CN101178491A - Repairing method of LCD device array substrates - Google Patents
Repairing method of LCD device array substrates Download PDFInfo
- Publication number
- CN101178491A CN101178491A CNA2007101682332A CN200710168233A CN101178491A CN 101178491 A CN101178491 A CN 101178491A CN A2007101682332 A CNA2007101682332 A CN A2007101682332A CN 200710168233 A CN200710168233 A CN 200710168233A CN 101178491 A CN101178491 A CN 101178491A
- Authority
- CN
- China
- Prior art keywords
- public electrode
- pixel capacitors
- repairing
- zone
- electrode wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000000758 substrate Substances 0.000 title claims description 18
- 239000003990 capacitor Substances 0.000 claims description 104
- 230000007547 defect Effects 0.000 claims description 20
- 230000008439 repair process Effects 0.000 claims description 9
- 239000010409 thin film Substances 0.000 claims description 8
- 230000005611 electricity Effects 0.000 claims description 5
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 4
- 238000009434 installation Methods 0.000 abstract 1
- 238000002844 melting Methods 0.000 description 10
- 230000008018 melting Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000005520 cutting process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Images
Landscapes
- Liquid Crystal (AREA)
Abstract
The invention provides a repairing method of an array base plate of a liquid crystal display device, and the array base plate comprises a plurality of scanning lines, a plurality data lines in cross installation with the scanning lines, a plurality of public electrode lines installed parallel to the scanning lines, and a plurality of pixel electrodes positioned near the crossed areas of the data lines and scanning lines; wherein, for the public electrode lines having line breaking disadvantage, the repairing is held as following: leading pixel electrodes corresponding to the line breaking disadvantage to be separated into a plurality of electrically isolated areas, and one of the areas is electrically connected with the public electrode lines. According to the invention, leading the pixel electrode to be separated into a plurality of areas electrically separated, wherein the public electrode lines on two sides of an opening of the public electrode line breaking position realize electric connection through one of the areas, and synchronously at least one of the other areas is non-bright area, thereby preventing the producing of entire pixel bright spot disadvantage when repairing the line breaking disadvantage of the public electrode lines.
Description
Technical field
The present invention relates to lcd technology, particularly a kind of method for repairing and mending of LCD device array substrates.
Background technology
Because advantages such as liquid crystal indicator has gently, approaches, low power consumption, so be widely used in modernized information equipments such as notebook, mobile phone and personal digital assistant.
Fig. 1 shows the pixel structure synoptic diagram of common liquid crystals display device array base palte, for clear expression, has omitted the structure of colored filter one side among Fig. 1.As shown in Figure 1, multi-strip scanning line 11 is arranged on the substrate (not shown) with data line 12 square crossings, thereby defines a plurality of pixel areas.In these pixel areas, be formed with pixel capacitors 16, wherein pixel capacitors comprises an extension 161, projection on substrate plane is partly overlapping in projection on the substrate plane and sweep trace 11 in this extension, when the appearance point display defect, overlapping pixel capacitors extension of this projection 161 and sweep trace 11 are electrically connected, thereby make electrical signal transfer on the sweep trace 11 on this pixel capacitors 16, reach the purpose of this point defect being repaired into dim spot.
Referring to Fig. 1, be formed with thin film transistor (TFT) (TFT) in position near sweep trace 11 and data line 12 point of crossing, this TFT is made up of source electrode 121, drain electrode 15 and grid, wherein source electrode 121 is electrically connected to data line 12, drain electrode 15 is electrically connected to pixel capacitors 16 by through hole 14, grid is electrically connected to sweep trace 11 (shown in the figure, grid is the part of sweep trace).In Fig. 1,13 is public electrode wire, and its effect is and pixel capacitors 16 constitutes memory capacitance, keeps putting on voltage on the pixel capacitors 16 with this.In order to increase the mutual electric field influence of memory capacitance and shielding pixel capacitors 16 and data line 12, public electrode wire 13 also is included in the part 131 of extending along the data line direction in the pixel area.
