CN103076530B - CMOS chip automatic open-short circuit system and method for testing - Google Patents
CMOS chip automatic open-short circuit system and method for testing Download PDFInfo
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- CN103076530B CN103076530B CN201210585947.4A CN201210585947A CN103076530B CN 103076530 B CN103076530 B CN 103076530B CN 201210585947 A CN201210585947 A CN 201210585947A CN 103076530 B CN103076530 B CN 103076530B
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Abstract
nullThe invention discloses a kind of CMOS chip automatic open-short circuit system and method for testing，This test system includes main control chip、Multiplexing module、LCD MODULE and memory module，Described main control chip respectively with described multiplexing module、Described LCD MODULE is connected with described memory module，Described multiplexing module is connected with CMOS chip to be measured，Described main control chip can carry out signals collecting by described multiplexing module and carry out signal processing by software the pin of CMOS chip to be measured，By described memory module, signal processing results can be stored，By LCD MODULE, signal processing results can also be shown，The present invention disclosure satisfy that the automatic open-short circuit of various CMOS chip on market，The precision of test is improve while optimal inspection efficiency，Testing standard can be formulated according to different CMOS chip.
Description
Technical field
The present invention relates to a kind of open-short circuit tester and method of testing, be specifically related to a kind of CMOS chip
Automatically open-short circuit system and method for testing, it is adaptable to DVP interface, MIPI single channel interface,
Various types of CMOS cores such as MIPI dual pathways interface, MIPI four-way interface and self defined interface
The open-short circuit of sheet.
Background technology
Open-short circuit (is tested also known as OPEN/SHORT, O/S tests), is mainly used for test electricity
The connection of sub-device, as the term suggests, open-short circuit tests open circuit and short circuit exactly, opens
Short-circuit test application the most extensively, such as: test pcb board, is tested IC bonding line, is tested I
The encapsulation of C, tests wire rod, tests FPC, and testing film switchs, test connector etc., no
Same application has again the special demand of comparison, and at present, the open-short circuit tester of CMOS chip can only
Product for parallel port is tested, it is impossible to meet increasing MIPI interface CMOS on market
The open-short circuit of chip.
Summary of the invention
In order to solve above-mentioned technical problem, the present invention proposes a kind of CMOS chip automatic open-short circuit system
System and method of testing, it is possible to meet various CMOS chip on market
Automatic open-short circuit, improve the precision of test while optimal inspection efficiency, can foundation
Different CMOS chip formulates testing standard.
The technical scheme is that and be achieved in that:
A kind of CMOS chip automatic open-short circuit system, including main control chip, multiplexing module,
LCD MODULE and memory module, described main control chip respectively with described multiplexing module,
Described LCD MODULE is connected with described memory module, and described multiplexing module is with to be measured
CMOS chip is connected, and described main control chip can be by described multiplexing module to CM to be measured
The pin of OS chip carries out signals collecting and carries out signal processing by software, it is possible to by described
Signal processing results is stored by memory module, additionally it is possible to by LCD MODULE by signal
Result shows.
As a further improvement on the present invention, being additionally provided with shifting device, described shifting device is with described many
Road Multiplexing module is connected, described multiplexing module can by described shifting device select with
The interface modes that CMOS chip to be measured matches.
As a further improvement on the present invention, described interface modes is DVP interface, MIPI single channel interface
, MIPI dual pathways interface, one in MIPI four-way interface and self defined interface.
As a further improvement on the present invention, it is additionally provided with communication module, described communication module and described master
Control chip is connected, and described main control chip can be described main control chip by described communication module
Power supply and transmission data.
As a further improvement on the present invention, described communication module is USB communication interface.
The method of testing of a kind of CMOS chip automatic open-short circuit system, including such as
Lower step:
A, open test, first, main control chip gives the G of CMOS chip to be measured by multiplexing module
The test signal of ND pin input 1.5V, then, main control chip is by multiplexing module successively
Gather the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured, if current
The protection diode of pin does not collect conduction voltage drop signal, then judge current pin open circuit
, otherwise, then judge that current pin is normal, stores open test information by memory module.
B, short-circuit test, first, main control chip gives CMOS chip to be measured successively by multiplexing module
The test signal of pin input 1.5v, then, main control chip passes through multiplexing module
Gather and contrast in addition to input signal pin the output signal of other pin whether with input signal
Identical, if signal is identical, judge that the pin of current collected contrast is short with signal input tube foot
Road, if signal differs, judges that current pin is normal, is surveyed by memory module storage short circuit
Examination information；
C, open circuit information is shown by LCD MODULE with short circuit information.
