CN103148943B - Interference signal generator controlled by simulated aplanatism differences - Google Patents
Interference signal generator controlled by simulated aplanatism differences Download PDFInfo
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- CN103148943B CN103148943B CN201310039515.8A CN201310039515A CN103148943B CN 103148943 B CN103148943 B CN 103148943B CN 201310039515 A CN201310039515 A CN 201310039515A CN 103148943 B CN103148943 B CN 103148943B
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Abstract
The invention discloses an interference signal generator controlled by simulated aplanatism differences. A basic principle of interferometer aplanatism difference sampling is utilized to generate a signal generating device for generating signals similar to interference signals. The interference signal generator is different from ordinary signal generator products, generated signals are not simple sine or pulse signals, and generation of the signals has output frequency of the signals, wherein the output frequency is controlled according to aplanatism differences. Wave forms of the signals are generated according to the characteristics of the interference signals. Two independent control units are adopted in design to respectively control the two kinds of the signals. The interference signal generator has the advantages that the wave forms are convenient to set, and the output frequency is controllable and flexible.
Description
Technical field:
The present invention is a kind of interference signal generator, particularly a kind of interference signal generator of simulating aplanatism difference and controlling.
Background technology:
Fourier spectrometer Detection Techniques utilize Michelson (Michelson) interferometer principle, the interference signal of measured target is sampled according to aplanatism difference, then light intensity signal is passed through inverse-Fourier transform, thus obtain a kind of detection means of target being observed spectral signal.
Interference signal is that interferometer produces, and generally needs detector, interference system and optical system.The detector of infrared band also needs to be operated in low temperature environment, needs to use Dewar to add liquid nitrogen refrigerating during surface work.Also need reference laser diode simultaneously, utilize reference laser signal to produce aplanatism difference sampling synchronization signals by interference system.
Interference signal obtains sampling and the relevant treatment that system mainly completes interferogram signal, these signal acquisitions and the characteristic such as restriction such as dynamic range, signal noise level of process except being subject to signal itself, also be subject to the restriction of the optical path difference time interval, the conditioning of data, collection, transmission, storage all need to complete in an aplanatism difference interval simultaneously.
Experiment condition is complicated and be subject to sequential restriction, if can produce interference signal according to interferometer work principle substitute real interferometer output signal, can complete the signal acquisition circuit checking outside detector.The signal generation apparatus of current signal generator also A designer person's designed, designed except all purpose instrument of standard, " the high-precision signal card based on FPGA and AD768 designs " that such as Northcentral University's Electronic Testing Technology National Key Laboratory Hu Zhenliang and Ren Yongfeng delivers (" microcomputer information " 2008 the 24th volume 1-2 phase 205th ~ 206 pages), the device mentioned in literary composition provides high-precision signal card for test automatically.The Ministry of Education of Northcentral University instrumental science and dynamic test key lab Zhao is also had to be the design describing the square wave signal generator used in test in " the high precision multipath signal source based on FPGA and AD768 designs " (phase in " mechanical engineering and robotization " February the 1st in 2010 139th ~ 141 pages) of delivering such as happy.The signal generator of these designs is all utilize digital-to-analog conversion to produce the test signal of needs, but does not possess the signal characteristic of fourier spectrometer, and main deficiency is as follows:
1. the signal waveform of the traditional signal generator output is fairly simple
Although the function that traditional signal generator can be simulated is various informative, these functions are relatively all fairly simple, and existing signal generation apparatus cannot produce interferogram signal principle.The interference signal produced based on the interferometer of Michelson Interference Principle is the function of optical path difference, when optical path difference is 0, the intensity of signal is maximum, and along with optical path difference increase, signal intensity sharply weakens, interference signal is more complicated than common triangular signal, square-wave signal and trigonometric function signal generator reason, and existing signal generator is difficult to realize, and interference signal waveform character is shown in accompanying drawing 1.
