CN102426313B - Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft - Google Patents
Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft Download PDFInfo
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- CN102426313B CN102426313B CN 201110321618 CN201110321618A CN102426313B CN 102426313 B CN102426313 B CN 102426313B CN 201110321618 CN201110321618 CN 201110321618 CN 201110321618 A CN201110321618 A CN 201110321618A CN 102426313 B CN102426313 B CN 102426313B
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Abstract
The invention discloses a highly-accelerated stress screening (HASS) method of an anti-skidding brake control box of an aircraft. By using the obtained working stress limit of low temperature, high temperature and vibration of the control box, an initial HASS test profile is established, and a high temperature quantity value, a low temperature quantity value and a vibration quantity value in the initial HASS test profile are lower than the working stress limit; and by using the characteristic that the high temperature quantity value, the low temperature quantity value and the vibration quantity value in the initial HASS test profile are lower than the working stress limit, an HASS test profile is obtained by validating the safety of failure hidden danger which exists in the control box. The method has the advantages that: by performing HASS test on the control box under the working state, a failure can be excited and observed, and the failure hidden danger of the control box can be discovered in a short time; according to test data, a certain defected control box is subjected to failure elimination, and screening time of 80 h is shortened into 2 h; and by tracking and observation, the failure of the control box is timely discovered and then timely eliminated, so that a safe and effective effect is achieved.
Description
Technical field
The present invention relates to the electronic product field of airplane in transportation category undercarriage control system, specifically is a kind of highly accelerated stress screen test method of aircraft antiskid brake control enclosure, test performance in screening process.
Background technology
High accelerated aging/highly accelerated stress screen (being referred to as the HALT/HASS test method abroad) is to improve the electronic product development quality, shortens a kind of experimental technique of development time.Screening refers to the condition according to standard code that is installed in a collection of electronic product in the shaker test equipment is tested, the permission troubleshooting of breaking down in the test, and the electronic product that does not break down has passed through shaker test, can pay the user and use.Can be divided into two types of conventional screening and highly accelerated stress screens.The parameter of highly accelerated stress screen derives from the data of Highly Accelerated Life Test, and at improved final state of the art.This test not only can substitute the screening of conventional 80h with the screening of 2h, and the screening degree of fault is screened greater than routine, uses proof for electronic product, be one to enhancing productivity and the effective experimental technique of workmanship.
Highly Accelerated Life Test (HALT) is progressively to improve high temperature, low temperature and the vibration condition that is tried electronic product and bear, until the high temperature that electronic product occurs, low temperature, the vibration working stress limit, the working stress limit refers to progressively improve respectively in the process of the test of hot conditions, cryogenic conditions temperature, vibration condition, properties of product occur defective, but when reducing environmental baseline, the performance of product can be recovered, and environmental baseline at this moment is called hot operation stress limit, low-temperature working stress limit, the vibration working stress limit of this product.
Be subjected to the working stress limit of trial product for the highly accelerated stress screen test profile of formulating this product.Test profile is the Essential Terms in the reliability engineering, refers to the environmental baseline that the applies relation of course in time, sees GJB899 standards such as " reliability are identified and reception test ".The highly accelerated stress screen diagrammatic cross-section of three embodiment of the present invention is seen Fig. 1, Fig. 2, Fig. 3 respectively.
The high temperature of highly accelerated stress screen section requires, low temperature requires, vibration requires to formulate according to hot operation stress limit, low-temperature working stress limit, the vibration working stress limit respectively.
The external GMW8287 " high accelerated aging, highly accelerated stress screen " that adopts General Motors Overseas Corporation to edit formulates and is subjected to the highly accelerated stress screen test method of trial product, but never leaks specific to the top-secret technology of the HALT/HASS test method that is subjected to trial product as enterprise-level.The product screening of external electron trade adopts the screening technique of HASS method and MIL-STD-2164 " electronic equipment Environment Stress Screening Method ", and MIL-STD-2164 is a kind of conventional shaker test method, and two kinds of methods are parallel.
Domesticly only adopt the method among the GJB1032 " electronic product Environment Stress Screening Method " to screen at present, GJB1032 is the equivalence margin of MIL-STD-2164, and the screening in two standards requires identical, screens the used time to be generally 80h.
Domestic Beijing Institute of Aeronautics Research on Automobile's Reliability Engineering institute and Air China's industry 301 the HASS experimental technique of studying all have more than 10 year time, because external nearly 50 years technical know-how, make demestic user and product development unit lack understanding to this technology, government offices also not issue use standard or the regulation of this technology, so in the electronic product development untapped this technology.The HASS method requires to test greater than the reliability intensifying testing table of 60 ℃/min at Triaxiality and six degrees of freedom, rate temperature change, and Beijing Institute of Aeronautics and 301 have introduced this equipment, but only limit to experimental technique research.Owing to lack understanding and lack standard, never carried out the HASS test of product.
