CN102289091B - Liquid crystal test box and manufacturing method thereof - Google Patents
Liquid crystal test box and manufacturing method thereof Download PDFInfo
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- CN102289091B CN102289091B CN201110252392.7A CN201110252392A CN102289091B CN 102289091 B CN102289091 B CN 102289091B CN 201110252392 A CN201110252392 A CN 201110252392A CN 102289091 B CN102289091 B CN 102289091B
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Abstract
The invention discloses a liquid crystal test box and a manufacturing method thereof. The manufacturing method of the liquid crystal test box comprises the following steps of: providing a first substrate; forming a first conductive pattern on the first substrate by using a first shield as a mask; rotating one of the first substrate or the first shield; forming an insulating pattern on the first conductive pattern by using the first shied as the mask, wherein the insulating patter and the first conductive pattern are overlapped and part of the first conductive pattern is exposed; forming a second conductive pattern on the insulating pattern, wherein the second conductive pattern is electrically insulated from the first conductive pattern; providing a second substrate; assembling the first substrate and the second substrate; and filling a liquid crystal layer between the first substrate and the second substrate. The liquid crystal test box and the manufacturing method thereof, which are disclosed by the invention, need few shields, so that the required cost for estimating liquid crystals can be effectively reduced.
Description
Technical field
The invention relates to a kind of photoelectric subassembly and manufacture method thereof, and particularly relevant for a kind of liquid crystal test box and manufacture method thereof.
Background technology
Liquid crystal is the key part and component of liquid crystal display, its characteristic for liquid crystal display (such as reaction time, driving voltage, can operating temperature interval etc.) playing the part of important role.The improvement of liquid crystal material can promote the characteristic of liquid crystal display effectively, therefore the liquid crystal material that imports function admirable is for obtaining a scarce ring in the work of exploitation high standard liquid crystal display.Yet, liquid crystal material is imported in actual liquid crystal display and tests the cost that often needs to expend much time and dependent part material, not only postponed the progress of liquid crystal material assessment, the material cost of more having wasted unnecessary part.
Therefore, someone has proposed to assess liquid crystal material to reduce the cost of assessment liquid crystal material with liquid crystal test box.To be used for assessing fringe field, switch (Fringe Field Switching, FFS) liquid crystal test box of liquid crystal is example, on a wherein substrate of this liquid crystal test box, at least disposes shared electrode, pixel electrode and the insulation course between shared electrode and pixel electrode.In known techniques, at least use three different light shields to form respectively above-mentioned shared electrode, pixel electrode and insulation course, and make to assess the required cost of liquid crystal material, cannot further reduce.Note: with the immediate prior art publication number of the present invention be: CN1448763A, open day is: on October 15th, 2003.
Summary of the invention
In view of this, the invention provides a kind of liquid crystal test box and manufacture method thereof, it can effectively reduce the required cost of assessment liquid crystal.
The invention provides another kind of liquid crystal test box and manufacture method thereof, it can effectively reduce the required cost of assessment liquid crystal.
The present invention proposes a kind of manufacture method of liquid crystal test box, and it comprises the following steps.First substrate is provided.Take the first shielding as cover curtain, on first substrate, form the first conductive pattern.Rotation first substrate and first shields one of them.Take the first shielding as cover curtain, on the first conductive pattern, form insulating pattern, insulating pattern and the first conductive pattern overlap and expose the first conductive pattern partly.On insulating pattern, form the second conductive pattern, the second conductive pattern and the first conductive pattern are electrically insulated.Second substrate is provided.The vertical first substrate of group and second substrate.Between first substrate and second substrate, insert liquid crystal layer.
In one embodiment of this invention, above-mentioned rotation first substrate and the first mode that shields one of them comprise: make first substrate with respect to the first shielding Rotate 180 degree.
In one embodiment of this invention, the profile of above-mentioned insulating pattern (form) and size (dimension) are identical in fact with profile and the size of the first conductive pattern.
In one embodiment of this invention, the first above-mentioned conductive pattern comprises the first operate portions and the first terminal portion being connected with the first operate portions, insulating pattern comprises insulation division and the extension being connected with insulation division, the profile of the first operate portions and size are identical in fact with profile and the size of insulation division, the profile of the first terminal portion and size are identical in fact with profile and the size of extension, wherein the first operate portions overlaps with insulation division, and the first terminal portion and extension are positioned at respectively the relative both sides of the first operate portions.
