CN103559857A - Method and device for OLED screen pixel defect detection - Google Patents
Method and device for OLED screen pixel defect detection Download PDFInfo
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Abstract
The invention relates to a display screen detection device, in particular to a method and device for OLED screen pixel defect detection. The method includes the steps of placing an OLED screen on a detection platform, initializing a detection system, obtaining information, including an original image, of the detected OLED screen, conducting preprocessing on the original image when the original image is received, conducting rotating correction on a preprocessed original image when the preprocessed original image is received, conducting iteration processing on an original image obtained through rotating correction when the original image obtained through rotating corrosion is received, starting to conduct image segmentation on an original image obtained through iteration processing when the original image obtained through iteration processing is received, starting to compare images obtained through segmentation with the complete image to find out whether defects exist or not according to the received images obtained through segmentation, if not, continuing to detect the next OLED screen, and if yes, giving an alarm and positioning the defects.
Description
Technical field
The present invention relates to display screen pick-up unit, exactly, is a kind of method and device towards OLED screen image element defects detection.
Background technology
OLED (Organic Light Emitting Display) display of organic electroluminescence, emerges rapidly as the new lover of current demonstration circle.Because it has low-power consumption, wide visual angle, active illuminating, is easy to realize the advantages such as flexible manufacturing and is subject to people and more and more pays close attention to.Complicated technique makes product inevitably there will be small defect, and these tiny defects impact the display effect of OLED, in order to improve display quality and the yield rate of product.Must in the manufacture process of OLED, increase a defects detection link.
Yet, due to technique complicated in OLED production run, therefore cannot promote the development of OLED industry, main cause is as follows:
For the pollution of molecule in process for making, cause these defect hiding in the inside of OLED pixel, size is little, is generally tens microns, and seemingly, contrast is low and luminosity is inhomogeneous for gray scale and background classes.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind a kind of method towards OLED screen image element defects detection, is intended to solve the point defect that OLED causes in the pollution of the tiny microparticle of manufacture process.
Example of the present invention is achieved in that a kind of method towards OLED screen image element defects detection, comprising:
OLED screen is placed in detection platform, and initialization detection system, obtains the information that detected OLED shields, and described packets of information is containing original image;
When receiving original image, described original image is carried out to pre-service;
When receiving while carrying out pretreated original image, described pretreated original image is rotated to rectification;
When receiving the original image of rotation rectification, the original image that described rotation is corrected carries out iterative processing;
When receiving the original image of iterative processing, the original image of described iterative processing is started to image and cut apart;
Described in receiving, cut apart image, described image and the complete image cut apart started contrast and whether have defect, if not, continue the detection of next piece OLED screen; If so, report to the police and location defect position.
Another object of the embodiment of the present invention is to provide a kind of method towards OLED screen image element defects detection, comprising:
Described original image carries out pre-service, comprise original image is carried out to filtering and figure image intensifying, described filtering is that original image noise is filtered, and to keep the clear and complete of original image edge contour, described figure image intensifying be the enhancing to pixel node brightness and contrast in original image;
Described pretreated original image is rotated rectification, to obtain view picture original image border, according to described image boundary line, obtain head and the tail coordinate, according to coordinate computation, obtain the angle of view picture original image deflection, described original image is carried out to counter deflexion angular setting original image and be horizontal;
The original image that described rotation is corrected carries out iterative processing, comprise and extract template pixel and iteration Defect Search, original image after described template extraction is corrected according to rotation carries out pixel extraction in threshold range, and described iteration Defect Search is to utilize difference shadow method to carry out iteration to extracting rear pattern plate pixel;
The original image of described iterative processing starts image to be cut apart, and is Image Segmentation Using after utilizing K-mean cluster to iterative processing, finally gets defect cluster and the background cluster of image.
Another object of the embodiment of the present invention is to provide a kind of device towards OLED screen image element defects detection, comprising:
Acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
Pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and figure image intensifying to original image;
Rotation correcting unit, for being rotated rectification according to receiving pre-service original image;
Iteration unit, for carrying out iteration according to the original image receiving after rotation is corrected, described iteration comprises extracts template pixel and iteration Defect Search;
Cutting unit, for cutting apart according to the original image receiving after iteration;
Decision unit, for starting to contrast whether there is defect according to the original image and the complete image that receive after cutting apart, if not, continues the detection of next piece OLED screen; If so, report to the police and location defect position.
