CN102820924B - Adjusting and optimizing algorithm for optimum operating bias voltage of avalanche photodiode - Google Patents
Adjusting and optimizing algorithm for optimum operating bias voltage of avalanche photodiode Download PDFInfo
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Abstract
The invention discloses an adjusting and optimizing algorithm for optimum operating bias voltage of an avalanche photodiode. The adjusting and optimizing algorithm includes steps of firstly, determining the optimum input photo power; and secondly, scanning bias voltage of the APD (avalanche photodiode) under the optimum input photo power, and finding out the bias voltage corresponding to the minimum BER (bit error rate), namely the optimum operating bias voltage of the APD. In the adjusting and optimizing algorithm, the optimum bias voltage of different APDs is found in large BER during the optimum bias voltage scanning by automatically adjusting input photo power, the BERs tested near the optimum bias voltage are quite different, accuracy of scanning is guaranteed, and the optimum operating bias voltage of each APD can be found, and the optimum sensitivity can be obtained.
Description
Technical field
The present invention relates to a kind of evolutionary algorithm in optical communication field, particularly a kind of evolutionary algorithm of avalanche photodide best effort bias voltage.
Background technology
Avalanche photo diode (APD) is that a kind of light of p-n junction type detects diode.The operation principle of avalanche photodide is, applies larger reverse biased, make it reach avalanche multiplication state, utilize the avalanche multiplication effect of charge carrier to amplify photosignal, to improve the sensitivity of detection during work.Avalanche photodide has its best effort bias voltage, and the best effort bias voltage of different avalanche photodide is different.Usually its optimal bias is applied to avalanche photodide during work, reach higher detection sensitivity to make it.So the best effort bias voltage finding out avalanche photodide is very necessary.
Due under identical input optical power condition, different bias voltages can obtain different bit error rate (BER)s (as shown in Figure 1), and minimum bit error rate (BER) bias voltage is APD best effort bias voltage, so the method finding the best effort bias voltage of avalanche photodide is at present, under fixing input optical power, scan A PD bias voltage, namely the different APD bias voltages of change are inputted, utilize error code to produce instrument (HOME BERT) test bit error rate (BER), find out the working bias voltage of APD under minimum bit error rate and be the best effort bias voltage of APD.
But, current APD manufacturing process can not guarantee best effort bias voltage, the consistency of sensitivity and the M factor, even if add under the testing time of abundance, if bit error rate (BER) is less, error code generation instrument HOME BERT can not test out a fixing bit error rate (BER) exactly.In addition, as shown in Figure 1, under less bit error rate (BER), when the bias voltage of APD scans near optimum operating voltage, less and the unsteadiness of difference due to bit error rate (BER), causes minimum bit error rate to be judged by accident, thus can accurately not find the optimum working bias voltage of APD.
Summary of the invention
The object of the invention is to overcome the deficiency cannot finding out the best effort bias voltage of APD accurately existing in prior art, a kind of evolutionary algorithm of avalanche photodide best effort bias voltage is provided, the best effort bias voltage of APD can be found out by this algorithm accurately.
In order to realize foregoing invention object, the invention provides following technical scheme:
An evolutionary algorithm for avalanche photodide best effort bias voltage, it comprises the steps:
The first step: determine optimum input optical power;
Second step: under optimum input optical power, scan A PD bias voltage, until bias voltage corresponding to minimum BER is APD best effort bias voltage.
Further, determine in the described first step that optimum input optical power comprises step:
APD bias voltage initial value Vapd0 and input optical power initial value are set;
Keep bias voltage Vapd0, automatically adjust input optical power, until bit error rate (BER) BER is within the scope of standard BER.
According to the embodiment of the present invention, the standard BER scope of described scan A PD bias voltage is: BER >=5E-04 and BER≤5E-03.
Further, the method for described automatic adjustment input optical power is:
Current input power=initial input luminous power;
Under bias voltage initial value Vapd0 and current input optical power, carry out BER test, if BER>5E-03, increase input optical power gradually, until BER≤5E-03; If BER<5E-04, reduce input optical power gradually, until BER >=5E-04.
