CN101187631A - Uniaxial crystal birefringence measuring method - Google Patents
Uniaxial crystal birefringence measuring method Download PDFInfo
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- CN101187631A CN101187631A CNA2007101156534A CN200710115653A CN101187631A CN 101187631 A CN101187631 A CN 101187631A CN A2007101156534 A CNA2007101156534 A CN A2007101156534A CN 200710115653 A CN200710115653 A CN 200710115653A CN 101187631 A CN101187631 A CN 101187631A
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Abstract
The invention discloses a method for measuring uniaxial crystal birefringence rates and belongs to a crystal material measuring technology, which comprises following steps: adopting a double-beam spectrophotometer, a polarizer and a polarized detector, using a bromotungsten lamp which can emit ultraviolet and visible light as a light source, measuring out continuously transmission spectrums of the uniaxial crystal, obtaining corresponding wave lengths according to crystal transmission spectrums which are measured, and thereby obtaining the uniaxial crystal birefringence rates. The measuring method has simple operation and simple instrument and equipment which are used, the uniaxial crystal birefringence rates can be rapidly calculated out through the transmission spectrums, and the invention is easy to be realized in a lab. On the other side, the value of uniaxial crystal birefringence rates in a certain spectrum range can be obtained through using a transmission spectrum method, and multi-wavelength measurements of the value of uniaxial crystal birefringence rates can be realized.
Description
Technical field:
The present invention relates to the measuring technique of crystalline material, particularly a kind of measuring method of uniaxial crystal birefringence.
Background technology:
The birefringence of crystal is widely used in the rising partially of light, modulation and nonlinear optical technology field, so the birefraction (n of crystal
o-n
e) measurement seem very important.There is several method can obtain the birefraction of crystal at present.For example traditional minimum deviation horn cupping is by measuring n respectively
oAnd n
eObtain the birefraction of crystal, measure n
oAnd n
ePrecision can reach 5 position effective digitals, yet crystal must be processed into prism because the minimum deviation horn cupping is measured, and processes difficulty, required crystal is also bigger, and in real work, the crystalline size that a lot of crystal can grow is very little, in the millimeter magnitude, measure just infeasible in this way; Interference fringe overlapping method can directly be measured the crystal birefringence rate, but measuring accuracy is subject to the luminous intensity measurement precision of judging that two cover stripeds overlap, measures complexity, and precision is not high yet.And the minimum deviation horn cupping, interference fringe overlapping methods etc. only can obtain the refractive index data of several wavelength usually owing to be subjected to the restriction of measurement light source.
Summary of the invention:
For overcoming the defective of prior art, solve the difficulty that classic method is run in measuring process, the present invention adopts the UV, visible light double beam spectrophotometer and plays inclined to one side and analyzing device, and the transmission spectrum of uniaxial crystal is studied, and proposes a kind of measuring method of uniaxial crystal birefringence.
Technical scheme of the present invention is as follows:
A kind of measuring method of uniaxial crystal birefringence, step is as follows:
A. tested crystal is cut into sample wafer along the z direction;
B. in a light path of double beam spectrophotometer, put into the polarizer and analyzer, the rotation analyzer makes the direction of shaking thoroughly of its shake the thoroughly direction and the polarizer parallel;
C. another light path is placed a diaphragm, and the pore size of diaphragm can be regulated;
D. the mensuration of benchmark: regulate monochromator, the continuous spectrum that light source (bromine tungsten filament lamp) is sent is decomposed into monochromatic light, be divided into the two-beam line of two light paths then via beam splitter and two catoptrons, road light in above-mentioned steps b becomes linearly polarized light by natural light behind the polarizer, by still being linearly polarized light behind the analyzer, its polarization direction and the analyzer direction of shaking thoroughly is parallel, incides detector through two catoptrons again; Light in light path described in the above-mentioned steps c also enters detector through diaphragm (sizableness of the logical light face of the sample wafer of its light hole size and tested crystal) and catoptron, detector (photomultiplier) imports two-way optical information data into computing machine to be handled, and obtains measuring basis;
E. wafer is put between the polarizer and analyzer of light path described in the above-mentioned steps b, regulate the direction of shaking the thoroughly angle at 45 of the optical axis of crystal (e optical vibration direction) and the polarizer, aperture stop size in the steps d remains unchanged, this moment, detector (photomultiplier) and computing machine were handled the two-way optical information data that receive, computing machine passes through the comparison with e benchmark that step obtains, and obtains corresponding monochromatic transmissivity T;
F. regulate monochromator, measure different monochromatic transmissivities respectively, computing machine draws the corresponding wavelength X of transmissivity two adjacent maximum value (corresponding order of interference is respectively m+1 and m) by transmission spectrum
1And λ
2, bring formula into:
In, can draw the birefraction Δ n (λ) of uniaxial crystal in af at wavelength lambda.