Another object of the embodiment of the present invention is to provide a kind of device towards OLED screen image element defects detection, comprising:
Described pretreatment unit also comprises filtering subelement and image enhanson, described filtering subelement is for filtering original image noise, and keeping the clear and complete of original image edge contour, described image enhanson is for the enhancing to the brightness of original image pixel node and contrast after filtering;
Described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, described extraction template pixel subelement is for carrying out pixel extraction in threshold range to correcting rear original image, and described iteration Defect Search subelement is for falling for difference shadow method and find out defect image according to extraction template pixel.
The invention has the beneficial effects as follows: reduced human factor, detected automatically, easily and efficiently the point defect that OLED causes in the pollution of the tiny microparticle of manufacture process, improved product quality, reduced the cost of following process.
Accompanying drawing explanation
A kind of realization flow figure towards OLED screen image element defect inspection method that Fig. 1 provides for the embodiment of the present invention;
A kind of realization flow figure towards OLED screen image element defect detecting device that Fig. 2 provides for the embodiment of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
As shown in Figure 1, a kind of realization flow figure towards OLED screen image element defect inspection method for the embodiment of the present invention provides, is implemented as follows:
In step S101, OLED screen is placed in detection platform, initialization detection system, obtains the information that detected OLED shields, and described packets of information is containing original image;
In this example, OLED screen is placed in detection platform, after clamping is fixing, energising is lighted, and initialization detection system starts CCD and carries out the collection of information, and described packets of information, containing original image, is transferred in computing machine.
In step S102, when receiving original image, described original image is carried out to pre-service.
In this example, due to illumination condition, information loss and noise in CCD photo-sensitive cell conversion accuracy and transmitting procedure, the original image that capital impact is obtained, particularly, when carrying out pre-service, adopt median filtering method, described method is nonlinear filtering method, can remove the noise of original image, and keep the clear and complete of image border profile, then, adopt IMAQ BCGLookup node to carry out original image enhancing, preferably, node control condition is by brightness location 128, contrast location 53.7, gamma factor location 1, described figure image intensifying is more clear to the pixel profile of each original image.
In step S103, when receiving while carrying out pretreated original image, described pretreated original image is rotated to rectification;
In this example, preferably, select IMAQ Find Horizontal Edge node, in order to improve the precision of detection boundaries, the step-length of sampling is made as 1 pixel, obtains view picture original image border, according to described image boundary line, obtains head and the tail coordinate, according to coordinate computation, obtain the angle of view picture original image deflection, described original image is carried out to counter deflexion angular setting original image and be horizontal.
In step S104, when receiving the original image of rotation rectification, the original image that described rotation is corrected carries out iterative processing;
In this example, owing to original image having been carried out to rotation before, correct, therefore image is now in complete level, and so every one-row pixels is all level, and each row pixel is also vertical simultaneously.Wherein rectangle frame represents pixel, and stain represents the border of pixel, and red point represents the pixel upper left corner, empty wire frame representation pixel coverage, and the algorithm model that extracts particularly template pixel is specific as follows:
On the horizontal line of the middle part of the first row pixel, extract horizontal boundary, extract border on then vertical at the middle part of a certain row pixel.
The method that adopts statistics to be averaging to horizontal boundary is tried to achieve the mean breadth of pixel, and same method is tried to achieve the average height of pixel.
The coordinate of the horizontal left margin of each pixel and vertical coboundary is combined, and the ，Yi upper left corner, border, the upper left corner that obtains pixel is basic point, extends the mean breadth of pixel to the right, to the average height of downward-extension pixel, just can obtain the scope of a pixel.
Continue to continue to use all pixel coverages of the method mark, accumulative total is added all pixel coverages, then tries to achieve mean value and obtains template pixel.