According to embodiments of the invention, if BER>5E-03, increase input optical power gradually, until the concrete operations of BER≤5E-03 are: current input optical power=current input optical power+luminous power stepping, BER test is carried out under bias voltage initial value Vapd0 and current input optical power, if BER>5E-03, then circulation performs this operation;
If BER<5E-04, reduce input optical power gradually, until the concrete operations of BER >=5E-04 are: current input optical power=current input optical power-luminous power step-length, BER test is carried out under bias voltage initial value Vapd0 and current input optical power, if BER<5E-04, then circulation performs this operation.
According to the embodiment of the present invention, described luminous power stepping is 0.2dbm or 0.5dbm or 1dbm.Be preferably 0.5dbm.
According to the embodiment of the present invention, described luminous power step-length is variable, and along with BER, to depart from 5E-04 far away, and luminous power step-length value is larger.
Further, in described second step under optimum input optical power, scan A PD bias voltage, the step finding out APD best effort bias voltage comprises:
Step a: Vapd1=Vapd0-bias adjustment value is set;
Step b: scan A PD bias voltage, carries out BER test;
Step c: if BER_Vapd1 < is BER_Vapd0, then reduce APD bias voltage, gradually until find out optimal bias Vopt corresponding to minimum BER; If BER_Vapd1 > is BER_Vapd0, then increase APD bias voltage gradually, until find out optimal bias Vopt corresponding to minimum BER, wherein, BER_Vapd1 represents that the BER that bias voltage is corresponding when being Vapd1, BER_Vapd0 represent the BER that bias voltage is corresponding when being Vapd0.
Further, bias adjustment value described in described step a is 0.2V or 0.4V or 0.6V or 1V.
Further, in described step c, if BER_Vapd1 < is BER_Vapd0, then reduce APD bias voltage gradually, until find out optimal bias Vopt corresponding to minimum BER, wherein, reduce APD bias voltage gradually, until the method finding out optimal bias Vopt corresponding to minimum BER is:
Step c101: if BER_Vapd1 < is BER_Vapd0, then Vapd0=Vapd1 is set, the stepping of Vapd1=Vapd0-bias voltage, carries out BER test, and circulation performs step c101;
Step c102: obtain more excellent Vapd=Vapd1, the APD bias voltage that namely minimum bit error rate is corresponding;
Step c103: continue scanning and be less than and at least one bias voltage test point of closing on Vapd, judge whether Vapd is the APD bias voltage that minimum bit error rate is corresponding, if so, then determine that Vapd is optimal bias Vopt; If not, then determine that the APD bias voltage that minimum bit error rate measured in this step is corresponding is optimal bias Vopt, and judge whether BER_Vopt > sets up with reference to BER, described is the bit error rate (BER) threshold value that different APD all can accurately find out best effort bias voltage with reference to BER, described BER_Vopt is bias voltage BER corresponding when being Vopt;
Step c104: if BER_Vopt > is with reference to BER, then obtaining APD best effort bias voltage is: Vopt-0.5V; If BER_Vopt≤reference BER, be then adjusted to optimum input optical power: optimum input optical power+1dbm; Continue scan A PD bias voltage, until find out bias voltage Vopt ' corresponding to minimum BER, then obtaining APD best effort bias voltage is: Vopt '-0.5V.
Further, in described step c, if BER_Vapd1 > is BER_Vapd0, then increase APD bias voltage gradually, until find out optimal bias Vopt corresponding to minimum BER, wherein, increase APD bias voltage gradually, until the method finding out optimal bias Vopt corresponding to minimum BER is:
Step c201: if BER_Vapd1 > is BER_Vapd0, then Vapd0=Vapd1 is set, the stepping of Vapd1=Vapd0+ bias voltage, carries out BER test, and circulation performs step c201;
Step c202: obtain more excellent Vapd=Vapd1, the APD bias voltage that namely minimum bit error rate is corresponding;
Step c203: continue scanning and be greater than and at least one bias voltage test point of closing on Vapd, judge whether Vapd is the APD bias voltage that minimum bit error rate is corresponding, if so, then determine that Vapd is optimal bias Vopt; If not, then to determine in this step that the APD bias voltage that measured minimum bit error rate is corresponding is optimal bias Vopt, and judge whether BER_Vopt > sets up with reference to BER, described BER_Vopt is bias voltage BER corresponding when being Vopt;
Step c204: judge whether BER_Vopt > sets up with reference to BER, if BER_Vopt > is with reference to BER, then obtaining APD best effort bias voltage is: Vopt-0.5V; If BER_Vopt≤reference BER, be then adjusted to optimum input optical power: optimum input optical power+1dbm; Continue scan A PD bias voltage, until find out bias voltage Vopt ' corresponding to minimum BER, then obtaining APD best effort bias voltage is: Vopt '-0.5V.
