CN102680366A - Electronic detecting method for raw milk nodes and device thereof - Google Patents

Electronic detecting method for raw milk nodes and device thereof Download PDF

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Publication number
CN102680366A
CN102680366A CN2012101784892A CN201210178489A CN102680366A CN 102680366 A CN102680366 A CN 102680366A CN 2012101784892 A CN2012101784892 A CN 2012101784892A CN 201210178489 A CN201210178489 A CN 201210178489A CN 102680366 A CN102680366 A CN 102680366A
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China
Prior art keywords
hold those
silk
nodes
those sections
signal
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CN2012101784892A
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Chinese (zh)
Inventor
孟凯
肖坤楠
徐昳荃
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Suzhou University
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Suzhou University
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Priority to CN2012101784892A priority Critical patent/CN102680366A/en
Publication of CN102680366A publication Critical patent/CN102680366A/en
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Abstract

The invention relates to an electronic detecting method for raw milk nodes and a device thereof, wherein two uniform parallel optical fields are established, namely, a measuring optical field and a background optical field; corresponding silicon photocells receive an incident optical field; the to-be-detected raw milk vertically passes through the measuring optical field at a certain speed, the irregular surface of the raw milk causes the light receiving amount of the silicon photocell in the optical field to change, so as to enable the voltage to vary; and output signals of the voltage are processed through a differential amplifier and input into a data collecting system, and the adaptive coherent model is adopted to process the collected signals in the time domain and then the collected signals are fitting processed through spline interpolation for three times, so as to filter the interfering signals, obtain the waveform of the nodes for judgment, and output the detection result. The electronic detecting method for raw milk nodes and the device thereof take the high-responsive silicon photocells as the photoelectric converting elements, can effectively collect the waveform of the raw silk nodes for judgment when the raw silk operates with a higher speed, and enables the detection of the raw silk nodes to be more effective and accurate.