There was the HASS testing equipment in family surplus domestic individual proprietorship or the enterprise with three kinds of capital had 70 approximately, but only carried out reliability intensifying test (being equivalent to HALT), according to the potential faults that obtains among the strenuous test result, finished the fault correction measure of same model electronic product.Never carried out the HASS test, the product that dispatches from the factory still screens according to the commonsense method of stipulating among the GJB1032.Reason is domestic common screening criteria to be arranged, but does not promulgate the standard of highly accelerated stress screen test, makes this technology of research and extension difficult.
The screening technique difference of highly accelerated stress screen test method and GJB1032, MIL-STD-2164 sees Table 1.
The difference of conventional method among table 1 highly accelerated stress screen test method and GJB1032, the MIL-STD-2164
The highly accelerated stress screen test of at present external electronic product is all carried out under off working state, the method that only applies environmental stress and do not apply working stress does not conform to the use state, because in use product is to bear environmental stress and working stress simultaneously, the data that adopt this classic method test to obtain owe true.
Control enclosure is the control module in the aircraft electricity anti-skid brake system (ABS); design has antiskid function, the ground protection function when landing in take-off line brake function, the landing braking process; the multiple function of protection between the wheel of left and right undercarriage wheel in the landing mission, any function does not meet designing requirement and is and breaks down.
For reliability and the security requirement that guarantees control enclosure, adopt the Highly Accelerated Life Test technology to excite the potential faults of control enclosure in the world, the working stress limit that employing obtains in Highly Accelerated Life Test is formulated the highly accelerated stress screen test profile of control enclosure, substitutes original common screening technique.Because external blockade on new techniques, domesticly only adopt common screening technique.Described common screening technique is low to the screening degree of fault, the loss height, and screening time reaches 80h; Be lower than product through Highly Accelerated Life Test without its quality of product of crossing Highly Accelerated Life Test.
Common screening technique adopts general test profile, and special-purpose test profile is adopted in highly accelerated stress screen test, and a kind of product adopts a special test profile, and the control enclosure of special-purpose test profile by same kind carries out Highly Accelerated Life Test and obtain.
The highly accelerated stress screen test parameters is from the final data of Highly Accelerated Life Test.
Xi'an aviation braking Science and Technology Ltd. discloses the method for the method of definite aircraft antiskid brake control enclosure low-temperature working stress limit, the method for determining aircraft antiskid brake control enclosure hot operation stress limit and definite aircraft antiskid brake control enclosure vibration working stress limit respectively in application number is 2011103108832,2011103108851 and 2011103108847 patented claim.Technique scheme adopts stepping to apply the method for working stress to the control enclosure under the duty, to excite and to observe fault, accelerates to determine and correct the various potential faults of control enclosure.But foregoing invention is created and is only applicable to single environmental stress, and be not suitable for the potential faults of determining under the integrated environment stress, lack the quality that adopts integrated environment stress screening method to guarantee to dispatch from the factory product, this method is exactly the highly accelerated stress screen test method.
Summary of the invention
For overcome exist in the prior art or under off working state, general electronic products is carried out highly accelerated stress screen test, it is true that resulting data are owed; The screening degree that perhaps adopts common screening technique to bring is low, the loss height, and screening time is long, perhaps is not suitable for the deficiency of determining the potential faults under the integrated environment stress, the present invention proposes a kind of method of aircraft antiskid brake control enclosure highly accelerated stress screen.
Detailed process of the present invention may further comprise the steps:
Step 1 is determined the low-temperature working stress limit of control enclosure
When determining the low-temperature working stress limit of control enclosure, stepping applies low temperature stress to control enclosure, to determine the low-temperature working stress limit of control enclosure.The step-length that stepping applies low temperature stress is 1 ℃～5 ℃, and rate of temperature fall is-25 ℃/min～-60 ℃/min, keeps 5min after each cooling reaches regulation numerical value, and the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until reaching the low-temperature working stress limit.
Step 2 is determined the hot operation stress limit of control enclosure
When determining the hot operation stress limit of control enclosure, stepping applies high temperature stress to control enclosure, to determine the hot operation stress limit of control enclosure.The step-length that stepping applies high temperature stress is 1 ℃～10 ℃, and heating rate is 20 ℃/min～60 ℃/min, and each the intensification keeps 5min after reaching regulation numerical value, and the test duration is 5min.Repeat above-mentioned temperature-fall period, until the working stress limit that reaches a high temperature.
Step 3 is determined the vibration working stress limit of control enclosure
When determining the vibration working stress limit of control enclosure, stepping applies vibration stress to control enclosure, to determine the vibration working stress limit of control enclosure.The step-length that stepping applies vibration stress is 1Grms～5Grms, keeps 5min after each stepping vibration reaches regulation numerical value, and the test duration is 5min.Retention time in the highest and minimum value experimental stage of vibration is 5min.Repeat above-mentioned stepping and apply the vibration stress process, until the vibration working stress limit that obtains exemplar.