In one embodiment of this invention, the first above-mentioned operate portions is tool sealing opening not, and the second conductive pattern has a plurality of slits, and these slits expose insulation division and are positioned in the first operate portions.
In one embodiment of this invention, the second above-mentioned conductive pattern is divided in a plurality of ，Ge test sections, test section connected with each other and disposes at least two slits, and the slit width that is positioned at one of them test section is different from the slit width that is positioned at another test section.
In one embodiment of this invention, the second above-mentioned conductive pattern is divided into a plurality of test sections connected with each other, in each test section, dispose at least two slits, the slit separation (pitch) that is positioned at one of them test section is different from the slit separation that is positioned at another test section.
In one embodiment of this invention, the manufacture method of above-mentioned liquid crystal test box can further comprise cutting second substrate.
In one embodiment of this invention, the second above-mentioned conductive pattern comprises the second operate portions and the second portion of terminal being connected with the second operate portions, the second operate portions and the first operate portions and insulation division overlap, and after cutting second substrate, the first terminal portion and the second portion of terminal are exposed.
The present invention proposes a kind of liquid crystal test box, and it comprises first substrate, the first conductive pattern, insulating pattern, the second conductive pattern, second substrate and liquid crystal layer.The first conductive pattern is disposed on first substrate.On insulating pattern configuration first substrate, and overlap with the first conductive pattern and expose the first conductive pattern partly, wherein the profile of insulating pattern and size are identical in fact with profile and the size of the first conductive pattern.The second conductive pattern is disposed on first substrate and with the first conductive pattern and is electrically insulated, and insulating pattern is between the first conductive pattern and the second conductive pattern.Second substrate subtend is in first substrate.Liquid crystal layer is between first substrate and second substrate.
In one embodiment of this invention, the first above-mentioned conductive pattern is between first substrate and insulating pattern.
In one embodiment of this invention, the second above-mentioned conductive pattern is between second substrate and insulating pattern.
In one embodiment of this invention, the first above-mentioned conductive pattern comprises the first operate portions and the first terminal portion being connected with the first operate portions, insulating pattern comprises insulation division and the extension being connected with insulation division, the profile of the first operate portions and size are identical in fact with profile and the size of insulation division, the profile of the first terminal portion and size are identical in fact with profile and the size of extension, wherein the first operate portions overlaps with insulation division, and the first terminal portion and extension are positioned at respectively the relative both sides of the first operate portions.
In one embodiment of this invention, the first above-mentioned operate portions does not have sealing opening, and the second conductive pattern has a plurality of slits, and these slits expose insulation division and are positioned in the first operate portions.
In one embodiment of this invention, the second above-mentioned conductive pattern is divided in a plurality of ，Ge test sections, test section connected with each other and disposes at least two slits, and the slit width that is positioned at one of them test section is different from the slit width that is positioned at another test section.
In one embodiment of this invention, the second above-mentioned conductive pattern is divided in a plurality of ，Ge test sections, test section connected with each other and disposes at least two slits, and the slit separation that is positioned at one of them test section is different from the slit separation that is positioned at another test section.
In one embodiment of this invention, the second above-mentioned conductive pattern comprises the second operate portions and the second portion of terminal being connected with the second operate portions, the second operate portions and the first operate portions and insulation division overlap, second substrate has at least two openings, and two openings expose respectively the first terminal portion and the second portion of terminal.
Based on above-mentioned, in liquid crystal test box of the present invention and manufacture method thereof, a conductive pattern is to adopt identical light shield to be made respectively with insulating pattern.Therefore the required shielding quantity of liquid crystal test box of the present invention and manufacture method thereof is few, and then can effectively reduce the required cost of assessment liquid crystal.
For above-mentioned feature and advantage of the present invention can be become apparent, special embodiment below, and coordinate appended graphic being described in detail below.
Accompanying drawing explanation
Figure 1A to Fig. 1 E looks schematic diagram on the manufacturing process of liquid crystal test box of first embodiment of the invention.
Fig. 2, Fig. 3 illustrate the first conductive pattern, insulating pattern 120 and the arrangement mode of the second conductive pattern on first substrate of one embodiment of the invention.
