CN103185811A - Atomic force microscope probe expanding working method - Google Patents
Atomic force microscope probe expanding working method Download PDFInfo
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- CN103185811A CN103185811A CN2011104526830A CN201110452683A CN103185811A CN 103185811 A CN103185811 A CN 103185811A CN 2011104526830 A CN2011104526830 A CN 2011104526830A CN 201110452683 A CN201110452683 A CN 201110452683A CN 103185811 A CN103185811 A CN 103185811A
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Abstract
The invention discloses a probe expanding working method based on an atomic force microscope. According to the method, the unambiguous degree of a task is distinguished on the basis of a topological structure of an operand and a start point of operation, whether a master-slave operation mode or a scanning operation mode is adopted by the task is determined according to the unambiguous degree. In a hardware framework of the same nanometer operation system and by modifying a software algorithm, a planning layer is introduced to a main control computer, an executive layer is introduced to an atomic force microscope controller, and the scanning operation mode of the probe is achieved due to the adoption of a pre-programmed probe motion planning method. In the master-slave mode, the atomic force microscope controller judges an operation state according to acting force feedback of the probe and a local scanning image, an operator can conduct man-machine interactive nanometer operation according to requirements of scientific research and processing work, and therefore a nanometer job which possesses functions of sensor information feedback and visual graph assistance is achieved. Due to the adoption of a multi-mode work mode, software and hardware resources of the system are fully used. Functions of the nanometer operation system are enriched, and efficiency of the nanometer job is improved. The achieving method is simple, and the expanding working method based on the atomic force microscope probe possesses strong generality.
Description
Technical field
The present invention relates to the nanometer field, specifically a kind of is atomic force microscope probe expansion operational method.
Background technology
Nanosecond science and technology are emerging scientific research fields of 21 century.The material of nanoscale has characteristics such as the physics different with macro-scale, chemistry, thereby finds and utilize these new characteristics and make up new structure, device and system, and is significant to the development of the technology of advancing science.
Because nanoscale is extremely small, realize that therefore effective observation of nanoscale material and operation are the gordian techniquies of development and applying nano science and technology.The spontaneous phenomenon such as various physics, chemistry of material under the nanoscale could be studied like this, nano-device could be developed, advanced technology and equipments such as nano-sensor and nanosystems.Therefore, effectively the nano-manipulation method is the research focus in micro-nano scientific and technological forward position, the current world.
Atomic force microscope (Atomic force microscopy) is one of visual plant of carrying out at present nano collimation and operation, and its operating type is the probe motion of control atomic force microscope, and the power of applying is carried out nano collimation and operation.Nano-manipulation method based on atomic force microscope mainly is that the operator utilizes the human-computer interaction device at present, finishes (as the multidimensional operation handle) with principal and subordinate's operating type.Because atomic force microscope probe needle point diameter has only tens nanometers, can only carry out point operation, and be difficult to obtain true-time operation information (position of object and probe, state etc.) feedback, thereby the nano-manipulation efficient of this man-machine interactive is very low, and be difficult to realize programming and automated job.So the efficient probe motion control method of control able to programme is significant to nano-manipulation.
Summary of the invention
At the defective that prior art exists, the technical problem to be solved in the present invention provides a kind of atomic force microscope probe expansion operational method based on task orientation.
The technical scheme that the present invention adopts for achieving the above object is: a kind of atomic force microscope probe expansion operational method may further comprise the steps:
Rely on atomic force microscope to obtain by operand, operating environment and Action Target information, will be to being principal and subordinate's operator scheme and scanning operation mode by the division of operations of operand;
The operating process of described principal and subordinate's operator scheme is:
By getting method a little, determine by the position of the position of operand central point and Action Target point;
Control command is issued to main control computer by input equipment;
Main control computer is converted into the macro-scale position coordinates to receive sees the dimension location coordinate, passes to the atomic force microscope controller by Ethernet.
By the atomic force microscope controller positional information of probe is sent to atomic force microscope;
Probe suffered force signal in operating process is fed back to controller;
The operating process of described scanning operation mode is:
Planning layer is set in the main control computer, in the atomic force microscope controller execution level is set;
The operator provides operational requirements by human-computer interaction interface, is asked for by the differential seat angle of the horizontal coordinate difference of the initial position of operand and final position and vertical coordinate difference and initial position and final position by planning layer;
These differences are resolved into a series of translations and the rotating operation of probe, the initial sum of decomposing the back basic operation is stopped coordinate send to operation layer by Ethernet;
Execution level utilizes initial sum to stop coordinate as the input data, carries out translation operation planning and the rotating operation planning of probe;
Probe location information after the planning is sent to atomic force microscope, operated by atomic force microscope control probe.
The topological structure, the mechanical attribute that are comprised operand by operand information that described dependence atomic force microscope obtains.
The operating environment information that described dependence atomic force microscope obtains is the complexity of operating environment.
