CN101943835A - Repairing structure and repairing method for liquid-crystal display (LCD) panel - Google Patents
Repairing structure and repairing method for liquid-crystal display (LCD) panel Download PDFInfo
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- CN101943835A CN101943835A CN 201010274930 CN201010274930A CN101943835A CN 101943835 A CN101943835 A CN 101943835A CN 201010274930 CN201010274930 CN 201010274930 CN 201010274930 A CN201010274930 A CN 201010274930A CN 101943835 A CN101943835 A CN 101943835A
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Abstract
The invention discloses a repairing structure and a repairing method for a liquid-crystal display (LCD) panel. The LCD panel is provided with a plurality of shared wirings and a plurality of scanning lines, wherein the shared wirings are parallel to the scanning lines, and the shared wirings and the scanning lines are alternately arranged on a base plate; each shared wiring is provided with a plurality of branches and a plurality of notches; the plurality of branches are parallel to a plurality of signal lines, and are overlapped but separated from the signal lines; and each branch, the corresponding signal line and a pixel electrode are configured to enable the corresponding notch to be exposed, so that an external tool can be provided to cut off the shared wiring from the notch, thereby disconnecting the shared wiring and the branch.
Description
Technical field
The present invention is relevant with the preparing structure in the LCD (TFT-LCD), particularly about a kind of preparing structure and method for repairing and mending thereof with display panels of high aperture (Aperture rate).
Background technology
LCD (Liquid Crystal Display, LCD) because of having low radiation and compact advantage, thus day by day extensive on using, become the main flow display on market at present.
Because liquid crystal itself is not luminous, make LCD need use backlight module as light source, each layer of this light source penetrating LCD device, polaroid, colored filter (color filter) or the like material for example, the real brightness that shows approximately has only about 10 of former illuminating source.Also because the deficiency of display brightness, if when improving backlight module brightness, though can allow panel luminance increase the power consumption of the backlight module that raise also.Therefore, prior art has the aperture opening ratio that proposes to increase the picture element (pixel) on the display panel, promotes panel luminance.
For obtaining than high aperture, No. 200712713 announcement of the Taiwan patent publication No. of announcing on April 1st, 2007 is a kind of will be as storage capacitors (Capacitor storage, Cs) shared electrode (Common electrode) be disposed at signal line under active assembly array base plate, in order to improve the aperture opening ratio of picture element.See also Fig. 1, Fig. 1 is the synoptic diagram of of the prior art one high opening picture element design, is arranged at the image element structure under the signal line in order to shared electrode to be described.This image element structure 100 has many signal line 102, and many sweep traces vertical with those signal line 104.One thin film transistor (TFT) 110 is electrically connected between this signal line 102 and this sweep trace 104, in order to the usefulness as switch (Switch).One drain end 116 of this thin film transistor (TFT) 110 sees through a contact hole (Contact hole) 117 and is electrically connected at a transparent pixel electrode 106.One storage capacitors electrode 120 is arranged under those signal line 102 and those drain ends 116, to improve the aperture opening ratio of this image element structure 100.In addition, be provided with an insulation course (not shown) between storage capacitors electrode 120 and those signal line 102 and those drain ends 116.
Yet, though this design has increased aperture opening ratio,, making the situation that storage capacitors electrode 120 and signal line 102 are short-circuited or open circuit if in manufacturing process, form some defectives, this will cause unusual on the picture.See also Fig. 2, Fig. 2 is the synoptic diagram that illustrates the image element structure of known repairing Fig. 1.Traditionally, when storage capacitors electrode 120 and signal line 102 are short-circuited (shown in the circle of Fig. 2), the countermeasure of head it off is that the storage capacitors electrode 120 with adjacent two image element structures 100 in the left and right sides utilizes laser cutting (laser cutting) to block (shown in Fig. 2 dotted line).But the repairing of doing laser cutting herein may make pixel electrode 106 and 120 short circuits of storage capacitors electrode and cause adjacent two image element structures 100 that the risk that forms bad point is all arranged.