Fig. 4 is the liquid crystal test box diagrammatic cross-section that the line segment A-A ' of corresponding diagram 1E paints.
Fig. 5 looks schematic diagram on the liquid crystal test box of second embodiment of the invention.
Fig. 6 is the liquid crystal test box diagrammatic cross-section that the line segment C-C ' of corresponding diagram 5 paints.
[primary clustering symbol description]
1000,1000A, 1000B: liquid crystal test box
100: first substrate
110: the first conductive patterns
112: the first operate portions
114: the first terminal portion
120: insulating pattern
122: insulation division
124: extension
130,130B: the second conductive pattern
132,132B: the second operate portions
134,134B: the second portion of terminal
200: second substrate
300: liquid crystal layer
H1, H2: opening
S: slit
R, R1, R2: test section
W1, W2: slit width
P1, P2: slit separation
Embodiment
For making object of the present invention, technical scheme and advantage clearer, below will, by specific embodiment and relevant drawings, the present invention be described in further detail.
the first embodiment
Figure 1A to Fig. 1 E looks schematic diagram on the manufacturing process of liquid crystal test box of first embodiment of the invention.Please refer to Figure 1A, first, provide first substrate 100.In the present embodiment, first substrate 100 is mainly for carrying the use of the assembly on first substrate 100, and its material can be glass, quartz, organic polymer or other material applicatory.
Please refer to Figure 1B, then, the first shielding (not illustrating) of take forms the first conductive pattern 110 as covering curtain on first substrate 100.In the present embodiment, the first conductive pattern 110 comprises the first operate portions 112 and the first terminal portion 114.First operate portions 112 of the present embodiment is to simulate fringe field to switch the shared electrode in (Fringe Field Switching, FFS) formula display panels.The first operate portions 112 can be complete conductive electrode.In other words, first operate portions 112 of the present embodiment does not have the opening of any sealing.The first terminal portion 114 of the present embodiment is connected with the first operate portions 112.The first terminal portion 114 is in order to test signal is passed to the first operate portions 112.In the present embodiment, the first conductive pattern 110 is for example transparent conductive patterns, its material comprises metal oxide, for example, be indium tin oxide, indium-zinc oxide, aluminium tin-oxide, aluminium zinc oxide, indium germanium zinc oxide or other suitable oxide or the above-mentioned at least stack layer of the two.
Then, rotation first substrate 100 and first shields one of them.In detail, can first substrate 100 and the first shielding keeping parallelism and distance between the two maintain fixing under, rotate individually first substrate 100 or the first shielding.Please refer to Fig. 1 C, at rotation first substrate 100, with the first shielding wherein after one, take this first shielding on the first conductive pattern 110, to form insulating pattern 120 as cover act.Insulating pattern 120 and the first conductive pattern 110 overlap and expose the first conductive pattern 110 partly.
For example, in the present embodiment, can be by substrate 100 with respect to the first shielding Rotate 180 degree.Then with this first shielding, be, that cover curtain forms insulating pattern 120.Because the first conductive pattern 110 and insulating pattern 120 are to form respectively with the first identical shielding, and the distance between the first shielding and first substrate 100 is identical during when formation the first conductive pattern 110 and at formation insulating pattern 120.Therefore the profile (form) of the insulating pattern 120 of the present embodiment and size (dimension) are identical in fact with profile and the size of the first conductive pattern 110.In the present embodiment, the material of insulating pattern 120 (for example: the stack layer of monox, silicon nitride, silicon oxynitride or above-mentioned at least two kinds of materials), organic material or above-mentioned combination can be inorganic material.
Furthermore, the insulating pattern 120 of the present embodiment comprises insulation division 122 and the extension 124 being connected with insulation division 122.The profile of insulation division 122 and size are identical in fact with profile and the size of the first operate portions 112, and the profile of extension 124 and size are identical in fact with profile and the size of the first terminal portion 114.In the present embodiment, because first substrate 100 when forming insulating pattern 120 is with respect to the first shielding Rotate 180 degree, therefore the first operate portions 112 overlaps with insulation division 122, and the first terminal portion 114 and extension 124 lay respectively at the relative both sides of the first operate portions 112.