The invention has the beneficial effects as follows: the present invention provides a kind of CMOS chip automatic open-short circuit system
, main control chip gives the GND pin input test signal of CMOS chip to be measured by multiplexing module
, then, it is judged that whether the protection diode of each pin of CMOS chip to be measured has conduction voltage drop signal
, it is possible to realizing the open test of CMOS chip, main control chip is given successively by multiplexing module
The test signal of one pin input 1.5v of CMOS chip to be measured, then, it is judged that input signal
Pin is the most identical with the output signal of other pin, it is possible to realize the short-circuit test of CMOS chip
, particularly, multiplexing module is matched by shifting device selection and CMOS chip to be measured
Interface modes, interface modes is that DVP interface, MIPI single channel connect
One in mouth, MIPI dual pathways interface, MIPI four-way interface and self defined interface, it is possible to
Effectively meet the automatic open-short circuit of various CMOS chip on market, optimal inspection efficiency same
Time improve the precision of test.
Accompanying drawing explanation
Fig. 1 is principle of the invention schematic block diagram；
Fig. 2 is testing process schematic diagram of the present invention.
Detailed description of the invention
As depicted in figs. 1 and 2, a kind of CMOS chip automatic open-short circuit system, including main control chip
, multiplexing module, LCD MODULE and memory module, described main control chip respectively with institute
State multiplexing module, described LCD MODULE is connected with described memory module, described many
Road Multiplexing module is connected with CMOS chip to be measured, and described main control chip can be by described multichannel
Multiplexing module is carried out signals collecting and is carried out at signal by software the pin of CMOS chip to be measured
Reason, it is possible to by described memory module, signal processing results is stored, additionally it is possible to pass through liquid
Signal processing results is shown by brilliant display module.
Preferably, being additionally provided with shifting device, described shifting device is connected with described multiplexing module
, described multiplexing module can be selected and CMOS chip to be measured phase by described shifting device
The interface modes joined.
Preferably, described interface modes is DVP interface, MIPI single channel interface, MIPI dual pathways interface
, one in MIPI four-way interface and self defined interface.
Preferably, it is additionally provided with communication module, described communication module and described main control chip
Be connected, described main control chip can by described communication module be described main control chip power and
Transmission data.
Preferably, described communication module is USB communication interface.
The method of testing of a kind of CMOS chip automatic open-short circuit system, comprises the steps:
A, open test, first, main control chip gives the G of CMOS chip to be measured by multiplexing module
The test signal of ND pin input 1.5V, then, main control chip is by multiplexing module successively
Gather the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured, if current
The protection diode of pin does not collect conduction voltage drop signal, then judge current pin open circuit
, otherwise, then judge that current pin is normal, stores open test information by memory module.
B, short-circuit test, first, main control chip gives CMOS chip to be measured successively by multiplexing module
The test signal of pin input 1.5v, then, main control chip passes through multiplexing module
Gather and contrast in addition to input signal pin the output signal of other pin whether with input signal
Identical, if signal is identical, judge that the pin of current collected contrast is short with signal input tube foot
Road, if signal differs, judges that current pin is normal, is surveyed by memory module storage short circuit
Examination information；
C, open circuit information is shown by LCD MODULE with short circuit information.
The test philosophy of CMOS chip of the present invention automatic open-short circuit system and method for testing is as follows: open
Road test philosophy, owing to the forward conduction voltage of normal CMOS chip protection diode is at 0.4V-0
.5V between, during pin open circuit, this protection diode is not turned on, therefore can be by test CMOS core
The conducting voltage signal of the protection diode of each pin of sheet may determine that whether pin opens a way；Short circuit
Test philosophy, to one
The pin input test signal of CMOS chip, goes to gather the signal on other pin, if adopting simultaneously
The test signal that collection arrives is consistent with the test signal of input, then it represents that this pin and the input of test
Pin short circuit.
Above example is referring to the drawings, to a preferred embodiment of the present invention will be described in detail, ability
The technical staff in territory by not carrying out the amendment on various forms or change to above-described embodiment, but not
In the case of deviating from the essence of the present invention, all fall within the scope and spirit of the invention.
Claims (4)
1. a CMOS chip automatic open-short circuit system, it is characterised in that: bag
Include main control chip, multiplexing module, LCD MODULE and memory module, described
Main control chip respectively with described multiplexing module, described LCD MODULE and described
Memory module is connected, and described multiplexing module is connected with CMOS chip to be measured,
Described main control chip can be by described multiplexing module to CMOS chip to be measured
Pin carries out signals collecting and carries out signal processing by software, it is possible to deposited by described
Signal processing results is stored by storage module, additionally it is possible to will by LCD MODULE
Signal processing results shows；It is additionally provided with shifting device, described shifting device and institute
Stating multiplexing module to be connected, described multiplexing module can pass through described dial-up
Device selects the interface modes matched with CMOS chip to be measured；Described interface modes
For DVP interface, MIPI single channel interface, MIPI dual pathways interface, MIPI four-way
One in pipeline joint and self defined interface.
