CN103077743B - Burn-in method and test board for embedded flash memory card, and embedded flash memory card - Google Patents
Burn-in method and test board for embedded flash memory card, and embedded flash memory card Download PDFInfo
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- CN103077743B CN103077743B CN201210409873.9A CN201210409873A CN103077743B CN 103077743 B CN103077743 B CN 103077743B CN 201210409873 A CN201210409873 A CN 201210409873A CN 103077743 B CN103077743 B CN 103077743B
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- 238000012360 testing method Methods 0.000 title claims abstract description 156
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- 230000015654 memory Effects 0.000 claims abstract description 88
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Abstract
The invention discloses a burn-in method and a test board for an embedded flash memory card, and the embedded flash memory card tested by adopting the technology. The disclosed method comprises the following steps: writing test data into a flash memory of an embedded flash memory card; electrically grounding a command line of the embedded flash memory card to operate the embedded flash memory card in a power-on state; when the embedded flash memory card is in the starting-up state and the test data is identified to exist in the flash memory, executing a burn-in process on the flash memory; and collecting a test report in the burn-in process, wherein the test report is stored in the flash memory.
Description
Technical field
The present invention has about the embedded flash card of one (embedded Multi Media Card, eMMC), and is particularly to the burn in process (burn-in test) of embedded flash card.
Background technology
Multimedia storage card (MultiMediaCard, MMC) is based on a not b gate type flash memory technology.Generally speaking, multimedia storage card, as the Storage Media of portable apparatus, is convenient to move to people's electricity people and accesses.Such as, digital still camera can adopt multimedia storage card to store image file.Photograph can be copied to his or her computer by card reader (such as, multimedia storage card card reader) by user.
Based on the specification of multimedia storage card, multimedia storage card interface, flash memory and controller are incorporated in same encapsulation by an embedded save scheme, the embedded flash card of called after (embedded Multi Media Card, eMMC).In order to ensure the fiduciary level of the flash memory of embedded flash card, need to burn this flash memory of machine flow testing at before sales.
Traditional burn in process design of the embedded flash card of Fig. 1 diagram.As shown in the figure, embedded flash card 102_1 ... 102_N inserts N number of card reader 104_1 respectively ... 104_N is to link a main frame 106.This main frame 106 provides multiple instruction to above-mentioned embedded flash card 102_1 ... the order line of 102_N, by all embedded flash card 102_1 ... 102_N all operates in a transmission state (transfer state).Described transmission state design is made traditional burn in process and is used.
But the traditional test framework of Fig. 1 is not suitable for temperature tolerance test.Such as, main frame 106 be not suitable for being placed in baking box or refrigerator.
The art needs a kind of embedded flash card test structure of novelty.
Summary of the invention
The burning machine method that the present invention discloses embedded flash card (eMMC), the embedded flash card adopting this burning machine method testing plate and test with this burning machine method.
Shown in one embodiment of the present invention one is burnt machine method and is comprised the following steps: a test data write in a flash memory of an embedded flash card; By an order line (command line) electrical ground of this embedded flash card, be stuck in an open state (boot state) to operate this embedded flash memory; In this embedded flash card be in this open state and this test data is present in this flash memory through identification time, collect a test report, this test report is stored in this flash memory.In one embodiment, above burns machine flow process, and the block (blocks) in this flash memory is tested with this test data.In addition, collected test report can the use for reference when this embedded flash card is normal running.
A mount pad and a wire is comprised according to the test board that another embodiment of the present invention realizes.Described mount pad is stuck in this test board for installing an embedded flash memory.About the embedded flash card that this mount pad is installed, wherein flash memory has write test firmware and the test data for burn in process for performing.Via this wire that this test board provides, an order line (command line) electrical ground of this embedded flash card, operates this embedded flash memory and is stuck in an open state (boot state).Based on the test data that open state and this flash memory of this embedded flash card have, executory test firmware performs one to this flash memory and burns machine flow process, tests multiple block of this flash memory and collect a test report in this burning machine flow process with this test data.This test report is stored in this flash memory.In addition, this test report can be referenced when this embedded flash card is normal running.
