CN103048300A - Confocal laser scanning microscope - Google Patents

Confocal laser scanning microscope Download PDF

Info

Publication number
CN103048300A
CN103048300A CN2012105479668A CN201210547966A CN103048300A CN 103048300 A CN103048300 A CN 103048300A CN 2012105479668 A CN2012105479668 A CN 2012105479668A CN 201210547966 A CN201210547966 A CN 201210547966A CN 103048300 A CN103048300 A CN 103048300A
Authority
CN
China
Prior art keywords
laser scanning
scanning microscope
confocal laser
focusing microscope
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2012105479668A
Other languages
Chinese (zh)
Inventor
徐东
程晓农
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu University
Original Assignee
Jiangsu University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu University filed Critical Jiangsu University
Priority to CN2012105479668A priority Critical patent/CN103048300A/en
Publication of CN103048300A publication Critical patent/CN103048300A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The invention relates to a confocal laser scanning microscope. An objective table of the confocal laser scanning microscope is additionally provided with a heating device; a temperature measuring device and an infrared detector are additionally arranged between an objective lens and a sample platform of the confocal laser scanning microscope; and heat image processing software is additionally arranged in a computer system of the confocal laser scanning microscope. The confocal laser scanning microscope relates to the following novel detection characterization techniques: (1) the microstructures of materials can be researched; (2) the distribution condition in a large range is directly observed by applying impurity or doped phase fluorescence excitation; (3) fluorescence is captured to dynamically track; (4) a system is focused for many times to obtain images with different depths; and three-dimensional imaging can be implemented for samples through computer processing; and (5) the heat and mass transfer processes of various materials can be synchronously dynamically researched when the temperature is changed, so that material phase changed thermodynamics and dynamics mechanisms can be built.

