CN101552256B - 能够切换操作模式的半导体器件及其操作模式设置方法 - Google Patents
能够切换操作模式的半导体器件及其操作模式设置方法 Download PDFInfo
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- CN101552256B CN101552256B CN2008102149208A CN200810214920A CN101552256B CN 101552256 B CN101552256 B CN 101552256B CN 2008102149208 A CN2008102149208 A CN 2008102149208A CN 200810214920 A CN200810214920 A CN 200810214920A CN 101552256 B CN101552256 B CN 101552256B
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/50—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H01L24/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
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Abstract
Description
Claims (17)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008089790A JP5241288B2 (ja) | 2008-03-31 | 2008-03-31 | 半導体装置及びその動作モード設定方法 |
JP2008-089790 | 2008-03-31 | ||
JP2008089790 | 2008-03-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101552256A CN101552256A (zh) | 2009-10-07 |
CN101552256B true CN101552256B (zh) | 2012-11-28 |
Family
ID=41116013
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008102149208A Active CN101552256B (zh) | 2008-03-31 | 2008-08-29 | 能够切换操作模式的半导体器件及其操作模式设置方法 |
Country Status (3)
Country | Link |
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US (3) | US7956643B2 (zh) |
JP (1) | JP5241288B2 (zh) |
CN (1) | CN101552256B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5301262B2 (ja) | 2008-12-19 | 2013-09-25 | ルネサスエレクトロニクス株式会社 | 半導体装置、及び動作モ−ド切換方法 |
US9893007B2 (en) | 2016-04-27 | 2018-02-13 | Semiconductor Components Industries, Llc | Packaged semiconductor devices with multi-use input contacts and related methods |
JP2018017605A (ja) * | 2016-07-28 | 2018-02-01 | ルネサスエレクトロニクス株式会社 | 半導体装置及びそれを備えた半導体システム |
JP6832375B2 (ja) * | 2019-02-25 | 2021-02-24 | ウィンボンド エレクトロニクス コーポレーション | 半導体集積回路をリバースエンジニアリングから保護する方法 |
CN112630621B (zh) * | 2020-12-16 | 2023-04-28 | 北京集创北方科技股份有限公司 | 一种引脚短路检测电路及检测方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW527491B (en) * | 1999-02-02 | 2003-04-11 | Fujitsu Ltd | Test method and test circuit for electronic device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5754879A (en) | 1996-09-23 | 1998-05-19 | Motorola, Inc. | Integrated circuit for external bus interface having programmable mode select by selectively bonding one of the bond pads to a reset terminal via a conductive wire |
JP3022415B2 (ja) * | 1997-07-03 | 2000-03-21 | 日本電気株式会社 | プログラマブルバッファ回路 |
JPH1197473A (ja) * | 1997-09-19 | 1999-04-09 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法と半導体装置 |
EP1176637A4 (en) * | 1999-01-22 | 2006-09-13 | Hitachi Ltd | INTEGRATED SEMICONDUCTOR CIRCUIT AND MANUFACTURE THEREOF |
JP2000221226A (ja) * | 1999-02-02 | 2000-08-11 | Fujitsu Ltd | 電子機器の試験方法、電子機器、及び、半導体装置 |
JP4629192B2 (ja) * | 2000-07-07 | 2011-02-09 | 富士通セミコンダクター株式会社 | トリミング回路、調整回路及び半導体装置 |
JP2004047720A (ja) * | 2002-07-11 | 2004-02-12 | Renesas Technology Corp | 半導体装置 |
JP2006197564A (ja) * | 2004-12-16 | 2006-07-27 | Seiko Epson Corp | 信号選択回路およびリアルタイムクロック装置 |
JP5301262B2 (ja) * | 2008-12-19 | 2013-09-25 | ルネサスエレクトロニクス株式会社 | 半導体装置、及び動作モ−ド切換方法 |
-
2008
- 2008-03-31 JP JP2008089790A patent/JP5241288B2/ja not_active Expired - Fee Related
- 2008-08-14 US US12/222,734 patent/US7956643B2/en active Active
- 2008-08-29 CN CN2008102149208A patent/CN101552256B/zh active Active
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2011
- 2011-05-13 US US13/067,175 patent/US8384434B2/en active Active
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2012
- 2012-12-11 US US13/711,032 patent/US8952724B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW527491B (en) * | 1999-02-02 | 2003-04-11 | Fujitsu Ltd | Test method and test circuit for electronic device |
US7251766B2 (en) * | 1999-02-02 | 2007-07-31 | Fujitsu Limited | Test method and test circuit for electronic device |
Also Published As
Publication number | Publication date |
---|---|
US8384434B2 (en) | 2013-02-26 |
US20090243400A1 (en) | 2009-10-01 |
US7956643B2 (en) | 2011-06-07 |
CN101552256A (zh) | 2009-10-07 |
US8952724B2 (en) | 2015-02-10 |
JP2009246087A (ja) | 2009-10-22 |
US20140002135A1 (en) | 2014-01-02 |
US20110215455A1 (en) | 2011-09-08 |
JP5241288B2 (ja) | 2013-07-17 |
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