Comprise a flash memory and a controller according to the embedded flash card that one embodiment of the present invention realizes, wherein, this controller comprises a ROM (read-only memory).Above-mentioned flash memory stores a customized source code and a test report.This test report is burnt machine flow process by one and is collected.This burning machine flow process execution design this embedded flash card order line (command line) electrical ground (operate this embedded flash memory and be stuck in an open state boot state) and this test data is present in this cache memory through identification time.Multiple blocks of this flash memory are tested with this test data in this burning machine flow process.Described ROM (read-only memory) is for storing a read-only procedure code (ROM code).Can with this controller of a host communication to the control of this flash memory according to this read-only procedure code and this customized source code and with reference to there being this test report.
For making above-mentioned purpose of the present invention, feature and advantage become apparent, special embodiment below, and coordinate appended diagram, be described in detail as follows.
Accompanying drawing explanation
The burn in process design that the embedded flash card of Fig. 1 diagram is known;
The test board 200 that Fig. 2 diagram realizes according to one embodiment of the present invention, for the burning machine flow process realizing embedded flash card;
The embedded flash card 300 that Fig. 3 diagram realizes according to one embodiment of the present invention;
Fig. 4 is a process flow diagram, the burning machine method that diagram realizes according to one embodiment of the present invention, for embedded flash card;
Fig. 5 is a process flow diagram, the embedded flash card burn in process that diagram realizes according to one embodiment of the present invention and embedded flash card comparation and assessment technology (based on described burn in process); And
Fig. 6 is a process flow diagram, a kind of embodiment of detailed annotation step S510.
Main element symbol description
102_1 ... the embedded flash card of 102_N;
104_1 ... 104_N card reader;
106 main frames;
202 mount pads;
204 wires;
206 embedded flash cards;
208 light emitting diodes;
210 oscillators;
300 embedded flash cards;
302 flash memories;
304 controllers;
306 ROM (read-only memory);
308 customized source codes;
310 test report;
312 read-only procedure codes;
314 main frames;
CLK clock pulse line;
CMD order line;
Data [0] data line;
GND ground end;
Power power supply;
S402 ... S408, S502 ... S520, S602 ... S612 step.
Embodiment
The test board 200 that Fig. 2 diagram is done for the burning machine flow process of embedded flash card according to one embodiment of the present invention.Test board 200 can be used for the embedded flash card of test polylith.Simple declaration it, single group of protos test suite PROTOS (corresponding one piece of embedded flash card) is only discussed below.One protos test suite PROTOS may comprise mount pad 202 and a wire 204.By this mount pad 202, embedded flash card 206 links this test board 200.
Note that embedded flash card 206 can first link a main frame before being mounted to this mount pad 202, to download test formula code and test data.Therefore, the embedded flash card 206 be installed on mount pad 202 has had test firmware for performing and the test data had needed for burning machine flow process.
One order line CMD electrically connect of this embedded flash card 206 is held GND by wire 204, is in an open state (boot state is generally used for supply start data to a main frame) to operate this embedded flash card 206.When performed test firmware sense this embedded flash card 206 open state and pick out this flash memory comprise this test data time, the performed tough cognition of test performs one and burns machine flow process on this flash memory, tests multiple blocks (blocks) of this flash memory with this test data.Burning machine flow process is collected has a test report to be stored in this flash memory, for reference during this embedded flash card 206 normal running.Based on this test report collected by aforementioned techniques, an embedded flash card can more effectively use wherein flash memory, or an embedded flash card can at before sales according to above-mentioned test report classification.In addition, because this burning machine flow process self is dominated by this embedded flash card 206, and main frame that need not be extra or card reader, therefore, test board 200 can carry out heatproof test.
This test board 200 more can comprise multiple light emitting diode (LEDs), set by the different protos test suite PROTOSs on test board 200.As shown in the figure, light emitting diode 208 can link a data line Data [0] of this embedded flash card 206.In one embodiment of the present invention, performed test firmware adopts this data line Data [0] to show the state (such as, product quality) of the flash memory of this embedded flash card 206 when performing this burning machine flow process.Therefore, this light emitting diode 208 can glimmer according to the state (such as, product quality) of the flash memory of this embedded flash card 206.Embodiment shows embedded flash card 206 fault on mount pad 202 with the light emitting diode 208 of continuous illumination, will remove from production line.