Description

A kind of laser scanning co-focusing microscope
Technical field
The present invention relates to a kind of analysis and characterization device of novel material sample, be specifically related to a kind of laser scanning co-focusing microscope, belong to material and characterize technical field.
Background technology
The Main Means that present material sample surfaces or interface microscopic appearance characterize has scanning electron microscope (SEM), atomic force microscope (AFM), transmission electron microscopes (TEM) etc.: SEM can't test aqueous specimen, for some the are small (impurity of particle diameter<1nm) or mix and to improve multiplying power mutually, the raising of enlargement factor causes reducing of visual field, thus can't be in larger zone (distribution situation of observing minute impurities or doping phase directly perceived in about 1mm * 1mm); The AFM difficulty or ease are judged dephasign; TEM is very high to the requirement of sample, and sample preparation is difficult, and the same with SEM, can't intuitively observe the distribution situation of minute impurities or doping phase in larger zone.The non-destructive testing means of present material sample composition have X-ray diffraction (XRD), and the energy spectrometer that adds in the scanning electron microscope (EDS) or spectrometer (WDS) etc.: XRD is for less mutually helpless of microcell specific phase or content; EDS or WDS can only obtain the element relative content, can't judge facies type (as can only know that Ti and the ratio of O are 1:2, but rutile or anatase but can't be judged), and also helpless for the inner composition in cavity.So the current defective that does not also have a kind of material sample characterization method can remedy simultaneously above-mentioned characterization technique wants to use the heat and mass transfer process of the current material field means of testing while various materials of dynamic studies when temperature change then more without possibility.
Summary of the invention
The purpose of this invention is to provide a kind of novel testing of materials characterization apparatus, this device is low to the conditional request of sample, method of testing is simple, can in larger zone, intuitively observe the distribution situation of minute impurities or doping phase, the heat and mass transfer process of the various materials of dynamic studies when temperature change simultaneously can remedy the deficiency of current material means of testing.
For achieving the above object, the technical solution used in the present invention is as follows:
A kind of laser scanning co-focusing microscope, wherein, the objective table of laser scanning co-focusing microscope is provided with heating arrangement; Temperature measuring equipment and infrared detector are set between the object lens of laser scanning co-focusing microscope and the objective table; Be provided with the heat picture process software in the computer system of laser scanning co-focusing microscope, described infrared detector is connected with computer system.
Described heating arrangement is the heater coil of objective table below.
Novel microscope of the present invention is at the technical characterstic aspect the detection sign:
(1) can be in the normal temperature and pressure air atmosphere research material microscopic appearance, remedy SEM, the TEM system must vacuumize and the defective that can't test aqueous specimen.
(2) use the fluorescence excitation of impurity or doping phase intuitively to observe its distribution situation on a large scale, the resolution of fluorescence is higher than 2 orders of magnitude of microscope of common direct observation on the dark substrate, can differentiate well dephasign, remedy the deficiency of AFM, also remedy SEM, the TEM little deficiency in visual field under high magnification.Change optical maser wavelength and namely judge microcell facies type (identical component not homophase has different Bands cracks), remedy XRD, EDS(or WDS) deficiency.
(3) catch fluorescence, dynamically follow the tracks of.
(4) repeatedly focus through system, obtain the image of different depth, machine is processed and can be carried out three-dimensional imaging to sample as calculated.
(5) heat and mass transfer process of the various materials of dynamic studies when temperature change simultaneously can be set up the thermodynamics and dynamics mechanism of material phase transformation thus.
Wherein, characteristics (3), (4), (5) are innovative function, and Material Field also exists without the instrument with identity function at present.Originality of the present invention is high, is showed no similar report both at home and abroad.The present invention can be widely used in the sign of colleges and universities, scientific research institutions and enterprise's lab material sample, the theoretical research of Material Thermodynamics dynamical foundation can be provided, also can satisfy the applied research of microcosmic imaging impurity analysis, the development that promotes Material Field is had very great meaning.
Description of drawings
Fig. 1 is that function of the present invention is strengthened the laser scanning co-focusing microscope structural drawing, among the figure, and 1-photodetector, the burnt pin hole of 2-copolymerization, 3-spectroscope, 4-light source pin hole, 5-object lens, 6-Temperature Detector, 7-infrared detector, 8-focal plane of lens, 9-heater coil;
Fig. 2 is pure CaCu 3 Ti 4 O film bright field image;
Fig. 3 is the CaCu 3 Ti 4 O film bright field image of doping ZnO;
Fig. 4 is pure CaCu 3 Ti 4 O film fluorescence picture;
Fig. 5 is the CaCu 3 Ti 4 O film fluorescence picture of doping ZnO.
Embodiment
Function of the present invention is strengthened being: (1) adds heating arrangement at the objective table of laser scanning co-focusing microscope; (2) add temperature measuring equipment and infrared detector between laser scanning co-focusing microscope object lens and the sample stage; (3) computer system at laser scanning co-focusing microscope adds the heat picture process software.The present invention adopts the life science instrument---and laser scanning co-focusing microscope (LSCM) carries out the microcosmic imaging to common material sample (pottery, metal, macromolecule and the compound substance that is comprised of them etc.), can see intuitively the distribution situation of minute impurities or doping phase in larger visual field.Add heating arrangement, material sample is heat-treated, capable of dynamic is observed material diffusion and the atomic migration situation of sample interior or material interface, but with the kinetics mechanism of this research material phase transformation in heat treatment process.Basis at heating arrangement adds pyroscan, and the infrared radiation of scanning capture material sample obtains each temperature information of material, forms heat picture, but with the Thermodynamic Mechanism of this research material phase transformation in heat treatment process.
Embodiment 1
With laser scanning co-focusing microscope the pure CaCu 3 Ti 4 O film of preparation on silicon substrate carried out the imaging of light field microcosmic.As can be seen from Figure 2, in the well imaging of inorganic thin film that opaque substrate prepares, film is evenly fine and close in a big way, contains a small amount of impurity.
Embodiment 2
With laser scanning co-focusing microscope the CaCu 3 Ti 4 O film for preparing the ZnO doping on silicon substrate is carried out the imaging of light field microcosmic.As can be seen from Figure 3, the sign that laser scanning co-focusing microscope is used for material has very large resolution, and the fine crack of film is clear and legible, can distinguish easily dephasign in the film by light and shade difference.
Embodiment 3
The laser that adopts 380 nm is light source, with laser scanning co-focusing microscope pure CaCu 3 Ti 4 O film and the CaCu 3 Ti 4 O film of mixing ZnO is carried out fluorescence imaging.As can be seen from Figure 4 and Figure 5, in pure CaCu 3 Ti 4 O film, do not have the fluorescence bright spot, and in the CaCu 3 Ti 4 O film of doping ZnO, found the blue-fluorescence bright spot of the ZnO of sparse distribution.Can clearly distinguish the ZnO of doping and the CaCu 3 Ti 4 O of parent phase in larger visual field, the distribution situation of ZnO, migratory direction and growth course are very clear in the parent phase.

