CN101211297A - Method for automatically allocating test machine station each IP address and the machine station - Google Patents
Method for automatically allocating test machine station each IP address and the machine station Download PDFInfo
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- CN101211297A CN101211297A CNA200610170290XA CN200610170290A CN101211297A CN 101211297 A CN101211297 A CN 101211297A CN A200610170290X A CNA200610170290X A CN A200610170290XA CN 200610170290 A CN200610170290 A CN 200610170290A CN 101211297 A CN101211297 A CN 101211297A
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Abstract
The invention relates to a method for automatically distributing each testing pedestal IP address of a testing machine station, and the testing machine station which applies the method. The testing machine station automatically distributes the IP address to each separate testing pedestal according to the method, wherein, each testing pedestal respectively comprises a testing circuit board for putting a circuit component/device to be tested; a network interface device which is arranged on the testing circuit board and stored with an internal code; and a memory device which is connected with the testing circuit board. With the invention, the testing machine station can control each testing pedestal in a unified way to avoid manpower waste caused by repeated distribution for the IP address and the loss for the product line because of shutdown. The method and the testing machine station which applies the method provided by the invention can effectively solve the technical problems above mentioned.
Description
Technical field:
The present invention relates to the method for a kind of distributing IP address, especially a kind of method of respectively testing pedestal IP address of automatically allocating test machine station, and the tester table of this method of application.
Background technology:
Integrated circuit (IC) assembly has become core indispensable in nearly all electronic equipment, and the fiduciary level of IC also becomes the link of the utmost importance that determines the electronic equipment fiduciary level undoubtedly.
Be used for the automatically testing machine platform of test I C at present, being broadly divided into by the test pedestal provides simulate signal, captures the simulation test of each output pin output signal; And actual host plate and periphery are provided, and vacate IC to be measured position, IC to be measured is inserted the real border test that operates in the actual environment for use.
Though simulation test can specifically obtain the complete electrical specification of tested IC; but for each different IC; all need write corresponding testing software targetedly; design provides the hardware structure of simulate signal; not only need expend the ample resources debug could actually use; and when IC Renewal Design to be measured; also need patience to wait testing software and hardware is reached perfection; so it is quite high to set up the cost of test environment; and can't follow new product immediately and come out and the corresponding testing apparatus of releasing, can lag behind a period of time usually.
The test of real border is on the contrary, owing to be not to be purpose with the complete electrical specification that obtains IC to be measured, therefore need not to obtain complete data, but in the test environment that meets environment for use fully, stay the vacancy of IC to be measured separately, allow tested IC fill up tested position, and test according to user mode with actual board, though it is long slightly to test required spended time at every turn, but can obtain the reactiveness of this IC to be measured under actual environment for use easily, and learn whether this IC to be measured can be for actual installation.
If the IC that institute's desire measures is a central processing unit, the testing circuit board of above-mentioned real border test is motherboard, if the IC that surveys is the IC that display card is used, promptly can display card as testing circuit board, in like manner, the mainboard etc. that also can adopt network interface card, PDA or mobile phone according to actual needs is as testing circuit board, and these products are all common on the market product, and the environment of therefore real border test is built without any difficulty.
As shown in Figure 1, 2, with for example six groups of tests of a central control module 90 controls pedestal 92 is example, each is tested pedestal 92 and respectively comprises that respectively a motherboard 920, a hard disk 922, a network interface card 924 and are connected in the connector 926 of motherboard, test procedure is stored in the hard disk 922, the signal that central control module 90 and each pedestal are 92 then transfers to motherboard 920 via network interface card 924, respectively test pedestal 92 with control, and acquisition judges in view of the above from the test result of each test pedestal 92 whether tested IC is qualified.The shortcoming that this method of testing exists is:
On the one hand, when starting production line at every turn, operating personnel all need respectively to test pedestal 92 state parameters by central control module 90 settings, when changing production line also so, set the content of per unit parameter, renewal hard disk 922 so respectively, cause managerial difficulty undoubtedly, also make testing efficiency be difficult to improve.
