CN103512653A - Device capable of measuring spin Hall effect of reflected light - Google Patents
Device capable of measuring spin Hall effect of reflected light Download PDFInfo
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- CN103512653A CN103512653A CN201210227366.3A CN201210227366A CN103512653A CN 103512653 A CN103512653 A CN 103512653A CN 201210227366 A CN201210227366 A CN 201210227366A CN 103512653 A CN103512653 A CN 103512653A
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- hall effect
- spin hall
- catoptrical light
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Abstract
The invention discloses a device capable of measuring the spin Hall effect of reflected light. The device comprises a laser, Glan laser polarizers, tunable liquid crystal wave plates, right-angled prisms, a cylindrical glass rod with grooves, fine-tuning platforms, a 1/4 wave plate, an imaging lens and an image sensor all of which are arranged sequentially and form a compound structure. The position of the cylindrical glass rod with the grooves is fine tuned through the fine-tuning platforms repeatedly, and the spin Hall effect of the reflected light is measured in a high-precision mode. Meanwhile, a plurality of small samples can be researched and analyzed conveniently by the rotation of the fine-tuning platforms.
Description
Technical field
What the present invention relates to is a kind of optical measuring device of thermometrically technical field, specifically a kind of device of measuring catoptrical light spin Hall effect.
Background technology
In recent years, along with the continuous research of classical Hall effect is goed deep into, it is found that a kind of novel Hall effect--spin Hall effect, the particularly light of uncharged particle photon spin Hall effect (Spin Hall Effect ofLight, SHEL).But the dependence test measuring equipment of the Hall effect of light spin at present but can not meet current research needs.
Through the retrieval of prior art is found, Bliokh KY, Niv A, Kleiner V, the people such as Hasman E are in Nature Photonics2 (12), pp748-753,2008 write articles " Geometrodynamics of spinning light " (gemetrodynamics of light spin), SHEL experimental provision when this technology has proposed that a measuring beam transmits in cylindrical glass rod, but this device can only be tested thicker glass bar, in the time of for the aligning of the higher optical fiber of accuracy requirement, can run into larger difficulty.So in actual use, this device dirigibility is not enough, should use and be subject to more restriction.
China application number CN201010199392.0, application publication number CN102194487A, in this patent, disclose a kind of photon echo devices and methods therefor, its object is to solve limited echo efficiency problem, can overcome existing restriction storage time that is limited to spin phase shift time.But do not take measures on customs clearance to strengthen the precision of measuring light spin Hall effect.
U.S. Patent number: US8,088,615, " Optical component for observing a nanometric sample; system comprising same; analysis method using same; and uses thereof " (optical element and the use thereof of analysis and observation nanoscale sample), this technology discloses a kind of relating to for observing the optical module of nanoscale sample, index plate comprising a substrate and predetermined thickness, can obtain higher image contrast and precision.But there is no the application of explanation aspect measurement light spin Hall effect.
To sum up, although the device of light spin Hall effect has obtained certain research, in document, have no the device that report can high precision measurement light spin Hall effect.
Summary of the invention
The present invention is directed to prior art above shortcomings, a kind of device of measuring catoptrical light spin Hall effect is provided, use this device can obtain higher precision, and can make research object obtain certain expansion.
The present invention is achieved by the following technical solutions, the present invention includes: set gradually and form composite structure laser instrument, Glan laser polarization mirror, tunable liquid crystal wave plate, right-angle prism, be with reeded cylindrical glass rod, fine adjustment stage, quarter wave plate, imaging len, imageing sensor.
Described laser instrument is that wavelength is the ultraviolet laser (Nd:YVO of 355nm
4crystal is as gain media).
Described is the glass bar that marks the different semicircle grooves of diameter on cylindrical glass rod with reeded cylindrical glass rod.
The described diameter with reeded cylindrical glass rod fovea superior grain is 100-1000 μ m.
Described fine adjustment stage can make to be with reeded cylindrical glass rod around its axis of symmetry rotation.
The axis of symmetry rotational speed of the described reeded cylindrical glass rod of fine adjustment stage strip winding is 0.01-0.2rad/s.