The Action Target information that described dependence atomic force microscope obtains requires according to pose accuracy and is required to be divided into simple target and complex target by the final configuration of operand.
The present invention has the following advantages:
1. the application has proposed the concept of task orientation first.Starting point with operand topological structure, operation is foundation, differentiates the clear-cut degree of task, and which kind of operator scheme decision-making adopts according to clear-cut degree;
2. under the hardware architecture of same nanometer operating system, by revising software algorithm, in main control computer, introduce planning layer, in the atomic force microscope controller, introduce execution level, and utilize the probe motion planing method of pre-programmed, realize the expansion operation of probe.This scanning operation mode has small step distance, quick multipoint directional, and operation is efficient, and control is by the characteristics of operand pose.
3. under principal and subordinate's operator scheme, the atomic force microscope controller is according to probe acting force feedback and local scan image decision operation state, the operator can carry out the man-machine interactive nano-manipulation according to scientific research and processing operation needs, thereby can realize having the nanometer operation auxiliary with visualized graphs of sensor information feedback.
4. this method adopts the multi-mode working mode, has taken full advantage of the software and hardware resources of system.Enrich the function of nanometer operating system, improved the nanometer efficiency of operation.Implementation method is simple, has very strong versatility, and its design philosophy can be transplanted in other nanometer operating system.
Description of drawings
Fig. 1 is principal and subordinate's operator scheme system construction drawing;
Fig. 2 is the scanning operation mode system construction drawing;
Fig. 3 is the scanning operation mode basic flow sheet.
Embodiment
The present invention is described in further detail below in conjunction with drawings and Examples.
1) task orientation: mainly rely on atomic force microscope to obtain by the information of operand and operating environment.According to topological structure, can be divided into zero-dimension nano structure and one-dimensional nano structure by operand; According to mechanical attribute, can be divided into rigid body and flexible body by operand.What of barrier are courses of action also can be divided into simple path and pahtfinder hard with distribution situation according to.Action Target also can require to be divided into simple target and complex target according to the pose accuracy requirement and by the final configuration of operand.Can be expressed as according to above classification task guiding principle, for the courses of action complexity, the target complexity zero dimension, one-dimensional nano structure should adopt principal and subordinate's operator scheme, should adopt scanning operation mode under other situation.
2) principal and subordinate's operator scheme:
As shown in Figure 1, under principal and subordinate's operator scheme, the operator imports by human-computer interaction interface, operational order.By the communication of hardware description language DirectX realization with main control computer.The coordinate of importing on the human-computer interaction interface is macroscopical three dimensional space coordinate, and main control computer can obtain the operating space size according to the scanning nano image, and macroscopical coordinate conversion is seen yardstick operating space coordinate for receiving.And coordinate information sent to the atomic force microscope controller by Ethernet.The ethernet communication agreement is ICP/IP protocol.The atomic force microscope controller then is converted to the coordinate information that obtains drive unit required voltage signal, amplifies the rear drive probe motion through high pressure.
When probe with after sample contacts, feedback force will sharply increase along with the distance that probe gos deep into sample, namely-0.2＜α≤0, we increase the value of feedback force with quadratic function, utilize segmentation place function continuous and reciprocal identical, can solve the coefficient of quadratic function, the funtcional relationship of distance and power is as follows:
Wherein: probe is dits apart from the initial distance of sample surfaces, and the actual range of operating process middle probe and sample is dpts, α=dpts/dits
According to this force feedback function, counter the asking of signal that sensing device is obtained.Atomic force microscope control returns the operation information that obtains to main control computer by Ethernet.Main control computer then with the image update form, informs the operator with operation information.
3) scanning operation mode:
Under principal and subordinate's operator scheme, the operator directly sends probe location coordinate information difference to the atomic force microscope controller by input equipment.Scanning operation mode adopts the operation of pre-programmed probe, and the operator is as long as provide operational requirements by interactive interface to system.Planning layer is at first asked for and is strengthened probe initial position and the horizontal coordinate difference of final position and the differential seat angle of vertical coordinate difference and reference position and final position, and the formulae express of acquiring method is as follows:
Wherein (xi,, yi), (xi ', yi ') be the starting point coordinate that strengthens probe, (xo,, yo), (xo ', yo ') for strengthening probe terminating point coordinate.
Strengthen the initial slope of probe:
Strengthen the termination slope of probe:
Differential seat angle ask for formula:
These differences are resolved into a series of translations that strengthen probe again and rotate basic operation, its formulae express is as follows:
Wherein: rj is the j time rotating operation of probe pre-programmed operation, and mxk is probe pre-programmed operation k sub-level translation operation, and myl is the 1st vertical translation operation of probe pre-programmed operation.
