CN103186798B - A kind of IC-card production test system - Google Patents
A kind of IC-card production test system Download PDFInfo
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- CN103186798B CN103186798B CN201110444005.XA CN201110444005A CN103186798B CN 103186798 B CN103186798 B CN 103186798B CN 201110444005 A CN201110444005 A CN 201110444005A CN 103186798 B CN103186798 B CN 103186798B
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Abstract
The present invention relates to a kind of IC-card production test system.The IC-card production test system includes:Test device, for testing IC-card;Authentication device, for being authenticated to IC-card;Control device, for being controlled to the test device and the authentication device, and passes to the authentication device by the authentication information of IC-card and the authentication information of the authentication device is passed into IC-card.The IC-card production test system of the present invention, the authentication by authentication device to IC-card can prevent the critical data of IC-card to be stolen, and improve production environment to the security in terms of the protection of IC-card critical data, and easy to operate.Moreover, the IC-card production test system of the present invention, can detect the upper electric current of IC-card, prevent electric current excessive and tested IC-card or test device are caused damage, play good short-circuit protection effect.
Description
Technical field
The present invention relates to the communications field, more particularly to a kind of IC-card production test system.
Background technology
SD card is a kind of memory device of new generation based on semiconductor fast-flash memory device, and it is widely used in portable
On device, such as digital camera, mobile phone, multimedia player.At present, various new SD cards are continuously emerged, such as band is penetrated
RFID-SD cards, SD-KEY with encryption function of frequency function etc., have been applied in actual life.SD card shipment with
Before be required for being detected, this detection is referred to as production test, after detection, and COS is downloaded to detecting in qualified SD card（Card
Operating System, card operating system）, need download several particular with RFID-SD, SD-KEY of New function etc.
COS, and COS is typically all critical data in card, it is necessary to be protected by, to prevent critical data from being stolen by others.But at present
Production environment the protection of critical data is also mainly carried out by system and specified Workplace, security and operability are all
It is poor.
It is the same with SD card, other IC-cards（Such as SIM card）There is also it is same the problem of, i.e. production environment is crucial to IC-card
There is potential safety hazard in terms of the protection of data, and operability is poor.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of IC-card production test system, improve production environment to IC-card
Security in terms of the protection of critical data.
In order to solve the above technical problems, the present invention proposes a kind of IC-card production test system, including：
Test device, for testing IC-card;
Authentication device, for being authenticated to IC-card;
Control device, believes for being controlled to the test device and the authentication device, and by the certification of IC-card
Breath passes to the authentication device and the authentication information of the authentication device is passed into IC-card
Further, above-mentioned IC-card production test system can also have the characteristics that, the authentication device is USB-KEY.
Further, above-mentioned IC-card production test system can also have the characteristics that, the control device is computer.
Further, above-mentioned IC-card production test system can also have the characteristics that the authentication device includes：
Authentication module, for receiving the authentication information of IC-card and handling the authentication information;
Logging modle, for recording test result of the test device to IC-card, test result is qualified IC-card number
Amount, test result are underproof IC-card quantity and the IC-card total amount tested by the test device；
Authorization module, the licensed-type production quantity for preserving IC-card, calculates the licensed-type production quantity and the logging modle
The difference of the IC-card total amount of the process test device test of record, the production when the difference is not zero to IC-card is awarded
Power；
Secure storage module, the private data for receiving and storing IC-card.
Further, above-mentioned IC-card production test system can also have the characteristics that the test device includes：
Current detection module, is detected for the upper electric current to IC-card;
Card reader, the data transfer for IC-card to be sent is sent to the control device, and by the control device
Data transfer to IC-card；
Main control module, for controlling the current detection module and the card reader.
Further, above-mentioned IC-card production test system can also have the characteristics that, the main control module, electric current inspection
Survey module and the card reader is arranged on same circuit board.
Further, above-mentioned IC-card production test system can also have the characteristics that, the main control module and the electric current
Detection module is arranged on first circuit board, and the card reader is arranged on second circuit board, the second circuit board with it is described
First circuit board is connected by contact pin.