In the process of making array base palte shown in Figure 1, the situation of common electrode line breaking may take place.As shown in the figure, disconnection defect takes place in the public electrode wire 13 that is positioned at pixel capacitors 16 belows, and 17 is the opening of gap, and the public electrode wire after the opening is owing to can't obtain voltage, therefore can't form memory capacitance, thereby influence the opening normal demonstration of all pixels afterwards.
In order to solve the problem that above-mentioned pixel can't normally show, more common repairing method is to electrically connect pixel capacitors and public electrode wire in the A point of the pixel capacitors 16 of the corresponding pixel of opening and opening 17 both sides public electrode line overlaps and the B point mode by the laser melting respectively, makes the public electrode wire of opening both sides to realize electrical connection by pixel capacitors.
But after carrying out above-mentioned repairing, electric signal on the public electrode wire 13 will directly be delivered on this pixel capacitors 16 via A point and B point, because the voltage ratio of public electrode wire 16 is lower, so this pixel is shown as a bright spot, and fleck defect does not allow to occur.
Summary of the invention
For addressing the above problem, the invention provides a kind of method for repairing and mending of LCD device array substrates, it can suppress the generation of whole pixel fleck defect when repairing the common electrode line breaking defective.
According to this method for repairing and mending, described array base palte comprises the multi-strip scanning line, with mutual many data lines arranged in a crossed manner of multi-strip scanning line, many public electrode wires that be arranged in parallel with sweep trace, and be arranged near a plurality of pixel capacitors of described data line and described sweep trace intersection region, wherein
For the public electrode wire that disconnection defect takes place, repair according to following manner: the corresponding pixel capacitors of described disconnection defect is divided into a plurality of zones electrically isolated from one, and one of them described zone and described public electrode wire electrically connect.
Preferably, in above-mentioned method for repairing and mending, at least one zone is repaired is the dark space.
Preferably, in above-mentioned method for repairing and mending, one of them zone is normally shown by thin film transistor (TFT) control still can.
Preferably, in above-mentioned method for repairing and mending, utilize the mode of lf that one of them described zone and described public electrode wire are electrically connected.
Preferably, in above-mentioned method for repairing and mending, utilize laser described pixel capacitors to be divided into a plurality of zones electrically isolated from one along the direction that is parallel to public electrode wire.
Preferably, in above-mentioned method for repairing and mending, utilize laser described pixel capacitors to be divided into a plurality of zones electrically isolated from one along direction perpendicular to public electrode wire.
Preferably, in above-mentioned method for repairing and mending, described at least one zone repairing is the dark space by utilizing the lf mode that described at least one zone and sweep trace are electrically connected.
Preferably, in above-mentioned method for repairing and mending, described pixel capacitors is divided into the zone that three electricity are isolated, wherein two zones electrically connect with described public electrode wire and sweep trace respectively, and another zone is normally shown by thin film transistor (TFT) control still can.
Preferably, in above-mentioned method for repairing and mending, described pixel capacitors is divided into the zone that three electricity are isolated, one of them described zone and described public electrode wire electrically connect, and two other described zone electrically connects with described sweep trace respectively.
According to the present invention, described pixel capacitors is divided into a plurality of zones electrically isolated from one, wherein the public electrode wire of the opening both sides of public electrode wire gap is realized electrically connecting by one of them zone, at least one zone is non-clear zone in other zones simultaneously, thereby can when repairing the common electrode line breaking defective, suppress the generation of whole pixel fleck defect.
Description of drawings
Fig. 1 shows the pixel structure synoptic diagram of common liquid crystals display device array base palte.
Fig. 2 repairs synoptic diagram according to the LCD device array substrates of one embodiment of the invention.
Fig. 3 is for to cut open the diagrammatic cross-section of getting according to Fig. 2 center line X-X.
Fig. 4 repairs synoptic diagram according to the LCD device array substrates of another embodiment of the present invention.
Fig. 5 repairs synoptic diagram according to the LCD device array substrates of another embodiment of the present invention.
Embodiment
Describe illustrative embodiments of the present invention in detail hereinafter with reference to accompanying drawing.