By step c101-c104 in step c or step c201-c204, determine optimum input optical power, the optimum input optical power accuracy obtained is high, and debugging speed is fast.
Further, described bias voltage stepping is 0.1V or 0.2V or 0.4V or 0.6V.Be preferably 0.2V.
Further, described is 5E-06 with reference to BER.
compared with prior art, beneficial effect of the present invention:
1, the evolutionary algorithm of avalanche photodide best effort bias voltage of the present invention, by automatically adjusting input optical power, different APD is made to be all the optimal bias found under large bit error rate (BER) in optimal bias scanning process, the bit error rate (BER) difference of testing near optimal bias ensure that more greatly the accuracy of scanning, thus find out every APD best effort bias voltage accurately, obtain optimum sensitivity.
2, APD best effort bias point can change with the change of ambient temperature, penalty coefficient is needed to calibrate different temperature points in practical application, if APD bias voltage can not accurately be found at certain temperature spot, the calibration parameter so calculated according to this point just can not accurately compensate, some temperature spot APD sensitivity is caused to decline, the meeting that compensating error is serious causes in APD Long-Time Service, and hydraulic performance decline is permanent damage even.Evolutionary algorithm of the present invention can draw APD best effort bias voltage accurately, avoids the generation of this type of situation, improves APD performance.
Accompanying drawing illustrates:
Fig. 1 is in current algorithm, under identical input optical power condition, and the relation schematic diagram of APD bias voltage and bit error rate (BER).
Fig. 2 is different input optical power, the relation schematic diagram of APD bias voltage and bit error rate (BER).
Fig. 3 is the workflow diagram of the evolutionary algorithm of avalanche photodide best effort bias voltage of the present invention.
Fig. 4 is the workflow diagram determining optimum input optical power in the inventive method.
Fig. 5 is in the inventive method, and under optimum input optical power, scan A PD bias voltage is to find out the workflow diagram of APD best effort bias voltage.
Embodiment
Below in conjunction with test example and embodiment, the present invention is described in further detail.But this should be interpreted as that the scope of the above-mentioned theme of the present invention is only limitted to following embodiment, all technology realized based on content of the present invention all belong to scope of the present invention.
With reference to figure 1, the method finding at present the best effort bias voltage of avalanche photodide is, under fixing input optical power, scan A PD bias voltage, finds out the working bias voltage of APD under minimum bit error rate and be the best effort bias voltage of APD.But under less bit error rate (BER), when the bias voltage of APD scans near optimum operating voltage, the less and unsteadiness of the difference due to bit error rate (BER), causes minimum bit error rate to be judged by accident, thus can accurately not find APD best effort bias voltage.Therefore, even if if can test to carry out scanning compared with small step footpath 0.1V the bit error rate (BER) differed greatly in APD bias voltage scanning process, just test error can be avoided, minimum bit error rate can be found accurately, scan A PD bias voltage under large bit error rate (BER), can find out APD best effort bias voltage accurately.
With reference to figure 2, different input optical power, the relation schematic diagram of APD bias voltage and bit error rate (BER).Same APD, under different input optical power, APD bias voltage is different from the relation curve that bit error rate (BER) BER is formed.As can be seen from Figure 2, BER is when below 5E-06, and the difference of the bit error rate (BER) that APD best effort bias voltage annex is tested is very little, is easy to the erroneous judgement causing minimum bit error rate, thus can accurately find out the optimum working bias voltage of APD.BER is when more than 5E-06, and the difference of the bit error rate (BER) that APD best effort bias voltage annex is tested is comparatively large, so can find out APD best effort bias voltage very accurately.