Further, above-mentioned IC-card production test system can also have the characteristics that the test device also includes：
Switch, for being powered or powering off to the card reader under the control of the main control module;
Interface epitaxial membrane, for connecting IC-card and the card reader.
Further, above-mentioned IC-card production test system can also have the characteristics that, the test device also includes USB set
Line device, the usb hub is used to connect the main control module and the control device, and connects the card reader and described
Control device.
Further, above-mentioned IC-card production test system can also have the characteristics that, the number of the current detection module
To be one or more, the number of the card reader is equal with the number of the current detection module.
Further, above-mentioned IC-card production test system can also have the characteristics that, the IC-card is smart card or storage
Card, the smart card is SIM card, usim card or UIM cards, and the storage card is SD card, TF cards or mmc card.
The IC-card production test system of the present invention, the authentication by authentication device to IC-card can prevent IC-card
Critical data is stolen, and improves production environment to the security in terms of the protection of IC-card critical data, and easy to operate.And
And, IC-card production test system of the invention can detect the upper electric current of IC-card, prevent electric current excessive to tested IC-card or survey
Trial assembly, which is put, to cause damage, and plays good short-circuit protection effect.
Brief description of the drawings
Fig. 1 is the structured flowchart of IC-card production test system in the embodiment of the present invention；
Fig. 2 is a kind of structured flowchart of test device 110 in Fig. 1；
Fig. 3 is another structured flowchart of test device 110 in Fig. 1；
Fig. 4 is a kind of structured flowchart of authentication device 120 in Fig. 1；
Fig. 5 is the identifying procedure figure of IC-card production test system in the embodiment of the present invention.
Embodiment
The principle and feature of the present invention are described below in conjunction with accompanying drawing, the given examples are served only to explain the present invention, and
It is non-to be used to limit the scope of the present invention.
Fig. 1 is the structured flowchart of IC-card production test system in the embodiment of the present invention.As shown in figure 1, in the present embodiment, IC
Card production test system 10 includes test device 110, authentication device 120 and control device 130.Wherein, test device 110 is used for
IC-card is tested, authentication device 120 is used to be authenticated IC-card, and control device 130 is used for test device 110 and recognized
Card device 120 is controlled, and the authentication information of IC-card is passed into authentication device 120 and the certification by authentication device 120
Information transmission is to IC-card.
It can be communicated between control device 130 and test device 110 by USB interface.Control device 130 and certification
It can also be communicated between device 120 by USB interface.IC-card to be measured can be entered by 7816 interfaces with test device 110
Row communication.When IC-card to be measured is SD card, SD card can be communicated by SD interface with test device 110.
Wherein, test device 110 can be DUT（Device Under Test, equipment test）Plate.
Wherein, authentication device 120 can be USB-KEY, and USB-KEY is a kind of widely used encryption key, can be right
The critical data of IC-card is protected.Access data are typically all to use FLASH inside USB-KEY, and FLASH is to have the life-span
, typically at 100,000 times or so.When with USB-KEY as authentication device, a specific algorithm can be designed, FLASH
Each block make full use of to increase USB-KEY service life.
Wherein, control device 130 can be computer, such as PC.
Wherein, IC-card both can be the smart cards such as SIM card, usim card, UIM cards, or SD card, TF cards, MMC（It is many
Media card）The storage cards such as card.And IC-card both can be standard IC-card or the extension IC-card with what's new.Example
Such as, SD card can be the extension SD card such as standard SD card or RFID-SD cards, SD-KEY with New function.RFID's contains
Justice is radio frequency identification.
The test content that test device 110 is carried out can be depending on the particular type and concrete structure according to IC-card.Test
Device 110 can be tested the hardware module of each in IC-card.User can be according to the particular type and tool of IC-card to be measured
Body structure writes test program, is stored in control device 130, before being tested, by control device 130 by test program
Test device 110 is sent to, that is, test device 110 downloads test program from control device 130.