On the other hand, after the switching on and shutting down flow process of frequent test, each hard disk 922 of testing pedestal 92 is easy to go wrong even damage, no matter be that operating personnel exchange the hard disk 922 of two test pedestals 92 smoothly, still upgrade the hard disk 922 that damages, all need to upgrade the content of hard disk 922, careless slightly, inconsistent with test product or the not corresponding situation of test procedure will be caused, the test result correctness after influence is upgraded.Be substandard product if accidentally specification product mistakes is surveyed, loss only be an IC; Otherwise, if mistake surveys defective IC for qualified, be installed on actual environment for use, will undermine the electronic equipment whole reliability undoubtedly, cause many puzzlements not only for follow-up user, but also can damage the prestige of electronic equipment set manufacturer and bring unnecessary economic loss to it.
And,, after monadic product test finishes, also may change the test products on the production line because production line is numerous in the factory as above-mentioned; The each replacing, operating personnel need to set one by one each test pedestal data of change again, in case omit, also can cause above-mentioned not correspondence problem.Moreover every bit manipulation personnel need pay close attention to a plurality of (rather than one) board simultaneously, and the probability of more feasible generation problem doubles with geometric progression.
Test as if energy robotization distributing IP network address, not only reduce cost, raising measuring accuracy and efficient that test makes a mistake, can also effectively increase the market acceptance of tester table, also the economic benefit of this kind of increase use board.
Summary of the invention:
Therefore, one of the technical problem to be solved in the present invention is the method that provides a kind of automatically allocating test machine station that reduces testing cost respectively to test pedestal IP address.
Another technical matters that the present invention will solve is that a kind of method that the artificial automatically allocating test machine station of handling careless mistake is respectively tested pedestal IP address that significantly reduces is provided.
The technical matters again that the present invention will solve is the method that the automatically allocating test machine station that provides a kind of measuring accuracy and efficient to improve is greatly respectively tested pedestal IP address.
The another technical matters that the present invention will solve is, but provides a kind of automatically allocating test machine station respectively to test the tester table of pedestal IP address.
Respectively test the method for pedestal IP address according to automatically allocating test machine station provided by the invention, a plurality of for the test pedestal that detects the electrical specification of a plurality of same model circuit under test members/means under a predetermining circuit environment for differentiating, wherein respectively this test pedestal comprises one respectively for the testing circuit board of putting a circuit under test members/means; One is installed in this testing circuit board and stores the Network Interface Unit of an ISN; And the memory storage of this testing circuit board of connection; This method comprises the following steps:
A) independent one of them described test pedestal of activation activates testing circuit board, memory storage and the Network Interface Unit of this test pedestal;
B) receive request, and read its ISN from described Network Interface Unit;
C) remember described ISN, and distribute an IP address to store for the described memory storage of this test pedestal; And
D) stop this test pedestal of distributing IP address of activation, and the test pedestal of another still unallocated IP address of activation, wherein all distributing IP addresses are not reproducible, and repetition above-mentioned steps to described test pedestal all has been assigned with the IP address, by this, this board can be known each described test pedestal of resolution.
According to the method that automatically allocating test machine station provided by the invention is respectively tested pedestal IP address, also have following attached technical characterictic:
Step d) comprises also the control device in this board checks all pedestals to be tested whether all to be assigned with the inferior step of IP address.
At described step b) and c) between, comprise also whether the described test pedestal of an analysis confirmation has been assigned with the step e) of IP address, and when described pedestal has been assigned with the IP address, with this assigned IP address sub-distribution more.
According to tester table provided by the invention, for detecting the electrical specification of a plurality of same model circuit under test members/means under a predetermining circuit environment, this board comprises:
A plurality of test pedestals, each described test pedestal comprises respectively: one is used to put the testing circuit board of a described circuit under test members/means; One Network Interface Unit that is installed in described testing circuit board and stores an ISN is connected the memory storage of described testing circuit board with one; And
One connection, activation and control each described test pedestal, for receiving described circuit under test members/means electrical specification, distributing the control device of respectively testing pedestal IP address automatically.
The present invention respectively tests pedestal and distributes each different IP address by the unified control of tester table, need not manual allocation, has not only reduced human cost, and reduces the manual operation careless mistake and the risk and the loss that produce, improves detection efficiency and precision.
