CN102200565A - 一种芯片测试装置 - Google Patents
一种芯片测试装置 Download PDFInfo
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- CN102200565A CN102200565A CN201010129632XA CN201010129632A CN102200565A CN 102200565 A CN102200565 A CN 102200565A CN 201010129632X A CN201010129632X A CN 201010129632XA CN 201010129632 A CN201010129632 A CN 201010129632A CN 102200565 A CN102200565 A CN 102200565A
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- 238000012360 testing method Methods 0.000 title claims abstract description 111
- 230000000052 comparative effect Effects 0.000 claims description 10
- 230000007547 defect Effects 0.000 abstract description 2
- 238000004904 shortening Methods 0.000 abstract 1
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- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
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CN201010129632.XA CN102200565B (zh) | 2010-03-23 | 2010-03-23 | 一种芯片测试装置 |
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CN201010129632.XA CN102200565B (zh) | 2010-03-23 | 2010-03-23 | 一种芯片测试装置 |
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CN102200565A true CN102200565A (zh) | 2011-09-28 |
CN102200565B CN102200565B (zh) | 2015-08-12 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103051322A (zh) * | 2012-12-03 | 2013-04-17 | 广州润芯信息技术有限公司 | 一种芯片管脚复用电路 |
CN105929818A (zh) * | 2016-07-05 | 2016-09-07 | 深圳市博巨兴实业发展有限公司 | 一种微控制器soc内建io映射测试装置 |
CN111435145A (zh) * | 2019-01-11 | 2020-07-21 | 北京确安科技股份有限公司 | 一种针对智能卡芯片的测试*** |
CN111736062A (zh) * | 2020-07-27 | 2020-10-02 | 上海兆芯集成电路有限公司 | 测试***以及测试方法 |
CN112182998A (zh) * | 2020-07-29 | 2021-01-05 | 北京智芯微电子科技有限公司 | 面向对象的芯片级端口互连电路及其端口互连方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6633838B1 (en) * | 1999-11-04 | 2003-10-14 | International Business Machines Corporation | Multi-state logic analyzer integral to a microprocessor |
US6859897B2 (en) * | 2000-03-02 | 2005-02-22 | Texas Instruments Incorporated | Range based detection of memory access |
CN101147077A (zh) * | 2005-03-22 | 2008-03-19 | 先进微装置公司 | 于多核心集成电路中的同步核心测试 |
JP2008096422A (ja) * | 2006-10-05 | 2008-04-24 | Princeton Technology Corp | チップテスト装置とシステム |
CN101303392A (zh) * | 2008-06-04 | 2008-11-12 | 北京中星微电子有限公司 | 一种数字逻辑芯片及其可测试设计的方法 |
US20090193303A1 (en) * | 2008-01-29 | 2009-07-30 | Giles Grady L | Test access mechanism for multi-core processor or other integrated circuit |
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2010
- 2010-03-23 CN CN201010129632.XA patent/CN102200565B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6633838B1 (en) * | 1999-11-04 | 2003-10-14 | International Business Machines Corporation | Multi-state logic analyzer integral to a microprocessor |
US6859897B2 (en) * | 2000-03-02 | 2005-02-22 | Texas Instruments Incorporated | Range based detection of memory access |
CN101147077A (zh) * | 2005-03-22 | 2008-03-19 | 先进微装置公司 | 于多核心集成电路中的同步核心测试 |
JP2008096422A (ja) * | 2006-10-05 | 2008-04-24 | Princeton Technology Corp | チップテスト装置とシステム |
US20090193303A1 (en) * | 2008-01-29 | 2009-07-30 | Giles Grady L | Test access mechanism for multi-core processor or other integrated circuit |
CN101303392A (zh) * | 2008-06-04 | 2008-11-12 | 北京中星微电子有限公司 | 一种数字逻辑芯片及其可测试设计的方法 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103051322A (zh) * | 2012-12-03 | 2013-04-17 | 广州润芯信息技术有限公司 | 一种芯片管脚复用电路 |
CN103051322B (zh) * | 2012-12-03 | 2015-12-23 | 广州润芯信息技术有限公司 | 一种芯片管脚复用电路 |
CN105929818A (zh) * | 2016-07-05 | 2016-09-07 | 深圳市博巨兴实业发展有限公司 | 一种微控制器soc内建io映射测试装置 |
CN111435145A (zh) * | 2019-01-11 | 2020-07-21 | 北京确安科技股份有限公司 | 一种针对智能卡芯片的测试*** |
CN111736062A (zh) * | 2020-07-27 | 2020-10-02 | 上海兆芯集成电路有限公司 | 测试***以及测试方法 |
CN112182998A (zh) * | 2020-07-29 | 2021-01-05 | 北京智芯微电子科技有限公司 | 面向对象的芯片级端口互连电路及其端口互连方法 |
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CN102200565B (zh) | 2015-08-12 |
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Effective date of registration: 20170505 Address after: 401336 Chongqing Nan'an District Tea Garden Road, No. 8, software Incubation Park, building 1 Patentee after: Keen (Chongqing) Microelectronics Technology Co.,Ltd. Address before: 400065 Chongqing Nan'an District huangjuezhen pass Chongqing University of Posts and Telecommunications shineford building 12 Patentee before: CHONGQING CYIT COMMUNICATION TECHNOLOGIES Co.,Ltd. |
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Effective date of registration: 20181107 Address after: 201203 Building 1, exhibition hall, 2288 lane, 2288 Chong, road, Zhangjiang hi tech park, Shanghai Patentee after: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. Address before: 401336 Chongqing Nan'an District tea garden Jade Road 8 software Incubation Park 1 floor Patentee before: Keen (Chongqing) Microelectronics Technology Co.,Ltd. |
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Effective date of registration: 20190325 Address after: 361006 Xiamen Free Trade Pilot Area, Xiamen, Fujian Province, Unit X, 8th Floor, Unit 05, Building D, Xiamen International Shipping Center, 97 Xiangyu Road, Xiamen Section Patentee after: Xinxin Finance Leasing (Xiamen) Co.,Ltd. Address before: 201203 Building 1, exhibition hall, 2288 lane, 2288 Chong, road, Zhangjiang hi tech park, Shanghai Patentee before: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. |
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Application publication date: 20110928 Assignee: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. Assignor: Xinxin Finance Leasing (Xiamen) Co.,Ltd. Contract record no.: X2021110000009 Denomination of invention: A chip test device Granted publication date: 20150812 License type: Exclusive License Record date: 20210317 |
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Effective date of registration: 20221014 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech park, Spreadtrum Center Building 1, Lane 2288 Patentee after: SPREADTRUM COMMUNICATIONS (SHANGHAI) Co.,Ltd. Address before: 361006 Xiamen Free Trade Pilot Area, Xiamen, Fujian Province, Unit X, 8th Floor, Unit 05, Building D, Xiamen International Shipping Center, 97 Xiangyu Road, Xiamen Section Patentee before: Xinxin Finance Leasing (Xiamen) Co.,Ltd. |