CN102148721B - Circuit detection method and device - Google Patents
Circuit detection method and device Download PDFInfo
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- CN102148721B CN102148721B CN201110023455.1A CN201110023455A CN102148721B CN 102148721 B CN102148721 B CN 102148721B CN 201110023455 A CN201110023455 A CN 201110023455A CN 102148721 B CN102148721 B CN 102148721B
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Abstract
The invention discloses a circuit detection method. The method comprises the following steps of: sending a control signal to a digital front-end (DFE) of an XDSL (X Digital Subscribe Line) circuit board so that the DFE sends a test signal; acquiring a response signal received by the DFE, wherein the response signal is response to the test signal by a hybrid circuit in the XDSL circuit board; judging whether a failure device exists in the hybrid circuit according to the response signal and acquiring the corresponding relation between the failure response signal and the device if the failure device exists in the hybrid circuit; and confirming the failure device according to the response signal and the corresponding relation between the response signal and the device. The embodiment of the invention ensures that the DFE sends the test signal and acquires the response signal of the hybrid circuit to the test signal, received by the DFE, and realizes that the hybrid circuit can be detected only through the original device of the XDSL circuit board without adopting an ICT (Integrated Circuit Tester). When the failure device exists in the hybrid circuit, the failure device is confirmed through the corresponding relation between the failure response signal and the device so as to accurately position the failure device and further improve the detection efficiency of the XDSL circuit board.
Description
Technical field
The present invention relates to field communication technical field, particularly a kind of method and apparatus of electric circuit inspection.
Background technology
DSL(Digital Subscriber Line, Digital Subscriber Line) be a kind of high speed transmission technology of carrying out transfer of data by twisted pair telephone, DSL is of a great variety, as ADSL(Asymmetric Digital Subscriber Line, ADSL (Asymmetric Digital Subscriber Line)), RADSL(Rate Adaptive DSL, rate adaptation DSL), etc., all kinds DSL is generically and collectively referred to as XDSL.
Hybrid Circuit(hybrid circuit on each XDSL circuit board) part contains a large amount of small-sized separating components, and these small-sized separating components in process of production, are understood probabilistic problem that occur rosin joint or connect tin; In actual use, because dust stratification can probabilistic open circuit problem that occurs that device short circuit problem or other reasons cause.Normal in order to guarantee the Hybrid Circuit part of XDSL circuit board, need to do fault detect and problem is accurately located to Hybrid Circuit.
In prior art, by using ICT(In Circuit Tester, tester) determine the concrete defective device of Hybrid Circuit.Its main operation principle is to apply signal by the Hybrid Circuit to XDSL circuit board, and obtains feedback signal, by feedback signal, determines concrete fault-signal.
Inventor finds that in realizing process of the present invention prior art exists following defect:
Need to purchase ICT tester, and ICT tester expense is higher, has increased testing cost.
Summary of the invention
In order to reduce testing cost, the embodiment of the present invention provides a kind of method of electric circuit inspection, and described method comprises:
The digital leading portion DFE that sends a control signal to XDSL circuit board, makes described DFE send test signal;
Obtain the response signal that described DFE receives, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
According to described response signal, judge and in Hybrid Circuit, whether have defective device, if exist, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device;
Wherein, the corresponding relation of described failure response signal and device comprises the label of device and the corresponding relation of failure response signal, wherein, device of the same type is carried out to the label that label obtains device, and set up the label of described device and the corresponding relation of failure response signal.
The embodiment of the present invention provides a kind of device of electric circuit inspection, and described device comprises:
Test signal sending module, for sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal;
Response signal receiver module, the response signal receiving for obtaining described DFE, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
Defective device determination module, be used for according to described response signal, judge and in Hybrid Circuit, whether have defective device, if existed, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device;
Wherein, the corresponding relation of described failure response signal and device comprises the label of device and the corresponding relation of failure response signal, wherein, device of the same type is carried out to the label that label obtains device, and set up the label of described device and the corresponding relation of failure response signal.