In addition, when storage capacitors electrode 120 and signal line 102 open circuit (shown in the intersection of Fig. 2), be that storage capacitors electrode 120 with adjacent two image element structures 100 in the left and right sides utilizes laser cutting (laser cutting) to block (shown in Fig. 2 dotted line), again storage capacitors electrode 120 and signal line 102 done short circuit welding (shown in the ellipse of Fig. 2).But similarly have pixel electrode 106 and storage capacitors electrode 120 short risk.
Therefore, shared electrode is arranged at image element structure under the signal line and can't utilizes the laser cutting to do immediately repairing action on the storage capacitors electrode, makes this display panel just can only scrap, and causes the waste on the cost.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of preparing structure of display panels of high aperture, to solve aforesaid problem.
Another object of the present invention is to provide a kind of method for repairing and mending of preparing structure of display panels of high aperture, it can carry out laser at the image element structure of display panels of the present invention repairs, and this panel need not be abandoned.
In order to achieve the above object, the invention provides a kind of preparing structure of display panels, the preparing structure of this display panels has a substrate, a plurality of scannings, a plurality of signal line, plurality of films transistor, plurality of films transistor and a plurality of shared wiring.Wherein those sweep traces are arranged on this substrate.Those signal line and those sweep traces are interconnected and separate each other and define a plurality of picture elements zone.Those thin film transistor (TFT)s are arranged at respectively in those picture element zones, and each this thin film transistor (TFT) is electrically connected to corresponding this sweep trace and signal line.Those pixel electrodes are arranged at respectively in those picture element zones, and each pixel electrode is electrically connected to this corresponding thin film transistor (TFT).
In addition, those shared wiring are parallel with those sweep traces, and those shared wiring and those sweep traces are arranged alternately on this substrate.Each this shared wiring has a plurality of branches and a plurality of breach that is parallel to those signal line, wherein those branches overlap and separate each other with those signal line respectively, and each this branch, corresponding this signal line and this pixel electrode are to be configured to make this corresponding breach to expose, in order to provide external tool to cut off this shared wiring, use this shared wiring of disconnection and this branch from this breach.
In preferred embodiment of the present invention, those thin film transistor (TFT)s also have a plurality of drain electrodes, wherein an end of each this drain electrode is electrically connected at this thin film transistor (TFT), and the other end of this drain electrode is arranged at those shared this pixel electrodes that fits over line and be electrically connected to correspondence through a contact hole electrode.In another preferred embodiment of the present invention, the other end of each this drain electrode also has an extension in order to this breach of cover part.
In preferred embodiment of the present invention, this drain electrode and this signal line are the same metal materials, and this shared wiring and this sweep trace are the same metal materials.In addition, those branches are arranged at those signal line belows respectively.
For reaching another above-mentioned purpose, the invention provides the method for repairing and mending of the preparing structure that uses the described display panels of preferred embodiment, be used for situation about being short-circuited when this signal line of damaging and corresponding this branch, this method comprises:
Carry out a cutting processing procedure, cut off this corresponding shared wiring respectively from adjacent one first breach of this branch institute and one second breach, wherein this signal line of the corresponding damage of this first breach, and this first breach and this second breach lay respectively at the both sides of this signal line; And carry out one and fuse processing procedure, will connect this thin film transistor (TFT) and this sweep trace that should second breach.In this preferred embodiment, this cutting processing procedure is to use laser cutting, this fuses processing procedure and be to use laser to fuse.
The present invention also provides the method for repairing and mending of the preparing structure that uses the described display panels of preferred embodiment, the situation that this signal line that is used for damaging opens circuit, and this method comprises:
Carry out a cutting processing procedure, from pairing this branch of the signal line of this damage adjacent one first breach and one second breach cut off this corresponding shared wiring respectively, wherein corresponding this signal line of damaging of this first breach, and this first breach and this second breach lay respectively at the both sides of this signal line; And carry out one and fuse processing procedure, the two ends at the place that opens circuit of the signal line of this damage are blended into this branch respectively, and will be to this thin film transistor (TFT) and the connection of this sweep trace that should second breach.In this preferred embodiment, this cutting processing procedure is to use laser cutting, this fuses processing procedure and be to use laser to fuse.