Find through research, under the condition meeting BER>5E-06, the difference of the bit error rate (BER) of the best effort bias voltage annex of different APD is larger, different APD all can accurately find out best effort bias voltage, define different APD and all can accurately find out the bit error rate (BER) threshold value of best effort bias voltage for reference BER, namely 5E-06 is with reference to BER.In addition, best effort bias voltage between each APD has huge difference, if BER > 5E-06 will be guaranteed in scanning process, the optimum input optical power of different APD is different, therefore, in actual production commissioning, fixing input optical power cannot guarantee every APD all scan bias voltage under reference bits error rate.
If need to guarantee that the BER scanned is greater than 5E-06, because different ROSA has different responsivenesses and different best effort bias voltages, so initial APD bias sets is particularly important, input optical power can not be too little simultaneously, needs to adjust to an optimum value.Find through research, scan A PD bias voltage is started within the scope of BER≤5E-03 at BER >=5E-04, BER>5E-06 can be guaranteed, and obtain optimum APD bias voltage, therefore define the standard BER scope that this scope is scan A PD bias voltage, if the BER recorded under a certain input optical power is within the scope of standard BER, then define the optimum input optical power that this input optical power is scan A PD bias voltage.
Such as, as can be seen from Figure 2, meeting under the condition of BER at more than 5E-06, when input optical power is-31dbm, the BER that the optimum working bias voltage of APD is corresponding is starkly lower than the BER that near the optimum working bias voltage of APD, bias voltage is corresponding, so when arranging input optical power for-31dbm, can be easy to, find out the optimum working bias voltage of APD very accurately, this-31dbm is called optimum input optical power.
The core concept of the evolutionary algorithm of avalanche photodide best effort bias voltage of the present invention is exactly, first determine optimum input optical power, scan A PD bias voltage under optimum input optical power again, if minimum BER does not meet BER > 5E-06, calibrate input optical power again, amplify the BER near APD best effort bias voltage, APD best effort bias voltage can be found out accurately, eliminate BER test erroneous judgement.
With reference to figure 3, Fig. 4, Fig. 5, the evolutionary algorithm of avalanche photodide best effort bias voltage of the present invention comprises the following steps:
S100: determine optimum input optical power;
S200: under optimum input optical power, scan A PD bias voltage, finds out bias voltage corresponding to minimum BER and is APD best effort bias voltage.
Wherein, determine in step S100 that the step of optimum input optical power comprises:
S101: the initial value Vapd0 of APD bias voltage and the initial value Power0 of input optical power is set.
The initial value of APD bias voltage and the initial value of input optical power configurable, illustrate according to different APD producers product specification books and arrange.
S102: carry out BER test.
S103: automatically adjust input optical power, makes input optical power reach optimum input optical power, that is, under optimum input optical power, the BER of test gained is at BER >=5E-04 and within the scope of BER≤5E-03.
The method of automatic adjustment input optical power is:
If BER>5E-03, then increase input optical power gradually, until BER≤5E-03; If BER<5E-04, then reduce input optical power gradually, until BER >=5E-04.Such as:
If BER>5E-03, then the stepping of Power0=Power0+ luminous power, returns step S102, follows and carries out ring BER test, until BER≤5E-03; If BER<5E-04, then Power0=Power0+ luminous power step-length, returns step S102, and circulation carries out BER test, until BER >=5E-04; Until BER >=5E-04 and BER≤5E-03 time, stop adjustment input optical power, input optical power is now optimum input optical power.
Described luminous power stepping can be 0.2dbm, 0.5dbm, 1dbm, and getting luminous power stepping in the present embodiment is 0.5dbm, and input optical power adjusts with the step frequency of 0.5dbm, often adjusts once, and BER approximately changes an order of magnitude.