Claims (2)

1. a laser scanning co-focusing microscope is characterized in that, the objective table of laser scanning co-focusing microscope is provided with heating arrangement; Temperature measuring equipment and infrared detector are set between the object lens of described laser scanning co-focusing microscope and the objective table; Be provided with the heat picture process software in the computer system of described laser scanning co-focusing microscope, described infrared detector is connected with computer system.
2. a kind of laser scanning co-focusing microscope according to claim 1 is characterized in that, described heating arrangement is the heater coil of objective table below.
CN2012105479668A 2012-12-17 2012-12-17 Confocal laser scanning microscope Pending CN103048300A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012105479668A CN103048300A (en) 2012-12-17 2012-12-17 Confocal laser scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012105479668A CN103048300A (en) 2012-12-17 2012-12-17 Confocal laser scanning microscope

Publications (1)

Publication Number Publication Date
CN103048300A true CN103048300A (en) 2013-04-17

Family

ID=48061019

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012105479668A Pending CN103048300A (en) 2012-12-17 2012-12-17 Confocal laser scanning microscope

Country Status (1)

Country Link
CN (1) CN103048300A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104111241A (en) * 2013-04-22 2014-10-22 清华大学 Linear scanning-based fluorescence confocal detection device
CN104181089A (en) * 2013-05-22 2014-12-03 中国石油化工股份有限公司 Equipment for scanning facial porosity of rock and method thereof
CN107991766A (en) * 2016-10-26 2018-05-04 中国科学技术大学 A kind of microscope and imaging method with three-dimensional imaging ability
CN111415297A (en) * 2020-03-06 2020-07-14 清华大学深圳国际研究生院 Imaging method of confocal microscope

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1344952A (en) * 2000-09-29 2002-04-17 中国科学院低温技术实验中心 Heatable sample platform for scanning probe microscope
US20080247038A1 (en) * 2007-04-04 2008-10-09 Olympus Corporation Scanning confocal microscope
CN101300518A (en) * 2005-10-13 2008-11-05 株式会社东海希多 Microscope stage and microscope observing unit
JP2009300841A (en) * 2008-06-16 2009-12-24 Nikon Corp Heater, microscope, microscope system and culture vessel
CN201436599U (en) * 2009-06-22 2010-04-07 宝山钢铁股份有限公司 Objective table used for laser scanning confocal microscope
CN102216827A (en) * 2008-09-13 2011-10-12 独立行政法人科学技术振兴机构 Microscope device and fluorescent observing method using same
CN102262052A (en) * 2010-05-26 2011-11-30 中国科学院理化技术研究所 Laser confocal obliquely-incident ellipsometric high-throughput biomolecular reaction imaging detection device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1344952A (en) * 2000-09-29 2002-04-17 中国科学院低温技术实验中心 Heatable sample platform for scanning probe microscope
CN101300518A (en) * 2005-10-13 2008-11-05 株式会社东海希多 Microscope stage and microscope observing unit
US20080247038A1 (en) * 2007-04-04 2008-10-09 Olympus Corporation Scanning confocal microscope
JP2009300841A (en) * 2008-06-16 2009-12-24 Nikon Corp Heater, microscope, microscope system and culture vessel
CN102216827A (en) * 2008-09-13 2011-10-12 独立行政法人科学技术振兴机构 Microscope device and fluorescent observing method using same
CN201436599U (en) * 2009-06-22 2010-04-07 宝山钢铁股份有限公司 Objective table used for laser scanning confocal microscope
CN102262052A (en) * 2010-05-26 2011-11-30 中国科学院理化技术研究所 Laser confocal obliquely-incident ellipsometric high-throughput biomolecular reaction imaging detection device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104111241A (en) * 2013-04-22 2014-10-22 清华大学 Linear scanning-based fluorescence confocal detection device
CN104111241B (en) * 2013-04-22 2017-10-03 清华大学 Fluorescence co-focusing detection means based on linear scanning
CN104181089A (en) * 2013-05-22 2014-12-03 中国石油化工股份有限公司 Equipment for scanning facial porosity of rock and method thereof
CN107991766A (en) * 2016-10-26 2018-05-04 中国科学技术大学 A kind of microscope and imaging method with three-dimensional imaging ability
US11194142B2 (en) 2016-10-26 2021-12-07 University Of Science And Technology Of China Microscope having three-dimensional imaging capability and three-dimensional microscopic imaging method
CN111415297A (en) * 2020-03-06 2020-07-14 清华大学深圳国际研究生院 Imaging method of confocal microscope
CN111415297B (en) * 2020-03-06 2023-04-18 清华大学深圳国际研究生院 Imaging method of confocal microscope

