CN102067456A - 用于估计与时间差有关的数据的装置和方法和用于校准延迟线的装置和方法 - Google Patents
用于估计与时间差有关的数据的装置和方法和用于校准延迟线的装置和方法 Download PDFInfo
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- CN102067456A CN102067456A CN2008801299460A CN200880129946A CN102067456A CN 102067456 A CN102067456 A CN 102067456A CN 2008801299460 A CN2008801299460 A CN 2008801299460A CN 200880129946 A CN200880129946 A CN 200880129946A CN 102067456 A CN102067456 A CN 102067456A
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- calibration
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- delay
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
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- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
- G04F10/005—Time-to-digital converters [TDC]
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Unknown Time Intervals (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2008/005005 WO2009152837A1 (en) | 2008-06-20 | 2008-06-20 | Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay line |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102067456A true CN102067456A (zh) | 2011-05-18 |
CN102067456B CN102067456B (zh) | 2015-03-11 |
Family
ID=40297731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200880129946.0A Active CN102067456B (zh) | 2008-06-20 | 2008-06-20 | 用于估计与时间差有关的数据的装置和方法和用于校准延迟线的装置和方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8825424B2 (zh) |
JP (1) | JP2011525737A (zh) |
KR (1) | KR101150618B1 (zh) |
CN (1) | CN102067456B (zh) |
DE (1) | DE112008003906T5 (zh) |
TW (1) | TWI403095B (zh) |
WO (1) | WO2009152837A1 (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103676621A (zh) * | 2013-12-18 | 2014-03-26 | 哈尔滨工程大学 | 一种相位式导线***号传输时间测量方法及装置 |
CN104378088A (zh) * | 2013-08-15 | 2015-02-25 | 瑞昱半导体股份有限公司 | 延迟时间差检测及调整装置与方法 |
CN104584437A (zh) * | 2012-08-30 | 2015-04-29 | 德克萨斯仪器股份有限公司 | 具有适配基准控制的异步模数转换器 |
CN106338909A (zh) * | 2016-08-31 | 2017-01-18 | 中国科学院上海高等研究院 | 相位比较器及门控游标型时间数字转换电路 |
CN106814595A (zh) * | 2017-02-08 | 2017-06-09 | 中国科学院测量与地球物理研究所 | 基于等效细分的高精度tdc及其等效测量方法 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8825424B2 (en) | 2008-06-20 | 2014-09-02 | Advantest (Singapore) Pte Ltd | Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay line |
EP2359480A1 (en) * | 2008-11-17 | 2011-08-24 | Nxp B.V. | Gain normalization of a time-to-digital converter |
US8072361B2 (en) * | 2010-01-08 | 2011-12-06 | Infineon Technologies Ag | Time-to-digital converter with built-in self test |
US20110248757A1 (en) * | 2010-04-08 | 2011-10-13 | Saket Jalan | Digital calibration device and method for high speed digital systems |
KR101749583B1 (ko) * | 2011-05-30 | 2017-06-21 | 삼성전자주식회사 | 시간차 가산기, 시간차 누산기, 시그마-델타 타임 디지털 변환기, 디지털 위상 고정 루프 및 온도 센서 |
US8736338B2 (en) * | 2012-04-11 | 2014-05-27 | Freescale Semiconductor, Inc. | High precision single edge capture and delay measurement circuit |
TWI507704B (zh) * | 2013-08-08 | 2015-11-11 | Realtek Semiconductor Corp | 延遲時間差偵測暨調整裝置與方法 |
JP6594420B2 (ja) * | 2016-05-17 | 2019-10-23 | ホアウェイ・テクノロジーズ・カンパニー・リミテッド | 時間デジタル変換器およびデジタル位相同期ループ |
US9927775B1 (en) * | 2017-04-01 | 2018-03-27 | Intel Corporation | Binary stochastic time-to-digital converter and method |
US10503122B2 (en) | 2017-04-14 | 2019-12-10 | Innophase, Inc. | Time to digital converter with increased range and sensitivity |
US10108148B1 (en) * | 2017-04-14 | 2018-10-23 | Innophase Inc. | Time to digital converter with increased range and sensitivity |
US10749535B2 (en) | 2017-06-28 | 2020-08-18 | Analog Devices, Inc. | Apparatus and methods for distributed timing using digital time stamps from a time-to-digital converter |
JP7085384B2 (ja) | 2018-03-29 | 2022-06-16 | 株式会社メガチップス | 時間デジタル変換回路及び時間デジタル変換方法 |
US10622959B2 (en) | 2018-09-07 | 2020-04-14 | Innophase Inc. | Multi-stage LNA with reduced mutual coupling |
