESS; FROM: |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder |
Address after: Gyeongnam Changwon City, South Korea Patentee after: HANWHA AEROSPACE Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Patentee before: HANWHA TECHWIN Co.,Ltd. |
|
CP01 | Change in the name or title of a patent holder | ||
TR01 | Transfer of patent right |
Effective date of registration: 20190228 Address after: Gyeonggi Do city of South Korea Patentee after: HANWHA TECHWIN Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Patentee before: HANWHA AEROSPACE Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
CP01 | Change in the name or title of a patent holder |
Address after: Gyeonggi Do city of South Korea Patentee after: Hanhua Vision Co.,Ltd. Address before: Gyeonggi Do city of South Korea Patentee before: HANWHA TECHWIN Co.,Ltd. |
|
CP01 | Change in the name or title of a patent holder |