CN103148943A - Interference signal generator controlled by simulated aplanatism differences - Google Patents
Interference signal generator controlled by simulated aplanatism differences Download PDFInfo
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- CN103148943A CN103148943A CN2013100395158A CN201310039515A CN103148943A CN 103148943 A CN103148943 A CN 103148943A CN 2013100395158 A CN2013100395158 A CN 2013100395158A CN 201310039515 A CN201310039515 A CN 201310039515A CN 103148943 A CN103148943 A CN 103148943A
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Abstract
The invention discloses an interference signal generator controlled by simulated aplanatism differences. A basic principle of interferometer aplanatism difference sampling is utilized to generate a signal generating device for generating signals similar to interference signals. The interference signal generator is different from ordinary signal generator products, generated signals are not simple sine or pulse signals, and generation of the signals has output frequency of the signals, wherein the output frequency is controlled according to aplanatism differences. Wave forms of the signals are generated according to the characteristics of the interference signals. Two independent control units are adopted in design to respectively control the two kinds of the signals. The interference signal generator has the advantages that the wave forms are convenient to set, and the output frequency is controllable and flexible.
Description
Technical field:
The present invention is a kind of interference signal generator, particularly a kind of interference signal generator of simulating the poor control of aplanatism.
Background technology:
The fourier spectrometer Detection Techniques are to utilize Michelson (Michelson) interferometer principle, interference signal to measured target is sampled according to aplanatism is poor, then light intensity signal is passed through inverse-Fourier transform, thereby obtain a kind of detection means of target being observed spectral signal.
Interference signal is that interferometer produces, and generally detector, interference system and optical system need to be arranged.The detector of infrared band also needs to be operated in low temperature environment, need to use Dewar to add the liquid nitrogen refrigeration during surface work.Also need simultaneously reference laser diode, utilize the reference laser signal to produce the poor sample-synchronous signal of aplanatism by interference system.
Interference signal obtains system and completes sampling and the relevant treatment of interferogram signal, these signal acquisitions and processing except the characteristic that is subject to signal itself such as restrictions such as dynamic range, signal noise levels, also be subject to simultaneously optical path difference time interval restriction, the conditioning of data, collection, transmission, storage all need to be completed in an aplanatism poor interval.
Experiment condition is complicated and be subject to the sequential restriction, substitutes real interferometer output signal if can produce interference signal according to the interferometer work principle, can complete the signal acquisition circuit checking outside detector.Present signal generator also signal generation apparatus of A designer person's designed, designed except all purpose instrument of standard, for example " based on the design of the high-precision signal card of FPGA and AD768 " delivered of Northcentral University's Electronic Testing Technology Hu Zhenliang of National Key Laboratory and Ren Yongfeng (" microcomputer information " 2008 the 24th volume 1-2 phase the 205th ~ 206 page), the device of mentioning in literary composition provides high-precision signal card for test automatically.Also have the Ministry of Education of Northcentral University instrumental science and dynamic test Zhao of key lab to be " based on the high precision multipath signal source design of FPGA and AD768 " that happy etc. delivers and described the design of the square wave signal generator of use in the test in (the 139th ~ 141 page of the 1st phase of " mechanical engineering and robotization " February in 2010).The signal generator of these designs is all to utilize the test signal that digital-to-analog conversion produces to be needed, but does not possess the signal characteristic of fourier spectrometer, and main is not enough as follows:
1. the signal waveform of the traditional signal generator output is fairly simple
Although the function that traditional signal generator can be simulated is various informative, these functions are relatively all fairly simple, and existing signal generation apparatus can't produce interferogram signal on principle.The interference signal that produces based on the interferometer of Michelson Interference Principle is the function of optical path difference, when optical path difference is 0, the intensity of signal is maximum, and along with optical path difference increases, signal intensity sharply weakens, interference signal is more complicated than common triangular signal, square-wave signal and trigonometric function signal generator reason, and existing signal generator is difficult to realization, and the interference signal waveform character is seen accompanying drawing 1.