Similar Documents

Publication Publication Date Title
Chirayil et al. Instrumental techniques for the characterization of nanoparticles
Inkson Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization
Reddy et al. Atomic structure of amorphous shear bands in boron carbide
Wang et al. Atomic scale imaging of magnetic circular dichroism by achromatic electron microscopy
Nelayah et al. Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging
Thoury et al. High spatial dynamics-photoluminescence imaging reveals the metallurgy of the earliest lost-wax cast object
Worobiec et al. Interfaced SEM/EDX and micro-Raman Spectrometry for characterisation of heterogeneous environmental particles—Fundamental and practical challenges
CN103048300A (en) Confocal laser scanning microscope
Jimenez-Sandoval Micro-Raman spectroscopy: a powerful technique for materials research
Aguilar et al. Non-destructive optical second harmonic generation imaging of 3D printed aluminum nitride ceramics
Pan et al. Tip-enhanced near-field Raman spectroscopy probing single dye-sensitized TiO2 nanoparticles
Gorgieva et al. Complementary assessment of commercial photoluminescent pigments printed on cotton fabric
Boothroyd et al. Atomic resolution imaging and spectroscopy of barium atoms and functional groups on graphene oxide
Furukawa et al. Fabrication of bright and thin Zn 2 SiO 4 luminescent film for electron beam excitation-assisted optical microscope
Gamcová et al. Mapping strain fields induced in Zr-based bulk metallic glasses during in-situ nanoindentation by X-ray nanodiffraction
Alay-e-Abbas et al. Characterization techniques for bionanocomposites
Timmermans et al. Integration of correlative Raman microscopy in a dualbeam FIB SEM
Godet et al. Multi-scale investigation of body-glaze interface in ancient ceramics
Nho et al. Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy
Fabbri et al. Origin of the visible emission of black silicon microstructures
Wang et al. Probing hydrogen in ZnO nanorods using solid-state H1 nuclear magnetic resonance
Hryhorenko et al. An innovative approach of surface polishing for SRF cavity applications
CN109269979B (en) Sample placing system and method for obtaining single-particle fluorescence-micro morphology
Hung et al. Potential application of tip-enhanced Raman spectroscopy (TERS) in semiconductor manufacturing
Srivastava et al. Tools and techniques used in nanobiotechnology

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C53 Correction of patent of invention or patent application
CB03 Change of inventor or designer information

Inventor after: Xu Dong

Inventor after: Cheng Xiaonong

Inventor after: Yu Renhong

Inventor after: He Kai

Inventor after: Wang Yang

Inventor before: Xu Dong

Inventor before: Cheng Xiaonong

COR Change of bibliographic data

Free format text: CORRECT: INVENTOR; FROM: XU DONG CHENG XIAONONG TO: XU DONG CHENG XIAONONG YU RENHONG HE KAI WANG YANG

C12 Rejection of a patent application after its publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20130417