In another embodiment of the present invention, performed test firmware adopts this data line Data [0] whether to show the flash memory of this embedded flash card 206 through this burning machine flow testing.Therefore, light emitting diode 208 can glimmer according to the progress of this burning machine flow process.Workers can have a clear understanding of the progress of burning machine flow process.
Test board 200 can more comprise should multiple oscillators of test board more than 200 protos test suite PROTOS.In the embodiment of Fig. 2, the exclusive protos test suite PROTOS of each oscillator.As shown in the figure, oscillator 210 can link a clock pulse line CLK of this embedded flash card 206, is specific to this embedded flash card 206 on this mount pad 202 to produce a clock signal.Exclusive oscillator design guarantees the accuracy of clock signal.Special declaration, exclusive oscillator design is non-limiting feature.In another embodiment, all on test board protos test suite PROTOSs can share single time clock source.
The embedded flash card 300 that Fig. 3 diagram realizes according to one embodiment of the present invention.This embedded flash card 300 comprises a flash memory 302 and has a controller 304 of a ROM (read-only memory) 306.Flash memory 302 has customized source code 308 and a test report 310.ROM (read-only memory) 306 stores a read-only procedure code (ROM code) 312.
Test report 310 is collected in the burning machine flow process of production line.The operational design of burning machine flow process this embedded flash card 300 an order line (command line) electrical ground (be an open state boot state in order to operate this embedded flash card 300) and a test data suffers identification to be present in this flash memory time.Multiple blocks of this flash memory 302 are tested with this test data in this burning machine flow process.With reference to the test board 200 of figure 2, the test report after tested collected by plate 200 can be used to the test report 310 realizing embedded flash card 300.
In practical application, with the controller 304 of main frame 314 communication to the control system of this flash memory 302 according to this read-only procedure code 312, this customized source code 308 and with reference to this test report 310.
Described test report 310 can comprise a time counting (how long indicating this burning machine flow performing) or the damage block information of this flash memory 302 or the bug check of each block and correcting code (error checking and correction, ECC) state.In one embodiment, multiple blocks of this flash memory are tested repeatedly by same test data, until meet a loop number.Therefore, this test report 310 more can comprise the number of blocks of test crash in a loop counting (the loop quantity of instruction burning machine flow process) or each loop.
According to one embodiment of the present invention, Fig. 4 is with the burning machine flow process of the embedded flash card of a process flow diagram diagram.In step S402, test data writes a flash memory of an embedded flash card.In step S404, an order line electrical ground of this embedded flash card is an open state to operate this embedded flash card.When this embedded flash card is open state and this test data picked out and is present in this flash memory, step S406 performs one at this flash memory and burns machine flow process, and wherein, by this burning machine flow process, each block of this flash memory is tested by this test data.In step S408, this burning machine flow process comprises collection one test report, and this test report is stored in this flash memory and is stuck in normal running with reference to using by this embedded flash memory.
In a kind of embodiment of described burning machine method, environment temperature acutely changes in burning machine flow process, and this embedded flash card is tested by this test data at different temperatures.Therefore, disclosed burning machine flow process comprises the temperature tolerance test of embedded flash card.
In a kind of embodiment of described burning machine method, a data line of embedded flash card is for showing this flash memory in burning the state (such as, product quality) in machine flow process.In another embodiment burning machine method, whether described data line is for showing flash memory just with this burning machine flow testing.
In a kind of embodiment of described burning machine method, burn machine flow process and more record a PognM-epo.Described PognM-epo is stored in this flash memory, for the burning machine flow process reference that power-off is sent a telegram in reply again.
In disclosed burning machine flow process, each block of described flash memory can erase after with this test data reprogramming, then be read out to confirm fiduciary level.Disclosed test report can by erasing/programming/read operation collection above.In one embodiment, multiple blocks of flash memory are tested repeatedly by this test data, until meet a loop number.Described test report can comprise in loop counting or the bug check of time counting or bad block information or each block and correcting code state or each loop by the number of blocks of test.