Step 4 is determined initial highly accelerated stress screen test profile
Described initial highly accelerated stress screen test profile comprises the duration of low-temperature working stress level, hot operation stress level and vibration working stress value, each value, and rate temperature change.
When determining described each value, determine the highly accelerated stress screen test parameters according to the above-mentioned low-temperature working stress limit that obtains, hot operation stress limit and the vibration working stress limit, the method of determining is: hot test parameter, low-temperature test parameter are all got 80% of the working stress limit, maximum amount value in the vibration parameters is 50% of the vibration working stress limit, and the minimum value in the vibration parameters is 2Grms～8Grms.
The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.
Described rate temperature change is: heating rate is 25 ℃/min～40 ℃/min, and rate of temperature fall is-25 ℃/min～-40 ℃/min.
So far, determined initial highly accelerated stress screen test profile.
Step 5 is implanted potential faults in control enclosure
Implanting the potential faults detailed process is:
At first determine the fault mode of implantation, and in control enclosure, implant potential faults according to the fault mode of determining.
At the potential faults of implanting control enclosure is carried out performance test.In the test, if the performance of control enclosure is normal, then the implantation of potential faults is successful.If the performance of control enclosure is undesired, what then implant is fault, rather than potential faults, must carry out the implantation of potential faults again, normal until the performance of control enclosure in performance test.
Step 6. pair initial highly accelerated stress screen test profile carries out validation verification
The highly accelerated stress screen test is the compbined test of carrying out environment temperature and vibration simultaneously.The value of environment temperature is maximum amount value and the minimum value of determined hot test parameter, low-temperature test parameter, definite vibration test parameter.The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.Described rate temperature change is: heating rate is 25 ℃/min～40 ℃/min, and rate of temperature fall is-25 ℃/min～-40 ℃/min.
Be installed on the moving-coil in the strenuous test case implanting control enclosure behind the potential faults, according to the test profile of input control enclosure carried out the highly accelerated stress screen test.Adopt initial highly accelerated stress screen test profile to carry out cyclic test, be converted into fault until the potential faults of implanting.Obtained the test profile by the checking of effect property.
Step 7. pair initial highly accelerated stress screen test profile carries out security verification
Employing is carried out security verification 10 times by the test profile of validation verification.The test parameters of security verification is identical with the test parameters of validation verification.Its detailed process is, gets the control enclosure of not implanting fault and is installed on the moving-coil in the strenuous test case, adopts the test profile by the checking of effect property to carry out 10 times highly accelerated stress screens tests continuously.If the injury tolerance of control enclosure is less than 10%, then initial highly accelerated stress screen test profile is safe for control enclosure.At last, the highly accelerated stress screen test profile after being verified.
Adopt in the computing machine of interactive mode with highly accelerated stress screen test profile input strenuous test case.
Every period all over the highly accelerated stress screen test is consistent with the period that obtains the validation verification test profile.
The present invention is defined as formal highly accelerated stress screen test profile by the test profile of validation verification and security verification.
The serviceability of control enclosure comprises the multiple function of protection between the wheel of left and right undercarriage wheel in antiskid function in take-off line brake function, the landing braking process, the ground protection function when landing, the landing mission, and any function does not meet designing requirement and is and breaks down.The present invention determines the highly accelerated stress screen test profile according to hot operation stress limit, low-temperature working stress limit, the vibration working stress limit, for the validity of warranty test section, the high temperature value in the test profile, low temperature value, the vibration value all should be near the working stress limit; For the security of warranty test section, the high temperature value in the test profile, low temperature value, vibration value all should be lower than the working stress limit again, and concrete value is determined with reference to the development quality of GMW8287 and control enclosure.The method confirmed test section that employing is taken all factors into consideration is effective and safe.
Because the fault of control enclosure takes place in the course of the work, undertaken by test profile in the process of highly accelerated stress screen, apply working stress and more be conducive to excite and observe fault, therefore, the present invention adopts the method that applies working stress in process of the test to control enclosure, in time find the fault of control enclosure by tracing observation, and in time get rid of, obtain effectively the effect of fixing a breakdown, guarantee reliability.
The present invention carries out the highly accelerated stress screen test to control enclosure down in working order, can inspire the potential faults of control enclosure at short notice, according to test figure indivedual defective control enclosurees are carried out troubleshooting, the screening time with original 80h shortens to 2h simultaneously.
Description of drawings
Fig. 1 is highly accelerated stress screen test profile synoptic diagram among the embodiment 1;
Fig. 2 is highly accelerated stress screen test profile synoptic diagram among the embodiment 2;
Fig. 3 is highly accelerated stress screen test profile synoptic diagram among the embodiment 3;
Fig. 4 is the process flow diagram of the method for aircraft antiskid brake control enclosure highly accelerated stress screen.
Embodiment
Embodiment one
It is the reliability intensifying chamber of UHS1200, digital avometer, signal source and oscillograph that model is adopted in the test of present embodiment.The control enclosure quantity of present embodiment is 2 covers, and wherein 1 cover is used for carrying out the validation verification of test profile, and 1 cover is used for carrying out the security verification of test profile.