Fig. 2 is a synoptic diagram of repairing LCD device array substrates according to one embodiment of the invention, for clear expression, has omitted the structure of colored filter one side among Fig. 2.As shown in Figure 2, multi-strip scanning line (here only draw for illustrative nature two sweep trace 21a and 21b) is arranged on the substrate (not drawing among the figure) with data line 22 square crossings, thereby defines a plurality of pixel areas.Be formed with pixel capacitors 26 in these pixel areas, wherein pixel capacitors also comprises an extension 261, and the projection on substrate plane is partly overlapping in projection on the substrate plane and sweep trace in this extension.
Referring to Fig. 2, be formed with thin film transistor (TFT) (TFT) in position near sweep trace 21a and 21b and data line 22 point of crossing, this TFT is made up of source electrode 221, drain electrode 25 and grid, wherein source electrode 221 is electrically connected with data line 22, grid is electrically connected (shown in the figure with sweep trace 21a and 21b, grid is the part of sweep trace), drain electrode 25 is electrically connected with pixel capacitors 26 by through hole 24.In Fig. 2,23 is public electrode wire, and 231 is the public electrode wire extension, and public electrode wire 13 and extension 131 thereof among its effect and structure and Fig. 1 are similar, do not give unnecessary details herein.Preferably, pixel capacitors 26 can be made of indium tin oxide (ITO).
As shown in Figure 2, disconnection defect takes place in the public electrode wire 23 in the array base palte, and wherein 27 is the opening of gap, according to embodiments of the invention, can adopt following manner to repair.
At first, respectively at the pixel capacitors 26 of the corresponding pixel of opening and the 2A point and the 2B point of opening both sides public electrode line overlap, mode by the laser melting electrically connects this pixel capacitors and public electrode wire, makes the public electrode wire of opening both sides to realize being electrically connected by this pixel capacitors.
Fig. 3 is for to cut open the diagrammatic cross-section of getting according to Fig. 2 center line X-X, and it shows the state that back pixel capacitors 26 and public electrode wire 23 electric connections are handled in the laser melting.As shown in Figure 3, on substrate 31, be formed with public electrode wire and gate insulating film 32, above gate insulating film 32, be followed successively by passivation layer 33 and pixel capacitors 26, here, public electrode wire is divided into two sections of 23a and 23b at pixel area 26 internal causes generation broken string, 23a and 23b lay respectively at the both sides of broken string opening 27, and after handling through the laser melting, pixel capacitors 26 electrically connects with public electrode wire 23a and 23b respectively at 2A point and 2B point.Make pixel capacitors 26 after 2A and 2B point electrically connect with public electrode wire 23a and 23b respectively, the 23a of public electrode wire 23 and 23b have realized electric connection by pixel capacitors 26, yet meanwhile the electric signal on the public electrode 23 also will be delivered on this pixel capacitors 26 via 2A point and 2B, thereby cause occurring fleck defect.
For avoiding occurring fleck defect, according to embodiments of the invention, then, can or be divided into three zones that are in electric isolation each other with these pixel capacitors 26 cuttings, and public electrode wire 23 and one of them regional conducting.For example shown in Fig. 2 and 3, along the public electrode wire both sides that are positioned at above-mentioned generation disconnection defect, utilize laser melting mode to peel off the ITO layer of above-mentioned pixel capacitors 26, thereby this pixel capacitors 26 is divided into three zones electrically isolated from one, that is, and pixel capacitors I district, pixel capacitors II district and pixel capacitors III district, be used for distinguishing according to it, pixel capacitors I district is normal viewing area, and pixel capacitors II district is for electrically connecting the district, and pixel capacitors III district is a patch area.Wherein, the 23a of public electrode wire 23 and 23b realize electrically connecting by electrically connecting the district.
At last, in pixel capacitors III district, the 2C place, lap position of pixel capacitors extension 261 and sweep trace 21b electrically connects pixel capacitors extension and sweep trace by lf, makes that the electric signal on the sweep trace 21b can be directly delivered to pixel capacitors III district.