In step S105, when receiving the original image of iterative processing, the original image of described iterative processing is started to image and cut apart;
In this example, the original image that described rotation is corrected carries out iterative processing, comprise and extract template pixel and iteration Defect Search, original image after described template extraction is corrected according to rotation carries out pixel extraction in threshold range, and described iteration Defect Search is to utilize difference shadow method to carry out iteration to extracting rear pattern plate pixel.
In step S106, described in receiving, cut apart image, described image and the complete image cut apart started contrast and whether have defect, if not, continue the detection of next piece OLED screen; If so, report to the police and location defect position.
In this example, the original image of described iterative processing starts image and cuts apart, it is Image Segmentation Using after utilizing K-mean cluster to iterative processing, image is divided into K class, K belongs to the integer that is greater than 1, choose K pixel as the initial cluster center of each class, calculate each pixel to the distance of cluster centre, they are included into the class at that nearest cluster centre place.The class of new generation is recalculated to its average, by this average, upgrade cluster centre, so repeatedly, until be that following criterion function reaches minimum, declarative procedure convergence, has cut apart iteration, finally gets defect cluster and the background cluster of image.
A kind of realization flow figure towards OLED screen image element defect detecting device providing for the embodiment of the present invention is provided Fig. 2, is implemented as follows:
In step S201, acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
In step S202, pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and figure image intensifying to original image;
In step S2021, described pretreatment unit also comprises filtering subelement and image enhanson, and described filtering subelement is used for original image noise to filter, and keeps the clear and complete of original image edge contour,
In step S2022, described image enhanson is for the enhancing to the brightness of original image pixel node and contrast after filtering.
In step S203, rotation correcting unit, for being rotated rectification according to receiving pre-service original image;
In step S204, iteration unit, for carrying out iteration according to the original image receiving after rotation is corrected, described iteration comprises extracts template pixel and iteration Defect Search;
In step S2041, described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, and described extraction template pixel subelement is used for carrying out pixel extraction in threshold range to correcting rear original image,
In step S2042, described iteration Defect Search subelement is for falling for difference shadow method and find out defect image according to extraction template pixel.
In step S205, cutting unit, for cutting apart according to the original image receiving after iteration.
In step S206, decision unit, for starting to contrast whether there is defect according to the original image and the complete image that receive after cutting apart, if not, continues the detection of next piece OLED screen; If so, report to the police and location defect position.
The foregoing is only preferred embodiment of the present invention, in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (8)
1. towards a method for OLED screen image element defects detection, it is characterized in that, described method comprises:
OLED screen is placed in detection platform, and initialization detection system, obtains the information that detected OLED shields, and described packets of information is containing original image;
When receiving original image, described original image is carried out to pre-service;
When receiving while carrying out pretreated original image, described pretreated original image is rotated to rectification;
When receiving the original image of rotation rectification, the original image that described rotation is corrected carries out iterative processing;
When receiving the original image of iterative processing, the original image of described iterative processing is started to image and cut apart;
Described in receiving, cut apart image, described image and the complete image cut apart started contrast and whether have defect, if not, continue the detection of next piece OLED screen; If so, report to the police and location defect position.
2. a kind of method towards OLED screen image element defects detection according to claim 1, it is characterized in that, described original image carries out pre-service, comprise original image is carried out to filtering and figure image intensifying, described filtering is that original image noise is filtered, and to keep the clear and complete of original image edge contour, described figure image intensifying be the enhancing to pixel node brightness and contrast in original image.
3. a kind of method towards OLED screen image element defects detection according to claim 1, it is characterized in that, described pretreated original image is rotated rectification, to obtain view picture original image border, according to described image boundary line, obtain head and the tail coordinate, according to coordinate computation, obtain the angle of view picture original image deflection, described original image is carried out to counter deflexion angular setting original image and be horizontal.
4. a kind of method towards OLED screen image element defects detection according to claim 1, it is characterized in that, the original image that described rotation is corrected carries out iterative processing, comprise and extract template pixel and iteration Defect Search, original image after described template extraction is corrected according to rotation carries out pixel extraction in threshold range, and described iteration Defect Search is to utilize difference shadow method to carry out iteration to extracting rear pattern plate pixel.