Especially, for the RF IC card with radio-frequency enabled（Such as RFID-SD cards, RFID-SIM cards）Deng extension IC
Card, test device 110 adds the function of current detecting, can complete the testing current of IC-card under various regimes.Pass through electricity
Stream detection, can play good short-circuit protection effect to the hardware circuit of IC-card.IC-card and the IC-card production test of the present invention
After system is connected, IC-card production test system detects the upper electric current of IC-card first, can be IC if upper electric current anomaly
Card power-off, is caused damage with preventing electric current excessive to tested IC-card or test device 110, especially for the IC-card of short circuit.
User can also download according to the particular type of IC-card to be measured to write critical data, be stored in control device
In 130, before being tested, critical data is downloaded by control device 130 and sends authentication device 120 to, that is, certification
Device 120 is downloaded critical data from control device 130 and downloaded.After test device 110 terminates to the test of IC-card,
Authentication device 120 carries out authentication to IC-card under the control of control device 130, and whether test IC-card is legal, confirms IC-card
After legal, just start critical data and download, by critical data（Such as COS data）Ciphertext download in IC-card, IC-card
Receive and decrypted after ciphertext, obtained plaintext is write inside card.The plaintext of so critical data is not appeared in inside card
Place in addition, ensure that the security of critical data very well.If after authentication device 120 is authenticated to IC-card, judged
IC-card is illegal, then will not download to critical data in IC-card.It can be seen that, the certification of authentication device 120 improves production environment
To the security in terms of the protection of IC-card critical data, it is ensured that the safety download of IC-card critical data.Authentication device 120 is to IC-card
Certification both can be authentication device 120 to two-way between the unilateral authentication or authentication device 120 and IC-card of IC-card
Certification.Authentication mode, AES employed in authentication device 120 etc. can use any available authentication mode and encryption
Algorithm.In verification process, the authentication information between authentication device 120 and IC-card is transmitted by control device 130.
Fig. 2 is a kind of structured flowchart of test device 110 in Fig. 1.As shown in Fig. 2 in the present embodiment, test device 110
Current detection module 111, card reader 112 and main control module 113 can be included.Wherein, current detection module 111 is used for IC-card
Upper electric current detected.Card reader 112 is used for the data transfer for sending IC-card to control device 130, and will control
The data transfer that device 130 is sent is to IC-card.Main control module 113 is used for control electric current detection module 111 and card reader 112.Electricity
It can be communicated between stream detection module 111 and main control module 113 by SPI interface.Card reader 112 and main control module 113
Between can by switch be connected.
In one embodiment of the invention, main control module 113, current detection module 111 and card reader 112 can be set
In on same circuit board.
In another embodiment of the present invention, main control module 113 and current detection module 111 are arranged at first circuit board
On, card reader 112 is arranged on second circuit board, and second circuit board is connected with first circuit board by contact pin.So, if read
Card device, which goes wrong, to break down, it is possible to timely and conveniently changes card reader, and without changing whole test device, had both reduced survey
Examination cost improves testing efficiency again.
Fig. 3 is another structured flowchart of test device 110 in Fig. 1.Test device 110 shown in Fig. 3 is used for SD card
Test.
As shown in figure 3, compared with the test device shown in Fig. 2, in the present embodiment, test device 110 can also include opening
Close 114.Switch 114 is used to be powered or power off to card reader 112 under the control of main control module 113.Switch 114 and card reader
Connected, connected between switch 114 and main control module 113 also by I/O pins by I/O pins between 112.Card reader 112 is led to
USB-HUB is crossed to be connected with control device 130.During work, control device 130（Such as PC）Directly control card reader 112 is to SD
Card is operated.Once control device 130 detects some operation irregularity of card reader 112, control device 130 will send order
To main control module 113, the order that then parsing of main control module 113 control device 130 is sent, after parsing, control module 113 passes through
Controlling switch 114 is re-powered corresponding card reader 112.The steady operation of test device 110 is so ensured that, is carried
The high reliability of test device 110.
