CN103048060A - Junction temperature measuring device for LED (Light Emitting Diode) lamp - Google Patents
Junction temperature measuring device for LED (Light Emitting Diode) lamp Download PDFInfo
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- CN103048060A CN103048060A CN2011103079914A CN201110307991A CN103048060A CN 103048060 A CN103048060 A CN 103048060A CN 2011103079914 A CN2011103079914 A CN 2011103079914A CN 201110307991 A CN201110307991 A CN 201110307991A CN 103048060 A CN103048060 A CN 103048060A
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- light fixture
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- 230000007246 mechanism Effects 0.000 claims abstract description 68
- 239000013307 optical fiber Substances 0.000 claims abstract description 20
- 230000008878 coupling Effects 0.000 claims description 21
- 238000010168 coupling process Methods 0.000 claims description 21
- 238000005859 coupling reaction Methods 0.000 claims description 21
- 230000003028 elevating effect Effects 0.000 claims description 16
- 239000000835 fiber Substances 0.000 claims description 16
- 238000009529 body temperature measurement Methods 0.000 claims description 12
- 230000001105 regulatory effect Effects 0.000 claims description 9
- 238000000926 separation method Methods 0.000 claims 1
- 238000001228 spectrum Methods 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201110307991.4A CN103048060B (en) | 2011-10-11 | 2011-10-11 | Junction temperature measuring device for LED (Light Emitting Diode) lamp |
Applications Claiming Priority (1)
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CN201110307991.4A CN103048060B (en) | 2011-10-11 | 2011-10-11 | Junction temperature measuring device for LED (Light Emitting Diode) lamp |
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CN103048060A true CN103048060A (en) | 2013-04-17 |
CN103048060B CN103048060B (en) | 2014-05-28 |
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CN201110307991.4A Active CN103048060B (en) | 2011-10-11 | 2011-10-11 | Junction temperature measuring device for LED (Light Emitting Diode) lamp |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103267588A (en) * | 2013-06-05 | 2013-08-28 | 常州工学院 | Junction temperature testing device and junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum |
CN107607193A (en) * | 2017-10-13 | 2018-01-19 | 中节能晶和照明有限公司 | A kind of distribution photometer c γ test fixtures |
CN108414915A (en) * | 2018-06-13 | 2018-08-17 | 苏州晶品新材料股份有限公司 | The lossless real-time chip of LED light source can debate measuring device |
CN111939831A (en) * | 2020-07-24 | 2020-11-17 | 盐城鼎恒机械有限公司 | Automatic feeding device for paint line with anti-blocking and anti-cracking functions |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020180472A1 (en) * | 2001-05-30 | 2002-12-05 | Volker Kilian | Method and device for measuring a temperature in an electronic component |
US20080205482A1 (en) * | 2007-02-23 | 2008-08-28 | Cao Group, Inc. | METHOD AND TESTING EQUIPMENT FOR LEDs AND LASER DIODES |
CN201212842Y (en) * | 2008-04-11 | 2009-03-25 | 中国科学院广州电子技术研究所 | Large power LED junction temperature measurement device |
CN101701854A (en) * | 2009-11-18 | 2010-05-05 | 中国科学院上海技术物理研究所 | Method for detecting junction temperature of chip of LED lamp |
CN201548657U (en) * | 2009-12-07 | 2010-08-11 | 国家电光源质量监督检验中心(上海) | Measuring unit for LED forward voltage drop and junction temperature curve |
CN201772946U (en) * | 2010-05-20 | 2011-03-23 | 江西省通用半导体照明检测有限公司 | High-power silicon substrate LED junction temperature detection device |
-
2011
- 2011-10-11 CN CN201110307991.4A patent/CN103048060B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020180472A1 (en) * | 2001-05-30 | 2002-12-05 | Volker Kilian | Method and device for measuring a temperature in an electronic component |
US20080205482A1 (en) * | 2007-02-23 | 2008-08-28 | Cao Group, Inc. | METHOD AND TESTING EQUIPMENT FOR LEDs AND LASER DIODES |
CN201212842Y (en) * | 2008-04-11 | 2009-03-25 | 中国科学院广州电子技术研究所 | Large power LED junction temperature measurement device |
CN101701854A (en) * | 2009-11-18 | 2010-05-05 | 中国科学院上海技术物理研究所 | Method for detecting junction temperature of chip of LED lamp |
CN201548657U (en) * | 2009-12-07 | 2010-08-11 | 国家电光源质量监督检验中心(上海) | Measuring unit for LED forward voltage drop and junction temperature curve |
CN201772946U (en) * | 2010-05-20 | 2011-03-23 | 江西省通用半导体照明检测有限公司 | High-power silicon substrate LED junction temperature detection device |
Non-Patent Citations (2)
Title |
---|
赵光华等: "一种非接触大功率白光LED结温测量方法", 《电路与***学报》 * |
陈海燕等: "大功率白光LED的结温与发光光谱特性研究", 《中山大学学报(自然科学版)》 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103267588A (en) * | 2013-06-05 | 2013-08-28 | 常州工学院 | Junction temperature testing device and junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum |
CN103267588B (en) * | 2013-06-05 | 2015-04-01 | 常州工学院 | Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum |
CN107607193A (en) * | 2017-10-13 | 2018-01-19 | 中节能晶和照明有限公司 | A kind of distribution photometer c γ test fixtures |
CN107607193B (en) * | 2017-10-13 | 2024-05-28 | 中节能晶和科技有限公司 | C-gamma test clamp for distribution photometer |
CN108414915A (en) * | 2018-06-13 | 2018-08-17 | 苏州晶品新材料股份有限公司 | The lossless real-time chip of LED light source can debate measuring device |
WO2019237416A1 (en) * | 2018-06-13 | 2019-12-19 | 苏州晶品新材料股份有限公司 | Led light source nondestructive real-time chip visual measuring device |
CN111939831A (en) * | 2020-07-24 | 2020-11-17 | 盐城鼎恒机械有限公司 | Automatic feeding device for paint line with anti-blocking and anti-cracking functions |
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Publication number | Publication date |
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CN103048060B (en) | 2014-05-28 |
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TR01 | Transfer of patent right |
Effective date of registration: 20181204 Address after: Room 111, Building A1, 999 Gaolang East Road, Wuxi City, Jiangsu Province, 214000 Patentee after: ZHONGKE KELONG OPTICAL INSTR EQUIPMENT WUXI Co.,Ltd. Address before: 213164 South Building, Huiyan Building, Changzhou Science and Education City, No. 801 Changwu Middle Road, Changzhou City, Jiangsu Province Co-patentee before: SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCE Patentee before: Changzhou Institute of Optoelectronic Technology |
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Effective date of registration: 20231124 Address after: 214000 B, No. 212, Chengnan Road, Xinwu District, Wuxi City, Jiangsu Province Patentee after: WUXI KELONG TESTING MECHANICAL Co.,Ltd. Address before: Room 111, Building A1, 999 Gaolang East Road, Wuxi City, Jiangsu Province, 214000 Patentee before: ZHONGKE KELONG OPTICAL INSTR EQUIPMENT WUXI Co.,Ltd. |
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CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: 214000 B6, No. 212 Chengnan Road, Xinwu District, Wuxi City, Jiangsu Province Patentee after: WUXI KELONG TESTING MECHANICAL Co.,Ltd. Address before: 214000 B, No. 212, Chengnan Road, Xinwu District, Wuxi City, Jiangsu Province Patentee before: WUXI KELONG TESTING MECHANICAL Co.,Ltd. |