Through after the above-mentioned repairing, in pixel capacitors I district, the thin film transistor (TFT) of this pixel still can be controlled pixel capacitors I district according to normal mode, and the pixel capacitors in public electrode extension line 231 and this district constitutes a memory capacitance, therefore, pixel capacitors I district possesses normal Presentation Function; Pixel capacitors II district is owing to link to each other with public electrode wire 23, and therefore the electrical signal transfer of public electrode wire 23 should the zone be the clear zone to this zone; Pixel capacitors III district links to each other with sweep trace 21b via the 2C zone, makes that the electric signal on the sweep trace 21b can be delivered to this district, because the average voltage of sweep trace is higher relatively, so this district is shown as the dark space.When the area of pixel capacitors district II when not being very big, clear zone area with respect to whole pixel is less, so this pixel will be shown as a dim spot, thereby avoids occurring fleck defect.
Fig. 4 is a synoptic diagram of repairing LCD device array substrates according to another embodiment of the present invention, for clear expression, has omitted the structure of colored filter one side among Fig. 4.Because the structure of the array base palte among Fig. 4 no longer is repeated in this description with shown in Figure 3 identical herein.
In the present embodiment, array base palte is positioned at the public electrode wire 23 generations disconnection defect as shown in Figure 4 of pixel capacitors 26 belows, and 37 for the broken string opening, can repair according to following steps.
At first, respectively at the pixel capacitors 26 of the corresponding pixel of opening and the 3A point and the 3B point of opening both sides public electrode line overlap, mode by the laser melting electrically connects this pixel capacitors 26 and public electrode wire, makes the public electrode wire of opening both sides to realize being electrically connected by this pixel capacitors.
Then, can or be divided into three zones that are in electric isolation each other with pixel capacitors 26 cuttings, and public electrode wire 23 and one of them regional conducting.For example as shown in Figure 4, along the public electrode wire both sides that are positioned at above-mentioned generation disconnection defect, utilize the ITO layer of the pixel capacitors 26 of the corresponding pixel of laser melting mode peel-open, thereby this pixel capacitors 26 is divided into three zones electrically isolated from one, that is, pixel capacitors I district, pixel capacitors II district and pixel capacitors III district are used for distinguishing according to it, pixel capacitors I district and pixel III district are patch area, and pixel capacitors II district is for electrically connecting the district.Wherein, the public electrode wire of opening 37 both sides is realized electrically connecting by electrically connecting the district.
Subsequently, in pixel capacitors III district, in the pixel capacitors extension 261 with the 3C place, lap position of sweep trace 21b, make pixel capacitors extension and sweep trace electric connection by lf, make that the electric signal on the sweep trace 21b can be directly delivered to pixel capacitors III district.
At last, in pixel capacitors I district, utilize laser to cut off the source electrode 221 of TFT and being connected of data line 22 in 3G position as shown in the figure, by laser melting mode drain electrode 25 and sweep trace 21a are electrically connected again, like this, the electric signal on the sweep trace 21a can be delivered to pixel capacitors I district by fusion point 3F.
Through after the above-mentioned repairing, pixel capacitors I district links to each other with sweep trace 21a via the 3F point, and the electrical signal transfer on the sweep trace is to this district, because the average voltage of sweep trace is higher relatively, so this district is shown as the dark space; Pixel capacitors II district is owing to link to each other with public electrode wire 23, and therefore the electrical signal transfer of public electrode wire 23 should the zone be the clear zone to this zone; Pixel capacitors III district links to each other with sweep trace 21b via the 3C point, makes that the electric signal on the sweep trace 21b can be delivered to this district, because the average voltage of sweep trace is higher relatively, so this district is shown as the dark space.When the area of pixel capacitors district II when not being very big, clear zone area with respect to whole pixel is less, and therefore whole pixel will be shown as a dim spot, thereby avoid occurring fleck defect.
Fig. 5 is a synoptic diagram of repairing LCD device array substrates according to another embodiment of the present invention, for clear expression, has omitted the structure of colored filter one side among Fig. 5.Because the structure of the array base palte among Fig. 5 no longer is repeated in this description with shown in Figure 3 identical herein.
