CN102662117B - Device and method for detecting single mutual- capacitance conducting layer - Google Patents
Device and method for detecting single mutual- capacitance conducting layer Download PDFInfo
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- CN102662117B CN102662117B CN201210144572.8A CN201210144572A CN102662117B CN 102662117 B CN102662117 B CN 102662117B CN 201210144572 A CN201210144572 A CN 201210144572A CN 102662117 B CN102662117 B CN 102662117B
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Abstract
The invention discloses a device and a method for detecting a single mutual-capacitance conducting layer. A system for detecting the single mutual-capacitance conducting layer comprises a substrate, an analog conducting layer, a detection circuit and an output device, wherein the lower surface of the analog conducting layer is attached on the substrate; a detection table is formed on the upper surface of the analog conducting layer; the detection circuit is electrically connected with the output device; a first interface and a second interface are formed on the detection circuit; the first interface is electrically connected with the analog conducting layer; and the second interface forms a detection interface. According to the device and the method, the analog conducting layer and a conducting layer to be detected form a mutual-capacitance structure, so that the two conducting layers to be detected are not required to be stacked for detection; and therefore, the conducting layer can be detected conveniently.
Description
Technical field
The present invention relates to a kind of individual layer mutual capacitance conductive layer detection system and detection method.
Background technology
For mutual capacitance type touch screen, in testing process, the existing practice is, two conductive layers is stacked by different directions, form mutual capacitance type touch screen, existing detection method needs have two conductive layers could form mutual capacitance structure simultaneously, and required two conductive layers during detection, detects inconvenient.
Summary of the invention
Based on this, the invention reside in the defect overcoming prior art, provide a kind of individual layer mutual capacitance conductive layer detection system and detection method, the present invention detects more convenient.
Its technical scheme is as follows:
A kind of individual layer mutual capacitance conductive layer detection system, comprise substrate, simulation conductive layer, testing circuit and output unit, the lower surface of simulation conductive layer is attached on substrate, the upper surface of simulation conductive layer forms monitor station, testing circuit is electrically connected with output unit, testing circuit is provided with first interface and the second interface, and first interface is electrically connected with described simulation conductive layer, and the second interface is formed and detects interface.
Wherein, described substrate is electro-conductive glass or printed-wiring board (PWB).
A kind of individual layer mutual capacitance conductive layer detection method, substrate arranges simulation conductive layer, and for simulating wherein one deck of mutual capacitance conductive layer, when detecting, simulation conductive layer and conductive layer to be detected form mutual capacitance structure.
Below the advantage of preceding solution or principle are described:
Owing to arranging simulation conductive layer on substrate, for simulating wherein one deck of mutual capacitance conductive layer, when detecting, simulation conductive layer and conductive layer to be detected form mutual capacitance structure, and do not need two simulation conductive laminates to be detected to be added together to detect, detect more convenient.
Accompanying drawing explanation
Fig. 1 is the theory diagram of individual layer mutual capacitance conductive layer detection system described in the embodiment of the present invention;
Description of reference numerals:
10, substrate, 20, simulation conductive layer, 30, testing circuit, 40, output unit, 50, conductive layer to be detected, 60, first interface, the 70, second interface.
Embodiment
Below embodiments of the invention are described in detail:
As shown in Figure 1, a kind of individual layer mutual capacitance conductive layer detection system, comprise substrate 10, simulation conductive layer 20, testing circuit 30 and output unit 40, the lower surface of simulation conductive layer 20 attaches on the substrate 10, the upper surface of simulation conductive layer 20 forms monitor station, and testing circuit 30 is electrically connected with output unit 40, and testing circuit 30 is provided with first interface 60 and the second interface 70, first interface 60 is electrically connected with described simulation conductive layer 20, and the second interface 70 is formed and detects interface.
Wherein, described substrate 10 is electro-conductive glass or printed-wiring board (PWB).
The individual layer mutual capacitance conductive layer detection method of the present embodiment is, arranges simulation conductive layer 20 on the substrate 10, and for simulating wherein one deck of mutual capacitance conductive layer, when detecting, simulation conductive layer 20 forms mutual capacitance structure with conductive layer 50 to be detected.
The present embodiment tool has the following advantages:
Owing to arranging simulation conductive layer 20 on the substrate 10, for simulating wherein one deck of mutual capacitance conductive layer, when detecting, simulation conductive layer 20 forms mutual capacitance structure with conductive layer 50 to be detected, and do not need two conductive laminates to be detected to be added together to detect, detect more convenient.
The above embodiment only have expressed the specific embodiment of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.
Claims (2)
1. an individual layer mutual capacitance conductive layer detection system, it is characterized in that, comprise substrate, simulation conductive layer, testing circuit and output unit, the lower surface of simulation conductive layer is attached on substrate, the upper surface of simulation conductive layer forms monitor station, and testing circuit is electrically connected with output unit, and testing circuit is provided with first interface and the second interface, first interface is electrically connected with described simulation conductive layer, and the second interface is formed and detects interface; Described substrate is electro-conductive glass or printed-wiring board (PWB); Wherein, substrate arranges simulation conductive layer, for simulating wherein one deck of mutual capacitance conductive layer.
2. adopt an individual layer mutual capacitance conductive layer detection method for system described in claim 1, it is characterized in that, when detecting, simulation conductive layer and conductive layer to be detected form mutual capacitance structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210144572.8A CN102662117B (en) | 2012-05-10 | 2012-05-10 | Device and method for detecting single mutual- capacitance conducting layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210144572.8A CN102662117B (en) | 2012-05-10 | 2012-05-10 | Device and method for detecting single mutual- capacitance conducting layer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102662117A CN102662117A (en) | 2012-09-12 |
| CN102662117B true CN102662117B (en) | 2015-05-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201210144572.8A Active CN102662117B (en) | 2012-05-10 | 2012-05-10 | Device and method for detecting single mutual- capacitance conducting layer |
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| CN (1) | CN102662117B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104375725B (en) * | 2014-11-07 | 2021-01-01 | 敦泰科技有限公司 | Single-layer mutual capacitance touch screen, touch screen device and equipment |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8279197B2 (en) * | 2009-08-25 | 2012-10-02 | Pixart Imaging Inc. | Method and apparatus for detecting defective traces in a mutual capacitance touch sensing device |
| US8576182B2 (en) * | 2009-09-01 | 2013-11-05 | Atmel Corporation | Methods and apparatuses to test the functionality of capacitive sensors |
| CN201707661U (en) * | 2010-05-31 | 2011-01-12 | 比亚迪股份有限公司 | Mutual capacitance detection circuit |
| CN202025305U (en) * | 2011-05-04 | 2011-11-02 | 京东方科技集团股份有限公司 | Touch screen with test interface |
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- 2012-05-10 CN CN201210144572.8A patent/CN102662117B/en active Active
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| CN102662117A (en) | 2012-09-12 |
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