Again as shown in figure 3, compared with the test device shown in Fig. 2, in the present embodiment, test device 110 can also include
SD card interface epitaxial membrane 115, such as SD card interface epitaxial membrane 115 can be SD card interface contact pins.SD card interface epitaxy part
Part 115 is used to connect SD card and card reader 112.One end of SD card interface epitaxial membrane 115 connects the SD interface of card reader 112,
The other end connects SD card.The receiving space of test device 110 is limited, if without SD card interface epitaxial membrane 115, in test
SD card will be directly inserted into the card reader 112 of test device 110, and so will certainly further reduce test device 110
Receiving space, and inconvenient operation, particularly in the case where test device 110 includes multiple card reader 112, this drawback
With regard to more obvious.There is SD card interface epitaxial membrane 115, SD card interface epitaxial membrane 115 just can be by the interface of card reader 112
The outside of test device 110 is extended to, SD card can be just connected on SD card interface epitaxial membrane 115 in test, pass through SD
Card interface epitaxial membrane 115 is connected with card reader 112, adds the convenience of operation.
Again as shown in figure 3, compared with the test device shown in Fig. 2, in the present embodiment, test device 110 can also include
USB HUB（Hub）116, USB HUB116 are used to connect main control module 113 and control device 130, and connection card reader
112 and control device 130.The USB interface limited amount of control device 130, therefore the quantity of card reader 112 that can be connected also has
Limit, which greatly limits testing efficiency, because the quantity of card reader 112 that can be connected with control device 130 is more, can enter simultaneously
The SD card of row test is more.USB HUB116 can expand the USB interface quantity of control device 130 so that control device 130
It can be connected simultaneously with multiple card reader 112, therefore, it is possible to test multiple SD cards simultaneously, improve testing efficiency.
Again as shown in figure 3, compared with the test device shown in Fig. 2, in the present embodiment, there is 8 groups of Hes of current detection module 111
Card reader 112（Current detection module 111 is consistent with the quantity of card reader 112）, each group of current detection module 111 and card reader
112 can be tested a SD card, therefore the test device 110 shown in Fig. 3 can be tested 8 SD cards simultaneously,
Improve testing efficiency.The quantity of switch 114 and the quantity of SD card interface epitaxial membrane 115 are consistent with the quantity of card reader 112.
In other embodiments of the invention, the current detection module of any group of number can be set in test device 110 as needed
111 and card reader 112, and 8 groups of the specific number being not limited in the present embodiment.
Test device for being tested SIM card or other IC-cards can also use the test device 110 in Fig. 3
Structure, simply needs to be changed to the SD card interface epitaxial membrane in Fig. 3 into the IC-card interface epitaxial membrane of corresponding IC-card, for example with
In SIM card test, then need the SD card interface epitaxial membrane in Fig. 3 being changed to SIM card interface epitaxial membrane.
Fig. 4 is a kind of structured flowchart of authentication device 120 in Fig. 1.As shown in figure 4, in the present embodiment, authentication device 120
Authentication module 121 can be included, authentication module 121 is used to receive the authentication information of IC-card and the authentication information is handled.
Identity authentication function on authentication device 120 is above having been described, and is not repeated herein.
Again as shown in figure 4, in the present embodiment, authentication device 120 can also include logging modle 122, logging modle 122 is used
In recording test result of the test device to IC-card, test result is that qualified IC-card quantity, test result are unqualified
IC-card quantity and by the test device test IC-card total amount.
Again as shown in figure 4, in the present embodiment, authentication device 120 can also include authorization module 123, authorization module 123 is used
In the licensed-type production quantity for preserving IC-card, the process test device 110 that the licensed-type production quantity is recorded with logging modle 122 is calculated
The difference of the IC-card total amount of test, the production when the difference is not zero to IC-card is authorized.If for example, authorizing this secondary
1000 IC-cards are produced, then the IC-card total amount that the process test device 110 that logging modle 122 is recorded is tested is if 1000, then
Follow-up production will not be carried out.