The pore size of diaphragm described in the above-mentioned steps c can be adjusted to the sizableness that leads to the light face with the sample wafer of tested crystal.
According to the interference theory of polarized light, the transmissivity that above-mentioned steps is surveyed satisfies equation (1):
T∝T
0+Bcosδ
c (1)
Wherein B is a proportionality constant, T
0Be the transmissivity of crystal when not considering bit phase delay.δ
c=(2 π/λ) Δ nd is a phase delay, and the d in the formula is the thickness of wafer in [010] direction, and Δ n is the birefraction of wafer.Because it is very slow that the value of Δ n changes in the long wavelength zone, δ
cMain relevant with wavelength.Crystal birefringence rate Δ n can obtain by the phase delay of two adjacent interference maximum value correspondences in the transmission spectrum like this:
Be δ
C1=(2 π/λ
1) Δ nd=2 (m+1) π, δ
C2=(2 π/λ
2) Δ nd=2m π (m=0,1,2...) (2)
δ
c1-δ
c2＝(2π/λ
1)Δnd-(2π/λ
2)Δnd＝2(m+1)π-2mπ＝2π (3)
Abbreviation (3) formula gets the crystal birefringence rate:
In the equation (4), λ
1And λ
2It is respectively the corresponding wavelength of two adjacent maximum value (corresponding order of interference is respectively m+1 and m) in the transmission spectrum.
Equation (4) is exactly the theoretical foundation that the present invention measures uniaxial crystal long wavelength zone birefraction.
A kind of device that is used for the method for above-mentioned measurement uniaxial crystal birefringence comprises double beam spectrophotometer, and it is to be made of light source, monochromator, a beam splitter and five catoptrons, photomultiplier and computing machines; Light source is positioned at the monochromator front, beam splitter and five catoptrons are positioned at the monochromator back, form two parallel light paths via beam splitter with wherein two catoptrons from the monochromatic light of monochromator outgoing, by three other catoptrons the light beam of two light paths is pooled to photomultiplier again, the photomultiplier back connects computing machine, it is characterized in that being placed with a polarizer and an analyzer in two light paths in one of them light path successively, be placed with a diaphragm in another light path.
Described light source is a bromine tungsten filament lamp.
The polarizer of the present invention is a kind of device in the optical instrument, nonpolarized light can be become linearly polarized light.
Analyzer of the present invention is a kind of device in the optical instrument, can be used for differentiating the polarisation of light light state.
Beam splitter of the present invention is a kind of device in the optical instrument, the single beam line can be become twin-beam light.
The inventive method adopt the double beam spectrophotometer utilization to rise partially and analyzer as the subsidiary device, by regulating the tested optical axis of crystal and rising partially and the direction of shaking the thoroughly angle at 45 of analyzer, obtain polarization interference spectrum (as the transmission spectrum of Fig. 1) in the long wave direction, the expression formula that crystalline phase by two adjacent maximum value correspondences on the spectrogram postpones obtains crystal birefringence rate value indirectly.Utilization can be launched the bromine tungsten filament lamp of ultraviolet and visible light as light source, and (the polarization interference phenomenon appears in the transmission spectrum of the uniaxial crystal in the 200nm～900nm) between the long-wavelength region, obtain the birefraction of Long wavelength region by equation (4) can to obtain wide spectral range.