According to the preparing structure of display panels of the present invention and method for repairing and mending, it utilizes the breach design, has solved the known problem that can't repair at the image element structure of high aperture, has also reduced the cost that defective products is scrapped.
For foregoing of the present invention can be become apparent, preferred embodiment cited below particularly, and cooperate appended graphicly, be described in detail below.
Description of drawings
Fig. 1 is the synoptic diagram that illustrates of the prior art one high opening picture element design.
Fig. 2 is the synoptic diagram that illustrates the image element structure of known repairing Fig. 1.
Fig. 3 is the vertical view of preparing structure that illustrates the display panels of preferred embodiment of the present invention.
Fig. 4 A is the black matrix" synoptic diagram that illustrates preferred embodiment of the present invention.
Fig. 4 B is the vertical view of preparing structure that illustrates the display panels of another preferred embodiment of the present invention.
Fig. 5 is the method for repairing and mending synoptic diagram that illustrates preferred embodiment of the present invention.
Fig. 6 is the method for repairing and mending synoptic diagram that illustrates preferred embodiment of the present invention.
[primary clustering symbol description]
100 image element structures, 102 signal line
104 sweep traces, 106 pixel electrodes
110 thin film transistor (TFT)s, 116 drain ends
117 contact holes, 120 storage capacitors electrodes
200 display panels, 210 substrates
210a, 240 (1), 240 (2) picture element zones
220 sweep traces, 230 signal line
240,240 (1), 240 (2) thin film transistor (TFT)s
244,244 (1), 244 (2) source electrodes
246,246 (1), 246 (2) drain electrodes
248,248 (1), 248 (2) semiconductor layers
250,250 (1), 250 (2) pixel electrodes
260 shared wiring, 262 branches
310 short circuits place of 262a (2) second breach
320 TFT and sweep trace connection place 315 place that opens circuit
316,317 fuse a little
The extra shaded areas of 410 shaded areas edge 410a.
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Embodiment
Preferred embodiment of the present invention will be in addition detailed with appended diagram and following explanation description, in the difference diagram, identical reference number is represented same or analogous assembly.Fig. 3 illustrates the vertical view of preparing structure of the display panels of preferred embodiment of the present invention.Please refer to Fig. 3, the preparing structure of the display panels 200 of this preferred embodiment is done explanation with two adjacent image element structures, it comprise a substrate 210, a plurality of sweep traces 220, a plurality of signal line 230, plurality of films transistor (Thin Film Transistor, TFT) 240, a plurality of pixel electrode (Pixel electrode) 250 and a plurality of shared wiring 260.
Those sweep traces 220 are to be set in parallel on this substrate 210, and those signal line 230 and those sweep traces 220 are interconnected and separate each other and define a plurality of picture elements zone 210a.In addition, those picture elements zone 210a is the array mode and arranges.In this preferred embodiment, this substrate 210 can be glass substrate, quartz base plate or other transparency carrier.In addition, this to separate be to implement in those signal line 230 and those sweep trace 220 modes so that an insulation course (not icon) to be set.
Those thin film transistor (TFT)s 240(is with reference number 240 (1) and 240 (2) expressions) be arranged at respectively in the 210a of these picture element zones, and each this thin film transistor (TFT) 240 is electrically connected to corresponding this sweep trace 220 and signal line 230.In this preferred embodiment, those thin film transistor (TFT)s 240 are to be arranged at respectively on this corresponding sweep trace 220.Those pixel electrodes 250 are arranged at respectively in the 210a of those picture element zones, and each pixel electrode 250 is electrically connected to this corresponding thin film transistor (TFT) 240.In addition, the material of pixel electrode 250 can be indium tin oxide (ITO), indium-zinc oxide (IZO), Zinc-aluminium (AZO) or other transparent conductor material.