CMOS chip the most according to claim 1 automatic open-short circuit system,
It is characterized in that: be additionally provided with communication module, described communication module and described main control chip
Being connected, described main control chip can be described main control chip by described communication module
Power supply and transmission data.
CMOS chip the most according to claim 2 automatic open-short circuit system,
It is characterized in that: described communication module is USB communication interface.
4. the CMOS chip as described in any one of claim 1-3 is opened short automatically
The method of testing of path test system, it is characterised in that: comprise the steps:
A, open test, first, main control chip is given to be measured by multiplexing module
The test signal of the GND pin input 1.5V of CMOS chip, then, main control chip
Protection two pole of each pin of CMOS chip to be measured is gathered successively by multiplexing module
The conduction voltage drop signal of pipe, if the protection diode of current pin does not collect
Conduction voltage drop signal, then judge current pin open circuit, otherwise, then judge current pipe
Foot is normal, stores open test information by memory module；
B, short-circuit test, first, main control chip is given successively by multiplexing module
The test signal of one pin input 1.5v of CMOS chip to be measured, then, master control
Chip gathers and contrasts in addition to input signal pin other by multiplexing module
The output signal of pin is the most identical with input signal, if signal is identical, judges to work as
The pin of front collected contrast and the short circuit of signal input tube foot, if signal differs,
Judge that current pin is normal, store short-circuit test information by memory module；
C, open test information is shown by LCD MODULE with short-circuit test information
Illustrate.
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| CN201210585947.4A CN103076530B (en) | 2012-12-28 | 2012-12-28 | CMOS chip automatic open-short circuit system and method for testing |
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| CN201210585947.4A CN103076530B (en) | 2012-12-28 | 2012-12-28 | CMOS chip automatic open-short circuit system and method for testing |
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| CN103076530B true CN103076530B (en) | 2016-12-28 |
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| CN104297614A (en) * | 2014-09-16 | 2015-01-21 | 冀雅(廊坊)电子有限公司 | Short-circuit testing device and method for segment code type liquid crystal display module |
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| CN105548790B (en) * | 2015-12-09 | 2019-08-16 | 上海斐讯数据通信技术有限公司 | A kind of USB3.1 Type-C cable automatic test approach and system |
| CN105823956A (en) * | 2016-03-16 | 2016-08-03 | 昆山软龙格自动化技术有限公司 | IC open/short test system integrated in USB3.0 test card |
| CN105891657A (en) * | 2016-04-25 | 2016-08-24 | 万高(杭州)科技有限公司 | Method and apparatus for detecting chip bonding conditions of printed circuit board |
| CN106771823A (en) * | 2017-02-06 | 2017-05-31 | 湖北三赢兴电子科技有限公司 | Camera module open-short circuit device, system |
| CN106899844A (en) * | 2017-02-13 | 2017-06-27 | 张家港市欧微自动化研发有限公司 | A kind of cmos sensor test system |
| CN108804261B (en) * | 2017-05-05 | 2023-05-19 | 中兴通讯股份有限公司 | Connector testing method and device |
| CN108957290A (en) * | 2018-06-27 | 2018-12-07 | 四川斐讯信息技术有限公司 | A kind of SCM Based chip method for detecting short circuit and system |
| CN110133486B (en) * | 2019-06-13 | 2021-06-18 | 上海安路信息科技股份有限公司 | Pin bridging short circuit test method of FPGA |
| CN110133481B (en) * | 2019-06-13 | 2021-08-06 | 上海安路信息科技股份有限公司 | Test method and test circuit for IO bridge short circuit |
| CN111028882A (en) * | 2019-11-27 | 2020-04-17 | 大连睿海信息科技有限公司 | Detection device for storage medium |
| CN110988738A (en) * | 2019-12-13 | 2020-04-10 | 华显光电技术（惠州）有限公司 | Multi-interface open-short circuit test circuit and device |
| CN111929565A (en) * | 2020-08-12 | 2020-11-13 | 上海龙旗科技股份有限公司 | Test circuit board opens short-circuit device |
| CN113726742B (en) * | 2021-07-30 | 2023-07-21 | 昆山丘钛微电子科技股份有限公司 | Test authentication method, device, electronic equipment and medium |
| CN114859210A (en) * | 2022-04-22 | 2022-08-05 | 上海研鼎信息技术有限公司 | CMOS chip open-short circuit test system and test method |
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Address after: No.3, Taihong Road, Kunshan high tech Industrial Development Zone, Suzhou, Jiangsu Province, 215300 Patentee after: Kunshan Qiuti Microelectronics Technology Co.,Ltd. Address before: 215300 No. 2588, Huanqing Road, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Patentee before: KUNSHAN Q TECHNOLOGY Co.,Ltd. |