Originally executing example may further comprise the steps.
Step 1 is determined the low-temperature working stress limit of control enclosure
When determining the low-temperature working stress limit of control enclosure, stepping applies low temperature stress to control enclosure since 20 ℃, to determine the low-temperature working stress limit of control enclosure.The step-length that stepping applies low temperature stress is 2 ℃, and rate of temperature fall is-25 ℃/min, keeps 5min after each cooling reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until reaching the low-temperature working stress limit, in the present embodiment, the low-temperature working stress limit is-80 ℃.
Step 2 is determined the hot operation stress limit of control enclosure
When determining the hot operation stress limit of control enclosure, stepping applies high temperature stress to control enclosure since 20 ℃, to determine the hot operation stress limit of control enclosure.The step-length that stepping applies high temperature stress is 1 ℃, and heating rate is 20 ℃/min, keeps 5min after each intensification reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until the working stress limit that reaches a high temperature, in the present embodiment, the hot operation stress limit is 100 ℃.
Step 3 is determined the vibration working stress limit of control enclosure
When determining the vibration working stress limit of control enclosure, begin from 5Grms that stepping applies vibration stress to control enclosure, to determine the vibration working stress limit of control enclosure.The step-length that stepping applies vibration stress is 1Grms, keeps 5min after each stepping vibration reaches regulation numerical value, reserves control enclosure vibration stress balance time, carries out performance test again, and the test duration is 5min, is 10min in the vibration retention time in each step summation.Retention time in the highest and minimum value experimental stage of vibration is 5min.Repeat above-mentioned stepping and apply the vibration stress process, until the vibration working stress limit that obtains exemplar, in the present embodiment, the vibration working stress limit is 50Grms.
Step 4 is determined initial highly accelerated stress screen test profile
Described initial highly accelerated stress screen test profile comprises the duration of low-temperature working stress level, hot operation stress level and vibration working stress value, each value, and rate temperature change.
When determining described each value, determine the highly accelerated stress screen test parameters according to the above-mentioned low-temperature working stress limit that obtains, hot operation stress limit and the vibration working stress limit, the method of determining is: hot test parameter, low-temperature test parameter are all got 80% of the working stress limit, maximum amount value in the vibration parameters is 50% of the vibration working stress limit, and the minimum value in the vibration parameters is than the big 1Grms of vibration value of GJB1032.In the present embodiment, the hot operation stress limit is 100 ℃, and the low-temperature working stress limit is-80 ℃, and the vibration working stress limit is 50Grms.So the hot test parameter of present embodiment is 80 ℃, the low-temperature test parameter is-64 ℃, and the maximum amount value of vibration parameters is 25Grms, and minimum value is 6Grms.
The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.
Described rate temperature change is: heating rate is 25 ℃/min, and rate of temperature fall is-25 ℃/min.
So far, determined initial highly accelerated stress screen test profile.
Step 5 is implanted potential faults in control enclosure
Implanting the potential faults detailed process is:
At first determine fault mode.Fault mode comprise the fault of not braking, not anti-skidding fault, earth-free protection and do not take turns between the protection.In the present embodiment, the fault mode of selecting to determine is the fault of not braking.
In control enclosure, implant the potential faults that do not brake.Method for implantation is to disconnect the brake function circuit with electric soldering iron, carries out rosin joint again, makes the brake function circuit have normal function, but can disconnect under service condition.
The control enclosure of implanting fault is carried out the braking quality test.In the test, if the braking quality of control enclosure is normal, the implantation of the potential faults that then brakes is successful; If the braking quality of control enclosure is undesired, what then implant is fault, rather than potential faults, must carry out the implantation of potential faults again, normal until the braking quality of control enclosure.
Step 6. pair initial highly accelerated stress screen test profile carries out validation verification
The effect proving time of determining initial highly accelerated stress screen test profile is 2 circulations, and an initial highly accelerated stress screen test just comprises 2 circulations of test profile.
The purpose of validation verification is to determine that can above-mentioned highly accelerated stress screen test profile filter out fault in a highly accelerated stress screen test of regulation, when the screening failsafe, tackle above-mentioned highly accelerated stress screen test profile and revise, until filtering out fault.
As shown in Figure 1, the highly accelerated stress screen test is the compbined test of carrying out environment temperature and vibration simultaneously.The value of environment temperature is 80 ℃ of determined hot test parameters, low-temperature test parameter-64 ℃, the maximum amount value 25Grms of vibration parameters and minimum value 6Grms.The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage, and in the time of the lasting 5min of lowest vibration value, finish Performance Detection.Described rate temperature change is: heating rate is 25 ℃/min, and rate of temperature fall is-25 ℃/min.
Be installed on the moving-coil in the strenuous test case implanting control enclosure behind the potential faults, starting characteristics test equipment carries out the highly accelerated stress screen test according to the test profile of input to control enclosure.