2. signal output does not provide the external reference consistent with signal intensity
Although the frequency of existing signal generator signal is adjustable, the reference data constantly consistent with signal intensity is not provided, all there are uncertainty (sampling instant and sampled result are not all known in advance) in the sampling instant of measured signal and the result of sampling.The sampling of interference signal and aplanatism difference signal are closely related, and the time reference that while aplanatism difference signal also obtains and processes as follow-up signal produces so the output of simulation interference signal must be controlled according to the poor reference signal of aplanatism.Signal output is seen accompanying drawing 2 with the relation of control signal.
Summary of the invention:
The purpose of this patent is to provide a kind of interference signal generating apparatus of simulating the poor control of aplanatism, solved the difficult point that existing signal generator does not possess provides the sophisticated signal waveform, overcome the limitation that signal amplitude in existing signal generator can not Set arbitrarily, characteristics with AWG (Arbitrary Waveform Generator), and sampling time benchmark consistent with signal intensity is provided, be particularly suitable for the circuit debugging of interference system.
The interference signal generator of the poor control of simulation aplanatism comprises two parts, the function of first is to produce two paths of signals, respectively at the uniform velocity zone state indicator signal and the poor control signal of aplanatism of index glass, the function of second portion is to make reference with the two paths of signals that first produces, complete the DAC conversion, produce interference signal.First is made of crystal oscillator 1, switch, microcontroller 1; Second portion is made of crystal oscillator 2, microprocessor 2, SRAM, level conversion device, DAC converter, buffer amplifier and BNC socket.The block diagram of system is seen Figure of description 3.
The technical parameter that respectively forms hardware is described below.
The active crystal oscillator of paper, crystal oscillator 1 and crystal oscillator 2 are active crystal oscillator, they provide work clock for microcontroller, the parameter of crystal oscillator is mainly operating voltage and output frequency, operating voltage is selected positive 3.3V, the temporal resolution decision that frequency of operation is the highest according to system, the designer can select suitable crystal oscillator according to oneself needs and selected microcontrolled requirement, for system provides work clock.
Switch selects " touch-switch ", its feature to be, switch conduction when switch is pressed, and when switch unclamps, switch disconnects.Switch one end has pull-up resistor, other end ground connection, and there being an end of pull-up resistor to be linked into microcontroller 1.
The parameter of SRAM mainly contains memory data output and response speed and operating voltage.Select high-speed SRAM, the access time is less than 20ns; In order to improve expanding of system function, a storage second amount is selected 256KX16, namely has 256K word storage space; Operating voltage is selected the 3.3V voltage identical with microcontroller, and integrated circuit is selected IS61LV25616AL-10TI or IS61LV25616AL-12TI.
Level transferring chip such as 74LVC4245 or 74LVC164245, they are the transceivers with 3 attitudes outputs, transceiver need to have good time resolution characteristics, and response time of steering order is not more than 15ns.
The DAC converter, the D/A converter ic of selection high-speed, high precision, slewing rate 30MSPS, resolution 16bit, the linearity is better than 14bit, and the way of output adopts the DAC converter of electric current output, as AD768.
The buffering operational amplifier carries out electric current to voltage transitions to the output current of DAC integrated circuit, and realizes the output buffering, as AD845 or AD797.
the invention is characterized on original signal card or signal source basis and increased external reference signal, with the control reference point of external reference signal as the signal generation, it is not only the generation interference signal, but produce interference signal according to the aplanatism difference signal as trigger pip, being convenient to system under test (SUT) also samples to interference signal according to aplanatism difference signal interval, because sampling instant is determined, and the signal amplitude of sampling instant is also determined, so the sampled result of system under test (SUT) should be in full accord with the signal in the tested moment in the systematic error scope, has good comparison basis, be convenient to simultaneously detect aplanatism in the poor cycle system under test (SUT) whether can complete corresponding work for the treatment of, as the data collection, data transmission and data storage etc. be a series of the performance index that explicitly call for to the time, and be not only that signal source is simply sampled.
Workflow is described below.