2. signal exports and does not provide the external reference consistent with signal intensity
Although the frequency-adjustable of existing signal generator signal, but the reference data consistent with the signal intensity moment is not provided, uncertainty (sampling instant and sampled result are not all known in advance) is all existed to the sampling instant of measured signal and the result of sampling.Sampling and the aplanatism difference signal of interference signal are closely related, and aplanatism difference signal is also as the time reference that follow-up signal obtains and processes simultaneously, so the output of simulation interference signal must control to produce according to aplanatism difference reference signal.Signal exports sees accompanying drawing 2 with the relation of control signal.
Summary of the invention:
The object of this patent is to provide a kind of interference signal generating apparatus of simulating aplanatism difference and controlling, solve existing signal generator and do not possess the difficult point that sophisticated signal waveform is provided, overcome the limitation that in existing signal generator, signal amplitude can not set arbitrarily, there is the feature of AWG (Arbitrary Waveform Generator), and sampling time reference consistent with signal intensity is provided, be particularly suitable for the circuit debugging of interference system.
The interference signal generator that simulation aplanatism difference controls comprises two parts, the function of Part I produces two paths of signals, index glass at the uniform velocity zone state indicator signal and aplanatism difference control signal respectively, the function of Part II is that the two paths of signals produced with Part I makes reference, complete DAC conversion, produce interference signal.Part I is made up of the 1st crystal oscillator, switch, the 1st microcontroller; Part II is made up of the 2nd crystal oscillator, microprocessor 2, SRAM, level conversion device, DAC converter, buffer amplifier and BNC socket.The block diagram of system is shown in Figure of description 3.
The technical parameter of each composition hardware is described below.
First active crystal oscillator is introduced, 1st crystal oscillator and the 2nd crystal oscillator are active crystal oscillator, they provide work clock for microcontroller, parameter mainly operating voltage and the output frequency of crystal oscillator, operating voltage selects positive 3.3V, the temporal resolution that frequency of operation is the highest according to system determines, designer can select suitable crystal oscillator, for system provides work clock according to the needs of oneself and selected microcontrolled requirement.
1st microcontroller and microprocessor 2 are single-chip microcomputer or digital signal processor (DSP), microcontroller 1 and the 2nd microcontroller device can be the same or different in form, the work clock of microcontroller determines the processing speed of controller, selects DSP2407, DSP2812 or MSP430F149.
Switch selects " touch-switch ", and its feature is, switch conduction when switch is pressed, and when switch unclamps, switch disconnects.There is pull-up resistor switch one end, other end ground connection, and there being one end of pull-up resistor to be linked into the 1st microcontroller.
The parameter of SRAM mainly contains memory data output and response speed and operating voltage.Select high-speed SRAM, the access time is less than 20ns; In order to improve expanding of system function, storing amount selection second 256KX16, namely there is 256K word storage space; Operating voltage selects the 3.3V voltage identical with microcontroller, and integrated circuit selects IS61LV25616AL-10TI or IS61LV25616AL-12TI.
Level transferring chip is as 74LVC4245 or 74LVC164245, and they are the transceivers with 3 states outputs, and transceiver needs to have good time resolution characteristics, is not more than 15ns to the response time of steering order.
DAC converter, select the D/A converter ic of high-speed, high precision, slewing rate 30MSPS, resolution 16bit, the linearity is better than 14bit, the DAC converter that the way of output adopts electric current to export, as AD768.
Buffering operational amplifier, carries out electric current to voltage transitions to the output current of DAC integrated circuit, and realizes exporting buffering, as AD845 or AD797.