Description of drawings:
Fig. 1 is existing room temperature environment automatic IC tester table schematic perspective view, and the relation of IC supply/output unit and pedestal is described;
Fig. 2 is the synoptic diagram of test pedestal;
Fig. 3 is the structure block diagram of IC tester table of the present invention;
Fig. 4 is the process flow diagram that automatically allocating test machine station of the present invention is respectively tested pedestal IP address approach preferred embodiment.
[primary clustering symbol description]
1 ... control device 224 ... Network Interface Unit
21~26,92 ... pedestal 226,926 ... connector
31~39 ... step 90 ... central control module
220 ... circuit board 920 ... motherboard
222,922 ... hard disk 924 ... network interface card
Embodiment:
About aforementioned and other technology contents, characteristics and effect of the present invention, in the DETAILED DESCRIPTION OF THE PREFERRED that following conjunction with figs. provides, can clearly present.
As a preferred embodiment of the present invention, as shown in Figure 3, tester table 1 comprises a control device 1, six groups of pedestals 21,22,23,24,25 and 26.Although the tester table of present embodiment is provided with six groups of pedestals, be not limited to this.
Because each base construction is identical, for the purpose of concise and to the point, only illustrated as example with test pedestal 22 herein.Pedestal 22 comprises: be provided with connector 226 for the testing circuit board 220 of putting IC to be measured, store relevant executive software and connect this testing circuit board as the hard disk 222 of memory storage be built in testing circuit board 220 and store the Network Interface Unit 224 of an ISN.Control device 1 is electrically connected with pedestal 22, the startup of control testing circuit board 220 and closing, and carry out information interchange with pedestal 22 via Network Interface Unit 224.
When tester table start or replacing working condition, as shown in Figure 4, the control device 1 first activation of step 31 tester table for example is not assigned with the test pedestal 22 of IP address, and the test pedestal 22 that be enabled this moment activates testing circuit board 220, memory storage 222 and Network Interface Unit (being adapter) 224 in step 32; The Network Interface Unit 224 that is activated sends its ISN to control device 1 in step 33, and asks the IP address to the control device 1 of tester table.
When the control device 1 of tester table is received the request of IP address, can differentiate Network Interface Unit 224 prior to step 34 and whether be assigned with the IP address with this ISN, if the ISN of distributing IP address, then can be in step 38 with IP address allocated sub-distribution more originally, if the ISN of unallocated IP address, then in step 35 control device 1 this ISN of memory by tester table, and distribute an IP address to store for the memory storage 222 of this test pedestal 22, when this memory storage 222 IP address allocated is stored finish after, stop this test pedestal 22 of distributing IP address of activation in step 36 by control device 1 again.
During step 37, tester table is checked all pedestals to be tested whether all to be assigned with the IP address to finish, if unallocated finishing, then carry out the distribution of IP address to step 36 at the test pedestal repeating step 31 of unallocated IP address still, all be assigned with the IP address up to all pedestals to be tested, then finished the action of distributing IP address to step 39.
Just the IP address can be distributed to automatically each test pedestal 21,22,23,24,25 and 26 according to above-mentioned method tester table, because this distribution method full automation, can need not manpower distributes, not only reduce human cost, and can also significantly reduce the generation probability of artificial careless mistake, and then lower the loss that production line stops, more can effectively improve the precision and the efficient of test, therefore can solve the technical matters that institute of the present invention desire solves fully by the present invention, reach technique effect of the present invention.
Above preferred embodiment only supplies explanation the present invention's usefulness, and is not limitation of the present invention.Those of ordinary skill in the art guides down without departing from the spirit and scope of the present invention, also can make various distortion and conversion, so all equivalent technical solutions all belongs to protection scope of the present invention.
Claims (4)
1. method that automatically allocating test machine station is respectively tested pedestal IP address, for differentiating a plurality of test pedestals that are used to detect the electrical specification of a plurality of same model circuit under test members/means under a predetermining circuit environment, wherein each described test pedestal comprises one respectively for the testing circuit board of putting a circuit under test members/means; One is installed in this testing circuit board and stores the Network Interface Unit of an ISN; And the memory storage of the described testing circuit board of a connection; This method comprises the following steps:
A) independent one of them described test pedestal of activation activates testing circuit board, memory storage and the Network Interface Unit of this test pedestal;
B) receive request, and read its ISN from described Network Interface Unit;
C) remember described ISN, and distribute an IP address to store for the described memory storage of this test pedestal; And
D) stop this test pedestal of distributing IP address of activation, and the test pedestal of another still unallocated IP address of activation, wherein all distributing IP addresses are not reproducible, and repetition above-mentioned steps to described test pedestal all has been assigned with the IP address, by this, this board can be known each described test pedestal of resolution.