Those shared wiring 260 are parallel in fact with those sweep traces 220, and those shared wiring 260 are arranged alternately on this substrate 210 with those sweep traces 220.Say that further each this shared wiring 260 is to be positioned at those picture elements zone 210a that is arranged in parallel, and interconnected and separate each other with those signal line 230.Similarly, this separates that to intersect be to implement so that an insulation course (not shown) mode between shared wiring 260 and those signal line 230 to be set.
Those thin film transistor (TFT)s 240 also have a plurality of source electrode electrodes 244, a plurality of drain electrode 246 and a plurality of semiconductor layer 248.Wherein, an end of each this drain electrode 246 is electrically connected at this source electrode 244, promptly sees through this semiconductor layer 248 and is electrically connected at this source electrode 244.In addition, the other end of this drain electrode 246 is arranged on those shared wiring 260, and sees through this pixel electrode 250 that a contact hole (Contact hole) 246a electrode is electrically connected to correspondence.
In this preferred embodiment, each this shared wiring 260 has a plurality of branches 262 and a plurality of breach 262a that is parallel to those signal line 230.Wherein, those branches 262 overlap and separate each other with those signal line 230 respectively.Particularly, those branches 262 are arranged at those signal line 230 belows respectively, and this to separate that mode intersects be to implement so that an insulation course (not icon) mode between a little branches 262 and those signal line 230 to be set.In addition, in order to allow pixel electrode 250 when not having sweep trace 220 drive thin film transistors 240, still can show GTG, so pixel electrode 250 has part overlapping place can form storage capacitors in those shared wiring 260 and those branches 262, in order to the storage data signal according to data signals.
On the other hand, each this branch 262 and pairing this signal line 230 are to be configured to make corresponding this breach 262a to expose with this pixel electrode 250, as shown in Figure 3.This breach 262a is in order to provide external tool to cut off this shared wiring 260 along dotted line (as shown in Figure 5) from this breach 262a, to use this shared wiring 260 of disconnection and this branch 262.The shared wiring 260 at this dotted line place does not overlap with pixel electrode 250, and this pixel electrode 250 produces the electrical Interference that short circuit caused with this shared wiring 260 after therefore can preventing to cut.
Be noted that this shared wiring 260 and branch 262 form at one first light shield processing procedure with this sweep trace 220, therefore have the same metal material.In addition, this source electrode 244 and this drain electrode 246 are to form with this signal line 230 1 one second light shield processing procedure that coexists, and therefore have the same metal material.In addition, it is the square type that the shape of this breach 262a is not limited to, and the shape of this breach can need not additionally form this breach 262a on demand in this first and second light shield process design.Other is noted that this breach 262a has above-mentioned insulation course, is not to be the structure in cavity.
Fig. 4 A illustrates the black matrix" synoptic diagram of preferred embodiment of the present invention.Please refer to Fig. 4 A, further say, the display panels 200 of this preferred embodiment also has the liquid crystal layer and a upper substrate (not shown) of a predetermined thickness, has black matrix" (Black Matrix) on this upper substrate in order to cover the light tight metal wire (for example those sweep traces 220, signal line 230, thin film transistor (TFT) 240 and shared wiring 260) on this substrate 210, and expose this pixel electrode 250 of printing opacity, to increase contrast.Because this breach 262a only has above-mentioned insulation course, so back light will leak out part light and influence the contrast of picture from this breach 262a.Therefore, the shaded areas edge 410 (being represented by dotted lines) of this black matrix" of this preferred embodiment also need cooperate this breach 262a to extend an extra shaded areas 410a to cover the light that leaks out that penetrates this liquid crystal layer from this breach 262a.