Described fine adjustment stage can be used the speed of 30 μ m/s to finely tune in the horizontal direction.
Reeded cylindrical glass rod and fine adjustment stage are with in utilization of the present invention, meeting on the test basis of traditional cylindrical glass bar, can also in groove, place the optical fiber of different-diameter and study, adding the adjustment of fine adjustment stage, higher precision be can obtain, more material and sample tested.
To sum up, the present invention is simple in structure, easy to use, during use, only the cylindric material of the different thicknesses that will study need to be placed in groove, just can carry out test and the research of the light spin Hall effect of degree of precision.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Below embodiments of the invention are elaborated, the present embodiment is implemented take technical solution of the present invention under prerequisite, provided detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following embodiment.
As shown in Figure 1, the device of measuring catoptrical light spin Hall effect described in the present embodiment comprises: laser instrument 1, Glan laser polarization mirror 2, tunable liquid crystal wave plate 3, right-angle prism 4, the groove 6 with on reeded cylindrical glass rod 5, glass bar, fine adjustment stage 7, quarter wave plate 8, imaging len 9, imageing sensor 10.
In the present embodiment, described laser instrument 1 is that wavelength is the ultraviolet laser (Nd:YVO of 355nm
4crystal is as gain media).
In the present embodiment, described Glan laser polarization mirror 2 is 2-5 group.
In the present embodiment, described tunable liquid crystal wave plate 3 is 2-5 group.
In the present embodiment, described is the glass bars that mark the different semicircle grooves of diameter on cylindrical glass rod with reeded cylindrical glass rod 5.
In the present embodiment, the described reeded cylindrical glass rod 5 of being with can be around its axis of symmetry rotation.
In the present embodiment, described to be with reeded cylindrical glass rod 5 rotational speeies be 0.01-0.2rad/s.
In the present embodiment, the diameter of the groove 6 on described glass bar is 100-1000 μ m.
In the present embodiment, the quantity of the groove 6 on described glass bar is 1-100.
In the present embodiment, described fine adjustment stage 7 can be used the speed of 30-500 μ m/s to finely tune in the horizontal direction.
The principle of work of the present embodiment is: for the catoptrical light spin of the measurement Hall effect of degree of precision, use fine adjustment stage repeatedly to finely tune and be with reeded cylindrical glass Bang position, until imageing sensor obtains good output.For the more tiny sample to similar optical fiber carries out high precision measurement, designed and can fix the groove of its position, then coordinated the adjustment of fine adjustment stage, can to tiny sampler, carry out research and analysis comparatively easily.
As shown in table 1, it is as shown in the table for the application request of the present embodiment.
Table 1 can be measured one group of modular design parameter of device of catoptrical light spin Hall effect
| Laser wavelength (nm) | 355 |
| Glan laser polarization mirror quantity (group) | 2 |
| Tunable liquid crystal wave plate quantity (group) | 2 |
| Be with reeded |
0.01 |
| The diameter of the groove on glass bar (μ m) | 100 |
| The quantity of the groove on glass bar (individual) | 20 |
| Fine adjustment stage speed (μ m/s) in the horizontal direction | 30 |
To sum up, comprehensive utilization fine adjustment stage be with reeded cylindrical glass rod, the catoptrical light spin of measurement Hall effect that can degree of precision, and utilize the rotation of fine adjustment stage, can carry out research and analysis to a plurality of tiny samplers easily.
Although content of the present invention has been done detailed introduction by above preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.Those skilled in the art, read after foregoing, for multiple modification of the present invention with to substitute will be all apparent.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (8)
1. can measure a device for catoptrical light spin Hall effect, set gradually and form composite structure laser instrument, Glan laser polarization mirror, tunable liquid crystal wave plate, right-angle prism, be with reeded cylindrical glass rod, fine adjustment stage, quarter wave plate, imaging len, imageing sensor.
2. the device of measuring catoptrical light spin Hall effect according to claim 1, is characterized in that, described laser instrument is that wavelength is the ultraviolet laser of 355nm.