The embodiment of the present invention, by sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal; And obtain Hybrid Circuit that described DFE the receives response signal to described test signal, and realized without adopting ICT tester, only by the own device of XDSL circuit board, can detect Hybrid Circuit; When there is defective device in Hybrid Circuit, by the corresponding relation of response signal, described failure response signal and device, determine described defective device, realize the accurate location to defective device, and then improved the detection efficiency of XDSL circuit board.
Accompanying drawing explanation
Fig. 1 is the method flow diagram of the electric circuit inspection that provides of the embodiment of the present invention 1;
Fig. 2 is the method flow diagram of the electric circuit inspection that provides of the embodiment of the present invention 2;
Fig. 3 is the XDSL circuit board basic framework figure that the embodiment of the present invention 2 provides;
Fig. 4 is the apparatus structure schematic diagram of the electric circuit inspection that provides of the embodiment of the present invention 3;
Fig. 5 is the apparatus structure schematic diagram of the electric circuit inspection that provides of the embodiment of the present invention 4.
Embodiment
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with accompanying drawing, embodiment of the present invention is described further in detail.
Embodiment 1
As shown in Figure 1, the embodiment of the present invention provides a kind of method of electric circuit inspection, and described method comprises:
S101: send a control signal to the digital leading portion DFE of XDSL circuit board, make described DFE send test signal;
S102: obtain the response signal that described DFE receives, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
S102: according to described response signal, judge and in Hybrid Circuit, whether have defective device, if exist, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device.
It should be noted that, in the present embodiment, the executive agent of each step can be the module that can realize function described in each step, and described module can be integrated in XDSL, can be also the individuality separated with XDSL; Described executive agent can also be to be applied to the software that existing programming language is realized, and it is upper or load on XDSL independently in functional module that this software can directly load on this XDSL.
The embodiment of the present invention, by sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal; And obtain Hybrid Circuit that described DFE the receives response signal to described test signal, and realized without adopting ICT tester, only by the own device of XDSL circuit board, can detect Hybrid Circuit; When there is defective device in Hybrid Circuit, by the corresponding relation of response signal, described failure response signal and device, determine described defective device, realize the accurate location to defective device, and then improved the detection efficiency of XDSL circuit board.
Embodiment 2
As shown in Figure 2, the embodiment of the present invention provides a kind of method of electric circuit inspection, and described method comprises:
S201: send a control signal to the digital leading portion DFE of XDSL circuit board, make described DFE send test signal;
Concrete, XDSL circuit board basic framework figure as shown in Figure 3, mainly comprises Logic chip, digital leading portion DFE, simulation leading portion AFE, line driver LD and hybrid circuit Hybrid Circuit.Its groundwork principle is by data being sent to logic chip Logic, in Logic, data being processed, and transmits DFE after making it to change into the form that DFE can identify; DFE carries out digital information modulation treatment and the signal after modulation treatment is sent to AFE; AFE is to send LD chip to after analog signal by digital signal transition; The signal that LD sends AFE here is delivered to Hybrid Circuit after amplifying, and finally outputs on subscribers feeder.When DFE is controlled send test massage after, this test signal is sent to Hybrid Circuit through said process.DFE in existing XDSL circuit board all can be autonomous transmitted signal.
S202: obtain the response signal that described DFE receives, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
Concrete, Hybrid Circuit receives after test signal, sends the response signal for this test signal, and this response signal is sent to AFE, AFE is that digital signal is given DFE by analog-signal transitions.
S203: obtain normal response signal;
Concrete, normal response signal can be write in the firmware firmware of XDSL circuit board in advance.Wherein, described normal response signal is when in described Hybrid Circuit, each device works, the response signal of described Hybrid Circuit to described test signal.Can be drawn based on experience value by those skilled in the art.By access firmware, obtain described normal response signal.