The invention is characterized in and add external reference signal on original signal card or signal source basis, using the control reference point that external reference signal occurs as signal, it is not only generation interference signal, but produce interference signal according to aplanatism difference signal as trigger pip, be convenient to system under test (SUT) also sample to interference signal according to aplanatism difference signal interval, because sampling instant is determined, and the signal amplitude of sampling instant is also determined, so the sampled result of system under test (SUT) should be completely the same with the signal in tested moment within the scope of systematic error, there is good comparison basis, be convenient to detect system under test (SUT) within the aplanatism difference cycle simultaneously and whether can complete corresponding work for the treatment of, as data acquisition, data transmission and data storage etc. are a series of the performance index explicitly called for the time, and be not only that signal source is simply sampled.
Workflow is described below.
The state of the 1st microcontroller scanning switch, once switch is pressed, the high level state that 1st microcontroller connected pull-up resistor is originally ground connection due to switch conduction, microcontroller can control two paths of signals (index glass is zone state indicator signal and aplanatism difference signal at the uniform velocity) " export and start " according to the change of on off state operates with " export and stop ", switch is pressed at every turn and can be realized replacing of two states, and the control flow chart of switch is shown in Figure of description 4.After " export and start " is effective, the 1st microcontroller is coordinated with counter by timer, has controlled the output of two kinds of signals, and concrete control flow is with reference to accompanying drawing 5.
The two paths of signals produced by the 1st microcontroller, as the control reference signal of the 2nd microcontroller, 2nd microcontroller and the 1st microcontroller are two independently controllers, can be the same or different in form, 1st microcontroller produces two paths of signals, one tunnel is index glass at the uniform velocity zone state indicator signal, and another road is aplanatism difference signal, and the feature of signal is as shown in " OUT1 " and " OUT2 " in accompanying drawing 5 (b).
When at the uniform velocity condition indicative signal (in Fig. 5 (b) OUT1) is " height " level to index glass, as the beginning of a width interferogram data conversion, when this signal returns to " low " level again by high level, once complete interferogram data EOC." height " level is at this signal, namely simulate index glass be at the uniform velocity state time, the negative edge of each aplanatism difference signal (in Fig. 5 (b) OUT2) starts a D/A conversion, complete the D/A conversion of width interferogram data successively, above-mentioned two kinds of signals are detected by the 2nd microcontroller, when needs carry out D/A conversion, corresponding data are sent to FPDP by the 2nd microcontroller, and send control conversion command to D/A converter.The end of transfer process is subject to two conditions restrictions, and one is data to be converted, if data volume is little, not exclusively can take index glass at the uniform velocity district's time and terminating in advance; Two is switching time, if data volume is excessive, at the uniform velocity all can not convert in district at an index glass, ignore the data exceeding index glass at the uniform velocity district, realize part conversion, so will carry out accurate Calculation to data volume to be converted in design, control flow is shown in accompanying drawing 6.
Signal from the 2nd microcontroller is the digital signal of 16bit, and signal level is 3.3V, and signal output frequency, according to the rate-adaptive pacemaker of aplanatism difference signal, is triggered by negative edge.16bit digital signal realizes the signal level coupling of the 2nd microcontroller and DAC converter by level transferring chip, and the level after overmatching, outputs to D/A converter, and then produces simulation interference signal.In order to reduce external electromagnetic interference, improve the reliability of Signal transmissions, simulation interference signal exports and adopts BNC socket as output interface.
It is more than the signal flow under two microprocessor controls, also need to prepare corresponding interferogram data to produce interferogram signal, interferogram data can be that the data obtained by capture card in an experiment obtain through arranging, and also can be calculated by MATLAB Software tool.Ready data are downloaded in control chip internal RAM, external RAM or FLASH, then according to Control timing sequence, interferogram data are changed successively, index glass be at every turn at the uniform velocity zone state time be converted to a width interferogram signal, index glass at the uniform velocity zone state indicator signal and aplanatism difference signal repeats, conversion just repeats, thus obtains continuous print interferogram signal.
The invention has the advantages that and can provide practical signal source for the research of fourier spectrometer technology, replace complicated experimental provision to a certain extent, carry out test and study work, reduce the complicacy of related experiment checking, improve debugging efficiency.