US10965442B2 (en) * | 2018-10-02 | 2021-03-30 | Qualcomm Incorporated | Low-power, low-latency time-to-digital-converter-based serial link |
TWI670939B (zh) * | 2018-12-03 | 2019-09-01 | 新唐科技股份有限公司 | 具有校正功能的延遲線電路及其校正方法 |
US11070196B2 (en) | 2019-01-07 | 2021-07-20 | Innophase Inc. | Using a multi-tone signal to tune a multi-stage low-noise amplifier |
KR20210054651A (ko) | 2019-11-05 | 2021-05-14 | 삼성전자주식회사 | 타이밍 데이터 수집 장치 |
US11031945B1 (en) * | 2020-09-11 | 2021-06-08 | Apple Inc. | Time-to-digital converter circuit linearity test mechanism |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5796682A (en) * | 1995-10-30 | 1998-08-18 | Motorola, Inc. | Method for measuring time and structure therefor |
WO2001069328A2 (en) * | 2000-03-17 | 2001-09-20 | Vector 12 Corporation | High resolution time-to-digital converter |
US6826247B1 (en) * | 2000-03-24 | 2004-11-30 | Stmicroelectronics, Inc. | Digital phase lock loop |
US6868047B2 (en) * | 2001-12-12 | 2005-03-15 | Teradyne, Inc. | Compact ATE with time stamp system |
US7205924B2 (en) * | 2004-11-18 | 2007-04-17 | Texas Instruments Incorporated | Circuit for high-resolution phase detection in a digital RF processor |
US7782242B2 (en) * | 2006-02-17 | 2010-08-24 | Verigy (Singapore) Pte. Ltd. | Time-to-digital conversion with delay contribution determination of delay elements |
WO2008033979A2 (en) | 2006-09-15 | 2008-03-20 | Massachusetts Institute Of Technology | Gated ring oscillator for a time-to-digital converter with shaped quantization noise |
US7548823B2 (en) * | 2007-05-18 | 2009-06-16 | International Business Machines Corporation | Correction of delay-based metric measurements using delay circuits having differing metric sensitivities |
US8825424B2 (en) | 2008-06-20 | 2014-09-02 | Advantest (Singapore) Pte Ltd | Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay line |
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2008
- 2008-06-20 US US13/000,348 patent/US8825424B2/en active Active
- 2008-06-20 JP JP2011513881A patent/JP2011525737A/ja active Pending
- 2008-06-20 CN CN200880129946.0A patent/CN102067456B/zh active Active
- 2008-06-20 DE DE112008003906T patent/DE112008003906T5/de not_active Ceased
- 2008-06-20 WO PCT/EP2008/005005 patent/WO2009152837A1/en active Application Filing
- 2008-06-20 KR KR1020117001537A patent/KR101150618B1/ko active IP Right Grant
-
2009
- 2009-06-18 TW TW098120426A patent/TWI403095B/zh active
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104584437A (zh) * | 2012-08-30 | 2015-04-29 | 德克萨斯仪器股份有限公司 | 具有适配基准控制的异步模数转换器 |
CN104584437B (zh) * | 2012-08-30 | 2018-06-12 | 德克萨斯仪器股份有限公司 | 具有适配基准控制的异步模数转换器 |
CN104378088A (zh) * | 2013-08-15 | 2015-02-25 | 瑞昱半导体股份有限公司 | 延迟时间差检测及调整装置与方法 |
CN104378088B (zh) * | 2013-08-15 | 2017-06-09 | 瑞昱半导体股份有限公司 | 延迟时间差检测及调整装置与方法 |
CN103676621A (zh) * | 2013-12-18 | 2014-03-26 | 哈尔滨工程大学 | 一种相位式导线***号传输时间测量方法及装置 |
CN103676621B (zh) * | 2013-12-18 | 2017-02-15 | 哈尔滨工程大学 | 一种相位式导线***号传输时间测量方法及装置 |
CN106338909A (zh) * | 2016-08-31 | 2017-01-18 | 中国科学院上海高等研究院 | 相位比较器及门控游标型时间数字转换电路 |
CN106338909B (zh) * | 2016-08-31 | 2019-03-22 | 中国科学院上海高等研究院 | 相位比较器及门控游标型时间数字转换电路 |
CN106814595A (zh) * | 2017-02-08 | 2017-06-09 | 中国科学院测量与地球物理研究所 | 基于等效细分的高精度tdc及其等效测量方法 |
CN106814595B (zh) * | 2017-02-08 | 2022-03-18 | 中国科学院精密测量科学与技术创新研究院 | 基于等效细分的高精度tdc及其等效测量方法 |
Also Published As
Publication number | Publication date |
---|---|
US20110140737A1 (en) | 2011-06-16 |
CN102067456B (zh) | 2015-03-11 |
TW201010291A (en) | 2010-03-01 |
US8825424B2 (en) | 2014-09-02 |
KR101150618B1 (ko) | 2012-07-02 |
TWI403095B (zh) | 2013-07-21 |
KR20110039538A (ko) | 2011-04-19 |
DE112008003906T5 (de) | 2012-01-12 |
JP2011525737A (ja) | 2011-09-22 |
WO2009152837A1 (en) | 2009-12-23 |
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