S204: the variance of calculating described response signal and described normal response signal;
Concrete, from the definition of variance, can measure the departure degree between response signal and normal response signal by variance,, by the variance of calculated response signal and described normal response signal, determine whether this response signal is normal response signal.
S205: judge whether described variance yields is greater than default threshold value, if so, have defective device in described Hybrid Circuit.
Concrete, when the variance yields of response signal and normal response signal is greater than default threshold value, represent that response signal and normal response deviation of signal are larger, in circuit, there is defective device.
For example, as shown in Table 1, wherein, the data sample that comprises response signal A, normal response signal B, by calculating the squared difference of A and B, and calculate thus the variance yields of A and B, and reach a conclusion with default threshold comparison: 1021040 are greater than givenly 120000, in Hybrid Circuit, have defective device.
Table one:
S206: the variance of calculating failure response signal in the corresponding relation of described response signal and failure response signal and device;
Optionally, failure response signal can identify by corresponding table with the corresponding relation of device, further alternative, because Hybrid Circuit may exist multiple device of the same type, but because its position in Hybrid Circuit is different, the response signal producing during its fault is also different.Therefore, can carry out label by the device to of the same type, and set up the corresponding relation of its failure response signal, thus while realizing current fault to its precise positioning, for example, the mapping table of this failure response signal and device can be as shown in Table 1:
Further alternative, the corresponding relation of failure response signal and device can be stored in the firmware firmware of XDSL circuit board, by access firmware, obtain the corresponding relation of this signal and device.
S207: obtain the failure response signal with described response signal variance yields minimum;
Concrete, the failure response signal of variance and response signal variance yields minimum is and the immediate failure response signal of described response signal.
S208: inquire about the corresponding relation of described failure response signal and device, obtain the device corresponding to failure response signal of described variance yields minimum, the device of described correspondence is described defective device.
For example, as shown in Table 1, wherein, comprise response signal A, Fisrt fault response signal C, the data sample of the second failure response signal C, by calculating respectively A and C, the squared difference of D, and calculate thus A and C, the variance yields of D, the failure response signal of known and described response signal variance yields minimum is C, and by the corresponding relation of inquiry failure response signal and device, show that the defective device corresponding with failure response signal C is 27nF electric capacity on Hybrid Circuit circuit, further determining and having defective device in Hybrid Circuit is 27nF electric capacity.
Table two:
Concrete, while breaking down due to different components, can produce different response signals, different response signals has represented the operating state of different devices.When the corresponding relation of failure response signal and device is stored in the firmware firmware of XDSL circuit board, by access firmware, obtain the corresponding relation of failure response signal and device, and obtain the device corresponding to failure response signal of variance yields minimum, thereby determine defective device.
Optionally, also can pass through setting program, response signal is sent to Firmware, makes the normal response signal of Firmware Auto-matching and its storage and/or the corresponding relation of failure response signal and device, and point out whether Hybrid Circuit circuit part has fault and concrete defective device.
It should be noted that, in the present embodiment, the executive agent of each step can be the module that can realize function described in each step, and described module can be integrated in XDSL, can be also the individuality separated with XDSL; Described executive agent can also be to be applied to the software that existing programming language is realized, and it is upper or load on XDSL independently in functional module that this software can directly load on this XDSL.
The embodiment of the present invention, by sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal; And obtain Hybrid Circuit that described DFE the receives response signal to described test signal, and realized without adopting ICT tester, only by the own device of XDSL circuit board, can detect Hybrid Circuit; When there is defective device in Hybrid Circuit, by the corresponding relation of response signal, described failure response signal and device, determine described defective device, realize the accurate location to defective device, and then improved the detection efficiency of xDSL circuit board.
Embodiment 3
As shown in Figure 4, the embodiment of the present invention provides a kind of device of electric circuit inspection, comprising:
Test signal sending module 301, for sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal;
Response signal receiver module 302, the response signal receiving for obtaining described DFE, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
Defective device determination module 303, be used for according to described response signal, judge and in Hybrid Circuit, whether have defective device, if existed, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device.
