CN102221753B - 一种像素阵列的检测方法及检测装置 - Google Patents
一种像素阵列的检测方法及检测装置 Download PDFInfo
- Publication number
- CN102221753B CN102221753B CN2011101495008A CN201110149500A CN102221753B CN 102221753 B CN102221753 B CN 102221753B CN 2011101495008 A CN2011101495008 A CN 2011101495008A CN 201110149500 A CN201110149500 A CN 201110149500A CN 102221753 B CN102221753 B CN 102221753B
- Authority
- CN
- China
- Prior art keywords
- pixel
- brightness value
- pixel cell
- module
- luminance threshold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
Description
Claims (8)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011101495008A CN102221753B (zh) | 2011-06-06 | 2011-06-06 | 一种像素阵列的检测方法及检测装置 |
US13/265,870 US20120310575A1 (en) | 2011-06-06 | 2011-06-19 | Inspection Method for Pixel Array and Inspection Apparatus Thereof |
PCT/CN2011/075907 WO2012167449A1 (zh) | 2011-06-06 | 2011-06-19 | 一种像素阵列的检测方法及检测装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011101495008A CN102221753B (zh) | 2011-06-06 | 2011-06-06 | 一种像素阵列的检测方法及检测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102221753A CN102221753A (zh) | 2011-10-19 |
CN102221753B true CN102221753B (zh) | 2013-04-24 |
Family
ID=44778344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011101495008A Expired - Fee Related CN102221753B (zh) | 2011-06-06 | 2011-06-06 | 一种像素阵列的检测方法及检测装置 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN102221753B (zh) |
WO (1) | WO2012167449A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105301429B (zh) * | 2015-11-05 | 2018-05-29 | 深圳市华星光电技术有限公司 | 自电容触控面板的缺陷检测装置与检测方法 |
CN109307587B (zh) * | 2017-07-26 | 2020-01-31 | 京东方科技集团股份有限公司 | 显示面板检测方法、装置及*** |
CN109583573A (zh) * | 2018-12-13 | 2019-04-05 | 银河水滴科技(北京)有限公司 | 一种轨道扣件的零件缺失检测方法及装置 |
CN110187529A (zh) * | 2019-05-22 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | 显示面板处理方法和显示面板处理*** |
CN114428412A (zh) * | 2020-10-29 | 2022-05-03 | 中强光电股份有限公司 | 影像辨识装置以及影像辨识方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1536349A (zh) * | 2002-11-01 | 2004-10-13 | 光子动力学公司 | 用于检查具有图样的平的介质的方法和装置 |
CN1635405A (zh) * | 2003-12-29 | 2005-07-06 | 财团法人工业技术研究院 | 以喷墨打印修补元件的方法 |
WO2008126987A1 (en) * | 2007-04-17 | 2008-10-23 | Okins Electronics Co., Ltd. | Electro optical detector |
CN101655614A (zh) * | 2008-08-19 | 2010-02-24 | 京东方科技集团股份有限公司 | 液晶显示面板云纹缺陷的检测方法和检测装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006329928A (ja) * | 2005-05-30 | 2006-12-07 | Shimadzu Corp | Tftアレイ検査装置 |
JP2007156127A (ja) * | 2005-12-06 | 2007-06-21 | Seiko Epson Corp | 電気光学装置の検査方法 |
US20090040343A1 (en) * | 2007-08-06 | 2009-02-12 | Mediatek Inc. | Methods and apparatuses for defective pixel detection and correction |
CN101661169B (zh) * | 2008-08-27 | 2011-12-28 | 北京京东方光电科技有限公司 | 液晶显示器亮点或暗点检测方法及其装置 |
CN102081244A (zh) * | 2011-03-01 | 2011-06-01 | 友达光电股份有限公司 | 一种检测像素的方法 |
-
2011
- 2011-06-06 CN CN2011101495008A patent/CN102221753B/zh not_active Expired - Fee Related
- 2011-06-19 WO PCT/CN2011/075907 patent/WO2012167449A1/zh active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1536349A (zh) * | 2002-11-01 | 2004-10-13 | 光子动力学公司 | 用于检查具有图样的平的介质的方法和装置 |
CN1635405A (zh) * | 2003-12-29 | 2005-07-06 | 财团法人工业技术研究院 | 以喷墨打印修补元件的方法 |
WO2008126987A1 (en) * | 2007-04-17 | 2008-10-23 | Okins Electronics Co., Ltd. | Electro optical detector |
CN101655614A (zh) * | 2008-08-19 | 2010-02-24 | 京东方科技集团股份有限公司 | 液晶显示面板云纹缺陷的检测方法和检测装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2012167449A1 (zh) | 2012-12-13 |
CN102221753A (zh) | 2011-10-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102221753B (zh) | 一种像素阵列的检测方法及检测装置 | |
US20130342229A1 (en) | Liquid crystal display and dead pixel test circuit and method for liquid crystal display | |
US20180330649A1 (en) | Detection Method and Detection Device of Display Panel | |
CN101661169B (zh) | 液晶显示器亮点或暗点检测方法及其装置 | |
CN101501516B (zh) | 根据光电导通的晶体管阵列电子测试 | |
US10373538B2 (en) | Judging method of array test reliability, testing method and device of organic light emitting backplane | |
CN102736341B (zh) | 一种液晶显示面板及其修复方法 | |
US6930505B2 (en) | Inspection method and apparatus for EL array substrate | |
CN102540508B (zh) | 液晶显示装置的线路检测结构及检测方法 | |
CN109036236B (zh) | 阵列基板检测方法及检测装置 | |
CN107367654A (zh) | 一种超级电容器老化测试方法 | |
CN105572520A (zh) | 一种超级电容器的测试工艺 | |
CN103308817A (zh) | 阵列基板线路检测装置及检测方法 | |
CN1996032A (zh) | 布线不良检查方法以及布线不良检查装置 | |
JP2005043783A (ja) | 液晶表示パネルの検査装置及び液晶パネルの検査方法 | |
CN107705737A (zh) | 短路不良的检测方法和装置 | |
CN102646382A (zh) | 液晶显示模组差分信号接收终端异常的检测方法及装置 | |
US10043426B2 (en) | Liquid crystal panels, TFT substrates, and the detection methods thereof | |
KR102250982B1 (ko) | 디스플레이 패널의 전기 검사장치 및 방법 | |
JPH0272392A (ja) | アクティブマトリクス型表示装置の検査及び修正方法 | |
CN102354534A (zh) | 检测存储器中连接缺陷的方法与可检测连接缺陷的存储器 | |
CN101843090A (zh) | 数字图像传感器中的白/黑像素校正 | |
CN101303499A (zh) | 液晶显示面板装置及其测试方法 | |
CN101295005B (zh) | 一种有机电致发光器件的检测装置及检测方法 | |
KR20080000313A (ko) | 액정표시장치 및 그의 리페어 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Method and device for detecting pixel array Effective date of registration: 20190426 Granted publication date: 20130424 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019440020032 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20201016 Granted publication date: 20130424 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: Shenzhen China Star Optoelectronics Technology Co.,Ltd. Registration number: 2019440020032 |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130424 |