3. according to the device of measuring catoptrical light spin Hall effect described in claim 1,2, it is characterized in that, the quantity of described Glan laser polarization mirror is 2-5 group.
4. according to the device of measuring catoptrical light spin Hall effect described in claim 1,2, it is characterized in that, the quantity of described tunable liquid crystal wave plate is 2-5 group.
5. the device of measuring catoptrical light spin Hall effect according to claim 1, is characterized in that, described to be with reeded cylindrical glass rod rotational speed be 0.01-0.2rad/s.
6. the device of measuring catoptrical light spin Hall effect according to claim 1, is characterized in that, the diameter of the groove on described glass bar is 100-1000 μ m.
7. the device of measuring catoptrical light spin Hall effect according to claim 1, is characterized in that, the quantity of the groove on described glass bar is 1-100.
8. the device of measuring catoptrical light spin Hall effect according to claim 1, is characterized in that, described fine adjustment stage can be used the speed of 30-500 μ m/s to finely tune in the horizontal direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210227366.3A CN103512653B (en) | 2012-06-29 | 2012-06-29 | A kind of device of the light logic gates measuring reflection light |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210227366.3A CN103512653B (en) | 2012-06-29 | 2012-06-29 | A kind of device of the light logic gates measuring reflection light |
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| CN103512653A true CN103512653A (en) | 2014-01-15 |
| CN103512653B CN103512653B (en) | 2016-12-21 |
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| CN201210227366.3A Expired - Fee Related CN103512653B (en) | 2012-06-29 | 2012-06-29 | A kind of device of the light logic gates measuring reflection light |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104569622A (en) * | 2014-12-24 | 2015-04-29 | 复旦大学 | Efficient microwave polarization detection device based on photonic spin Hall effect |
| CN107807320A (en) * | 2017-09-27 | 2018-03-16 | 福州大学 | Distinguish that the photic inverse logic gates of semiconductor are intrinsic and the method for extrinsic mechanism |
| CN107843198A (en) * | 2017-10-18 | 2018-03-27 | 天津大学 | A kind of device for being used to measure the division displacement of light logic gates |
| CN109443554A (en) * | 2018-12-11 | 2019-03-08 | 深圳大学 | A kind of wavelength measuring apparatus and method based on graphene light logic gates |
| CN110412490A (en) * | 2019-08-15 | 2019-11-05 | 四川大学 | A kind of strip magnetic measurement method based on light logic gates |
| CN111929627A (en) * | 2020-06-28 | 2020-11-13 | 成都信息工程大学 | Thermo-optic spinning Hall effect regulation and control device and response sensitivity measuring and calculating method |
| CN113030016A (en) * | 2021-03-04 | 2021-06-25 | 湖南理工学院 | Weak measurement-based method for identifying type of Wilson semimetal and measuring inclination of Wilson cone |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3329375A1 (en) * | 1982-11-18 | 1984-05-24 | General Electric Co., Schenectady, N.Y. | OPTICAL PROBE |
| US5760586A (en) * | 1994-12-01 | 1998-06-02 | Bruker Analytische Messtechnik | Nuclear magnetic resonance spectrometer |
| CN1270674A (en) * | 1997-09-17 | 2000-10-18 | 单一检索有限公司 | Electron devices for single electron and nuclear spin measurement |
| US7016523B1 (en) * | 1999-04-21 | 2006-03-21 | Hiroyuki Ogawa | Method for observing object by projection, method for detecting microorganisms and projection detecting system |
| GB2442752A (en) * | 2006-10-10 | 2008-04-16 | Univ Plymouth | Analysis of carrier spin polarisation using the Spin Hall Effect |
| CN101738374A (en) * | 2008-11-20 | 2010-06-16 | 株式会社日立制作所 | Spin-polarized charge carrier device |
| CN101832786A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Integrated Hall-effect sensor |