The embodiment of the present invention, by sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal; And obtain Hybrid Circuit that described DFE the receives response signal to described test signal, and realized without adopting ICT tester, only by the own device of XDSL circuit board, can detect Hybrid Circuit; When there is defective device in Hybrid Circuit, by the corresponding relation of response signal, described failure response signal and device, determine described defective device, realize the accurate location to defective device, and then improved the detection efficiency of XDSL circuit board.
Embodiment 4
As shown in Figure 5, the embodiment of the present invention provides a kind of device of electric circuit inspection, comprising: test signal sending module 301, response signal receiver module 302 and defective device determination module 303;
Wherein, described defective device determination module 303 specifically comprises:
Normal response signal acquiring unit 3031, for obtaining normal response signal, described normal response signal is when in described Hybrid Circuit, each device works, the response signal of described Hybrid Circuit to described test signal;
First variance computing unit 3032, for calculating the variance of described response signal and described normal response signal;
, for judging whether described variance yields is greater than default threshold value, if so, in described Hybrid Circuit, there is defective device in defective device determining unit 3033.
Described defective device determination module 303 specifically also comprises:
Second variance computing unit 3034, for calculating the variance of described response signal and described corresponding relation failure response signal;
The minimum failure response signal acquiring unit 3035 of variance, for obtaining the failure response signal with described response signal variance yields minimum;
Defective device determining unit 3036, for inquiring about the corresponding relation of described failure response signal and device, obtains the device corresponding to failure response signal of described variance yields minimum, and the device of described correspondence is described defective device.
Described device also comprises:
Default response signal memory module 304, for by normal response signal, and/or the corresponding relation of failure response signal and device writes in the firmware firmware of XDSL circuit board.
Accordingly, when described device comprises well default response signal memory module 304, described defective device determination module 303 specifically comprises:
Corresponding relation acquiring unit 3037, the described normal response signal of storing for obtaining described firmware, and/or obtain the corresponding relation of failure response signal and device.
The embodiment of the present invention, by sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal; And obtain Hybrid Circuit that described DFE the receives response signal to described test signal, and realized without adopting ICT tester, only by the own device of XDSL circuit board, can detect Hybrid Circuit; When there is defective device in Hybrid Circuit, by the corresponding relation of response signal, described failure response signal and device, determine described defective device, realize the accurate location to defective device, and then improved the detection efficiency of xDSL circuit board.
All or part of content in the technical scheme that above embodiment provides can realize by software programming, and its software program is stored in the storage medium can read, storage medium for example: the hard disk in computer, CD or floppy disk.
The foregoing is only preferred embodiment of the present invention, in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (10)
1. a method for electric circuit inspection, is characterized in that, described method comprises:
The digital leading portion DFE that sends a control signal to XDSL circuit board, makes described DFE send test signal;
Obtain the response signal that described DFE receives, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
According to described response signal, judge and in Hybrid Circuit, whether have defective device, if exist, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device;
Wherein, the corresponding relation of described failure response signal and device comprises the label of device and the corresponding relation of failure response signal, wherein, device of the same type is carried out to the label that label obtains device, and set up the label of described device and the corresponding relation of failure response signal.
2. method according to claim 1, is characterized in that, describedly according to described response signal, judges in described Hybrid Circuit whether exist defective device specifically to comprise:
Obtain normal response signal, described normal response signal is when in described Hybrid Circuit, each device works, the response signal of described Hybrid Circuit to described test signal;
Calculate the variance of described response signal and described normal response signal;
Judge whether described variance yields is greater than default threshold value, if so, in described Hybrid Circuit, have defective device.
3. according to the method described in 1-2 any one claim, it is characterized in that, the described corresponding relation according to described response signal, described failure response signal and device determines that described defective device specifically comprises:
Calculate the variance of failure response signal in described response signal and described corresponding relation;
Obtain the failure response signal with described response signal variance yields minimum;
Inquire about the corresponding relation of described failure response signal and device, obtain the device corresponding to failure response signal of described variance yields minimum, the device of described correspondence is described defective device.
