CN101487793B - 时间序列变换脉冲分光计测装置 - Google Patents
时间序列变换脉冲分光计测装置 Download PDFInfo
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- CN101487793B CN101487793B CN2008101906573A CN200810190657A CN101487793B CN 101487793 B CN101487793 B CN 101487793B CN 2008101906573 A CN2008101906573 A CN 2008101906573A CN 200810190657 A CN200810190657 A CN 200810190657A CN 101487793 B CN101487793 B CN 101487793B
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- 238000004611 spectroscopical analysis Methods 0.000 abstract description 9
- 238000005259 measurement Methods 0.000 abstract description 7
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- 230000000694 effects Effects 0.000 description 18
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- 238000010276 construction Methods 0.000 description 11
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/08—Beam switching arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
- G01N2201/0698—Using reference pulsed source
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
Claims (1)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP299373/03 | 2003-08-22 | ||
JP2003299373A JP2005069840A (ja) | 2003-08-22 | 2003-08-22 | 時系列変換パルス分光計測装置の時系列信号取得のための光路差補償機構 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800237219A Division CN1839307B (zh) | 2003-08-22 | 2004-08-19 | 时间序列变换脉冲分光计测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101487793A CN101487793A (zh) | 2009-07-22 |
CN101487793B true CN101487793B (zh) | 2012-08-08 |
Family
ID=34213756
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101906573A Expired - Lifetime CN101487793B (zh) | 2003-08-22 | 2004-08-19 | 时间序列变换脉冲分光计测装置 |
CN2004800237219A Expired - Lifetime CN1839307B (zh) | 2003-08-22 | 2004-08-19 | 时间序列变换脉冲分光计测装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800237219A Expired - Lifetime CN1839307B (zh) | 2003-08-22 | 2004-08-19 | 时间序列变换脉冲分光计测装置 |
Country Status (7)
Country | Link |
---|---|
US (2) | US7507966B2 (zh) |
EP (2) | EP1662249B1 (zh) |
JP (2) | JP2005069840A (zh) |
KR (2) | KR100800037B1 (zh) |
CN (2) | CN101487793B (zh) |
HK (1) | HK1131437A1 (zh) |
WO (1) | WO2005019809A1 (zh) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI114824B (fi) * | 2003-02-12 | 2004-12-31 | Temet Instr Oy | Infrapunamodulaattori spektrometriä varten |
JP4769490B2 (ja) * | 2005-05-27 | 2011-09-07 | キヤノン株式会社 | 光路長制御装置 |
JP4783662B2 (ja) * | 2006-04-17 | 2011-09-28 | 株式会社ミツトヨ | 光路差増倍装置 |
CN101201322B (zh) * | 2006-12-14 | 2011-05-18 | 上海通微分析技术有限公司 | 高灵敏度荧光检测装置 |
JP5037929B2 (ja) * | 2006-12-18 | 2012-10-03 | キヤノン株式会社 | テラヘルツ波を用いた対象物の情報取得装置及び方法 |
KR100905881B1 (ko) * | 2007-10-05 | 2009-07-03 | 삼성전기주식회사 | 레이저 측량장치 |
JP5357531B2 (ja) * | 2008-02-05 | 2013-12-04 | キヤノン株式会社 | 情報取得装置及び情報取得方法 |
CN101514920B (zh) * | 2008-02-20 | 2010-06-09 | 厦门大学 | 紫外分光光度计检测头 |
US7910891B2 (en) * | 2008-09-24 | 2011-03-22 | James Edward Cannon | Method and apparatus for photographing “small” x-ray scintillation images at the same(“full”) camera resolution normally available for “large” scintillation images |
