CN102034556A - 一种基于扫描链的存储器测试方法 - Google Patents
一种基于扫描链的存储器测试方法 Download PDFInfo
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106291099A (zh) * | 2016-07-29 | 2017-01-04 | 上海华岭集成电路技术股份有限公司 | 芯片端口频率测试方法 |
CN107329867A (zh) * | 2017-06-29 | 2017-11-07 | 记忆科技(深圳)有限公司 | 一种基于扫描链的芯片分析方法 |
CN107492395A (zh) * | 2016-06-12 | 2017-12-19 | 晨星半导体股份有限公司 | 条件式存取芯片、其内建自我测试电路及测试方法 |
CN111274080A (zh) * | 2020-01-19 | 2020-06-12 | 芜湖荣芯电子科技有限公司 | 基于寄存器扫描链的调试数字电路功能的方法 |
CN112305400A (zh) * | 2020-01-04 | 2021-02-02 | 成都华微电子科技有限公司 | 一种参数快速扫描测试装置和方法 |
CN115952026A (zh) * | 2023-03-15 | 2023-04-11 | 燧原智能科技(成都)有限公司 | 一种虚拟芯片的异常定位方法、装置、设备及存储介质 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US20060136795A1 (en) * | 2004-12-17 | 2006-06-22 | Lsi Logic Corporation | Method of testing scan chain integrity and tester setup for scan block testing |
CN101300500A (zh) * | 2005-11-02 | 2008-11-05 | Nxp股份有限公司 | Ic测试方法及设备 |
CN101515479A (zh) * | 2009-03-30 | 2009-08-26 | 北京中星微电子有限公司 | 一种提高扫描链测试覆盖率的方法和装置 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US20060136795A1 (en) * | 2004-12-17 | 2006-06-22 | Lsi Logic Corporation | Method of testing scan chain integrity and tester setup for scan block testing |
CN101300500A (zh) * | 2005-11-02 | 2008-11-05 | Nxp股份有限公司 | Ic测试方法及设备 |
CN101515479A (zh) * | 2009-03-30 | 2009-08-26 | 北京中星微电子有限公司 | 一种提高扫描链测试覆盖率的方法和装置 |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107492395A (zh) * | 2016-06-12 | 2017-12-19 | 晨星半导体股份有限公司 | 条件式存取芯片、其内建自我测试电路及测试方法 |
CN107492395B (zh) * | 2016-06-12 | 2020-12-01 | 联发科技股份有限公司 | 条件式存取芯片、其内建自我测试电路及测试方法 |
CN106291099A (zh) * | 2016-07-29 | 2017-01-04 | 上海华岭集成电路技术股份有限公司 | 芯片端口频率测试方法 |
CN106291099B (zh) * | 2016-07-29 | 2019-10-25 | 上海华岭集成电路技术股份有限公司 | 芯片端口频率测试方法 |
CN107329867A (zh) * | 2017-06-29 | 2017-11-07 | 记忆科技(深圳)有限公司 | 一种基于扫描链的芯片分析方法 |
CN112305400A (zh) * | 2020-01-04 | 2021-02-02 | 成都华微电子科技有限公司 | 一种参数快速扫描测试装置和方法 |
CN112305400B (zh) * | 2020-01-04 | 2023-09-29 | 成都华微电子科技股份有限公司 | 一种参数快速扫描测试装置和方法 |
CN111274080A (zh) * | 2020-01-19 | 2020-06-12 | 芜湖荣芯电子科技有限公司 | 基于寄存器扫描链的调试数字电路功能的方法 |
CN115952026A (zh) * | 2023-03-15 | 2023-04-11 | 燧原智能科技(成都)有限公司 | 一种虚拟芯片的异常定位方法、装置、设备及存储介质 |
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Address after: 350000 Fuzhou Gulou District, Fujian, software Avenue, building 89, No. 18 Patentee after: FUZHOU ROCKCHIP ELECTRONICS CO., LTD. Address before: 350000 Fuzhou Gulou District, Fujian, software Avenue, building 89, No. 18 Patentee before: Fuzhou Rockchip Semiconductor Co., Ltd. |
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Address after: 350000 building, No. 89, software Avenue, Gulou District, Fujian, Fuzhou 18, China Patentee after: Ruixin Microelectronics Co., Ltd Address before: 350000 building, No. 89, software Avenue, Gulou District, Fujian, Fuzhou 18, China Patentee before: Fuzhou Rockchips Electronics Co.,Ltd. |
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