4. method according to claim 3, is characterized in that, described in send a control signal to the digital leading portion DFE of XDSL circuit board before described method also comprise:
By normal response signal, and/or the corresponding relation of failure response signal and device writes in the firmware firmware of XDSL circuit board.
5. method according to claim 4, is characterized in that, described in the corresponding relation that obtains normal response signal and/or obtain failure response signal and device specifically comprise:
Obtain the described normal response signal of storing in described firmware, and/or obtain the corresponding relation of failure response signal and device.
6. a device for electric circuit inspection, is characterized in that, described device comprises:
Test signal sending module, for sending a control signal to the digital leading portion DFE of XDSL circuit board, makes described DFE send test signal;
Response signal receiver module, the response signal receiving for obtaining described DFE, described response signal is hybrid circuit Hybrid Circuit in the described XDSL circuit board response signal to described test signal;
Defective device determination module, be used for according to described response signal, judge and in Hybrid Circuit, whether have defective device, if existed, obtain the corresponding relation of failure response signal and device, and determine described defective device according to the corresponding relation of described response signal, described failure response signal and device;
Wherein, the corresponding relation of described failure response signal and device comprises the label of device and the corresponding relation of failure response signal, wherein, device of the same type is carried out to the label that label obtains device, and set up the label of described device and the corresponding relation of failure response signal.
7. device according to claim 6, is characterized in that, described defective device determination module specifically comprises:
Normal response signal acquiring unit, for obtaining normal response signal, described normal response signal is when in described Hybrid Circuit, each device works, the response signal of described Hybrid Circuit to described test signal;
First variance computing unit, for calculating the variance of described response signal and described normal response signal;
, for judging whether described variance yields is greater than default threshold value, if so, in described Hybrid Circuit, there is defective device in defective device determining unit.
8. according to the device described in 6-7 any one claim, it is characterized in that, described defective device determination module specifically also comprises:
Second variance computing unit, for calculating the variance of described response signal and described corresponding relation failure response signal;
The minimum failure response signal acquiring unit of variance, for obtaining the failure response signal with described response signal variance yields minimum;
Defective device determining unit, for inquiring about the corresponding relation of described failure response signal and device, obtains the device corresponding to failure response signal of described variance yields minimum, and the device of described correspondence is described defective device.
9. device according to claim 8, is characterized in that, described device also comprises:
Default response signal memory module, for by normal response signal, and/or the corresponding relation of failure response signal and device writes in the firmware firmware of XDSL circuit board.
10. device according to claim 9, is characterized in that, described defective device determination module specifically comprises:
Corresponding relation acquiring unit, the described normal response signal of storing for obtaining described firmware, and/or obtain the corresponding relation of failure response signal and device.
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1745562A (en) * | 2002-12-12 | 2006-03-08 | Adcdsl***公司 | Fault characterization using information indicative of echo |
| CN101894296A (en) * | 2010-07-05 | 2010-11-24 | 湖南大学 | Method for realizing analogue circuit fault diagnosis based on standard deviation and skewness by neural network |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001127715A (en) * | 1999-10-28 | 2001-05-11 | Nec Corp | Fault detecting circuit |
| AU2004317680A1 (en) * | 2004-03-18 | 2005-10-06 | Adva Ag Optical Networking | Fault management in a ethernet based communication system |
| ATE497661T1 (en) * | 2005-03-04 | 2011-02-15 | Alcatel Lucent | TEST SYSTEM AND TEST METHOD FOR ACCESS TELECOMMUNICATIONS |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1745562A (en) * | 2002-12-12 | 2006-03-08 | Adcdsl***公司 | Fault characterization using information indicative of echo |
| CN101894296A (en) * | 2010-07-05 | 2010-11-24 | 湖南大学 | Method for realizing analogue circuit fault diagnosis based on standard deviation and skewness by neural network |
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