JP5717335B2 (ja) | 2009-01-23 | 2015-05-13 | キヤノン株式会社 | 分析装置 |
EP2497018B9 (en) * | 2009-11-03 | 2019-05-01 | Nokia Technologies Oy | Method and apparatus for organizing messages and attachments as a conversation |
US8754566B2 (en) * | 2009-12-16 | 2014-06-17 | Nidec Motor Corporation | Assembling method for a stator and stator produced thereby |
US8378304B2 (en) | 2010-08-24 | 2013-02-19 | Honeywell Asca Inc. | Continuous referencing for increasing measurement precision in time-domain spectroscopy |
US8638443B2 (en) * | 2011-05-24 | 2014-01-28 | Honeywell International Inc. | Error compensation in a spectrometer |
CN103888111B (zh) * | 2014-04-11 | 2016-06-01 | 北京理工大学 | 基于迈克尔逊干涉仪的脉冲序列调制方法及调制器 |
CN105203208B (zh) * | 2015-09-15 | 2018-01-30 | 中国电子科技集团公司第五十研究所 | 级联快速旋转延迟扫描装置 |
EP3441748A4 (en) | 2016-04-05 | 2019-12-18 | Advanced Bio-Spectroscopy Co., Ltd. | METHOD FOR OBSERVING THE DYNAMIC PHYSICAL PROPERTIES OF BIOLOGICAL TISSUE AND DEVICE FOR OBSERVING THE DYNAMIC PHYSICAL PROPERTIES OF BIOLOGICAL TISSUE |
CN106441580B (zh) * | 2016-06-16 | 2018-07-13 | 电子科技大学 | 可变角度入射同时测透射和反射的太赫兹时域光谱仪 |
CN106291507B (zh) * | 2016-07-21 | 2018-10-30 | 京东方科技集团股份有限公司 | 检测光测距装置及测距方法 |
US11092552B2 (en) * | 2017-07-10 | 2021-08-17 | Shimadzu Corporation | Flame atomic absorption spectrophotometer |
EP3550328B1 (en) * | 2018-04-04 | 2023-05-31 | Melexis Technologies NV | Pulsed-light detection and ranging apparatus and method of detection and ranging of an object in a pulsed light detection and ranging system |
KR102079864B1 (ko) | 2018-06-27 | 2020-02-19 | 한국전력공사 | 순간압력센서 시험장치 및 시험방법 |
CN111045200A (zh) * | 2019-11-29 | 2020-04-21 | 安徽省生态环境监测中心(安徽省重污染天气预报预警中心) | 一种用于延长光程的光反射组件 |
CN110849809A (zh) * | 2019-12-19 | 2020-02-28 | 中国科学院长春光学精密机械与物理研究所 | 一种多档可变气体吸收池 |
CN117664902A (zh) * | 2024-01-31 | 2024-03-08 | 合肥中科红外精密仪器有限公司 | 一种改进的多光程开放式怀特池红外光谱分析*** |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6078047A (en) * | 1997-03-14 | 2000-06-20 | Lucent Technologies Inc. | Method and apparatus for terahertz tomographic imaging |
Family Cites Families (21)
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US5227861A (en) * | 1989-09-25 | 1993-07-13 | Mitsubishi Denki Kabushiki Kaisha | Apparatus for and method of evaluating multilayer thin film |
JPH05115485A (ja) | 1991-10-25 | 1993-05-14 | Hitachi Ltd | 生体光計測装置 |
AU777135B2 (en) | 1999-02-23 | 2004-10-07 | Teraview Limited | Method and apparatus for terahertz imaging |
JP4248665B2 (ja) * | 1999-03-25 | 2009-04-02 | 日本分光株式会社 | 赤外分光装置 |
JP4368082B2 (ja) | 1999-06-21 | 2009-11-18 | 浜松ホトニクス株式会社 | テラヘルツ波分光器 |
JP3896532B2 (ja) | 1999-07-09 | 2007-03-22 | 独立行政法人科学技術振興機構 | テラヘルツ帯複素誘電率測定装置 |
JP2001066375A (ja) | 1999-08-31 | 2001-03-16 | Communication Research Laboratory Mpt | サブテラヘルツ電磁波を用いた粉粒体中異物検査装置およびその検査方法 |
JP4237363B2 (ja) | 1999-11-10 | 2009-03-11 | 日本分光株式会社 | 赤外分光装置 |
JP2001275103A (ja) | 2000-03-23 | 2001-10-05 | Matsushita Electric Ind Co Ltd | 監視システム及びその動き検出方法 |
JP4476462B2 (ja) | 2000-03-27 | 2010-06-09 | 株式会社栃木ニコン | 半導体の電気特性評価装置 |