2. automatically allocating test machine station according to claim 1 is respectively tested the method for pedestal IP address, it is characterized in that: step d) comprises also the control device in this board checks all pedestals to be tested whether all to be assigned with the inferior step of IP address.
3. automatically allocating test machine station according to claim 1 is respectively tested the method for pedestal IP address, it is characterized in that: at described step b) and c) between, comprise also whether the described test pedestal of an analysis confirmation has been assigned with the step e) of IP address, and when described pedestal has been assigned with the IP address, with this assigned IP address sub-distribution more.
4. a tester table supplies to detect the electrical specification of a plurality of same model circuit under test members/means under a predetermining circuit environment, and this board comprises:
A plurality of test pedestals, each described test pedestal comprises respectively;
One is used to put the testing circuit board of a described circuit under test members/means;
One is installed in described testing circuit board and stores the Network Interface Unit of an ISN; And
One connects the memory storage of described testing circuit board; And
One connection, activation and control each described test pedestal, for receiving described circuit under test members/means electrical specification, distributing the control device of respectively testing pedestal IP address automatically.
Priority Applications (1)
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CNA200610170290XA CN101211297A (en) | 2006-12-27 | 2006-12-27 | Method for automatically allocating test machine station each IP address and the machine station |
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CNA200610170290XA CN101211297A (en) | 2006-12-27 | 2006-12-27 | Method for automatically allocating test machine station each IP address and the machine station |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102999403A (en) * | 2011-09-13 | 2013-03-27 | 深圳市普联技术有限公司 | Processing method, system and server for invoking test PCs (personal computer) |
CN105182107A (en) * | 2015-07-29 | 2015-12-23 | 北京煜邦电力技术股份有限公司 | Detection device, system and method |
CN105675992A (en) * | 2016-01-14 | 2016-06-15 | 昆山鑫润利自动化科技有限公司 | Automatic testing system and testing method thereof |
CN108076660A (en) * | 2016-12-30 | 2018-05-25 | 深圳配天智能技术研究院有限公司 | A kind of device and method of PCBA functional tests |
CN108490337A (en) * | 2018-03-14 | 2018-09-04 | 广州视源电子科技股份有限公司 | Board card testing method and system, readable storage medium and computer equipment |
CN114518739A (en) * | 2020-11-20 | 2022-05-20 | 罗克韦尔自动化技术公司 | Fault tolerant backplane slot allocation |
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2006
- 2006-12-27 CN CNA200610170290XA patent/CN101211297A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102999403A (en) * | 2011-09-13 | 2013-03-27 | 深圳市普联技术有限公司 | Processing method, system and server for invoking test PCs (personal computer) |
CN102999403B (en) * | 2011-09-13 | 2016-02-03 | 普联技术有限公司 | A kind ofly call the test disposal route of PC, system and server |
CN105182107A (en) * | 2015-07-29 | 2015-12-23 | 北京煜邦电力技术股份有限公司 | Detection device, system and method |
CN105675992A (en) * | 2016-01-14 | 2016-06-15 | 昆山鑫润利自动化科技有限公司 | Automatic testing system and testing method thereof |
CN108076660A (en) * | 2016-12-30 | 2018-05-25 | 深圳配天智能技术研究院有限公司 | A kind of device and method of PCBA functional tests |
WO2018120207A1 (en) * | 2016-12-30 | 2018-07-05 | 深圳配天智能技术研究院有限公司 | Pcba functional testing device and method |
CN108490337A (en) * | 2018-03-14 | 2018-09-04 | 广州视源电子科技股份有限公司 | Board card testing method and system, readable storage medium and computer equipment |
CN114518739A (en) * | 2020-11-20 | 2022-05-20 | 罗克韦尔自动化技术公司 | Fault tolerant backplane slot allocation |
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Open date: 20080702 |