Again as shown in figure 4, in the present embodiment, authentication device 120 can also include secure storage module 124, safety storage
Module 124 is used for the private data for receiving and storing IC-card, the critical data of such as IC-card.Can be first the critical data of IC-card
Ciphertext be put into secure storage module 124, when download again from secure storage module 124 export come, so to IC-card
Critical data serve safer protective effect, and the renewal of more convenient IC-card data.
Below by taking the SD card production test system that USB-KEY, DUT board and PC are constituted as an example, illustrate the IC-card of the present invention
Verification process of the production test system to IC-card.
Fig. 5 is the identifying procedure figure of IC-card production test system in the embodiment of the present invention.Before certification, by USB-KEY
It is connected on PC.As shown in figure 5, in the present embodiment, the identifying procedure of SD card production test system includes：
Step 501, PC waits SD card to be installed in DUT board；
Step 502, PC judges whether SD card has been installed in DUT board, if then performing step 503, otherwise performs step
Rapid 501；
Step 503, PC reads the quantity of SD card in USB-KEY；
Step 504, PC judges whether the quantity of SD card in USB-KEY is more than 0, if then performing step 505, otherwise holds
Row step 501；
Step 505, PC downloads authentication procedure and sends authentication command to SD card；
Step 506, SD card, which is received, produces the first random number after authentication command；
Step 507, the first random number of generation is sent to PC by SD card；
Step 508, the first random number is sent to USB-KEY by PC；
Step 509, USB-KEY itself produces the second random number, is encrypted after combine with the first random number of SD card and obtains the
One ciphertext；
Step 510, USB-KEY sends the first ciphertext to PC；
Step 511, PC is transmitted to SD card after receiving the first ciphertext；
Step 512, SD card is received after the first ciphertext, and the first ciphertext is decrypted, and is then judged in the plaintext after decryption
Whether there is the first random number, if then performing step 513, otherwise perform step 501；
Step 513, SD card replaces the first random number in the plaintext after decryption with 0, and the is obtained after re-encrypted plaintext
Two ciphertexts, PC is together transmitted to by the judged result of the second ciphertext and step 512；
Step 514, PC receives whether certification of second ciphertext with judging SD card after the judged result of step 512 passes through；
Step 515, step 516 is performed if if the certification of SD card, otherwise performs step 501；
Step 516, the second ciphertext is transmitted to USB-KEY by PC；
Step 517, the second ciphertext is decrypted USB-KEY, judges whether there is the second random number in the plaintext after decryption,
Certification passes through if having；
Step 518, authentication result is issued PC by USB-KEY；
Step 519, the USB-KEY received authentication result is transmitted to SD card by PC；
Step 520, SD card judges USB-KEY authentication result, makes final authentication result, if USB-KEY certification knot
Fruit is that then final authentication result is that otherwise final authentication result is not over certification by certification by certification；
Step 521, final authentication result is returned to PC by SD card；
Step 522, PC judges final authentication result, if performing step 523 if, otherwise performs step 501；
Step 523, the ciphertext of critical data is downloaded to SD card by PC control, and SD card decrypts ciphertext after receiving, obtaining
The clear data obtained is written in the FLASH of SD card itself card；
Step 524, if downloading successfully, the quantity of qualified SD card in USB-KEY is subtracted 1 by PC, otherwise, is lost if downloaded
Lose, the quantity of unqualified SD card is added 1 by PC.
The certification key that flow shown in Fig. 5 is used be premature cure into USB-KEY and SD card, if the safety of data
Property class requirement it is higher, or the inconvenient premature cure key of SD card can use dynamic key.Dynamic key is produced every time
Random number it is different, so each certification key is all different, such data security levels can be higher.With USB-KEY certifications
After the completion of, the authentication procedure in SD card can be wiped, so both ensure that the safety download of SD card critical data, and be also not take up
The memory space of final SD card user.
In other embodiments of the invention, it can be selected according to the processor performance of the requirement of the safe class of IC-card and IC-card
Select suitable identifying algorithm.
Therefore, IC-card production test system of the invention, the authentication by authentication device to IC-card, Neng Goufang
Only the critical data of IC-card is stolen, and improves production environment to the security in terms of the protection of IC-card critical data, and operation
It is convenient.Moreover, the IC-card production test system of the present invention, can detect the upper electric current of IC-card, prevent electric current excessive to tested
IC-card or test device cause damage, and play good short-circuit protection effect.