JP2002243416A (ja) | 2001-02-13 | 2002-08-28 | Tochigi Nikon Corp | 厚み測定方法及び装置並びにウエハ |
JP3477496B2 (ja) | 2001-02-27 | 2003-12-10 | 独立行政法人通信総合研究所 | 電磁波検出装置および検出方法 |
JP2002277393A (ja) | 2001-03-15 | 2002-09-25 | Tochigi Nikon Corp | 測定方法及び装置、並びに、イメージ化方法及び装置 |
JP2002277394A (ja) * | 2001-03-15 | 2002-09-25 | Mitsuo Takeda | 誘電体物質の光物性定数の光学的測定方法及びその装置並びにその装置を組み込んだ製造システム |
JP3550381B2 (ja) | 2001-06-27 | 2004-08-04 | 松下電器産業株式会社 | 偏光解析装置及び偏光解析方法 |
JP5495218B2 (ja) | 2001-09-06 | 2014-05-21 | 独立行政法人情報通信研究機構 | テラヘルツ光検出方法、テラヘルツ光装置及びイメージ化装置 |
JP3598375B2 (ja) | 2001-09-10 | 2004-12-08 | 独立行政法人情報通信研究機構 | テラヘルツ電磁波時間分解分光装置 |
JP2003121355A (ja) | 2001-10-10 | 2003-04-23 | Tochigi Nikon Corp | 試料情報取得方法及びテラヘルツ光装置 |
JP2003131137A (ja) | 2001-10-24 | 2003-05-08 | Tochigi Nikon Corp | テラヘルツ光供給光学系、テラヘルツ光検出光学系、及びこれを用いたテラヘルツ光装置 |
EP1469298A1 (en) * | 2001-12-28 | 2004-10-20 | Tochigi Nikon Corporation | Spectral measuring device |
JP2004003902A (ja) | 2002-06-03 | 2004-01-08 | Tochigi Nikon Corp | テラヘルツ光を用いた平面基板の電気特性測定方法 |
-
2003
- 2003-08-22 JP JP2003299373A patent/JP2005069840A/ja active Pending
-
2004
- 2004-08-19 US US10/568,528 patent/US7507966B2/en active Active
- 2004-08-19 WO PCT/JP2004/011926 patent/WO2005019809A1/ja active Application Filing
- 2004-08-19 EP EP20040771887 patent/EP1662249B1/en not_active Expired - Lifetime
- 2004-08-19 EP EP11192255.5A patent/EP2442093A3/en not_active Withdrawn
- 2004-08-19 CN CN2008101906573A patent/CN101487793B/zh not_active Expired - Lifetime
- 2004-08-19 CN CN2004800237219A patent/CN1839307B/zh not_active Expired - Lifetime
- 2004-08-19 JP JP2005513296A patent/JP4059403B2/ja not_active Expired - Fee Related
- 2004-08-19 KR KR20067003365A patent/KR100800037B1/ko active IP Right Grant
- 2004-08-19 KR KR1020077010457A patent/KR100852453B1/ko active IP Right Grant
-
2009
- 2009-02-13 US US12/371,325 patent/US7705311B2/en not_active Expired - Lifetime
- 2009-11-26 HK HK09111035A patent/HK1131437A1/xx unknown
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6078047A (en) * | 1997-03-14 | 2000-06-20 | Lucent Technologies Inc. | Method and apparatus for terahertz tomographic imaging |
Non-Patent Citations (1)
Title |
---|
JP特开2000-275105A 2000.10.06 |
Also Published As
Publication number | Publication date |
---|---|
EP1662249A1 (en) | 2006-05-31 |
KR100800037B1 (ko) | 2008-01-31 |
KR20070052364A (ko) | 2007-05-21 |
JPWO2005019809A1 (ja) | 2007-11-08 |
CN1839307B (zh) | 2010-05-05 |
KR20060054443A (ko) | 2006-05-22 |
KR100852453B1 (ko) | 2008-08-14 |
EP2442093A2 (en) | 2012-04-18 |
US7705311B2 (en) | 2010-04-27 |
CN1839307A (zh) | 2006-09-27 |
CN101487793A (zh) | 2009-07-22 |
US7507966B2 (en) | 2009-03-24 |
HK1131437A1 (en) | 2010-01-22 |
US20060278830A1 (en) | 2006-12-14 |
EP2442093A3 (en) | 2017-03-15 |
JP2005069840A (ja) | 2005-03-17 |
US20090152469A1 (en) | 2009-06-18 |
EP1662249B1 (en) | 2014-10-15 |
JP4059403B2 (ja) | 2008-03-12 |
WO2005019809A1 (ja) | 2005-03-03 |
EP1662249A4 (en) | 2008-02-13 |
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