Please refer to Fig. 1 D, then, on insulating pattern 120, form the second conductive pattern 130.The second conductive pattern 130 and the first conductive pattern 110 are electrically insulated.In the present embodiment, the second conductive pattern 130 comprises the second operate portions 132 and the second portion of terminal 134 being connected with the second operate portions 132.The second operate portions 132 and the first operate portions 112 and insulation division 122 overlap.The second operate portions 132 is electrically insulated by insulation division 122 and the first conductive pattern 110.The second portion of terminal 134 overlaps with the extension 124 of insulating pattern 120, and does not overlap with the first operate portions 112 and the first terminal portion 114, therefore the second portion of terminal 134 and the first conductive pattern 110 are electrically insulated.
Second operate portions 132 of the present embodiment is to simulate the pixel electrode that fringe field switches (Fringe Field Switching, FFS) display panels.In the present embodiment, the second operate portions 132 has a plurality of slit S, and these slits S exposes insulation division 122 and is positioned in the first operate portions 112.Second portion of terminal 134 of the present embodiment is in order to test signal is passed to the second operate portions 132.When test signal is inputted respectively the first operate portions 112 and the second operate portions 132 by the first terminal portion 114 and the second portion of terminal 134, the first operate portions 112 and 132 of the second operate portions can form an electric field, this electric field can drive liquid crystal, and then makes the liquid crystal test box of the present embodiment have the effect of assessing liquid crystal.
In addition, need special instruction, in Figure 1A to Fig. 1 E, only take first conductive pattern 110, an insulating pattern 120 or second conductive pattern 130 is example.Yet the present invention is not particularly limited the quantity of the conductive pattern 110, insulating pattern 120 and the second conductive pattern 130 that form on first substrate 100.As shown in Figures 2 and 3, in other embodiments, also can once form a plurality of the first conductive patterns 110, a plurality of insulating pattern 120 and a plurality of the second conductive pattern 130.
Please refer to Fig. 1 E, then, provide second substrate 200.Then, vertical (assemble) first substrate 100 of group and second substrate 200.Then, between first substrate 100 and second substrate 200, insert liquid crystal layer (not illustrating).In detail, in the present embodiment, can first organize vertical (assemble) first substrate 100 and second substrate 200, and then utilize vacuum to inject (injection) method injection liquid crystal layer between first substrate 100 and second substrate 200.In the present embodiment, more can be before the vertical first substrate 100 of group and second substrate 200 be inserted liquid crystal layer before, in first substrate 100 or second substrate 200 spread separation materials (spacer).Separation material (spacer) can maintain the gap (being cell gap) between first substrate 100 and second substrate 200.Yet, the invention is not restricted to described in epimere, in other embodiments, also can on first substrate 100 or second substrate 200, first splash into liquid crystal layer, group is found first substrate 100 and second substrate 200 (being One drop fill, ODF) more afterwards.
The manufacture method of the liquid crystal test box of the present embodiment can further comprise cutting second substrate 200.The mode of cutting second substrate 200 comprises break bar cutting or laser cutting.After cutting second substrate 200, the first terminal portion 114 and the second portion of terminal 134 are directly exposed to the open air in external environment, and allow user easily test signal be put on to the first terminal portion 114 and the second portion of terminal 134, and then drive the liquid crystal layer in liquid crystal test box.In this, just completed the liquid crystal test box 1000 of the present embodiment.
In the manufacture method of the liquid crystal test box of the present embodiment, the first conductive pattern and insulation course are to form respectively with same shielding, therefore the manufacture method of the liquid crystal test box of the present embodiment can reduce its required shielding quantity, and then save the required cost of assessment liquid crystal.
Fig. 1 E looks schematic diagram on the liquid crystal test box of first embodiment of the invention.Fig. 4 is the liquid crystal test box diagrammatic cross-section that the line segment A-A ' of corresponding diagram 1E paints.Referring to Fig. 1 E and Fig. 4, the liquid crystal test box 1000 of the present embodiment comprises that first substrate 100, the first conductive pattern 110, insulating pattern 120, the second conductive pattern 130, subtend are in second substrate 200 and the liquid crystal layer 300 between first substrate 100 and second substrate 200 of first substrate 100.