The state of microcontroller 1 scanning switch, in case switch is pressed, microcontroller 1 originally connected draw resistance high level state due to switch conduction ground connection, microcontroller can be controlled according to the change of on off state " output starts " and " output stops " operation of two paths of signals (index glass is zone state indicator signal and aplanatism difference signal at the uniform velocity), switch is pressed at every turn and can be realized replacing of two states, and the control flow chart of switch is seen Figure of description 4.After " output starts " was effective, microcontroller 1 coordinated with counter by timer, controlled the output of completing two kinds of signals, and concrete control flow is with reference to accompanying drawing 5.
Two paths of signals by microcontroller 1 generation, control reference signal as microcontroller 2, microcontroller 2 is two independently controllers with microcontroller 1, can be the same or different in form, microcontroller 1 produces two paths of signals, one the tunnel is at the uniform velocity zone state indicator signal of index glass, and another road is the aplanatism difference signal, and the feature of signal is as accompanying drawing 5(b) in as shown in " OUT1 " and " OUT2 ".
At the uniform velocity condition indicative signal (OUT1 in Fig. 5 (b)) is when being " height " level when index glass, and as the beginning of a width interferogram data-switching, when this signal returned to " low " level again by high level, once complete interferogram data-switching finished.Be in " height " level at this signal, namely simulate index glass when being at the uniform velocity state, the negative edge of each aplanatism difference signal (OUT2 in Fig. 5 (b)) starts a D/A conversion, complete successively the D/A conversion of width interferogram data, above-mentioned two kinds of signals are detected by microcontroller 2, when needs carried out the D/A conversion, microcontroller 2 sent to FPDP with corresponding data, and sent the control conversion command to D/A converter.The end of transfer process is subject to two condition restriction, and the one, data to be converted if data volume is little, can not exclusively takies index glass and at the uniform velocity distinguish the time and finish in advance; The 2nd, switching time, if data volume is excessive, can not at the uniform velocity distinguishes all at an index glass and convert, to ignore the data of at the uniform velocity distinguishing over index glass, realize the part conversion, so will carry out accurate Calculation to data volume to be converted in design, control flow is seen accompanying drawing 6.
Signal from microcontroller 2 is the digital signal of 16bit, and signal level is 3.3V, and signal output frequency is triggered by negative edge according to the frequency output of aplanatism difference signal.The 16bit digital signal realizes the signal level coupling of microcontroller 2 and DAC converter by level transferring chip, the level after overmatching outputs to D/A converter, and then produces the simulation interference signal.In order to reduce external electromagnetic interference, improve the reliability of signal transmission, the output of simulation interference signal adopts BNC socket as output interface.
It is more than the signal flow under two microprocessor controls, also need to prepare corresponding interferogram data in order to produce interferogram signal, the interferogram data can be that the data that obtained by capture card in experiment obtain through arrangement, also can calculate by the MATLAB Software tool.Ready data are downloaded in control chip internal RAM, external RAM or FLASH, during then according to control, ordered pair interferogram data are changed successively, index glass is converted to a width interferogram signal at every turn when being at the uniform velocity zone state, index glass at the uniform velocity zone state indicator signal and aplanatism difference signal repeats, conversion just repeats, thereby obtains continuous interferogram signal.
The invention has the advantages that the signal source that can provide for the research of fourier spectrometer technology practical, replace to a certain extent complicated experimental provision, carry out test and study work, reduce the complicacy of related experiment checking, improve debugging efficiency.
Description of drawings:
Fig. 1 is the interference signal design sketch, is (1-2) effect of broadening on (1-1) time shaft.
Fig. 2 is that interference signal output concerns schematic diagram with control signal (index glass condition indicative signal and aplanatism difference signal).Wherein the high level state of " index glass is the zone state indicator signal at the uniform velocity " represents that index glass is operated at the uniform velocity district, and low level represents that index glass is operated in non-at the uniform velocity district.The output time of interference signal appears at the negative edge moment of " aplanatism difference signal ".
Fig. 3 is the block diagram of system.