When the first pass test proceeded to 30min, the potential faults that do not brake of implantation was converted into the fault of not braking, and proved that determined test profile is effectively to the screening potential faults, obtains the test profile by the checking of effect property.
Step 7. pair initial highly accelerated stress screen test profile has security verification
Test profile by validation verification is carried out security verification, described test profile by validation verification is carried out security verification 10 times, each is all over comprising two circulations shown in Figure 1.The test parameters of security verification is identical with the test parameters of validation verification.Its detailed process is, gets 1 cover and do not implant the control enclosure of fault and be installed on the moving-coil in the strenuous test case, carries out 10 times highly accelerated stress screens tests continuously according to the test profile by the checking of effect property.When the security verification off-test, initial highly accelerated stress screen test profile is carried out security differentiate.The criterion of safety is: in the highly accelerated stress screen test, if the injury tolerance of control enclosure is less than 10%, then initial highly accelerated stress screen test profile is safe for control enclosure.In the present embodiment, in 10 times complete highly accelerated stress screen circulations, all do not break down the highly accelerated stress screen test profile after being verified.
Embodiment two
It is the reliability intensifying chamber of UHS1200, digital avometer, signal source and oscillograph that present embodiment adopts model.The control enclosure quantity of present embodiment is 6 covers, and wherein 3 covers are used for carrying out the validation verification of test profile, and other 3 covers are used for carrying out the security verification of test profile.
Originally executing example may further comprise the steps.
Step 1 is determined the low-temperature working stress limit of control enclosure
When determining the low-temperature working stress limit of control enclosure, stepping applies low temperature stress to control enclosure since 30 ℃, to determine the low-temperature working stress limit of control enclosure.The step-length that stepping applies low temperature stress is 5 ℃, and rate of temperature fall is-40 ℃/min, keeps 5min after each cooling reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until reaching the low-temperature working stress limit, in the present embodiment, the low-temperature working stress limit is-75 ℃.
Step 2 is determined the hot operation stress limit of control enclosure
When determining the hot operation stress limit of control enclosure, stepping applies high temperature stress to control enclosure since 40 ℃, to determine the hot operation stress limit of control enclosure.The step-length that stepping applies high temperature stress is 3 ℃, and heating rate is 40 ℃/min, keeps 5min after each intensification reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until the working stress limit that reaches a high temperature, in the present embodiment, the hot operation stress limit is 120 ℃.
Step 3 is determined the vibration working stress limit of control enclosure
When determining the vibration working stress limit of control enclosure, begin from 10Grms that stepping applies vibration stress to control enclosure, to determine the vibration working stress limit of control enclosure.The step-length that stepping applies vibration stress is 3Grms, keeps 5min after each stepping vibration reaches regulation numerical value, reserves control enclosure vibration stress balance time, carries out performance test again, and the test duration is 5min, is 10min in the vibration retention time in each step summation.Retention time in the highest and minimum value experimental stage of vibration is 5min.Repeat above-mentioned stepping and apply the vibration stress process, until the vibration working stress limit that obtains exemplar, in the present embodiment, the vibration working stress limit is 40Grms.
Step 4 is determined initial highly accelerated stress screen test profile
Described initial highly accelerated stress screen test profile comprises the duration of low-temperature working stress level, hot operation stress level and vibration working stress value, each value, and rate temperature change.
When determining described each value, determine the highly accelerated stress screen test parameters according to the above-mentioned low-temperature working stress limit that obtains, hot operation stress limit and the vibration working stress limit, the method of determining is: hot test parameter, low-temperature test parameter are all got 80% of the working stress limit, maximum amount value in the vibration parameters is 50% of the vibration working stress limit, and the minimum value in the vibration parameters is 2Grms.In the present embodiment, the hot operation stress limit is 120 ℃, and the low-temperature working stress limit is-75 ℃, and the vibration working stress limit is 40Grms.So the hot test parameter of present embodiment is 96 ℃, the low-temperature test parameter is-60 ℃, and the maximum amount value of vibration parameters is 20Grms, and minimum value is 2Grms.
The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.
Described rate temperature change is: heating rate is 30 ℃/min, and rate of temperature fall is-30 ℃/min.
So far, determined initial highly accelerated stress screen test profile.
Step 5 is implanted potential faults in control enclosure
Implanting the potential faults detailed process is:
At first determine fault mode.Fault mode comprise the fault of not braking, not anti-skidding fault, earth-free protection and do not take turns between the protection.In the present embodiment, the fault mode of selecting to determine is not anti-skidding fault.
Carry out all implanting not anti-skidding potential faults in the control enclosure of validation verification at 3 covers.Method for implantation is to disconnect the antiskid function circuit with electric soldering iron, carries out rosin joint again, makes the antiskid function circuit have normal function, but can disconnect under service condition.
The control enclosure of implanting fault is all carried out the non-skid property test.In the test, if the non-skid property of control enclosure is normal, then the implantation of anti-skidding potential faults is successful; If the non-skid property of control enclosure is undesired, what then implant is fault, rather than potential faults, must carry out the implantation of anti-skidding potential faults again, normal until the non-skid property of control enclosure.