First conductive pattern 110 of the present embodiment is disposed at first substrate 100.On.First conductive pattern 110 of the present embodiment comprises the first operate portions 112 and the first terminal portion 114 being connected with the first operate portions 112.In the present embodiment, the first operate portions 112 is complete conductive electrode and does not have sealing opening.
The insulating pattern 120 of the present embodiment configures on first substrates 100 and overlaps with the first conductive pattern 110 and expose the first conductive pattern 110 partly, and wherein the profile of insulating pattern 120 and size are identical in fact with profile and the size of the first conductive pattern 110.In detail, insulating pattern 120 comprises insulation division 122 and the extension 124 being connected with insulation division 122.The profile of the first operate portions 112 and size are identical in fact with profile and the size of insulation division 122.The profile of the first terminal portion 114 and size are identical in fact with profile and the size of extension 124.The first operate portions 112 overlaps with insulation division 122, and the first terminal portion 114 and extension 124 lay respectively at the relative both sides of the first operate portions 112.In the present embodiment, the first conductive pattern 110 is between first substrate 100 and insulating pattern 120.
Second conductive pattern 130 of the present embodiment is disposed on first substrate 100 and with the first conductive pattern 110 and is electrically insulated.Insulating pattern 120 is between the first conductive pattern 110 and the second conductive pattern 130.The second conductive pattern 130 comprises the second operate portions 132 and the second portion of terminal 134 being connected with the second operate portions 132.The second operate portions 132 and the first operate portions 112 and insulation division 122 overlap.In the present embodiment, the second conductive pattern 130 has a plurality of slit S.Slit S exposes insulation division 122 and is positioned in the first operate portions 112.
The second substrate 200 of the present embodiment has at least two opening H1, H2.Opening H1, H2 expose respectively the first terminal portion 114 and the second terminal 134.Test signal can see through respectively the first terminal portion 114 and the second terminal 134 input the first operate portions 112 and the second operate portions 132, and drive the liquid crystal molecule in liquid crystal layer 300, and then allow user can measure the photoelectric characteristic of liquid crystal molecule, such as reaction time (response time), voltage to penetrance curve (V-T curve) etc.
The liquid crystal test box of the present embodiment can be used for assessing the characteristic of liquid crystal, and the shielding number using in its manufacturing process is few.Therefore liquid crystal test box 1000 costs of manufacture of the present embodiment are low, and can effectively reduce the required cost of assessment liquid crystal.
the second embodiment
The manufacturing process of the liquid crystal test box of the manufacturing process of the liquid crystal test box of the present embodiment and the first embodiment is almost identical.Both are only different part: the second conductive pattern 130B of the present embodiment is different from the second conductive pattern 130 of the first embodiment.Therefore, just no longer repeat the manufacturing process of the liquid crystal test box of the present embodiment.Below only with regard to the liquid crystal test box 1000B of the present embodiment and the structural different part of the liquid crystal test box 100 of the first embodiment, explain.
Fig. 5 looks schematic diagram on the liquid crystal test box of third embodiment of the invention.Fig. 6 is the liquid crystal test box diagrammatic cross-section that the line segment C-C ' of corresponding diagram 5 paints.Please refer to Fig. 5 and Fig. 6, the liquid crystal test box 1000B of the present embodiment and the liquid crystal test box 1000 of the first embodiment are similar.Only the second conductive pattern 130B of the present embodiment and the second conductive pattern 130 of the first embodiment have a little differently, below only with regard to this deviation, explain, and both just no longer repeat something in common.
Referring to Fig. 5 and Fig. 6, the liquid crystal test box 1000B of the present embodiment comprises that first substrate 100, the first conductive pattern 110, insulating pattern 120, the second conductive pattern 130B, subtend are in second substrate 200 and the liquid crystal layer 300 between first substrate 100 and second substrate 200 of first substrate 100.
First conductive pattern 110 of the present embodiment is disposed at first substrate 100.On.First conductive pattern 110 of the present embodiment comprises the first operate portions 112 and the first terminal portion 114 being connected with the first operate portions 112.In the present embodiment, the first operate portions 112 is complete conductive electrode and does not have sealing opening.