Fig. 4 B illustrates the vertical view of preparing structure of the display panels of another preferred embodiment of the present invention.Please refer to Fig. 4 B, in each above-mentioned thin film transistor (TFT) 240, the other end of each this drain electrode 246 also has an extension 247 in order to cover part this breach 262a.The purpose of design of this extension 247 is to prevent that the part back light from exposing from this breach 262a, and the dead area that can reduce the black matrix" that is positioned at upper substrate (not shown) is to increase aperture opening ratio.The shaded areas edge 410 (being represented by dotted lines) of this black matrix" wherein.
In sum, the preparing structure of display panels of the present invention is to utilize breach design, and this breach is not covered by the branch of pixel electrode, shared wiring and signal line.Can and can not cause short circuit problem with this shared wiring cut-out by this breach.Therefore solved the shortcoming that known techniques can't be repaired for the display panels of high opening.
Below will describe the method for repairing and mending of the preparing structure of the display panels 200 that uses preferred embodiment of the present invention in detail.Please refer to shown in Figure 5ly, Fig. 5 is the method for repairing and mending synoptic diagram of preferred embodiment of the present invention.The display panels 200 of preferred embodiment of the present invention can be learnt the position of a signal line 230 of damaging behind array (Array) detection-phase.The method for repairing and mending of this preferred embodiment is used for situation about being short-circuited when this signal line 230 of damaging and corresponding this branch 262.This method for repairing and mending comprises:
Carry out a cutting processing procedure, short circuit place 310 according to the signal line 230 of this damage, from this branch 262 adjacent one first breach 262a (1) and one second breach 262a (2) cut off this corresponding shared wiring 260 respectively along dotted line, wherein corresponding this signal line 230 of damaging of this first breach 262a (1), and this first breach 262a (1) and this second breach 262a (2) lay respectively at the both sides of this signal line 230; And carry out one and fuse processing procedure, will connect with this sweep trace 220 this thin film transistor (TFT) 240 (2) that should the second breach 262a (2).
Say that further though the signal of the signal line 230 of this damage can be in the corresponding normal demonstration of this picture element zone 210a (1) of this first breach 262a (1), signal is sent to this branch 262 and then has influence on this shared wiring 260 via short circuit place 310.Therefore need to cut off this shared wiring 260 respectively, to block of the influence of this signal to whole piece shared wiring 260 from two this first breach 262a (1) and the 2nd 262a (2).In addition, this cutting processing procedure is to use laser (laser) to implement along the dotted line cutting.
In addition, can be at a TFT and sweep trace connection place 320 these sweep trace 220 formation short circuits of this drain electrode 246 (2) to this thin film transistor (TFT) 240 (2) that should the second breach 262a (2) with bottom with the embodiment that this sweep trace 220 is connected.Feasible driving signal by this sweep trace 220 sees through this TFT and sweep trace connection place 320 is transferred to this pixel electrode 250 (2), and make that this picture element zone 210a (2) that should the second breach 262a (2) is formed dim spot does repairing, and then increase the taste of panel.In addition, this to fuse processing procedure be to use the laser mode of fusing to implement.
Please refer to shown in Figure 6ly, Fig. 6 is the method for repairing and mending synoptic diagram of preferred embodiment of the present invention.The display panels 200 of preferred embodiment of the present invention can be learnt the position of a signal line 230 of damaging behind array (Array) detection-phase.The situation that this signal line 230 that the method for repairing and mending of this preferred embodiment is used for damaging opens circuit.This method for repairing and mending comprises:
Carry out a cutting processing procedure, opening circuit of signal line 230 according to this damage located 315 pairing these branches 262, from this branch 262 adjacent this one first breach 262a (1) and one second breach 262a (2) cut off this corresponding shared wiring 260 respectively along dotted line, wherein corresponding this signal line 230 of damaging of this first breach 262a (1), and this first breach 262a (1) and this second breach 262a (2) lay respectively at the both sides of this signal line 230; And carry out one and fuse processing procedure, the two ends at the place 315 that opens circuit of the signal line 230 of this damage are blended into this branch 262 respectively, as the welding point among the figure 316,317, and will connect with this sweep trace 220 this thin film transistor (TFT) 240 (2) that should the second breach 262a (2).