The foregoing is only presently preferred embodiments of the present invention, be not intended to limit the invention, it is all the present invention spirit and
Within principle, any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.
Claims (10)
1. a kind of IC-card production test system, it is characterised in that, including:
Test device, for testing IC-card；
Authentication device, for being authenticated to IC-card；The authentication device includes：
Authentication module, for receiving the authentication information of IC-card and handling the authentication information；
Logging modle, for recording test result of the test device to IC-card, test result is qualified IC-card quantity, surveyed
Test result is underproof IC-card quantity and the IC-card total amount tested by the test device；
Authorization module, the licensed-type production quantity for preserving IC-card calculates the licensed-type production quantity and recorded with the logging modle
The test of the process test device IC-card total amount difference, the production when the difference is not zero to IC-card authorizes；
Secure storage module, the private data for receiving and storing IC-card；
The authentication device is additionally operable under control of the control means, carry out IC-card authentication, and whether test IC-card is legal,
After confirming that IC-card is legal, just start critical data and download, the ciphertext of critical data is downloaded in IC-card, IC-card receives close
Decrypted after text, obtained plaintext is write inside card；
The control device, believes for being controlled to the test device and the authentication device, and by the certification of IC-card
Breath passes to the authentication device and the authentication information of the authentication device is passed into IC-card.
2. IC-card production test system according to claim 1, it is characterised in that, the authentication device is USB-KEY.
3. IC-card production test system according to claim 1, it is characterised in that, the control device is computer.
4. IC-card production test system according to claim 1, it is characterised in that, the test device also includes：
Current detection module, is detected for the upper electric current to IC-card；
Card reader, the control device, and the number that the control device is sent are given for the data transfer that sends IC-card
According to passing to IC-card；
Main control module, for controlling the current detection module and the card reader.
5. IC-card production test system according to claim 4, it is characterised in that, the main control module, electric current inspection
Survey module and the card reader is arranged on same circuit board.
6. IC-card production test system according to claim 4, it is characterised in that, the main control module and electric current inspection
Survey module to be arranged on first circuit board, the card reader is arranged on second circuit board, the second circuit board and described the
One circuit board is connected by contact pin.
7. IC-card production test system according to claim 4, it is characterised in that, the test device also includes：
Switch, for being powered or powering off to the card reader under the control of the main control module；
Interface epitaxial membrane, for connecting IC-card and the card reader.
8. IC-card production test system according to claim 4, it is characterised in that, the test device also includes USB set
Line device, the usb hub is used to connect the main control module and the control device, and connects the card reader and described
Control device.
9. IC-card production test system according to claim 4, it is characterised in that, the number of the current detection module is
One or more, the number of the card reader is equal with the number of the current detection module.
10. IC-card production test system according to claim 1, it is characterised in that, the IC-card is smart card or storage
Card, the smart card is SIM card, usim card or UIM cards, and the storage card is SD card, TF cards or mmc card.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201110444005.XA CN103186798B (en) | 2011-12-27 | 2011-12-27 | A kind of IC-card production test system |
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| CN201110444005.XA CN103186798B (en) | 2011-12-27 | 2011-12-27 | A kind of IC-card production test system |
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| CN104865459B (en) * | 2015-03-23 | 2018-08-31 | 珠海市金邦达保密卡有限公司 | One kind is for detecting the undesirable method and device of non-contact card chip |
| CN105808439B (en) * | 2016-03-11 | 2018-10-16 | 中国联合网络通信集团有限公司 | Application program of intelligent card remote test system |
| CN106844199A (en) * | 2016-12-27 | 2017-06-13 | 广州智慧城市发展研究院 | A kind of financial IC card circle deposits circle and puies forward test system |
| CN111552698B (en) * | 2020-04-21 | 2023-06-06 | 重庆富民银行股份有限公司 | SQL version control system and method for solving environmental difference |
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