As BER<5E-04, described luminous power step-length is variable luminous power step-length, and BER is less, namely to depart from 5E-04 far away for BER, luminous power step-length value is larger, can improve test speed like this, finds input optical power during BER >=5E-04 within a short period of time.Such as, luminous power step-length can be taked to change with under type:
BER<5E-04, and BER ∈ [5E-05,5E-04), i.e. BER >=5E-05 and BER < 5E-04, getting luminous power step-length is 0.5dbm, then Power0=Power0-0.5dbm;
BER<5E-04, and BER ∈ [5E-06,5E-05), i.e. BER >=5E-06 and BER < 5E-05, getting luminous power step-length is 2*0.5dbm, then Power0=Power0-0.5*2dbm=Power0-1dbm;
BER<5E-04, and BER ∈ [5E-07,5E-06), i.e. BER >=5E-07 and BER < 5E-06, getting luminous power step-length is 3*0.5dbm, then Power0=Power0-0.5*3dbm=Power0-1.5dbm;
Choose input optical power in the manner described above successively, circulation carries out BER test, until input optical power when finding BER >=5E-04.
Wherein, in step S200 under optimum input optical power, scan A PD bias voltage, find out APD best effort bias voltage and comprise step:
S201: scan A PD bias voltage, arranges APD bias voltage Vapd1=Vapd0-bias adjustment value, then carries out BER test, if BER_Vapd1 < is BER_Vapd0, then enter step S202; If BER_Vapd1 > is BER_Vapd0, then enter step S203.Wherein, described bias adjustment value can be 0.2V or 0.4V or 0.6V or 1V, usually chooses 0.4V.
With reference to figure 2, BER_Vapd1 < BER_Vapd0, illustrate that BER reduces along with APD bias voltage and reduces, so reduce APD bias voltage gradually, if Vapd0 is with certain bias voltage stepping regressive, constantly scan, the more excellent bias voltage Vapd that minimum BER is corresponding can be found out.
S202:Vapd0 is with the step footpath regressive of 0.2V, as Vapd0-0.2V, Vapd0-0.4V, Vapd0-0.6V, Vapd0-0.8V, until find more excellent bias voltage Vapd, namely, under optimum input optical power, Vapd corresponds to minimum bit error rate BER_Vapd, wherein, BER_Vapd1 represents that the BER that bias voltage is corresponding when being Vapd1, BER_Vapd0 represent the BER that bias voltage is corresponding when being Vapd0;
Because be that discrete sampling is carried out in stepping with 0.2V during test, so in order to obtain optimal bias more accurately, whether checking Vapd is APD optimal bias Vopt, improves the test accuracy of APD optimal bias, continues the several APD bias voltage test point of scanning after finding Vapd, as Vapd-0.1V, Vapd-0.2V, Vapd-0.3V, Vapd-0.4V, Vapd-0.6V, finally determines optimal bias Vopt.Such as, be respectively Vapd-0.1V at bias voltage, when Vapd-0.2V, Vapd-0.3V, Vapd-0.4V, Vapd-0.6V, BER is all greater than BER_Vapd, then Vopt=Vapd, and namely Vapd is APD optimal bias; If when bias voltage is Vapd-0.1V or Vapd-0.2V or Vapd-0.3V or Vapd-0.4V or Vapd-0.6V, any one BER is wherein had to be less than BER_Vapd, then determine that optimal bias Vopt is Vapd-0.1V or Vapd-0.2V or Vapd-0.3V or Vapd-0.4V or Vapd-0.6V, enter step S204.
With reference to figure 2, BER_Vapd1>BER_Vapd0, illustrate that BER reduces along with APD bias voltage and increases, namely BER increases along with APD bias voltage and reduces, so increase APD bias voltage gradually, as Vapd0 adds up with certain bias voltage stepping, constantly scan, the more excellent bias voltage Vapd that minimum BER is corresponding can be found out.
S203:Vapd1 adds up with the stepping of 0.2V, and as Vapd1+0.2V, Vapd1+0.4V, Vapd1+0.6V, until find preferably Vapd, that is, under optimum input optical power, Vapd corresponds to minimum bit error rate BER_Vapd.Same, after finding Vapd, continue the several APD bias voltage test point of scanning, as Vapd+0.1V, Vapd+0.2V, Vapd+0.3V, Vapd+0.4V, Vapd+0.6V, finally determine optimal bias Vopt, enter step S205.
