CN102194794B - 等离子体损伤检测结构、其检测方法及其形成方法 - Google Patents
等离子体损伤检测结构、其检测方法及其形成方法 Download PDFInfo
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- CN102194794B CN102194794B CN2010101188274A CN201010118827A CN102194794B CN 102194794 B CN102194794 B CN 102194794B CN 2010101188274 A CN2010101188274 A CN 2010101188274A CN 201010118827 A CN201010118827 A CN 201010118827A CN 102194794 B CN102194794 B CN 102194794B
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- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/266—Bombardment with radiation with high-energy radiation producing ion implantation using masks
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- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
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- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
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- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/401—Multistep manufacturing processes
- H01L29/4011—Multistep manufacturing processes for data storage electrodes
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
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- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66825—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a floating gate
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
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- Automation & Control Theory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Plasma Technology (AREA)
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Abstract
Description
Claims (17)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010101188274A CN102194794B (zh) | 2010-03-05 | 2010-03-05 | 等离子体损伤检测结构、其检测方法及其形成方法 |
US13/035,895 US8796685B2 (en) | 2010-03-05 | 2011-02-25 | On-chip plasma charging sensor |
US14/323,749 US9299622B2 (en) | 2010-03-05 | 2014-07-03 | On-chip plasma charging sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN2010101188274A CN102194794B (zh) | 2010-03-05 | 2010-03-05 | 等离子体损伤检测结构、其检测方法及其形成方法 |
Publications (2)
Publication Number | Publication Date |
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CN102194794A CN102194794A (zh) | 2011-09-21 |
CN102194794B true CN102194794B (zh) | 2013-09-11 |
Family
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CN2010101188274A Active CN102194794B (zh) | 2010-03-05 | 2010-03-05 | 等离子体损伤检测结构、其检测方法及其形成方法 |
Country Status (2)
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US (2) | US8796685B2 (zh) |
CN (1) | CN102194794B (zh) |
Families Citing this family (16)
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US8194371B2 (en) * | 2009-04-07 | 2012-06-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrated circuit protection device |
CN102194794B (zh) | 2010-03-05 | 2013-09-11 | 中芯国际集成电路制造(上海)有限公司 | 等离子体损伤检测结构、其检测方法及其形成方法 |
CN103094144B (zh) * | 2011-10-31 | 2015-11-25 | 无锡华润上华科技有限公司 | 一种用于预估mos管的阈值电压的方法 |
CN102800658B (zh) * | 2012-08-29 | 2016-12-07 | 上海华虹宏力半导体制造有限公司 | 测试键结构以及晶圆测试方法 |
CN104091769B (zh) * | 2014-07-25 | 2017-03-01 | 上海华力微电子有限公司 | 一种通孔刻蚀不足的检测方法 |
US9916413B2 (en) * | 2014-12-22 | 2018-03-13 | Wallace W. Lin | Transistor plasma charging metal design rule generator |
CN105161524A (zh) * | 2015-07-21 | 2015-12-16 | 北京大学 | 一种抗单粒子辐射的场效应晶体管及其制备方法 |
DE102016107953A1 (de) * | 2016-04-28 | 2017-11-02 | Infineon Technologies Ag | Halbleiterbauelemente und Verfahren zum Testen einer Gate-Isolierung einer Transistorstruktur |
DE102017127641A1 (de) | 2016-12-15 | 2018-06-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Verfahren zum Überbrückungstesten in benachbarten Halbleitervorrichtungen und Testaufbau |
US10276458B2 (en) | 2016-12-15 | 2019-04-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for testing bridging in adjacent semiconductor devices and test structure |
US10236367B2 (en) | 2017-07-06 | 2019-03-19 | Globalfoundries Inc. | Bipolar semiconductor device with silicon alloy region in silicon well and method for making |
US10418356B2 (en) * | 2017-12-21 | 2019-09-17 | Nanya Technology Corporation | Diode structure and electrostatic discharge protection device including the same |
CN108922857B (zh) * | 2018-09-11 | 2023-12-08 | 长江存储科技有限责任公司 | 界面缺陷表征结构及界面缺陷检测装置 |
US10825744B2 (en) * | 2018-09-20 | 2020-11-03 | Nanya Technology Corporation | Semiconductor structure and manufacturing method thereof |
CN110850263B (zh) * | 2019-11-18 | 2020-10-09 | 西北核技术研究院 | 基于栅控lpnp晶体管进行质子位移损伤等效的方法 |
CN113497002B (zh) * | 2020-04-07 | 2024-02-06 | 长鑫存储技术有限公司 | Pid测试结构及半导体测试结构 |
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2010
- 2010-03-05 CN CN2010101188274A patent/CN102194794B/zh active Active
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2011
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2014
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Also Published As
Publication number | Publication date |
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US9299622B2 (en) | 2016-03-29 |
CN102194794A (zh) | 2011-09-21 |
US20150079706A1 (en) | 2015-03-19 |
US8796685B2 (en) | 2014-08-05 |
US20110215393A1 (en) | 2011-09-08 |
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