In a kind of embodiment of disclosed burning machine method, this test report more can be used in the embedded flash card of before sales classification.
According to one embodiment of the present invention, Fig. 5 is with the classification technique (based on described burn in process) of the burn in process of the embedded flash card of a process flow diagram diagram one and embedded flash card.In step S502, an embedded flash card (also known as embedded flash card sample) couples a main frame (also known as eMMC main frame), and this main frame is at this embedded flash card write (writing wherein flash memory) test firmware.In step S504, test data is downloaded to this embedded flash card (being loaded into wherein flash memory) by this main frame.In step S506, this embedded flash card and this main frame disconnect, and change link test board as shown in Figure 2.In step S508, test board is moved to a test environment (the temperature modulation environment such as, needed for heatproof test).In step S510, test board starts (power supply Power powers on), and on it, embedded flash card is according to the tough body action of test.(set up by this test board based on an order line of this embedded flash card and the electrically connect of an earth terminal, operate this embedded flash memory and be stuck in an open state boot state) and the test data that recognizes, executory test firmware carries out burning machine flow process on the flash memory of this embedded flash card, and collects test report in burning machine flow process.Then, step S512 is performed.In step S512, test board decapacitation.In step S514, embedded flash card removes from this test board.In step S516, this embedded flash card links this main frame, and this main frame downloads test report from this embedded flash card.In step S518, main frame appraises through comparison this embedded flash card according to this test report.In step S520, test firmware removes from this embedded flash card by main frame, and this main frame writes a customized firmware to this embedded flash card (being written to wherein flash memory).
6th figure is with a kind of embodiment of process flow diagram detailed annotation step S510.In step S602, test board starts.Step S604 judges whether this embedded flash card is in open state (boot state).When this embedded flash card is not in open state, routine executing step S606, omits burning machine flow process to carry out general embedded flash card operation.When this embedded flash card is in open state, routine executing step S608, judges whether this embedded flash card comprises test data.If this embedded flash card does not comprise test data after identification, routine executing step S606, omit burning machine flow process to carry out general embedded flash card operation.If test data picked out be present in this embedded flash card, routine executing step S610.Step S610 carries out burning machine flow process to the flash memory of this embedded flash card, and collects test report in burning machine flow process.In some embodiments, flow process more comprises a non-limiting step S612.In step S612, the quality of this embedded flash card or burning machine state are shown in a data line (can control the display of a light emitting diode) of this embedded flash card.
Although the present invention discloses as above with preferred embodiment; so itself and be not used to limit the present invention; any those who are familiar with this art; without departing from the spirit and scope of the present invention; when doing a little change and retouching, therefore protection scope of the present invention is when being as the criterion depending on the accompanying claim person of defining.
Claims (16)
1. embedded flash card burns a machine method, comprising:
One test data is write a flash memory of an embedded flash card;
By a wire of test board, being held with being electrically connected to by an order line of this embedded flash card, is an open state to operate this embedded flash card;
When this embedded flash card is this open state and this test data is present in this flash memory through identification, one is performed to this flash memory and burns machine flow process; And
In this burning machine flow process, collect a test report, and store this test report to this flash memory.
2. embedded flash card as claimed in claim 1 burns machine method, and it is characterized in that, this burning machine flow process tests multiple blocks of this flash memory with this test data.
3. embedded flash card as claimed in claim 2 burns machine method, it is characterized in that, also comprises control one environment temperature, this burning machine flow operations is tested this embedded flash card under various temperature.
4. embedded flash card as claimed in claim 2 burns machine method, it is characterized in that, also comprises and adopts a data line of this embedded flash card to show a state of this flash memory when performing this burning machine flow process.
5. embedded flash card as claimed in claim 2 burns machine method, it is characterized in that, also comprise the state of the data line controlling this embedded flash card, to show this burning machine flow process, whether positive interaction is on this flash memory.
6. embedded flash card as claimed in claim 2 burns machine method, and it is characterized in that, be also included in this burning machine flow process and record a PognM-epo, this PognM-epo is stored in this flash memory, for the burning machine flow process reference of sending a telegram in reply again after power-off.