In the present embodiment, array base palte is positioned at the public electrode wire 23 generations disconnection defect as shown in Figure 5 of pixel capacitors 26 belows, and 47 for the broken string opening, can repair according to following steps.
At first, respectively at the pixel capacitors 26 of the corresponding pixel of opening and the 4A point and the 4B point of opening both sides public electrode line overlap, mode by the laser melting electrically connects this pixel capacitors 26 and public electrode wire, makes the public electrode wire of opening 47 both sides to realize being electrically connected by this pixel capacitors.
Then, can or be divided into two zones that are in electric isolation each other with described pixel capacitors 26 cuttings, and public electrode wire 23 and one of them regional conducting.For example as shown in Figure 5, utilize laser melting mode to peel off the ITO layer of pixel capacitors 26, thereby pixel capacitors 26 is divided into two zones electrically isolated from one, promptly, pixel capacitors I ' district and pixel capacitors II ' district, be used for distinguishing according to it, pixel capacitors I ' district is normal viewing area, and pixel capacitors II ' district is for electrically connecting the district.Wherein, the public electrode wire of opening 47 both sides is realized electrically connecting by electrically connecting the district.
Through after the above-mentioned repairing, distinguish at pixel capacitors I ', the thin film transistor (TFT) of this pixel still can be controlled pixel capacitors I ' district according to normal mode, and public electrode wire and extension line 231 thereof constitute a memory capacitance with the pixel capacitors in this district, therefore, pixel capacitors I ' district possesses normal Presentation Function; Pixel capacitors II ' district is owing to link to each other with public electrode wire 23, and therefore the electrical signal transfer of public electrode wire 23 should the zone be the clear zone to this zone.At this moment, as long as the area in pixel capacitors I ' district is compared enough greatly with the area in pixel capacitors II ' district, also can reach the purpose of inhibition fleck defect.
It is worthy of note, though in the above embodiments, each is repaired step and describes in a certain order, but it is evident that, each step is separate each other, whether the enforcement of one of them step does not influence the exploitativeness of other step, and therefore the concrete order of step recited above can change.In addition, pixel capacitors cut apart the mode recited above that is not limited to, as long as can keep apart with being electrically connected to the pixel capacitors district of public electrode wire gap and other regional electricity of pixel capacitors.Moreover, as long as be electrically connected to the public electrode wire gap the pixel capacitors district area enough little, other zone of pixel capacitors need not to repair for the dark space and also can reach the purpose that suppresses the clear zone effect.In a word, the principle and scope of the present invention should not be limited to the description of top specific embodiment.
Claims (9)
1. the method for repairing and mending of a LCD device array substrates, described array base palte comprises the multi-strip scanning line, with mutual many data lines arranged in a crossed manner of multi-strip scanning line, many public electrode wires that be arranged in parallel with sweep trace, and be arranged near described data line and the described sweep trace intersection region a plurality of pixel capacitors, it is characterized in that
For the public electrode wire that disconnection defect takes place, repair according to following manner: the corresponding pixel capacitors of described disconnection defect is divided into a plurality of zones electrically isolated from one, and one of them described zone and described public electrode wire electrically connect.
2. method for repairing and mending as claimed in claim 1, wherein, at least one zone is repaired is the dark space.
3. method for repairing and mending as claimed in claim 1, one of them zone are normally shown by thin film transistor (TFT) control still can.
4. as claim 1,2 or 3 described method for repairing and mending, wherein, utilize the mode of lf that one of them described zone and described public electrode wire are electrically connected.
5. as claim 1,2 or 3 described method for repairing and mending, wherein, utilize laser described pixel capacitors to be divided into a plurality of zones electrically isolated from one along the direction that is parallel to public electrode wire.
6. as claim 1,2 or 3 described method for repairing and mending, wherein, utilize laser described pixel capacitors to be divided into a plurality of zones electrically isolated from one along direction perpendicular to public electrode wire.
7. method for repairing and mending as claimed in claim 2 wherein, is the dark space by utilizing the lf mode that described at least one zone and sweep trace are electrically connected with described at least one zone repairing.