Step 6. pair initial highly accelerated stress screen test profile carries out validation verification
The effect of determining initial highly accelerated stress screen test profile is verified as 2 circulations, and an initial highly accelerated stress screen test just comprises 2 circulations of test profile.
The purpose of validation verification is to determine that can above-mentioned highly accelerated stress screen test profile filter out fault in a highly accelerated stress screen test of regulation, when the screening failsafe, tackle above-mentioned test profile and revise, until filtering out fault.
As shown in Figure 1, the highly accelerated stress screen test is the compbined test of carrying out environment temperature and vibration simultaneously.The value of environment temperature is 96 ℃ of determined hot test parameters, low-temperature test parameter-60 ℃, the maximum amount value 20Grms of vibration parameters and minimum value 2Grms.The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.Described rate temperature change is: heating rate is 30 ℃/min, and rate of temperature fall is-30 ℃/min.
Be installed on the moving-coil in the strenuous test case implanting control enclosure behind the potential faults, starting characteristics test equipment carries out the highly accelerated stress screen test according to the test profile of input to control enclosure.
After the first pass test was finished, the not anti-skidding potential faults of implantation is unconverted to be fault.Time expand, proceeded validation verification.When second time test proceeded to 50min, the not anti-skidding potential faults of implantation was converted into not anti-skidding fault, proved that determined test profile is effectively to the screening potential faults, obtains the validation verification test profile by three circulations.A highly accelerated stress screen test profile revision is for comprising three circulations.
Step 7. pair initial highly accelerated stress screen test profile has security verification
Test profile by validation verification is carried out security verification, described test profile by validation verification is carried out security verification 10 times, each is all over comprising three circulations shown in Figure 2.The test parameters of security verification is identical with the test parameters of validation verification.Its detailed process is, gets 3 covers and do not implant the control enclosure of fault and be installed on the moving-coil in the strenuous test case, carries out 10 times highly accelerated stress screens tests continuously according to the test profile by the checking of effect property.When the security verification off-test, initial highly accelerated stress screen test profile is carried out security to be differentiated, the criterion of safety is: in the highly accelerated stress screen test, if the injury tolerance of control enclosure is less than 10%, then initial highly accelerated stress screen test profile is safe for control enclosure.In the present embodiment, need carry out 10 times highly accelerated stress screen tests altogether.Breaking down in the 3rd highly accelerated stress screen circulation of the 10th time, is 3.3% to the injury tolerance of control enclosure, less than 10%.This highly accelerated stress screen test profile is safe, the highly accelerated stress screen test profile after being verified.
Embodiment three
Present embodiment is that the control enclosure of the third type is determined the highly accelerated stress screen test profile, tests, vibrates the problem that occurs in the working stress marginal test at the test of low-temperature working stress limit, the hot operation stress limit of control enclosure and finished the localized design improvement.
It is the reliability intensifying chamber of UHS1200, digital avometer, signal source and oscillograph that model is adopted in the test of present embodiment.The control enclosure quantity of present embodiment is 10 covers, and wherein 5 covers are used for carrying out the validation verification of test profile, and other 5 covers are used for carrying out the security verification of test profile.
Originally executing example may further comprise the steps.
Step 1 is determined the low-temperature working stress limit of control enclosure
When determining the low-temperature working stress limit of control enclosure, stepping applies low temperature stress to control enclosure since 25 ℃, to determine the low-temperature working stress limit of control enclosure.The step-length that stepping applies low temperature stress is 1 ℃, and rate of temperature fall is-60 ℃/min, keeps 5min after each cooling reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until reaching the low-temperature working stress limit, in the present embodiment, the low-temperature working stress limit is-70 ℃.
Step 2 is determined the hot operation stress limit of control enclosure
When determining the hot operation stress limit of control enclosure, stepping applies high temperature stress to control enclosure since 60 ℃, to determine the hot operation stress limit of control enclosure.The step-length that stepping applies high temperature stress is 5 ℃, and heating rate is 60 ℃/min, keeps 5min after each intensification reaches regulation numerical value, reserve control enclosure temperature balance time, carry out performance test again, the test duration is 5min, and the temperature hold-time summation in each step is 10min.Repeat above-mentioned temperature-fall period, until the working stress limit that reaches a high temperature, in the present embodiment, the hot operation stress limit is 130 ℃.
Step 3 is determined the vibration working stress limit of control enclosure
When determining the vibration working stress limit of control enclosure, begin from 15Grms that stepping applies vibration stress to control enclosure, to determine the vibration working stress limit of control enclosure.The step-length that stepping applies vibration stress is 5Grms, keeps 5min after each stepping vibration reaches regulation numerical value, reserves control enclosure vibration stress balance time, carries out performance test again, and the test duration is 5min, is 10min in the vibration retention time in each step summation.Retention time in the highest and minimum value experimental stage of vibration is 5mi n.Repeat above-mentioned stepping and apply the vibration stress process, until the vibration working stress limit that obtains exemplar, in the present embodiment, the vibration working stress limit is 60Grms.