Planning layer will be operated needed initial sum termination coordinate at every turn and send to execution level.Execution level then utilizes initial sum termination coordinate to begin to carry out as preprogrammed input, sends control information to atomic force microscope, and the control probe is operated.By the nanometer operating system with human-computer interaction interface, planning layer and operation layer three-fies system structure that makes up, can realize probe basic operation action design and planning based on the pre-programmed technology, the nanometer that can finish given parameter automatically promotes operation, the efficient of nano-manipulation and automaticity height.Its work flow as shown in Figure 3.
Claims (4)
1. an atomic force microscope probe expansion operational method is characterized in that, may further comprise the steps:
Rely on atomic force microscope to obtain by operand, operating environment and Action Target information, will be to being principal and subordinate's operator scheme and scanning operation mode by the division of operations of operand;
The operating process of described principal and subordinate's operator scheme is:
By getting method a little, determine by the position of the position of operand central point and Action Target point;
Control command is issued to main control computer by input equipment;
Main control computer is converted into the macro-scale position coordinates to receive sees the dimension location coordinate, passes to the atomic force microscope controller by Ethernet.
By the atomic force microscope controller positional information of probe is sent to atomic force microscope;
Probe suffered force signal in operating process is fed back to controller;
The operating process of described scanning operation mode is:
Planning layer is set in the main control computer, in the atomic force microscope controller execution level is set;
The operator provides operational requirements by human-computer interaction interface, is asked for by the differential seat angle of the horizontal coordinate difference of the initial position of operand and final position and vertical coordinate difference and initial position and final position by planning layer;
These differences are resolved into a series of translations and the rotating operation of probe, the initial sum of decomposing the back basic operation is stopped coordinate send to operation layer by Ethernet;
Execution level utilizes initial sum to stop coordinate as the input data, carries out translation operation planning and the rotating operation planning of probe;
Probe location information after the planning is sent to atomic force microscope, operated by atomic force microscope control probe.
2. atomic force microscope probe expansion operational method according to claim 1 is characterized in that the topological structure, the mechanical attribute that are comprised operand by operand information that described dependence atomic force microscope obtains.
3. atomic force microscope probe expansion operational method according to claim 1 is characterized in that the operating environment information that described dependence atomic force microscope obtains is the complexity of operating environment.
4. atomic force microscope probe according to claim 1 is expanded operational method, it is characterized in that the Action Target information that described dependence atomic force microscope obtains requires according to pose accuracy and required to be divided into simple target and complex target by the final configuration of operand.
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| CN2011104526830A CN103185811A (en) | 2011-12-29 | 2011-12-29 | Atomic force microscope probe expanding working method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104930981A (en) * | 2015-06-03 | 2015-09-23 | 华中科技大学 | Atomic force probe posture adjusting apparatus |
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| CN1821743A (en) * | 2006-03-27 | 2006-08-23 | 北京航空航天大学 | Atomic force microscopic detecting method and device for moonscape environment locating measurement |
| CN1900687A (en) * | 2005-07-22 | 2007-01-24 | 董再励 | Low-price touch interactive interface implementation method based on scanning probe microscope |
| CN101419466A (en) * | 2007-10-26 | 2009-04-29 | 中国科学院沈阳自动化研究所 | Nanometer operating system based on SPM probe enhancement operation |
| US20090139315A1 (en) * | 2007-11-30 | 2009-06-04 | Chikuang Charles Wang | Non-destructive ambient dynamic mode afm amplitude versus distance curve acquisition |
| CN101960287A (en) * | 2007-08-02 | 2011-01-26 | 威科仪器公司 | The scanning probe microscopy of quick scanning and the method that operates on it |
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1757591A (en) * | 2004-10-10 | 2006-04-12 | 中国科学院沈阳自动化研究所 | Real-time force sense and visual image man-machine interaction method and system based on nanometer operation |
| CN1900687A (en) * | 2005-07-22 | 2007-01-24 | 董再励 | Low-price touch interactive interface implementation method based on scanning probe microscope |
| CN1821743A (en) * | 2006-03-27 | 2006-08-23 | 北京航空航天大学 | Atomic force microscopic detecting method and device for moonscape environment locating measurement |
| CN101960287A (en) * | 2007-08-02 | 2011-01-26 | 威科仪器公司 | The scanning probe microscopy of quick scanning and the method that operates on it |
| CN101419466A (en) * | 2007-10-26 | 2009-04-29 | 中国科学院沈阳自动化研究所 | Nanometer operating system based on SPM probe enhancement operation |
| US20090139315A1 (en) * | 2007-11-30 | 2009-06-04 | Chikuang Charles Wang | Non-destructive ambient dynamic mode afm amplitude versus distance curve acquisition |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104930981A (en) * | 2015-06-03 | 2015-09-23 | 华中科技大学 | Atomic force probe posture adjusting apparatus |
| CN104930981B (en) * | 2015-06-03 | 2016-05-25 | 华中科技大学 | A kind of atomic force probe pose adjusting device |
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Application publication date: 20130703 |