Further say, this fuses signal line 230 that processing procedure will damage and fuses a little two and 316,317 blend into respectively in this branch 262, make the signal of signal line 230 of this damage to fuse a little and 316 be sent to this branch 262 via this, and then pass to signal line 230 originally again to repair via fusing a little 317, make this corresponding picture element zone 210a (1) of this first breach 262a (1) normally to show.Yet this signal also can have influence on this shared wiring 260, therefore needs to cut off this shared wiring 260 respectively from this first breach 262a (1) and this second breach 262a (2), to block the influence of this signal to whole piece shared wiring 260.In addition, this fuses processing procedure is to use the laser mode of fusing to implement, and this cutting processing procedure is to use laser (laser) to implement along the dotted line cutting.
Similarly, can be at a TFT and sweep trace connection place 320 these sweep trace 220 formation short circuits of this drain electrode 246 (2) to this thin film transistor (TFT) 240 (2) that should the second breach 262a (2) with bottom with the embodiment that this sweep trace 220 is connected.Feasible driving signal by this sweep trace 220 sees through this TFT and sweep trace connection place 320 is transferred to this pixel electrode 250 (2), and make that this picture element zone 210a (2) that should the second breach 262a (2) is formed dim spot does repairing, and then increase the taste of panel.
In sum, repairing method of the present invention is the breach design that utilizes above-mentioned preferred embodiment.Because this breach do not cover by the branch of pixel electrode, shared wiring and signal line, therefore can this shared wiring be cut off and can not cause short circuit problem by this breach.In addition, also utilize to fuse this thin film transistor (TFT) and this sweep trace connection of processing procedure, reduce the influence that counter plate shows in order to form dim spot the signal line of correspondence damage.The method for repairing and mending display panels that solved the design of high aperture picture element can't be repaired the problem of the institute's cost that causes raising by this.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; the persond having ordinary knowledge in the technical field of the present invention; without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking accompanying the claim person of defining.
Claims (10)
1. the preparing structure of a display panels is characterized in that, comprises:
One substrate;
A plurality of sweep traces are arranged on this substrate;
A plurality of signal line, interconnected and separate each other and define a plurality of picture elements zone with those sweep traces;
The plurality of films transistor is arranged at respectively in those picture element zones, and each this thin film transistor (TFT) is electrically connected to corresponding this sweep trace and signal line;
A plurality of pixel electrodes are arranged at respectively in those picture element zones, and each pixel electrode is electrically connected to this corresponding thin film transistor (TFT); And
A plurality of shared wiring, parallel with those sweep traces, and be arranged alternately on this substrate with those sweep traces, each this shared wiring has a plurality of branches and a plurality of breach that is parallel to those signal line, wherein those branches overlap and separate each other with those signal line respectively, and each this branch, corresponding this signal line and this pixel electrode are to be configured to make this corresponding breach to expose.
2. display panels according to claim 1, it is characterized in that: those thin film transistor (TFT)s also have a plurality of drain electrodes, wherein an end of each this drain electrode is electrically connected at this thin film transistor (TFT), and the other end of this drain electrode is arranged at those shared this pixel electrodes that fits over line and be electrically connected to correspondence through a contact hole electrode.
3. display panels according to claim 2 is characterized in that: wherein the other end of each this drain electrode also has an extension in order to this breach of cover part.
4. display panels according to claim 2, wherein this drain electrode and this signal line are the same metal materials.
5. display panels according to claim 1, wherein this shared wiring and this sweep trace are the same metal materials.
6. display panels according to claim 1, wherein those branches are arranged at those signal line belows respectively.