The insulating pattern 120 of the present embodiment configures on first substrates 100 and overlaps with the first conductive pattern 110 and expose the first conductive pattern 110 partly, and wherein the profile of insulating pattern 120 and size are identical in fact with profile and the size of the first conductive pattern 110.In detail, insulating pattern 120 comprises insulation division 122 and the extension 124 being connected with insulation division 122.The profile of the first operate portions 112 and size are identical in fact with profile and the size of insulation division 122.The profile of the first terminal portion 114 and size are identical in fact with profile and the size of extension 124.The first operate portions 112 overlaps with insulation division 122, and the first terminal portion 114 and extension 124 lay respectively at the relative both sides of the first operate portions 112.In the present embodiment, the first conductive pattern 110 is between first substrate 100 and insulating pattern 120.
The second conductive pattern 130B of the present embodiment is disposed on first substrate 100 and with the first conductive pattern 110 and is electrically insulated.Insulating pattern 120 is between the first conductive pattern 110 and the second conductive pattern 130B.The second conductive pattern 130B comprises the second operate portions 132B and the second portion of terminal 134B being connected with the second operate portions 132B.The second operate portions 132B and the first operate portions 112 and insulation division 124 overlap.In the present embodiment, the second conductive pattern 130 has a plurality of slit S.Slit S exposes insulation division 122 and is positioned in the first operate portions 112.
Different from the first embodiment, the second conductive pattern 130B of the present embodiment can be divided into a plurality of test section R.In the R of each test section, dispose at least two slit S, and the slit width that is positioned at one of them test section R is different from the width of slit that is positioned at another test section R.For example, be positioned at the slit width W1 of test section R1 different from the slit width W2 that is positioned at test section R2.In addition, in the present embodiment, the slit separation that is positioned at one of them test section R is different from the spacing of slit that is positioned at another test section R.For example, be positioned at the slit separation P1 of test section R1 different from the slit separation P2 that is positioned at test section R2.
For example, when in same liquid crystal test box, the test section of different experiment condition (different slit widths, slit separation or its combination) is organized in design more, can reduce different experimental conditions between the errors that cause because gap (cell gap) is different, and then improve the relatively correctness of the data between different experimental conditions.
The liquid crystal test box 1000B of the present embodiment and manufacture method thereof have and the similar effect of the first embodiment and advantage, in this, just no longer repeat.
In sum, in liquid crystal test box of the present invention and manufacture method thereof, a conductive pattern is to adopt identical light shield to be made respectively with insulating pattern.Therefore the required shielding quantity of liquid crystal test box of the present invention and manufacture method thereof is few, and then can effectively reduce the required cost of assessment liquid crystal.
Although the present invention discloses as above with embodiment; so it is not in order to limit the present invention; under any, in technical field, have and conventionally know the knowledgeable; without departing from the spirit and scope of the present invention; when doing a little change and retouching, therefore protection scope of the present invention is when being as the criterion depending on the accompanying claim person of defining.
Claims (11)
1. a manufacture method for liquid crystal test box, is characterized in that, comprising:
One first substrate is provided;
Take one first shielding as cover curtain, on this first substrate, form one first conductive pattern;
Rotate this first substrate and this first shielding one of them;
Take this first shielding is cover curtain, on this first conductive pattern, forms an insulating pattern, this insulating pattern and the overlapping of this first conductive pattern and expose this first conductive pattern of part;
On this insulating pattern, form one second conductive pattern, this second conductive pattern and this first conductive pattern are electrically insulated;
One second substrate is provided;
Vertical this first substrate of group and this second substrate; And
Between this first substrate and this second substrate, insert a liquid crystal layer;
Wherein the profile of this insulating pattern (form) and size (dimension) are identical in fact with profile and the size of this first conductive pattern;
Wherein this first conductive pattern comprises one first operate portions and the first terminal portion being connected with this first operate portions, this insulating pattern comprises an insulation division and the extension being connected with this insulation division, the profile of this first operate portions and size are identical in fact with profile and the size of this insulation division, the profile of this first terminal portion and size are identical in fact with profile and the size of this extension, wherein this first operate portions overlaps with this insulation division, and this first terminal portion and this extension are positioned at respectively the relative both sides of this first operate portions;
This first operate portions tool sealing opening not wherein, and this second conductive pattern has a plurality of slits, those slits expose this insulation division and are positioned in this first operate portions.
2. the manufacture method of liquid crystal test box according to claim 1, is characterized in that, wherein rotates one of them mode of this first substrate and this first shielding and comprises: make this first substrate with respect to this first shielding Rotate 180 degree.