The crystal birefringence rate measuring method that the present invention proposes, be to utilize through spectrum to measure the crystal birefringence rate, this measuring method is simple to operate, used instrument and equipment is also uncomplicated, can calculate the crystal birefringence rate fast by transmitted spectrum, in the laboratory, be very easy to realize, on the other hand, utilize transmission spectrum method can obtain crystal birefringence rate value in certain spectral range, can realize that the multi-wavelength of crystal birefringence rate value is measured.
Description of drawings
Fig. 1 is a measurement mechanism light path synoptic diagram of the present invention, wherein:
1-light source (bromine tungsten filament lamp), 2-monochromator, 3-beam splitter, 4,5,10,11,12-catoptron, 6-diaphragm, the 7-polarizer, 8-sample wafer, 9-analyzer, 13-detector (photomultiplier).
Fig. 2 and Fig. 3 are the transmissivity spectrums of tested crystal in the embodiment of the invention, wherein:
Horizontal ordinate is a wavelength, and ordinate is a transmissivity; Little figure wherein is the part stretch-out view of big figure.
Fig. 4 is the Δ n that is composed resulting corresponding different wave length value in the embodiment of the invention 2 and 3 by the transmissivity of two tested crystal.
Embodiment:
Embodiment 1: the device that is used to measure uniaxial crystal birefringence
Present embodiment comprises double beam spectrophotometer as shown in Figure 1, and it is to be made of light source 1, monochromator 2, beam splitter 3 and five catoptrons 4,5,10,11 and 12, photomultiplier 13 and computing machine; Light source 1 is positioned at monochromator 2 fronts, beam splitter 3 and five catoptrons 4,5,10,11 and 12 are positioned at monochromator 2 back, form two parallel light paths via beam splitter 3 with wherein two catoptrons 4 and 5 from the monochromatic light of monochromator 2 outgoing, again by three other catoptrons 10,11 and 12 light beams with two light paths are pooled to photomultiplier 13, photomultiplier 13 back connect computing machine, it is characterized in that being placed with successively in one of them light path in two light paths a polarizer 7 and an analyzer 9, be placed with a diaphragm 6 in another light path, light source 1 is a bromine tungsten filament lamp.
Embodiment 2: a kind of measuring method of uniaxial crystal birefringence
As shown in Figure 1, step is as follows:
A. strontium barium niobate (SBN) crystal that will mix caesium cuts into sample wafer 8 along the z direction;
B. in a light path of double beam spectrophotometer, put into the polarizer 7 and analyzer 9, rotation analyzer 9 makes the direction of shaking thoroughly of its shake the thoroughly direction and the polarizer 7 parallel;
C. another light path is placed a diaphragm 6, and the pore size of diaphragm 6 can be regulated;
D. the mensuration of benchmark: regulate monochromator 2, the continuous spectrum that light source (bromine tungsten filament lamp) 1 is sent is decomposed into monochromatic light, be divided into the two-beam line of two light paths then via beam splitter 3 and two catoptrons 4 and 5, road light in above-mentioned steps b becomes linearly polarized light by natural light behind the polarizer 7, by still being linearly polarized light behind the analyzer 9, its polarization direction and analyzer 9 direction of shaking thoroughly is parallel, incides detector through two catoptrons 11 and 12 again; Light in light path described in the above-mentioned steps c also enters detector 13 through diaphragm 6 and catoptron 10, and detector (photomultiplier) 11 and 12 imports two-way optical information data into computing machine to be handled, and obtains measuring basis;
F. regulate monochromator 2, measure different monochromatic transmissivities respectively, as shown in Figure 2, draw the corresponding wavelength X of two adjacent maximum value (corresponding order of interference is respectively m+1 and m) by transmission spectrum by computing machine
1And λ
2, bring formula into:
In can draw the birefraction Δ n (λ) of uniaxial crystal in af at wavelength lambda, shown in the horizontal column of SBN1 among Fig. 4.
The concentration that selected strontium barium niobate (SBN) sample wafer 8 is mixed caesium in the present embodiment is 0.02% (referring to Fig. 4 SBN1), and its size is respectively 5.00 * 5.76 * 7.66mm
3, be 5.76mm in the thickness d of [010] direction.Diaphragm 6 pore sizes herein are adjusted to the sizableness of the sample wafer 8 logical light faces of 5.00mm and tested crystal.