8. method for repairing and mending as claimed in claim 1 or 2, wherein, described pixel capacitors is divided into the zone that three electricity are isolated, and wherein two zones electrically connect with described public electrode wire and sweep trace respectively, and another zone is normally shown by thin film transistor (TFT) control still can.
9. method for repairing and mending as claimed in claim 1 or 2 wherein, is divided into the zone that three electricity are isolated with described pixel capacitors, and one of them described zone and described public electrode wire electrically connect, and two other described zone electrically connects with described sweep trace respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710168233A CN100592146C (en) | 2007-10-29 | 2007-10-29 | Repairing method of LCD device array substrates |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710168233A CN100592146C (en) | 2007-10-29 | 2007-10-29 | Repairing method of LCD device array substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101178491A true CN101178491A (en) | 2008-05-14 |
| CN100592146C CN100592146C (en) | 2010-02-24 |
Family
ID=39404804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200710168233A Active CN100592146C (en) | 2007-10-29 | 2007-10-29 | Repairing method of LCD device array substrates |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100592146C (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102629605A (en) * | 2011-05-06 | 2012-08-08 | 京东方科技集团股份有限公司 | TFT-LCD array substrate and methods for manufacturing and restoring the same |
| CN103278987A (en) * | 2013-05-24 | 2013-09-04 | 京东方科技集团股份有限公司 | Array substrate, repair method for broken lines of array substrate and display device |
| US8704963B2 (en) | 2009-12-02 | 2014-04-22 | Chimei Innolux Corporation | Thin film transistor array wherein both an auxiliary electrode and a storage electrode are shaped as an octagonal ring |
| CN103760727A (en) * | 2013-12-31 | 2014-04-30 | 深圳市华星光电技术有限公司 | Thin film transistor array substrate, liquid crystal display panel and restoration method of liquid crystal display panel |
| WO2014205895A1 (en) * | 2013-06-28 | 2014-12-31 | 京东方科技集团股份有限公司 | Thin-film transistor pixel structure and bright point repair method |
| CN104793366A (en) * | 2015-04-23 | 2015-07-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel subjected to bright point repair and bright point repair method thereof |
| CN113219746A (en) * | 2021-04-21 | 2021-08-06 | 惠科股份有限公司 | Array substrate, display panel and shading treatment method |
| CN114839801A (en) * | 2022-04-11 | 2022-08-02 | 滁州惠科光电科技有限公司 | Bright spot repairing method of liquid crystal panel and liquid crystal panel |
-
2007
- 2007-10-29 CN CN200710168233A patent/CN100592146C/en active Active
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8704963B2 (en) | 2009-12-02 | 2014-04-22 | Chimei Innolux Corporation | Thin film transistor array wherein both an auxiliary electrode and a storage electrode are shaped as an octagonal ring |
| CN102629605A (en) * | 2011-05-06 | 2012-08-08 | 京东方科技集团股份有限公司 | TFT-LCD array substrate and methods for manufacturing and restoring the same |
| CN102629605B (en) * | 2011-05-06 | 2015-03-25 | 京东方科技集团股份有限公司 | TFT-LCD array substrate and methods for manufacturing and restoring the same |
| CN103278987B (en) * | 2013-05-24 | 2015-07-01 | 京东方科技集团股份有限公司 | Array substrate, repair method for broken lines of array substrate and display device |
| CN103278987A (en) * | 2013-05-24 | 2013-09-04 | 京东方科技集团股份有限公司 | Array substrate, repair method for broken lines of array substrate and display device |
| WO2014187097A1 (en) * | 2013-05-24 | 2014-11-27 | 京东方科技集团股份有限公司 | Array substrate, broken line repair method therefor and display device |
| WO2014205895A1 (en) * | 2013-06-28 | 2014-12-31 | 京东方科技集团股份有限公司 | Thin-film transistor pixel structure and bright point repair method |
| WO2015100836A1 (en) * | 2013-12-31 | 2015-07-09 | 深圳市华星光电技术有限公司 | Thin film transistor array substrate, liquid crystal display panel, and method for repairing liquid crystal display panel |