Description

One kind of silk hold those sections electronic testing method and apparatus
Technical field
The present invention relates to a textile fiber materials and test methods of the photoelectric measuring device, in particular to a method for silk hold those test method and apparatus section, optical inspection of fibrous material technology.
Background technology
Silk hold those sections can be divided into large hold those, hold those large, medium and small hold those hold those are four large length to tens of millimeters or more, small 2 mm or less.Silk hold those sections cut caused by the process in the silk, but also in the fabric spots significant, detrimental to fabric appearance.So hold those sections raw silk quality inspection tests are indispensable items.As China's raw silk inspection standards to the international development trend, the traditional blackboard manual test method due to the presence of people affect the Japanese inspection subjectivity slow speed issue has been difficult to keep up with the times, and the silk industry silk hold those eager to test section can be achieved objective and fair, high-precision, high-efficiency electronic test.Silk hold those sections detection principle by electronic detection equipment is divided into capacitive, image processing, photoelectric three.Since the capacitor plates formed by measuring the length of the field is at least 8mm, so the sample length is much larger than 1mm silk hold those sections electronic test criteria; Image processing style hold those sections detector due to a large number of samples to be used as control parameters and image analysis consumption too long, so it is difficult to enter into a substantive application stage.
Summary of the invention
The object of the present invention to overcome the shortcomings of the prior art, to provide a high-precision, high efficiency silk hold those sections electronic test method and apparatus.
Purpose of the invention is used to provide a technical solution silk hold those sections electronic testing device, which includes optical measurement systems, data acquisition systems and processing systems; said photoelectric measuring system consists of two parallel uniform light field, which a light field is measured, and the other end of the light field, respectively, corresponding to silicon photocell receiving incident field; silicon photovoltaic cell output signal by processing the input differential amplifier circuit to the data acquisition system, and then the treatment system, the The processing system includes removal of interfering module and signal processing module, remove interference coherent module template method using adaptive signal collected for processing in the time domain, and then using cubic spline interpolation fitting process, after the signal processing module to obtain raw silk hold those sections of the waveform, the number of records hold those sections, discriminant silk hold those section types, output test results.
Described parallel light field comprises GaAs laser diode and lens.
Described silicon photocell is pasted a steel disc, the slit that it is 0.1~0.3mm that the centre of steel disc has a width on its light receiving surface.
A use of the apparatus to hold those silk electronic test section, comprising the steps of:
(1) build two uniform parallel light fields, as for measuring in the light field, raw silk to be checked is along the movement in vertical direction of parallel rays with raw silk to be checked;
(2) silicon photocell of correspondence receives the light intensity signal of two parallel rayss respectively;
(3) voltage signal with two silicon photocell outputs carries out inputing to data acquisition system (DAS) after the difference processing and amplifying;
(4) data collection system, the signal input to the processing system that uses adaptive coherent template method to the collected signals are processed in the time domain, and then using cubic spline interpolation fitting process, filtered interference, get silk hold those sections waveform; Record number hold those sections, discriminant silk hold those section types, output test results.
Principle of the present invention is: two same light sources form two uniform parallel light fields respectively after the lens conversion; And shine on two same silicon photocells; Raw silk vertically passes through one of them light field with certain speed; Its plucked can make the light-receiving amount of the silicon photocell in this light field constantly change, thereby the voltage of its generation is constantly changed.The two silicon photocell voltage signal generated after difference amplifier output through the data acquisition card analog voltage signals to discrete digital signal is input into the computer, the signal processing section to obtain silk hold those waveform section of a waveform is determined according to hold those and record the number and types of its output.
Compared with prior art, technical scheme of the present invention has following tangible progress and advantage.
1, using a highly responsive silicon photocell as a photoelectric conversion element, with high sampling rate data acquisition card, at higher speeds when raw silk, raw silk can effectively hold those sections collected waveforms to determine, accurately test out hold those sections the number and variety of the silk hold those sections inspection more efficient and accurate.
2, make up two parallel, raw silk to be checked is the receiving plane top through one of them silicon photocell only, with the difference of two the silicon photocell output voltages output voltage as sensor, helps eliminating background noise, can effectively improve the precision of detection signal.
3, the silicon photovoltaic cell is attached a light receiving surface of the steel sheet, steel sheet having a slit opening, to make the light receiving surface of silicon photovoltaic cells is removed from the width of the PN junction region Bunsen width determines the width of the slit but rather determined by the steel, the sampling width effectively guarantee the silk hold those sections of the detection accuracy.
4, using the time-domain signal adaptive coherent template method and cubic spline interpolation method of fitting process, filter frequency interference, harmonic interference, high-frequency interference and white noise disturbance, effectively improve the signal sampling accuracy, ensures hold those sections waveform distortion, improved hold those sections determine the number and type of accuracy.
5, the existing testing methods can hold those sections determine the size of the section hold those species can not be determined, the present invention provides methods and apparatus to test the measured waveform hold those sections, which can further determine the type of hold those sections.
6, the present invention is based on the photovoltaic silicon photocell approach its excellent responsiveness and a light receiving area is small, with the virtual instrument's acquisition technology, will be particularly suitable for different sizes of silk hold those sections of the test.
Description of drawings
FIG.. 1 is a the present invention. Embodiment Example is provided a raw silk hold those the section test apparatus optoelectronic detection system schematic structural diagram of;
Figure 2 is a embodiment of the invention there is provided a silk hold those sections of the test apparatus differential amplifier circuit diagram;
Figure 3 is an embodiment of the invention provides a be seized silk hold those sections of the physical image;
Figure 4 is an embodiment of the present invention, the section of the test apparatus silk hold those obtained silk hold those sections to be tested a waveform diagram;
Wherein, 1 and 5, laser diode; 2 and 6, optical lens; 3, raw silk to be checked; 4 and 7, silicon photocell; 8, difference channel; 9, one-level amplifying circuit; 10, second amplifying circuit.
Embodiment
Below in conjunction with accompanying drawing and embodiment technical scheme of the present invention is done and to be further described.
Embodiment 1
Referring to Fig 1, which is the present embodiment is provided a test apparatus silk hold those photodetector section schematic block diagram of the system; light emitted from the laser diode 1 through the lens 2 into parallel light is irradiated to the silicon photocell 4, the laser diode 5 emitted from the light by a lens 6 into a parallel light is irradiated to the silicon photocell 7, the laser diode 1, the lens 2, the silicon photocell and the laser diode 4 are respectively 5, lens 6, 7 are the same silicon photocell.In this embodiment, a GaAs laser diode, the line width of about 25nm, may be considered monochromatic light, after accumulation through the lens, the beam divergence of up to 0.5 mrad, can be considered as parallel light; silicon photocell model HPI-2C, silicon photocell paste a light receiving surface of the steel, the steel sheet has a 0.2mm middle slit open, can make the light receiving surface of silicon photovoltaic cells is removed from the width of the PN junction region width determines Bunsen but by steel slit width determines the sampling width effectively guarantee the silk hold those sections of the detection accuracy.。
Light field between raw silk 3 vertical scioptics 2 to be checked and the silicon photocell 4, the plucked of raw silk 3 can make the light-receiving amount of silicon photocell 4 constantly change, thereby the voltage of its generation is constantly changed.And no raw silk passes through between lens 6 and the silicon photocell 7, and 7 of silicon photocells produce this life voltage.
Referring to Fig 2, which is provided in this embodiment a section of the test apparatus silk hold those differential amplifier circuit diagram; wherein the differential circuit 8, an amplifier 9, the secondary amplification circuit composed of the differential amplifier circuit 10, the figure ①, ②, ③, ④, ⑤, ⑥, ⑦, ⑧ were operational amplifier 8 pin.Silicon photocell 4 carries out the signal amplification through first order amplifying circuit 9 and second level amplifying circuit 10 again with the voltage signal that the voltage signal of silicon photocell 7 generations is exported through difference channel 8 backs.
Voltage signal through after difference and the two-stage amplification is gathered through data collecting card and capture program.Present embodiment adopts the NI DAQCard-6024E of company data collecting card.This capture card adopts the PCMIA bus, 12 acquisition precisions, and the highest SF is 200KHZ, 16 road analog input channels, 2 tunnel analog output channels.LabVIEW-based language acquisition program, the program is not just the role of the voltage signal acquisition, but also the collected voltage signal in the time domain using an adaptive coherent template method for processing to filter frequency interference and harmonic interference and Fitting using a cubic spline interpolation process to filter high frequency interference and white noise, in order to guarantee access to hold those sections to reflect the signal waveform shape.Meanwhile, according to the signal waveform is also set automatically determine the number of silk hold those sections and types of functions.
Referring to Fig 3, which is provided in this embodiment a subject to be captured with a microscope the section of the physical image hold those silk; when this section hold those 2.5m / s speed through the lens 2 and the silicon photocell light field is between 4 , the present embodiment provides an apparatus and method for detecting the hold those obtained waveform diagram see section shown in Figure 4.According to the waveform shown in Figure 4, to accurately determine the type of hold those sections.