| CN101832785A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Regulatable Hall effect sensor |
| CN102194487A (en) * | 2010-03-12 | 2011-09-21 | 仁荷大学校产业协力团 | Optically locked photon echo apparatus and method |
-
2012
- 2012-06-29 CN CN201210227366.3A patent/CN103512653B/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3329375A1 (en) * | 1982-11-18 | 1984-05-24 | General Electric Co., Schenectady, N.Y. | OPTICAL PROBE |
| US5760586A (en) * | 1994-12-01 | 1998-06-02 | Bruker Analytische Messtechnik | Nuclear magnetic resonance spectrometer |
| CN1270674A (en) * | 1997-09-17 | 2000-10-18 | 单一检索有限公司 | Electron devices for single electron and nuclear spin measurement |
| US7016523B1 (en) * | 1999-04-21 | 2006-03-21 | Hiroyuki Ogawa | Method for observing object by projection, method for detecting microorganisms and projection detecting system |
| GB2442752A (en) * | 2006-10-10 | 2008-04-16 | Univ Plymouth | Analysis of carrier spin polarisation using the Spin Hall Effect |
| CN101738374A (en) * | 2008-11-20 | 2010-06-16 | 株式会社日立制作所 | Spin-polarized charge carrier device |
| CN102194487A (en) * | 2010-03-12 | 2011-09-21 | 仁荷大学校产业协力团 | Optically locked photon echo apparatus and method |
| CN101832786A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Integrated Hall-effect sensor |
| CN101832785A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Regulatable Hall effect sensor |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104569622A (en) * | 2014-12-24 | 2015-04-29 | 复旦大学 | Efficient microwave polarization detection device based on photonic spin Hall effect |
| CN104569622B (en) * | 2014-12-24 | 2017-07-07 | 复旦大学 | Polarized microwave detection means based on spin of photon Hall effect |
| CN107807320A (en) * | 2017-09-27 | 2018-03-16 | 福州大学 | Distinguish that the photic inverse logic gates of semiconductor are intrinsic and the method for extrinsic mechanism |
| CN107807320B (en) * | 2017-09-27 | 2019-12-31 | 福州大学 | Method for distinguishing intrinsic and extrinsic mechanisms of semiconductor photoinduced inverse spin Hall effect |
| CN107843198A (en) * | 2017-10-18 | 2018-03-27 | 天津大学 | A kind of device for being used to measure the division displacement of light logic gates |
| CN109443554A (en) * | 2018-12-11 | 2019-03-08 | 深圳大学 | A kind of wavelength measuring apparatus and method based on graphene light logic gates |
| CN109443554B (en) * | 2018-12-11 | 2020-08-11 | 深圳大学 | Wavelength measuring device and method based on graphene optical spin Hall effect |
| CN110412490A (en) * | 2019-08-15 | 2019-11-05 | 四川大学 | A kind of strip magnetic measurement method based on light logic gates |
| CN110412490B (en) * | 2019-08-15 | 2020-11-24 | 四川大学 | Magnetic measurement method based on optical spin Hall effect |
| CN111929627A (en) * | 2020-06-28 | 2020-11-13 | 成都信息工程大学 | Thermo-optic spinning Hall effect regulation and control device and response sensitivity measuring and calculating method |
| CN113030016A (en) * | 2021-03-04 | 2021-06-25 | 湖南理工学院 | Weak measurement-based method for identifying type of Wilson semimetal and measuring inclination of Wilson cone |
| CN113030016B (en) * | 2021-03-04 | 2022-08-30 | 湖南理工学院 | Weak measurement-based method for identifying type of Wilson semimetal and measuring inclination of Wilson cone |
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Inventor after: Shu Yuhang Inventor before: Kang Xiaoyang |
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Effective date of registration: 20170811 Address after: No. 1 double park 224000 Dagang Dagang Town in Jiangsu province Yancheng City Chengxiang District Road No. 2 (F) Patentee after: Yancheng promise Machinery Co., Ltd. Address before: 312500 Xinchang City, Shaoxing Province, Qixing street, Zhejiang, the Yangtze River Road, No. 1 Jiangnan tea market B3 building, 2011 Co-patentee before: Kang Xiaoyang Patentee before: Xinchang County Guanyang Technology Development Co., Ltd. |
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