7. embedded flash card as claimed in claim 2 burns machine method, it is characterized in that, in this burning machine flow process, each block of this flash memory is erased, then again programmes with this test data and be then read out checking fiduciary level, to collect this test report.
8. embedded flash card as claimed in claim 2 burns machine method, and it is characterized in that, in this burning machine flow process, each block of this flash memory is tested repeatedly by this test data, until meet a loop number.
9. embedded flash card as claimed in claim 8 burns machine method, it is characterized in that, this test report comprises the bug check of a loop counting or a time counting or damage block information or each block and the block amount not by testing of correcting code or each loop.
10. embedded flash card as claimed in claim 2 burns machine method, and it is characterized in that, this test report is more for appraising through comparison this embedded flash card.
The test board of 11. 1 kinds of embedded flash card burn in process, comprising:
One mount pad, for the embedded flash card of installation one, this embedded flash card has a flash memory, and this flash memory stores a test data of a test firmware and the burning test performed;
One wire, the order line being electrically connected this embedded flash card extremely is held, be an open state to operate this embedded flash card, wherein, this performed test firmware performs one when picking out this test data to this flash memory and burns machine flow process, test multiple blocks of this flash memory with this test data, and collect a test report in this burning machine flow process, this test report is stored in this flash memory.
The test board of 12. embedded flash card burn in process as claimed in claim 11, is characterized in that, also comprise:
One light emitting diode, is connected and installed in a data line of this embedded flash card on this mount pad, and wherein, this data line shows a state of this flash memory when this burning machine flow process is carried out.
The test board of 13. embedded flash card burn in process as claimed in claim 11, is characterized in that, also comprise:
One light emitting diode, is connected with a data line of this embedded flash card be installed on this mount pad, and wherein this data line shows on this flash memory whether implementing this burning machine flow process.
The test board of 14. embedded flash card burn in process as claimed in claim 11, is characterized in that, also comprise:
One oscillator, produces an exclusive clock signal for this embedded flash card be installed on this mount pad.
15. 1 kinds of embedded flash cards, comprising:
One flash memory, store a customized source code and a test report, wherein this test report is burnt in machine flow process one and is collected, this burning machine flow process when this embedded flash card an order line through electrical ground make this embedded flash card be an open state and a test data is present in this flash memory through identification time perform, and this burning machine flow process tests multiple blocks of this flash memory with this test data; And
Have a controller of a ROM (read-only memory), wherein this ROM (read-only memory) stores a read-only procedure code, and this controller to the control of this flash memory based on this read-only procedure code, this customized source code and with reference to this test report.
16. embedded flash cards as claimed in claim 15, it is characterized in that, the collection of this test report tests the plurality of block of this flash memory until meet a loop number repeatedly with this test data, and this test report comprises the bug check of a loop counting or a time counting or damage block information or each block and the block amount not by testing of correcting code state or each loop.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161551168P | 2011-10-25 | 2011-10-25 | |
| US61/551,168 | 2011-10-25 | ||
| TW101112573 | 2012-04-10 | ||
| TW101112573A TWI489474B (en) | 2011-10-25 | 2012-04-10 | Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same |
Publications (2)
| Publication Number | Publication Date |
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| CN103077743A CN103077743A (en) | 2013-05-01 |
| CN103077743B true CN103077743B (en) | 2015-08-05 |
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| CN201210409873.9A Active CN103077743B (en) | 2011-10-25 | 2012-10-24 | Burn-in method and test board for embedded flash memory card, and embedded flash memory card |
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| CN105510755A (en) * | 2016-01-25 | 2016-04-20 | 联宝(合肥)电子科技有限公司 | Testing device |
| CN110109791A (en) * | 2019-05-16 | 2019-08-09 | 深圳市时创意电子有限公司 | A kind of test method for verifying eMMC data stability and reliability |
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| US6910162B2 (en) * | 2003-05-12 | 2005-06-21 | Kingston Technology Corp. | Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane |
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| CN101145402A (en) * | 2007-10-26 | 2008-03-19 | 中兴通讯股份有限公司 | Flash memory card test device and method |
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