Described bias voltage stepping can be 0.1V, 0.2V, 0.4V, 0.6V, and bias voltage stepping is less, and the precision of test gained is also higher, but the speed of test is lower.When bias voltage stepping is 0.2V, measuring accuracy is very high, so choose the bias voltage stepping regressive or cumulative of 0.2V, improves test speed.
S204: judge whether BER_Vopt > 5E-06 sets up, if BER_Vopt > is 5E-06, enter S210, if be false, enter step S206, wherein BER_Vopt represents the BER that bias voltage is corresponding when being Vopt.
S205: judge whether BER_Vopt > 5E-06 sets up, if BER_Vopt > is 5E-06, enter S210, if be false, enter step S207, wherein BER_Vopt represents the BER that bias voltage is corresponding when being Vopt.
S206: optimum input optical power is adjusted to: optimum input optical power+1dbm, enters step S208.
Find through research, with reference to figure 2, on the basis of the optimum input optical power determined in the step s 100, add 1dbm, revised input optical power accurately can find out the optimum input optical power of APD best effort bias voltage.
S207: optimum input optical power is adjusted to: optimum input optical power+1dbm, enters step S209.
S208: continue scan A PD bias voltage, now only need scan a small amount of bias voltage test point near a small amount of several Vopt, as Vopt+0.4V, Vopt+0.2V, Vopt, Vopt-0.2V, Vopt-0.4V, Vopt-0.6V, to improve test speed.Find out in above-mentioned bias voltage test point, the bias voltage that minimum BER is corresponding, that is, optimal bias will be obtained in step S202 be revised as the optimal bias Vopt ' of this step gained, and enter step S211.
Because after step S202, S204, find out Vopt, now only a small amount of bias voltage test point that need scan near Vopt can obtain optimal bias accurately, so now only need scan a small amount of bias voltage test point near Vopt, passes through test speed.
S209: continue scan A PD bias voltage, now only need scan several bias voltage test points a small amount of near Vopt, as Vopt+0.4V, Vopt+0.2V, Vopt, Vopt-0.2V, Vopt-0.4V, Vopt-0.6V, find out in above-mentioned bias voltage test point, the bias voltage that minimum BER is corresponding, namely, optimal bias will be obtained in step S203 be revised as the optimal bias Vopt ' of this step gained, enter step S211.
S210: obtaining APD best effort bias voltage is Vopt-0.5V.
It should be stressed, optimal bias described in this specification is not APD best effort bias voltage, and APD best effort bias voltage deducts 0.5V on the basis of optimal bias, i.e. APD best effort bias voltage=optimal bias-0.5V.Consider that ROSA judges with LOS after being used in long-distance optical fiber transmission, and the deviation of optimum sensitivity and the M factor=10 in ROSA actual production, determine APD best effort bias voltage=optimal bias-0.5V, the accuracy of further raising APD best effort bias voltage, under this APD best effort bias voltage, APD performance is better.
S211: obtaining APD best effort bias voltage is Vopt '-0.5V.
The evolutionary algorithm of avalanche photodide best effort bias voltage of the present invention, by automatically adjusting input optical power, different APD is made to be all the optimal bias found under large bit error rate (BER) in optimal bias scanning process, the bit error rate (BER) difference of testing near optimal bias ensure that more greatly the accuracy of scanning, thus find out every APD best effort bias voltage accurately, obtain optimum sensitivity.
Arbitrary feature disclosed in this specification (comprising any accessory claim, summary and accompanying drawing), unless specifically stated otherwise, all can be replaced by other equivalences or the alternative features with similar object.That is, unless specifically stated otherwise, each feature is an example in a series of equivalence or similar characteristics.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature of disclosing in this manual or any combination newly, and the step of the arbitrary new method disclosed or process or any combination newly.
Claims (6)
1. an evolutionary algorithm for avalanche photodide working bias voltage, is characterized in that, this evolutionary algorithm comprises the steps:
The first step: determine an input optical power;
Second step: under described input optical power, scan A PD bias voltage, until the bias voltage that minimum BER is corresponding;
Determine in the described first step that an input optical power comprises step:
APD bias voltage initial value Vapd0 and input optical power initial value are set;
Keep bias voltage Vapd0, automatically adjust input optical power, until bit error rate (BER) BER is within the scope of standard BER;
Wherein, described standard BER scope is: BER >=5E-04 and BER≤5E-03;
The method of described automatic adjustment input optical power is:
Current input power=initial input luminous power;
Under bias voltage initial value Vapd0 and current input optical power, carry out BER test, if BER>5E-03, then increase input optical power gradually, until BER≤5E-03; If BER<5E-04, reduce input optical power gradually, until BER >=5E-04.