Fig. 4 is switch scanning and control flow chart, and wherein COUNT1 and COUNT2 are counter registers, is identical variable with COUNT1 in accompanying drawing 5 and COUNT2.
Fig. 5 (a) is at the uniform velocity zone state indication and aplanatism differential mode analog signal generation control flow chart of index glass, and wherein COUNT1, COUNT2 are respectively counter register; A, B, C, A1, A2 is count value; OUT1, OUT2 are the electrical signal mouths, and " 1 " and " 0 " corresponding with port OUT1 and OUT2 represent respectively high-low level.The time that the output state of OUT1 and OUT2 is kept is depended on the product with the timer sum counter.
Fig. 5 (b) is sequential control point is relevant in Fig. 5 (a) count value and the corresponding relation figure of waveform, and wherein A, B, C, A1, A2 are the change count values of correspondence of level, the 0th, and initial time, OUT1, OUT2 represents output port.
Fig. 6 is DAC conversion and control process flow diagram, and wherein CON is the counter register variable.
Embodiment:
Below concrete enforcement of the present invention is further described.Need according to the complete circuit form of above-mentioned principle design in order to complete above-mentioned work, the hardware design type selecting is as follows:
Claims (1)
1. interference signal generating apparatus of simulating the poor control of aplanatism, at the uniform velocity zone state indicator signal and the first of the poor control signal of aplanatism and the two paths of signals that produces with first make reference by producing index glass for it, complete the DAC conversion, the second portion that produces interference signal forms, and it is characterized in that:
The first of interference signal generating apparatus is made of crystal oscillator 1, switch and microcontroller 1, and wherein said crystal oscillator 1 is active crystal oscillator, and for system provides work clock, operating voltage is positive 3.3V, and frequency of operation is determined by the highest temporal resolution of system; Described microcontroller 1 is single-chip microcomputer or digital signal processor; Described switch is touch-switch; The state of microcontroller 1 scanning switch, in case switch is pressed, microcontroller 1 originally connected draw resistance high level state due to switch conduction ground connection, microcontroller is controlled index glass at the uniform velocity " output starts " and " output stops " operation of zone state indicator signal and this two paths of signals of aplanatism difference signal according to the change of on off state, switch is pressed at every turn and can be realized replacing of two states, after " output starts " is effective, microcontroller 1 coordinates with counter by timer, controls the output of completing two kinds of signals.
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Citations (4)
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| US6313934B1 (en) * | 1999-01-08 | 2001-11-06 | Agilent Technologies, Inc. | Chromatic dispersion measurement scheme for optical systems having remote access points |
| JP2001349788A (en) * | 2000-06-12 | 2001-12-21 | Daisei Yagami | Measuring device of pulse light propagation time |
| CN101050941A (en) * | 2007-05-23 | 2007-10-10 | 中国科学院光电技术研究所 | Sub nano grade double frequency laser interferometer signal subdivision system |
| CN101886541A (en) * | 2009-05-15 | 2010-11-17 | 中国石油天然气集团公司 | Opposed steering large-power signal source system for long-distance large-caliber oil-gas pipeline |
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- 2013-01-31 CN CN201310039515.8A patent/CN103148943B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6313934B1 (en) * | 1999-01-08 | 2001-11-06 | Agilent Technologies, Inc. | Chromatic dispersion measurement scheme for optical systems having remote access points |
| JP2001349788A (en) * | 2000-06-12 | 2001-12-21 | Daisei Yagami | Measuring device of pulse light propagation time |
| CN101050941A (en) * | 2007-05-23 | 2007-10-10 | 中国科学院光电技术研究所 | Sub nano grade double frequency laser interferometer signal subdivision system |
| CN101886541A (en) * | 2009-05-15 | 2010-11-17 | 中国石油天然气集团公司 | Opposed steering large-power signal source system for long-distance large-caliber oil-gas pipeline |
Non-Patent Citations (1)
| Title |
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| 王峰等: ""基于单片机和AD9833的信号发生器的设计"", 《南京师范大学学报（工程技术版）》 * |
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