Step 4 is determined initial highly accelerated stress screen test profile
Described initial highly accelerated stress screen test profile comprises the duration of low-temperature working stress level, hot operation stress level and vibration working stress value, each value, and rate temperature change.
When determining described each value, determine the highly accelerated stress screen test parameters according to the above-mentioned low-temperature working stress limit that obtains, hot operation stress limit and the vibration working stress limit, the method of determining is: hot test parameter, low-temperature test parameter are all got 80% of the working stress limit, maximum amount value in the vibration parameters is 50% of the vibration working stress limit, and the minimum value in the vibration parameters is 8Grms.In the present embodiment, the hot operation stress limit is 130 ℃, and the low-temperature working stress limit is-70 ℃, and the vibration working stress limit is 60Grms.So the hot test parameter of present embodiment is 104 ℃, the low-temperature test parameter is-56 ℃, and the maximum amount value of vibration parameters is 30Grms, and minimum value is 8Grms.
The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.
Described rate temperature change is: heating rate is 40 ℃/min, and rate of temperature fall is-40 ℃/min.
So far, determined initial highly accelerated stress screen test profile.
Step 5 is implanted potential faults in control enclosure
Implanting the potential faults detailed process is:
At first determine fault mode.Fault mode comprise the fault of not braking, not anti-skidding fault, earth-free protection and do not take turns between the protection.In the present embodiment, definite fault mode of selecting to determine is earth-free protection fault.
Overlap the potential faults of all implanting earth-free protection in the control enclosure that carries out validation verification 5.Method for implantation is to disconnect the ground protection functional circuit with electric soldering iron, carries out rosin joint again, makes the ground protection functional circuit have normal function, but can disconnect under service condition.
The control enclosure of implanting fault is all carried out the ground protection performance test.In the test, if the ground protection performance of control enclosure is normal, then the implantation of earth-free protection potential faults is successful; If the ground protection performance of control enclosure is undesired, what then implant is fault, rather than potential faults, must carry out the implantation of earth-free protection potential faults again, normal until the ground protection performance of control enclosure.
Step 6. pair initial highly accelerated stress screen test profile carries out validation verification
The effect of determining initial highly accelerated stress screen test profile is verified as 2 circulations, and a highly accelerated stress screen test just comprises 2 circulations of test profile.
The purpose of validation verification is to determine that can above-mentioned highly accelerated stress screen test profile filter out fault in a complete cycle of regulation, when the screening failsafe, tackle above-mentioned highly accelerated stress screen test profile and revise, until filtering out fault.
As shown in Figure 1, the highly accelerated stress screen test is the compbined test of carrying out environment temperature and vibration simultaneously.The value of environment temperature is 104 ℃ of determined hot test parameters, low-temperature test parameter-56 ℃, the maximum amount value 30Grms of vibration parameters and minimum value 8Grms.The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min.Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage.Described rate temperature change is: heating rate is 40 ℃/min, and rate of temperature fall is-40 ℃/min.
Be installed on the moving-coil in the strenuous test case implanting control enclosure behind the potential faults, starting characteristics test equipment carries out the highly accelerated stress screen test according to the test profile of input to control enclosure.
After the first pass test was finished, the earth-free protection potential faults of implantation is unconverted to be fault.Time expand, proceeded validation verification.When second time test proceeds to 40min; the earth-free protection potential faults of implanting is converted into earth-free protection fault; prove that determined test profile is effective to the screening potential faults; obtain the validation verification test profile by three circulations, a highly accelerated stress screen test profile revision is for comprising three circulations.
Step 7. pair initial highly accelerated stress screen test profile has security verification
Test profile by validation verification is carried out security verification, described test profile by validation verification is carried out security verification 10 times, each is all over comprising three circulations shown in Figure 3.The test parameters of security verification is identical with the test parameters of validation verification.Its detailed process is, gets 5 covers and do not implant the control enclosure of fault and be installed on the moving-coil in the strenuous test case, carries out 10 times highly accelerated stress screens tests continuously according to the test profile by the checking of effect property.When the security verification off-test, initial highly accelerated stress screen test profile is carried out security to be differentiated, the criterion of safety is: in the highly accelerated stress screen test, if the injury tolerance of control enclosure is less than 10%, then initial highly accelerated stress screen test profile is safe for control enclosure.In the present embodiment, owing to obtain the validation verification test profile by three circulations, so every the test all over highly accelerated stress screen also is three circulations, need carry out 10 times highly accelerated stress screens tests altogether.Breaking down in second highly accelerated stress screen circulation of the 10th time, is 5% to the injury tolerance of control enclosure, less than 10%.This highly accelerated stress screen test profile is safe, the highly accelerated stress screen test profile after being verified.