2. the evolutionary algorithm of avalanche photodide working bias voltage as claimed in claim 1, it is characterized in that, if BER>5E-03, increase input optical power gradually, until the concrete operations of BER≤5E-03 are: current input optical power=current input optical power+luminous power stepping, under bias voltage initial value Vapd0 and current input optical power, carry out BER test, if BER>5E-03, then circulation performs this operation;
If BER<5E-04, reduce input optical power gradually, until the concrete operations of BER >=5E-04 are: current input optical power=current input optical power-luminous power step-length, BER test is carried out under bias voltage initial value Vapd0 and current input optical power, if BER<5E-04, then circulation performs this operation.
3. the evolutionary algorithm of avalanche photodide working bias voltage as claimed in claim 2, it is characterized in that, described luminous power stepping is 0.2dbm or 0.5dbm or 1dbm.
4. the evolutionary algorithm of avalanche photodide working bias voltage as claimed in claim 2, it is characterized in that, described luminous power step-length is variable, and along with BER, to depart from 5E-04 far away, and luminous power step-length value is larger.
5. the evolutionary algorithm of avalanche photodide working bias voltage as claimed in claim 1, it is characterized in that, described second step specifically comprises:
Step a: Vapd1=Vapd0-bias adjustment value is set;
Step b: scan A PD bias voltage, carries out BER test;
Step c: if BER_Vapd1 < is BER_Vapd0, then reduce APD bias voltage, gradually until find out bias voltage Vopt corresponding to minimum BER; If BER_Vapd1 > is BER_Vapd0, then increase APD bias voltage gradually, until find out bias voltage Vopt corresponding to minimum BER, wherein, BER_Vapd1 represents that the BER that bias voltage is corresponding when being Vapd1, BER_Vapd0 represent the BER that bias voltage is corresponding when being Vapd0.
6. the evolutionary algorithm of avalanche photodide working bias voltage as claimed in claim 5, it is characterized in that, bias adjustment value described in described step a is 0.2V or 0.4V or 0.6V or 1V.
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| CN104142460B (en) * | 2013-05-09 | 2018-08-03 | 深圳市共进电子股份有限公司 | The test method of avalanche photodide optimum operating voltage |
| CN105049202B (en) * | 2015-08-19 | 2018-05-22 | 安徽问天量子科技股份有限公司 | The method and device of dynamic adjustment detector drift in quantum key dispatching system |
| CN107465455A (en) * | 2017-08-15 | 2017-12-12 | 中航海信光电技术有限公司 | A kind of Optical Receivers sensitivity evaluation method and system |
| CN109596965B (en) * | 2019-01-17 | 2021-05-07 | 四川天邑康和通信股份有限公司 | Method for judging optimal working voltage of Avalanche Photodiode (APD) of 10G EPON |
| CN111385023A (en) * | 2020-03-02 | 2020-07-07 | 成都优博创通信技术股份有限公司 | Optical module debugging device and debugging method |
| CN113064044A (en) * | 2021-03-31 | 2021-07-02 | 南通中瑞通信科技有限公司 | Novel APD correction algorithm |
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| CN1698294A (en) * | 2002-03-14 | 2005-11-16 | 马科尼英国知识产权有限公司 | Control of avalanche photodiodes bias voltage |
| CN101871813A (en) * | 2010-06-18 | 2010-10-27 | 成都优博创技术有限公司 | Method and device for monitoring input optical power of avalanche photoelectric diode |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1698294A (en) * | 2002-03-14 | 2005-11-16 | 马科尼英国知识产权有限公司 | Control of avalanche photodiodes bias voltage |
| CN101871813A (en) * | 2010-06-18 | 2010-10-27 | 成都优博创技术有限公司 | Method and device for monitoring input optical power of avalanche photoelectric diode |
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