7. method for repairing and mending that uses the preparing structure of display panels as claimed in claim 1 is used for it is characterized in that when this signal line damaged and the situation that corresponding this branch is short-circuited this method comprises:
Carry out a cutting processing procedure, from this branch adjacent one first breach and one second breach cut off this corresponding shared wiring respectively, wherein corresponding this signal line of damaging of this first breach, and this first breach and this second breach lay respectively at the both sides of this signal line; And
Carry out one and fuse processing procedure, will connect this thin film transistor (TFT) and this sweep trace that should second breach.
8. method for repairing and mending that uses the preparing structure of display panels as claimed in claim 1, the situation that this signal line that is used for damaging opens circuit, it is characterized in that, this method comprises: carry out a cutting processing procedure, from pairing this branch of the signal line of this damage adjacent one first breach and one second breach cut off this corresponding shared wiring respectively, wherein corresponding this signal line of damaging of this first breach, and this first breach and this second breach lay respectively at the both sides of this signal line; And carry out one and fuse processing procedure, the two ends at the place that opens circuit of the signal line of this damage are blended into this branch respectively, and will be to this thin film transistor (TFT) and the connection of this sweep trace that should second breach.
9. according to claim 7 or 8 described method for repairing and mending, it is characterized in that: wherein this cutting processing procedure is to use the laser cutting.
10. according to claim 7 or 8 described method for repairing and mending, it is characterized in that: wherein this fuses processing procedure and is to use laser to fuse.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010274930 CN101943835A (en) | 2010-09-07 | 2010-09-07 | Repairing structure and repairing method for liquid-crystal display (LCD) panel |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201010274930 CN101943835A (en) | 2010-09-07 | 2010-09-07 | Repairing structure and repairing method for liquid-crystal display (LCD) panel |
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| CN101943835A true CN101943835A (en) | 2011-01-12 |
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| CN 201010274930 Pending CN101943835A (en) | 2010-09-07 | 2010-09-07 | Repairing structure and repairing method for liquid-crystal display (LCD) panel |
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| CN103135297A (en) * | 2011-11-30 | 2013-06-05 | 上海中航光电子有限公司 | Thin film transistor liquid crystal display device and disconnected data line repairing method thereof |
| CN109324454A (en) * | 2018-09-30 | 2019-02-12 | 惠科股份有限公司 | A kind of display panel and display device |
| WO2020062380A1 (en) * | 2018-09-30 | 2020-04-02 | 惠科股份有限公司 | Display panel and display device |
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| CN101174067A (en) * | 2006-11-03 | 2008-05-07 | 三星电子株式会社 | Liquid crystal display device and method of repairing bad pixels therein |
| CN101202287A (en) * | 2006-12-12 | 2008-06-18 | Lg.菲利浦Lcd株式会社 | Array substrate, method of manufacturing the same, and method of repairing line in the same |
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| US6441401B1 (en) * | 1999-03-19 | 2002-08-27 | Samsung Electronics Co., Ltd. | Thin film transistor array panel for liquid crystal display and method for repairing the same |
| KR20050105591A (en) * | 2004-04-30 | 2005-11-04 | 엘지.필립스 엘시디 주식회사 | Liquid crystal display device and method for fabricating the same |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103135297A (en) * | 2011-11-30 | 2013-06-05 | 上海中航光电子有限公司 | Thin film transistor liquid crystal display device and disconnected data line repairing method thereof |
| CN103135297B (en) * | 2011-11-30 | 2016-03-16 | 上海中航光电子有限公司 | A kind of thin-film transistor LCD device and broken string data line restorative procedure thereof |
| CN109324454A (en) * | 2018-09-30 | 2019-02-12 | 惠科股份有限公司 | A kind of display panel and display device |
| WO2020062380A1 (en) * | 2018-09-30 | 2020-04-02 | 惠科股份有限公司 | Display panel and display device |
| CN109324454B (en) * | 2018-09-30 | 2020-10-16 | 惠科股份有限公司 | Display panel and display device |
| US11249359B2 (en) | 2018-09-30 | 2022-02-15 | HKC Corporation Limited | Display panel and display apparatus |
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