| CN103760727A (en) * | 2013-12-31 | 2014-04-30 | 深圳市华星光电技术有限公司 | Thin film transistor array substrate, liquid crystal display panel and restoration method of liquid crystal display panel |
| CN103760727B (en) * | 2013-12-31 | 2016-07-06 | 深圳市华星光电技术有限公司 | The restorative procedure of thin-film transistor array base-plate, display panels and display panels |
| US9897878B2 (en) | 2013-12-31 | 2018-02-20 | Shenzhen China Star Optoelectronics Technology Co., Ltd | Thin film transistor array substrate, liquid crystal display panel and repair method of liquid crystal display panel |
| CN104793366A (en) * | 2015-04-23 | 2015-07-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel subjected to bright point repair and bright point repair method thereof |
| CN104793366B (en) * | 2015-04-23 | 2018-01-16 | 深圳市华星光电技术有限公司 | Liquid crystal panel and its bright spot restorative procedure after bright spot is repaired |
| CN113219746A (en) * | 2021-04-21 | 2021-08-06 | 惠科股份有限公司 | Array substrate, display panel and shading treatment method |
| CN114839801A (en) * | 2022-04-11 | 2022-08-02 | 滁州惠科光电科技有限公司 | Bright spot repairing method of liquid crystal panel and liquid crystal panel |
| CN114839801B (en) * | 2022-04-11 | 2023-10-24 | 滁州惠科光电科技有限公司 | Method for repairing bright spots of liquid crystal panel and liquid crystal panel |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100592146C (en) | 2010-02-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100592146C (en) | Repairing method of LCD device array substrates | |
| CN101964324B (en) | Active matrix substrate and display device | |
| CN204595382U (en) | Array base palte and display panels and device and repaired array base palte | |
| CN100555051C (en) | LCD device array substrates and defect mending method thereof | |
| CN100454561C (en) | Film transistor array substrates and its producing method, repairing method | |
| CN103278987A (en) | Array substrate, repair method for broken lines of array substrate and display device | |
| CN104730790B (en) | Liquid crystal display device, liquid crystal display and preparation method thereof and dim spot operational method | |
| CN100557496C (en) | The liquid crystal display TFT substrate of easy for rehabilitating crosspoint short circuit | |
| CN100466268C (en) | Pixel array substrate | |
| CN103885262A (en) | TFT-LCD (thin film transistor-liquid crystal display) array substrate and data line disconnection restoring method thereof | |
| CN106206746A (en) | Thin film transistor (TFT), GOA circuit, display base plate and display device | |
| CN102722058A (en) | Liquid crystal array substrate, manufacturing method and repair method of liquid crystal array substrate | |
| CN101866084B (en) | Pixel unit, liquid crystal display device and defect repairing method | |
| CN100557805C (en) | Dot structure | |
| CN102074503B (en) | Array substrate of display panel and patching method thereof | |
| CN105336747A (en) | Array substrate and repair method thereof | |
| CN108920009B (en) | Touch display screen, display device and repairing method thereof | |
| CN201004141Y (en) | TFT array base plate for LCD with repair structure | |
| CN202939398U (en) | Thin film transistor array substrate and display device | |
| CN101639595A (en) | LCD array substrate with self-repairing disconnection function | |
| CN104460071A (en) | Thin film transistor array substrate and liquid crystal display panel | |
| CN100454556C (en) | Repairing structure and active component array substrate | |
| WO2020192422A1 (en) | Display panel, repair method for display panel, and display apparatus | |
| CN102629062A (en) | Display panel and signal line repairing method thereof | |
| CN101217155A (en) | A TFT array base plate of double-layer wiring structure |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 215300 No. 1, Longteng Road, Kunshan, Jiangsu Patentee after: InfoVision Optoelectronics(Kunshan)Co.,Ltd. Address before: 1 Longteng Road, Kunshan City, Jiangsu Province Patentee before: INFOVISION OPTOELECTRONICS (KUNSHAN) Co.,Ltd. |