Embodiment 3: a kind of measuring method of uniaxial crystal birefringence
As shown in Figure 1, step is as follows:
A. strontium barium niobate (SBN) crystal that will mix caesium cuts into sample wafer 8 along the z direction;
B. in a light path of double beam spectrophotometer, put into the polarizer 7 and analyzer 9, rotation analyzer 9 makes the direction of shaking thoroughly of its shake the thoroughly direction and the polarizer 7 parallel;
C. another light path is placed a diaphragm 6, and the pore size of diaphragm 6 can be regulated;
D. the mensuration of benchmark: regulate monochromator 2, the continuous spectrum that light source (bromine tungsten filament lamp) 1 is sent is decomposed into monochromatic light, be divided into the two-beam line of two light paths then via beam splitter 3 and two catoptrons 4 and 5, road light in above-mentioned steps b becomes linearly polarized light by natural light behind the polarizer 7, by still being linearly polarized light behind the analyzer 9, its polarization direction and analyzer 9 direction of shaking thoroughly is parallel, incides detector through two catoptrons 11 and 12 again; Light in light path described in the above-mentioned steps c also enters detector 13 through diaphragm 6 and catoptron 10, and detector (photomultiplier) 11 and 12 imports two-way optical information data into computing machine to be handled, and obtains measuring basis;
F. regulate monochromator 2, measure different monochromatic transmissivities respectively, as shown in Figure 3, draw by transmission spectrum, the wavelength X of transmissivity two adjacent maximum value correspondences by computing machine
1And λ
2, bring formula into:
In can draw the birefraction Δ n (λ) of uniaxial crystal in af at wavelength lambda, shown in the horizontal column of SBN2 among Fig. 4.
The concentration that selected strontium barium niobate (SBN) sample wafer 8 is mixed caesium in the present embodiment is 0.04% (referring to Fig. 4 SBN2), and it is of a size of 5.76 * 6.08 * 6.50mm
3, they are 6.08mm in the thickness d of [010] direction.Diaphragm 6 pore sizes herein are adjusted to the sizableness of the sample wafer 8 logical light faces of 5.76mm and tested crystal.
Embodiment 4: a kind of measuring method of uniaxial crystal birefringence
As shown in Figure 1, step is identical with embodiment 2, and just sample wafer 8 is selected the LGS monocrystal material for use, and it is of a size of 2.10 * 2.16 * 2.55mm
3, be 2.16mm in the thickness d of [010] direction, diaphragm 6 pore sizes herein are adjusted to the sizableness of the sample wafer 8 logical light faces of 2.10mm and tested crystal.Adopt the detection method of birefraction of the present invention, obtain wavelength 680-780nm transmitance spectrum, at wavelength 690nm place, utilizing equation (4) to calculate the birefraction that obtains the LGS monocrystalline is Δ n=0.01143, this result and the result who utilizes the minimum deviation horn cupping to record: Δ n=0.01142 compares and meets very goodly, and error only is 1 * 10
-5
Claims (4)
1. the measuring method of a uniaxial crystal birefringence is characterized in that step is as follows:
A. tested crystal is cut into sample wafer along the z direction;
B. in a light path of double beam spectrophotometer, put into the polarizer and analyzer, the rotation analyzer makes the direction of shaking thoroughly of its shake the thoroughly direction and the polarizer parallel;
C. another light path is placed a diaphragm, and the pore size of diaphragm can be regulated;
D. the mensuration of benchmark: regulate monochromator, the continuous spectrum that light source is sent is decomposed into monochromatic light, be divided into the two-beam line of two light paths then via beam splitter and two catoptrons, road light in above-mentioned steps b becomes linearly polarized light by natural light behind the polarizer, by still being linearly polarized light behind the analyzer, its polarization direction and the analyzer direction of shaking thoroughly is parallel, incides detector through two catoptrons again; Light in light path described in the above-mentioned steps c also enters detector through diaphragm and catoptron, and detector imports two-way optical information data into computing machine to be handled, and obtains measuring basis;
E. wafer is put between the polarizer and analyzer of light path described in the above-mentioned steps b, regulate the direction of shaking the thoroughly angle at 45 of the optical axis of crystal and the polarizer, aperture stop size in the steps d remains unchanged, this moment, detector and computing machine were handled the two-way optical information data that receive, computing machine passes through the comparison with e benchmark that step obtains, and obtains corresponding monochromatic transmissivity T;
F. regulate monochromator, measure different monochromatic transmissivities respectively, computing machine is drawn the wavelength X of two adjacent maximum value correspondences by transmission spectrum
1And λ
2, bring formula into:
In, can draw the birefraction Δ n (λ) of uniaxial crystal in af at wavelength lambda.