Claims (4)

1 An electronic test apparatus silk hold those sections, characterized in that: it comprises optical measuring systems, data acquisition systems and processing systems; said photoelectric measuring system comprises two parallel uniform light field, one of which is the measured light field , the other end of the light field, respectively, corresponding to silicon photocell receiving incident field; silicon photovoltaic cell output signal by processing the input differential amplifier circuit to the data acquisition system, and then the treatment system, said processing system including removal of Interference module and signal processing module, remove interference coherent module template method using adaptive signal collected for processing in the time domain, and then using cubic spline interpolation fitting process, after the signal processing module to obtain raw silk hold those sections of the waveform, Record the number of hold those sections, discriminant silk hold those section types, output test results.
(2) as claimed in claim 1, wherein the section A silk hold those electronic test apparatus, wherein: said parallel light field comprises GaAs laser diode and a lens.
3 according to claim 1, wherein the section A silk hold those electronic test apparatus, characterized in that: said silicon photovoltaic cell, the light receiving surface of the paste a steel, the steel sheet has a middle opening width of 0.1 to 0.3 mm slit.
4 A method as claimed in claim 1, wherein said means for electronic test silk hold those sections, characterized by comprising the steps of:
(1) build two uniform parallel light fields, as for measuring in the light field, raw silk to be checked is along the movement in vertical direction of parallel rays with raw silk to be checked;
(2) silicon photocell of correspondence receives the light intensity signal of two parallel rayss respectively;
(3) voltage signal with two silicon photocell outputs carries out inputing to data acquisition system (DAS) after the difference processing and amplifying;
(4) data collection system, the signal input to the processing system that uses adaptive coherent template method to the collected signals are processed in the time domain, and then using cubic spline interpolation fitting process, filtered interference, get silk hold those sections waveform; Record number hold those sections, discriminant silk hold those section types, output test results.
CN2012101784892A 2012-06-01 2012-06-01 Electronic detecting method for raw milk nodes and device thereof Pending CN102680366A (en)

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CN2012101784892A CN102680366A (en) 2012-06-01 2012-06-01 Electronic detecting method for raw milk nodes and device thereof

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Application Number Priority Date Filing Date Title
CN2012101784892A CN102680366A (en) 2012-06-01 2012-06-01 Electronic detecting method for raw milk nodes and device thereof

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104502355A (en) * 2014-12-19 2015-04-08 柳州市自动化科学研究所 Method and device for detecting entangled silken knots of single silks

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2114826U (en) * 1992-03-21 1992-09-02 浙江大学 Photoelectric quick cocoon testing device
CN1076021A (en) * 1992-02-27 1993-09-08 清华大学 With laser method on-line measurement tube wire diameter
CN1328255A (en) * 2001-07-24 2001-12-26 武汉华工激光工程有限责任公司 Method for measuring air permeability of microporous sheet material

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1076021A (en) * 1992-02-27 1993-09-08 清华大学 With laser method on-line measurement tube wire diameter
CN2114826U (en) * 1992-03-21 1992-09-02 浙江大学 Photoelectric quick cocoon testing device
CN1328255A (en) * 2001-07-24 2001-12-26 武汉华工激光工程有限责任公司 Method for measuring air permeability of microporous sheet material

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
史佳丽: "《苏州大学硕士学位论文》", 22 December 2010, article "基于CRIO的生丝颣节电子检验***", pages: 23-41 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104502355A (en) * 2014-12-19 2015-04-08 柳州市自动化科学研究所 Method and device for detecting entangled silken knots of single silks

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Application publication date: 20120919