5. a kind of method towards OLED screen image element defects detection according to claim 1, it is characterized in that, the original image of described iterative processing starts image to be cut apart, and is Image Segmentation Using after utilizing K-mean cluster to iterative processing, finally gets defect cluster and the background cluster of image.
6. towards a device for OLED screen image element defects detection, it is characterized in that, described device comprises:
Acquiring unit, for obtaining the information of detected OLED screen, described packets of information is containing original image;
Pretreatment unit, for carrying out pre-service according to receiving original image, described pre-service comprises carries out filtering and figure image intensifying to original image;
Rotation correcting unit, for being rotated rectification according to receiving pre-service original image;
Iteration unit, for carrying out iteration according to the original image receiving after rotation is corrected, described iteration comprises extracts template pixel and iteration Defect Search;
Cutting unit, for cutting apart according to the original image receiving after iteration;
Decision unit, for starting to contrast whether there is defect according to the original image and the complete image that receive after cutting apart, if not, continues the detection of next piece OLED screen; If so, report to the police and location defect position.
7. a kind of device towards OLED screen image element defects detection according to claim 6, it is characterized in that, described pretreatment unit also comprises filtering subelement and image enhanson, described filtering subelement is for filtering original image noise, and keeping the clear and complete of original image edge contour, described image enhanson is for the enhancing to the brightness of original image pixel node and contrast after filtering.
8. a kind of device towards OLED screen image element defects detection according to claim 6, it is characterized in that, described iteration unit also comprises extracts template pixel subelement and iteration Defect Search subelement, described extraction template pixel subelement is for carrying out pixel extraction in threshold range to correcting rear original image, and described iteration Defect Search subelement is for falling for difference shadow method and find out defect image according to extraction template pixel.
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| WO2016095318A1 (en) * | 2014-12-16 | 2016-06-23 | 深圳市华星光电技术有限公司 | Method for automatically detecting display panel defect |
| CN106782233A (en) * | 2015-11-20 | 2017-05-31 | 宁波舜宇光电信息有限公司 | Oled display screen detecting system and its application |
| CN107103865A (en) * | 2017-04-10 | 2017-08-29 | 青岛海信电器股份有限公司 | The method and apparatus for detecting viewing area in display screen |
| CN107516482A (en) * | 2017-08-29 | 2017-12-26 | 深圳市佳彩光电科技有限公司 | A kind of OLED screen detection compensation method based on ARM |
| CN108107611A (en) * | 2016-11-24 | 2018-06-01 | 研祥智能科技股份有限公司 | A kind of adaptive defect inspection method, device and electronic equipment |
| CN109743565A (en) * | 2018-12-14 | 2019-05-10 | 华南智能机器人创新研究院 | More equipment cooperations are automatic to obtain the method and system for stablizing image |
| CN109765245A (en) * | 2019-02-25 | 2019-05-17 | 武汉精立电子技术有限公司 | Large scale display screen defects detection localization method |
| CN110174414A (en) * | 2019-07-03 | 2019-08-27 | 厦门特仪科技有限公司 | A kind of Micro-OLED product optical detection apparatus and wafer chip detection method |
| CN110517231A (en) * | 2019-08-13 | 2019-11-29 | 云谷（固安）科技有限公司 | Shield the detection method and device of body showing edge |
| CN110517616A (en) * | 2019-09-10 | 2019-11-29 | 浙江晶鲸科技有限公司 | A kind of OLED display screen bad point exposure mask positioning system |
| CN113469944A (en) * | 2021-06-03 | 2021-10-01 | 厦门宏泰智能制造有限公司 | Product quality inspection method and device and electronic equipment |
| CN113724652A (en) * | 2021-08-25 | 2021-11-30 | 深圳贝尔信息科技有限公司 | Compensation method and device for Mura of OLED display panel and readable medium |
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| CN113469944A (en) * | 2021-06-03 | 2021-10-01 | 厦门宏泰智能制造有限公司 | Product quality inspection method and device and electronic equipment |
| CN113724652A (en) * | 2021-08-25 | 2021-11-30 | 深圳贝尔信息科技有限公司 | Compensation method and device for Mura of OLED display panel and readable medium |
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