CN102539114B - 激光器参数测量*** - Google Patents
激光器参数测量*** Download PDFInfo
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- CN102539114B CN102539114B CN 201010616844 CN201010616844A CN102539114B CN 102539114 B CN102539114 B CN 102539114B CN 201010616844 CN201010616844 CN 201010616844 CN 201010616844 A CN201010616844 A CN 201010616844A CN 102539114 B CN102539114 B CN 102539114B
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- Length Measuring Devices By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
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CN 201010616844 CN102539114B (zh) | 2010-12-31 | 2010-12-31 | 激光器参数测量*** |
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CN 201010616844 CN102539114B (zh) | 2010-12-31 | 2010-12-31 | 激光器参数测量*** |
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CN102539114A CN102539114A (zh) | 2012-07-04 |
CN102539114B true CN102539114B (zh) | 2013-10-09 |
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CN 201010616844 Expired - Fee Related CN102539114B (zh) | 2010-12-31 | 2010-12-31 | 激光器参数测量*** |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109655232B (zh) * | 2017-10-12 | 2021-08-10 | 致茂电子(苏州)有限公司 | 光学量测装置 |
CN111723621B (zh) * | 2019-03-21 | 2023-11-03 | 上海耕岩智能科技有限公司 | 图像采集装置及电子设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523469A (en) * | 1983-01-19 | 1985-06-18 | The United States Of America As Represented By The Secretary Of The Navy | Laser generation of ultrasonic waveform reconstructions |
US6043885A (en) * | 1996-07-12 | 2000-03-28 | Essilor International | Fringe deflectometry apparatus and method |
CN1740759A (zh) * | 2005-09-23 | 2006-03-01 | 左昉 | 基于图像处理的激光光束参数测量方法 |
CN101782435A (zh) * | 2010-03-11 | 2010-07-21 | 中国科学院上海光学精密机械研究所 | 激光参数综合测试*** |
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2010
- 2010-12-31 CN CN 201010616844 patent/CN102539114B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523469A (en) * | 1983-01-19 | 1985-06-18 | The United States Of America As Represented By The Secretary Of The Navy | Laser generation of ultrasonic waveform reconstructions |
US6043885A (en) * | 1996-07-12 | 2000-03-28 | Essilor International | Fringe deflectometry apparatus and method |
CN1740759A (zh) * | 2005-09-23 | 2006-03-01 | 左昉 | 基于图像处理的激光光束参数测量方法 |
CN101782435A (zh) * | 2010-03-11 | 2010-07-21 | 中国科学院上海光学精密机械研究所 | 激光参数综合测试*** |
Non-Patent Citations (2)
Title |
---|
低重复频率激光光束多参数实时监测***;赵天卓等;《中国激光》;20101210;第37卷(第12期);3086-3090 * |
赵天卓等.低重复频率激光光束多参数实时监测***.《中国激光》.2010,第37卷(第12期),3086-3090. |
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CN102539114A (zh) | 2012-07-04 |
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Denomination of invention: Laser parameter measuring system Effective date of registration: 20140723 Granted publication date: 20131009 Pledgee: Zhongguancun Beijing technology financing Company limited by guarantee Pledgor: Beijing GK Laser Technology Co., Ltd. Registration number: 2014990000600 |
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Date of cancellation: 20180727 Granted publication date: 20131009 Pledgee: Zhongguancun Beijing technology financing Company limited by guarantee Pledgor: Beijing GK Laser Technology Co., Ltd. Registration number: 2014990000600 |
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