2. the measuring method of a kind of uniaxial crystal birefringence as claimed in claim 1 is characterized in that the pore size of diaphragm described in the step c can be adjusted to the sizableness that leads to the light face with the sample wafer of tested crystal.
3. a device of measuring the method for uniaxial crystal birefringence according to claim 1 comprises double beam spectrophotometer, and it is to be made of light source, monochromator, a beam splitter and five catoptrons, photomultiplier and computing machines; Light source is positioned at the monochromator front, beam splitter and five catoptrons are positioned at the monochromator back, form two parallel light paths via beam splitter with wherein two catoptrons from the monochromatic light of monochromator outgoing, by three other catoptrons the light beam of two light paths is pooled to photomultiplier again, the photomultiplier back connects computing machine, it is characterized in that being placed with a polarizer and an analyzer in two light paths in one of them light path successively, be placed with a diaphragm in another light path.
4. device as claimed in claim 3 is characterized in that described light source is a bromine tungsten filament lamp.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102323238A (en) * | 2011-10-25 | 2012-01-18 | 上海交通大学 | Device and method for measuring refractive index of intermediate infrared multi-wavelength material |
| CN102007392B (en) * | 2009-01-22 | 2013-01-16 | 松下电器产业株式会社 | Refractive index measuring apparatus |
| CN103196865A (en) * | 2013-03-13 | 2013-07-10 | 清华大学 | Method for simultaneously measuring thickness and refractive index of birefringent element |
| CN105158163A (en) * | 2015-07-10 | 2015-12-16 | 中国科学院西安光学精密机械研究所 | Large-caliber uniaxial crystal light absorption coefficient measuring device and method |
| CN110554003A (en) * | 2018-05-30 | 2019-12-10 | 中国石油化工股份有限公司 | device and method for measuring uniaxial crystal mineral birefringence |
| CN111208089A (en) * | 2020-01-13 | 2020-05-29 | 中国科学院上海光学精密机械研究所 | Device and method for measuring defects in long-distance rough end face crystal body |
-
2007
- 2007-12-19 CN CNA2007101156534A patent/CN101187631A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102007392B (en) * | 2009-01-22 | 2013-01-16 | 松下电器产业株式会社 | Refractive index measuring apparatus |
| CN102323238A (en) * | 2011-10-25 | 2012-01-18 | 上海交通大学 | Device and method for measuring refractive index of intermediate infrared multi-wavelength material |
| CN102323238B (en) * | 2011-10-25 | 2012-12-26 | 上海交通大学 | Device and method for measuring refractive index of intermediate infrared multi-wavelength material |
| CN103196865A (en) * | 2013-03-13 | 2013-07-10 | 清华大学 | Method for simultaneously measuring thickness and refractive index of birefringent element |
| CN103196865B (en) * | 2013-03-13 | 2015-10-21 | 清华大学 | Measure the measuring method of birefringence element thickness and refractive index simultaneously |
| CN105158163A (en) * | 2015-07-10 | 2015-12-16 | 中国科学院西安光学精密机械研究所 | Large-caliber uniaxial crystal light absorption coefficient measuring device and method |
| CN110554003A (en) * | 2018-05-30 | 2019-12-10 | 中国石油化工股份有限公司 | device and method for measuring uniaxial crystal mineral birefringence |
| CN110554003B (en) * | 2018-05-30 | 2022-07-15 | 中国石油化工股份有限公司 | Device and method for measuring uniaxial crystal mineral birefringence |
| CN111208089A (en) * | 2020-01-13 | 2020-05-29 | 中国科学院上海光学精密机械研究所 | Device and method for measuring defects in long-distance rough end face crystal body |
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