Claims (2)
1. the method for an aircraft antiskid brake control enclosure highly accelerated stress screen is characterized in that its detailed process may further comprise the steps:
Step 1 is determined the low-temperature working stress limit of control enclosure
When determining the low-temperature working stress limit of control enclosure, stepping applies low temperature stress to control enclosure, to determine the low-temperature working stress limit of control enclosure; The step-length that stepping applies low temperature stress is 1 ℃～5 ℃, rate of temperature fall is-25 ℃/min～-60 ℃/min, after reaching regulation numerical value, each cooling keeps 5min, test duration is 5min, temperature hold-time summation in each step is that 10min repeats above-mentioned temperature-fall period, until reaching the low-temperature working stress limit;
Step 2 is determined the hot operation stress limit of control enclosure
When determining the hot operation stress limit of control enclosure, stepping applies high temperature stress to control enclosure, to determine the hot operation stress limit of control enclosure; The step-length that stepping applies high temperature stress is 1 ℃～10 ℃, and heating rate is 20 ℃/min～60 ℃/min, and each the intensification keeps 5min after reaching regulation numerical value, and the test duration is 5min; Repeat above-mentioned temperature-rise period, until the working stress limit that reaches a high temperature;
Step 3 is determined the vibration working stress limit of control enclosure
When determining the vibration working stress limit of control enclosure, stepping applies vibration stress to control enclosure, to determine the vibration working stress limit of control enclosure; The step-length that stepping applies vibration stress is 1Grms～5Grms, keeps 5min after each stepping vibration reaches regulation numerical value, and the test duration is 5min; Retention time in the highest and minimum value experimental stage of vibration is 5min; Repeat the process that above-mentioned stepping applies vibration stress, until the vibration working stress limit that obtains exemplar;
Step 4 is determined initial highly accelerated stress screen test profile
Described initial highly accelerated stress screen test profile comprises the duration of low-temperature working stress level, hot operation stress level and vibration working stress value, each value, and rate temperature change;
When determining described each value, determine the highly accelerated stress screen test parameters according to the above-mentioned low-temperature working stress limit that obtains, hot operation stress limit and the vibration working stress limit, the method of determining is: hot test parameter, low-temperature test parameter are all got 80% of the working stress limit, maximum amount value in the vibration parameters is 50% of the vibration working stress limit, and the minimum value in the vibration parameters is 2Grms～8Grms;
The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min; Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage;
Described rate temperature change is: heating rate is 25 ℃～40 ℃/min, and rate of temperature fall is-25 ℃～-40 ℃/min;
So far, determined initial highly accelerated stress screen test profile;
Step 5 is implanted potential faults in control enclosure
Implanting the potential faults detailed process is:
At first determine fault mode, and in control enclosure, implant potential faults according to the fault mode of determining; At the potential faults of implanting control enclosure is carried out performance test; In the test, if the performance of control enclosure is normal, then the implantation of potential faults is successful; If the performance of control enclosure is undesired, what then implant is fault, rather than potential faults, must carry out the implantation of potential faults again, normal until the braking quality of control enclosure;
Step 6. pair initial highly accelerated stress screen test profile carries out validation verification
The highly accelerated stress screen test is the compbined test of carrying out environment temperature and vibration simultaneously; The value of environment temperature is maximum amount value and the minimum value of determined hot test parameter, low-temperature test parameter, vibration parameters; The duration of described each value is: the retention time in hot test stage and low-temperature test stage is 10min, wherein comprises the Performance Detection time of 5min; Be 5min in the maximum amount value of vibration parameters and the retention time of minimum value experimental stage; Described rate temperature change is: heating rate is 25 ℃/min～40 ℃/min, and rate of temperature fall is-25/min～-40 ℃/min;
Be installed on the moving-coil in the strenuous test case implanting control enclosure behind the potential faults, according to the test profile of input control enclosure carried out the highly accelerated stress screen test; Adopt the initial highly accelerated stress screen test profile of determining to carry out cyclic test, be converted into fault until the potential faults of implanting; Obtain the test profile by validation verification;
Step 7. pair initial highly accelerated stress screen test profile carries out security verification
Employing is carried out security verification 10 times by the test profile of validation verification; The test parameters of security verification is identical with the test parameters of validation verification; Its detailed process is, gets the control enclosure of not implanting potential faults and is installed on the moving-coil in the strenuous test case, adopts the test profile by validation verification to carry out 10 times highly accelerated stress screens tests continuously; In the highly accelerated stress screen test, if the injury tolerance of control enclosure is less than 10%, then the highly accelerated stress screen test profile by validation verification is safe for control enclosure; At last, the highly accelerated stress screen test profile after being verified.
2. a kind of method of aircraft antiskid brake control enclosure highly accelerated stress screen according to claim 1 is characterized in that, every period all over the highly accelerated stress screen test is consistent with the period that obtains the validation verification test profile.
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| CN103512716A (en) * | 2013-09-12 | 2014-01-15 | 西安航空制动科技有限公司 | Anti-sliding brake control box high-acceleration stress sieving method |
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