3. the manufacture method of liquid crystal test box according to claim 1, it is characterized in that, wherein this second conductive pattern is divided into a plurality of test sections, respectively in this test section, dispose at least two slits, be positioned at one of them the width of those slits of those test sections different from the width of those slits that is positioned at another test section.
4. the manufacture method of liquid crystal test box according to claim 1, it is characterized in that, wherein this second conductive pattern is divided into a plurality of test sections, respectively in this test section, dispose at least two slits, be positioned at one of them the spacing (pitch) of those slits of those test sections different from the spacing of those slits that is positioned at another test section.
5. the manufacture method of liquid crystal test box according to claim 1, is characterized in that, more comprises this second substrate of cutting; Wherein this second conductive pattern comprises one second operate portions and one second portion of terminal being connected with this second operate portions, this second operate portions and this first operate portions and this insulation division overlap, and after this second substrate of cutting, this first terminal portion and this second portion of terminal are exposed.
6. a liquid crystal test box, comprising:
One first substrate;
One first conductive pattern, is disposed on this first substrate;
One insulating pattern, configures on this first substrate, and overlaps with this first conductive pattern and expose this first conductive pattern partly, and wherein the profile of this insulating pattern and size are identical in fact with profile and the size of this first conductive pattern;
One second conductive pattern, is disposed on this first substrate and with this first conductive pattern and is electrically insulated, and this insulating pattern is between this first conductive pattern and this second conductive pattern;
One second substrate, subtend is in this first substrate; And
One liquid crystal layer, between this first substrate and this second substrate; It is characterized in that:
Wherein this first conductive pattern comprises one first operate portions and the first terminal portion being connected with this first operate portions, this insulating pattern comprises an insulation division and the extension being connected with this insulation division, the profile of this first operate portions and size are identical in fact with profile and the size of this insulation division, the profile of this first terminal portion and size are identical in fact with profile and the size of this extension, wherein this first operate portions overlaps with this insulation division, and this first terminal portion and this extension are positioned at respectively the relative both sides of this first operate portions;
Wherein this first operate portions does not have sealing opening, and this second conductive pattern has a plurality of slits, and those slits expose this insulation division and are positioned in this first operate portions.
7. liquid crystal test box according to claim 6, is characterized in that, wherein this first conductive pattern is between this first substrate and this insulating pattern.
8. liquid crystal test box according to claim 6, is characterized in that, wherein this second conductive pattern is between this second substrate and this insulating pattern.
9. liquid crystal test box according to claim 6, it is characterized in that, wherein this second conductive pattern is divided into a plurality of test sections, respectively in this test section, dispose at least two slits, be positioned at one of them the width of those slits of those test sections different from the width of those slits that is positioned at another test section.
10. liquid crystal test box according to claim 6, it is characterized in that, wherein this second conductive pattern is divided into a plurality of test sections, respectively in this test section, dispose at least two slits, be positioned at one of them the spacing (pitch) of those slits of those test sections different from the spacing of those slits that is positioned at another test section.
11. liquid crystal test boxes according to claim 6, it is characterized in that, wherein this second conductive pattern comprises one second operate portions and one second portion of terminal being connected with this second operate portions, this second operate portions and this first operate portions and this insulation division overlap, this second substrate has at least two openings, and those openings expose respectively this first terminal portion and this second portion of terminal.
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| JP3799287B2 (en) * | 2002-04-03 | 2006-07-19 | Ｎｅｃ液晶テクノロジー株式会社 | Evaluation method of liquid crystal display device |
| KR100707034B1 (en) * | 2005-02-28 | 2007-04-11 | 비오이 하이디스 테크놀로지 주식회사 | Method for forming line for testing array substrate in fringe field switching mode LCD |
| JP4356757B2 (en) * | 2007-03-13 | 2009-11-04 | セイコーエプソン株式会社 | Liquid crystal device, electronic device and position specifying method |
| JP2010054551A (en) * | 2008-08-26 | 2010-03-11 | Epson Imaging Devices Corp | Display device and inspection probe for the display device |
| TWI329219B (en) * | 2008-10-07 | 2010-08-21 | Au Optronics Corp | Thin film transistor array substrate |
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