Accompanying drawing illustrates:
Fig. 1 is interference signal design sketch, and (1-2) is the effect of broadening on (1-1) time shaft.
Fig. 2 is that interference signal exports and control signal (index glass condition indicative signal and aplanatism difference signal) relation schematic diagram.Wherein the high level state of " index glass is zone state indicator signal at the uniform velocity " represents that index glass is operated at the uniform velocity district, and low level represents that index glass is operated in non-at the uniform velocity district.The output time of interference signal appears at the negative edge moment of " aplanatism difference signal ".
Fig. 3 is the block diagram of system.
Fig. 4 is switch scanning and control flow chart, and wherein COUNT1 and COUNT2 is counter register, is identical variable with COUNT1 and COUNT2 in accompanying drawing 5.
Fig. 5 (a) is index glass at the uniform velocity zone state instruction and aplanatism differential mode analog signal generation control flow chart, and wherein COUNT1, COUNT2 are respectively counter register; A, B, C, A1, A2 is count value; OUT1, OUT2 are electrical signal mouths, and " 1 " and " 0 " corresponding with port OUT1 and OUT2 represents low and high level respectively.The time that the output state of OUT1 and OUT2 maintains depends on the product with timer sum counter.
Fig. 5 (b) is sequential control point is correlated with in Fig. 5 (a) count value and the corresponding relation figure of waveform, and wherein A, B, C, A1, A2 are that level changes the count value of correspondence, and 0 is initial time, and OUT1, OUT2 represent output port.
Fig. 6 is DAC conversion and control process flow diagram, and wherein CON is counter register variable.
Embodiment:
Specifically implement to be further described to the present invention below.Need according to the complete circuit form of above-mentioned principle design in order to complete above-mentioned work, hardware design type selecting is as follows:
1st microcontroller and microprocessor 2 all have selected DSP2812, and being respectively them provides the 1st crystal oscillator of work clock and the 2nd crystal oscillator all to select output frequency to be the active crystal oscillator of 30MHz, and DSP2812 work clock can be set to 150M by inner frequency parameter.In peripheral components, vertical type touch-switch selected by switch, and SRAM selects IS61LV25616AL-10TI, DAC integrated circuit selects AD768, level conversion transceiver selects 74LVC4245, and AD845 is selected in the conversion of buffering operational amplifier, and output interface adopts standard BNC socket.
Claims (1)
1. the interference signal generating apparatus of simulating aplanatism difference and controlling, it by produce index glass at the uniform velocity zone state indicator signal and aplanatism difference control signal Part I and with Part I produce two paths of signals make reference, complete DAC conversion, produce the Part II composition of interference signal, it is characterized in that:
The Part I of interference signal generating apparatus is made up of the 1st crystal oscillator, switch and the 1st microcontroller, the 1st wherein said crystal oscillator is active crystal oscillator, for system provides work clock, operating voltage is positive 3.3V, and frequency of operation is determined by the temporal resolution that system is the highest; The 1st described microcontroller is single-chip microcomputer or digital signal processor; Described switch is touch-switch; The state of the 1st microcontroller scanning switch, once switch is pressed, the high level state that 1st microcontroller connected pull-up resistor is originally ground connection due to switch conduction, 1st microcontroller controls index glass at the uniform velocity zone state indicator signal and this two paths of signals of aplanatism difference signal " export and start " according to the change of on off state operates with " export and stop ", switch is pressed at every turn and can be realized replacing of two states, after " export and start " is effective, 1st microcontroller is coordinated with counter by timer, has controlled the output of two kinds of signals.
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| US6313934B1 (en) * | 1999-01-08 | 2001-11-06 | Agilent Technologies, Inc. | Chromatic dispersion measurement scheme for optical systems having remote access points |
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| CN100541113C (en) * | 2007-05-23 | 2009-09-16 | 中国科学院光电技术研究所 | Sub nano grade double frequency laser interferometer signal subdivision system |
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