CN102929005B - Tft-lcd基板的探测装置 - Google Patents
Tft-lcd基板的探测装置 Download PDFInfo
- Publication number
- CN102929005B CN102929005B CN201210363912.6A CN201210363912A CN102929005B CN 102929005 B CN102929005 B CN 102929005B CN 201210363912 A CN201210363912 A CN 201210363912A CN 102929005 B CN102929005 B CN 102929005B
- Authority
- CN
- China
- Prior art keywords
- motor
- probe
- several
- tft
- electrically connected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Landscapes
- Liquid Crystal (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
Claims (6)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210363912.6A CN102929005B (zh) | 2012-09-26 | 2012-09-26 | Tft-lcd基板的探测装置 |
PCT/CN2012/082815 WO2014047978A1 (zh) | 2012-09-26 | 2012-10-12 | Tft-lcd基板的探测装置 |
US13/703,888 US8970245B2 (en) | 2012-09-26 | 2012-10-12 | Probing device for TFT-LCD substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210363912.6A CN102929005B (zh) | 2012-09-26 | 2012-09-26 | Tft-lcd基板的探测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102929005A CN102929005A (zh) | 2013-02-13 |
CN102929005B true CN102929005B (zh) | 2016-03-30 |
Family
ID=47643841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210363912.6A Active CN102929005B (zh) | 2012-09-26 | 2012-09-26 | Tft-lcd基板的探测装置 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN102929005B (zh) |
WO (1) | WO2014047978A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104715705B (zh) * | 2015-03-30 | 2017-04-19 | 深圳市华星光电技术有限公司 | 一种用于液晶显示面板的检测装置 |
CN106873195B (zh) * | 2015-12-11 | 2020-10-30 | De&T株式会社 | 探针单元更换装置 |
CN108538269B (zh) * | 2018-05-30 | 2020-09-18 | 武汉精测电子集团股份有限公司 | 基于可编程功率放大器的液晶面板驱动***及配向方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101071205A (zh) * | 2007-07-06 | 2007-11-14 | 友达光电股份有限公司 | 液晶面板检测方法及装置 |
CN101995679A (zh) * | 2009-08-27 | 2011-03-30 | 沋博普利斯金股份有限公司 | 多探头单元 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5506512A (en) * | 1993-11-25 | 1996-04-09 | Tokyo Electron Limited | Transfer apparatus having an elevator and prober using the same |
KR100817131B1 (ko) * | 2002-03-15 | 2008-03-27 | 엘지.필립스 엘시디 주식회사 | 액정 패널의 검사 장치 및 그 방법 |
KR101279656B1 (ko) * | 2008-12-22 | 2013-06-27 | 엘지디스플레이 주식회사 | 프로브 검사장치 |
CN201796208U (zh) * | 2010-09-06 | 2011-04-13 | 均豪精密工业股份有限公司 | 液晶面板点灯检测机的探针组定位装置 |
KR101129195B1 (ko) * | 2010-12-20 | 2012-03-27 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 |
KR101234088B1 (ko) * | 2010-12-30 | 2013-02-19 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 |
-
2012
- 2012-09-26 CN CN201210363912.6A patent/CN102929005B/zh active Active
- 2012-10-12 WO PCT/CN2012/082815 patent/WO2014047978A1/zh active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101071205A (zh) * | 2007-07-06 | 2007-11-14 | 友达光电股份有限公司 | 液晶面板检测方法及装置 |
CN101995679A (zh) * | 2009-08-27 | 2011-03-30 | 沋博普利斯金股份有限公司 | 多探头单元 |
Also Published As
Publication number | Publication date |
---|---|
WO2014047978A1 (zh) | 2014-04-03 |
CN102929005A (zh) | 2013-02-13 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Detection device of thin film transistor-liquid crystal display (TFT-LCD) substrate Effective date of registration: 20190426 Granted publication date: 20160330 Pledgee: Bank of Beijing Limited by Share Ltd Shenzhen branch Pledgor: Shenzhen Huaxing Optoelectronic Technology Co., Ltd. Registration number: 2019440020032 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20201016 Granted publication date: 20160330 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: Shenzhen China Star Optoelectronics Technology Co.,Ltd. Registration number: 2019440020032 |